IEC 60068-2-21:2006

Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices

IEC 60068-2-21:2006 is applicable to all electrical and electronic components whose terminations or integral mounting devices are liable to be submitted to stresses during normal assembly or handling operations. This edition includes the following significant technical changes with respect to the previous edition:
- Addition of torque severity for nominal thread diameter of 8 mm in Test Ud: torque in accordance with IEC 60252-2 (see table 5);
- Modification of substrate specification and mounting method describing lead-free solder in Test Ue (see Figure 5 and 8.3.3 et al.);
- Modification of test jig and test condition in Test Ue1: substrate bending test (see Figure 7 et al.);
- Change of pushing force from 10 N to 5 N in Test Ue3: shear test (see 8.5.3.2). The contents of the corrigendum of January 2012 have been included in this copy.

Essais d'environnement - Partie 2-21: Essais - Essai U: Robustesse des sorties et des dispositifs de montage incorporés

La CEI 60068-2-21:2006 est applicable à tous les composants électriques et électroniques dont les sorties ou les dispositifs de montage incorporés sont susceptibles d'être soumis à des contraintes au cours des opérations normales de montage ou de manipulation. La présente édition inclut les modifications techniques significatives suivantes par rapport à l'édition antérieure:
- Ajout de la sévérité du couple pour le diamètre nominal du filetage de 8 mm à l'Essai Ud: essai de couple, conformément à la CEI 60252-2 (voir le tableau 5);
- Modification de la spécification du substrat et de la méthode de montage décrivant l'alliage à braser sans plomb, à l'Essai Ue (voir la Figure 5 et le 8.3.3 et al.);
- Modification du gabarit d'essai et des conditions d'essai concernant l'Essai Ue1: essai de pliage du substrat (voir la Figure 7 et al.);
- Modification de la force de poussée passant de 10 N à 5 N dans l'Essai Ue3: essai de cisaillement (voir le 8.5.3.2). Le contenu du corrigendum de janvier 2012 a été pris en considération dans cet exemplaire.

General Information

• Status: Published
• Publication Date: 21-Jun-2006
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 19.040 - Environmental testing
• ICS: 31.190 - Electronic component assemblies
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 3 - TC 91/WG 3
• Current Stage: DELPUB - Deleted Publication
• Start Date: 31-Jul-2017
• Completion Date: 08-Jul-2021

Relations

• Corrected By: IEC 60068-2-21:2006/COR1:2012 - Corrigendum 1 - Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
• Effective Date: 05-Sep-2023
• Revises: IEC 60068-2-21:1999 - Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
• Effective Date: 05-Sep-2023
• Revised: IEC 60068-2-21:2021 - Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices
• Effective Date: 05-Sep-2023

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD 60068-2-21
Sixth edition
2006-06
Environmental testing –
Part 2-21:
Tests – Test U: Robustness of terminations
and integral mounting devices
Reference number
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the

60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.

Consolidated editions
The IEC is now publishing consolidated versions of its publications. For example,

edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the

base publication incorporating amendment 1 and the base publication incorporating

amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD 60068-2-21
Sixth edition
2006-06
Environmental testing –
Part 2-21:
Tests – Test U: Robustness of terminations
and integral mounting devices
 IEC 2006  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale U
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60068-2-21  IEC:2006(E)

CONTENTS
FOREWORD.4

1 Scope.6

2 Normative references .6

3 Test Ua : tensile .7
3.1 Object .7

3.2 General description .7

3.3 Preconditioning .7
3.4 Initial measurements .7
3.5 Test method .7
3.6 Final measurements .8
3.7 Information to be given in the relevant specification .8
4 Test Ua : thrust.9
4.1 Object .9
4.2 General description .9
4.3 Preconditioning .9
4.4 Initial measurements .9
4.5 Test method .9
4.6 Final measurements .10
4.7 Information to be given in the relevant specification .10
5 Test Ub: bending .10
5.1 Object .10
5.2 General description .11
5.3 Preconditioning .11
5.4 Initial measurements .11
5.5 Test method .11
5.6 Final measurements .13
5.7 Information to be given in the relevant specification .14
6 Test Uc: torsion .14
6.1 Object .14
6.2 Preconditioning .14
6.3 Initial measurements .14

6.4 Test method .14
6.5 Final measurements .15
6.6 Information to be given in the relevant specification .15
7 Test Ud: torque .15
7.1 Object .15
7.2 General description .15
7.3 Preconditioning .15
7.4 Initial measurements .15
7.5 Test method .16
7.6 Final measurements .16
7.7 Information to be given in the relevant specification .16

