IEC 62343-2-1:2019
(Main)Dynamic modules - Part 2-1: Reliability qualification - Test template
Dynamic modules - Part 2-1: Reliability qualification - Test template
IEC 62343-2-1:2019 provides a reliability qualification test template for dynamic modules (DMs). The template describes the reliability qualification test items and provides information on requirements or options. Example test conditions are given for information purposes in Annex A. For reliability qualification purposes, some information about the internal components, parts and interconnections is needed. These internal parts are treated as black boxes. This document gives requirements for the evaluation of DM reliability by combining the reliability of such internal black boxes. The object of this reliability qualification test template is to provide a framework for the reliability qualification tests for DMs. Developers of reliability qualification tests for DMs determine the test conditions for each test item by referring to the examples in Annex A.
Keywords: dynamic modules (DMs), test requirements for DMs
Modules dynamiques - Partie 2-1: Qualification de fiabilité - Modèle d'essai
IEC 62343-2-1:2019 fournit un modèle d'essai de qualification de la fiabilité pour des modules dynamiques. Le modèle décrit les éléments d'essai de qualification de la fiabilité et donne des informations sur les exigences ou les options. Des exemples de conditions d'essai sont donnés à titre d'information à l’Annexe A. Dans le cadre de la qualification de fiabilité, certaines informations sur les composants, les constituants et les interconnexions internes sont nécessaires. Ces constituants internes sont traités comme des boîtes noires. Le présent document donne les exigences pour l'évaluation de la fiabilité des modules dynamiques en combinant la fiabilité de telles boîtes noires internes. L'objet de ce modèle d'essai de qualification de la fiabilité est de fournir un cadre pour les essais de qualification de la fiabilité pour des modules dynamiques. Les développeurs d'essais de qualification de la fiabilité pour modules dynamiques déterminent les conditions d'essai pour chaque élément d'essai en se référant aux exemples de l'Annexe A.
Mots clés: Les modules dynamiques, essais de qualification pour les modules dynamiques
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IEC 62343-2-1 ®
Edition 1.0 2019-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Dynamic modules –
Part 2-1: Reliability qualification – Test template
Modules dynamiques –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
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IEC 62343-2-1 ®
Edition 1.0 2019-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Dynamic modules –
Part 2-1: Reliability qualification – Test template
Modules dynamiques –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.01 ISBN 978-2-8322-7356-2
– 2 – IEC 62343-2-1:2019 IEC 2019
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and abbreviated terms . 6
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 7
4 Reliability qualification test considerations . 7
4.1 General . 7
4.2 Approach . 7
5 Reliability qualification test items . 8
Annex A (informative) Examples of reliability qualification test conditions . 9
Annex B (informative) Reliability qualification test recommendations . 10
B.1 General . 10
B.2 Pass/fail criteria . 10
B.3 Guidance of failure mode effect analysis (FMEA) and qualification of
similarity . 11
Bibliography . 12
Table 1 – Reliability qualification test items . 8
Table A.1 – Example of reliability qualification test conditions . 9
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
DYNAMIC MODULES –
Part 2-1: Reliability qualification – Test template
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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International Standard IEC 62343-2-1 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
This first edition cancels and replaces the second edition of IEC 62343-2 published in 2014.
This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to
IEC 62343-2:2014:
a) addition of an Introduction to the background of this document;
b) replacement of "Reliability qualification consideration" by "reliability qualification test
consideration";
c) deletion of the consideration of "Design 1" and "Design 2" and change of the contents of
"Approach" in "Reliability qualification test considerations";
d) deletion of the details in "Reliability qualification requirements" and replacement by
"Reliability qualification test items";
– 4 – IEC 62343-2-1:2019 IEC 2019
e) deletion of "Reliability calculations" from the sum of failure rates of constituting parts;
f) Integration of "Pass/fail criteria" and "Guidance of FMEA" into Annex B (informative);
g) Simplification of test items and conditions in Annex A and change of title of Annex A to
"Examples of reliability qualification test conditions".
The text of this International Standard is based on the following documents:
CDV Report on voting
86C/1567/CDV 86C/1594/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62343 series, published under the general title Dynamic modules,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
NOTICE
This document contains material that is Copyright © 2006, Telcordia Technologies, Inc.
("Telcordia"). All rights reserved.
The reader is advised that this IEC document and Telcordia source(s) may differ, and the
context and use of said material in this IEC document may differ from that of Telcordia.
TELCORDIA MAKES NO REPRESENTATION OR WARRANTY, EXPRESS OR IMPLIED,
WITH RESPECT TO THE SUFFICIENCY, ACCURACY, OR UTILITY OF ANY INFORMATION
OR OPINION CONTAINED HEREIN. ANY USE OF OR RELIANCE UPON SAID
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LIABLE FOR ANY DAMAGE OR INJURY INCURRED BY ANY PERSON ARISING OUT OF
THE SUFFICIENCY, ACCURACY, OR UTILITY OF ANY INFORMATION OR OPINION
CONTAINED HEREIN.
INTRODUCTION
Dynamic modules (DMs) are relatively new fibre optic devices. In the industry, there is no de-
facto standard of reliability qualification test requirements for DMs. Also, there are many types
and functions of DMs, such as optical path switching, wavelength management, chromatic
dispersion management, optical channel power management, and optical channel powers and
wavelength monitoring. Therefore, it is difficult to standardize the reliability qualification test
requirements because their functionality is so diverse. For DMs, a reliability qualification test
template rather than particular requirements has been standardized.
