IEC 61000-4-34:2005
(Main)Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase
Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase
This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current exceeding 16 A per phase. It covers equipment installed in residential areas as well as industrial machinery, specifically voltage dips and short interruptions for equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. The test method documented in this part of IEC 61000 describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon. It has the status of a Basic EMC Publication in accordance with IEC Guide 107.
Compatibilité électromagnétique (CEM) - Partie 4-34: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension pour matériel ayant un courant appelé de plus de 16 A par phase
La présente partie de la CEI 61000 définit les méthodes d'essai d'immunité ainsi que la gamme des niveaux d'essais préférés pour les matériels électriques et électroniques connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures brèves et les variations de tension. La présente norme s'applique aux matériels électriques et électroniques dont le courant nominal d'entrée dépasse 16 A par phase. Elle s'applique aux matériels installés dans des environnements résidentiels de même qu'aux matériels industriels, pour l'aspect creux de tension et coupures brèves des équipements, monophasés et triphasés, reliés à des réseaux électriques alternatif de 50 Hz ou 60 Hz. Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. La méthode d'essai décrite dans la présente partie de la CEI 61000 détaille une méthode sans faille pour estimer l'immunité d'un matériel ou d'un système à un phénomène prédéfini. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI.
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Standards Content (Sample)
IEC 61000-4-34 ®
Edition 1.2 2025-08
INTERNATIONAL
STANDARD
CONSOLIDATED VERSION
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) -
Part 4-34: Testing and measurement techniques - Voltage dips, short
interruptions and voltage variations immunity tests for equipment with input
mains current more than 16 A per phase
ICS 33.100.20 ISBN 978-2-8327-0645-9
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CONTENTS
FOREWORD . 3
INTRODUCTION . 5
INTRODUCTION to Amendment 2 . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 General . 8
5 Test levels . 8
5.1 Voltage dips and short interruptions . 9
5.2 Voltage variations (optional) . 10
6 Test instrumentation . 11
6.1 Test generator . 11
6.1.1 Characteristics and performance of the generator. 12
6.1.2 Verification of the characteristics of the voltage dips, short
interruptions generators . 12
6.2 Power source . 13
7 Test set-up . 13
8 Test procedures . 13
8.1 Laboratory reference conditions . 14
8.1.1 Climatic conditions . 14
8.1.2 Electromagnetic conditions . 14
8.2 Execution of the test . 14
8.2.1 Voltage dips and short interruptions . 14
8.2.2 Voltage variations (optional) . 17
9 Evaluation of test results . 17
10 Test report. 17
Annex A (normative) Test generator peak inrush current drive capability . 18
A.1 Test generator inrush current requirement . 18
A.2 Measuring test generator peak inrush current drive capability . 18
A.3 Test generator requirement during dip current . 19
Annex B (informative) Electromagnetic environment classes . 20
Annex C (informative) Vectors for three-phase testing . 21
C.1 Phase-to-neutral dip vectors . 21
C.2 Acceptable Method 1 – phase-to-phase dip vectors . 24
C.3 Acceptable Method 2 – phase-to-phase dip vectors . 27
Annex D (informative) Test instrumentation . 30
Annex E (informative) Dip immunity tests for equipment with large mains current . 33
E.1 General . 33
E.2 Considering the EUT current rating . 33
E.3 Modular testing for large equipment . 33
E.4 Combined testing and simulation for large equipment . 33
E.5 Considerations for voltage dip immunity analysis of very large equipment
operation . 34
Annex F (informative) Interpretation of the rise-time and fall-time requirements during
EUT testing . 35
Bibliography . 36
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph . 11
Figure 2 – Voltage variation . 11
Figure 3a – Phase-to-neutral testing on three-phase systems . 16
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift . 16
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift . 16
Figure 3d – Not acceptable – phase-to-phase testing without phase shift . 16
Figure 3 – Testing on three-phase systems . 16
Figure A.1 – Circuit for determining inrush current drive capability . 19
Figure C.1 – Phase-to-neutral dip vectors . 22
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors . 25
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors . 28
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches . 30
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create the
Acceptable Method 1 vectors of Figures C.1, C.2, 3b and 3c . 31
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier . 32
Table 1 – Preferred test level and durations for voltage dips . 9
Table 2 – Preferred test level and durations for short interruptions . 10
Table 3 – Timing of short-term supply voltage variations . 10
Table 4 – Generator specifications . 12
Table A.1 – Minimum peak inrush current capability. 18
Table C.1 – Vector values for phase-to-neutral dips . 23
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips . 26
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips . 29
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Part 4-34: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with input mains current more than 16 A per phase
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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This consolidated version of the official IEC Standard and its amendments has been prepared
for user convenience.
IEC 61000-4-34 edition 1.2 contains the first edition (2005-10) [documents 77A/498/FDIS and
77A/515/RVD], its amendment 1 (2009-05) [documents 77A/670/CDV and 77A/688/RVC] and
its corrigendum 1 (2009-10), and its amendment 2 (2025-08) [documents 77A/1233/CDV and
77A/1247/RVC].
In this Redline version, a vertical line in the margin shows where the technical content is
modified by amendments 1 and 2. Additions are in green text, deletions are in strikethrough
red text. A separate Final version with all changes accepted is available in this publication.
International Standard IEC 61000-4-34 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-34 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
The text of this standard is based on the following documents:
FDIS Report on voting
77A/498/FDIS 77A/515/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this document and its amendments will
remain unchanged until the stability date indicated on the IEC website under webstore.iec.ch
in the data related to the specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
INTRODUCTION to Amendment 2
This amendment contains the following main changes in comparison with IEC 61000-4-
34:2005 and IEC 61000-4-34:2005/AMD1:2009:
• Addition of a note in Annex C: The sign of phase angles of three-phase systems can differ
depending on the convention used. It should be noted that phase angles opposite to those
used in the figures and tables in this annex (i.e. -120° for L2 instead of +120°) are also
common. It is not intended to specify the direction of rotation of the three-phase system
used for testing.
• Add UL1-N = √(1+3P^2 )/2 in Annex C.3,
• Add a new annex "Interpretation of the rise-time and fall-time requirements during EUT
testing" (Annex F), as in IEC 61000-4-11:2020, Clause D.4:
1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input mains
current exceeding 16 A per phase. (See Annex E for guidance on electrical and electronic
equipment rated at more than 200 A per phase.) It covers equipment installed in residential
areas as well as industrial machinery, specifically voltage dips and short interruptions for
equipment connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase
mains.
NOTE 1 Equipment with a rated input mains current of 16 A or less per phase is covered by publication
IEC 61000-4-11.
NOTE 2 There is no upper limit on rated input mains current in this publication. However, in some countries, the
rated input mains current may be limited to some upper value, for example 75 A or 250 A, because of mandatory
safety standards.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for equipment connected to these networks will be covered by future IEC
standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE 1 Voltage fluctuations are covered by publication IEC 61000-4-14.
NOTE 2 For equipment under test with rated currents above 250 A, suitable test equipment may be difficult to
obtain. In these cases, the applicability of this standard should be carefully evaluated by committees responsible
for generic, product and product-family standards. Alternatively, this standard might be used as a framework for an
agreement on performance criteria between the manufacturer and the purchaser.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described
in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining
whether this immunity test standard should be applied or not, and if applied, they are
responsible for defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
IEC 61000-4-30, Electromagnetic compatibility (EMC) − Part 4-30: Testing and measurement
techniques – Power quality measurement methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following definitions apply:
3.1
1)
basic EMC standard (ACEC)
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems, and serve as reference
documents for product committees
3.2
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply system
below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operation related to the occurrence and
termination of short circuits on the system or installations connected to it.
