IEC 61000-4-15:2010
(Main)Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications
Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications
IEC 61000-4-15:2010 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with this standard. The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a correction factor can be applied for those other voltages. Some of these correction factors are provided in the Annex B. Detailed specifications for voltages and frequencies other than those given above, remain under consideration. The object of this part of IEC 61000 is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit values of flicker severity. This second edition cancels and replaces the first edition published in 1997 and its Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds or clarifies the definition of several directly measured parameters, so that diverging interpretations are avoided. It has the status of a basic EMC publication in accordance with IEC Guide 107.
The contents of the corrigendum of March 2012 have been included in this copy.
Compatibilité électromagnétique (CEM) - Partie 4-15: Techniques d'essai et de mesure - Flickermètre - Spécifications fonctionnelles et de conception
IEC 61000-4-15:2010 traite des spécifications fonctionnelles et de conception d'un appareil mesurant le flicker, destiné à indiquer le niveau correct de perception du flicker du flux lumineux (le flicker) pour toutes les formes d'ondes de fluctuation de la tension rencontrées dans la pratique. On y présente des informations permettant de construire un tel instrument. Une méthode d'évaluation de la sévérité du flicker est fournie à partir des résultats obtenus avec des flickermètres en conformité avec cette norme. Les spécifications du flickermètre dans cette partie concernent uniquement les mesures desentrées de120 V et 230 V, 50Hz et 60Hz. Les caractéristiquesde certaineslampesà incandescence pour d'autres tensions sont suffisamment similaires aux valeurs des Tableaux 1 et 2 pour que l'utilisation d'un facteur de correction puisse être appliquée à ces autres tensions. Certains de ces facteurs de correction sont fournis à l'Annexe B. Des spécifications détaillées pour des tensions et des fréquences autres que celles données ci-dessus sont à l'étude. L'objet de la présente partie de la CEI 61000 est de fournir les informations nécessaires à la conception et à la réalisation d'un flickermètre analogique ou numérique. Elle ne spécifie pas les valeurs limites tolérables du flicker. Cette deuxième édition annule et remplace la première édition publiée en 1997 et son amendement 1 (2003), et constitue une révision technique. Cette nouvelle édition, en particulier, ajoute ou clarifie la définition de plusieurs paramètres mesurés directement, de telle façon que l'on évite des interprétations divergentes. Elle a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI. Le contenu du corrigendum de mars 2012 a été pris en considération dans cet exemplaire.
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IEC 61000-4-15 ®
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications
fonctionnelles et de conception
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IEC 61000-4-15 ®
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications
fonctionnelles et de conception
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
X
CODE PRIX
ICS 33.100.20 ISBN 978-2-88912-076-5
IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
IEC 61000-4-15
Edition 2.0 2010-08
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: EMC – Low frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
FDIS Report on voting
77A/966/FDIS 77A/973/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of requirements for rectangular voltage modulation with duty ratio
according to IEC 61000-4-15: Electromagnetic compatibility (EMC) – Testing and
measurement techniques – Flickermeter – Functional and design specifications.
IEC 61000-4-15 Ed 2 gives requirements in 6.8 for what is called “Rectangular voltage
changes with 20 % duty cycle”. Table 11 provides the test specification for rectangular voltage
changes with duty ratio. The requirements per Table 11 and the associated tests patterns
caused some questions in the past year, and therefore IEC/SC77A/WG-2 wishes to clarify the
title and interpretation per 6.8 which should be read as follows:
6.8 Rectangular voltage modulation for 20 % of the time
The amplitude of the test voltage U is rectangularly modulated with a 50 % duty cycle at 28
Hz. Every minute the amplitude modulation is switched on for 12 s and off for 48 s. Table 11
specifies the modulation depth in terms of voltage fluctuation (∆U/U), which is further
specified in Annex B. The transition time at the edges of the rectangular modulation shall be
less than 0,5 ms.
The ten-minute P indication of the meter under test shall be 1,00 with a tolerance of ± 5 %.
st
Figure 1 shows a ∆U/U = 35 % for illustration purposes, as a 1 % to 2 % modulation would not
be visible. Only 400 ms of the time axis is depicted, showing 200 ms on each side of the
modulation on/off switching at 12 s.
NOTE The above text in 6.8 will be considered as a replacement for the original text when
IEC 61000-4-15 is updated either through an amendment or replaced by a new edition.
__________
ICS 33.100.20
– 2 – 61000-4-15 © IEC:2010
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object .7
2 Normative references.7
3 Parameters and symbols.8
3.1 Directly measured parameters and characteristics .8
3.1.1 General .8
3.1.2 Half period rms value of the voltage .8
3.1.3 Half period rms value characteristics.8
3.1.4 Relative half period rms value characteristics.8
3.1.5 Steady state voltage and voltage change characteristics .8
3.1.6 Steady state voltage change .9
3.1.7 Maximum voltage change during a voltage change characteristic .9
3.1.8 Maximum steady state voltage change during an observation period .9
3.1.9 Maximum absolute voltage change during an observation period .10
3.1.10 Voltage deviation .10
3.1.11 Centre voltage .10
3.2 Symbols .10
4 Description of the instrument .11
4.1 General .11
4.2 Block 1 – Input voltage adaptor.11
4.3 Block 2 – Squaring multiplier.11
4.4 Block 3 – Weighting filters .12
4.5 Block 4 – Squaring and smoothing .12
4.6 Block 5 – On-line statistical analysis .12
4.7 Outputs .13
4.7.1 General .13
4.7.2 P output.13
lin
4.7.3 P output .13
inst
4.7.4 P output .13
st
4.7.5 P output .13
lt
4.7.6 d-meter outputs .13
5 Specification.13
5.1 Response and accuracy.13
5.2 Input voltage ranges .18
5.3 Voltage adaptor .18
5.4 Weighting filters.18
5.5 Weighting filter response in block 3.18
5.6 Squaring multiplier and sliding mean filter .19
5.7 General statistical analysis procedure .19
5.7.1 General .19
5.7.2 Short-term flicker evaluation .19
5.7.3 Long-term flicker evaluation .20
6 Flickermeter tests .20
6.1 General .20
6.2 Sinusoidal/rectangular voltage changes .21
61000-4-15 © IEC:2010 – 3 –
6.3 Rectangular voltage changes and performance testing.21
6.4 Combined frequency and voltage changes – Class F1 flickermeters .22
6.5 Distorted voltage with multiple zero crossings – Class F1 flickermeters .23