The first edition of IEC 62343-2, Dynamic modules – Part 2: Reliability qualification, was
published in 2011, and the second edition was published in 2014. A survey on reliability
qualification test items and conditions was carried out in Japan, China, North America and
Europe in 2015 and 2016. The survey revealed that several reliability test conditions were
inconsistent with those in IEC 62343-2:2014, and the responses indicated a lack of consensus.
As a result of the discussion in SC 86C, it was agreed that it was impossible to unify the test
conditions for the reliability qualification of DMs. Instead of a reliability qualification document,
it was decided to prepare this template for a reliability qualification test for DMs.
Consequently, IEC 62343-2:2014 will be withdrawn and replaced upon publication of this
document.
– 6 – IEC 62343-2-1:2019 IEC 2019
DYNAMIC MODULES –
Part 2-1: Reliability qualification – Test template
1 Scope
This part of IEC 62343 provides a reliability qualification test template for dynamic modules
(DMs). The template describes the reliability qualification test items and provides information
on requirements or options. Example test conditions are given for information purposes in
Annex A.
For reliability qualification purposes, some information about the internal components, parts
and interconnections is needed. These internal parts are treated as black boxes. This
document gives requirements for the evaluation of DM reliability by combining the reliability of
such internal black boxes.
The object of this reliability qualification test template is to provide a framework for the
reliability qualification tests for DMs. Developers of reliability qualification tests for DMs
determine the test conditions for each test item by referring to the examples in Annex A.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 62343, Dynamic modules – General and guidance
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purpose of this document, terms and definitions given in IEC 62343 and the following
apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
failure
non-compliance to product specification or change in parameters as set by the standard or
agreed by the customer and supplier
3.1.2
qualification
formal test process to determine whether or not the product is suitable for applications
Note 1 to entry: "Pass or fail" is the expected outcome.
Note 2 to entry: This is different from a reliability test, which is an engineering test designed to understand the
reliability consideration or estimate the reliability of the product; pass or fail is not the main result.
3.1.3
reliability
probability of performing required functions at specified operating and environmental
conditions over time
Note 1 to entry: The reliability of a DM is expressed by either of the following two parameters: mean time between
failure (MTBF) and failure in time (FIT):
• the MTBF is the mean period of DM continuous operation without any failure at specified operating and
environmental conditions;
• the FIT is the number of failures expected in 10 device-hours at specified operating and environmental
conditions.
3.2 Abbreviated terms
Each abbreviated term introduced in this document is explained in the text at least the first
time it appears. However, for an easier understanding of the whole text, the following is a list
of all abbreviated terms used in this document:
DM dynamic module
EMC electro-magnetic compatibility
FIT failure in time
FMEA failure mode and effects analysis
IL insertion loss
LCD liquid crystal device
MEMS micro electro-mechanical system
MTBF mean time between failure
RH relative humidity
4 Reliability qualification test considerations
4.1 General
Since dynamic modules (DMs) are relatively new products in the commercial market and
involve different technologies, the requirements included in this document will be reviewed as
technology progresses.
4.2 Approach
It is worth emphasizing the fundamental approach of reliability qualification adopted in this
document.
a) Any parts that can be effectively qualified on their individual levels shall be qualified at
that level. Their qualification shall be based on IEC standards or other industrial standards
in the absence of such IEC standards.
b) The qualification tests required at the DM level should be based on the degradation
mechanisms and failure modes that cannot be effectively detected in the lower part levels.
At the DM level, the qualification tests need not attempt to discover or identify those
degradation mechanisms and failure modes that can be discovered at lower assembly
levels than the final product level. For example, if all parts in the DM can be effectively
tested for damp heat-accelerated degradations, there is no need to repeat the damp heat
test at the DM level.
c) Specific test items for specific DMs should be considered as follows:
– shock and vibration test for micro electro-mechanical system (MEMS) engines;
– low temperature storage test for liquid crystal devices (LCDs) engines;
– 8 – IEC 62343-2-1:2019 IEC 2019
– intermittent test for LCDs and mechanical engines;
– high power test for modules which have glue and/or coating film in the optical path;
– high and low temperature operating test for thermal-optic engine;
– switching durability test for MEMS and mechanical engines.
Annex B provides guidance on reliability qualification test items and conditions.
5 Reliability qualification test items
Clause 5 defines reliability qualification test items (see Table 1). Some test items are
requirements; others are optional. Table 1 shows the reliability qualification test items. The
right column shows requirements (R) or optional items (O). Reliability qualification developers
shall test the required items and can add tests for the optional items.
Table 1 – Reliability qualification test items
Test categories Test items R or O
Mechanical test Operating mechanical shock R
Operating mechanical vibration R
Non-operating mechanical shock R
Non-operating mechanical vibration R
Non-operating unpacked drop R
Non-operating packed vibration O
Non-operating packed drop R
Temperature and humidity test Non-operating high temperature R
Non-operating low temperature R
Non-operating temperature cycling R
Non-operating temperature shock O
Non-operating damp heat R
Operating temperature cycling R
Operating temperature humidity cycling O
Electro-magnetic compatibility Electro-magnetic compatibility R
High optical power Operating high optical power R
Fibre integrity Operating fibre pull R
Key
R: Requirement
O: Optional
Annex A
(informative)
Examples of reliability qualification test conditions
Table A.1 shows examples of reliability qualification test conditions. The reliability
qualification test developer may select the condition or define other conditions by referring to
Table A.1.