60068-2-21  IEC:2006(E) – 3 –

8 Test Ue: robustness of terminations for SMD in the mounted state .17

8.1 Object .17

8.2 General description .17

8.3 Mounting .18

8.4 Initial measurements .19

8.5 Test methods .19

8.6 Final measurements .21

8.7 Information to be given in the relevant specification .22

Figure 1 – Clamp for the testing of short terminations .13

Figure 2 – Sketches showing direction by arrow heads of application of forces
Test Ua : tensile and test Ua : thrust.23
1 2
Figure 3 – Sketches showing test procedure for test Ub: bending (see 5.5.2.1 and 5.5.2.3) .24
Figure 4 – Diagrams showing test procedure for test Uc: torsion test for wire terminations.25
Figure 5 – Example of substrate for test method Ue (also suitable for electrical test).26
Figure 6 – Example of substrate for test methods Ue and Ue
2 3
(also suitable for electrical test) .26
Figure 7 – Bending jig for test Ue .27
Figure 8 – Example of a push-off test substrate .27
Figure 9 – Force test Ue – pull-off .28
Figure 10 – Example of a force application pushing tool for test Ue – push-off .28
Figure 11 – Example of the shear (adhesion) test – Ue .28
Table 1 – Application .6
Table 2 – Value of applied force for test Ua .8
Table 3 – Value of applied force for test Ua .10
Table 4 – Value of applied force for test Ub .12
Table 5 – Torque severity .16

– 4 – 60068-2-21  IEC:2006(E)

INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
ENVIRONMENTAL TESTING –
Part 2-21: Tests – Test U: Robustness of terminations

and integral mounting devices
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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...

IEC 60068-2-21 ®
Edition 6.0 2006-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Environmental testing –
Part 2-21: Tests – Test U: Robustness of terminations and integral mounting
devices
Essais d’environnement –
Partie 2-21: Essais – Essai U: Robustesse des sorties et des dispositifs de
montage incorporés
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
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IEC 60068-2-21 ®
Edition 6.0 2006-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Environmental testing –
Part 2-21: Tests – Test U: Robustness of terminations and integral mounting
devices
Essais d’environnement –
Partie 2-21: Essais – Essai U: Robustesse des sorties et des dispositifs de
montage incorporés
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX U
ICS 19.040; 31.190 ISBN 978-2-88912-734-4

– 2 – 60068-2-21  IEC:2006
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Test Ua : tensile . 7
3.1 Object . 7
3.2 General description . 7
3.3 Preconditioning . 7
3.4 Initial measurements . 7
3.5 Test method . 7
3.6 Final measurements . 8
3.7 Information to be given in the relevant specification . 8
4 Test Ua : thrust . 9
4.1 Object . 9
4.2 General description . 9
4.3 Preconditioning . 9
4.4 Initial measurements . 9
4.5 Test method . 9
4.6 Final measurements . 10
4.7 Information to be given in the relevant specification . 10
5 Test Ub: bending . 10
5.1 Object . 10
5.2 General description . 11
5.3 Preconditioning . 11
5.4 Initial measurements . 11
5.5 Test method . 11
5.6 Final measurements . 13
5.7 Information to be given in the relevant specification . 14
6 Test Uc: torsion . 14
6.1 Object . 14
6.2 Preconditioning . 14
6.3 Initial measurements . 14
6.4 Test method . 14
6.5 Final measurements . 15
6.6 Information to be given in the relevant specification . 15
7 Test Ud: torque . 15
7.1 Object . 15
7.2 General description . 15
7.3 Preconditioning . 15
7.4 Initial measurements . 15
7.5 Test method . 16
7.6 Final measurements . 16
7.7 Information to be given in the relevant specification . 16

60068-2-21  IEC:2006 – 3 –
8 Test Ue: robustness of terminations for SMD in the mounted state . 17
8.1 Object . 17
8.2 General description . 17
8.3 Mounting . 18
8.4 Initial measurements . 19
8.5 Test methods . 19
8.6 Final measurements . 21
8.7 Information to be given in the relevant specification . 22

Figure 1 – Clamp for the testing of short terminations . 13
Figure 2 – Sketches showing direction by arrow heads of application of forces
Test Ua : tensile and test Ua : thrust . 23
1 2
Figure 3 – Sketches showing test procedure for test Ub: bending (see 5.5.2.1 and 5.5.2.3) . 24
Figure 4 – Diagrams showing test procedure for test Uc: torsion test for wire terminations. 25
Figure 5 – Example of substrate for test method Ue (also suitable for electrical test) . 26
Figure 6 – Example of substrate for test methods Ue and Ue
2 3
(also suitable for electrical test) . 26
Figure 7 – Bending jig for test Ue . 27
Figure 8 – Example of a push-off test substrate . 27
Figure 9 – Force test Ue – pull-off . 28
Figure 10 – Example of a force application pushing tool for test Ue – push-off . 28
Figure 11 – Example of the shear (adhesion) test – Ue . 28
Table 1 – Application . 6
Table 2 – Value of applied force for test Ua . 8
Table 3 – Value of applied force for test Ua . 10
Table 4 – Value of applied force for test Ub . 12
Table 5 – Torque severity . 16

– 4 – 60068-2-21  IEC:2006
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ENVIRONMENTAL TESTING –
Part 2-21: Tests – Test U: Robustness of terminations
and integral mounting devices
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee in
...