IEC 62014-5:2015
(Main)Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs
Quality of Electronic and Software Intellectual Property Used in System and System on Chip (SoC) Designs
IEC 62014-5:2015(E) defines a standard XML format for representing electronic design intellectual property (IP) quality information, based on an information model for IP quality measurement. It includes a schema and the terms that are relevant for measuring IP quality, including the software that executes on the system. The schema and information model can be focused to represent particular categories of interest to IP users.
General Information
Standards Content (Sample)
IEC 62014-5 ®
Edition 1.0 2015-03
™
IEEE Std 1734 -2011
INTERNATIONAL
STANDARD
Quality of Electronic and Software Intellectual Property Used in System and
System on Chip (SoC) Designs
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IEC 62014-5 ®
Edition 1.0 2015-03
IEEE Std 1734™-2011
INTERNATIONAL
STANDARD
Quality of Electronic and Software Intellectual Property Used in System and
System on Chip (SoC) Designs
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 25.040 ISBN 978-2-83222-386-4
IEC 62014-5
i IEEE Std 1734-2011
Contents
1. Overview . 1
1.1 Scope . 1
1.2 Purpose . 1
1.3 Design environment. 2
1.4 QIP-compliant enabled implementations. 2
1.5 Conventions used. 3
1.6 Use of color in this standard . 6
1.7 Contents of this standard . 6
2. Normative references. 7
3. Definitions, acronyms, and abbreviations . 7
3.1 Definitions . 7
3.2 Acronyms and abbreviations . 8
4. Interoperability use model. 8
4.1 Roles and responsibilities . 9
4.2 IP exchange flows. 9
5. QIP schema structures . 10
5.1 QIP schema structure for golden XML. 10
5.2 QIP schema structure for the answer XML . 14
5.3 Tooling requirements for operating on golden XML. 16
5.4 Relationship between golden XML and completed XML . 20
5.5 User extensions. 21
6. Compatibility with VSIA QIP . 22
Annex A (informative) Bibliography . 24
Annex B (normative) Semantic consistency rules. 25
Annex C (informative) IEEE List of Participants .32
Published by IEC under license from IEEE. © 2011 IEEE. All rights reserved.
viii
IEC 62014-5
IEEE Std 1734-2011 ii
Published by IEC under license from IEEE. © 2011 IEEE. All rights reserved.
IEC 62014-5
iii IEEE Std 1734-2011
QUALITY OF ELECTRONIC AND SOFTWARE
INTELLECTUAL PROPERTY USED IN SYSTEM
AND SYSTEM ON CHIP (SOC) DESIGNS
FOREWORD
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Published by IEC under license from IEEE. © 2011 IEEE. All rights reserved.
IEC 62014-5
IEEE Std 1734-2011 iv
International Standard IEC 62014-5/ IEEE Std 1734-2011 has been processed through IEC
technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo
Agreement.
The text of this standard is based on the following documents:
IEEE Std FDIS Report on voting
1734 (2011) 91/1208/FDIS 91/1227/RVD
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Published by IEC under license from IEEE. © 2011 IEEE. All rights reserved.
IEC 62014-5
IEEE Std 1734™-2011
v IEEE Std 1734-2011
IEEE Standard for Quality of
Electronic and Software Intellectual
Property Used in System and
System on Chip (SoC) Designs
Sponsor
Design Automation Standards Committee
of the
IEEE Computer Society
Approved 16 June 2011
IEEE
...
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