Table A.1 – Example of reliability qualification test conditions
Test items Example of test conditions Remarks
Operating mechanical shock 98 m/s , 0,3 ms half-sine shock pulse, 3 axes
Condition No. 1
Operating mechanical
vibration 2
Swept sine wave at a level of 9,8 m/s , 3 mm max.
displacement, 5 Hz to 100 Hz, 0,1 oct/min, 3 axes
Condition No. 2
Swept sine wave at a level of 19,6 m/s , 100 Hz to
200 Hz, 8 oct/min, 3 axes
Condition No. 1
Swept sine wave at a level of 9,8 m/s , 3 mm max.
displacement, 5 Hz to 100 Hz, 0,1 oct/min, 3 axes
2 000 m/s , 3 axes, 2 impacts/direction (12 impacts
Non-operating mechanical
total),
shock
Nominal 1,33 ms, half sine pulse
for 0,125 kg < m (mass) ≤ 0,225 kg
500 m/s , 3 axes, 2 impacts/direction (12 impacts total)
Nominal 5 ms, half sine pulse
for 0,225 kg < m ≤ 1 kg
100 mm height for m ≤ 10 kg
Non-operating unpacked drop
75 mm height for 10 kg < m ≤ 25 kg
5 Hz to 50 Hz, 0,1 oct/min, 15 m/s , then 50 Hz to
Non-operating vibration
500 Hz, 0,25 oct/min., 29,4 m/s
10 Hz to 2 000 Hz, 196 m/s maximum acceleration
5 Hz to 20 Hz, 0,01 g /Hz, 20 Hz to 200 Hz,
Packed vibration
–3 dB/oct
1 m height for ≤ 10 kg mass
Packed drop
Non-operating high
85 °C, 2 000 h
temperature
–40 °C, 72 h
Non-operating low temperature
–40 °C to +70 °C, 100 cycles
Non-operating temperature
a
cycling
–40 °C to +85 °C, 100 cycles
85 °C, 85 % RH, 1 000 h
Non-operating damp heat Telcordia GR-1312
85 °C, 85 % RH, 500 h
Operating temperature
–10 °C to +60 °C, 20 % RH to 85 % RH
humidity cycling
Under consideration
EMC
2 mm: 20 N to 100 N, 3 times, 5 s pulls Test procedure:
Operating fibre pull
900 µm: 10 N, 3 times, 5 s pulls IEC 61300-2-4
250 µm: 5 N, 3 times, 5 s pulls Duration:
Telcordia GR-1312
Under consideration
High optical power
Under consideration
Sample size
a
The detail conditions of duration and temperature transition rate should be determined for consideration of
thermal capacity of the DUT. The useful information of the temperature cycling test is described in IEC 60068-2-
14, Test Nb.
– 10 – IEC 62343-2-1:2019 IEC 2019
Annex B
(informative)
Reliability qualification test recommendations
B.1 General
For the purposes of this document, each internal component, part, and interconnection should
be treated as a black box. It is also important to point out that the parts in the DM include
fibre splices, fibre routing, and fibre anchoring, as well as how the fibre exits from the housing
and how parts are mounted.
This document is based on the assumption that the reliability of a DM can be evaluated with
sufficient confidence from the failure in time (FIT) rates of its internal black boxes when the
assembly process of the constituents has been qualified.
There are degradation and failures not due to part failures, for example fibre routing and fibre
holders. The quality and reliability of the assembling, for example fibre routing, should be
assessed and qualified through process evaluation and qualification.
The internal black boxes often constituting a DM are:
• passive optical components, including patch cords, pigtails, connectors and splices;
• active optical components;
• electronics, including PCBs, electrical connectors, etc.;
• others (e.g. the fibre splicing, fibre routing, and fibre anchoring, as well as how the fibre
exits from the housing and how components are mounted).
DM manufacturers should declare the number and type of the internal black boxes
constituting the DM and give the failure rates (in FITs) for each black box.
The DM failure rate should be calculated by suitably combining the failure rates in FITs of its
black boxes. The model and assumptions used in the DM failure rate calculation should be
provided and justified for review, if the DM manufacturer has so requested.
B.2 Pass/fail criteria
It should be noted that the commonly used failure criterion of a drift higher than 0,5 dB in
insertion loss (IL) is a guideline. For dense wavelength division multiplexing (DWDM) DMs,
such as wavelength blockers, centre wavelength drift should be defined as a failure criterion.
The actual and practical criteria should be developed based on the degradation allowed for
the expected life of the product.
EXAMPLE
• The acceleration factor of the testing condition to the operating condition is 50.
• The beginning-of-life parametric measurement is 1,0 dB below the end-of-life specification.
• The expected life is assumed to be 20 years.
• The allowed degradation for a 2 000 h testing is: (1,0 × 50 × 2 000) / (20 × 365,25 × 24) = 0,57 dB.
Readers should note that IL is not the only parameter that should be considered for pass/fail,
but that other parameters are also to be included.
B.3 Guidance of failure mode effect analysis (FMEA) and qualification of
similarity
It is worth emphasizing that the reliability assessment or qualification tests should be based
on the degradation mechanisms and failure modes. The appropriate accelerated tests can be
developed once the degradation mechanisms, failure modes, and their acceleration factors
are understood. To begin with, the failure mode and effects analysis (FMEA) should be
developed. A set of reliability tests should be planned and conducted as the result of FMEA.
The testing results can be used to develop additional tests or refined tests to better
understand the degradation mechanisms or develop the acceleration models.
Where a range of dynamic modules is produced by a DM manufacturer, there may be some
significant similarity between different type codes. A combination of results from different test
programmes, where appropriate, is therefore permitted.
