IEC 62024-1:2024
(Main)High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor
IEC 62024-1:2024 specifies the electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in the high frequency (over 100 kHz) range.
This edition includes the following significant technical changes with respect to the previous edition:
a) addition of S parameter measurement;
b) addition of the inductance, Q-factor and impedance of an inductor which are measured by the reflection coefficient method with a network analyzer;
c) addition of the resonance frequency of an inductor which is measured by a two-port network analyzer;
d) addition of the mounting method for a surface mounting inductor with Pb-free solder.
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de mesure - Partie 1: Bobine d'inductance pastille de l'ordre du nanohenry
L'IEC 62024-1:2024 spécifie les caractéristiques électriques et les méthodes de mesure pour l'inductance pastille de l'ordre du nanohenry qui est normalement utilisée dans la plage des hautes fréquences (supérieures à 100 kHz).
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) ajout du mesurage des paramètres S;
b) ajout des mesurages de l'inductance, du facteur Q et de l'impédance d'une bobine d'inductance par la méthode du facteur de réflexion au moyen d'un analyseur de réseau;
c) ajout du mesurage de la fréquence de résonance d'une bobine d'inductance par un analyseur de réseau à deux accès;
d) ajout de la méthode de montage d'une bobine d'inductance à montage en surface par brasage sans plomb.
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IEC 62024-1 ®
Edition 4.0 2024-07
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
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IEC 62024-1 ®
Edition 4.0 2024-07
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
High frequency inductive components – Electrical characteristics and
measuring methods –
Part 1: Nanohenry range chip inductor
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 29.100.10 ISBN 978-2-8322-9414-7
– 2 – IEC 62024-1:2024 RLV © IEC 2024
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Inductance, Q-factor and impedance. 6
4.1 Inductance . 6
4.1.1 Measuring method . 6
4.1.2 Measuring circuit . 7
4.1.3 Mounting the inductor for the test . 9
4.1.4 Measuring method and calculation formula . 12
4.1.5 Notes on measurement . 13
4.2 Quality factor . 15
4.2.1 Measuring method . 15
4.2.2 Measuring circuit . 15
4.2.3 Mounting the inductor for test . 15
4.2.4 Measuring method and calculation formula . 15
4.2.5 Notes on measurement . 16
4.3 Impedance . 16
4.3.1 Measuring method . 16
4.3.2 Measuring circuit . 16
4.3.3 Mounting the inductor for test . 16
4.3.4 Measuring method and calculation . 16
4.3.5 Notes on measurement . 17
5 Resonance frequency . 17
5.1 Self-resonance frequency . 17
5.2 Minimum output method . 17
5.2.1 General . 17
5.2.2 Measuring circuit . 17
5.2.3 Mounting the inductor for test . 18
5.2.4 Measuring method and calculation formula . 19
5.2.5 Note on measurement . 20
5.3 Reflection method .
5.3 Measurement by analyzer . 23
5.3.1 Measurement by impedance analyzer and one-port network analyzer . 23
5.3.2 Measurement by two-port network analyzer . 23
6 DC resistance . 23
6.1 Voltage-drop method. 23
6.1.1 Measuring circuit . 23
6.1.2 Measuring method and calculation formula . 24
6.2 Bridge method . 25
6.2.1 Measuring circuit . 25
6.2.2 Measuring method and calculation formula . 25
6.3 Notes on measurement . 25
6.4 Measuring temperature . 26
7 S-parameter . 26
7.1 Measurement setup and procedure . 26
7.1.1 General . 26
7.1.2 Two-port S-parameter . 27
7.1.3 Test fixture . 27
7.2 Calibrations and verification of test setup . 28
7.2.1 General . 28
7.2.2 Calibration . 29
7.2.3 De-embedding . 32
7.3 Indirect method of impedance . 32
7.4 Evaluation from the two-port S-parameter . 32
Annex A (normative) Mounting method for a surface mounting inductor . 35
A.1 Overview. 35
A.2 Mounting printed-circuit board and mounting land . 35
A.3 Solder . 35
A.4 Test condition . 35
A.5 Cleaning . 35
Annex B (normative) Elimination of residual parameter effects in test fixture . 37
B.1 Overview. 37
B.2 Test fixture represented by the ABCD matrix of a two-terminal pair network . 37
Bibliography . 39
Figure 1 – Example of circuit for vector voltage/current method . 8
Figure 2 – Example of circuit for reflection coefficient method . 9
Figure 3 – Fixture A . 9
Figure 4 – Fixture B . 11
Figure 5 – Fixture C . 12
Figure 6 – Short device shape . 14
Figure 7 – Example of test circuit for the minimum output method . 18
Figure 8 – Self-resonance frequency test board (minimum output method) . 19
Figure 9 – Suitable test fixture for measuring self-resonance frequency .