3.5
residual voltage (of voltage dip)
minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
rated input voltage
U
T
root-mean-square input supply voltage for which the equipment has been designed. Several
rated input voltages may be specified for one equipment
3.73.6
malfunction
termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
3.83.7
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
___________
1)
Advisory Committee on Electromagnetic Compatibility (ACEC).
NOTE 1 This term is based on the "uncertainty" approach.
NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle,
by a calibration diagram.
[IEV 311-01-09]
3.93.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to demonstrate that the test system is functioning within
the specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The procedure of 6.1.2 is meant as a guide to insure the correct operation of the test generator, and
other items making up the test set-up so that the intended waveform is delivered to the EUT.
NOTE 3 For the purpose of this basic EMC standard this definition is different from the definition given in
IEV 311-01-13.
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short
circuits (see also IEC 61000-2-8), in installations or by sudden large changes of load. In
certain cases, two or more consecutive dips or interruptions may occur. Voltage variations are
caused by continuously varying loads connected to the network.
Voltage dips at equipment terminals are influenced by the transformer connections between
the fault location on the supply system and the equipment connection point. The transformer
connections will influence both the magnitude and the phase relationship of the voltage dip
experienced by the equipment.
These phenomena are random in nature and can be minimally characterized for the purpose
of laboratory simulation in terms of the deviation from the rated voltage, and duration.
Consequently, different types of tests are specified in this standard to simulate the effects
of abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment (U ) as a basis for
T
voltage test level specification (U ).
T
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− the selection of test levels and durations shall take into account the information given in
IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. Unless otherwise specified by the
T
responsible product committee, the start and stop phase angle for the voltage dips and
interruptions shall be 0° (i.e. the positive-going voltage zero-crossing on the dipped phase),
See 8.2.1. The following test voltage levels (in % U ) are used: 0 %, 40 %, 70 % and 80 %,
T
corresponding to voltage dips or interruptions with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1.
For short interruptions, the preferred test levels and durations are given in Table 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many
real world dips, but are not intended to guarantee immunity to all voltage dips. More severe
test levels, for example 0 % test level for 1 s, and balanced three-phase dips, may be
considered by product committees.
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4. Furthermore, additional information is given in Annex F with respect to the correct
interpretation of rise-time and fall-time requirements during EUT testing.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as an interruption.
Shorter durations in the table, in particular the half-cycle, should be tested to be sure that the
equipment under test (EUT) operates within the performance limits specified for it.
When setting performance criteria for disturbances of 0,5 period duration for products with a
mains transformer, product committees should pay particular attention to effects which may
result from inrush currents. For such products, these may reach 10 to 40 times the rated
current because of magnetic flux saturation of the transformer core after the voltage dip.
Table 1 – Preferred test level and durations for voltage dips
a
Classes Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
Class 2 0 % during 0 % during 70 % during
c
½ cycle 1 cycle 25/30 cycles
d
Class 3 0 % during 0 % during 40 % during 70 % during 80 % during
c c c
½ cycle 1 cycle 10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the levels
must not be less severe than class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test", “10/12 cycles” means “10 cycles
for 50 Hz test” and “12 cycles for 60 Hz test” and “250/300 cycles” means “250 cycles for 50 Hz test” and “300
cycles for 60 Hz test”.
d
May be replaced by product committee with a test level of 50 % for equipment that is intended primarily for
200 V or 208 V nominal operation.
Table 2 – Preferred test level and durations for short interruptions
a
Classes Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test.
5.2 Voltage variations (optional)
This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.
The preferred duration of the voltages changes and the time for which the reduced voltages
are to be maintained are given in Table 3. The rate of change should be constant; however,
the voltage may be stepped. The steps should be positioned at zero crossings, and should be
no larger than 10 % of U . Steps under 1 % of U are considered as constant rate of change
T T
of voltage.
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced voltage Time for increasing
voltage (t ) (t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test.
For voltage variations in three-phase systems with or without neutral, all the three phases
shall be tested simultaneously. Simultaneous voltage variations in three-phase systems are
positioned at the zero-crossing of one of the voltages.
This shape is the typical shape of a motor starting with a rapid time for decreasing voltage, t ,
d
and slower time for increasing voltage, t
i.
Figure 2 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.
U
0 5 25
t (cycles)
IEC 1671/05
NOTE The voltage decreases to 70 % for 25 cycles (50 Hz). Step at zero crossing.
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph
U
T(r.m.s.)
100 %
70 %
0 %
t t t
d
s i
10Time
IEC 1672/05
Figure 2 – Voltage variation
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex D.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.
Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.
The output of the generator may be influenced by the generator characteristics, the load
characteristics, and/or the characteristics of the a.c. network that supplies the generator.
6.1.1 Characteristics and performance of the generator
Table 4 – Generator specifications
Output voltage at no load
As required in Table 1, ±5 % of residual voltage value
Voltage at the output of the generator during equipment As required in Table 1, ±10 % of residual voltage value,
test
measured as r.m.s. value refreshed each ½ cycle per
IEC 61000-4-30
Output current capability See Annex A
Peak inrush current capability (no requirement for See Annex A
voltage variation tests)
Instantaneous peak overshoot/undershoot of the Less than 5 % of U
T
actual voltage, generator loaded with resistive load –
see NOTE 1
Voltage rise (and fall) time t (and t ), during abrupt
Between 1 µs and 5 µs for current ≤75 A
r f
change, generator loaded with resistive load – see
Between 1 µs and 50 µs for current >75 A
NOTE A and NOTE 1
Phase angle at which the voltage dip begins and ends 0° to 360° with a maximum resolution of 5°, see
NOTE B
Phase relationship of voltage dips and interruptions
Less than ±5°
with the power frequency
Zero crossing control of the generators
±10°
NOTE A These values must be checked with a resistive load as per NOTE 1 after this table, but they need not
be checked when an EUT is connected.
NOTE B Phase angle adjustment may be required to comply with 5.1.
Output impedance shall be predominantly resistive.
The output impedance of the test voltage generator shall be low even during transitions when
generating dips. A brief interval (up to 100 μs) of high impedance is permitted during each
transition. For generating interruptions, a high impedance open circuit is preferred permited.
NOTE 1 The value of the non-inductive resistive load for testing overshoot, undershoot, rise time, and fall time
shall be 100 ohms for generators rated for 50 A or less, 50 ohms for generators rated for more than 50 A and less
or equal than 100 A, and 25 ohms for generators rated more than 100 A.
NOTE 2 To test equipment which regenerates energy, an external resistor connected in parallel to the load can
be added. The test result shall not be influenced by this load.
NOTE 3 A high-impedance interruption, when applied to an inductive load, may generate substantial over-
voltages.
6.1.2 Verification of the characteristics of the voltage dips, short interruptions
generators
In order to compare the test results obtained from different test generators, the generator
characteristics shall be verified according to the following:
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall conform to
those percentages of the selected operating voltage: 230 V, 120 V, etc.;
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall be
measured at no load, and shall be maintained within the specified percentage of the U ;
T
– the voltage at the output of the generator shall be monitored during tests as an r.m.s.
value refreshed each ½ cycle, and shall be maintained within the specified percentage
throughout the tests.
NOTE If it can be demonstrated that the equipment peak current requirements are sufficiently small as not to
influence the voltage at the output of the generator, it is not necessary to monitor the output voltage during tests.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching at both
90° and 270°, from 0 % to 100 %, 100 % to 80 %, 100 % to 70 %, 100 % to 40 %, and 100 %
to 0 %.