Consideration should be given to the fact that minor differences in technology or processing
can sometimes have a major impact on reliability, whilst not being apparent during quality
assessment.
At minimum, FMEA should be carried out for all varieties of products that are considered
"similar" and claimed to be "qualified" by "similarity". FMEA should be done thoroughly in
order to be an effective tool to consider "qualified-by-similarity". Its thoroughness can be
checked against the failure mode analysis (FMA) to manufacturing drop-out and customer
returns.
Evidence should be presented to demonstrate that all results are directly relevant.
– 12 – IEC 62343-2-1:2019 IEC 2019
Bibliography
IEC 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature
IEC 61300 (all parts), Fibre optic interconnecting devices and passive components – Basic
tests and measurement procedures
IEC 61300-2-4, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 2-4: Tests – Fibre or cable retention
IEC 62005-9-1, Fibre optic interconnecting devices and passive components – Reliability –
Part 9-1: Qualification of passive optical components
IEC 62005-9-2, Reliability of fibre optic interconnecting devices and passive optical
components – Part 9-2: Reliability qualification for single fibre optic connector sets – Single
mode
IEC TR 62343-6-6, Dynamic modules – Part 6-6: Design guide – Failure mode effect analysis
for optical units of dynamic modules
IEC 62572-3, Fibre optic active components and devices – Reliability standards – Part 3:
Laser modules used for telecommunication
United States Code of Federal Regulations (CFR) – Title 47 – Chapter I – Subchapter A –
Part 15, Telecommunication – Federal Communications Commission (FCC) – General – Radio
frequency devices
EN 55032, Electromagnetic compatibility of multimedia equipment – Emission Requirements
MIL-STD-883, Test Method Standard Microcircuits (Method 2003, Solderability)
Telcordia TR-NWT-000870, Electrostatic Discharge Control in the Manufacture of
Telecommunications Equipment
Telcordia GR-63-CORE, NEBS Requirements: Physical Protection
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Generic Criteria for Network Telecommunications Equipment
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Telcordia GR-1312-CORE, Generic Requirements for Optical Fiber Amplifiers and Proprietary
Den
...
IEC 62343-2-1 ®
Edition 1.1 2023-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Dynamic modules –
Part 2-1: Reliability qualification – Test template
Modules dynamiques –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
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IEC 62343-2-1 ®
Edition 1.1 2023-12
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Dynamic modules –
Part 2-1: Reliability qualification – Test template
Modules dynamiques –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.01 ISBN 978-2-8322-8054-6
IEC 62343-2-1 ®
Edition 1.1 2023-12
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
Dynamic modules –
Part 2-1: Reliability qualification – Test template
Modules dynamiques –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
– 2 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
CONTENTS
FOREWORD . 3
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviated terms . 7
3.1 Terms and definitions . 7
3.2 Abbreviated terms . 8
4 Reliability qualification test considerations . 8
4.1 General . 8
4.2 Approach . 8
5 Reliability qualification test items . 9
Annex A (informative) Examples of reliability qualification test conditions . 10
Annex B (informative) Reliability qualification test recommendations . 11
B.1 General . 11
B.2 Pass/fail criteria . 11
B.3 Guidance of failure mode effect analysis (FMEA) and qualification of
similarity . 12
Bibliography . 13
Table 1 – Reliability qualification test items . 9
Table A.1 – Example of reliability qualification test conditions . 10
IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
DYNAMIC MODULES –
Part 2-1: Reliability qualification – Test template
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This consolidated version of the official IEC Standard and its amendment has been
prepared for user convenience.
IEC 62343-2-1 edition 1.1 contains the first edition (2019-09) [documents 86C/1567/CDV
and 86C/1594/RVC] and its amendment 1 (2023-12) [documents 86C/1868/CDV and
86C/1888/RVC].
In this Redline version, a vertical line in the margin shows where the technical content
is modified by amendment 1. Additions are in green text, deletions are in strikethrough
red text. A separate Final version with all changes accepted is available in this
publication.
– 4 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
International Standard IEC 62343-2-1 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
This first edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to
IEC 62343-2:2014:
a) addition of an Introduction to the background of this document;
b) replacement of "Reliability qualification consideration" by "reliability qualification test
consideration";
c) deletion of the consideration of "Design 1" and "Design 2" and change of the contents of
"Approach" in "Reliability qualification test considerations";
d) deletion of the details in "Reliability qualification requirements" and replacement by
"Reliability qualification test items";
e) deletion of "Reliability calculations" from the sum of failure rates of constituting parts;
f) Integration of "Pass/fail criteria" and "Guidance of FMEA" into Annex B (informative);
g) Simplification of test items and conditions in Annex A and change of title of Annex A to
"Examples of reliability qualification test conditions".
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62343 series, published under the general title Dynamic modules,
can be found on the IEC website.
The committee has decided that the contents of this document and its amendment will remain
unchanged until the stability date indicated on the IEC website under webstore.iec.ch in the
data related to the specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
IEC 2023
NOTICE
This document contains material that is Copyright © 2006, Telcordia Technologies, Inc.
("Telcordia"). All rights reserved.
The reader is advised that this IEC document and Telcordia source(s) may differ, and the
context and use of said material in this IEC document may differ from that of Telcordia.
