IEC TS 62607-9-2:2024

Nanomanufacturing - Key control characteristics - Part 9-2: Nanomagnetic products - Magnetic field distribution: Magneto-optical indicator film technique

IEC TS 62607-9-2:2024, which is a Technical Specification, establishes a standardized method to determine the key control characteristic
• magnetic field distribution
of nanomagnetic materials, structures and devices by the
• magneto-optical indicator film technique.
The magnetic field distribution is derived by utilizing a magneto optical indicator film, which is a thin film of magneto-optic material that is placed on the surface of an object exhibiting a spatially varying magnetic field distribution. The Faraday effect is then employed to measure the magnetic field strength by analysing the rotation of the polarization plane of light passing through the magneto-optic film.
The method is applicable for measuring the stray field distribution of flat nanomagnetic materials, structures and devices.
- The method can especially be used to perform fast quantitative measurements of stray field distributions at the surface of an object.
- The magneto-optic indicator film technique (MOIF) is a fast, non-destructive method, making it an attractive option for materials analysis and testing in the industry.
- MOIF measurements can be done without any sample preparation and do not rely on specific surface properties of the object. It can be applied to the characterization of rough samples as well as of samples with non-magnetic cover layers.
- MOIF can quantitatively measure magnetic field distributions:
• with a one-shot measurement which typically takes a few seconds
• over areas of several square centimetres (over diameters of up to 15 cm with special techniques)
• in a field range from 1 mT to more than 100 mT
• with down to 1 µm spatial resolution
- Although techniques with nano-scale resolution are suitable for analysing the details of magnetic field structure, their ability to characterize larger areas is limited by their scanning area. Therefore, the MOIF technique is an indispensable complementary method that can offer a more comprehensive understanding of material properties.
This document focuses on the calibration procedures, calibrated measurement process, and evaluation of measurement uncertainty to ensure the traceability of quantitative magnetic field measurements obtained through the magneto-optic indicator film technique.

General Information

• Status: Published
• Publication Date: 15-Jul-2024
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 3 - TC 113/WG 3
• Current Stage: PPUB - Publication issued
• Start Date: 21-Jun-2024
• Completion Date: 16-Jul-2024

Standards Content (Sample)

IEC TS 62607-9-2 ®
Edition 1.0 2024-07
TECHNICAL
SPECIFICATION
Nanomanufacturing – Key control characteristics –
Part 9-2: Nanomagnetic products – Magnetic field distribution: Magneto-optical
indicator film technique
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IEC TS 62607-9-2 ®
Edition 1.0 2024-07
TECHNICAL
SPECIFICATION
Nanomanufacturing – Key control characteristics –

Part 9-2: Nanomagnetic products – Magnetic field distribution: Magneto-optical

indicator film technique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120  ISBN 978-2-8322-8987-7

