Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

IEC 60679-1:2017 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.
This edition includes the following significant technical changes with respect to the previous edition:
a) the title has been changed;
b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;
c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series);
d) the content of Annex A has been extended;
e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;
f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;
g) Annex D has been added.

Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance de la qualité - Partie 1: Spécification générique

L’IEC 60679-1:2017 spécifie les exigences générales relatives aux oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO - Dielectric Resonator Oscillators) et les oscillateurs à résonateurs à ondes acoustiques de volume à couches (FBAR) (ci-après dénommés "Oscillateur"), sous assurance qualité par les procédures d’agrément de savoir-faire ou les procédures d’homologation.
NOTE Les oscillateurs DRO et FBAR sont à l’étude.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) le titre a été modifié;
b) des éléments supplémentaires relatifs aux oscillateurs utilisant un résonateur OAS ou MEMS ont été ajoutés dans "Termes, définitions et informations générales";
c) les méthodes de mesure de l’IEC 60679-1:2007 ont été supprimées (elles seront intégrées à la série IEC 62884);
d) le contenu de l’Annexe A a été enrichi;
e) un nouveau terme et sa définition, “DIXO” (digital interfaced crystal oscillator - oscillateur à quartz à interface numérique), ont été ajoutés;
f) un nouveau terme et sa définition, “SSXO” (spread spectrum crystal oscillator - oscillateur à quartz à spectre étalé), ont été ajoutés;
g) l’Annexe D a été ajoutée.

General Information

Status
Published
Publication Date
25-Jul-2017
Current Stage
PPUB - Publication issued
Start Date
26-Jul-2017
Completion Date
26-Jul-2017
Ref Project

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IEC 60679-1
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance
de la qualité –
Partie 1: Spécification générique
IEC 60679-1:2017-07(en-fr)
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 60679-1
Edition 4.0 2017-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Piezoelectric, dielectric and electrostatic oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs piézoélectriques, diélectriques et électrostatiques sous assurance
de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7178-0

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 60679-1:2017 © IEC 2017
CONTENTS

FOREWORD ........................................................................................................................... 4

1 Scope .............................................................................................................................. 6

2 Normative references ...................................................................................................... 6

3 Terms, definitions and general information ...................................................................... 7

3.1 General ................................................................................................................... 7

3.2 Terms and definitions .............................................................................................. 7

3.3 Preferred values for ratings and characteristics .................................................... 22

3.3.1 General ......................................................................................................... 22

3.3.2 Climatic category (40/85/56) .......................................................................... 22

3.3.3 Bump severity ................................................................................................ 22

3.3.4 Vibration severity ........................................................................................... 22

3.3.5 Shock severity ............................................................................................... 23

3.3.6 Leak rate ....................................................................................................... 23

3.4 Marking ................................................................................................................. 23

3.4.1 General ......................................................................................................... 23

3.4.2 Packaging...................................................................................................... 23

4 Quality assessment procedures ..................................................................................... 23

4.1 General ................................................................................................................. 23

4.2 Primary stage of manufacture ............................................................................... 24

4.3 Structurally similar components ............................................................................ 24

4.4 Subcontracting ...................................................................................................... 24

4.5 Incorporated components ...................................................................................... 24

4.6 Manufacturer’s approval ........................................................................................ 24

4.7 Approval procedures ............................................................................................. 24

4.7.1 General ......................................................................................................... 24

4.7.2 Capability approval ........................................................................................ 24

4.7.3 Qualification approval .................................................................................... 25

4.8 Procedures for capability approval ........................................................................ 25

4.8.1 General ......................................................................................................... 25

4.8.2 Eligibility for capability approval ..................................................................... 25

4.8.3 Application for capability approval ................................................................. 25

4.8.4 Granting of capability approval ...................................................................... 25

4.8.5 Capability manual .......................................................................................... 25

4.9 Procedures for qualification approval .................................................................... 26

4.9.1 General ......................................................................................................... 26

4.9.2 Eligibility for qualification approval ................................................................. 26

4.9.3 Application for qualification approval ............................................................. 26

4.9.4 Granting of qualification approval .................................................................. 26

4.9.5 Quality conformance inspection ..................................................................... 26

4.10 Test procedures .................................................................................................... 26

4.11 Screening requirements ........................................................................................ 26

4.12 Rework and repair work ........................................................................................ 26

4.12.1 Rework .......................................................................................................... 26

4.12.2 Repair work ................................................................................................... 26

4.13 Certified test records............................................................................................. 27

4.14 Validity of release ................................................................................................. 27

4.15 Release for delivery .............................................................................................. 27

---------------------- Page: 4 ----------------------
IEC 60679-1:2017 © IEC 2017 – 3 –

4.16 Unchecked parameters ......................................................................................... 27

Annex A (normative) Load circuit for logic drive ................................................................... 28

A.1 TTL and Schottky .................................................................................................. 28

