IEC 60352-2:2024
(Main)Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical guidance
Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical guidance
IEC 60352-2:2024 is applicable to solderless crimped connections made with:
- appropriately designed uninsulated or pre-insulated crimp barrels as parts of crimp contacts, terminal ends or splices, and
- stranded wires of 0,05 mm2 to 10 mm2 cross-section or
- solid wires of 0,25 mm to 3,6 mm diameter;
for use in electrical and electronic equipment.
Information on the materials and data from industrial experience is included in addition to the test procedures to provide electrically stable connections under prescribed environmental conditions.
This part of IEC 60352 is not applicable to crimping of coaxial cables.
This part of IEC 60352 determines the suitability of solderless crimped connections as described above, under specified mechanical, electrical and atmospheric conditions and provides a means of comparing test results when the tools used to make the connections are of different designs or manufacture.
Connexions sans soudure - Partie 2: Connexions serties - Exigences générales, méthodes d'essai et guide pratique
IEC 60352-2:2024 s’applique aux connexions serties sans soudure réalisées avec:
- des fûts à sertir non isolés ou pré-isolés, de conception appropriée, utilisés en tant que parties de contacts à sertir, d’embouts ou de jonctions de fils; et
- des fils câblés de section comprise entre 0,05 mm2 et 10 mm2; ou
- des fils massifs de 0,25 mm à 3,6 mm de diamètre;
destinés à être utilisés dans des équipements électriques et électroniques.
Des informations sur les matériaux et des données émanant de l’expérience industrielle sont fournies en plus des procédures d’essai afin de fournir des connexions électriquement stables dans les conditions d’environnement prescrites.
La présente partie de l’IEC 60352 ne s’applique pas au sertissage des câbles coaxiaux.
La présente partie de l’IEC 60352 détermine la conformité des connexions serties sans soudure telles que décrites ci-dessus, dans des conditions mécaniques, électriques et atmosphériques spécifiées, et fournit un moyen pour comparer les résultats d’essai lorsque les outils utilisés pour réaliser les connexions sont de conception ou de fabrication différentes.
General Information
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Standards Content (Sample)
IEC 60352-2 ®
Edition 3.0 2024-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Solderless connections –
Part 2: Crimped connections – General requirements, test methods and practical
guidance
Connexions sans soudure –
Partie 2: Connexions serties – Exigences générales, méthodes d'essai et guide
pratique
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IEC 60352-2 ®
Edition 3.0 2024-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Solderless connections –
Part 2: Crimped connections – General requirements, test methods and
practical guidance
Connexions sans soudure –
Partie 2: Connexions serties – Exigences générales, méthodes d'essai et guide
pratique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.120.20 ISBN 978-2-8322-9903-6
– 2 – IEC 60352-2:2024 © IEC 2024
CONTENTS
FOREWORD . 10
INTRODUCTION . 13
1 Scope . 14
2 Normative references . 14
3 Terms and definitions . 16
4 Workmanship . 25
5 Prerequisites for basic test schedule . 26
5.1 Classification by end-product class . 26
5.1.1 General . 26
5.1.2 Class A – General electrical and electronics products . 26
5.1.3 Class B – Dedicated service electrical and electronics products . 26
5.1.4 Class C – High-performance electrical and electronics products . 26
5.2 Prerequisites for tools . 26
5.3 Prerequisites for crimp barrels . 27
5.3.1 Crimp barrel materials . 27
5.3.2 Crimp barrel dimensions . 27
5.3.3 Crimp barrel surface finishes . 27
5.3.4 Crimp barrel design features . 28
5.4 Prerequisites for wires . 28
5.4.1 General . 28
5.4.2 Conductor materials. 28
5.4.3 Conductor dimensions . 28
5.4.4 Conductor surface finishes . 29
5.4.5 Wire insulation . 29
