Standard for Signal and Test Definition

IEC 62529:2012(E) provides the means to define and describe signals used in testing. It provides a set of common basic signal definitions, built upon formal mathematical specifications, so that signals can be combined to form complex signals usable across all test platforms. The standard provides support for structural textual languages and programming language interfaces for interoperability. This second edition cancels and replaces the first edition, published in 2007, and constitutes a technical revision.

General Information

Status
Published
Publication Date
20-Jun-2012
Current Stage
PPUB - Publication issued
Start Date
21-Jun-2012
Completion Date
21-Jun-2012
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IEC 62529
Edition 2.0 2012-06
IEEE Std 1641
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition
IEC 62529:2012(E) IEEE Std 1641-2010
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 62529
Edition 2.0 2012-06
IEEE Std 1641™
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
ICS 25.040; 35.060 ISBN 978-2-83220-103-9

Warning! Make sure that you obtained this publication from an authorized distributor.

---------------------- Page: 3 ----------------------
IEC 62529:2012
– ii – IEEE Std 1641-2010
Contents

1. Overview .................................................................................................................................................... 1

1.1 Scope ................................................................................................................................................... 1

1.2 Purpose ................................................................................................................................................ 1

1.3 Application .......................................................................................................................................... 1

1.4 Annexes ............................................................................................................................................... 2

2. Definitions, abbreviations, and acronyms................................................................................................... 2

2.1 Definitions ........................................................................................................................................... 2

2.2 Abbreviations and acronyms ............................................................................................................... 4

3. Structure of this standard ............................................................................................................................ 5

3.1 Layers .................................................................................................................................................. 5

3.2 Signal Modeling Language (SML) layer ............................................................................................. 6

3.3 BSC layer ............................................................................................................................................. 6

3.4 TSF layer ............................................................................................................................................. 6

3.5 Test requirement layer ......................................................................................................................... 6

3.6 Using the layers ................................................................................................................................... 7

4. Signals and SignalFunctions ....................................................................................................................... 7

4.1 Introduction ......................................................................................................................................... 7

4.2 Physical signal states ........................................................................................................................... 8

4.3 Event states .......................................................................................................................................... 9

4.4 Digital stream states ............................................................................................................................. 9

5. SML layer ................................................................................................................................................. 10

6. BSC layer ................................................................................................................................................. 11

6.1 BSC layer base classes ....................................................................................................................... 11

6.2 General description of BSCs.............................................................................................................. 11

6.3 SignalFunction template .................................................................................................................... 12

7. TSF layer .................................................................................................................................................. 12

7.1 TSF classes ........................................................................................................................................ 13

7.2 TSF signals defined by a model ......................................................................................................... 13

7.3 TSF signals defined by an external reference .................................................................................... 16

8. Test procedure language (TPL) ................................................................................................................ 16

8.1 Goals of the TPL ................................................................................................................................ 16

8.2 Elements of the TPL .......................................................................................................................... 16

8.3 Use of the TPL ................................................................................................................................... 17

9. Maximizing test platform independence................................................................................................... 17

Annex A (normative) Signal modeling language (SML) ............................................................................. 18

A.1 Use of the SML ................................................................................................................................. 18

A.2 Introduction....................................................................................................................................... 18

A.3 Physical types ................................................................................................................................... 19

A.4 Signal definitions .............................................................................................................................. 22

A.5 Pure signals ....................................................................................................................................... 24

A.6 Pure signal-combining mechanisms.................................................................................................. 26

A.7 Pure function transformations ........................................................................................................... 32

Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.
---------------------- Page: 4 ----------------------
IEC 62529:2012
IEEE Std 1641-2010 – iii –

A.8 Measuring, limiting, and sampling signals ....................................................................................... 32

A.9 Digital signals ................................................................................................................................... 34

A.10 Basic component SML .................................................................................................................... 38

A.11 Fast Fourier analysis support .......................................................................................................... 63

Annex B (normative) Basic signal components (BSC) layer ....................................................................... 65

B.1 BSC layer base classes ...................................................................................................................... 65

B.2 BSC subclasses ................................................................................................................................. 65

B.3 Description of a BSC ........................................................................................................................ 69

B.4 Physical class .................................................................................................................................... 76

B.5 PulseDefns class ................................................................................................................................ 87

B.6 SignalFunction class ......................................................................................................................... 89

Annex C (normative) Dynamic signal descriptions .................................................................................... 143

C.1 Introduction ..................................................................................................................................... 143

C.2 Basic classes .................................................................................................................................... 144

C.3 Dynamic signal goals and use cases ................................................................................................ 152

Annex D (normative) Interface definition language (IDL) basic components ........................................... 153

D.1 Introduction..................................................................................................................................... 153

D.2 IDL BSC library ............................................................................................................................. 153

Annex E (informative) Test signal framework (TSF) for C/ATLAS ......................................................... 154

E.1 Introduction ..................................................................................................................................... 154

E.2 TSF library definition in extensible markup language (XML) ........................................................ 154

E.3 Interface definition language (IDL) for the TSF for C/ATLAS ...................................................... 154

E.4 AC_SIGNAL ............................................................................. 155

E.5 AM_SIGNAL .................................................................................................................................. 157

E.6 DC_SIGNAL ............................................................................. 159

E.7 DIGITAL_PARALLEL .................................................................................................................. 161

