IEC 61326-2-1:2020

Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

IEC 61326:2020 specifies more detailed test configurations, operational conditions and performance criteria for equipment with test and measurement circuits (internal or, external to the equipment, or both) that are not EMC protected for operational and/or functional reasons, as specified by the manufacturer. The manufacturer specifies the environment for which the product is intended to be used and selects the appropriate test level specifications of IEC 61326-1:2020.

Matériel électrique de mesure, de commande et de laboratoire - Exigences relatives à la CEM - Partie 2-1: Exigences particulières - Configurations d'essai, conditions fonctionnelles et critères de performance pour essai de sensibilité et matériel de mesure pour les applications non protégées de la CEM

L’IEC 61326:2020 donne des spécifications plus détaillées des configurations d’essai, des conditions fonctionnelles et des critères de performance pour les matériels avec des circuits d’essai et de mesure (internes et/ou externes au matériel) qui n’ont pas de protection CEM pour des raisons opérationnelles et/ou fonctionnelles, comme spécifié par le fabricant. Le fabricant spécifie l’environnement auquel le produit est destiné et sélectionne les spécifications pertinentes du niveau d’essai de l’IEC 61326-1:2020.

General Information

• Status: Published
• Publication Date: 22-Oct-2020
• ICS: 17.220.20 - Measurement of electrical and magnetic quantities
• ICS: 25.040.40 - Industrial process measurement and control
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 65A - System aspects
• Drafting Committee: WG 4 - TC 65/SC 65A/WG 4
• Current Stage: PPUB - Publication issued
• Start Date: 23-Oct-2020
• Completion Date: 13-Nov-2020

Relations

• Revises: IEC 61326-2-1:2012 - Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications
• Effective Date: 05-Sep-2023

Overview

IEC 61326-2-1:2020 (Edition 3.0) is a Part 2 supplement to IEC 61326-1:2020 that defines EMC test configurations, operational conditions and performance criteria specifically for sensitive test and measurement equipment that is intentionally EMC unprotected for functional reasons. It applies to instruments with internal or external test and measurement circuits - for example oscilloscopes, logic analysers, spectrum/network analysers, analogue instruments, digital multimeters (DMM) and board test systems. The manufacturer is responsible for specifying the intended environment and selecting the appropriate test levels from IEC 61326-1:2020.

Key Topics and Requirements

• Test configuration and EUT setup
  • Test and measurement input ports should be capped/covered and terminated with appropriate impedance unless doing so would create an unrepresentative operating condition.
  • Output ports not required for essential functions should be capped/terminated.
  • Electrostatic discharge (ESD) is applied to housing shields or connector shields - not to inner pins of shielded connectors.
• Operational conditions during testing
  • Both battery and AC mains modes must be tested when both are available.
  • Specific guidance for common instruments:
    • Oscilloscopes: maximum sweep speed, maximum sensitivity, continuous acquisition.
    • Logic analysers: data analysis modes for emissions, continuous acquisition for immunity.
    • DMMs: peak detect, maximum sensitivity (auto-range), continuous acquisition.
  • For other equipment, representative worst‑case normal-operation modes are selected.
• Immunity and performance criteria
  • Applies IEC 61326-1 immunity tests with specified additions.
  • For transient electromagnetic phenomena assigned to performance criterion B, temporary self-recovering degradation is allowed; manufacturer must document any self-recovery times greater than 10 s. No change of operating state or loss of stored data is permitted.
• Documentation and user instructions
  • Manufacturers must inform users that connecting test leads/probes may reduce immunity and provide guidance to minimize disturbance impact.

Applications and Who Uses It

• Intended for manufacturers, test engineers and EMC compliance teams working with laboratory and production test instruments that are sensitive by design and not EMC-hardened.
• Useful for designers of oscilloscopes, logic analysers, DMMs and board test systems; test laboratories developing EMC test plans for unprotected measurement equipment; and procurement/specification engineers assessing suitability of sensitive instruments for specific electromagnetic environments.

Related Standards

• IEC 61326-1:2020 - General EMC requirements for measurement, control and laboratory equipment (to be used in conjunction with Part 2-1).
• IEC 60050-161 - Electrotechnical vocabulary (terms and definitions referenced).

Keywords: IEC 61326-2-1, EMC requirements, test configurations, immunity testing, emissions, sensitive test and measurement equipment, oscilloscopes, logic analysers, DMM, manufacturer instructions.