6.6 Bandwidth test using harmonic and inter-harmonic side band modulation .23
6.7 Phase jumps – Class F1 flickermeters .24
6.8 Rectangular voltage changes with 20 % duty cycle .24
6.9 d parameter test, d , d , and d(t) > 3,3% .25
c max
7 Environmental and other requirements .27
7.1 General .27
7.2 Insulation, climatic, electromagnetic compatibility, and other tests.27
Annex A (normative) Techniques to improve accuracy of flicker evaluation .30
Annex B (informative) Meaning of ΔU/U and number of voltage changes, d , d(t), d
c max
examples .32
Annex C (informative) Sample protocols for type testing .36
Bibliography .40
Figure 1 – Illustration of 28 Hz modulated test voltage with 20 % duty cycle .25
Figure 2 – Functional diagram of IEC flickermeter .28
Figure 3 – Basic illustration of the time-at-level method for P = 2,000 .29
st
Figure B.1 – Rectangular voltage change ΔU/U = 40 %, 8,8 Hz, 17,6 changes/second.33
Figure B.2 – Illustration of “d” parameter definitions.35
Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for
sinusoidal voltage fluctuations .14
Table 1b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for
sinusoidal voltage fluctuations .15
Table 2a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for
rectangular voltage fluctuations .16
Table 2b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for
rectangular voltage fluctuations .17
Table 3 – Indicative values for the parameters of lamps.19
Table 4 – Test specifications for flickermeter.21
Table 5 – Test specification for flickermeter classifier.22
Table 6 – Test specification for combined frequency and voltage changes – Class F1
flickermeters .23
Table 7 – Test specification for distorted voltage with multiple zero crossings – Class F1
flickermeters .23
Table 8 – 8,8 Hz modulation depth for distorted voltage test – Class F 1 flickermeters .23
Table 9 – Test specification for Harmonics with side band – Class F1 flickermeters .24
Table 10 – Test specification for phase jumps – Class F1 flickermeters .24
Table 11 – Test specification for rectangular voltage changes with duty ratio .24
Table 12 – Test specification for d , d , t > 3,3 % .25
c max (d(t))
Table 13 – Test specification for d , d , t > 3,3 % .26
c max (d(t))
Table B.1 – Correction factor for other voltage/frequency combinations .33
– 4 – 61000-4-15 © IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-15 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
IEC 61000-4-15 is based on work by the “Disturbances” Working Group of the International
Union for Electroheat (UIE), on work of the IEEE, and on work within IEC itself.
It forms part 4-15 of the IEC 61000 series. It has the status of a basic EMC publication in
accordance with IEC Guide 107.
This second edition cancels and replaces the first edition published in 1997 and its
Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds
or clarifies the definition of several directly measured parameters, so that diverging
interpretations are avoided.
61000-4-15 © IEC:2010 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
77A/722/FDIS 77A/730/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 61000 series, under the general title Electromagnetic compatibility
(EMC) can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of March 2012 and Interpretation Sheet 1 of August 2017
have been included in this copy.
– 6 – 61000-4-15 © IEC:2010
INTRODUCTION
IEC 61000-4 is a part of the IEC 61000 series, according to the following structure:
Part 1: General
General consideration (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards,
as technical specifications or technical reports, some of which have already been published as
sections. Others are and will be published with the part number followed by a dash and
completed by a second number identifying the subdivision (example: IEC 61000-6-1).
61000-4-15 © IEC:2010 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
1 Scope and object
This part of IEC 61000 gives a functional and design specification for flicker measuring
apparatus intended to indicate the correct flicker perception level for all practical voltage
fluctuation waveforms. Information is presented to enable such an instrument to be
constructed. A method is given for the evaluation of flicker severity on the basis of the output of
flickermeters complying with this standard.
The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V
and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other
voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a
correction factor can be applied for those other voltages. Some of these correction factors are
provided in the Annex B. Detailed specifications for voltages and frequencies other than those
given above, remain under consideration.
The object of this part of IEC 61000 is to provide basic information for the design and the
instrumentation of an analogue or digital flicker measuring apparatus. It does not give
tolerance limit values of flicker severity.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60068 (all parts), Environmental testing
IEC 61000-3-3, Electromagnetic compatibility (EMC) – Part 3-3: Limits – Limitation of voltage
changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment
with rated current ≤16 A per phase and not subject to conditional connection
IEC 61000-3-11, Electromagnetic compatibility (EMC) – Part 3-11: Limits – Limitation of
voltage changes, voltage fluctuations and flicker in public low-voltage supply systems –
Equipment with rated current ≤75 A and subject to conditional connection
IEC 61010-1, Safety requirements for electrical equipment for measurement, control, and lab-
oratory use – Part 1: General requirements
IEC 61326-1, Electrical equipment for measurement, control and laboratory use – EMC
requirements – Part 1: General requirements
– 8 – 61000-4-15 © IEC:2010
3 Parameters and symbols
3.1 Directly measured parameters and characteristics
3.1.1 General
The examples in Figure B.2a, Figure B.2b, Figure B.2c and Figure B.2d are intended to assist
flickermeter manufacturers with the correct implementation for the determination of the
parameters specified in this clause.
3.1.2 Half period rms value of the voltage
U
hp
Is the rms voltage of the mains supply voltage, determined over a half period, between
consecutive zero crossings of the fundamental frequency voltage.
3.1.3 Half period rms value characteristics
U (t)
hp
Are the characteristics versus time of the half period rms value, determined from successive
U values, see also the examples in Annex B.
hp
3.1.4 Relative half period rms value characteristics
d (t)
hp
The characteristics versus time of the half period rms values expressed as a ratio of the
nominal voltage U .
n
d (t) = U (t)/U
hp hp n
3.1.5 Steady state voltage and voltage change characteristics
This subclause defines the evaluation of half cycle rms voltage values over time. Two basic
conditions are recognized, being periods where the voltage remains in steady state and periods
where voltage changes occur.
A steady state condition exists when the voltage U remains within the specified tolerance
hp
band of ±0,2 % for a minimum of 100/120 half cycles (50 Hz/60 Hz) of the fundamental
frequency.