Phase angle accuracy shall be verified for switching from 0 % to 100 % and 100 % to 0 %,
at nine phase angles from 0 to 315° in 45° increments. It shall also be verified for switching
from 100 % to 80 % and 80 % to 100 %, 100 % to 70 % and 70 % to 100 %, as well as from
100 % to 40 % and 40 % to 100 %, at 90° and 180°.
6.2 Power source
The frequency of the test voltage shall be within ±2 % of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the shortest
power supply cable as specified by the EUT manufacturer. If no cable length is specified, it
shall be the shortest possible length suitable to the application of the EUT.
The test set-ups for the three types of phenomena described in this standard are:
– voltage dips;
– short interruptions;
– voltage variations with gradual transition between the rated voltage and the changed
voltage (optional).
Examples of test set-ups are given in Annex D.
8 Test procedures
Caution should be exercised during the set-up and execution of these tests. EUT and test
equipment shall not become dangerous or unsafe as a result of the application of the tests
defined in this part of IEC 61000. Precautions should be taken to avoid dangerous and unsafe
situations for personnel, the EUT, and the test equipment.
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is intended to be used.
Systems may require a precise pre-analysis to define which system configurations must be
tested to reproduce field situations.
Test cases must be explained and indicated in the Test report.
It is recommended that the test plan include the following items:
– the type designation of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables, and
peripherals;
– input power port of equipment to be tested;
– information about the inrush current requirements of the equipment;
– representative operational modes of the EUT for the test;
– performance criteria used and defined in the technical specifications;
– operational mode(s) of equipment;
– description of the test set-up.
If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and
after the tests. After each group of tests, a full functional check shall be performed.
8.1 Laboratory reference conditions
8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on
the EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the correct
operation of the EUT in order not to influence the test results.
8.2 Execution of the test
During the tests, the mains voltage for testing shall be monitored within an accuracy of 2 %.
8.2.1 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test
event). Each representative mode of operation shall be tested.
For voltage dips, changes in supply voltage shall occur at 0° (positive-going zero crossing of
the voltage), except for ½ cycle test which shall occur at 90°. Additional angles considered
critical may be selected by product committees or individual product specifications preferably
from 45°, 90°, 135°, 180°, 225°, 270° and 315° on each phase.
NOTE Because of saturation effects of inductive loads such as transformers and motors (which tend to be more
significant in equipment rated for greater than 16 A per phase), dips with a half-period duration that commence at
0° or 180° should be avoided.
For short interruptions, the starting angle shall be defined by the product committee as the
worst case. In the absence of definition, it is recommended to use 0° for one of the phases.
For short interruptions test of three-phase systems, all the three phases shall be
simultaneously tested as per 5.1.
For voltage dips test of single-phase systems, the voltage shall be tested as per 5.1. This
implies one series of tests.
For voltage dips test of three-phase systems with neutral, each individual voltage (phase-to-
neutral and phase-to-phase) shall be tested, one at a time, as per 5.1. This implies six
different series of tests. See Figure 3a, Figure 3b and Figure 3c, and Figure D.2.a and
Figure D.2.b in Annex D.
For voltage dips test of three-phase systems without neutral, each phase-to-phase voltage
shall be tested, one at a time, as per 5.1. This implies three different series of tests. See
Annex C. See Figure 3b and Figure 3c, and Figure D.2.a in Annex D.
NOTE 1 For three-phase systems, during a dip on a phase-to-phase voltage, a change will occur on one or two of
the other voltages as well.
NOTE 2 For phase-to-phase testing on three-phase systems, the vect
...
NORME CEI
INTERNATIONALE
IEC
61000-4-34
INTERNATIONAL
Première édition
STANDARD
First edition
2005-10
PUBLICATION FONDAMENTALE EN CEM
BASIC EMC PUBLICATION
Compatibilité électromagnétique (CEM) –
Partie 4-34:
Techniques d'essai et de mesure –
Essais d'immunité aux creux de tension,
coupures brèves et variations de tension
pour matériel ayant un courant appelé
de plus de 16 A par phase
Electromagnetic compatibility (EMC) –
Part 4-34:
Testing and measurement techniques –
Voltage dips, short interruptions and voltage
variations immunity tests for equipment
with input current more than 16 A per phase
Numéro de référence
Reference number
CEI/IEC 61000-4-34:2005
Numérotation des publications Publication numbering
Depuis le 1er janvier 1997, les publications de la CEI As from 1 January 1997 all IEC publications are
sont numérotées à partir de 60000. Ainsi, la CEI 34-1 issued with a designation in the 60000 series. For
devient la CEI 60034-1. example, IEC 34-1 is now referred to as IEC 60034-1.
Editions consolidées Consolidated editions
Les versions consolidées de certaines publications de la The IEC is now publishing consolidated versions of its
CEI incorporant les amendements sont disponibles. Par publications. For example, edition numbers 1.0, 1.1
exemple, les numéros d’édition 1.0, 1.1 et 1.2 indiquent and 1.2 refer, respectively, to the base publication,
respectivement la publication de base, la publication de the base publication incorporating amendment 1 and
base incorporant l’amendement 1, et la publication de the base publication incorporating amendments 1
base incorporant les amendements 1 et 2. and 2.
Informations supplémentaires Further information on IEC publications
sur les publications de la CEI
Le contenu technique des publications de la CEI est The technical content of IEC publications is kept
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nibles dans le Catalogue des publications de la CEI available in the IEC Catalogue of publications
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.