5.4.6 Wire cutting and stripping . 29
5.5 Prerequisites for crimped connections. 31
5.5.1 Compatibility of combination . 31
5.5.2 Conductor location . 31
5.5.3 Crimping location . 31
5.5.4 Contact deformation . 31
5.5.5 Prerequisites for crimped connections with more than one conductor in
the crimp barrel . 31
5.5.6 Adjustment of conductor cross-sectional area to the crimp barrel . 32
5.5.7 Crimp contacts and terminal ends . 32
5.5.8 Splice crimp barrels . 36
5.6 Prerequisites for splice crimped connections . 37
5.6.1 General . 37
5.6.2 Conductor requirements for crimped splices . 37
6 Testing . 38
6.1 General . 38
6.2 Standard conditions for testing . 39
6.3 Pre-conditioning . 39
6.4 Recovery . 39
6.5 Mounting of the specimen . 39
7 Test methods and test requirements . 40
7.1 General examination of crimp barrels and wires . 40
7.2 Examination of crimp dimensions . 40
7.2.1 Crimp height C , crimp width C and measurable crimp width C . 40
h w wm
7.2.2 Contact deformation after crimping . 42
7.2.3 Visual examination of insulation distance and conductor overhang . 43
7.2.4 Visual examination of splice crimped connections . 44
7.2.5 Visual examination of crimped connections on closed (machined) crimp
barrels . 44
7.2.6 Visual examination of crimped connections on B-crimp open crimp
barrels . 44
7.2.7 Visual examination of crimped connections with open crimp barrel with
insulation grip . 44
7.3 Mechanical tests . 46
7.3.1 Tensile strength . 46
7.3.2 Microsection . 48
7.3.3 Insulation grip effectiveness . 49
7.3.4 Bending test (uninsulated crimp barrels with insulation grip) . 50
7.3.5 Bending test (pre-insulated crimp barrels with insulation grip) . 51
7.3.6 Bending test on splice crimped connections . 52
7.3.7 Vibration test . 52
7.4 Electrical tests . 53
7.4.1 Crimp resistance. 53
7.4.2 Voltage proof (crimped connection with pre-insulated crimp barrels) . 58
7.4.3 Current-carrying capacity test with temperature rise . 58
7.5 Climatic tests . 60
7.5.1 General . 60
7.5.2 Rapid change of temperature . 60
7.5.3 Dry heat . 61
7.5.4 Climatic sequence . 61
7.5.5 Current loading, cyclic . 62
7.5.6 Crimping at low temperature (crimped connections with pre-insulated
crimp barrels) . 66
7.6 Miscellaneous tests . 67
7.6.1 Fluid resistance of pre-insulated crimp barrels . 67
7.6.2 Flowing mixed gas corrosion test . 67
8 Test schedules . 68
8.1 Preparation and type of test specimens . 68
8.1.1 Preparation of test specimens. 68
8.1.2 Type A specimen (for testing according to 8.2, 8.2.3.3 if required, 8.3.2,
8.3.4 if required) . 68
8.1.3 Type B specimen (for tests according to 8.2.3.1 and 8.3.3.2) . 68
8.1.4 Type C specimen (for insulation grip effectiveness tests, see 8.2.3.3
and 8.3.4) . 69
8.1.5 Type D specimen (for testing of pre-insulated crimp barrels only, see
8.2.3.4, 8.3.9.2 and 8.3.9.3) . 70
8.1.6 Type E specimen (for tests according to 8.2.3.2, 8.2.3.4, 8.3.3.5) . 70
8.1.7 Type F specimen (for testing of pre-insulated crimp barrels according to
8.3.9.4) . 71
8.1.8 Type G specimen (for testing according to 8.2.3.2, 8.3.3.4, 8.3.3.5 and
8.3.6) . 72
8.1.9 Type H specimen (for testing according to 8.2.2, 8.2.3.1, 8.2.3.3, 8.3.2,
8.3.3.2, 8.3.3.3 and 8.3.4) . 72
– 4 – IEC 60352-2:2024 © IEC 2024
8.1.10 Number of specimens required . 73
8.2 Basic test schedule . 74
8.2.1 General . 74
8.2.2 Initial examination . 74
8.2.3 Testing of crimped connections . 75
8.3 Full test schedule . 77
8.3.1 General . 77
8.3.2 Initial examination . 78
8.3.3 Testing of crimped connections . 78
8.3.4 Testing of insulation grip effectiveness, test group F5 . 80
8.3.5 Testing of stability of splice crimped connections under bending . 81
8.3.6 Test group F7, if required . 81
8.3.7 Test group F8, if required . 81
8.3.8 Test group F9, if required . 81
8.3.9 Testing of crimped connections with pre-insulated crimp barrels . 82
8.4 Flow charts . 83
Annex A (informative) Practical guidance . 86
A.1 General information on crimped connections . 86
A.1.1 General . 86
A.1.2 Advantages of crimped connections . 86