At the beginning of the test, the average rms voltage, as measured during the last second
preceding the test observation period, shall be used as the starting reference value for d , and
c
d (t) calculations, as well as for the purpose of d , and d(t) measurements. In the event that
hp max
no steady state condition during given tests is established, the parameter d shall be reported
c
to be zero.
As the measurement during a test progresses, and a steady state condition remains present,
the sliding 1 s average value U of U is determined, i.e. the last 100 (120 for 60 Hz)
hp_avg hp
values of U are used to compute U . This value U is subsequently used to
hp hp_avg hp_avg
determine whether or not the steady state condition continues, and it is also the reference for
d and d determination in the event that a voltage change occurs.
c max
For the determination of a new steady state condition “ d ” after a voltage change has
c
i
occurred, a first value d = d (t = t ) is used. Around this value a tolerance band of
start_i hp start
±0,002 U (±0,2 % of U ) is determined. The steady state condition is considered to be present
n n
if U (t) does not leave the tolerance band for 100 half consecutive periods (120 for 60 Hz) of
hp
the fundamental frequency.
61000-4-15 © IEC:2010 – 9 –
NOTE The use of this U parameter prevents that very slowly changing line voltages trigger a d or d
hp-avg c max
evaluation, while minimizing deviations of up to 0,4 % of U ( + and – 0,2 %) between two measuring instruments.
n
The steady state condition ends when a subsequent value U (t = t ) exceeds the tolerance
hp x
band: d (t = t ) > d +0,002 or d (t = t ) < d –0,002.
hp x hp_avg hp x hp_avg
The last value within the tolerance band, is denoted as d = d (t = t ). The value
end hp x −1
i
d (t = t ) is used as the starting value for the determination of the next steady state condition
hp x
d (= d ) .
c start
i+1 i+1
If any value d (t > t ) fails the tolerance band prior to the required 100/120 half periods for
hp x
establishing steady state, this new U is used as the starting value for the determination of the
hp
next steady state condition d . Thus, a new steady state condition is present the instant
c
i+1
U can be determined.
hp_avg
3.1.6 Steady state voltage change
d
c
i
Is the value of the difference between two successive steady state values, normally expressed
as a percent of U , i.e. d − d .
n end start
i−1
The polarity of change(s) in steady state condition(s) shall be indicated. As follows from the
above formula, if the voltage decreases during a change characteristic, the resulting d value
c
will be positive. If the voltage increases during a change characteristic the resulting d value
c
will be negative.
3.1.7 Maximum voltage change during a voltage change characteristic
d
max
i
The absolute value of the maximum difference between the last steady state condition d
end
i−1
and following d (t) values, observed during a voltage change characteristic, normally
hp
expressed as a percent of U .
n
d = max (d – d (t))
max end hp
i i-1
The d evaluation ends as soon as a new steady state condition is established, or at the
max
i
end of the observation period. The polarity of change(s) shall be indicated. As follows from the
above formula, if the maximum voltage deviation is observed during a reduction in voltage
versus d the resulting d value will be positive. If the maximum voltage deviation is
end max
i−1 i
observed during a voltage increase with respect to the previous d the resulting d
end max
i−1 i
value will be negative.
3.1.8 Maximum steady state voltage change during an observation period
d
c
The highest absolute value of all d values, observed during an observation period, is called
c
i
d .
c
d = max( d )
c c
i
i
– 10 – 61000-4-15 © IEC:2010
3.1.9 Maximum absolute voltage change during an observation period
d
max
The highest absolute value of all d values, observed during an observation period, is called
max
i
d .
max
d = max( d )|
max max
i
i
3.1.10 Voltage deviation
d(t)
The deviation of actual d (t) from the previous d inside a voltage change characteristic is
end
hp
i−1
called d(t), and is expressed as a percentage of U .
n
d(t) = d − d (t)
end hp
i−1
Polarity is optional. If polarity is shown, a voltage drop is considered to be a positive value.
NOTE The d(t) limit evaluation in IEC 61000-3-3 with the maximum permitted limit of 3,3 % for up to 500 ms is
generally intended to evaluate the inrush current pattern of the equipment under test. Thus, as soon as a new
U is established, the d(t) evaluation is ended. When a new voltage change occurs, a new d(t) evaluation is
hp_avg
started. The maximum duration that d(t) exceeds the 3,3 % limit value for any of the individual d(t) evaluations
during the observation period, is used for the comparison against the 500 ms limit, and is reported for the test.
3.1.11 Centre voltage
U
c
The voltage around which the modulation pattern is centered, such as required for the classifier
test method, or periodic calibration tests in 6.3, Table 5.
3.2 Symbols
T short term interval for the P evaluation
short st
NOTE Unless otherwise specified, the short-term interval T is 10 min.
short
P short-term flicker severity
st
NOTE Unless otherwise specified, the P evaluation time is 10 min. For the purpose of power
st
quality surveys and studies, other time intervals may be used, and should be defined in the index.
For example a 1 min interval should be written as P .
st,1m
T long-term time interval for the P evaluation, which is always an integer multiple of
lt
long
the short term flicker severity evaluation P .
st
NOTE Unless otherwise specified, the long-term interval T is 12 × 10 min, i.e. 2 h. For the
long
purpose of power quality surveys and studies other time intervals may be used.
long-term flicker severity
P
lt
N
P
∑
3 st
i
i =1
P =
lt
N
where P (i = 1, 2, 3, .) are consecutive readings of the short-term severity P .
st st
i
NOTE Unless otherwise specified, P is calculated over discrete T periods. Each time a T
lt long long
period has expired, a new P calculation is started.
lt
61000-4-15 © IEC:2010 – 11 –
instantaneous flicker sensation
P
inst
NOTE In previous editions of this standard this output was called "Output 5".
peak value of the instantaneous flicker sensation P measured during the
P inst
inst,max
observation period
demodulated voltage change signal, after passing through block 3 of the
P
lin
flickermeter
half period rms value of the voltage
U
hp
sliding 1 s average of U
U hp
hp-avg
centre voltage
U
c
ralative half period rms value of the voltage
d
hp
maximum steady state voltage change during an observation period
d
c
voltage deviation
d(t)
maximum absolute voltage change during the observation period
d
max
4 Description of the instrument
4.1 General
The description below is based on a digital implementation of the flickermeter. Analogue
implementations are allowed provided they deliver the same results. For the purpose of
compliance testing and power quality surveys the results obtained with a digital instrument,
complying with this standard, are definitive.
