IEC 61000-4-25:2001+AMD1:2012 CSV

Electromagnetic compatibility (EMC) - Part 4-25: Testing and measurement techniques - HEMP immunity test methods for equipment and systems

IEC 61000-4-25:2001+A1:2012 describe immunity test levels and related test methods for electrical and electronic equipment and systems exposed to high-altitude electromagnetic pulse (HEMP) environments. Specifications for test equipment and instrumentation test set-up, test procedures, pass/fail criteria, and test documentation requirements are also defined by this standard. These tests are intended to demonstrate the immunity of electrical and electronic equipment when subjected to HEMP radiated and conducted electromagnetic disturbances. The objective of this part of IEC 61000 is to establish a common and reproducible basis for evaluating the performance of electrical and electronic equipment, when subjected to HEMP radiated environments and the associated conducted transients on power, antenna, and input/output (I/O) signal and control lines. The amendment 1 introduces the damped sinusoidal wave standard recently published IEC 61000-4-18. This consolidated version consists of the first edition (2001) and its amendment 1 (2012). Therefore, no need to order amendment in addition to this publication.

Compatibilité électromagnétique (CEM) - Partie 4-25: Techniques d'essai et de mesure - Méthodes d'essai d'immunité à l'IEMN-HA des appareils et des systèmes

La CEI 61000-4-25:2001+A1:2012 décrit les niveaux d'essai pour l'immunité et les méthodes d'essai correspondantes applicables aux appareils et aux systèmes électriques et électroniques exposés à l'environnement des impulsions électromagnétiques nucléaires à haute altitude (IEMN-HA). Cette norme définit également les spécifications pour les matériels et la configuration d'essai, les procédures d'essai, les critères d'acceptation ou de rejet et les prescriptions pour la documentation d'essai. Ces essais sont destinés à démontrer l'immunité des appareils électriques et électroniques aux perturbations électromagnétiques IEMN-HA rayonnées et conduites. L'objectif de cette partie de la CEI 61000 est d'établir une base commune et reproductible pour l'évaluation des performances des appareils électriques et électroniques, lorsqu'ils sont soumis à l'environnement d'IEMN-HA rayonnées ainsi que de transitoires conduits associés sur les réseaux d'alimentation électrique, les antennes, les signaux d'entrée/sortie (E/S) et les lignes de contrôle. L'Amendement 1 introduit la norme sur les ondes oscillatoires amorties récemment publiée CEI 61000-4-18.  Cette version consolidée comprend la première édition (2001) et son amendement 1 (2012). Il n'est donc pas nécessaire de commander l'amendement avec cette publication.

General Information

• Status: Published
• Publication Date: 14-May-2012
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.99 - Other aspects related to EMC
• Technical Committee: SC 77C - High power transient phenomena
• Current Stage: PPUB - Publication issued
• Start Date: 15-May-2012
• Completion Date: 15-May-2012

Standards Content (Sample)

IEC 61000-4-25
®

Edition 1.1 2012-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Electromagnetic compatibility (EMC)
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems

Compatibilité électromagnétique (CEM)
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes

IEC 61000-4-25:2001+A1:2012

---------------------- Page: 1 ----------------------
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IEC 61000-4-25

®


Edition 1.1 2012-05




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Electromagnetic compatibility (EMC)

Part 4-25: Testing and measurement techniques – HEMP immunity test methods

for equipment and systems




Compatibilité électromagnétique (CEM)

Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à


l’IEMN-HA des appareils et des systèmes













INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE

PRICE CODE
INTERNATIONALE

CODE PRIX CN


ICS 33.100.99 ISBN 978-2-88912-055-0



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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– 2 – 61000-4-25  IEC:2001+A1:2012
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references. 7
3 Definitions . 8
4 General . 11
5 Immunity tests and immunity test levels . 12
5.1 Introduction . 12
5.2 Immunity tests . 12
5.3 Immunity test levels . 12
5.4 Radiated disturbance tests . 12
5.4.1 Radiated immunity test levels . 12
5.4.2 Radiated immunity test specifications . 13
5.4.3 Small radiated test facilities . 14
5.4.4 Large HEMP simulators . 14
5.4.5 Frequency domain spectrum requirements . 16
5.5 Conducted disturbance tests . 16
5.5.1 Conducted immunity test levels . 16
5.5.2 Conducted immunity test specifications . 19
6 Test equipment . 20
6.1 Radiated field tests . 20
6.1.1 Radiated field generator . 20
6.1.2 Instrumentation . 20
6.2 Conducted disturbance tests . 21
6.2.1 Test generator . 21
6.2.2 Instrumentation . 23
7 Test set-up . 23
7.1 Radiated disturbance test . 23
7.2 Conducted disturbance test . 23
8 Test procedure . 24
8.1 Climatic conditions. 24
8.2 Immunity test level and test exposures . 25
8.3 Radiated disturbance test procedure . 25
8.3.1 Test parameter measurements . 25
8.3.2 Radiated test procedure . 25
8.4 Conducted disturbance immunity test procedure . 27
8.5 Test execution . 27
8.5.1 Execution of the radiated immunity test . 27
8.5.2 Execution of the conducted immunity test . 28
9 Test results and test reports . 28

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61000-4-25  IEC:2001+A1:2012 – 3 –
Annex A (informative) Rationale for the immunity test levels . 29
Annex B (informative) Conducted immunity tests for antennas . 38
Annex C (informative) Conducted disturbance immunity tests . 40
Annex D (normative informative) Damped oscillatory wave test . 44

Figure 1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz. 14
Figure C.1 – Block diagram for EC10 and EC11 immunity tests . 41
Figure C.2 – Example of a simplified circuit diagram of a fast transient/burst generator . 41
Figure C.3 – Waveshape of an EC10 pulse into a 50 Ω load . 42
Figure C.4 – Example of an EC11 generator (see clause C.1 for details) . 42
Figure C.5 – Waveshape of an EC11 pulse into a 50 Ω load . 43
Figure C.6 – Simplified block diagram for LC immunity test levels . 43
Figure C.7 – Waveshape of the LC slow pulse . 43


Table 1 – Radiated immunity test levels defined in the present standard . 13
Table 2 – Early time conducted immunity test levels . 17
Table 3 – Intermediate time HEMP conducted immunity test levels . 18
Table 4 – Conducted environment immunity test levels for late-time HEMP . 19
Table 5 – Late time HEMP conducted environment effects tests for low-voltage a.c.
power ports . 19
Table 6 – Conducted HEMP immunity test specifications . 20
Table A.1 – Radiated immunity test levels . 30
Table A.2 – Conducted common-mode early time HEMP environments . 31
Table A.3 – Early time HEMP conducted environments on LV circuits
(low-voltage circuits up to 1 000 V) . 32
Table A.4 – Conducted environments for early time HEMP . 33
Table A.5 – Early time HEMP conducted environments immunity test levels for LV
circuits (low-voltage circuits up to 1000 V) . 34
Table A.6 – Example early time HEMP immunity test levels for various applications. . 35
Table D.1 – ISO 7137 test procedure reference number 3.8 . 44
Table D.2 – VG current injection test . 45
Table D3 – MIL-STD-461-E . 45

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– 4 – 61000-4-25  IEC:2001+A1:2012
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-25: Testing and measurement techniques –
HEMP immunity test methods for equipment and systems



FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

This consolidated version of IEC 61000-4-25 consists of the first edition (2001)
[documents 77C/113/FDIS and 77C/117/RVD] and its amendment 1 (2012) [documents
77C/216/FDIS and 77C/218/RVD]. It bears the edition number 1.1.
The technical content is therefore identical to the base edition and its amendment and
has been prepared for user convenience. A vertical line in the margin shows where the
base publication has been modified by amendment 1. Additions and deletions are
displayed in red, with deletions being struck through.