NORME CEI
INTERNATIONALE
IEC
61000-4-34
INTERNATIONAL
Première édition
STANDARD
First edition
2005-10
PUBLICATION FONDAMENTALE EN CEM
BASIC EMC PUBLICATION
Compatibilité électromagnétique (CEM) –
Partie 4-34:
Techniques d'essai et de mesure –
Essais d'immunité aux creux de tension,
coupures brèves et variations de tension
pour matériel ayant un courant appelé
de plus de 16 A par phase
Electromagnetic compatibility (EMC) –
Part 4-34:
Testing and measurement techniques –
Voltage dips, short interruptions and voltage
variations immunity tests for equipment
with input current more than 16 A per phase
IEC 2005 Droits de reproduction réservés Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
CODE PRIX
V
PRICE CODE
Commission Electrotechnique Internationale
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue
– 2 – 61000-4-34 CEI:2005
SOMMAIRE
AVANT-PROPOS.6
INTRODUCTION.10
1 Domaine d’application .12
2 Références normatives.12
3 Termes et définitions .14
4 Généralités.16
5 Niveaux d'essai .18
5.1 Creux de tension et coupures brèves .18
5.2 Variations de tension (facultatif) .20
6 Instruments d'essai .24
6.1 Générateur d’essai .24
6.2 Source d’énergie .26
7 Montage d'essai .26
8 Procédures d'essai .26
8.1 Conditions de référence en laboratoire .28
8.2 Exécution des essais.30
9 Evaluation des résultats d'essai.34
10 Rapport d'essai .34
Annexe A (normative) Valeur crête du courant d'appel d'excitation du générateur d'essai.38
Annexe B (informative) Classes d'environnement électromagnétique .42
Annexe C (informative) Vecteurs de tension pour les essais triphasés.44
Annexe D (informative) Instrumentation d'essai .56
Bibliographie.62
Figure 1 – Creux de tension – figure montrant la forme d'onde d'un creux de tension
de 70 % .22
Figure 2 – Variation de tension .22
Figure 3a – Essai phase-neutre des systèmes triphasés .32
Figure 3b – Essais phase-phase des systèmes triphasés – méthode acceptable 1.32
Figure 3c – Essais phase-phase des systèmes triphasés – méthode acceptable 2.32
Figure 3d – Solution non acceptable – essai phase-phase sans déphasage.32
Figure A.1 – Circuit utilisé pour déterminer le courant d’appel crête du générateur
de coupures brèves .40
Figure C.1 – Vecteurs de creux de tension phase-neutre .44
Figure C.2 – Vecteurs de creux de tension phase – méthode acceptable 1 .48
Figure C.3 – Vecteurs de creux de tension phase-phase – méthode acceptable 2 .52
Figure D.1 – Schéma d'un exemple d'instruments d’essai pour les creux de tension,
les coupures brèves et les variations de tension à l’aide de transformateurs variables
et de commutateurs .56
61000-4-34 IEC:2005 – 3 –
CONTENTS
FOREWORD.7
INTRODUCTION.11
1 Scope.13
2 Normative references .13
3 Terms and definitions .15
4 General .17
5 Test levels.19
5.1 Voltage dips and short interruptions .19
5.2 Voltage variations (optional) .21
6 Test instrumentation.25
6.1 Test generator.25
6.2 Power source .27
7 Test set-up .27
8 Test procedures .27
8.1 Laboratory reference conditions .29
8.2 Execution of the test.31
9 Evaluation of test results .35
10 Test report.35
Annex A (normative) Test generator peak inrush current drive capability .39
Annex B (informative) Electromagnetic environment classes.43
Annex C (informative) Vectors for three-phase testing .45
Annex D (informative) Test instrumentation .57
Bibliography.63
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph.23
Figure 2 – Voltage variation .23
Figure 3a – Phase-to-neutral testing on three-phase systems .33
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift.33
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift.33
Figure 3d – Not acceptable – phase-to-phase testing without phase shift.33
Figure A.1 – Circuit for determining inrush current drive capability.41
Figure C.1 – Phase-to-neutral dip vectors .45
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors .49
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors .53
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches.57
– 4 – 61000-4-34 CEI:2005
Figure D.2 – Application de l'exemple d'instruments d'essai indiqué à la Figure D.1
pour créer la méthode acceptable 1 des vecteurs des Figures C.1, C.2, 4a et 4b.58
Figure D.3 – Schéma d'un exemple d'instruments d’essai pour les creux de tension
triphasés, les coupures brèves et les variations de tension à l’aide d’un amplificateur
de puissance .60
Tableau 1 – Durées et niveaux d’essai préférés pour les creux de tension.20
Tableau 2 – Durées et niveaux d’essai préférés pour les coupures brèves.20
Tableau 3 – Durée des variations de tension d’alimentation à court terme .20
Tableau 4 – Spécifications du générateur .24
Tableau A.1 – Courant d'appel minimal admissible .38
Tableau C.1 – Valeur des vecteurs pour des creux de tension phase neutre.46
Tableau C.2 – Vecteurs de creux de tension phase – méthode acceptable 1 .50
Tableau C.3 – Vecteurs de creux de tension phase-phase – méthode acceptable 2.54
61000-4-34 IEC:2005 – 5 –
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create the
Acceptable Method 1 vectors of Figures C.1, C.2, 4a and 4b .59
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier.61
Table 1 – Preferred test level and durations for voltage dips .21
Table 2 – Preferred test level and durations for short interruptions .21
Table 3 – Timing of short-term supply voltage variations.21
Table 4 – Generator specifications.25
Table A.1 – Minimum peak inrush current capability.39
Table C.1 – Vector values for phase-to-neutral dips.47
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips .51
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips .55
– 6 – 61000-4-34 CEI:2005
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –
Partie 4-34: Techniques d'essai et de mesure –
Essais d'immunité aux creux de tension, coupures brèves et
variations de tension pour matériel ayant un courant appelé
de plus de 16 A par phase
AVANT-PROPOS
1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation
composée de l'ensemble des comités électrotechniques nationaux (Comités nationaux de la CEI). La CEI a
pour objet de favoriser la coopération internationale pour toutes les questions de normalisation dans les
domaines de l'électricité et de l'électronique. A cet effet, la CEI, entre autres activités, publie des Normes
internationales, des Spécifications techniques, des Rapports techniques, des Spécifications accessibles au
public (PAS) et des Guides (ci-après dénommés "Publication(s) de la CEI"). Leur élaboration est confiée à des
comités d'études, aux travaux desquels tout Comité national intéressé par le sujet traité peut participer. Les
organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent
également aux travaux. La CEI collabore étroitement avec l'Organisation Internationale de Normalisation (ISO),
selon des conditions fixées par accord entre les deux organisations.
2) Les décisions ou accords officiels de la CEI concernant les questions techniques représentent, dans la mesure
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l'éventuelle fausse utilisation ou interprétation qui en est faite par un quelconque utilisateur final.
4) Dans le but d'encourager l'uniformité internationale, les Comités nationaux de la CEI s'engagent, dans toute la
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responsabilité pour les équipements déclarés conformes à une de ses Publications.
6) Tous les utilisateurs doivent s'assurer qu'ils sont en possession de la dernière édition de cette publication.
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toute autre Publication de la CEI, ou au crédit qui lui es accordé.
8) L’attention est attirée sur les références normatives citées dans cette publication. L'utilisation de publications
référencées est obligatoire pour une application correcte de la présente publication
9) L'attention est attirée sur le fait que certains des éléments de la présente Publication de la CEI peuvent faire
l’objet de droits de propriété intellectuelle ou de droits analogues. La CEI ne saurait être tenue pour
responsable de ne pas avoir identifié de tels droits de propriété et de ne pas avoir signalé leur existence.
La Norme internationale CEI 61000-4-34 a été établie par le sous-comité 77A: Phénomènes
basse fréquence, du comité d'études 77 de la CEI: Compatibilité électromagnétique.
Elle constitue la partie 4-34 de la CEI 61000. Elle a le statut de publication fondamentale en
CEM conformément au Guide 107 de la CEI.
61000-4-34 IEC:2005 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests for equipment
with input current more than 16 A per phase
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-34 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-34 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
– 8 – 61000-4-34 CEI:2005
Le texte de cette norme est issu des documents suivants:
FDIS Rapport de vote
77A/498/FDIS 77A/515/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cette norme.
Cette publication a été rédigée selon les Directives ISO/CEI, Partie 2.
Le comité a décidé que le contenu de cette publication ne sera pas modifié avant la date de
maintenance indiquée sur le site web de la CEI sous «http://webstore.iec.ch» dans les
données relatives à la publication recherchée. A cette date, la publication sera
• reconduite;
• supprimée;
• remplacée par une édition révisée, ou
• amendée.
61000-4-34 IEC:2005 – 9 –
The text of this standard is based on the following documents:
FDIS Report on voting
77A/498/FDIS 77A/515/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
– 10 – 61000-4-34 CEI:2005
INTRODUCTION
La CEI 61000 est publiée sous forme de plusieurs parties séparées, conformément à la
structure suivante:
Partie 1: Généralités
Considérations générales (introduction, principes fondamentaux)
Définitions, terminologie
Partie 2: Environnement
Description de l'environnement
Classification de l'environnement
Niveaux de compatibilité
Partie 3: Limites
Limites d'émissions
Limites d'immunité (dans la mesure où elles ne tombent pas sous la responsabilité des
comités de produits)
Partie 4: Techniques d'essai et de mesure
Techniques de mesure
Techniques d'essais
Partie 5: Directives d'installation et d'atténuation
Guide d'installation
Méthodes et dispositifs d'atténuation
Partie 6: Normes génériques
Partie 9: Divers
Chaque partie est à son tour subdivisée en plusieurs parties, publiées soit comme normes
internationales soit comme spécifications techniques ou rapports techniques, dont certaines ont
déjà été publiées comme sections. D’autres seront publiées avec le numéro de partie, suivi d’un
tiret et complété d’un second numéro identifiant la subdivision (exemple: 61000-6-1).