A.1.3 Current-carrying capacity considerations . 86
A.2 Tool information . 87
A.3 Crimp barrel information . 88
A.3.1 General . 88
A.3.2 Materials . 89
A.3.3 Surface finishes . 89
A.3.4 Shapes of crimped connections . 89
A.4 Wire information. 91
A.4.1 General . 91
A.4.2 Conductor materials. 92
A.4.3 Conductor surface finishes . 92
A.4.4 Wire stripping information . 92
A.5 Crimped connection information . 95
A.5.1 General . 95
A.5.2 Additional information . 96
A.5.3 Crimped connections made with more than one wire in a crimp barrel . 99
A.5.4 Dimensions after crimping . 100
A.5.5 Conductor and crimp barrel materials and finishes selection . 100
A.6 Crimping process . 100
A.6.1 Crimping of contacts with open crimp barrel . 100
A.6.2 Crimping of contacts with open crimp barrel, loose piece contacts . 100
A.6.3 Processing instruction . 101
A.7 Correct crimped connections (additional information) . 102
A.7.1 Correct crimped connections of contacts with open crimp barrel . 102
A.7.2 Measuring of crimp height or depth . 103
A.7.3 Pull-out force . 104
A.8 Examination by microsection . 110
A.8.1 Microsection image creation . 110
A.8.2 Graphical representation of the microsection image requirements . 111
A.8.3 Microsection terminology . 112
A.8.4 Porosity ratio of crimped connections in microsections . 114
A.8.5 Crimp compression ratio of the crimped connection in the microsection . 115
A.8.6 Ratio of crimp height to crimp width in the microsection . 115
A.8.7 Requirements for B-crimped connections in the microsection . 116
A.8.8 Condition of microsections . 117
A.8.9 Insulation grip . 119
A.9 Faults with crimped contacts having open crimp barrels . 121
A.10 Splices . 121
A.11 Crimp resistance test . 121
A.11.1 General . 121
A.11.2 Notes on specimen preparation and measurement . 125
A.12 General information about crimp contacts as part of a multipole connector . 125
A.12.1 Insertion of crimped contacts into the contact cavities of the connector
insert . 125
A.12.2 Removal of inserted contacts . 126
A.12.3 Mounting and bending of wire bundles or cables with crimped contacts . 126
A.12.4 Mating and unmating of multipole connectors with crimped contacts . 127
A.13 Final remarks . 127
Bibliography . 128
Figure 1 – Examples of crimp contact . 17
Figure 2 – Examples of splice . 18
Figure 3 – Example of insulation support . 18
Figure 4 – Examples of insulation grip . 19
Figure 5 – Examples of crimping tool . 19
Figure 6 – Example of positioner holding the crimp barrel . 20
Figure 7 – Example of positioner holding the stripped wire . 20
Figure 8 – Open crimp barrel . 22
Figure 9 – Closed crimp barrels . 22
Figure 10 – Pre-insulated crimp barrel . 23
Figure 11 – Crimping zones . 23
Figure 12 – Example of crimp funnel . 24
Figure 13 – Concentricity of wire insulation . 29
Figure 14 – Diameter ratio when crimping wires with different individual strand
diameters . 32
Figure 15 – Examples of open stamped crimp contacts for automatic production . 32
Figure 16 – Stamped open B-crimp contact with anvil and punch shapes . 33
Figure 17 – Designations on open B-crimp contact . 33
Figure 18 – Examples of crimping dies (press dies) . 33
Figure 19 – Stamped closed crimp barrel (crimp cable lug) . 34
Figure 20 – Different crimp shapes . 34
Figure 21 – Examples of crimping dies for closed crimp barrels . 34
Figure 22 – Tubular cable lugs for class 5 conductors . 35
Figure 23 – Tubular cable lugs for class 6 conductors . 35
Figure 24 – Crimping process of 4-indent crimping with adjustable tools . 35
– 6 – IEC 60352-2:2024 © IEC 2024
Figure 25 – Pre-insulated stamped close crimp barrel, area definitions . 36
Figure 26 – Pre-insulated closed crimp barrels of various designs . 36
Figure 27 – Examples of pre-insulated crimp cable lugs as strip parts . 36
Figure 28 – Uninsulated splice variants . 37
Figure 29 – Diameter ratio when crimping wires with different individual strand
diameters in splices . 38
Figure 30 – Crimp height measurement on open crimp barrel (B-crimp) . 41
Figure 31 – Crimp height measurement on closed crimp barrel (mandrel crimping) . 41