The flickermeter architecture is described by the block diagram of Figure 2. It can be divided
into two parts, each performing one of the following tasks:
– simulation of the response of the lamp-eye-brain chain;
– on-line statistical analysis of the flicker signal and presentation of the results.
The first task is performed by blocks 2, 3 and 4 as illustrated in Figure 2, while the second task
is accomplished by block 5.
4.2 Block 1 – Input voltage adaptor
This block contains a voltage adapting circuit that scales the input mains frequency voltage to
an internal reference level as defined in 5.3. This method permits flicker measurements to be
made, independently of the actual input carrier voltage level and may be expressed as a per
cent ratio.
4.3 Block 2 – Squaring multiplier
The purpose of this block is to recover the voltage fluctuation by squaring the input voltage
scaled to the reference level, thus simulating the behavior of a lamp.
NOTE This multiplier, together with the Butterworth filter in block 3, operates as a demodulator.
– 12 – 61000-4-15 © IEC:2010
4.4 Block 3 – Weighting filters
Block 3 is composed of a cascade of two filters, which can precede or follow the selective filter
circuit. The first low-pass filter eliminates the double mains frequency ripple components of the
demodulator output.
The high pass filter (first order, −3 dB at 0,05 Hz) can be used to eliminate any d.c. voltage
component. The values in the calibration Tables 1a and 1b and Tables 2a and 2b, and the
performance test Table 5, include the effect of this HP filter with the 0,05 Hz corner frequency.
The second filter is a weighting filter block that simulates the frequency response of the human
visual system to sinusoidal voltage fluctuations of a coiled filament gas-filled lamp (60 W /
230 V and/or 60 W / 120 V).
NOTE 1 The response function is based on the perceptibility threshold found at each frequency by 50 % of the
persons tested.
NOTE 2 A reference filament lamp for 100 V systems would have a different frequency response and would
require a corresponding adjustment of the weighting filter. The characteristics of discharge and LED lamps are
totally different, and substantial modifications to the calibration tables in this standard would be necessary if they
were taken into account. Correction factors for several common voltage/frequency combinations are given in
Clause B.2.
NOTE 3 Block 3 alone is based on the borderline perceptibility curve for sinusoidal voltage fluctuations; the
correct weighting of non-sinusoidal and arbitrary voltage fluctuations is achieved by an appropriate choice of the
complex transfer function for blocks 3 and 4. Accordingly, the correct performance of the model has also been
checked with periodic rectangular signals as well as with transient signals. Some of these signals are illustrated in
the Annex B.
4.5 Block 4 – Squaring and smoothing
Block 4 is composed of a squaring multiplier and a first order low-pass filter. The human flicker
perception, by the eye and brain combination, of voltage fluctuations applied to the reference
lamp, is simulated by the combined non-linear response of blocks 2, 3 and 4.
The output of block 4 represents the instantaneous flicker sensation P .
inst
4.6 Block 5 – On-line statistical analysis
Block 5 performs an on-line analysis of the flicker level, thus allowing direct calculation of
significant evaluation parameters.
A suitable interface, either with analog signals or digital data transfer, allows data presentation
and recording. The purpose of this block is to derive flicker severity indications by means of
statistical analysis. This statistical analysis, performed on-line through block 5, shall be made
by sampling the instantaneous flicker signal level and subdividing these samples into a suitable
number of classes.
Every time that the applicable value occurs, the counter of the corresponding class is
incremented by one. In this way, the frequency distribution function of the P values is
inst
obtained. By choosing a sufficiently high sampling frequency, the final result at the end of the
measuring interval represents the distribution of flicker level duration in each class. Adding the
content of the counters of all classes and expressing the count of each class relative to the
total gives the probability density function of the flicker levels.
From this function the cumulative probability function is obtained, which in turn is used in the
time-at-level statistical method. Figure 3 schematically represents the statistical analysis
method, limited for simplicity to only 15 classes in the P calculation for a performance test
st
using the modulation setting of 1,788 % (i.e. factor k = 2 ) at 39 CPM (0,325 Hz), for a target
P value of 2,000 as defined in 6.2 and Table 5 for 230 V/50 Hz.
st
61000-4-15 © IEC:2010 – 13 –
From the cumulative probability function, significant statistical values can be obtained such as
mean, standard deviation, flicker level being exceeded for a given percentage of time or,
alternatively, the percentage of time that an assigned flicker level has been exceeded.
For on-line processing, immediately after the conclusion of each short time interval, the
statistical analysis of the next interval is started and the results for the just completed interval
are made available for output. In this way, n short time analyses will be available for a given
observation period T together with the results for the total interval.
long
4.7 Outputs
4.7.1 General
The flickermeter diagram in Figure 2 shows a number of mandatory outputs. The outputs
marked with an asterisk are optional, and allow full exploitation of the instrument’s potential for
the investigation of voltage fluctuations. Further optional outputs may be considered.
4.7.2 P output
lin
P output is optional and mainly intended for flicker minimization purposes. This output is
lin
proportional to the input voltage changes.
4.7.3 P output
inst
This output, formerly called output 5, is mandatory. It represents the instantaneous flicker
sensation and can be recorded for later processing. It shall be provided as an analogue signal
or via a digital interface. For tests of Tables 1 and 2, the maximum value of P is observed.
inst
4.7.4 P output
st
The P output in block 5 is mandatory.
st
4.7.5 P output
lt
The P output is mandatory.
lt
4.7.6 d-meter outputs
For compliance tests according to IEC 61000-3-3 or IEC 61000-3-11, it is necessary that the
directly measured parameters d , d , and d(t) are available. These d , d , and d(t)
c max c max
parameters are not mandatory for the purpose of short term or long term flicker evaluation. The
parameter U is not required for any compliance testing or flicker evaluation, but might be
hp
necessary for calibration purposes.
