Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

This part of IEC 60747 gives the terminology, essential ratings, characteristics, safety test as well as the measuring method for photocouplers (or optocouplers). NOTE The word "optocoupler" can also be used instead of "photocoupler". This standard replaces the clauses for photocouplers (or optocouplers) described in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments. The contents for phototransistors and photothyristors in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments, will be considered obsolete as of the effective date of publication of this standard. NOTE Photocouplers that are certified to the previous version of the photocoupler standard, namely IEC 60747-5-1/2/3, are to be considered in compliance with the requirements and provisions of IEC 60747-5-5.

Dispositifs à semiconducteurs - Dispositifs discrets - Partie 5-5: Dispositifs optoélectroniques - Photocoupleurs

La présente partie de la CEI 60747 donne la terminologie, les performances essentielles, les caractéristiques, les essais de sécurité ainsi que les méthodes de mesures pour les photocoupleurs (ou optocoupleurs). NOTE Le terme "optocoupleur" peut aussi être employé à la place de "photocoupleur". Cette norme remplace les articles pour les photocoupleurs (ou optocoupleurs) décrites dans la CEI 60747-5-1, la CEI 60747-5-2 et la CEI 60747-5-3, y compris leurs amendements. Le texte concernant les phototransistors et les photothyristors dans la CEI 60747-5-1, la CEI 60747- 5-2 et la CEI 60747-5-3 y compris leurs amendements sera considéré obsolète à la date effective de publication de la présente norme. NOTE Les photocoupleurs qui sont certifiés selon la version précédente de la norme sur les photocoupleurs, c'est-à-dire la CEI 60747-5-1/2/3, sont à considérer comme étant en conformité avec les exigences et dispositions de la CEI 60747-5-5.

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Publication Date
25-Sep-2007
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20-Jul-2020
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IEC 60747-5-5
Edition 1.0 2007-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Discrete devices –
Part 5-5: Optoelectronic devices – Photocouplers

Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 5-5: Dispositifs optoélectroniques – Photocoupleurs

IEC 60747-5-5:2007

---------------------- Page: 1 ----------------------
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IEC 60747-5-5
Edition 1.0 2007-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Discrete devices –
Part 5-5: Optoelectronic devices – Photocouplers

Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 5-5: Dispositifs optoélectroniques – Photocoupleurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XA
CODE PRIX
ICS 31.080.01; 31.260 ISBN 2-8318-8643-0

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– 2 – 60747-5-5 © IEC:2007
CONTENTS
FOREWORD.6

1 Scope.8
2 Normative references .8
3 Photocoupler .9
3.1 Semiconductor material.9
3.2 Details of outline and encapsulation .9
3.2.1 IEC and/or national reference number of the outline drawing .9
3.2.2 Method of encapsulation: glass/metal/plastic/other .9
3.2.3 Terminal identification and indication of any connection between a
terminal and the case .9
3.3 Type of photocouplers .9
3.3.1 DC input photocoupler .9
3.3.2 AC input photocoupler .9
3.3.3 Phototransistor photocoupler .9
3.3.4 Photodarlington photocoupler .9
3.3.5 Photothyristor photocoupler.9
3.3.6 Phototriac photocoupler.10
3.3.7 IC photocoupler .10
3.3.8 FET photocoupler .10
3.3.9 Photodiode photocoupler .10
3.3.10 IC input photocoupler .10
3.3.11 Solid state opto relay.10
4 Terms related to ratings and characteristics for photocouplers .10
4.1 Current transfer ratio .10
4.1.1 Static value of the (forward) current transfer ratio h .10
F(ctr)
4.1.2 Small-signal short-circuit (forward) current transfer ratio h .10
f(ctr)
4.2 Cut-off frequency f .10
co
4.3 Input-to-output capacitance C .10
IO
4.4 Isolation resistance R .10
IO
4.5 Isolation voltage .10
4.5.1 DC isolation voltage V .11
IO
4.5.2 Repetitive peak isolation voltage V .11
IORM
4.5.3 Surge isolation voltage V .11
IOSM
4.6 Terms related to photocouplers with phototriac output and/or solid state
opto-relay with triac output .11
4.6.1 Repetitive peak voltage .11
4.6.2 Repetitive peak off-state voltage V .11
DRM
4.6.3 Repetitive peak reverse voltage V .11
RRM
4.6.4 RMS on-state current I .11
T(RMS)
4.6.5 Peak off-state current I .11
DRM
4.6.6 Peak on-state voltage V .11
TM
4.6.7 DC off-state current I .11
BD
4.6.8 DC on-state voltage V .11
T
4.6.9 Holding current I .11
H
4.6.10 Critical rate of rise of off-state voltage dV/dt .11

