Effects of engaging and separating under electrical load on connector interfaces in cabling used to support IEEE 802.3af (power-over-ethernet) applications

IEC/TR 62652:2010(E) is intended to provide information on the effects of engaging and separating under electrical load on the connector interfaces in cabling, used to support IEEE 802.3af (Power-over-Ethernet (PoE)) applications.

General Information

Status
Published
Publication Date
29-Mar-2010
Technical Committee
Current Stage
PPUB - Publication issued
Start Date
30-Jun-2010
Completion Date
30-Mar-2010
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IEC TR 62652:2010 - Effects of engaging and separating under electrical load on connector interfaces in cabling used to support IEEE 802.3af (power-over-ethernet) applications
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IEC/TR 62652 ®
Edition 1.0 2010-03
TECHNICAL
REPORT
colour
inside
Effects of engaging and separating under electrical load on connector interfaces
in cabling used to support IEEE 802.3af (power-over-ethernet) applications

IEC/TR 62652:2010(E)
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IEC/TR 62652 ®
Edition 1.0 2010-03
TECHNICAL
REPORT
colour
inside
Effects of engaging and separating under electrical load on connector interfaces
in cabling used to support IEEE 802.3af (power-over-ethernet) applications

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
U
ICS 31.220.10 ISBN 2-8318-1087-3
– 2 – TR 62652 © IEC:2010(E)
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .7
3 Abbreviations .7
4 General .8
5 Telecommunications industry information .8
6 Technical information .9
6.1 Electrical discharges .9
6.2 Surface plating. long and short term effects.10
6.3 IEEE 802.3af – Power-over-Ethernet environment (PoE) .11
6.4 Factors affecting the connector durability and definition of a nominal contact
zone.12
6.5 Acceptance criteria.13
7 Test procedures, test set-up description and results .14
7.1 General .14
7.2 Tests 1A and 2A – Evaluation of the mechanical damage.15
7.3 Tests 3A.15
7.4 Test 4A – Comparison of different IEC 60603-7 connectors.17
7.4.1 General .17
7.4.2 Tests – Visual inspection of contacts .17
7.4.3 Results and observations to test 4A.17
7.5 Test 5A – Resistive test setup simulating PoE power stress .19
7.5.1 General .19
7.5.2 Test setup .19
7.5.3 Tests – Visal inspection of contacts.19
7.5.4 Results and observations to test 5A.19
7.6 Test 6A – Engaging and separating with IEEE 802.3af hardware.20
7.6.1 PoE hardware.20
7.6.2 Tests – Visual inspection of contacts .21
7.6.3 Results – Test 6A .21
7.7 Test 7A and 8A – Effect of speed of contact separation.22
7.8 Tests 9A, 10A and 11A – Effect of the cord length.22
7.9 Test 12A – Effect of polarity .23
7.10 Test 13 A – Investigation of IEC 60603-7-7 or IEC 61076-3-110 connecting
hardware .24
7.11 Tests 14A and 15 A. 100 m long cable test.25
8 Conclusions.26
9 Future work .26
Bibliography.28

Figure 1 – Illustration of a typical shielded 8-way connector according IEC 60603-7 .9
Figure 2 – Illustration of an IEC 60603-7-7 or IEC 61076-3-110 connector.9
Figure 3 – Connecting hardware contacts .10
Figure 4 – Endspan PSE – Alternative A according to IEEE 802.3af .11

TR 62652 © IEC:2010(E) – 3 –
Figure 5 – Midspan PSE – Alternative B according to IEEE 802.3af .11
Figure 6 – Cables used in the study.12
Figure 7 – Illustration of contact engaging cycle.13
Figure 8 – Illustration of a nominal contact area concept.13
Figure 9 – Illustration of a low level contact resistance (bulk) test .14
Figure 10 – IEC 60603-7-7 connector contacts .15
Figure 11 – Test circuit A.16
Figure 12 – Test results of tests 1A and 3A.16
Figure 13 – Test circuit B.17
Figure 14 – Damage due to electrical discharges.18
Figure 15 – Test 4A – Changes in LLCR .18
Figure 16 – Test circuit C.19
Figure 17 – Test 5A observations .20
Figure 18 – Test 5A results show little change in LLCR.20
Figure 19 – Test circuit D.21
Figure 20 – Test results test 6A .21
Figure 21 – Test circuit E.22
Figure 22 – LLCR (bulk) change .22
Figure 23 – Test circuit F .23
Figure 24 – Test 12A – Observed minor damage to the plug connector surface .24
Figure 25 – Discharge effects for the IEC 60603-7-7 connector .25
Figure 26 – Test results test 13A .25
Figure 27 – Change in the LLCR due to electrical and mechanical discharge for
IEC 60603-7 connectors including 2 m, 10 m, and 100 m cables combined.26

Table 1 – Some factors affecting the connecting hardware durability .12
Table 2 – Selected parameters of the test set up and procedures .14

– 4 – TR 62652 © IEC:2010(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
EFFECTS OF ENGAGING AND SEPARATING UNDER ELECTRICAL LOAD
ON CONNECTOR INTERFACES IN CABLING USED TO SUPPORT
IEEE 802.3af (POWER-OVER-ETHERNET) APPLICATIONS

FOREWORD
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