Standards Content (Sample)

IEC 61326-2-1 ®
Edition 3.0 2020-10
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Electrical equipment for measurement, control and laboratory use –
EMC requirements –
Part 2-1: Particular requirements – Test configurations, operational conditions
and performance criteria for sensitive test and measurement equipment for
EMC unprotected applications
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: [phone]
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About the IEC
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IEC 61326-2-1 ®
Edition 3.0 2020-10
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Electrical equipment for measurement, control and laboratory use –

EMC requirements –
Part 2-1: Particular requirements – Test configurations, operational conditions

and performance criteria for sensitive test and measurement equipment for

EMC unprotected applications
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.220.20; 25.040.40; 33.100.20 ISBN 978-2-8322-8989-1

– 2 – IEC 61326-2-1:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General . 5
5 EMC test plan . 6
5.1 General . 6
5.2 Configuration of EUT during testing . 6
5.3 Operation conditions of EUT during testing . 6
5.4 Specification of FUNCTIONAL PERFORMANCE . 7
5.5 Test description . 7
6 Immunity requirements . 7
6.1 Conditions during the tests. 7
6.2 Immunity test requirements . 7
6.3 Random aspects . 7
6.4 Performance criteria . 7
7 Emission requirements . 7
8 Test results and test report . 7
9 Instructions for use . 8
Annex A (normative) Immunity test requirements for PORTABLE TEST AND MEASUREMENT
EQUIPMENT powered by battery or from the circuit being measured . 9
Annex B (informative) Guide for analysis and assessment for electromagnetic
compatibility. 10

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRICAL EQUIPMENT FOR MEASUREMENT,
CONTROL AND LABORATORY USE –
EMC REQUIREMENTS –
Part 2-1: Particular requirements –
Test configurations, operational conditions and performance
criteria for sensitive test and measurement equipment
for EMC unprotected applications

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This redline version of the official IEC Standard allows the user to identify the changes
made to the previous edition. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.

– 4 – IEC 61326-2-1:2020 RLV © IEC 2020
International Standard IEC 61326-2-1 has been prepared by subcommittee 65A: System
aspects, of IEC technical committee 65: Industrial-process measurement, control and
automation.
This third edition cancels and replaces the second edition published in 2012. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
– update with respect to IEC 61326-1:2020.
The text of this International Standard is based on the following documents:
FDIS Report on voting
65A/976/FDIS 65A/987/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
This part of IEC 61326 is to be used in conjunction with IEC 61326-1:2020 and follows the
same numbering of clauses, subclauses, tables and figures.
When a particular subclause of IEC 61326-1 is not mentioned in this part, that subclause
applies as far as is reasonable. When this standard states “addition”, “modification” or
“replacement”, the relevant text in IEC 61326-1 is to be adapted accordingly.
NOTE The following numbering system is used:
– subclauses, tables and figures that are numbered starting from 101 are additional to those in IEC 61326-1;
– unless notes are in a new subclause or involve notes in IEC 61326-1, they are numbered starting from 101
including those in a replaced clause or subclause;
– additional annexes are lettered AA, BB, etc.
A list of all parts of IEC 61326 series, under the general title Electrical equipment for
measurement, control and laboratory use – EMC requirements, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
ELECTRICAL EQUIPMENT FOR MEASUREMENT,
CONTROL AND LABORATORY USE –
EMC REQUIREMENTS –
Part 2-1: Particular requirements –
Test configurations, operational conditions and performance
criteria for sensitive test and measurement equipment
for EMC unprotected applications

1 Scope
In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test
configurations, operational conditions and performance criteria for equipment with test and
measurement circuits (both internal and/or, external to the equipment, or both) that are not
EMC protected for operational and/or functional reasons, as specified by the manufacturer.
The manufacturer specifies the environment for which the product is intended to be used and
selects the appropriate test level specifications of IEC 61326-1:2020.
NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers,
network analysers, analogue instruments, digital multimeters (DMM) and board test systems.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
Clause 2 of IEC 61326-1:2020 applies except as follows:
Addition:
IEC 61326-1:20122020, Electrical equipment for measurement, control and laboratory use –
EMC requirements – Part 1: General requirements
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61326-1:2020 and
IEC 60050-161 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
4 General
Clause 4 of IEC 61326-1:2020 applies.