Outputs – either in analog signal or digital data format – shall be provided for d , d , and
c max
d(t), and it is recommended that an output for U is also available.
hp
5 Specification
5.1 Response and accuracy
The overall response from the instrument input to the output of block 4 is given in Tables 1 and
2 for sinusoidal and rectangular voltage fluctuations at 50 Hz, respectively 60 Hz. One unit
output from block 4 corresponds to the reference human flicker perceptibility threshold. The
response is centered at 8,8 Hz for sinusoidal modulation. Tables 1 and 2 give values for 120 V
and 230 V, and 50 Hz and 60 Hz systems.
The required accuracy for the instrument from input to output of Block 4 is achieved if the
measured P values for the specified sine and square-wave modulations, with a modulation
inst
– 14 – 61000-4-15 © IEC:2010
phase relationship as shown in Annex B, are within ±8 % of one unit of perceptibility for the
specified operating ranges and frequencies of the flickermeter. The bold printed entries in
Tables 1 and 2 show mandatory test points. The manufacturer shall specify the voltage and
frequency ranges for which the flickermeter is intended to be used.
Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz
for sinusoidal voltage fluctuations
(input relative voltage fluctuation ΔU/U for one unit of perceptibility at P output)
inst
Voltage fluctuation ΔU/U Voltage fluctuation ΔU/U
% %
Hz Hz
120 V lamp 120 V lamp 120 V lamp 120 V lamp
60 Hz system 50 Hz syste
...
IEC 61000-4-15 ®
Edition 2.0 2010-08
REDLINE VERSION
INTERNATIONAL
STANDARD
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inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications
fonctionnelles et de conception
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IEC 61000-4-15 ®
Edition 2.0 2010-08
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications
fonctionnelles et de conception
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-
IEC 61000-4-15 ®
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications
fonctionnelles et de conception
IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
IEC 61000-4-15
Edition 2.0 2010-08
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
INTERPRETATION SHEET 1
This interpretation sheet has been prepared by subcommittee 77A: EMC – Low frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility.
The text of this interpretation sheet is based on the following documents:
FDIS Report on voting
77A/966/FDIS 77A/973/RVD
Full information on the voting for the approval of this interpretation sheet can be found in the
report on voting indicated in the above table.
___________
Interpretation of requirements for rectangular voltage modulation with duty ratio
according to IEC 61000-4-15: Electromagnetic compatibility (EMC) – Testing and
measurement techniques – Flickermeter – Functional and design specifications.
IEC 61000-4-15 Ed 2 gives requirements in 6.8 for what is called “Rectangular voltage
changes with 20 % duty cycle”. Table 11 provides the test specification for rectangular voltage
changes with duty ratio. The requirements per Table 11 and the associated tests patterns
caused some questions in the past year, and therefore IEC/SC77A/WG-2 wishes to clarify the
title and interpretation per 6.8 which should be read as follows:
6.8 Rectangular voltage modulation for 20 % of the time
The amplitude of the test voltage U is rectangularly modulated with a 50 % duty cycle at 28
Hz. Every minute the amplitude modulation is switched on for 12 s and off for 48 s. Table 11
specifies the modulation depth in terms of voltage fluctuation (∆U/U), which is further
specified in Annex B. The transition time at the edges of the rectangular modulation shall be
less than 0,5 ms.
The ten-minute P indication of the meter under test shall be 1,00 with a tolerance of ± 5 %.
st
Figure 1 shows a ∆U/U = 35 % for illustration purposes, as a 1 % to 2 % modulation would not
be visible. Only 400 ms of the time axis is depicted, showing 200 ms on each side of the
modulation on/off switching at 12 s.
NOTE The above text in 6.8 will be considered as a replacement for the original text when
IEC 61000-4-15 is updated either through an amendment or replaced by a new edition.
__________
ICS 33.100.20
– 2 – 61000-4-15 © IEC:2010
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object .7
2 Normative references.7
3 Parameters and symbols.8
3.1 Directly measured parameters and characteristics .8
3.1.1 General .8
3.1.2 Half period rms value of the voltage .8
3.1.3 Half period rms value characteristics.8
3.1.4 Relative half period rms value characteristics.8
3.1.5 Steady state voltage and voltage change characteristics .8
3.1.6 Steady state voltage change .9
3.1.7 Maximum voltage change during a voltage change characteristic .9
3.1.8 Maximum steady state voltage change during an observation period .9
3.1.9 Maximum absolute voltage change during an observation period .10
3.1.10 Voltage deviation .10
3.1.11 Centre voltage .10
3.2 Symbols .10
4 Description of the instrument .11
4.1 General .11
4.2 Block 1 – Input voltage adaptor.11
4.3 Block 2 – Squaring multiplier.11
4.4 Block 3 – Weighting filters .12
4.5 Block 4 – Squaring and smoothing .12
4.6 Block 5 – On-line statistical analysis .12
4.7 Outputs .13
4.7.1 General .13
4.7.2 P output.13
lin
4.7.3 P output .13
inst
4.7.4 P output .13
st
4.7.5 P output .13
lt
4.7.6 d-meter outputs .13
5 Specification.13
5.1 Response and accuracy.13
5.2 Input voltage ranges .18
5.3 Voltage adaptor .18
5.4 Weighting filters.18
5.5 Weighting filter response in block 3.18
5.6 Squaring multiplier and sliding mean filter .19
5.7 General statistical analysis procedure .19
5.7.1 General .19
5.7.2 Short-term flicker evaluation .19
5.7.3 Long-term flicker evaluation .20
6 Flickermeter tests .20
6.1 General .20
6.2 Sinusoidal/rectangular voltage changes .21
61000-4-15 © IEC:2010 – 3 –
6.3 Rectangular voltage changes and performance testing.21
6.4 Combined frequency and voltage changes – Class F1 flickermeters .22
6.5 Distorted voltage with multiple zero crossings – Class F1 flickermeters .23
6.6 Bandwidth test using harmonic and inter-harmonic side band modulation .23
6.7 Phase jumps – Class F1 flickermeters .24
6.8 Rectangular voltage changes with 20 % duty cycle .24
6.9 d parameter test, d , d , and d(t) > 3,3% .25
c max
7 Environmental and other requirements .27
7.1 General .27
7.2 Insulation, climatic, electromagnetic compatibility, and other tests.27
Annex A (normative) Techniques to improve accuracy of flicker evaluation .30
Annex B (informative) Meaning of ΔU/U and number of voltage changes, d , d(t), d
c max
examples .32
Annex C (informative) Sample protocols for type testing .36
Bibliography .40
Figure 1 – Illustration of 28 Hz modulated test voltage with 20 % duty cycle .25
Figure 2 – Functional diagram of IEC flickermeter .28
Figure 3 – Basic illustration of the time-at-level method for P = 2,000 .29
