IEC 61000-4-11:2020

Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon.
NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- rise time and fall time of transients are now defined terms in Clause 3;
- the origin of voltage dips and short interruptions is now stated in Clause 4.
The contents of the corrigendum of May 2020 and October 2022 have been included in this copy.

Compatibilité électromagnétique (CEM) - Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour les appareils à courant d’entrée inférieur ou égal à 16 A par phase

L'IEC 61000-4-11:2020 définit les méthodes d'essai d'immunité ainsi que la plage des niveaux d'essais préférentiels pour les matériels électriques et électroniques connectés à des réseaux d'alimentation à basse tension pour les creux de tension, les coupures brèves et les variations de tension. Le présent document s’applique aux matériels électriques et électroniques dont le courant assigné d’entrée ne dépasse pas 16 A par phase et destinés à être reliés à des réseaux électriques à courant alternatif de 50 Hz ou 60 Hz. Il ne s'applique pas aux matériels électriques et électroniques destinés à être reliés à des réseaux électriques à courant alternatif de 400 Hz. Les essais pour ces réseaux seront traités dans des documents IEC à venir. Le but du présent document est d'établir une référence commune pour l'évaluation de l'immunité des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension.
NOTE 1 Les essais d’immunité aux fluctuations de tension sont traités dans l’IEC 61000-4-14. La méthode d’essai décrite dans le présent document détaille une méthode sans faille pour évaluer l’immunité d’un matériel ou d’un système à un phénomène prédéfini.
NOTE 2 Comme cela est décrit dans le Guide 107 de l’IEC, ce document est une publication fondamentale en CEM destinée à l’usage des comités de produits de l’IEC. Comme cela est également mentionné dans le Guide 107, les comités de produits de l’IEC sont chargés de décider s’il convient d’utiliser ou non cette norme d’essai d’immunité et, si elle est utilisée, les comités sont responsables de la définition des niveaux d’essai appropriés. Le comité d’études 77 et ses sous-comités sont prêts à coopérer avec les comités de produits pour l’évaluation de la pertinence des essais particuliers d’immunité pour leurs produits. Cette troisième édition annule et remplace la deuxième édition parue en 2004 et l'Amendement 1:2017. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
- le temps de montée et le temps de descente sont désormais des termes définis à l’Article 3;
- l’origine des creux de tension et des coupures brèves est désormais décrite à l’Article 4.
Mots-clés : méthodes d'essai d'immunité, réseaux d'alimentation à basse tension
Le contenu du corrigendum de mai 2020 et d'octobre 2022 a été introduit dans cet exemplaire.

General Information

• Status: Published
• Publication Date: 27-Jan-2020
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Drafting Committee: WG 6 - TC 77/SC 77A/WG 6
• Current Stage: PPUB - Publication issued
• Start Date: 22-Nov-2019
• Completion Date: 28-Jan-2020

Relations

• Corrected By: IEC 61000-4-11:2020/COR1:2020 - Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
• Effective Date: 05-Sep-2023
• Corrected By: IEC 61000-4-11:2020/COR2:2022 - Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-11:2004 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-11:2004/ISH1:2010 - Interpretation Sheet 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-11:2004/AMD1:2017 - Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61000-4-11 ®
Edition 3.0 2020-01
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with input
current up to 16 A per phase
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
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latest edition, a corrigendum or an amendment might have been published.

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IEC 61000-4-11 ®
Edition 3.0 2020-01
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –

Part 4-11: Testing and measurement techniques – Voltage dips, short

interruptions and voltage variations immunity tests for equipment with input

current up to 16 A per phase
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7832-1

– 2 – IEC 61000-4-11:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 4
INTRODUCTION . 2
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 General . 9
5 Test levels . 9
5.1 General . 9
5.2 Voltage dips and short interruptions . 10
5.3 Voltage variations. 11
6 Test instrumentation . 12
6.1 Test generator . 17
6.1.1 General . 17
6.1.2 Characteristics and performance of the generator . 17
6.1.3 Verification of the characteristics of the voltage dips, short interruptions
generators . 18
6.2 Power source . 19
7 Test set-up . 19
8 Test procedures . 19
8.1 General . 19
8.2 Laboratory reference conditions . 20
8.2.1 Climatic conditions . 20
8.2.2 Electromagnetic conditions . 20
8.3 Execution of the test . 20
8.3.1 General . 20
8.3.2 Voltage dips and short interruptions . 20
8.3.3 Voltage variations (optional) . 21
9 Evaluation of test results . 21
10 Test report . 22
Annex A (normative) Test circuit details . 23
A.1 Test generator peak inrush current drive capability . 23
A.2 Current monitor's characteristics for measuring peak inrush current
capability . 23
A.3 EUT peak inrush current requirement . 23
Annex B (informative) Electromagnetic environment classes . 25
Annex C (informative) Test instrumentation. 26
Annex D (informative) Rationale for generator specification regarding voltage, rise-
time and fall-time, and inrush current capability . 29
D.1 Concept of basic standard . 29
D.2 IEC 61000-4-11:1994 (first edition) . 29
D.3 Rationale for the need of rapid fall-times . 29
D.4 Interpretation of the rise-time and fall-time requirements during EUT testing . 30
D.5 Main conclusions . 30
D.6 Rationale for inrush current capability . 30
Bibliography . 32