A.2 CMOS ................................................................................................................... 30

A.3 ECL ...................................................................................................................... 30

A.4 LVDS .................................................................................................................... 31

Annex B (normative) Latch-up test ....................................................................................... 32

B.1 Definition .............................................................................................................. 32

B.1.1 Latch-up ........................................................................................................ 32

B.1.2 Test procedure .............................................................................................. 32

B.2 Test method .......................................................................................................... 32

Annex C (normative) Electrostatic discharge sensitivity classification .................................. 33

C.1 Definition .............................................................................................................. 33

C.1.1 Electrostatic discharge (ESD) ........................................................................ 33

C.1.2 Test procedure .............................................................................................. 33

C.2 Test methods ........................................................................................................ 33

C.2.1 General ......................................................................................................... 33

C.2.2 Leaded oscillator ........................................................................................... 33

C.2.3 SMD oscillator ............................................................................................... 33

C.2.4 The impact of ESD on Oscillator in steady-state ............................................ 33

Annex D (normative) Digital interfaced crystal oscillator’s function ....................................... 34

Bibliography .......................................................................................................................... 35

Figure 1 – Basic configurations of SAW resonators ................................................................. 9

Figure 2 – Example of the use of frequency offset................................................................. 11

Figure 3 – Linearity of frequency modulation deviation .......................................................... 16

Figure 4 – Characteristics of an output waveform .................................................................. 18

Figure 5 – Definition of start-up time ..................................................................................... 19

Figure 6 – Clock signal with period jitter................................................................................ 19

Figure 7 – Phase jitter measures .......................................................................................... 20

Figure 8 – Gaussian distribution of jitter ................................................................................ 20

Figure 9 – Jitter amplitude and period of jitter frequency ....................................................... 21

Figure 10 – Jitter tolerance according to ITU-T G.825, ATIS-0900101, Telcordia GR-

253 and ETSI EN 300 462 .................................................................................................... 21

Figure A.1 – Circuit for TTL ................................................................................................... 28

Figure A.2 – Circuit for Schottky logic ................................................................................... 29

Figure A.3 – Circuit for PECL ................................................................................................ 30

Figure A.4 – Circuit for LVDS ................................................................................................ 31

Table A.1 – Values to be used when calculating R and R ................................................... 30

1 2

Table A.2 – Operating condition ............................................................................................ 31

Table A.3 – DC Electrical characteristics output load = 50 Ω to Vcc-2V ................................. 31

Table D.1 – Function of the digital interface .......................................................................... 34

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– 4 – IEC 60679-1:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC
OSCILLATORS OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

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5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

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6) All users should ensure that they have the latest edition of this publication.

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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 60679-1 has been prepared by IEC technical committee TC 49:

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency

control, selection and detection.

This bilingual version (2019-07) corresponds to the monolingual English version, published in

2017-07.

This fourth edition cancels and replaces the third edition published in 2007. This edition

constitutes a technical revision.
---------------------- Page: 6 ----------------------
IEC 60679-1:2017 © IEC 2017 – 5 –

This edition includes the following significant technical changes with respect to the previous

edition:
a) the title has been changed;

b) additional matters related to oscillator using SAW or MEMS resonator in "Terms,

definitions and general information" have been included;

c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to

IEC 62884 series);
d) the content of Annex A has been extended;

e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;

f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;

g) Annex D has been added.
The text of this standard is based on the following documents:
FDIS Report on voting
49/1229/FDIS 49/1233/RVD

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.
The French version of this standard has not been voted upon.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts of the IEC 60679 series, published under the general title piezoelectric,

dielectric and electrostatic oscillators of assessed quality can be found on the IEC website.

Future standards in this series will carry the new general title as cited above. Titles of existing

standards in this series will be updated at the time of the next edition.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
---------------------- Page: 7 ----------------------
– 6 – IEC 60679-1:2017 © IEC 2017
PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC
OSCILLATORS OF ASSESSED QUALITY –
Part 1: Generic specification
1 Scope

This part of IEC 60679 specifies general requirements for piezoelectric, dielectric and

electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using

FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability

approval or qualification approval procedures.

NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.

2 Normative references

The following documents are referred to in the text in such a way that some or all of their

content constitutes requirements of this document. For dated references, only the edition

cited applies. For undated references, the latest edition of the referenced document (including

any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology

IEC 60050-561, International electrotecnical vocabulary – Part 561: Piezoelectric, dielectric

and electrostatic devices and associated materials for frequency control, selection and

detection. Available at www.electropedia.org

IEC 60469, Transitions, pulses and related waveforms – Terms, definitions and algorithms

IEC 60617, Graphical symbols for diagrams. Available at http://std.iec.ch/iec60617

IEC 60748-2, Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits

IEC 60749-26, Semiconductor devices – Mechanical and climatic test methods – Part 26:

