IEC 60747-15:2010

Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices

IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below.
a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses.
b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion.
c) Clause 8 was amended by suitable addition and deletion.
d) Annex C, D and Bibliography were deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.

Dispositifs à semiconducteurs - Dispositifs discrets - Partie 15: Dispositifs de puissance à semiconducteurs isolés

La CEI 60747-15:2010 donne les exigences relatives aux dispositifs de puissance à semi-conducteurs isolés avec circuits de commande intégrés. Ces exigences s'ajoutent à celles données dans d'autres parties de la CEI 60747 pour les dispositifs de puissance non-isolés correspondants. Les modifications principales par rapport à l'édition précédente sont les suivantes:
a) Les Articles 3, 4 et 5 ont été réédités et certains ont été associés à d'autres paragraphes.
b) Les Articles 6 et 7 ont été réédités et font partie des "Méthodes de mesure" avec les ajouts et suppressions correspondants.
c) L'Article 8 a été modifié par les ajouts et suppressions appropriés correspondants.
d) Les Annexes C, D et la Bibliographie ont été supprimées.
Cette publication doit être lue conjointement avec la CEI 60747-1:2006.

General Information

• Status: Published
• Publication Date: 15-Dec-2010
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: SC 47E - Discrete semiconductor devices
• Drafting Committee: WG 3 - TC 47/SC 47E/WG 3
• Current Stage: PPUB - Publication issued
• Start Date: 15-Jan-2011
• Completion Date: 16-Dec-2010

Relations

• Revises: IEC 60747-15:2003 - Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60747-15 ®
Edition 2.0 2010-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Discrete devices –
Part 15: Isolated power semiconductor devices

Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 15: Dispositifs de puissance à semiconducteurs isolés

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office
3, rue de Varembé
CH-1211 Geneva 20
Switzerland
Email: [e-mail]
Web: www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.
§ Catalogue of IEC publications: www.iec.ch/searchpub
The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,…).
It also gives information on projects, withdrawn and replaced publications.
§ IEC Just Published: www.iec.ch/online_news/justpub
Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available
on-line and also by email.
§ Electropedia: www.electropedia.org
The world's leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions
in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical
Vocabulary online.
§ Customer Service Centre: www.iec.ch/webstore/custserv
If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service
Centre FAQ or contact us:
Email: [e-mail]
Tel.: [phone]
Fax: [phone]
A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.
§ Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm
Le Catalogue en-ligne de la CEI vous permet d’effectuer des recherches en utilisant différents critères (numéro de référence,
texte, comité d’études,…). Il donne aussi des informations sur les projets et les publications retirées ou remplacées.
§ Just Published CEI: www.iec.ch/online_news/justpub
Restez informé sur les nouvelles publications de la CEI. Just Published détaille deux fois par mois les nouvelles
publications parues. Disponible en-ligne et aussi par email.
§ Electropedia: www.electropedia.org
Le premier dictionnaire en ligne au monde de termes électroniques et électriques. Il contient plus de 20 000 termes et
définitions en anglais et en français, ainsi que les termes équivalents dans les langues additionnelles. Egalement appelé
Vocabulaire Electrotechnique International en ligne.
§ Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm
Si vous désirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du
Service clients ou contactez-nous:
Email: [e-mail]
Tél.: [phone]
Fax: [phone]
IEC 60747-15 ®
Edition 2.0 2010-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Discrete devices –
Part 15: Isolated power semiconductor devices

Dispositifs à semiconducteurs – Dispositifs discrets –
Partie 15: Dispositifs de puissance à semiconducteurs isolés

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
T
CODE PRIX
ICS 31.080.99 ISBN 978-2-88912-310-0
– 2 – 60747-15 Ó IEC:2010
CONTENTS
FOREW ORD . 4
1 Sc o pe . 6
2 Normative references . 6
3 Terms and definitions . 7
4 Letter symbols . 8
4.1 Ge n eral . 8
4.2 Additional subscripts/symbols . 8
4.3 List letter symbols . 8
4.3.1 Voltages and currents . 8
4.3.2 Mechanical symbols . 8
4.3.3 Other symbols . 9
5 Essential ratings (limiting values) and characteristics . 9
5.1 Ge n eral . 9
5.2 Ratings (limiting values). 9
5.2.1 Isolation voltage (V ) . 9
isol
5.2.2 Peak case non-rupture current (I or I ) (where appropriate). 9
RSMC CNR
5.2.3 Terminal current (I ) (where appropriate), . 9
tRMS
5.2.4 Total power dissipation (P ) . 9
tot
5.2.5 Temperatures . 9
5.2.6 Mechanical ratings . 10
5.2.7 Climatic ratings (where appropriate) . 10
5.3 Characteristics . 10
5.3.1 Mechanical characteristics . 10
5.3.2 Parasitic inductance (L ) . 11
p
5.3.3 Parasitic capacitances (C ) . 11
p
5.3.4 Partial discharge inception voltage (V or V ) (where
iM i(RMS)
appropriate) . 11
5.3.5 Partial discharge extinction voltage (V or V ) (where
eM e(RMS)
appropriate) . 11
5.3.6 Thermal resistances . 11
5.3.7 Transient thermal impedance (Z ) . 12
th
6 Measurement methods . 12
6.1 Verification of isolation voltage rating between terminals and base plate
(V ) . 12
isol
6.2 Methods of measurement . 13
6.2.1 Partial discharge inception and extinction voltages (V ) (V ) . 13
i e
6.2.2 Parasitic inductance (L ) . 13
p
6.2.3 Parasitic capacitance terminal to case (C ) . 15
p
6.2.4 Thermal characteristics . 16
7 Acceptance and reliability . 18
7.1 General requirements . 18
7.2 List of endurance tests . 19
7.3 Acceptance defining criteria . 19
7.4 Type tests and routine tests . 19
7.4.1 Type tests . 19
7.4.2 Routine tests . 20
Annex A (informative) Test method of peak case non-rupture current . 21

60747-15 Ó IEC:2010 – 3 –
Annex B (informative) Measuring method of the thickness of thermal compound paste . 24
Bibliography . 25

Figure 1 – Basic circuit diagram for isolation breakdown withstand voltage test (“high
pot test”) with V . 12
isol
Figure 2 – Circuit diagram for measurement of parasitic inductances (L ) . 14
p
Figure 3 – Wave forms . 15
Figure 4 – Circuit diagram for measurement of parasitic capacitance C . 16
p
Figure 5 – Cross-section of an isolated power device with reference points for
temperature measurement of T and T . 17
c s
Figure A.1 – Circuit diagram for test of peak case non-rupture current I . 21
CNR
Figure B.1 – Example of a measuring gauge for a layer of thermal compound paste of
a thickness between 5 mm and 150 mm . 24

Table 1 – Endurance tests . 19
Table 2 – Acceptance defining characteristics for endurance and reliability tests . 19
Table 3 – Minimum type and routine tests for isolated power semiconductor devices . 20

– 4 – 60747-15 Ó IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
DISCRETE DEVICES –
Part 15: Isolated power semiconductor devices

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should
...