Figure 32 – Crimp height measurement on closed crimp barrel (4-indent crimping) . 42
Figure 33 – Example of holding and measuring points for contact deformation . 43
Figure 34 – Insulation distance and conductor overhang . 43
Figure 35 – Examples of insulation grip die shapes . 45
Figure 36 – Examples of insulation grip . 45
Figure 37 – Test arrangement . 50
Figure 38 – Bending test of crimped connections with uninsulated crimp barrels . 50
Figure 39 – Bending test of crimped connections with pre-insulated crimp barrels . 51
Figure 40 – Bending test on splice crimped connections . 52
Figure 41 – Arrangement for vibration test . 53
Figure 42 – Test arrangement for measurement of crimp resistance of single-conductor
crimped connection . 54
Figure 43 – Measuring of crimp resistance of splices or multiple-conductor crimp
connections . 54
Figure 44 – Crimp resistance R of crimped connections with copper barrels and
C
copper conductor (K = 1) . 56
Figure 45 – Test setup for temperature rise measurements under current load . 58
Figure 46 – Temperature chamber with ventilation opening for current-temperature
derating measurements . 60
Figure 47 – Examples of test arrangements . 64
Figure 48 – Test current for crimped connections . 65
Figure 49 – Examples of type A specimens . 68
Figure 50 – Examples of type B specimens . 69
Figure 51 – Examples of type C specimens . 70
Figure 52 – Example of type D specimen (pre-insulated) . 70
Figure 53 – Examples of type E specimen. 71
Figure 54 – Example of type F specimen . 72
Figure 55 – Type G specimen (splice) . 72
Figure 56 – Type H specimen (splice) . 73
Figure 57 – Basic test schedule (see 8.2) . 84
Figure 58 – Full test schedule (see 8.3) . 85
Figure A.1 – Open crimp barrels . 88
Figure A.2 – Closed crimp barrels . 89
Figure A.3 – Crimping shape in the wire axis . 90
Figure A.4 – Crimping shape 90° angled to the wire axis . 90
Figure A.5 – Crimping shape without insulation grip . 90
Figure A.6 – Crimping shape with pre-insulated crimp barrel . 91
Figure A.7 – Crimping shape without pre-insulated crimp barrel . 91
Figure A.8 – Crimped connections using solid round conductors . 92
Figure A.9 – Stripping length . 93
Figure A.10 – Example of parallel (in-line) process crimping and angled crimping
process . 101
Figure A.11 – Crimping process of an open crimp barrel (B-crimp) . 102
Figure A.12 – Correct crimped connections of contacts with open crimp barrel . 102
Figure A.13 – Measuring instructions . 103
Figure A.14 – Crimp height measuring procedure . 104
Figure A.15 – Pull-out force test for crimped connections with pull speed 50 mm/min . 105
Figure A.16 – Determination of the intrinsic tensile strength of the conductor
(50 mm/min) . 107
Figure A.17 – Relationships between crimp height (C ), pull-out force, crimp force
h
(indentation depth), and electrical conductivity . 109
Figure A.18 – Pull-out force test of splice crimp connections (50 mm/min) . 110
Figure A.19 – Illustration of the parting plane on the crimp barrel centred in the
crimping zone (X). 111
Figure A.20 – Example of end-feed (length feed) open barrel crimp contacts . 111
Figure A.21 – Cutting the crimped connection . 111
Figure A.22 – Dimensions on the microsection for B-crimp barrels . 112
Figure A.23 – Dimensions on the microsection for closed tube and crimped cable lugs . 113
Figure A.24 – Dimensions on the microsection for 4-indent closed crimp barrels . 113
Figure A.25 – Dimensions on the microsection for hexagonal crimp barrels . 113
Figure A.26 – Dimensions on the microsection for crimp barrels (also pre-insulated) . 114
Figure A.27 – Examples of microsections of crimp barrels . 114
Figure A.28 – Ratio of crimp height C to crimp width C . 115
h w
Figure A.29 – Ratio of distance between crimp face ends CFE and base material
thickness S . 116
Figure A.30 – Support angle α of the crimp flanks . 116
w
Figure A.31 – Support height L of the crimp flanks . 116
a
Figure A.32 – Crimp edge distance to floor (F ) . 116
a
Figure A.33 – Resulting bottom thickness S after crimping . 117