– 6 – IEC 61326-2-1:2020 RLV © IEC 2020
5 EMC test plan
5.1 General
Subclause 5.1 of IEC 61326-1:2020 applies.
5.2 Configuration of EUT during testing
Subclause 5.2 of IEC 61326-1:2020 applies, except as follows:
Addition:
5.2.4.101 I/O ports for test and measurement purposes
Test and measurement input ports shall be capped and shorted covered and terminated with
an appropriate impedance unless this leads to an operating condition unsuitable for
measuring the emission and immunity performance of the product. If an input signal is
needed, an appropriate input signal shall be applied using test leads or probes as specified by
the manufacturer.
Test and measurement output ports not needed to evaluate the essential functions of the EUT
shall be capped covered and/or terminated.
Electrostatic discharges shall be applied to the housing shield mated connector or the shield
of the unmated port, but not to the inner pins of shielded port or cable connectors.
Examples include but are not limited to: USB, BNC, D-subminiature, IEEE 488 (IEC 60488),
GPIB, RS232 and IEEE 1284-B (parallel printer port), etc.
NOTE 1 Probes and/or test leads not used to apply an input signal during test to the test and measurement ports
do not need to be connected. Such test leads can vary substantially from one application to another and are often
connected to equipment that has the covers removed and may can be in various stages of disassembly to provide
access to test points inside. Connected test leads may could increase emissions and/or reduce immunity in certain
applications.
NOTE 2 Capped Covered means locally covered with a screen or shield.
5.3 Operation conditions of EUT during testing
Subclause 5.3 of IEC 61326-1:2020 applies, except as follows:
Addition:
5.3.101 Operational conditions
When both battery and a.c. mains options are available, both modes of operation shall
comply.
5.3.102 Oscilloscopes
The oscilloscope ports shall be set for maximum sweep speed, maximum sensitivity and
continuous acquisition mode unless other modes are known to provide worst-case emission or
immunity results within normal applications.
5.3.103 Logic analysers
The logic analyser shall be set for data analysis modes during emission measurement and
continuous data acquisition mode during immunity testing unless other modes are known to
provide worst-case emission or immunity results within normal applications.

5.3.104 Digital multimeters (DMM)
Typical set-ups include: peak detect, maximum sensitivity (usually auto-range, if available, will
suffice) and continuous acquisition mode.
5.3.105 Other equipment
For equipment not mentioned in 5.3.102 to 5.3.104, the following philosophy shall apply.
A selection of representative operation modes shall be made, taking into account that not all
functions, but only the most typical functions of the equipment can be tested. The estimated
worst-case operating modes for normal application shall be selected.
5.4 Specification of FUNCTIONAL PERFORMANCE
Subclause 5.4 of IEC 61326-1:2020 applies.
5.5 Test description
Subclause 5.5 of IEC 61326-1:2020 applies.
6 Immunity requirements
6.1 Conditions during the tests
Subclause 6.1 of IEC 61326-1:2020 applies.
6.2 Immunity test requirements
Subclause 6.2 of IEC 61326-1:2020 applies.
6.3 Random aspects
Subclause 6.3 of IEC 61326-1:2020 applies.
6.4 Performance criteria
Subclause 6.4 of IEC 61326-1:2020 applies, except as follows:
Addition:
6.4.101 Tests with transient electromagnetic phenomenon
During testing with transient electromagnetic phenomena that are assigned to performance
criteria B in Table 1, 2 or 3 of IEC 61326-1:2020, the EUT may have temporary degradation or
loss of function or performance which is self-recovering. Self-recovery times greater than 10 s
shall be specified by the manufacturer in the equipment documentation for the user. Trigger
functions need not be evaluated. No change in actual operating state or loss of stored data is
allowed.
7 Emission requirements
Clause 7 of IEC 61326-1:2020 applies.
8 Test results and test report
Clause 8 of IEC 61326-1:2020 applies.

– 8 – IEC 61326-2-1:2020 RLV © IEC 2020
9 Instructions for use
Clause 9 of IEC 61326-1:2020 applies, except as follows:
Addition:
9.101 Additional instructions
The manufacturer shall give information that the equipment may might not meet the immunity
requirements of this document when test leads and/or test probes are connected and shall
give guidance on how to use test leads and/or test probes to minimize the impact of
disturbances.
Annex A
(normative)
Immunity test requirements for PORTABLE TEST AND MEASUREMENT
EQUIPMENT powered by battery or from the circuit being measured
Annex A of IEC 61326-1:2020 does not apply.

– 10 – IEC 61326-2-1:2020 RLV © IEC 2020
Annex B
(informative)
Guide for analysis and assessment for electromagnetic compatibility
Annex B of IEC 61326-1:2020 applies.