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60747-5-5 © IEC:2007 – 3 –
4.6.11 Trigger input current I .12
FT
4.7 Common mode transient immunity CMTI .12
5 Terms for photocoupler providing protection against electrical shock.12
5.1 Safety ratings of a photocoupler for reinforced isolation .12
5.2 Electrical safety requirements of a photocoupler for reinforced isolation.12
5.2.1 Partial discharge p .12
d
5.2.2 Apparent charge q , q .12
pd
5.2.3 Threshold apparent charge q , q .12
pd(TH) TH
5.2.4 Test voltages for the partial-discharge test of a photocoupler .12
5.2.5 Test voltage V , V .12
pd(t) t
5.2.6 Partial discharge test voltage V .13
pd(t)
5.2.7 Initial test voltage V , V .13
pd(ini) ini
5.2.8 Apparent charge measuring voltage V , V .13
pd(m) m
5.2.9 Partial-discharge inception voltage V , V .13
pd(i) i
5.2.10 Partial-discharge extinction voltage V , V .13
pd(e) e
5.2.11 Time intervals of the test voltage .13
5.3 Isolation voltages and isolation test voltages for photocouplers providing
protection against electrical shock.16
5.3.1 Rated isolation voltage .16
5.4 Limiting values (absolute maximum system) over the operating temperature
range, unless otherwise stated .16
5.4.1 Minimum and maximum storage temperatures T .16
stg
5.4.2 Minimum and maximum ambient or reference-point operating
temperatures T or T .16
amb ref
5.4.3 Maximum soldering temperature T .16
sld
5.4.4 Maximum continuous (direct) reverse input voltage V .16
R
5.4.5 Maximum collector-emitter voltage, with the base open-circuited
V .16
CEO
5.4.6 Maximum collector-base voltage, where an external base connection is
present, with the emitter open-circuited V .16
CBO
5.4.7 Maximum emitter-base voltage, where an external base connection is
present, with the collector open-circuited V .16
EBO
5.4.8 Maximum emitter-collector voltage, where no external base connection
is present V .16
ECO
5.4.9 Maximum continuous (direct) or repetitive peak isolation voltage V
IO
or V .16
IORM
5.4.10 Where appropriate, maximum surge isolation voltage V .16
IOSM
5.4.11 Maximum continuous collector current I .17
C
5.4.12 Maximum continuous forward input current I at an ambient or
F
reference-point temperature of 25 °C and derating curve or derating
factor.17
5.4.13 Maximum peak forward input current I at an ambient or
FM
reference-point temperature of 25 °C and under specified pulse
conditions.17
5.4.14 Maximum power dissipation P of the output transistor at an ambient
trn
or reference-point temperature of 25 °C and a derating curve or
derating factor .17
5.4.15 Maximum total power dissipation of the package P at an ambient or
tot
reference-point temperature of 25 °C and derating curve or derating
factor.17

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– 4 – 60747-5-5 © IEC:2007
6 Electrical characteristics.17
6.1 Phototransistor output photocoupler .17
6.2 Phototriac output photocoupler or solid state opto-relay .19
7 Photocouplers providing protection against electrical shock.19
7.1 Type.19
7.2 Ratings (have to be mentioned in a special section in the manufacturer’s data
sheet).19
7.2.1 Safety ratings .19
7.2.2 Functional ratings.19
7.2.3 Rated isolation voltages .19
7.3 Electrical safety requirements .20
7.4 Electrical, environmental and/or endurance test information (supplementary
information) .20
8 Measuring methods for photocouplers .27
8.1 Current transfer ratio h .27
F(ctr)
8.2 Input-to-output capacitance C .28
IO
8.3 Isolation resistance between input and output R .29
IO
8.4 Isolation test.30
8.5 Partial discharges of photocouplers.31
8.6 Collector-emitter saturation voltage V of a photocoupler .34
CE(sat)
8.6.1 Collector-emitter saturation voltage (d.c. method).34
8.6.2 Collector-emitter saturation voltage (pulse method) .35
8.7 Switching times t t of a photocoupler .36
on, off
8.8 Peak off-state current I .37
DRM
8.9 Peak on-state voltage V .39
TM
8.10 DC off-state current I .41
BD
8.11 DC on-state voltage V .42
T
8.12 Holding current I .43
H
8.13 Critical rate of rise of off-state voltage dV/dt.43
8.14 Trigger input current I .46
FT
8.15 Measuring methods of common mode transient immunity (CMTI) for
photocoupler .47
9 Testing methods of electrical rating for phototriac coupler .49
9.1 Repetitive peak off-state voltage V .49
DRM
9.2 DC off-state voltage V .50
BD