st
Figure B.1 – Rectangular voltage change ΔU/U = 40 %, 8,8 Hz, 17,6 changes/second.33
Figure B.2 – Illustration of “d” parameter definitions.35
Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for
sinusoidal voltage fluctuations .14
Table 1b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for
sinusoidal voltage fluctuations .15
Table 2a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for
rectangular voltage fluctuations .16
Table 2b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for
rectangular voltage fluctuations .17
Table 3 – Indicative values for the parameters of lamps.19
Table 4 – Test specifications for flickermeter.21
Table 5 – Test specification for flickermeter classifier.22
Table 6 – Test specification for combined frequency and voltage changes – Class F1
flickermeters .23
Table 7 – Test specification for distorted voltage with multiple zero crossings – Class F1
flickermeters .23
Table 8 – 8,8 Hz modulation depth for distorted voltage test – Class F 1 flickermeters .23
Table 9 – Test specification for Harmonics with side band – Class F1 flickermeters .24
Table 10 – Test specification for phase jumps – Class F1 flickermeters .24
Table 11 – Test specification for rectangular voltage changes with duty ratio .24
Table 12 – Test specification for d , d , t > 3,3 % .25
c max (d(t))
Table 13 – Test specification for d , d , t > 3,3 % .26
c max (d(t))
Table B.1 – Correction factor for other voltage/frequency combinations .33
– 4 – 61000-4-15 © IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
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8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-15 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
IEC 61000-4-15 is based on work by the “Disturbances” Working Group of the International
Union for Electroheat (UIE), on work of the IEEE, and on work within IEC itself.
It forms part 4-15 of the IEC 61000 series. It has the status of a basic EMC publication in
accordance with IEC Guide 107.
This second edition cancels and replaces the first edition published in 1997 and its
Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds
or clarifies the definition of several directly measured parameters, so that diverging
interpretations are avoided.
61000-4-15 © IEC:2010 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
77A/722/FDIS 77A/730/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 61000 series, under the general title Electromagnetic compatibility
(EMC) can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigendum of March 2012 and Interpretation Sheet 1 of August 2017
have been included in this copy.
– 6 – 61000-4-15 © IEC:2010
INTRODUCTION
IEC 61000-4 is a part of the IEC 61000 series, according to the following structure:
Part 1: General
General consideration (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards,
as technical specifications or technical reports, some of which have already been published as
sections. Others are and will be published with the part number followed by a dash and
completed by a second number identifying the subdivision (example: IEC 61000-6-1).
61000-4-15 © IEC:2010 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
1 Scope and object
This part of IEC 61000 gives a functional and design specification for flicker measuring
apparatus intended to indicate the correct flicker perception level for all practical voltage
fluctuation waveforms. Information is presented to enable such an instrument to be
constructed. A method is given for the evaluation of flicker severity on the basis of the output of
flickermeters complying with this standard.
The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V
and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other
voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a
correction factor can be applied for those other voltages. Some of these correction factors are
provided in the Annex B. Detailed specifications for voltages and frequencies other than those
given above, remain under consideration.
The object of this part of IEC 61000 is to provide basic information for the design and the
instrumentation of an analogue or digital flicker measuring apparatus. It does not give
tolerance limit values of flicker severity.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60068 (all parts), Environmental testing
IEC 61000-3-3, Electromagnetic compatibility (EMC) – Part 3-3: Limits – Limitation of voltage
changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment
with rated current ≤16 A per phase and not subject to conditional connection
IEC 61000-3-11, Electromagnetic compatibility (EMC) – Part 3-11: Limits – Limitation of
voltage changes, voltage fluctuations and flicker in public low-voltage supply systems –
Equipment with rated current ≤75 A and subject to conditional connection
IEC 61010-1, Safety requirements for electrical equipment for measurement, control, and lab-
oratory use – Part 1: General requirements
IEC 61326-1, Electrical equipment for measurement, control and laboratory use – EMC
requirements – Part 1: General requirements
– 8 – 61000-4-15 © IEC:2010
3 Parameters and symbols
3.1 Directly measured parameters and characteristics
3.1.1 General
The examples in Figure B.2a, Figure B.2b, Figure B.2c and Figure B.2d are intended to assist
flickermeter manufacturers with the correct implementation for the determination of the
parameters specified in this clause.
3.1.2 Half period rms value of the voltage
U
hp
Is the rms voltage of the mains supply voltage, determined over a half period, between
consecutive zero crossings of the fundamental frequency voltage.
3.1.3 Half period rms value characteristics
U (t)
hp
Are the characteristics versus time of the half period rms value, determined from successive
U values, see also the examples in Annex B.
hp
3.1.4 Relative half period rms value characteristics
d (t)
hp
The characteristics versus time of the half period rms values expressed as a ratio of the
nominal voltage U .
n
d (t) = U (t)/U
hp hp n
3.1.5 Steady state voltage and voltage change characteristics
This subclause defines the evaluation of half cycle rms voltage values over time. Two basic
conditions are recognized, being periods where the voltage remains in steady state and periods
where voltage changes occur.
A steady state condition exists when the voltage U remains within the specified tolerance
hp
band of ±0,2 % for a minimum of 100/120 half cycles (50 Hz/60 Hz) of the fundamental
frequency.
At the beginning of the test, the average rms voltage, as measured during the last second
preceding the test observation period, shall be used as the starting reference value for d , and
c
d (t) calculations, as well as for the purpose of d , and d(t) measurements. In the event that
hp max
no steady state condition during given tests is established, the parameter d shall be reported
c
to be zero.