Figure 1 – Voltage dip - Examples . 13
Figure 2 – Short interruption . 14
Figure 3 – Detailed view of rise and fall time . 15
Figure 4 – Voltage variation . 16
Figure 5 – Phase-to-neutral and phase-to-phase testing on three-phase systems . 21
Figure A.1 – Circuit for determining the inrush current drive capability of the short
interruptions generator . 24
Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT . 24
Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions

and voltage variations . 27
Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short
interruptions and voltage variations using a power amplifier . 28

Table 1 – Preferred test levels and durations for voltage dips . 11
Table 2 – Preferred test levels and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 17

– 4 – IEC 61000-4-11:2020 RLV © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity
tests for equipment with input current up to 16 A per phase

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
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---------------
...

IEC 61000-4-11 ®
Edition 3.0 2020-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-11: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with input
current up to 16 A per phase
Compatibilité électromagnétique (CEM) –
Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux
de tension, coupures brèves et variations de tension pour les appareils
à courant d’entrée inférieur ou égal à 16 A par phase

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

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The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,
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and withdrawn publications. Also known as the International Electrotechnical Vocabulary

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IEC 61000-4-11 ®
Edition 3.0 2020-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-11: Testing and measurement techniques – Voltage dips, short

interruptions and voltage variations immunity tests for equipment with input

current up to 16 A per phase
Compatibilité électromagnétique (CEM) –

Partie 4-11: Techniques d'essai et de mesure – Essais d'immunité aux creux

de tension, coupures brèves et variations de tension pour les appareils

à courant d’entrée inférieur ou égal à 16 A par phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-7546-7

– 2 – IEC 61000-4-11:2020 © IEC 2020
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 General . 9
5 Test levels . 9
5.1 General . 9
5.2 Voltage dips and short interruptions . 9
5.3 Voltage variations . 11
6 Test instrumentation . 14
6.1 Test generator . 14
6.1.1 General. 14
6.1.2 Characteristics and performance of the generator . 15
6.1.3 Verification of the characteristics of the voltage dips, short
interruptions generators . 15
6.2 Power source . 16
7 Test set-up . 16
8 Test procedures . 17
8.1 General . 17
8.2 Laboratory reference conditions . 17
8.2.1 Climatic conditions . 17
8.2.2 Electromagnetic conditions . 18
8.3 Execution of the test . 18
8.3.1 General. 18
8.3.2 Voltage dips and short interruptions . 18
8.3.3 Voltage variations . 19
9 Evaluation of test results . 19
10 Test report . 20
Annex A (normative) Test circuit details . 21
A.1 Test generator peak inrush current drive capability . 21
A.2 Current monitor's characteristics for measuring peak inrush current
capability . 21
A.3 EUT peak inrush current requirement . 21
Annex B (informative) Electromagnetic environment classes . 23
Annex C (informative) Test instrumentation. 24
Annex D (informative) Rationale for generator specification regarding voltage, rise-
time and fall-time, and inrush current capability . 27
D.1 Concept of basic standard . 27
D.2 IEC 61000-4-11:1994 (first edition) . 27
D.3 Rationale for the need of rapid fall-times . 27
D.4 Interpretation of the rise-time and fall-time requirements during EUT testing . 28
D.5 Main conclusions . 28
D.6 Rationale for inrush current capability . 28
Bibliography . 30

Figure 1 – Voltage dip – Examples . 12
Figure 2 – Short interruption . 13
Figure 3 – Detailed view of rise and fall time . 13
Figure 4 – Voltage variation . 14
Figure 5 – Phase-to-neutral and phase-to-phase testing on three-phase systems . 19
Figure A.1 – Circuit for determining the inrush current drive capability of the short
interruptions generator . 22
Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT . 22
Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions

and voltage variations . 25
Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short
interruptions and voltage variations using a power amplifier . 26

Table 1 – Preferred test levels and durations for voltage dips . 10
Table 2 – Preferred test levels and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 15

– 4 – IEC 61000-4-11:2020 © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity
tests for equipment with input current up to 16 A per phase

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other acti
...