IEC PAS 61338-1-5:2010

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.

General Information

• Status: Replaced
• Publication Date: 18-May-2010
• ICS: 31.140 - Piezoelectric devices
• ICS: 35.160 - Microprocessor systems
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 10 - TC 49/WG 10
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 25-Jun-2015

Relations

• Replaced By: IEC 61338-1-5:2015 - Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC/PAS 61338-1-5
®
Edition 1.0 2010-05
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD

Waveguide type dielectric resonators –
Part 1-5: General information and test conditions – Measurement method
of conductivity at interface between conductor layer and dielectric substrate
at microwave frequency


IEC/PAS 61338-1-5:2010(E)

---------------------- Page: 1 ----------------------
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IEC/PAS 61338-1-5
®
Edition 1.0 2010-05
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD

Waveguide type dielectric resonators –
Part 1-5: General information and test conditions – Measurement method
of conductivity at interface between conductor layer and dielectric substrate
at microwave frequency


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 31.140 ISBN 978-2-88910-935-7
® Registered trademark of the International Electrotechnical Commission

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– 2 – PAS 61338-1-5 © IEC:2010(E)
CONTENTS

FOREWORD.4
INTRODUCTION.6
1 Scope.7
2 Normative references .8
3 Measurement and related parameters .8
4 Calculation equations for R and σ .9
i i
5 Preparation of specimen.13
6 Measurement equipment and apparatus .13
6.1 Measurement equipment .13
6.2 Measurement apparatus .13
7 Measurement procedure.14
7.1 Set up of measurement equipment and apparatus .14
7.2 Measurement of reference level .14
7.3 Measurement procedure of Q .14
u
7.4 Determination of σ and measurement uncertainty.16
i
8 Example of measurement result .16
Annex A (informative)  Derivation of equation (4) for R .18
i
Annex B (informative)  Calculation uncertainty of parameters in Figure 3.19
Bibliography.20

Figure 1 – Surface resistance R , surface conductivity σ , interface resistance R ,
s s i
and interface conductivity σ . .7
i
Figure 2 – The TE mode dielectric rod resonator to measure σ . .9
01δ i
Figure 3 – Parameters chart of , , and for reference sapphire rod.
f g P P
0 rod sub
Calculation conditions: ε ' = 9.4, d = 10.00 mm and h = 5.00 mm .11
rod
Figure 4 – Parameters chart of f , g , P and P for reference (Zr,Sn)TiO rod.
4
0 rod sub
Calculation conditions: = 39, d = 14.00 mm and h = 6.46 mm.12
ε '
rod
Figure 5 – Schematic diagram of measurement equipments.13
Figure 6 – Schematic diagram of measurement apparatus for σ .14
ri
Figure 7 – Frequency response for reference sapphire rod with two dielectric
substrates as shown in figure 2.15
Figure 8 – Resonance frequency f , insertion attenuation IA and half-power band
0 0
width f .16
BW

Table 1 – Specifications of reference rods. .10
Table 2 – ε ' and tanδ of reference rods measured by the method (IEC 61338-1-3).16
rod rod
Table 3 – ε ' and tanδ of a LTCC test substrate measured by the method
sub sub
(IEC 61338-1-4).17

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PAS 61338-1-5 © IEC:2010(E) – 3 –
Table 4 – Measurement results of σ and σ of a copper layer in LTCC substrate with
i ri
ε ' =4.76, d’=45 mm and t=0.415 mm.17
sub
Table B.1 – Parameters obtained by FEM and rigorous analysis (IEC61338-1-3) for the
TE mode resonator with ε ' =9.4, d=10.0 mm, and h=5.0 mm. .19
011 rod
Table B.2 – Calculated parameters f , g , P , P , R , σ and σ for the TE
0 rod sub i i ri 01δ
mode resonator with ε ' =9.4 and 9.3, with the test condition of ε ' =6.0,
rod sub
tanδ =0.001, t=0.5 mm, and Q =6000. .19
u
sub

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– 4 – PAS 61338-1-5 © IEC:2010(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions – Measurement method
of conductivity at interface between conductor layer and dielectric substrate
at microwave frequency

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
A PAS is a technical specification not fulfilling the requirements for a standard, but made
available to the public.
IEC/PAS 61338-1-5 has been processed by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document
Draft PAS Report on voting
49/873/PAS 49/902/RVD
Following publication of this PAS, which is a pre-standard publication, the technical committee
or subcommittee concerned may transform it into an International Standard.
This PAS shall remain valid for an initial maximum period of 3 years starting from the
publication date. The validity may be extended for a single period up to a maximum of 3 years,