As the measurement during a test progresses, and a steady state condition remains present,
the sliding 1 s average value U of U is determined, i.e. the last 100 (120 for 60 Hz)
hp_avg hp
values of U are used to compute U . This value U is subsequently used to
hp hp_avg hp_avg
determine whether or not the steady state condition continues, and it is also the reference for
d and d determination in the event that a voltage change occurs.
c max
For the determination of a new steady state condition “ d ” after a voltage change has
c
i
occurred, a first value d = d (t = t ) is used. Around this value a tolerance band of
start_i hp start
±0,002 U (±0,2 % of U ) is determined. The steady state condition is considered to be present
n n
if U (t) does not leave the tolerance band for 100 half consecutive periods (120 for 60 Hz) of
hp
the fundamental frequency.
61000-4-15 © IEC:2010 – 9 –
NOTE The use of this U parameter prevents that very slowly changing line voltages trigger a d or d
hp-avg c max
evaluation, while minimizing deviations of up to 0,4 % of U ( + and – 0,2 %) between two measuring instruments.
n
The steady state condition ends when a subsequent value U (t = t ) exceeds the tolerance
hp x
band: d (t = t ) > d +0,002 or d (t = t ) < d –0,002.
hp x hp_avg hp x hp_avg
The last value within the tolerance band, is denoted as d = d (t = t ). The value
end hp x −1
i
d (t = t ) is used as the starting value for the determination of the next steady state condition
hp x
d (= d ) .
c start
i+1 i+1
If any value d (t > t ) fails the tolerance band prior to the required 100/120 half periods for
hp x
establishing steady state, this new U is used as the starting value for the determination of the
hp
next steady state condition d . Thus, a new steady state condition is present the instant
c
i+1
U can be determined.
hp_avg
3.1.6 Steady state voltage change
d
c
i
Is the value of the difference between two successive steady state values, normally expressed
as a percent of U , i.e. d − d .
n end start
i−1
The polarity of change(s) in steady state condition(s) shall be indicated. As follows from the
above formula, if the voltage decreases during a change characteristic, the resulting d value
c
will be positive. If the voltage increases during a change characteristic the resulting d value
c
will be negative.
3.1.7 Maximum voltage change during a voltage change characteristic
d
max
i
The absolute value of the maximum difference between the last steady state condition d
end
i−1
and following d (t) values, observed during a voltage change characteristic, normally
hp
expressed as a percent of U .
n
d = max (d – d (t))
max end hp
i i-1
The d evaluation ends as soon as a new steady state condition is established, or at the
max
i
end of the observation period. The polarity of change(s) shall be indicated. As follows from the
above formula, if the maximum voltage deviation is observed during a reduction in voltage
versus d the resulting d value will be positive. If the maximum voltage deviation is
end max
i−1 i
observed during a voltage increase with respect to the previous d the resulting d
end max
i−1 i
value will be negative.
3.1.8 Maximum steady state voltage change during an observation period
d
c
The highest absolute value of all d values, observed during an observation period, is called
c
i
d .
c
d = max( d )
c c
i
i
– 10 – 61000-4-15 © IEC:2010
3.1.9 Maximum absolute voltage change during an observation period
d
max
The highest absolute value of all d values, observed during an observation period, is called
max
i
d .
max
d = max( d )|
max max
i
i
3.1.10 Voltage deviation
d(t)
The deviation of actual d (t) from the previous d inside a voltage change characteristic is
end
hp
i−1
called d(t), and is expressed as a percentage of U .
n
d(t) = d − d (t)
end hp
i−1
Polarity is optional. If polarity is shown, a voltage drop is considered to be a positive value.
NOTE The d(t) limit evaluation in IEC 61000-3-3 with the maximum permitted limit of 3,3 % for up to 500 ms is
generally intended to evaluate the inrush current pattern of the equipment under test. Thus, as soon as a new
U is established, the d(t) evaluation is ended. When a new voltage change occurs, a new d(t) evaluation is
hp_avg
started. The maximum duration that d(t) exceeds the 3,3 % limit value for any of the individual d(t) evaluations
during the observation period, is used for the comparison against the 500 ms limit, and is reported for the test.
3.1.11 Centre voltage
U
c
The voltage around which the modulation pattern is centered, such as required for the classifier
test method, or periodic calibration tests in 6.3, Table 5.
3.2 Symbols
T short term interval for the P evaluation
short st
NOTE Unless otherwise specified, the short-term interval T is 10 min.
short
P short-term flicker severity
st
NOTE Unless otherwise specified, the P evaluation time is 10 min. For the purpose of power
st
quality surveys and studies, other time intervals may be used, and should be defined in the index.
For example a 1 min interval should be written as P .
st,1m
T long-term time interval for the P evaluation, which is always an integer multiple of
lt
long
the short term flicker severity evaluation P .
st
NOTE Unless otherwise specified, the long-term interval T is 12 × 10 min, i.e. 2 h. For the
long
purpose of power quality surveys and studies other time intervals may be used.
long-term flicker severity
P
lt
N
P
∑
3 st
i
i =1
P =
lt
N
where P (i = 1, 2, 3, .) are consecutive readings of the short-term severity P .
st st
i
NOTE Unless otherwise specified, P is calculated over discrete T periods. Each time a T
lt long long
period has expired, a new P calculation is started.
lt
61000-4-15 © IEC:2010 – 11 –
instantaneous flicker sensation
P
inst
NOTE In previous editions of this standard this output was called "Output 5".
peak value of the instantaneous flicker sensation P measured during the
P inst
inst,max
observation period
demodulated voltage change signal, after passing through block 3 of the
P
lin
flickermeter
half period rms value of the voltage
U
hp
sliding 1 s average of U
U hp
hp-avg
centre voltage
U
c
ralative half period rms value of the voltage
d
hp
maximum steady state voltage change during an observation period
d
c
voltage deviation
d(t)
maximum absolute voltage change during the observation period
d
max
4 Description of the instrument
4.1 General
The description below is based on a digital implementation of the flickermeter. Analogue
implementations are allowed provided they deliver the same results. For the purpose of
compliance testing and power quality surveys the results obtained with a digital instrument,
complying with this standard, are definitive.
The flickermeter architecture is described by the block diagram of Figure 2. It can be divided
into two parts, each performing one of the following tasks:
– simulation of the response of the lamp-eye-brain chain;
– on-line statistical analysis of the flicker signal and presentation of the results.
The first task is performed by blocks 2, 3 and 4 as illustrated in Figure 2, while the second task
is accomplished by block 5.