Annex A (normative) Input/output safety test .51

Bibliography.52

Figure 1a – Time intervals for method a).14
Figure 1b – Time intervals for method b).15
Figure 1 – Time intervals of the test voltage.15
Figure 2 – Test voltage .17
Figure 3 – Measurement circuit.27
Figure 4 – Measurement circuit for input to output capacitance.29
Figure 5 – Measurement circuit for isolation resistance.29

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60747-5-5 © IEC:2007 – 5 –
Figure 6 – Test circuit for withstanding isolation voltage .30
Figure 7 – Partial discharge test circuit .31
Figure 8 – Complete test arrangement connections for calibration .32
Figure 9 – DC measurement circuit.34
Figure 10 – Pulse measurement circuit .35
Figure 11 – Switching time measurement circuit .36
Figure 12 – Switching times .37
Figure 13 – Measurement circuit for peak off-state current.38
Figure 14 – Waveforms of the peak off-state voltage and current.39
Figure 15 – Measurement circuit for peak on-state voltage .40
Figure 16 – Waveforms of the peak on-state voltage and current .41
Figure 17 – Measurement circuit for d.c. off-state current .41
Figure 18 – Measurement circuit for d.c. on-state voltage .42
Figure 19 – Measurement circuit for holding current.43
Figure 20 – Measurement circuit for critical rate of rise of off-state voltage .44
Figure 21 – Exponential waveform of the off-voltage (V ).45
D
Figure 22 –Linear pulse form of the off-voltage (V ) .45
D
Figure 23 – Measurement circuit for the trigger input current .46
Figure 24 – Output terminal voltage versus input forward current.46
Figure 25 – Common mode transient immunity (CMTI) measurement circuit for
photocoupler.47
Figure 26 – Typical waveforms of the common mode pulse (V ) and optocoupler
CM
output (V ).49
O
Figure A.1 – Circuit diagram .51

Table 1 – Datasheet characteristics .20
Table 2 – Tests and test sequence for photocoupler providing protection against
electrical shock.26
Table 3 – Test conditions.27

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– 6 – 60747-5-5 © IEC:2007
INTERNATIONAL ELECTROTECHNICAL COMMISSION
______________

SEMICONDUCTOR DEVICES –
DISCRETE DEVICES –

Part 5-5: Optoelectronic devices –
Photocouplers


FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60747-5-5 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
This standard replaces the clauses for photocouplers (or optocouplers) described in
IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments.
The contents for phototransistors and photothyristors in IEC 60747-5-1, IEC 60747-5-2 and
IEC 60747-5-3, including their amendments, will be considered obsolete as of the effective date
of publication of this standard.
NOTE Photocouplers that are certified to the previous version of the photocoupler standard, namely
IEC 60747-5-1/2/3, are to be considered in compliance with the requirements and provisions of IEC 60747-5-5.

---------------------- Page: 8 ----------------------
60747-5-5 © IEC:2007 – 7 –
The text of this standard is based on the following documents:
FDIS Report on voting
47E/332/FDIS 47E/340/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of the parts in the IEC 60747 series, under the general title Semiconductor devices –
Discrete devices, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until the
maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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– 8 – 60747-5-5 © IEC:2007
SEMICONDUCTOR DEVICES –
DISCRETE DEVICES –

Part 5-5: Optoelectronic devices –
Photocouplers



1 Scope
This part of IEC 60747 gives the terminology, essential ratings, characteristics, safety tests as
well as the measuring methods for photocouplers (or optocouplers).
NOTE The word “optocoupler” can also be used instead of “photocoupler”.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of the
referenced document (including any amendments) applies.
IEC 60065:2001, Audio, video and similar electronic apparatus – Safety requirements
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:2007, Environmental testing – Part 2: Tests – Tests A: Cold
IEC 60068-2-2:2007, Environmental testing – Part 2: Tests – Tests B: Dry heat
IEC 60068-2-78:2001, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady
state
1
IEC 60068-2-6:⎯, Environmental testing – Part 2: Tests – Test Fc: Vibrat
...

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