Electrostatic discharge (ESD) sensitivity testing – Human body model (HBM)

IEC 60749-27, Semiconductor devices – Mechanical and climatic test methods – Part 27:

Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

IEC TR 61000-4-1, Electromagnetic compatibility (EMC) – Part 4-1: Testing and measurement

techniques – Overview of the IEC 61000-4 series

IEC 61340-5-1, Electrostatics – Part 5-1: Protection of electronic devices from electrostatic

phenomena – General requirements

IEC 62884-1:2017, Measurement techniques of piezoelectric, dielectric, and electrostatic

oscillators – Part 1: Basic methods for the measurement
ISO 80000-1, Quantities and units – Part 1: General

Where any discrepancies occur for any reason, documents shall rank in the following order of

precedence:
---------------------- Page: 8 ----------------------
IEC 60679-1:2017 © IEC 2017 – 7 –
• detail specification;
• sectional specification;
• generic specification;

• any other international documents (for example of the IEC) to which reference is made.

The same order of precedence shall apply to equivalent national documents.
3 Terms, definitions and general information
3.1 General

Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken

from the following standards:
• IEC 60027;
• IEC 60050-561;
• IEC 60469;
• IEC 60617;
• ISO 80000-1.
3.2 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.2.1
simple packaged crystal oscillator
SPXO

crystal controlled oscillator having no means of temperature control or compensation,

exhibiting a frequency/temperature characteristic determined substantially by the quartz

crystal resonator employed
[SOURCE: IEC 60050-561:2014, 561-03-30]
3.2.2
overtone crystal controlled oscillator

oscillator designed to operate with the controlling piezoelectric resonator functioning in a

specified mechanical overtone order of vibration

[SOURCE: IEC 60050-561:2014, 561-03-20, modified – The word "functioning" has been

added.]
3.2.3
crystal cut

orientation of the crystal element with respect to the crystallographic axes of the crystal

Note 1 to entry: It can be desirable to specify the cut (and hence the general form of the frequency/temperature

performance) of a crystal unit used in an oscillator application. The choice of the crystal cut will imply certain

attributes of the oscillator which may not otherwise appear in the detail specification.

[SOURCE: IEC 60050-561:2014, 561-03-04]
---------------------- Page: 9 ----------------------
– 8 – IEC 60679-1:2017 © IEC 2017
3.2.4
voltage controlled crystal oscillator
VCXO

crystal controlled oscillator, the frequency of which can be deviated or modulated according to

a specific relation, through application of a control voltage
[SOURCE: IEC 60050-561:2014, 561-03-41]
3.2.5
temperature compensated crystal oscillator
TCXO

crystal controlled oscillator whose frequency deviation due to temperature is reduced by

means of a compensation system, incorporated in the device
[SOURCE: IEC 60050-561:2014, 561-03-36]
3.2.6
oven controlled crystal oscillator
OCXO

crystal controlled oscillator in which at least the piezoelectric resonator is temperature

controlled

Note 1 to entry: This mode of operation ensures that the oscillator frequency will remain sensibly constant over

the operating temperature range of the OCXO, therefore independent of the frequency/temperature characteristic

of the crystal unit.

[SOURCE: IEC 60050-561:2014, 561-03-19, modified – The note to entry has been added.]

3.2.7
surface acoustic wave
SAW

acoustic wave, propagating along the surface of an elastic substrate, the amplitude of which

decays exponentially with substrate depth
[SOURCE: IEC 60050-561:2014, 561-01-86]
3.2.8
SAWR
surface acoustic wave resonator
SAW resonator
resonator using multiple reflections of surface acoustic waves

[SOURCE: IEC 60050-561:2014, 561-01-87, modified – The term "SAW resonator" has been

added.]
3.2.9
one-port SAW resonator
SAW resonator having a pair of terminals
SEE: Figure 1a.

[SOURCE: IEC 60050-561:2014, 561-01-57, modified – The figure reference has been changed.]

3.2.10
two-port SAW resonator
SAW resonator having input and output ports
SEE: Figure 1b

[SOURCE: IEC 60050-561:2014, 561-01-94, modified – The figure reference has been changed.]

---------------------- Page: 10 ----------------------
IEC 60679-1:2017 © IEC 2017 – 9 –
IEC
a) One-port resonator with opened array
IEC
b) Two-port resonator with shorted arrays
Figure 1 – Basic configurations of SAW resonators
3.2.11
SAW oscillator
oscillator that uses a SAW resonator as the main frequency controlling element
3.2.12
simple packaged SAW oscillator
SPSO

SAW oscillator having no means of temperature control or compensation, exhibiting a

frequency/temperature characteristic determined substantially by SAW resonator employed

[SOURCE: IEC 60050-561:2014, 561-03-30, modified – change from crystal oscillator to SAW

oscillator and from crystal resonator to SAW resonator.]
3.2.13
voltage controlled SAW oscillator
VCSO
...

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