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61000-4-25  IEC:2001+A1:2012 – 5 –
International Standard IEC 61000-4-25 has been prepared by subcommittee 77C: High power
transient phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms part 4-25 of IEC 61000. It has the status of a basic EMC publication in accordance with
IEC Guide 107.
Annex D forms an integral part of this standard.
Annexes A, B C and D are for information only.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The “colour inside” logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this publication using a colour printer.

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– 6 – 61000-4-25  IEC:2001+A1:2012
INTRODUCTION
This standard is part of the IEC 61000 series, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of product committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and completed
by a second number identifying the subdivision (example: 61000-6-1).

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61000-4-25  IEC:2001+A1:2012 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-25: Testing and measurement techniques –
HEMP immunity test methods for equipment and systems



1 Scope
This part of IEC 61000 describes the immunity test levels and related test methods for
electrical and electronic equipment and systems exposed to high-altitude electromagnetic
pulse (HEMP) environments. It defines ranges of immunity test levels and establishes test
procedures. Specifications for test equipment and instrumentation test set-up, test procedures,
pass/fail criteria, and test documentation requirements are also defined by this standard.
These tests are intended to demonstrate the immunity of electrical and electronic equipment
when subjected to HEMP radiated and conducted electromagnetic disturbances. For radiated
disturbance immunity tests, specifications are defined in this standard both for small test
facilities and large HEMP simulators.
This part of IEC 61000 defines specifications for laboratory immunity tests. On-site tests
performed on equipment in the final installation to verify immunity are also specified. These
verification tests use the same specifications as laboratory tests, except for the climatic
environmental specifications.
The objective of this part of IEC 61000 is to establish a common and reproducible basis for
evaluating the performance of electrical and electronic equipment, when subjected to HEMP
radiated environments and the associated conducted transients on power, antenna, and
input/output (I/O) signal and control lines.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 60050(161), International Electrotechnical Vocabulary – Chapter 161: Electromagnetic
compatibility
IEC 60038, IEC standard voltages
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 61000-2-5, Electromagnetic compatibility (EMC) – Part 2: Environment – Section 5:
Classification of electromagnetic environments. Basic EMC publication
IEC 61000-2-9, Electromagnetic compatibility (EMC) – Part 2: Environment – Section 9:
Description of HEMP environment – Radiated disturbance. Basic EMC publication
IEC 61000-2-10:1998, Electromagnetic compatibility (EMC) – Part 2-10: Environment –
Description of HEMP environment – Conducted disturbance
IEC 61000-2-11, Electromagnetic compatibility (EMC) – Part 2: Environment – Section 11:
Classification of HEMP environments. Basic EMC publication

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– 8 – 61000-4-25  IEC:2001+A1:2012
IEC 61000-4-4, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication
IEC 61000-4-5, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 5: Surge immunity test
IEC 61000-4-11, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 11: Voltage dips, short interruptions and voltage variations immunity tests
IEC 61000-4-12, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 12: Oscillatory waves immunity test
IEC 61000-4-13, Electromagnetic compatibility (EMC) – Part 4-13: Testing and measurement
techniques – Harmonics and interharmonics including mains signalling at a.c. power port, low
1
frequency immunity tests – Basic EMC Publication
IEC 61000-4-18, Electromagnetic compatibility (EMC) – Part 4-18: Testing and measurement
techniques – Damped oscillatory wave immunity test
IEC 61000-4-20, Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement
1
techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
IEC 61000-4-33, Electromagnetic compatibility (EMC) – Part 4-33: Testing and measurement
techniques – Measurement methods for high-power transient parameters
IEC 61000-5-3, Electromagnetic compatibility (EMC) – Part 5-3: Installation and mitigation
guidelines – HEMP protection concepts
IEC 61000-5-4/TR, Electromagnetic compatibility (EMC) – Part 5: Installation and mitigation
guidelines – Section 4: Immunity to HEMP – Specifications for protective devices against
HEMP radiated disturbance. Basic EMC Publication
IEC 61024-1, Protection of structures against lightning – Part 1: General principles
ISO 7137, Aircraft – Environmental conditions and test procedures for airborne equipment
3 Definitions
For the purpose of this part of IEC 61000, the following definitions apply.
3.1
compatibility level
specified electromagnetic disturbance level used as a reference level for co-ordination in the
setting of emission and immunity limits
[IEV 161-03-10]
3.2
coupling (HEMP)
interaction of electromagnetic fields with a system to produce currents and voltages on system
surfaces and cables
3.3
coupling clamp
device of defined dimensions and characteristics for common mode coupling of the disturbance
signal to the circuit under test without any galvanic connection to it
___________
1
To be published

