CISPR 16-1-6:2014/AMD1:2017
(Amendment)Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-6: Radio disturbance and immunity measuring apparatus - EMC antenna calibration
Amendment 1 - Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-6: Radio disturbance and immunity measuring apparatus - EMC antenna calibration
Amendement 1 - Spécifications des méthodes et des appareils de mesure des perturbations radioélectriques et de l'immunité aux perturbations radioélectriques - Partie 1-6: Appareils de mesure des perturbations radioélectriques et de l'immunité aux perturbations radioélectriques - Étalonnage des antennes CEM
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CISPR 16-1-6
®
Edition 1.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 1-6: Radio disturbance and immunity measuring apparatus – EMC antenna
calibration
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 1-6: Appareils de mesure des perturbations radioélectriques et de
l'immunité aux perturbations radioélectriques – Étalonnage des antennes CEM
CISPR 16-1-6:2014-12/AMD1:2017-01(en-fr)
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CISPR 16-1-6
®
Edition 1.0 2017-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE
COMITÉ INTERNATIONAL SPÉCIAL DES PERTURBATIONS RADIOÉLECTRIQUES
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Specification for radio disturbance and immunity measuring apparatus and
methods –
Part 1-6: Radio disturbance and immunity measuring apparatus – EMC antenna
calibration
Spécifications des méthodes et des appareils de mesure des perturbations
radioélectriques et de l'immunité aux perturbations radioélectriques –
Partie 1-6: Appareils de mesure des perturbations radioélectriques et de
l'immunité aux perturbations radioélectriques – Étalonnage des antennes CEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10; 33.100.20 ISBN 978-2-8322-3786-1
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– 2 – CISPR 16-1-6:2014/AMD1:2017
© IEC 2017
FOREWORD
This amendment has been prepared by CISPR subcommittee A: Radio-interference
measurements and statistical methods, of IEC technical committee CISPR: International
special committee on radio interference.
The text of this amendment is based on the following documents:
FDIS Report on voting
CISPR/A/1195/FDIS CISPR/A/1204/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
_____________
6.3.4 Radiation patterns of an antenna
Add, after the last paragraph of this subclause, the following new paragraph:
Annex I introduces a method for antenna pattern measurement in the frequency range above
1 GHz.
Add, after the existing Annex H, the following new Annex I:
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CISPR 16-1-6:2014/AMD1:2017 – 3 –
© IEC 2017
Annex I
(normative)
Antenna pattern measurement method in the frequency
range above 1 GHz, with measurement uncertainty budget
I.1 General
All measurement methods in the CISPR 16 series need an estimation of the measurement
uncertainty. A common approach is to list all contributions and to determine the influence of
each one. This works very well if the uncertainty contributions are independent from the EUT
itself. In case of antenna pattern measurements above 1 GHz uncertainty contributions are
NOT independent from the EUT.
The major uncertainty contributions are:
a) reflections inside the antenna chamber;
b) reflections from the transmit antenna mast and the receive antenna mast;
c) positioning uncertainty of the turntable leading to azimuth drift;
d) alignment of the antennas;
e) reflections between antennas.
All of these contributions are dependent on the antenna pattern to be measured as follows:
1) The nature of the pattern of omnidirectional antennas will lead to stronger reflections from
objects around the antenna and from all surfaces of the anechoic chamber.
2) Coupling with the antenna mast is more significant if omnidirectional antennas or
directional antennas with a strong back lobe are measured.
3) Uncertainty of the turntable positioning can be seen if directional antennas with a high-
gradient antenna pattern are measured.
4) Alignment is more critical if directive antennas are measured.
5) Unwanted coupling between measurement antennas exists if the dimensions of the
antennas are electrically large.
To account for these effects on uncertainty this measurement method includes a statistical
estimation of the measurement uncertainty. The following subclauses describe the set-up and
test method. Because a combined method is used, the problem of separately performing site
validation and antenna mast validation is solved. It is easy for calibration labs to implement,
and the effort is reasonable because the procedure is applied for the following cases:
a) for a new and/or modified chamber and/or turntable;
b) if the receive antenna model is changed;
c) for each manufacturer and model of AUC.
This method is similar to the method given in 5.3.3 of CISPR 16-1-5:2014.
I.2 Test set-up
In a typical test set-up, the receive or transmit antenna under test is mounted in front of a
vertical mast placed on a turntable. A change between the E-plane and the H-plane is easily
done by rotating the antenna by 90°.
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© IEC 2017
For the purposes of these tests, two principal categories of positioning systems are defined
based on known methods of performing spherical antenna pattern tests. These are the
distributed-axis system and the combined-axis system.
Combined-axis systems mount the Φ-axis positioner on the θ-axis, as shown in Figure I.1 a),
to rotate the AUC around two axes, while the distributed axis systems move the measurement
antenna about the AUC on the Φ-axis positioner, as shown in Figure I.1 b). With the combined
axis system the height is not critical but half the chamber height is recommended. With the
distributed axis system the radius of the ring is determined by using the maximum size of the
AUC and calculating the far-field criteria.
Measurement
AUC
antenna Measurement
antenna
Φ
rotational axis θ
AUC rotational axis
Antenna
Φ
mast
rotational axis
Turntable
IEC
IEC
a) Combined axis system b) Distributed axis system
Figure I.1 – Typical set-up for antenna pattern measurement
Two distances are defined as follows:
d is the distance between the centre of the turntable and the reference point of the
1
measurement antenna; a distance of 3 m or longer is recommended (see Figure
I.2);
Measurement
AUC
antenna
d
1
Measurement
antenna
Antenna
AUC
mast
Turntable
IEC
IEC
a) Combined axis system b) Distributed axis system
Figure I.2 − Definition of d
1
θ
rotational axis
d
1
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CISPR 16-1-6:2014/AMD1:2017 – 5 –
© IEC 2017
d is the distance between the antenna mast and the reference point of the AUC (see
2
Figure I.3); because only the antenna can be moved, and not the positioner.