E.8 DIGITAL_SERIAL ......................................................................................................................... 163

E.9 DIGITAL_TEST ............................................................................................................................. 165

E.10 DME_INTERROGATION ........................................................................................................... 168

E.11 DME_RESPONSE ........................................................................................................................ 171

E.12 FM_SIGNAL ........................................................................... 174

E.13 ILS_GLIDE_SLOPE .............................................................................. 177

E.14 ILS_LOCALIZER .................................................................................. 180

E.15 ILS_MARKER .............................................................................................................................. 183

E.16 PM_SIGNAL ................................................................................................................................ 186

E.17 PULSED_AC_SIGNAL .......................................................... 188

E.18 PULSED_AC_TRAIN ............................................................. 190

E.19 PULSED_DC_SIGNAL .......................................................... 192

E.20 PULSED_DC_TRAIN ............................................................. 194

E.21 RADAR_RX_SIGNAL ................................................................................................................. 196

E.22 RADAR_TX_SIGNAL............................................................ 199

E.23 RAMP_SIGNAL ..................................................................... 200

E.24 RANDOM_NOISE ....................................................................................................................... 202

E.25 RESOLVER .................................................................................................................................. 204

E.26 RS_232 .......................................................................................................................................... 207

E.27 SQUARE_WAVE ................................................................... 208

E.28 SSR_INTERROGATION ........................................................ 210

E.29 SSR_RESPONSE .................................................................... 213

E.30 STEP_SIGNAL ............................................................................................................................. 217

E.31 SUP_CAR_SIGNAL ..................................................................................................................... 219

E.32 SYNCHRO .................................................................................................................................... 221

E.33 TACAN ......................................................................................................................................... 225

Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.
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IEC 62529:2012
– iv – IEEE Std 1641-2010

E.34 TRIANGULAR_WAVE_SIGNAL ......................................... 229

E.35 VOR .............................................................................................................................................. 231

Annex F (informative) Test signal framework (TSF) library for digital pulse classes ............................... 235

F.1 Introduction ..................................................................................................................................... 235

F.2 TSF library definition in extensible markup language (XML) ........................................................ 235

F.3 Graphical models of TSFs ............................................................................................................... 235

F.4 Pulse class family of TSFs .............................................................................................................. 235

F.5 DTIF ................................................................................................................................................ 252

Annex G (normative) Carrier language requirements ................................................................................ 254

G.1 Carrier language requirements ........................................................................................................ 254

G.2 Interface definition language (IDL) ................................................................................................ 254

G.3 Datatypes ........................................................................................................................................ 254

G.4 Data-processing requirements ......................................................................................................... 259

G.5 Control structures ............................................................................................................................ 263

Annex H (normative) Test procedure language (TPL) ............................................................................... 265

H.1 TPL layer ........................................................................................................................................ 265

H.2 Elements of the TPL ....................................................................................................................... 265

H.3 Structure of test requirements ......................................................................................................... 265

H.4 Carrier language .............................................................................................................................. 265

H.5 Signal statements ............................................................................................................................ 265

H.6 Mapping of test statements to carrier language ............................................................................... 267

H.7 Test statement definitions ............................................................................................................... 267

H.8 Elements used in test statement definitions .................................................................................... 285

H.9 Attributes with multiple properties ................................................................................................. 288

H.10 Transferring data in digital signals................................................................................................ 292

H.11 Creating test requirements ............................................................................................................ 296

H.12 Delimiting TPL statements ........................................................................................................... 298

Annex I (normative) Extensible markup language (XML) signal descriptions .......................................... 300

I.1 Introduction ...................................................................................................................................... 300

I.2 XSD for BSCs .................................................................................................................................. 301

I.3 XSD for TSFs ................................................................................................................................... 302

Annex J (informative) Support for ATLAS nouns and modifiers .............................................................. 308

J.1 Signal and test definition (STD) support for ATLAS signals .......................................................... 308

J.2 STD support for ATLAS nouns ....................................................................................................... 308

J.3 STD support for C/ATLAS noun modifiers ..................................................................................... 311

J.4 Support for C/ATLAS extensions .................................................................................................... 319

Annex K (informative) Guide for maximizing test platform independence and test application

interchangeability ....................................................................................................................................... 320

K.1 Introduction..................................................................................................................................... 320

K.2 Guiding principles........................................................................................................................... 320

K.3 Best practice rules ........................................................................................................................... 320

Annex L (informative) Bibliography .......................................................................................................... 323

Annex M (informative) IEEE List of Participants ....................................................................................... 325

Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.
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IEC 62529:2012
IEEE Std 1641-2010 – v –
Standard for Signal and Test Definition
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Published by IEC under license from IEEE. © 2010 IEEE. All rights reserved.
---------------------- Page: 7 ----------------------
IEC 62529:2012
– vi – IEEE Std 1641-2010

International Standard IEC 62529 / IEEE Std 1641-2010 has been processed through IEC

technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement.

This second edition cancels and replaces the first edition, published in 2007, and

constitutes a technical revision.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
IEEE Std 1641-2010 93/322/FDIS 93/329/RVD

Full information on the voting for the approval of this standard can be found in the report

on voting indicated in the above table.
The IEC Technical Committee and IEEE Technical Committee have decided that the

contents of this publication will remain unchanged until the stability date indicated on the

IEC web site under "http://webstore.iec.ch" in the dat
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