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61000-4-25  IEC:2001+A1:2012 – 9 –
3.4
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.5
decoupling network
electrical circuit for the purpose of preventing over-voltages applied to the EUT from affecting
other devices, equipment or systems, which are not under test
3.6
degradation (of performance)
undesired departure in the operational performance of any device, equipment or system from
its intended performance
NOTE The term “degradation” can apply to a temporary or permanent failure.
[IEV 161-01-19]
3.7
electromagnetic disturbance
any electromagnetic phenomenon which may degrade the performance of a device, equipment
or system
[IEV 161-01-05, modified]
3.8
electromagnetic interference
degradation of the performance of a device, transmission channel or system caused by an
electromagnetic disturbance
[IEV 161-01-06]
3.9
electromagnetic susceptibility
inability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
NOTE Susceptibility is a lack of immunity.
[IEV 161-01-21]
3.10
EUT (equipment under test)
the equipment under test can be a single unit or multiple units interconnected by cables, data
links, etc.
NOTE Multiple units interconnected by cables, etc. are also called a system [see 3.27 below].
3.11
fast Fourier transform
FFT
mathematical procedure for rapidly computing the direct or inverse Fourier transform of a time
m
domain signal or of a frequency domain spectrum, respectively. It requires 2 (m = integer)
data points that are equally spaced in time or frequency, and involves much less computation
time than a standard discrete Fourier transform (DFT)
3.12
ground reference plane
flat conductive surface, whose potential is used as a common reference
[IEV 161-04-36]

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– 10 – 61000-4-25  IEC:2001+A1:2012
3.13
HV transmission line
power line with a nominal a.c. system voltage equal to or greater than 100 kV
3.14
short circuit current
I
sc
current resulting from an abnormal connection of relatively low resistance between two points
of different potentials in a circuit
3.15
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.16
immunity level
maximum level of a given electromagnetic disturbance incident on a particular device,
equipment or system for which it remains capable of operating at a required degree of
performance
[IEV 161-03-14]
3.17
immunity test level
value of an influencing electromagnetic quantity specified for an immunity test
NOTE It is to be noted that the text of this definition is the same as for severity level. A test standard can specify
several severity levels according to different immunity levels.
3.18
large HEMP simulator
transient electromagnetic pulse test facility with a test volume sufficiently large to test objects
with cubical dimensions equal to or greater than 1 m × 1 m × 1 m
3.19
LV (low-voltage) power circuit
power circuit with a nominal a.c. voltage between 120 V and 1 000 V
NOTE The standard voltages in this voltage range are presented in IEC 60038.
3.20
MV (medium voltage) distribution power line
power line with a nominal a.c. voltage above 1 kV and not exceeding 35 kV used to distribute
power within a local area
NOTE The standard voltages in this voltage range are presented in IEC 60038.
3.21
point-of-entry
port-of-entry
PoE
the physical location (point/port) on the electromagnetic barrier, where EM energy may enter or
exit a topological volume, unless an adequate PoE protective device is provided. A PoE is not
limited to a geometrical point. PoEs are classified as aperture PoEs or conductor PoEs,
according to the type of penetration. They are also classified as architectural, mechanical,
structural or electrical PoEs, according to the architectural
...