61000-4-34 IEC:2005 – 11 –
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
– 12 – 61000-4-34 CEI:2005
COMPATIBILITÉ ÉLECTROMAGNÉTIQUE (CEM) –
Partie 4-34: Techniques d'essai et de mesure –
Essais d'immunité aux creux de tension, coupures brèves et
variations de tension pour matériel ayant un courant appelé
de plus de 16 A par phase
1 Domaine d’application
La présente partie de la CEI 61000 définit les méthodes d'essai d'immunité ainsi que la
gamme des niveaux d'essais préférés pour les matériels électriques et électroniques
connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures
brèves et les variations de tension.
La présente norme s’applique aux matériels électriques et électroniques dont le courant
nominal d’entrée dépasse 16 A par phase. Elle s'applique aux matériels installés dans des
environnements résidentiels de même qu'aux matériels industriels, pour l'aspect creux de
tension et coupures brèves des équipements, monophasés et triphasés, reliés à des réseaux
électriques alternatif de 50 Hz ou 60 Hz.
NOTE 1 Les matériels dont le courant appelé est de 16 A ou moins sont traités dans la CEI 61000-4-11.
NOTE 2 Il n'y a pas de limite maximale du courant appelé dans la présente norme. Néanmoins, dans certains
pays, le courant appelé peut être limité à une valeur maximale, par exemple 75 A ou 250 A, à cause de normes de
sécurité obligatoires.
Elle ne s'applique pas aux matériels électriques et électroniques destinés à être reliés à des
réseaux électriques à courant alternatif de 400 Hz. Les essais pour les matériels reliés à ces
réseaux seront traités dans des normes CEI à venir.
Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité
fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des
coupures brèves et à des variations de tension.
NOTE 1 Les fluctuations de la tension sont traitées dans la CEI 61000-4-14.
NOTE 2 Pour les matériels en essai dont le courant assigné est supérieur à 250 A, un équipement d’essai qui
convienne peut être difficile à obtenir. Dans ce cas, l’applicabilité de cette norme sera évaluée avec précaution par
les comités responsables des normes génériques, produits et familles de produits. Une alternative consiste à
utiliser cette norme comme une trame pour un accord entre un constructeur et un acheteur.
La méthode d’essai décrite dans la présente partie de la CEI 61000 détaille une méthode
sans faille pour estimer l’immunité d’un matériel ou d’un système à un phénomène prédéfini.
Comme décrit dans le Guide 107 de la CEI, ce document est une publication fondamentale en
CEM destinée à l’usage des comités de produits de la CEI. Comme également mentionné
dans le Guide 107, les comités de produits de la CEI sont responsables du choix d’utilisation
ou non de cette norme d’essai d’immunité et, si elle est utilisée, les comités sont
responsables de la définition des niveaux d’essai appropriés. Le comité d’études 77 et ses
sous-comités sont prêts à coopérer avec les comités de produits pour l’évaluation de la
pertinence des essais particuliers d’immunité pour leurs produits.
2 Références normatives
Les documents de référence suivants sont indispensables pour l'application du présent
document. Pour les références datées, seule l'édition citée s'applique. Pour les références
non datées, la dernière édition du document de référence s'applique (y compris les éventuels
amendements).
CEI 60050-161, Vocabulaire Electrotechnique International (VEI) – Chapitre 161:
Compatibilité électromagnétique
61000-4-34 IEC:2005 – 13 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests for equipment
with input current more than 16 A per phase
1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current
exceeding 16 A per phase. It covers equipment installed in residential areas as well as
industrial machinery, specifically voltage dips and short interruptions for equipment connected
to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains.
NOTE 1 Equipment with a rated input current of 16 A or less per phase is covered by publication IEC 61000-4-11.
NOTE 2 There is no upper limit on rated input current in this publication. However, in some countries, the rated
input current may be limited to some upper value, for example 75 A or 250 A, because of mandatory safety
standards.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for equipment connected to these networks will be covered by future IEC
standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE 1 Voltage fluctuations are covered by publication IEC 61000-4-14.
NOTE 2 For equipment under test with rated currents above 250 A, suitable test equipment may be difficult to
obtain. In these cases, the applicability of this standard should be carefully evaluated by committees responsible
for generic, product and product-family standards. Alternatively, this standard might be used as a framework for an
agreement on performance criteria between the manufacturer and the purchaser.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described
in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining
whether this immunity test standard should be applied or not, and if applied, they are
responsible for defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
– 14 – 61000-4-34 CEI:2005
CEI 61000-2-8, Compatibilité électromagnétique (CEM) – Partie 2-8: Environnement – Creux
de tension et coupures brèves sur les réseaux d’électricité publics incluant des résultats de
mesures statistiques.
CEI 61000-4-30, Compatibilité électromagnétique (CEM) − Partie 4-30: Techniques d'essais
et de mesure – Méthodes de mesure de la qualité de l'alimentation
3 Termes et définitions
Pour les besoins du présent document, les termes et définitions donnés dans CEI 60050-
161, ainsi que les suivants, s'appliquent:
3.1
1)
norme fondamentale en CEM (ACEC)
norme relative aux conditions ou aux règlements fondamentaux et généraux nécessaires à la
réalisation de la CEM liés ou s’appliquant à tous les produits et systèmes et que les comités
de produits peuvent utiliser comme document de référence
3.2
immunité (à une perturbation)
aptitude d'un dispositif, d'un appareil ou d'un système à fonctionner sans dégradation en
présence d'une perturbation électromagnétique
[VEI 161-01-20]
3.3
creux de tension
diminution brusque de la tension à un endroit particulier d’un système d’alimentation
électrique qui devient inférieure à un seuil de creux spécifié, puis reprend une valeur
supérieure au seuil après un bref intervalle de temps
NOTE 1 Typiquement, un creux est associé à l’apparition et à la disparition d’un court-circuit ou de toute autre
cause de surintensité dans le système ou les installations connectées à celui-ci.
NOTE 2 Un creux de tension est une perturbation électromagnétique en deux dimensions, dont le niveau est
déterminé par la tension et la durée.
3.4
coupure brève
diminution brusque de la tension sur toutes les phases à un endroit particulier d’un système
d’alimentation électrique qui devient inférieure à un seuil d’interruption spécifié, puis reprend
une valeur supérieure au seuil après un bref intervalle de temps
NOTE Les coupures brèves sont souvent liées aux dispositifs de commutation dont le fonctionnement est lié à
l’apparition et à la disparition de courts-circuits dans le système ou les installations connectées à celui-ci.
3.5
tension résiduelle (d’un creux de tension)
valeur minimale de la tension efficace enregistrée pendant un creux de tension ou une
coupure brève
NOTE La tension résiduelle peut être exprimée en volts, en pourcentage ou en valeur unitaire par rapport à la
tension de référence.
3.6
tension assignée
U
T
tension assignée de l’EST
___________
1)
Comité consultatif pour la compatibilité électromagnétique (Advisory Committee on Electromagnetic
Compatibility (ACEC) en anglais).