b
Figure A.34 – Requirements for the acceptance of a burr formation . 117
Figure A.35 – Diagrams for resistance values (A and B) for electrolytic copper
conductors (K = 1) and for material with K = 3,8. 122
Figure A.36 – Replacement circuit diagram for the crimp resistance . 123
Figure A.37 – Insertion of crimped contacts into contact cavities . 126
Figure A.38 – Mounting of wire bundles/cables with crimped contacts . 126
Figure A.39 – Bending of wire bundles of connectors . 127
Figure A.40 – Mating and unmating of multipole connectors . 127
Table 1 – Allowable strand damage . 30
Table 2 – Prerequisites of 5.3 for crimp barrels to access the basic test schedule of 8.2 . 38
– 8 – IEC 60352-2:2024 © IEC 2024
Table 3 – Prerequisites of 5.4 for wires to access the basic test schedule of 8.2 . 39
Table 4 – Magnification aids for visual examination . 40
Table 5 – Example of permissible tolerances for crimp height measurements . 42
Table 6 – Insulation distance and conductor overhang on closed crimp barrels . 44
Table 7 – Pull-out force of crimped connections . 47
Table 8 – Vibration, preferred test severities . 53
Table 9 – Example of other materials . 57
Table 10 – Minimum wire length L as a function of conductor cross-sectional area S . 59
Table 11 – Current values (tentative) – alternative current loading, cyclic method . 66
Table 12 – Number of specimens . 73
Table 13 – Test group B0 . 75
Table 14 – Test group B1 . 75
Table 15 – Test group B2 . 76
Table 16 – Test group B3 . 76
Table 17 – Test group B4 . 77
Table 18 – Test group B5 . 77
Table 19 – Test group F0 . 78
Table 20 – Test group F1 . 79
Table 21 – Test group F2 . 79
Table 22 – Test group F3 . 79
Table 23 – Test group F4 . 80
Table 24 – Test group F5 . 80
Table 25 – Test group F6 . 81
Table 26 – Test group F7 . 81
Table 27 – Test group F8 . 81
Table 28 – Test group F9 . 82
Table 29 – Test group F10 . 82
Table 30 – Test group F11 . 83
Table 31 – Test group F12 . 83
Table A.1 – Stripping of stranded conductors (good to sufficient requirements) . 94
Table A.2 – Stripping of stranded conductors (faults or conditions according to Table 1) . 95
Table A.3 – Condition of closed machined crimp barrels . 97
Table A.4 – Condition of open crimp barrels (B-crimp) . 98
Table A.5 – Minimum dimensions and tolerances for input funnel on a B-crimping zone . 99
Table A.6 – Condition of position of wire insulation in the insulation grip . 99
Table A.7 – Pull-out force recommended minimum values for electrolytic copper
conductors with tensile strength 200 N/mm (e.g. according to EN 13602) . 106
Table A.8 – Examples of pull-out force values (break) of commercially available
European stranded conductors . 107
Table A.9 – Examples of pull-out force values (break) of commercially available
American stranded conductors . 107
Table A.10 – Determination of the minimum pull-out forces in relation to the respective
cross-sectional area and the intrinsic tensile strength of the conductor . 108
Table A.11 – Pull-out force values for butt splice crimped connections . 110
Table A.12 – Values for the support height L . 116
a
Table A.13 – Condition of microsections . 118
Table A.14 – Condition "Good" of insulation grip for B-crimp and O-crimp
(asymmetrical and symmetrical overlap and enclosure crimp) . 119
Table A.15 – Condition "PID" of insulation grip for B-crimp and O-crimp (asymmetrical
and symmetrical overlap and enclosure crimp) . 120
Table A.16 – Condition "Fault" of insulation grip for B-crimp, O-crimp (asymmetrical
and symmetrical overlap and enclosure crimp) . 120
Table A.17 – Features of splice crimp barrels . 121
Table A.18 – Crimp resistance (maximum allowed initial values A) for K = 1
(electrolytic copper) . 124
Table A.19 – Crimp resistance (after loading, R ) for K = 1 (electrolytic copper) . 124
CR
Table A.20 – Crimp resistance (maximum allowed initial values A) for K ≈ 3,8 (nickel-
brass, bright) . 124
Table A.21 – Crimp resistance (after loading, R ) for K
...
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