TELCORDIA MAKES NO REPRESENTATION OR WARRANTY, EXPRESS OR IMPLIED,
WITH RESPECT TO THE SUFFICIENCY, ACCURACY, OR UTILITY OF ANY INFORMATION
OR OPINION CONTAINED HEREIN. ANY USE OF OR RELIANCE UPON SAID
INFORMATION OR OPINION IS AT THE RISK OF THE USER. TELCORDIA SHALL NOT BE
LIABLE FOR ANY DAMAGE OR INJURY INCURRED BY ANY PERSON ARISING OUT OF
THE SUFFICIENCY, ACCURACY, OR UTILITY OF ANY INFORMATION OR OPINION
CONTAINED HEREIN.
– 6 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
INTRODUCTION
Dynamic modules (DMs) are relatively new fibre optic devices. In the industry, there is no de-
facto standard of reliability qualification test requirements for DMs. Also, there are many types
and functions of DMs, such as optical path switching, wavelength management, chromatic
dispersion management, optical channel power management, and optical channel powers and
wavelength monitoring. Therefore, it is difficult to standardize the reliability qualification test
requirements because their functionality is so diverse. For DMs, a reliability qualification test
template rather than particular requirements has been standardized.
The first edition of IEC 62343-2, Dynamic modules – Part 2: Reliability qualification, was
published in 2011, and the second edition was published in 2014. A survey on reliability
qualification test items and conditions was carried out in Japan, China, North America and
Europe in 2015 and 2016. The survey revealed that several reliability test conditions were
inconsistent with those in IEC 62343-2:2014, and the responses indicated a lack of consensus.
As a result of the discussion in SC 86C, it was agreed that it was impossible to unify the test
conditions for the reliability qualification of DMs. Instead of a reliability qualification document,
it was decided to prepare this template for a reliability qualification test for DMs.
Consequently, IEC 62343-2:2014 will be withdrawn and replaced upon publication of this
document.
IEC 2023
DYNAMIC MODULES –
Part 2-1: Reliability qualification – Test template
1 Scope
This part of IEC 62343 provides a reliability qualification test template for dynamic modules
(DMs). The template describes the reliability qualification test items and provides information
on requirements or options. Example test conditions are given for information purposes in
Annex A.
For reliability qualification purposes, some information about the internal components, parts
and interconnections is needed. These internal parts are treated as black boxes. This
document gives requirements for the evaluation of DM reliability by combining the reliability of
such internal black boxes.
The object of this reliability qualification test template is to provide a framework for the
reliability qualification tests for DMs. Developers of reliability qualification tests for DMs
determine the test conditions for each test item by referring to the examples in Annex A.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 62343, Dynamic modules – General and guidance
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purpose of this document, terms and definitions given in IEC 62343 and the following
apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
failure
non-compliance to product specification or change in parameters as set by the standard or
agreed by the customer and supplier
3.1.2
qualification
formal test process to determine whether or not the product is suitable for applications
Note 1 to entry: "Pass or fail" is the expected outcome.
– 8 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
Note 2 to entry: This is different from a reliability test, which is an engineering test designed to understand the
reliability consideration or estimate the reliability of the product; pass or fail is not the main result.
3.1.3
reliability
probability of performing required functions at specified operating and environmental
conditions over time
Note 1 to entry: The reliability of a DM is expressed by either of the following two parameters: mean time between
failure (MTBF) and failure in time (FIT):
• the MTBF is the mean period of DM continuous operation without any failure at specified operating and
environmental conditions;
• the FIT is the number of failures expected in 10 device-hours at specified operating and environmental
conditions.
3.2 Abbreviated terms
Each abbreviated term introduced in this document is explained in the text at least the first
time it appears. However, for an easier understanding of the whole text, the following is a list
of all abbreviated terms used in this document:
DM dynamic module
EMC electro-magnetic compatibility
FIT failure in time
FMEA failure mode and effects analysis
IL insertion loss
LCD liquid crystal device
MEMS micro electro-mechanical system
MTBF mean time between failure
RH relative humidity
4 Reliability qualification test considerations
4.1 General
Since dynamic modules (DMs) are relatively new products in the commercial market and
involve different technologies, the requirements included in this document will be reviewed as
technology progresses.
4.2 Approach
It is worth emphasizing the fundamental approach of reliability qualification adopted in this
document.
a) Any parts that can be effectively qualified on their individual levels shall be qualified at
that level. Their qualification shall be based on IEC standards or other industrial standards
in the absence of such IEC standards.
b) The qualification tests required at the DM level should be based on the degradation
mechanisms and failure modes that cannot be effectively detected in the lower part levels.
At the DM level, the qualification tests need not attempt to discover or identify those
degradation mechanisms and failure modes that can be discovered at lower assembly
levels than the final product level. For example, if all parts in the DM can be effectively
tested for damp heat-accelerated degradations, there is no need to repeat the damp heat
test at the DM level.
c) Specific test items for specific DMs should be considered as follows:
– shock and vibration test for micro electro-mechanical system (MEMS) engines;
– low temperature storage test for liquid crystal devices (LCDs) engines;
IEC 2023
– intermittent test for LCDs and mechanical engines;
– high power test for modules which have glue and/or coating film in the optical path;
– high and low temperature operating test for thermal-optic engine;
– switching durability test for MEMS and mechanical engines.
Annex B provides guidance on reliability qualification test items and conditions.
5 Reliability qualification test items
Clause 5 defines reliability qualification test items (see Table 1). Some test items are
requirements; others are optional. Table 1 shows the reliability qualification test items. The
right column shows requirements (R) or optional items (O). Reliability qualification developers
shall test the required items and can add tests for the optional items.