61000-4-34 IEC:2005 – 15 –
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
IEC 61000-4-30, Electromagnetic compatibility (EMC) − Part 4-30: Testing and measurement
techniques – Power quality measurement methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following definitions apply:
3.1
1)
basic EMC standard (ACEC)
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems, and serve as reference
documents for product committees
3.2
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply system
below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operation related to the occurrence and
termination of short circuits on the system or installations connected to it.
3.5
residual voltage (of voltage dip)
minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
rated input voltage
U
T
root-mean-square input supply voltage for which the equipment has been designed. Several
rated input voltages may be specified for one equipment
___________
1)
Advisory Committee on Electromagnetic Compatibility (ACEC).
– 16 – 61000-4-34 CEI:2005
3.7
dysfonctionnement
cessation de l’aptitude d’un matériel à accomplir ses fonctions ou exécution de fonctions
incorrectes par le matériel
3.8
étalonnage
ensemble des opérations établissant, en référence à des étalons, la relation qui existe, dans
les conditions spécifiées, entre une indication et un résultat de mesure
NOTE 1 Cette définition est conçue dans l'approche "incertitude".
NOTE 2 La relation entre les indications et les résultants de mesure peut être donnée, en principe, dans un
diagramme d'étalonnage.
[VEI 311-01-09]
3.9
vérification
ensemble des opérations utilisées qui s’appliquent à l’ensemble des matériels d’essais (par
exemple le générateur d’essai et les câbles d’interconnexion) pour démontrer que le système
d’essai fonctionne conformément aux spécifications décrites à l’Article 6
NOTE 1 Les méthodes de vérification ne sont pas nécessairement les mêmes que les méthodes d’étalonnage.
NOTE 2 Les procédures de vérification décrites en 6.1.2 servent à vérifier que le générateur d’essai fonctionne
correctement les autres éléments constituant le montage d’essai servent à vérifier qu’une forme d’onde correcte
est délivrée à l’EST.
NOTE 3 Dans le contexte de cette norme fondamentale en CEM, cette définition est différente de celle indiquée
dans VEI 311-01-13.
4 Généralités
Les creux de tension, les coupures brèves et les variations de tension de l’alimentation
électrique peuvent avoir une incidence sur les matériels électriques et électroniques.
Les creux de tension et les coupures brèves sont causés par des défaillances au niveau du
réseau, essentiellement des courts-circuits (voir également la CEI 61000-2-8), dans les
installations ou par d’importantes variations brusques de charge. Dans certains cas, plusieurs
creux ou coupures consécutifs peuvent survenir. Les variations de tension sont causées par
des variations continues des charges connectées au réseau.
Les creux de tension aux bornes des matériels sont influencés par les raccordements des
transformateurs entre le lieu de la faute sur le circuit d'alimentation et le point de
raccordement du matériel. Les raccordements des transformateurs influencent à la fois
l'amplitude et le déphasage angulaire du creux de tension auquel le matériel est soumis.
Ces phénomènes, aléatoires par nature, peuvent être caractérisés de manière minimale en
vue d’être utilisés pour des simulations en laboratoire en termes d’écart par rapport à la
tension nominale et de durée.
En conséquence, différents types d’essais sont spécifiés dans cette norme pour simuler les
effets des variations brusques de tension. Ces essais doivent uniquement être utilisés pour
d
...
IEC 61000-4-34 ®
Edition 1.1 2009-11
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase
Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase
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IEC 61000-4-34 ®
Edition 1.1 2009-11
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-34: Testing and measurement techniques – Voltage dips, short
interruptions and voltage variations immunity tests for equipment with mains
current more than 16 A per phase
Compatibilité électromagnétique (CEM) –
Partie 4-34: Techniques d'essai et de mesure – Essais d'immunité aux creux de
tension, coupures brèves et variations de tension pour matériel ayant un
courant d’alimentation de plus de 16 A par phase
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 2-8318-1049-2
– 2 – 61000-4-34 IEC:2005+A1:2009
CONTENTS
FOREWORD. 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 General . 9
5 Test levels . 9
5.1 Voltage dips and short interruptions . 10
5.2 Voltage variations (optional) . 11
6 Test instrumentation . 13
6.1 Test generator . 13
6.2 Power source . 14
7 Test set-up . 14
8 Test procedures . 14
8.1 Laboratory reference conditions . 15
8.2 Execution of the test . 15
9 Evaluation of test results . 18
10 Test report . 18
Annex A (normative) Test generator current drive capability . 19
Annex B (informative) Electromagnetic environment classes . 21
Annex C (informative) Vectors for three-phase testing . 22
Annex D (informative) Test instrumentation . 28
Annex E (informative) Dip immunity tests for equipment with large mains current . 31
Bibliography . 33
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph . 12
Figure 2 – Voltage variation . 12
Figure 3a – Phase-to-neutral testing on three-phase systems . 17
Figure 3b – Phase-to-phase testing on three-phase systems – Acceptable Method 1
phase shift . 17
Figure 3c – Phase-to-phase testing on three-phase systems – Acceptable Method 2
phase shift . 17
Figure 3d – Not acceptable – phase-to-phase testing without phase shift . 17
Figure A.1 – Circuit for determining inrush current drive capability . 20
Figure C.1 – Phase-to-neutral dip vectors . 22
Figure C.2 – Acceptable Method 1 – phase-to-phase dip vectors . 24
Figure C.3 – Acceptable Method 2 – phase-to-phase dip vectors . 26
Figure D.1 – Schematic of example test instrumentation for voltage dips and short
interruptions using tapped transformer and switches . 28
61000-4-34 IEC:2005+A1:2009 – 3 –
Figure D.2 – Applying the example test instrumentation of Figure D.1 to create
the Acceptable Method 1 vectors of Figures C.1, C.2, 4a and 4b . 29
Figure D.3 – Schematic of example test instrumentation for three-phase voltage dips,
short interruptions and voltage variations using power amplifier . 30
Table 1 – Preferred test level and durations for voltage dips . 10
Table 2 – Preferred test level and durations for short interruptions . 11
Table 3 – Timing of short-term supply voltage variations . 11
Table 4 – Generator specifications . 13
Table A.1 – Minimum peak inrush current capability . 19
Table C.1 – Vector values for phase-to-neutral dips . 23
Table C.2 – Acceptable Method 1 – vector values for phase-to-phase dips . 25
Table C.3 – Acceptable Method 2 – vector values for phase-to-phase dips . 27
– 4 – 61000-4-34 IEC:2005+A1:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This consolidated version of the official IEC Standard and its amendment has been prepared
for user convenience.
IEC 61000-4-34 edition 1.1 contains the first edition (2005) [documents 77A/498/FDIS and
77A/515/RVD] and its amendment 1 (2009) [documents 77A/670/CDV and 77A/688/RVC].
A vertical line in the margin shows where the base publication has been modified by
amendment 1.
International Standard IEC 61000-4-34 has been prepared by subcommittee 77A: Low frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility.
61000-4-34 IEC:2005+A1:2009 – 5 –
It forms Part 4-34 of IEC 61000. It has the status of a Basic EMC Publication in accordance with IEC
Guide 107.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of the base publication and its amendments
will remain unchanged until the maintenance result date indicated on the IEC web site
under "http://webstore.iec.ch" in the data related to the specific publication. At
this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – 61000-4-34 IEC:2005+A1:2009
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
61000-4-34 IEC:2005+A1:2009 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-34: Testing and measurement techniques –
Voltage dips, short interruptions and voltage variations immunity tests
for equipment with mains current more than 16 A per phase
1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated mains current
exceeding 16 A per phase. (See Annex E for guidance on electrical and electronic equipment
rated at more than 200 A per phase.) It covers equipment installed in residential areas as well
as industrial machinery, specifically voltage dips and short interruptions for equipment
connected to either 50 Hz or 60 Hz a.c. networks, including 1-phase and 3-phase mains.