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PAS 61338-1-5 © IEC:2010(E) – 5 –
at the end of which it shall be published as another type of normative document, or shall be
withdrawn.
A list of all parts of IEC 61338 series under the general title Waveguide type dielectric
resonators can be found on the IEC website.
IEC 61338 consists of the following parts, under the general title Waveguide type dielectric
resonators:
Part 1: Generic specification
Part 1-3: General information and test conditions - Measurement method of complex relative
permittivity for dielectric resonator materials at microwave frequency
Part 1-4: General information and test conditions - Measurement method of complex relative
permittivity for dielectric resonator materials at millimeter-wave frequency
Part 2: Guidelines for oscillator and filter applications
Part 4: Sectional specification
Part 4-1: Blank detail specification

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– 6 – PAS 61338-1-5 © IEC:2010(E)
INTRODUCTION
The International Electrotechnical Commission (IEC) draws attention to the fact that it is
claimed that compliance with this PAS may involve the use of a patent concerning:
“Measurement method of conductivity at interface of conductor layer”
“Measurement method of conductivity of conductor layer”
IEC takes no position concerning the evidence, validity and scope of this patent right.
The holder of this patent right has assured the IEC that he/she is willing to negotiate licences
under reasonable and non-discriminatory terms and conditions with applicants throughout the
world. In this respect, the statement of the holder of this patent right is registered with IEC.
Information may be obtained from:
KYOCERA Corporation
6 Takeda Tobadono-cho, Fushimiku, Kyoto 612-5801, Japan
Attention is drawn to the possibility that some of the elements of this PAS may be the subject
of patent rights other than those identified above. IEC shall not be held responsible for
identifying any or all such patent rights.
ISO (www.iso.org/patents) and IEC (http://www.iec.ch/tctools/patent_decl.htm) maintain on-
line data bases of patents relevant to their standards. Users are encouraged to consult the
data bases for the most up to date information concerning patents.

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PAS 61338-1-5 © IEC:2010(E) – 7 –
WAVEGUIDE TYPE DIELECTRIC RESONATORS –

Part 1-5: General information and test conditions – Measurement method
of conductivity at interface between conductor layer and dielectric substrate
at microwave frequency


1 Scope
Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In
the microwave circuits, the attenuation of planar transmission lines such as striplines,
microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and
radiation loss. Among them, the conductor loss is a major factor in the attenuation of the
planar transmission lines. A new measurement method is needed to evaluate the conductivity
of transmission line on or in the substrates such as the organic, ceramic and LTCC (low
temperature co-fired ceramics) substrates.
The IEC 61338-1-3 described the measurement method for the surface resistance R and
s
effective conductivity σ on the surface of the conductor. The term σ is designated as σ in this
s
PAS, and is called surface conductivity (Figure 1). This PAS describes a measurement
method for resistance and effective conductivity at the interface between conductor layer and
dielectric substrate designated as R and σ respectively, and are called interface resistance and
i i
interface conductivity.

R and σ (surface)
s s
Conductor layer
Dielectric substrate
R and σ (interface)
i i
with ε′ and tan δ
sub sub

Figure 1 – Surface resistance R , surface conductivity σ ,
s s
interface resistance R , and interface conductivity σ .
i i
For the transmission line in the substrates, the electric current is concentrated at the interface
between conductor layer and dielectric substrate, because the skin depth δ in the conductor
is the order of μm in thickness at the microwave frequencies. In microstrip lines, the current
is concentrated at the interface, rather than at the open face of the conductor. Furthermore, in
copper-clad organic substrates, the interface side of the copper foil has rugged structure to
hold the strong adhesive strength. In LTCC substrates, the interface between the conductor
and ceramics has a rough structure, depending on the co-firing process and the material
compositions. The interface conditions increase the conductor loss. Therefore, the evaluation
of R and σ is important to design microwave circuit and to improve the conductor
i i
fabrication process.
This measurement method has the following characteristics:
– the interface resistance R is obtained by measuring the resonant frequency f and
i 0
unloaded quality factor Q of a TE mode dielectric rod resonator shown in Figure 2;
u 01δ

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– 8 – PAS 61338-1-5 © IEC:2010(E)
– the interface conductivity σ and the relative interface conductivity σ = σ σ are calculated
i ri i 0
7
from the measured R value, where σ = 5,8 ×10 S/m is the conductivity of standard copper;
i 0
– the measurement uncertainty of σ ( Δσ ) is less than 5%.
ri ri
2 Normative references
The following referenced documents are indispensable for the application of this PAS. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 61338-1-3: Waveguide type dielectric resonators - Part 1-3: General information and test
conditions – Measurement method of complex relative permittivity for dielectric resonator
materials at microwave frequ
...