___________
IEC 61326-2-1 ®
Edition 3.0 2020-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electrical equipment for measurement, control and laboratory use –
EMC requirements –
Part 2-1: Particular requirements – Test configurations, operational conditions
and performance criteria for sensitive test and measurement equipment for
EMC unprotected applications
Matériel électrique de mesure, de commande et de laboratoire –
Exigences relatives à la CEM –
Partie 2-1: Exigences particulières – Configurations d'essai, conditions
fonctionnelles et critères de performance pour essai de sensibilité et matériel de
mesure pour les applications non protégées de la CEM

– 2 – IEC 61326-2-1:2020 © IEC 2020
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General . 5
5 EMC test plan . 6
5.1 General . 6
5.2 Configuration of EUT during testing . 6
5.3 Operation conditions of EUT during testing . 6
5.4 Specification of FUNCTIONAL PERFORMANCE . 7
5.5 Test description . 7
6 Immunity requirements . 7
6.1 Conditions during the tests. 7
6.2 Immunity test requirements . 7
6.3 Random aspects . 7
6.4 Performance criteria . 7
7 Emission requirements . 7
8 Test results and test report . 7
9 Instructions for use . 8
Annex A (normative) Immunity test requirements for PORTABLE TEST AND MEASUREMENT
EQUIPMENT powered by battery or from the circuit being measured . 9
Annex B (informative) Guide for analysis and assessment for electromagnetic
compatibility. 10

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRICAL EQUIPMENT FOR MEASUREMENT,
CONTROL AND LABORATORY USE –
EMC REQUIREMENTS –
Part 2-1: Particular requirements –
Test configurations, operational conditions and performance
criteria for sensitive test and measurement equipment
for EMC unprotected applications

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61326-2-1 has been prepared by subcommittee 65A: System
aspects, of IEC technical committee 65: Industrial-process measurem
...

IEC 61326-2-1 ®
Edition 3.0 2020-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electrical equipment for measurement, control and laboratory use –
EMC requirements –
Part 2-1: Particular requirements – Test configurations, operational conditions
and performance criteria for sensitive test and measurement equipment for
EMC unprotected applications
Matériel électrique de mesure, de commande et de laboratoire –
Exigences relatives à la CEM –
Partie 2-1: Exigences particulières – Configurations d'essai, conditions
fonctionnelles et critères de performance pour essai de sensibilité et matériel de
mesure pour les applications non protégées de la CEM

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org
The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English
committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.
and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary
details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and
once a month by email. French extracted from the Terms and Definitions clause of
IEC publications issued since 2002. Some entries have been
IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and
If you wish to give us your feedback on this publication or CISPR.

need further assistance, please contact the Customer Service

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IEC 61326-2-1 ®
Edition 3.0 2020-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electrical equipment for measurement, control and laboratory use –

EMC requirements –
Part 2-1: Particular requirements – Test configurations, operational conditions

and performance criteria for sensitive test and measurement equipment for

EMC unprotected applications
Matériel électrique de mesure, de commande et de laboratoire –

Exigences relatives à la CEM –

Partie 2-1: Exigences particulières – Configurations d'essai, conditions

fonctionnelles et critères de performance pour essai de sensibilité et matériel

de mesure pour les applications non protégées de la CEM

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20; 25.040.40; 33.100.20 ISBN 978-2-8322-8949-5

– 2 – IEC 61326-2-1:2020 © IEC 2020
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 General . 5
5 EMC test plan . 6
5.1 General . 6
5.2 Configuration of EUT during testing . 6
5.3 Operation conditions of EUT during testing . 6
5.4 Specification of FUNCTIONAL PERFORMANCE . 7
5.5 Test description . 7
6 Immunity requirements . 7
6.1 Conditions during the tests. 7
6.2 Immunity test requirements . 7
6.3 Random aspects . 7
6.4 Performance criteria . 7
7 Emission requirements . 7
8 Test results and test report . 7
9 Instructions for use . 8
Annex A (normative) Immunity test requirements for PORTABLE TEST AND MEASUREMENT
EQUIPMENT powered by battery or from the circuit being measured . 9
Annex B (informative) Guide for analysis and assessment for electromagnetic
compatibility. 10

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRICAL EQUIPMENT FOR MEASUREMENT,
CONTROL AND LABORATORY USE –
EMC REQUIREMENTS –
Part 2-1: Particular requirements –
Test configurations, operational conditions and performance
criteria for sensitive test and measurement equipment
for EMC unprotected applications

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61326-2-1 has been prepared by subcommittee 65A: System
aspects, of IEC technical committee 65: Industrial-process measurement, control and
automation.
This third edition cancels and replaces the second edition published in 2012. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
– update with respect to IEC 61326-1:2020.