NOTE 1 Equipment with a rated mains current of 16 A or less per phase is covered by publication IEC 61000-4-11.
NOTE 2 There is no upper limit on rated mains current in this publication. However, in some countries, the rated
mains current may be limited to some upper value, for example 75 A or 250 A, because of mandatory safety
standards.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c.
networks. Tests for equipment connected to these networks will be covered by future IEC
standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE 1 Voltage fluctuations are covered by publication IEC 61000-4-14.
NOTE 2 For equipment under test with rated currents above 250 A, suitable test equipment may be difficult to
obtain. In these cases, the applicability of this standard should be carefully evaluated by committees responsible
for generic, product and product-family standards. Alternatively, this standard might be used as a framework for an
agreement on performance criteria between the manufacturer and the purchaser.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described
in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining
whether this immunity test standard should be applied or not, and if applied, they are
responsible for defining the appropriate test levels. Technical committee 77 and its sub-
committees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161: Electro-
magnetic compatibility
– 8 – 61000-4-34 IEC:2005+A1:2009
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
IEC 61000-4-30, Electromagnetic compatibility (EMC) − Part 4-30: Testing and measurement
techniques – Power quality measurement methods
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050-161 as well
as the following definitions apply:
3.1
1)
basic EMC standard (ACEC)
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems, and serve as reference
documents for product committees
3.2
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
sudden reduction of the voltage on all phases at a particular point of an electric supply system
below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operation related to the occurrence and
termination of short circuits on the system or installations connected to it.
3.5
residual voltage (of voltage dip)
minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
malfunction
termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
___________
1)
Advisory Committee on Electromagnetic Compatibility (ACEC).
61000-4-34 IEC:2005+A1:2009 – 9 –
3.7
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
NOTE 1 This term is based on the "uncertainty" approach.
NOTE 2 The relationship between the indications and the results of measurement can be expressed, in principle,
by a calibration diagram.
[IEV 311-01-09]
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to demonstrate that the test system is functioning within
the specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The procedure of 6.1.2 is meant as a guide to insure the correct operation of the test generator, and
other items making up the test set-up so that the intended waveform is delivered to the EUT.
NOTE 3 For the purpose of this basic EMC standard this definition is different from the definition given in
IEV 311-01-13.
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short
circuits (see also IEC 61000-2-8), in installations or by sudden large changes of load. In
certain cases, two or more consecutive dips or interruptions may occur. Voltage variations are
caused by continuously varying loads connected to the network.
Voltage dips at equipment terminals are influenced by the transformer connections between
the fault location on the supply system and the equipment connection point. The transformer
connections will influence both the magnitude and the phase relationship of the voltage dip
experienced by the equipment.
These phenomena are random in nature and can be minimally characterized for the purpose
of laboratory simulation in terms of the deviation from the rated voltage, and duration.
Consequently, different types of tests are specified in this standard to simulate the effects
of abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment as a basis for voltage
test level specification (U ).
T
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
– 10 – 61000-4-34 IEC:2005+A1:2009
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− the selection of test levels and durations shall take into account the information given in
IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. Unless otherwise specified by the
T
responsible product committee, the start and stop phase angle for the voltage dips and
interruptions shall be 0° (i.e. the positive-going voltage zero-crossing on the dipped phase),
) are used: 0 %, 40 %, 70 % and 80 %,
See 8.2.1. The following test voltage levels (in % U
T
corresponding to voltage dips or interruptions with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1.
For short interruptions, the preferred test levels and durations are given in Table 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many
real world dips, but are not intended to guarantee immunity to all voltage dips. More severe
test levels, for example 0 % test level for 1 s, and balanced three-phase dips, may be
considered by product committees.
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as an interruption.
Table 1 – Preferred test level and durations for voltage dips
a
Classes Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
70 % during
Class 2 0 % during 1 cycle
c
25/30 cycles
d
40 % during 70 % during 80 % during
Class 3 0 % during 1 cycle
c c c
10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the levels
must not be less severe than class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test", “10/12 cycles” means “10 cycles
for 50 Hz test” and “12 cycles for 60 Hz test” and “250/300 cycles” means “250 cycles for 50 Hz test” and “300
cycles for 60 Hz test”.
d
May be replaced by product committee with a test level of 50 % for equipment that is intended primarily for
200 V or 208 V nominal operation.
61000-4-34 IEC:2005+A1:2009 – 11 –
Table 2 – Preferred test level and durations for short interruptions
a
Classes Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test.
5.2 Voltage variations (optional)
This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.
The preferred duration of the voltages changes and the time for which the reduced voltages are to
be maintained are given in Table 3. The rate of change should be constant; however, the voltage
may be stepped. The steps should be positioned at zero crossings, and should be no larger than
10 % of U . Steps under 1 % of U are considered as constant rate of change of voltage.
T T
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced voltage Time for increasing
voltage (t ) (t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test.
For voltage variations in three-phase systems with or without neutral, all the three phases
shall be tested simultaneously. Simultaneous voltage variations in three-phase systems are
positioned at the zero-crossing of one of the voltages.
This shape is the typical shape of a motor starting with a rapid time for decreasing voltage, t ,
d
and slower time for increasing voltage, t
i.
Figure 2 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.
– 12 – 61000-4-34 IEC:2005+A1:2009
U
0 5 25
t (cycles)
IEC 1671/05
NOTE The voltage decreases to 70 % for 25 cycles (50 Hz). Step at zero crossing.
Figure 1 – Voltage dip – 70 % voltage dip sine wave graph
U
T(r.m.s.)
100 %
70 %
0 %
t
t t
d s i
10Time
IEC 1672/05
Figure 2 – Voltage variation
61000-4-34 IEC:2005+A1:2009 – 13 –
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex D.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.
Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.
The output of the generator may be influenced by the generator characteristics, the load
characteristics, and/or the characteristics of the a.c. network that supplies the generator.
6.1.1 Characteristics and performance of the generator
Table 4 – Generator specifications
Output voltage at no load
As required in Table 1, ±5 % of residual voltage value
Voltage at the output of the generator during equipment As required in Table 1, ±10 % of residual voltage value,
test measured as r.m.s. value refreshed each ½ cycle per
IEC 61000-4-30
Output current capability See Annex A
Peak inrush current capability (no requirement for See Annex A
voltage variation tests)
Instantaneous peak overshoot/undershoot of the Less than 5 % of U
T
actual voltage, generator loaded with resistive load –
see NOTE 1
Voltage rise (and fall) time t (and t ), during abrupt Between 1 µs and 5 µs for current ≤75 A
r f
change, generator loaded with resistive load – see
Between 1 µs and 50 µs for current >75 A
NOTE A and NOTE 1
Phase angle at which the voltage dip begins and ends 0° to 360° with a maximum resolution of 5°, see
NOTE B
Phase relationship of voltage dips and interruptions
Less than ±5°
with the power frequency
Zero crossing control of the generators ±10°
NOTE A These values must be checked with a resistive load as per NOTE 1 after this table, but they need not
be checked when an EUT is connected.
NOTE B Phase angle adjustment may be required to comply with 5.1.
Output impedance shall be predominantly resistive.
The output impedance of the test voltage generator shall be low even during transitions when
generating dips. A brief interval (up to 100 μs) of high impedance is permitted during each
transition. For generating interruptions, a high impedance open circuit is permitted.