Adjustment of d is possible using for example different length adaptors.
2
d
2
Measurement
antenna
Measurement
AUC
antenna
AUC
Adjustable
Adjustable
length
height
Antenna
mast
Turntable
IEC IEC
a) Combined axis system b) Distributed axis system
Figure I.3 − Definition of d
2
The AUC is the antenna mounted on the rotational positioner of the combined axis system
and on the rotating pedestal for the distributed axis system. Only one of either system needs
to be used.
For an element type antenna, see 7.5.2.1.
I.3 Test method
The test method is based on changing the phase condition of direct and reflected waves,
similar to S (see CISPR 16-1-4).
VSWR
The antenna pattern is measured a total of 12 times while the distances d and d are varied
1 2
as follows.
a) Influence of the antenna mast – with d held constant, d is increased in the following
1 2
steps (see Figure I.4):
1) d + 0,0 cm,
2
2) d + 0,3 cm,
2
3) d + 3,0 cm,
2
4) d + 6,0 cm,
2
5) d + 7,5 cm,
2
+ 9,0 cm.
6) d
2
The spacing between d positions above is unequal, i.e. similar to S . The physical
2 VSWR
lower limit is defined by the lowest frequency used, at least λ/4.
NOTE The reference point and phase centre in this case mean the same thing. The phase centre can change
as a function of frequency and has to be known for the application of the antenna, i.e. the antenna factor, to be
valid. For LPDA antennas either the manufacturer's mark or the antenna midpoint for calibration is used. For
DRG horn antennas the plane of the aperture is used.
d
2
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– 6 – CISPR 16-1-6:2014/AMD1:2017
© IEC 2017
Measurement antenna (phase centre) held constant
d d + x
2 2
AUC (phase centre) moved
Measurement
antenna
Mast
d
1
AUC positions
IEC
Figure I.4 − With d held constant, d is increased in x cm steps
1 2
b) Influence of the chamber – with d held constant, d is increased in the following steps
2 1
(see Figure I.5):
1) d + 0 cm,
1
2) d + 2 cm,
1
3) d + 10 cm,
1
4) d + 18 cm,
1
5) d + 30 cm,
1
6) d + 40 cm.
1
The spacing between d positions above is unequal. The distances listed above are equal
1
to those used in measuring S , so commercially available antenna positioners can be
VSWR
used for an automated procedure.
d
2
Measurement antenna (phase centre) moved
AUC (phase centre) held constant
Measurement
antenna
Mast
d + x
1
AUC positions
IEC
Figure I.5 − With d held constant, d is increased in x cm steps
2 1
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CISPR 16-1-6:2014/AMD1:2017 – 7 –
© IEC 2017
When the change in d causes the AUC to move away from the axis of rotation, the distance
2
between the transmit and the receive antennas is dependent on the angle, and a distance
correction is required (see Figure I.6 and Equation (I.1)).
To get an estimate for the measurement uncertainty contributions due to reflections of the test
site and antenna positioner the standard deviations of combined and distributed systems are
calculated separately from the measured antenna pattern. See Table I.2.
Measurements shall be performed at a single frequency in steps of 500 MHz or smaller. The
turntable shall be stepped from 0° to 360° with a maximum angular resolution of 2°. The
measurement at 360° shall be compared to the 0° value for completion of the pattern.
A radiation pattern correction is required for d when the axes of both antennas do not
2
coincide due to the turntable rotation (see Table I.1).
Due to the required correction of the received level and the angle – see Equation (I.3) and
Figure I.6 – the angular grid is not equally spaced; see Table I.1. To solve this issue the
pattern shall be recalculated to an angular resolution of 0,5° via linear interpolation at each
frequency using dB scale values for pattern data. After this alignment the standard deviation
shall be calculated.
Table I.1 – Correction of angle α for a distance of d = 3 m (refer to Figure I.6)
1
α (°) α (°) α (°) α (°) α (°) α (°)
α r
cor corr corr corr corr corr
(°) x = 0 (cm) x = 0,3 (cm) x = 3 (cm) x = 6 (cm) x = 7,5 (cm) x = 9 (cm)
0 0,000 0,000 0,000 0,000 0,000 0,000
2 2,000 2,002 2,020 2,041 2,051 2,062
4 4,000 4,004 4,040 4,082 4,102 4,124
6 6,000 6,006 6,060 6,122 6,154 6,185
8 8,000 8,008 8,081 8,163 8,204 8,247
10 10,000 10,010 10,100 10,203 10,255 10,308
… … … … … … …
90 90,000 90,057 90,573 91,146 91,432 91,718
… … … … … … …
180 180,000 180,000 180,000 180,000 180,000 180,000
… … … … … … …
270 270,000 269,943 269,427 268,854 268,568 268,282
… … … … … … …
360 360,000 360,000 360,000 360,000 360,000 360,000
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– 8 – CISPR 16-1-6:2014/AMD1:2017
© IEC 2017
d
2
Mast
d + x
2
Measurement
antenna
d
α
Axis of rotation d
AUC
1
for required text
(θ and Φ)
IEC
Figure I.6 − Distance and angle correction
The following equations support Figure I.6:
2 2 2
d = d + x − 2d xcosα (I.1)
1 1
d
P = P + 20lg
(I.2)
corr meas
d
1
xsinα
α =α+ arctan
(I.3)
corr
d − xcosα
1
I.4 Test report
The test report shall include a description of the facility, the test equipment used and the
measurement uncertainty.
...
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