Table 1 – Reliability qualification test items
Test categories Test items R or O
Mechanical test Operating mechanical shock R
Operating mechanical vibration R
Non-operating mechanical shock R
Non-operating mechanical vibration R
Non-operating unpacked drop RO
Non-operating packed vibration O
Non-operating packed drop R
Temperature and humidity test Non-operating high temperature R
Non-operating low temperature R
Non-operating temperature cycling R
Non-operating temperature shock O
Non-operating damp heat R
Operating temperature cycling R
Operating temperature humidity cycling O
Electro-magnetic compatibility Electro-magnetic compatibility R
High optical power Operating high optical power R
Fibre integrity Operating fibre pull R
Key
R: Requirement
O: Optional
– 10 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
Annex A
(informative)
Examples of reliability qualification test conditions
Table A.1 shows examples of reliability qualification test conditions. The reliability
qualification test developer may select the condition or define other conditions by referring to
Table A.1.
Table A.1 – Example of reliability qualification test conditions
Test items Example of test conditions Remarks
Operating mechanical shock 98 m/s , 0,3 ms half-sine shock pulse, 3 axes
Condition No. 1
Operating mechanical
vibration 2
Swept sine wave at a level of 9,8 m/s , 3 mm max.
displacement, 5 Hz to 100 Hz, 0,1 oct/min, 3 axes
Condition No. 2
Swept sine wave at a level of 19,6 m/s , 100 Hz to
200 Hz, 8 oct/min, 3 axes
Condition No. 1
Swept sine wave at a level of 9,8 m/s , 3 mm max.
displacement, 5 Hz to 100 Hz, 0,1 oct/min, 3 axes
2 000 m/s , 3 axes, 2 impacts/direction (12 impacts
Non-operating mechanical
total),
shock
Nominal 1,33 ms, half sine pulse
for 0,125 kg < m (mass) ≤ 0,225 kg
500 m/s , 3 axes, 2 impacts/direction (12 impacts total)
Nominal 5 ms, half sine pulse
for 0,225 kg < m ≤ 1 kg
100 mm height for m ≤ 10 kg
Non-operating unpacked drop
75 mm height for 10 kg < m ≤ 25 kg
5 Hz to 50 Hz, 0,1 oct/min, 15 m/s , then 50 Hz to
Non-operating vibration
500 Hz, 0,25 oct/min., 29,4 m/s
10 Hz to 2 000 Hz, 196 m/s maximum acceleration
5 Hz to 20 Hz, 0,01 g /Hz, 20 Hz to 200 Hz,
Packed vibration
–3 dB/oct
1 m height for ≤ 10 kg mass
Packed drop
Non-operating high
85 °C, 2 000 h
temperature
–40 °C, 72 h
Non-operating low temperature
–40 °C to +70 °C, 100 cycles
Non-operating temperature
a
cycling
–40 °C to +85 °C, 100 cycles
85 °C, 85 % RH, 1 000 h
Non-operating damp heat Telcordia GR-1312
85 °C, 85 % RH, 500 h
Operating temperature
–10 °C to +60 °C, 20 % RH to 85 % RH
humidity cycling
Under consideration
EMC
2 mm: 20 N to 100 N, 3 times, 5 s pulls Test procedure:
Operating fibre pull
900 µm: 10 N, 3 times, 5 s pulls IEC 61300-2-4
250 µm: 5 N, 3 times, 5 s pulls Duration:
Telcordia GR-1312
Under consideration
High optical power
Under consideration
Sample size
a
The detail conditions of duration and temperature transition rate should be determined for consideration of
thermal capacity of the DUT. The useful information of the temperature cycling test is described in IEC 60068-2-
14, Test Nb.
IEC 2023
Annex B
(informative)
Reliability qualification test recommendations
B.1 General
For the purposes of this document, each internal component, part, and interconnection should
be treated as a black box. It is also important to point out that the parts in the DM include
fibre splices, fibre routing, and fibre anchoring, as well as how the fibre exits from the housing
and how parts are mounted.
This document is based on the assumption that the reliability of a DM can be evaluated with
sufficient confidence from the failure in time (FIT) rates of its internal black boxes when the
assembly process of the constituents has been qualified.
There are degradation and failures not due to part failures, for example fibre routing and fibre
holders. The quality and reliability of the assembling, for example fibre routing, should be
assessed and qualified through process evaluation and qualification.
The internal black boxes often constituting a DM are:
• passive optical components, including patch cords, pigtails, connectors and splices;
• active optical components;
• electronics, including PCBs, electrical connectors, etc.;
• others (e.g. the fibre splicing, fibre routing, and fibre anchoring, as well as how the fibre
exits from the housing and how components are mounted).
DM manufacturers should declare the number and type of the internal black boxes
constituting the DM and give the failure rates (in FITs) for each black box.
The DM failure rate should be calculated by suitably combining the failure rates in FITs of its
black boxes. The model and assumptions used in the DM failure rate calculation should be
provided and justified for review, if the DM manufacturer has so requested.
B.2 Pass/fail criteria
It should be noted that the commonly used failure criterion of a drift higher than 0,5 dB in
insertion loss (IL) is a guideline. For dense wavelength division multiplexing (DWDM) DMs,
such as wavelength blockers, centre wavelength drift should be defined as a failure criterion.
The actual and practical criteria should be developed based on the degradation allowed for
the expected life of the product.
EXAMPLE
• The acceleration factor of the testing condition to the operating condition is 50.
• The beginning-of-life parametric measurement is 1,0 dB below the end-of-life specification.
• The expected life is assumed to be 20 years.
