IEC 62951-4:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices

IEC 62951-4:2019 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.

Dispositifs à semiconducteurs - Dispositifs à semiconducteurs souples et extensibles - Partie 4: Evaluation de la fatigue pour les couches minces conductrices souples sur les substrats pour dispositifs à semiconducteurs souples

L’IEC 62951-4:2019 spécifie une méthode d’évaluation des propriétés de fatigue en flexion des couches souples conductrices et des substrats souples pour l'application à des dispositifs semiconducteurs souples. Les couches comprennent toute couche déposée ou collée sur un substrat souple non conducteur telle qu’une couche métallique mince, une électrode conductrice transparente et une couche de silicium mince utilisée pour des dispositifs à semiconducteurs souples. L'évaluation porte sur les comportements électriques et mécaniques des couches sur les substrats. Les méthodes d’essai de fatigue comprennent l’essai de fatigue en flexion dynamique et l’essai de fatigue en flexion statique.

General Information

• Status: Published
• Publication Date: 26-Feb-2019
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.99 - Other semiconductor devices
• ICS: 33.100 - Electromagnetic compatibility (EMC)
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 6 - TC 47/WG 6
• Current Stage: PPUB - Publication issued
• Start Date: 29-Mar-2019
• Completion Date: 27-Feb-2019

Standards Content (Sample)

IEC 62951-4 ®
Edition 1.0 2019-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Semiconductor devices – Flexible and stretchable semiconductor devices –
Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for
flexible semiconductor devices

Dispositifs à semiconducteurs – Dispositifs à semiconducteurs souples et
extensibles –
Partie 4: Evaluation de la fatigue pour les couches minces conductrices souples
sur les substrats pour dispositifs à semiconducteurs souples

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IEC 62951-4 ®
Edition 1.0 2019-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Semiconductor devices – Flexible and stretchable semiconductor devices –

Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for

flexible semiconductor devices

Dispositifs à semiconducteurs – Dispositifs à semiconducteurs souples et

extensibles –
Partie 4: Evaluation de la fatigue pour les couches minces conductrices souples

sur les substrats pour dispositifs à semiconducteurs souples

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-6610-6

– 2 – IEC 62951-4:2019 © IEC 2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Test piece . 6
4.1 Design of test piece . 6
4.2 Preparation of a test piece . 7
4.3 Measurement of dimensions . 7
4.4 Storage prior to testing . 7
5 Testing method and test apparatus . 7
5.1 General . 7
5.2 Test apparatus . 7
5.3 Method of gripping . 7
5.4 Bending test . 8
5.5 Dynamic bending fatigue test . 8
5.6 Static bending fatigue test . 8
5.7 Bending fatigue test of flexible substrate . 8
5.8 Speed of bending fatigue test . 8
6 Test . 8
6.1 Test procedure . 8
6.2 Failure criterion (test termination) . 9
6.3 Test environments . 9
6.4 Recorded data . 9
7 Test report . 9
Annex A (informative)  Various bending fatigue testers . 10
Bibliography . 13

Figure A.1 – Bending fatigue tester using curved mandrel and roller . 10
Figure A.2 – Cyclic mandrel bending tester . 11
Figure A.3 – Collapsing radius bending fatigue tester . 11
Figure A.4 – X-Y-θ bending fatigue test method . 11
Figure A.5 – Schematic of the bending fatigue test . 12

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES –

Part 4: Fatigue evaluation for flexible conductive thin film
on the substrate for flexible semiconductor devices

FOREWORD
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International Standard IEC 62951-4 has been prepared by IEC technical committee 47:
Semiconductor devices.
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2531/FDIS 47/2549/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – IEC 62951-4:2019 © IEC 2019
A list of all parts in the IEC 62951 series, published under the general title Semiconductor
devices – Flexible and stretchable semiconductor devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicat
...