4.2 Block 1 – Input voltage adaptor
This block contains a voltage adapting circuit that scales the input mains frequency voltage to
an internal reference level as defined in 5.3. This method permits flicker measurements to be
made, independently of the actual input carrier voltage level and may be expressed as a per
cent ratio.
4.3 Block 2 – Squaring multiplier
The purpose of this block is to recover the voltage fluctuation by squaring the input voltage
scaled to the reference level, thus simulating the behavior of a lamp.
NOTE This multiplier, together with the Butterworth filter in block 3, operates as a demodulator.
– 12 – 61000-4-15 © IEC:2010
4.4 Block 3 – Weighting filters
Block 3 is composed of a cascade of two filters, which can precede or follow the selective filter
circuit. The first low-pass filter eliminates the double mains frequency ripple components of the
demodulator output.
The high pass filter (first order, −3 dB at 0,05 Hz) can be used to eliminate any d.c. voltage
component. The values in the calibration Tables 1a and 1b and Tables 2a and 2b, and the
performance test Table 5, include the effect of this HP filter with the 0,05 Hz corner frequency.
The second filter is a weighting filter block that simulates the frequency response of the human
visual system to sinusoidal voltage fluctuations of a coiled filament gas-filled lamp (60 W /
230 V and/or 60 W / 120 V).
NOTE 1 The response function is based on the perceptibility threshold found at each frequency by 50 % of the
persons tested.
NOTE 2 A reference filament lamp for 100 V systems would have a different frequency response and would
require a corresponding adjustment of the weighting filter. The characteristics of discharge and LED lamps are
totally different, and substantial modifications to the calibration tables in this standard would be necessary if they
were taken into account. Correction factors for several common voltage/frequency combinations are given in
Clause B.2.
NOTE 3 Block 3 alone is based on the borderline perceptibility curve for sinusoidal voltage fluctuations; the
correct weighting of non-sinusoidal and arbitrary voltage fluctuations is achieved by an appropriate choice of the
complex transfer function for blocks 3 and 4. Accordingly, the correct performance of the model has also been
checked with periodic rectangular signals as well as with transient signals. Some of these signals are illustrated in
the Annex B.
4.5 Block 4 – Squaring and smoothing
Block 4 is composed of a squaring multiplier and a first order low-pass filter. The human flicker
perception, by the eye and brain combination, of voltage fluctuations applied to the reference
lamp, is simulated by the combined non-linear response of blocks 2, 3 and 4.
The output of block 4 represents the instantaneous flicker sensation P .
inst
4.6 Block 5 – On-line statistical analysis
Block 5 performs an on-line analysis of the flicker level, thus allowing direct calculation of
significant evaluation parameters.
A suitable interface, either with analog signals or digital data transfer, allows data presentation
and recording. The purpose of this block is to derive flicker severity indications by means of
statistical analysis. This statistical analysis, performed on-line through block 5, shall be made
by sampling the instantaneous flicker signal level and subdividing these samples into a suitable
number of classes.
Every time that the applicable value occurs, the counter of the corresponding class is
incremented by one. In this way, the frequency distribution function of the P values is
inst
obtained. By choosing a sufficiently high sampling frequency, the final result at the end of the
measuring interval represents the distribution of flicker level duration in each class. Adding the
content of the counters of all classes and expressing the count of each class relative to the
total gives the probability density function of the flicker levels.
From this function the cumulative probability function is obtained, which in turn is used in the
time-at-level statistical method. Figure 3 schematically represents the statistical analysis
method, limited for simplicity to only 15 classes in the P calculation for a performance test
st
using the modulation setting of 1,788 % (i.e. factor k = 2 ) at 39 CPM (0,325 Hz), for a target
P value of 2,000 as defined in 6.2 and Table 5 for 230 V/50 Hz.
st
61000-4-15 © IEC:2010 – 13 –
From the cumulative probability function, significant statistical values can be obtained such as
mean, standard deviation, flicker level being exceeded for a given percentage of time or,
alternatively, the percentage of time that an assigned flicker level has been exceeded.
For on-line processing, immediately after the conclusion of each short time interval, the
statistical analysis of the next interval is started and the results for the just completed interval
are made available for output. In this way, n short time analyses will be available for a given
observation period T together with the results for the total interval.
long
4.7 Outputs
4.7.1 General
The flickermeter diagram in Figure 2 shows a number of mandatory outputs. The outputs
marked with an asterisk are optional, and allow full exploitation of the instrument’s potential for
the investigation of voltage fluctuations. Further optional outputs may be considered.
4.7.2 P output
lin
P output is optional and mainly intended for flicker minimization purposes. This output is
lin
proportional to the input voltage changes.
4.7.3 P output
inst
This output, formerly called output 5, is mandatory. It represents the instantaneous flicker
sensation and can be recorded for later processing. It shall be provided as an analogue signal
or via a digital interface. For tests of Tables 1 and 2, the maximum value of P is observed.
inst
4.7.4 P output
st
The P output in block 5 is mandatory.
st
4.7.5 P output
lt
The P output is mandatory.
lt
4.7.6 d-meter outputs
For compliance tests according to IEC 61000-3-3 or IEC 61000-3-11, it is necessary that the
directly measured parameters d , d , and d(t) are available. These d , d , and d(t)
c max c max
parameters are not mandatory for the purpose of short term or long term flicker evaluation. The
parameter U is not required for any compliance testing or flicker evaluation, but might be
hp
necessary for calibration purposes.
Outputs – either in analog signal or digital data format – shall be provided for d , d , and
c max
d(t), and it is recommended that an output for U is also available.
hp
5 Specification
5.1 Response and accuracy
The overall response from the instrument input to the output of block 4 is given in Tables 1 and
2 for sinusoidal and rectangular voltage fluctuations at 50 Hz, respectively 60 Hz. One unit
output from block 4 corresponds to the reference human flicker perceptibility threshold. The
response is centered at 8,8 Hz for sinusoidal modulation. Tables 1 and 2 give values for 120 V
and 230 V, and 50 Hz and 60 Hz systems.
The required accuracy for the instrument from input to output of Block 4 is achieved if the
measured P values for the specified sine and square-wave modulations, with a modulation
inst
– 14 – 61000-4-15 © IEC:2010
phase relationship as shown in Annex B, are within ±8
...
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