IEC 62529:2024
(Main)Standard for Signal and Test Definition
Standard for Signal and Test Definition
IEC 62529:2024 provides the means to define and describe signals used in testing. It provides a set of common basic signal definitions, built upon formal mathematical specifications, so that signals can be combined to form complex signals usable across all test platforms. The standard provides support for structural textual languages and programming language interfaces for interoperability. This second edition cancels and replaces the first edition, published in 2007, and constitutes a technical revision.
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IEC 62529 ®
Edition 3.0 2024-06
™
IEEE Std 1641
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition
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IEC 62529 ®
Edition 3.0 2024-06
IEEE Std 1641™
INTERNATIONAL
STANDARD
colour
inside
Standard for Signal and Test Definition
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040.01; 35.060 ISBN 978-2-8322-8703-3
IEEE Std 1641™-2022
Contents
1. Overview . 12
1.1 Scope . 12
1.2 Purpose . 12
1.3 Word Usage . 12
1.4 Application . 13
1.5 Annexes . 13
2. Definitions, abbreviations, and acronyms . 13
2.1 Definitions . 13
2.2 Abbreviations and acronyms . 15
3. Structure of this standard . 16
3.1 Layers . 16
3.2 Signal Modeling Language (SML) layer . 17
3.3 BSC layer . 17
3.4 TSF layer . 18
3.5 Test requirement layer . 18
3.6 Using the layers . 18
4. Signals and SignalFunctions . 18
4.1 Introduction . 18
4.2 Physical signal states . 19
4.3 Event states . 20
4.4 Digital stream states . 21
5. SML layer . 22
6. BSC layer . 23
6.1 BSC layer base classes. 23
6.2 General description of BSCs . 23
6.3 SignalFunction template . 24
7. TSF layer . 25
7.1 TSF classes . 25
7.2 TSF signals defined by a model . 26
7.3 TSF signals defined by an external reference . 28
8. Test procedure language (TPL) . 28
8.1 Goals of the TPL . 28
8.2 Elements of the TPL . 29
8.3 Use of the TPL . 29
9. Maximizing test platform independence . 29
Annex A (normative) Signal modeling language (SML) . 30
A.1 Use of the SML . 30
A.2 Introduction . 30
A.3 Physical types . 31
A.4 Signal definitions . 34
A.5 Pure signals . 36
A.6 Pure signal-combining mechanisms . 38
Published Published by IEC under licence by IEC under licence from IEEE. from IEEE. © 2022 IEEE. © 2022 IEEE. All rights reserved.All rights reserved.
IEEE Std 1641™-2022
A.7 Pure function transformations . 44
A.8 Measure, limiting, and sampling signals . 44
A.9 Digital signals . 46
A.10 Basic component SML. 50
A.11 Fast Fourier analysis support . 76
Annex B (normative) Basic signal components (BSC) layer . 78
B.1 BSC layer base classes . 78
B.2 BSC subclasses . 78
B.3 Description of a BSC . 83
B.4 Physical class . 91
B.5 PulseDefns class .103
B.6 SignalFunction class .104
Annex C (normative) Dynamic signal descriptions .163
C.1 Introduction .163
C.2 Basic classes .164
C.3 Dynamic signal goals and use cases .172
Annex D (normative) Interface definition language (IDL) basic components .174
D.1 Introduction .174
D.2 IDL BSC library .174
Annex E (informative) Test signal framework (TSF) for C/ATLAS .175
E.1 Introduction .175
E.2 TSF library definition in extensible markup language (XML) .175
E.3 Interface definition language (IDL) for the TSF for C/ATLAS .175
E.4 AC_SIGNAL .176
E.5 AM_SIGNAL .178
E.6 DC_SIGNAL .180
E.7 DIGITAL_PARALLEL .182
E.8 DIGITAL_SERIAL .184
E.9 DIGITAL_TEST .186
E.10 DME_INTERROGATION .189
E.11 DME_RESPONSE .192
E.12 FM_SIGNAL .195
E.13 ILS_GLIDE_SLOPE .198
E.14 I
...
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