– 4 – IEC 61326-2-1:2020 © IEC 2020
The text of this International Standard is based on the following documents:
FDIS Report on voting
65A/976/FDIS 65A/987/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
This part of IEC 61326 is to be used in conjunction with IEC 61326-1:2020 and follows the
same numbering of clauses, subclauses, tables and figures.
When a particular subclause of IEC 61326-1 is not mentioned in this part, that subclause
applies as far as is reasonable. When this standard states “addition”, “modification” or
“replacement”, the relevant text in IEC 61326-1 is to be adapted accordingly.
NOTE The following numbering system is used:
– subclauses, tables and figures that are numbered starting from 101 are additional to those in IEC 61326-1;
– unless notes are in a new subclause or involve notes in IEC 61326-1, they are numbered starting from 101
including those in a replaced clause or subclause;
– additional annexes are lettered AA, BB, etc.
A list of all parts of IEC 61326 series, under the general title Electrical equipment for
measurement, control and laboratory use – EMC requirements, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
ELECTRICAL EQUIPMENT FOR MEASUREMENT,
CONTROL AND LABORATORY USE –
EMC REQUIREMENTS –
Part 2-1: Particular requirements –
Test configurations, operational conditions and performance
criteria for sensitive test and measurement equipment
for EMC unprotected applications

1 Scope
In addition to the scope of IEC 61326-1, this part of IEC 61326 specifies more detailed test
configurations, operational conditions and performance criteria for equipment with test and
measurement circuits (internal or, external to the equipment, or both) that are not EMC
protected for operational and/or functional reasons, as specified by the manufacturer.
The manufacturer specifies the environment for which the product is intended to be used and
selects the appropriate test level specifications of IEC 61326-1:2020.
NOTE Examples of equipment include, but are not limited to, oscilloscopes, logic analysers, spectrum analysers,
network analysers, analogue instruments, digital multimeters (DMM) and board test systems.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
Clause 2 of IEC 61326-1:2020 applies except as follows:
Addition:
IEC 61326-1:2020, Electrical equipment for measurement, control and laboratory use – EMC
requirements – Part 1: General requirements
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 61326-1:2020 and
IEC 60050-161 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
4 General
Clause 4 of IEC 61326-1:2020 applies.

– 6 – IEC 61326-2-1:2020 © IEC 2020
5 EMC test plan
5.1 General
Subclause 5.1 of IEC 61326-1:2020 applies.
5.2 Configuration of EUT during testing
Subclause 5.2 of IEC 61326-1:2020 applies, except as follows:
Addition:
5.2.4.101 I/O ports for test and measurement purposes
Test and measurement input ports shall be covered and terminated with an appropriate
impedance unless this leads to an operating condition unsuitable for measuring the emission
and immunity performance of the product. If an input signal is needed, an appropriate input
signal shall be applied using test leads or probes as specified by the manufacturer.
Test and measurement output ports not needed to evaluate the essential functions of the EUT
shall be covered and/or terminated.
Electrostatic discharges shall be applied to the mated connector or the shield of the unmated
port, but not to the inner pins of shielded port or cable connectors.
Examples include but are not limited to: USB, BNC, D-subminiature, GPIB, RS232 and
IEEE 1284-B (parallel printer port), etc.
NOTE 1 Probes and/or test leads not used to apply an input signal during test to the test and measurement ports
do not need to be connected. Such test leads can vary substantially from one application to another and are often
connected to equipment that has the covers removed and can be in various stages of disassembly to provide
access to test points inside. Connected test leads could increase emissions and/or reduce immunity in certain
applications.
NOTE 2 Covered means locally covered with a screen or shield.
5.3 Operation conditions of EUT during testing
Subclause 5.3 of IEC 61326-1:2020 applies, except as follows:
Addition:
5.3.101 Operational conditions
When both battery and mains options are available, both modes of operation shall comply.
5.3.102 Oscilloscopes
The oscilloscope ports shall be set for maximum sweep speed, maximum sensitivity and
continuous acquisition mode unless other modes are known to provide worst-case emission or
immunity results within normal applications.
5.3.103 Logic analysers
The logic analyser shall be set for data analysis modes during emission measurement and
continuous data acquisition mode during immunity testing unless other modes are known to
provide worst-case emission or immunity results within normal applications.

5.3.104 Digital multimeters (DMM)
Typical set-ups include: peak detect, maximum sensitivity (usually auto-range, if available, will
suffice) and continuous acquisition mode.
5.3.105 Other equipment
For equipment not mentioned in 5.3.102 to 5.3.104, the following philosophy shall apply.
A selection of representative operation modes shall be made, taking into account that not all
functions, but only the most typical functions of the equipment can be tested. The estimated
worst-case operating modes for normal application shall be select
...