– 2 – IEC TS 62607-9-2:2024 © IEC 2024
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 11
2 Normative references . 11
3 Terms and definitions . 12
3.1 General terms . 12
3.2 General terms related to magnetic stray field characterization . 12
3.3 Terms related to the measurement method described in this document . 12
3.4 Terms related to the magneto optical indicator film (MOIF) . 15
3.5 Terms related to Faraday rotation . 18
3.6 Terms related to the magneto-optical measurement setup . 19
3.7 Terms related to optical microscopy . 21
3.8 Terms related to the setup calibration process . 22
3.9 Terms related to the magneto-optical measurement process . 23
3.10 Key control characteristics measured according to this standard . 23
4 Symbols and abbreviated terms . 24
5 General . 25
5.1 Measurement principle . 25
5.1.1 Overview . 25
5.1.2 Magneto-optical indicator films . 26
5.1.3 Sensor . 27
5.1.4 Faraday effect in reflection . 28
5.1.5 Measurement scheme . 28
5.1.6 MOIF signal generation theory . 29
5.1.7 MOIF measurement modes . 29
5.1.8 Feature detection mode . 30
5.1.9 Quantitative spatially resolved feature detection mode . 30
5.2 Description of measurement equipment or apparatus . 30
5.2.1 MOIF imaging system . 30
5.2.2 MOIF imaging systems for spot measurements, confocal microscopy . 31
5.2.3 Imaging systems in wide field geometry . 31
5.2.4 MOIF signal detection . 31
5.2.5 MOIF signal detection schemes overview . 32
5.2.6 MOIF signal detection by a polarizing filter as an analyser . 32
5.2.7 Differential MOIF signal detection by a polarizing filter plus a Faraday
rotator to modulate the signal for lock-in detection . 32
5.2.8 MOIF signal generation by a polarization camera . 33
5.2.9 MOIF signal generation theory for direct MOIF measurements . 33
5.2.10 Selecting the analyser operating angle . 33
5.2.11 MOIF signal generation theory in differential MOIF measurements . 34
5.2.12 MOIF signal generation theory in the polarization measurement using a
polarization camera . 35
5.3 Ambient conditions during measurement . 35
6 Measurement procedure . 36
6.1 Calibration of measurement equipment . 36
6.1.1 Calibration of analyser-based MOIF measurements for purely
perpendicular magnetic fields H = H . 36
z
6.1.2 Calibration approach for one pixel . 36
6.1.3 Calibration approach for array sensors using an analyser-based
detection scheme . 37
6.1.4 Background image subtraction . 37
6.1.5 Calibration of differential MOIF for perpendicular magnetic fields H = H . 38
z
6.1.6 Calibration approach . 38
6.1.7 Providing the perpendicular calibration field . 39
6.2 MOIF key control parameters . 40
6.2.1 General . 40
ext
6.2.2 Calibrated external magnetic field, H . 40
z
6.2.3 Intensity of the light source . 40
6.2.4 Optical imaging geometry . 40
MOIF
6.2.5 Thickness of the MOIF, d . 40
6.2.6 Measurement height, h . 41
sensor
6.2.7 Sensor measurement temperature, T . 41
env
6.2.8 Environmental measurement temperature, T . 41
6.2.9 Scan size Sx × Sy and pixel resolution Nx, Ny and pixel size ∆x × ∆x . 41
6.3 Detailed description of the measurement procedure . 42
6.3.1 General . 42
6.3.2 Sample mounting . 42
6.3.3 Temperature stabilization . 42
6.3.4 Frame averaging . 42
6.3.5 Background image . 42
6.3.6 Raw data distribution . 43
6.3.7 Measurement procedure for geometrical feature detection . 43
6.3.8 Measurement procedure for calibrated magnetic field measurements
(analyser based) . 43
6.3.9 Detailed description of the MOIF calibration procedure for quantitative
stray field measurements . 44
6.3.10 Detailed description of the MOIF calibrated stray field measurement
procedure . 46
6.4 Measurement accuracy . 48
6.4.1 Contribution of in-plane magnetic field components . 48
6.4.2 In-plane magnetic fields contribution for low magnetic fields H << H . 48
uoop
6.4.3 In-plane magnetic field contribution for fields in the order of magnitude
of H . 49
uoop
6.4.4 Forward simulation . 49
6.4.5 Influence of the finite sensor thickness . 49
6.4.6 Transfer function-based sensor thickness correction . 50
6.4.7 Spatial resolution . 50
6.4.8 Diffraction limited resolution . 50
6.4.9 Sensor thickness limited resolution . 50
6.4.10 Signal generation artefacts in MOIF measurements . 51
6.4.11 Uncertainty evaluation . 51
6.4.12 Calibration uncertainty . 51
6.4.13 Uncertainty of calibrated field measurement . 51
7 Data analysis and interpretation of results . 52
7.1 Quantitative data analysis . 52

– 4 – IEC TS 62607-9-2:2024 © IEC 2024
7.2 Secondary parameters from MOIF measurements . 52
7.2.1 General . 52
7.2.2 Secondary parameters of magnetic scales . 52
7.2.3 Secondary parameters of grain-oriented electrical steel sheets . 53
8 Results to be reported . 53
8.1 Cover sheet . 53
8.2 Product / sample identification . 53
8.3 Measurement conditions . 53
8.4 Measurement specific information (exampl
...