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IEC TS 62607-6-11:2022

(Main)

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy

General Information

Status
Published
Publication Date
07-Feb-2022
ICS
07.120 - Nanotechnologies
Technical Committee
TC 113 - Nanotechnology for electrotechnical products and systems
Drafting Committee
PT 62607-6-11 - TC 113/PT 62607-6-11
Current Stage
PPUB - Publication issued
Start Date
01-Mar-2022
Completion Date
08-Feb-2022
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IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopyIEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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IEC TS 62607-6-11:2022 - Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
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IEC TS 62607-6-11
®

Edition 1.0 2022-02
TECHNICAL
SPECIFICATION

colour
inside


Nanomanufacturing – Key control characteristics –
Part 6-11: Graphene – Defect density: Raman spectroscopy
IEC TS 62607-6-11:2022-02(en)

---------------------- Page: 1 ----------------------
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IEC TS 62607-6-11

®


Edition 1.0 2022-02




TECHNICAL



SPECIFICATION








colour

inside










Nanomanufacturing – Key control characteristics –

Part 6-11: Graphene – Defect density: Raman spectroscopy


























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ICS 07.120 ISBN 978-2-8322-1071-9




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® Registered trademark of the International Electrotechnical Commission

---------------------- Page: 3 ----------------------
– 2 – IEC TS 62607-6-11:2022 © IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 8
3.2 Key control characteristics measured in accordance with this document . 9
3.3 Terms related to the measurement method described in this document . 9
4 General . 10
4.1 Measurement principle . 10
4.2 Sample preparation method . 11
4.3 Description of test equipment . 11
4.4 Calibration standards, alignment and peak fitting . 12
...

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