• The allowed degradation for a 2 000 h testing is: (1,0 × 50 × 2 000) / (20 × 365,25 × 24) = 0,57 dB.
Readers should note that IL is not the only parameter that should be considered for pass/fail,
but that other parameters are also to be included.
– 12 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
B.3 Guidance of failure mode effect analysis (FMEA) and qualification of
similarity
It is worth emphasizing that the reliability assessment or qualification tests should be based
on the degradation mechanisms and failure modes. The appropriate accelerated tests can be
developed once the degradation mechanisms, failure modes, and their acceleration factors
are understood. To begin with, the failure mode and effects analysis (FMEA) should be
developed. A set of reliability tests should be planned and conducted as the result of FMEA.
The testing results can be used to develop additional tests or refined tests to better
understand the degradation mechanisms or develop the acceleration models.
Where a range of dynamic modules is produced by a DM manufacturer, there may be some
significant similarity between different type codes. A combination of results from different test
programmes, where appropriate, is therefore permitted.
Consideration should be given to the fact that minor differences in technology or processing
can sometimes have a major impact on reliability, whilst not being apparent during quality
assessment.
At minimum, FMEA should be carried out for all varieties of products that are considered
"similar" and claimed to be "qualified" by "similarity". FMEA should be done thoroughly in
order to be an effective tool to consider "qualified-by-similarity". Its thoroughness can be
checked against the failure mode analysis (FMA) to manufacturing drop-out and customer
returns.
Evidence should be presented to demonstrate that all results are directly relevant.
IEC 2023
Bibliography
IEC 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature
IEC 61300 (all parts), Fibre optic interconnecting devices and passive components – Basic
tests and measurement procedures
IEC 61300-2-4, Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures – Part 2-4: Tests – Fibre or cable retention
IEC 62005-9-1, Fibre optic interconnecting devices and passive components – Reliability –
Part 9-1: Qualification of passive optical components
IEC 62005-9-2, Reliability of fibre optic interconnecting devices and passive optical
components – Part 9-2: Reliability qualification for single fibre optic connector sets – Single
mode
IEC TR 62343-6-6, Dynamic modules – Part 6-6: Design guide – Failure mode effect analysis
for optical units of dynamic modules
IEC 62572-3, Fibre optic active components and devices – Reliability standards – Part 3:
Laser modules used for telecommunication
United States Code of Federal Regulations (CFR) – Title 47 – Chapter I – Subchapter A –
Part 15, Telecommunication – Federal Communications Commission (FCC) – General – Radio
frequency devices
EN 55032, Electromagnetic compatibility of multimedia equipment – Emission Requirements
MIL-STD-883, Test Method Standard Microcircuits (Method 2003, Solderability)
Telcordia TR-NWT-000870, Electrostatic Discharge Control in the Manufacture of
Telecommunications Equipment
Telcordia GR-63-CORE, NEBS Requirements: Physical Protection
Telcordia GR-1089-CORE, Electromagnetic Compatibility and Electrical Safety –
Generic Criteria for Network Telecommunications Equipment
Telcordia GR-1209-CORE, Generic Requirements for Passive Optical Components
Telcordia GR-1312-CORE, Generic Requirements for Optical Fiber Amplifiers and Proprietary
Dense Wavelength-Division Multiplexed Systems
UL 94, UL Standard for Safety Tests for Flammability of Plastic Materials for Parts in Devices
and Appliances
___________
– 14 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
SOMMAIRE
AVANT-PROPOS . 15
INTRODUCTION . 18
1 Domaine d'application . 19
2 Références normatives . 19
3 Termes, définitions et termes abrégés . 19
3.1 Termes et définitions . 19
3.2 Termes abrégés . 20
4 Considérations sur les essais de qualification de fiabilité . 20
4.1 Généralités . 20
4.2 Approche . 20
5 Eléments d'essai de qualification de fiabilité . 21
Annexe A (informative) Exemples de conditions d'essai de qualification de la fiabilité . 22
Annexe B (informative) Recommandations concernant les essais de qualification de la
fiabilité . 24
B.1 Généralités . 24
B.2 Critères d'acceptation/de rejet . 24
B.3 Recommandations sur l'analyse des modes de défaillances et de leurs effets
(AMDE) et sur la qualification par similitude . 25
Bibliographie . 26
Tableau 1 – Eléments d'essai de qualification de fiabilité . 21
Tableau A.1 – Exemples de conditions d'essai de qualification de la fiabilité. 22
IEC 2023
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
MODULES DYNAMIQUES –
Partie 2-1: Qualification de fiabilité – Modèle d'essai
AVANT-PROPOS
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conditions fixées par accord entre les deux organisations.
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4) Dans le but d'encourager l'uniformité internationale, les Comités nationaux de l'IEC s'engagent, dans toute la
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et régionales. Toutes divergences entre toutes Publications de l'IEC et toutes publications nationales ou
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5) L'IEC elle-même ne fournit aucune attestation de conformité. Des organismes de certification indépendants
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6) Tous les utilisateurs doivent s'assurer qu'ils sont en possession de la dernière édition de cette publication.
7) Aucune responsabilité ne doit être imputée à l'IEC, à ses administrateurs, employés, auxiliaires ou mandataires,
y compris ses experts particuliers et les membres de ses comités d'études et des Comités nationaux de l'IEC,
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Publication de l'IEC, ou au crédit qui lui est accordé.
8) L'attention est attirée sur les références normatives citées dans cette publication. L'utilisation de publications
référencées est obligatoire pour une application correcte de la présente publication.