Figure 9 – Example of test circuit for voltage-drop method . 24
Figure 10 – Example of test circuit for bridge method . 25
Figure 11 – Schematic diagram of the two-port S-parameter measurement setup and
the network analyzer . 27
Figure 12 – S-parameter test fixture for two-terminal devices . 27
Figure 13 – Test fixture for a two-terminal device (shunt connection) . 28
Figure 14 – Test fixture for a two-terminal device (series connection) . 28
Figure 15 – Examples of the standards for TRL calibration . 30
Figure 16 – Examples of the standards for TRL calibration with microprobes . 31
Figure 17 – Examples of full two-port de-embedding with microprobes . 32
Figure 18 – Two-port measurement of a two-terminal device in shunt connection . 33
Figure 19 – Two-port measurement of a two-terminal device in series connection . 33
Figure B.1 – Test fixture represented by the ABCD matrix . 37
Table 1 – Dimensions of l and d . 10
Table 2 – Short device dimensions and inductances . 15
– 4 – IEC 62024-1:2024 RLV © IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –
Part 1: Nanohenry range chip inductor
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, gov
...
IEC 62024-1 ®
Edition 4.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor
Composants inductifs à haute fréquence – Caractéristiques électriques et
méthodes de mesure –
Partie 1: Bobine d'inductance pastille de l'ordre du nanohenry
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
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your local IEC member National Committee for further information.
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les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.
IEC Secretariat Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews, graphical symbols and the glossary.
committee, …). It also gives information on projects, replaced With a subscription you will always have access to up to date
and withdrawn publications. content tailored to your needs.
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Stay up to date on all new IEC publications. Just Published
The world's leading online dictionary on electrotechnology,
details all new publications released. Available online and once
containing more than 22 500 terminological entries in English
a month by email.
and French, with equivalent terms in 25 additional languages.
Also known as the International Electrotechnical Vocabulary
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(IEV) online.
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IEC 62024-1 ®
Edition 4.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor
Composants inductifs à haute fréquence – Caractéristiques électriques et
méthodes de mesure –
Partie 1: Bobine d'inductance pastille de l'ordre du nanohenry
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.100.10 ISBN 978-2-8322-9301-0
– 2 – IEC 62024-1:2024 © IEC 2024
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Inductance, Q-factor and impedance. 6
4.1 Inductance . 6
4.1.1 Measuring method . 6
4.1.2 Measuring circuit . 7
4.1.3 Mounting the inductor for the test . 8
4.1.4 Measuring method and calculation formula . 10
4.1.5 Notes on measurement . 11
4.2 Quality factor . 12
4.2.1 Measuring method . 12
4.2.2 Measuring circuit . 12
4.2.3 Mounting the inductor for test . 12
4.2.4 Measuring method and calculation formula . 12
4.2.5 Notes on measurement . 13
4.3 Impedance . 13
4.3.1 Measuring method . 13
4.3.2 Measuring circuit . 13
4.3.3 Mounting the inductor for test . 13
4.3.4 Measuring method and calculation . 13
4.3.5 Notes on measurement . 13
5 Resonance frequency . 13
5.1 Self-resonance frequency . 13
5.2 Minimum output method . 13
5.2.1 General . 13
5.2.2 Measuring circuit . 13
5.2.3 Mounting the inductor for test . 14
5.2.4 Measuring method and calculation formula . 15
5.2.5 Note on measurement . 15
5.3 Measurement by analyzer . 15
5.3.1 Measurement by impedance analyzer and one-port network analyzer . 15
5.3.2 Measurement by two-port network analyzer . 16
6 DC resistance . 16
6.1 Voltage-drop method. 16
6.1.1 Measuring circuit . 16
6.1.2 Measuring method and calculation formula . 16
6.2 Bridge method . 17
6.2.1 Measuring circuit . 17
6.2.2 Measuring method and calculation formula . 17
6.3 Notes on measurement . 18
6.4 Measuring temperature . 18
7 S-parameter . 18
7.1 Measurement setup and procedure . 18
7.1.1 General . 18
7.1.2 Two-port S-parameter . 19
7.1.3 Test fixture . 19
7.2 Calibrations and verification of test setup . 20
7.2.1 General . 20
7.2.2 Calibration . 21
7.2.3 De-embedding . 24
7.3 Indirect method of impedance . 24
7.4 Evaluation from the two-port S-parameter . 24
Annex A (normative) Mounting method for a surface mounting inductor . 27
A.1 Overview. 27
A.2 Mounting printed-circuit board and mounting land . 27
A.3 Solder . 27
A.4 Test condition . 27
A.5 Cleaning . 28
Annex B (normative) Elimination of residual parameter effects in test fixture . 29
B.1 Overview. 29
B.2 Test fixture represented by the ABCD matrix of a two-terminal pair network . 29
Bibliography . 31
Figure 1 – Example of circuit for vector voltage/current method . 7
Figure 2 – Example of circuit for reflection coefficient method . 8
Figure 3 – Fixture A . 8
Figure 4 – Fixture B . 9
Figure 5 – Fixture C . 10
Figure 6 – Short device shape . 11
Figure 7 – Example of test circuit for the minimum output method . 14
Figure 8 – Self-resonance frequency test board (minimum output method) .
...
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