9) L'attention est attirée sur le fait que certains des éléments de la présente publication de l'IEC peuvent faire
l'objet de droits de brevet. L'IEC ne saurait être tenue pour responsable de ne pas avoir identifié de tels droits
de brevets et averti de leur existence.
Cette version consolidée de la Norme IEC officielle et de son amendement a été
préparée pour la commodité de l'utilisateur.
L’IEC 62343-2-1 édition 1.1 contient la première édition (2019-09) [documents
86C/1567/CDV et 86C/1594/RVC] et son amendement 1 (2023-12) [documents
86C/1868/CDV et 86C/1888/RVC].
Dans cette version Redline, une ligne verticale dans la marge indique où le contenu
technique est modifié par l'amendement 1. Les ajouts sont en vert, les suppressions
sont en rouge, barrées. Une version Finale avec toutes les modifications acceptées est
disponible dans cette publication.
– 16 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
La Norme internationale IEC 62343-2-1 a été établie par le sous-comité 86C: Systèmes et
dispositifs actifs à fibres optiques, du comité d’études 86 de l'IEC: Fibres optiques.
Cette première édition constitue une révision technique.
La présente édition inclut les modifications techniques majeures suivantes par rapport à
l'IEC 62343-2:2014:
a) ajout d'une introduction sur le contexte du présent document;
b) remplacement de "Considérations sur la qualification de fiabilité" par "Considérations sur
les essais de qualification de fiabilité";
c) suppression des considérations "Conception 1" et "Conception 2" et modification du
contenu du paragraphe "Approche" dans les "Considérations sur les essais de
qualification de fiabilité";
d) suppression des détails dans "Exigences de qualification de fiabilité" et remplacement par
"Eléments d'essai de qualification de fiabilité";
e) suppression de "Calculs de fiabilité" de la somme des taux de défaillance des constituants;
f) déplacement de "Critères d'acceptation/de rejet" et de "Recommandations sur l'analyse
des modes de défaillances et de leurs effets (AMDE)" à l'Annexe B (informative);
g) Simplification des éléments d'essai et des conditions dans l'Annexe A et modification du
titre de l'Annexe A qui devient "Exemples de conditions d'essai de qualification de la
fiabilité ".
Ce document a été rédigé selon les Directives ISO/IEC, Partie 2.
Une liste de toutes les parties de la série IEC 62343, publiées sous le titre général Modules
dynamiques, peut être consultée sur le site web de l'IEC.
Le comité a décidé que le contenu de ce document et de son amendement ne sera pas
modifié avant la date de stabilité indiquée sur le site web de l'IEC sous webstore.iec.ch dans
les données relatives au document recherché. À cette date, le document sera
• reconduit,
• supprimé, ou
• révisé.
IMPORTANT – Le logo "colour inside" qui se trouve sur la page de couverture de cette
publication indique qu'elle contient des couleurs qui sont considérées comme utiles à
une bonne compréhension de son contenu. Les utilisateurs devraient, par conséquent,
imprimer cette publication en utilisant une imprimante couleur.
IEC 2023
AVERTISSEMENT
Le présent document contient du matériel qui est protégé par le Copyright © 2006, Telcordia
Technologies, Inc. ("Telcordia"). Tous droits réservés.
Le lecteur est informé que le présent document IEC et la (les) source(s) de Telcordia peuvent
différer, et que le contexte et l'utilisation dudit matériel dans le présent document IEC peuvent
différer de ceux de Telcordia. TELCORDIA NE FAIT AUCUNE REPRESENTATION OU
GARANTIE, EXPRESSE OU IMPLICITE, EN CE QUI CONCERNE LA SUFFISANCE,
L'EXACTITUDE, OU L'UTILITE DE TOUTE INFORMATION OU OPINION CONTENUES DANS
CE DOCUMENT. TOUTE UTILISATION OU CONFIANCE ENVERS LADITE INFORMATION,
OU OPINION EST AUX RISQUES DE L'UTILISATEUR. TELCORDIA N'EST RESPONSABLE
D'AUCUN DOMMAGE NI BLESSURES ENCOURUS PAR TOUTE PERSONNE DUS A LA
SUFFISANCE, L'EXACTITUDE, OU L'UTILITE DE TOUTE INFORMATION OU OPINION
CONTENUES DANS CE DOCUMENT.
– 18 – IEC 62343-2-1:2019+AMD1:2023 CSV
IEC 2023
INTRODUCTION
Les modules dynamiques (DM: Dynamic Module) sont des dispositifs fibroniques relativement
récents. Il n'existe pas dans l'industrie de norme de facto couvrant les exigences relatives aux
essais de qualification de la fiabilité pour les modules dynamiques. De plus, il existe de
nombreux types de modules dynamiques avec différentes fonctions telles que la commutation
des chemins optiques, la gestion des longueurs d'onde, la gestion de la dispersion
chromatique, la gestion de la puissance des canaux de transmission optique et la surveillance
des longueurs d'onde et des puissances des canaux de transmission optique. Les
fonctionnalités sont donc tellement variées qu'il est difficile de normaliser les exigences
relatives aux essais de qualification de la fiabilité. Pour les modules dynamiques, un modèle
d'essai de qualification de la fiabilité plutôt que des exigences particulières a été normalisé.
La première édition de l'IEC 62343-2, Modules dynamiques – Partie 2: Qualification de
fiabilité, a été publiée en 2011, et la deuxième édition a été publiée en 2014. Une étude sur
les éléments et les conditio
...
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