NOTE 1 The value of the non-inductive resistive load for testing overshoot, undershoot, rise time, and fall time
shall be 100 ohms for generators rated for 50 A or less, 50 ohms for generators rated for more than 50 A and less
or equal than 100 A, and 25 ohms for generators rated more than 100 A.
NOTE 2 To test equipment which regenerates energy, an external resistor connected in parallel to the load can
be added. The test result shall not be influenced by this load.
NOTE 3 A high-impedance interruption, when applied to an inductive load, may generate substantial over-
voltages.
– 14 – 61000-4-34 IEC:2005+A1:2009
6.1.2 Verification of the characteristics of the voltage dips, short interruptions
generators
In order to compare the test results obtained from different test generators, the generator
characteristics shall be verified according to the following:
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall conform to
those percentages of the selected operating voltage: 230 V, 120 V, etc.;
– the 100 %, 80 %, 70 % and 40 % r.m.s. output voltages of the generator shall be
measured at no load, and shall be maintained within the specified percentage of the U ;
T
– the voltage at the output of the generator shall be monitored during tests as an r.m.s.
value refreshed each ½ cycle, and shall be maintained within the specified percentage
throughout the tests.
NOTE If it can be demonstrated that the equipment peak current requirements are sufficiently small as not to
influence the voltage at the output of the generator, it is not necessary to monitor the output voltage during tests.
Rise and fall time, as well as overshoot and undershoot, shall be verified for switching at both 90°
and 270°, from 0 % to 100 %, 100 % to 80 %, 100 % to 70 %, 100 % to 40 %, and 100 % to 0 %.
Phase angle accuracy shall be verified for switching from 0 % to 100 % and 100 % to 0 %,
at nine phase angles from 0 to 315° in 45° increments. It shall also be verified for switching
from 100 % to 80 % and 80 % to 100 %, 100 % to 70 % and 70 % to 100 %, as well as from
100 % to 40 % and 40 % to 100 %, at 90° and 180°.
6.2 Power source
The frequency of the test voltage shall be within ±2 % of rated frequency.
7 Test set-up
The test shall be performed with the EUT connected to the test generator with the shortest
power supply cable as specified by the EUT manufacturer. If no cable length is specified, it
shall be the shortest possible length suitable to the application of the EUT.
The test set-ups for the three types of phenomena described in this standard are:
– voltage dips;
– short interruptions;
– voltage variations with gradual transition between the rated voltage and the changed
voltage (optional).
Examples of test set-ups are given in Annex D.
8 Test procedures
Caution should be exercised during the set-up and execution of these tests. EUT and test
equipment shall not become dangerous or unsafe as a result of the application of the tests
defined in this part of IEC 61000. Precautions should be taken to avoid dangerous and unsafe
situations for personnel, the EUT, and the test equipment.
Before starting the test of a given EUT, a test plan shall be prepared.
The test plan should be representative of the way the system is intended to be used.
Systems may require a precise pre-analysis to define which system configurations must be
tested to reproduce field situations.
61000-4-34 IEC:2005+A1:2009 – 15 –
Test cases must be explained and indicated in the Test report.
It is recommended that the test plan include the following items:
– the type designation of the EUT;
– information on possible connections (plugs, terminals, etc.) and corresponding cables, and
peripherals;
– input power port of equipment to be tested;
– information about the inrush current requirements of the equipment;
– representative operational modes of the EUT for the test;
– performance criteria used and defined in the technical specifications;
– operational mode(s) of equipment;
– description of the test set-up.
If the actual operating signal sources are not available to the EUT, they may be simulated.
For each test, any degradation of performance shall be recorded. The monitoring equipment
should be capable of displaying the status of the operational mode of the EUT during and
after the tests. After each group of tests, a full functional check shall be performed.
8.1 Laboratory reference conditions
8.1.1 Climatic conditions
Unless otherwise specified by the committee responsible for the generic or product standard,
the climatic conditions in the laboratory shall be within any limits specified for the operation of
the EUT and the test equipment by their respective manufacturers.
Tests shall not be performed if the relative humidity is so high as to cause condensation on
the EUT or the test equipment.
NOTE Where it is considered that there is sufficient evidence to demonstrate that the effects of the phenomenon
covered by this standard are influenced by climatic conditions, this should be brought to the attention of the
committee responsible for this standard.
8.1.2 Electromagnetic conditions
The electromagnetic conditions of the laboratory shall be such as to guarantee the correct
operation of the EUT in order not to influence the test results.
8.2 Execution of the test
During the tests, the mains voltage for testing shall be monitored within an accuracy of 2 %.
8.2.1 Voltage dips and short interruptions
The EUT shall be tested for each selected combination of test level and duration with a
sequence of three dips/interruptions with intervals of 10 s minimum (between each test
event). Each representative mode of operation shall be tested.
For voltage dips, changes in supply voltage shall occur at 0° (positive-going zero crossing of
the voltage). Additional angles considered critical may be selected by product committees or
individual product specifications preferably from 45°, 90°, 135°, 180°, 225°, 270° and 315° on
each phase.
– 16 – 61000-4-34 IEC:2005+A1:2009
For short interruptions, the starting angle shall be defined by the product committee as the
worst case. In the absence of definition, it is recommended to use 0° for one of the phases.
For short interruptions test of three-phase systems, all the three phases shall be
simultaneously tested as per 5.1.
For voltage dips test of single-phase systems, the voltage shall be tested as per 5.1. This
implies one series of tests.
For voltage dips test of three-phase systems with neutral, each individual voltage (phase-to-
neutral and phase-to-phase) shall be tested, one at a time, as per 5.1. This implies six
different series of tests. See Figure 3a, Figure 3b and Figure 3c.
For voltage dips test of three-phase systems without neutral, each phase-to-phase voltage
shall be tested, one at a time, as per 5.1. This implies three different series of tests. See
Annex C. See Figure 3b, and Figure 3c.
NOTE 1 For three-phase systems, during a dip on a phase-to-phase voltage, a change will occur on one or two of
the other voltages as well.
NOTE 2 For phase-to-phase testing on three-phase systems, the vectors of Figure 3b represents Acceptable
Method 1, and the vectors of Figure 3c represent Acceptable Method 2. The Acceptable Method 1 vectors shown
in Figure 3b may be easier for test labs to generate. See Annex D, Figure D.1. The Acceptable Method 2 vectors
shown in Figure 3c may be more representative of real-world dips. There may be significant differences between
results when comparing the vectors of Figure 3b to the vectors of Figure 3c.
For EUTs with more than one power cord, each power cord should be tested individually.
61000-4-34 IEC:2005+A1:2009 – 17 –
70 %
70 %
70 %
IEC 1673/05
NOTE Phase-to-neutral testing on three-phase systems is performed one phase at a time.
Figure 3a – Phase-to-neutral testing on three-phase systems
70 %
70 %
70 %
IEC 1674/05
NOTE Phase-to-phase testing on three-phase systems is also performed one phase at a time
Figure 3b – Phase-to-phase testing on three-phase systems –
Acceptable Method 1 phase shift
70 %
70 %
70 %
IEC 1675/05
Figure 3c – Phase-to-phase testing on three-phase systems –
Acceptable Method 2 phase shift
70 % 70 %
70 %
IEC 1676/05
Figure 3d – Not acceptable – phase-to-phase testing without phase shift
Figure 3 – Testing on three-phase systems
– 18 – 61000-4-34 IEC:2005+A1:2009
8.2.2 Voltage variations (optional)
The EUT is tested to each of the specified voltage variations, three times at 10 s intervals for
the most representative modes of operations.
9 Evaluation of test results
The test results shall be classified in terms of the loss of function or degradation of
performance of the equipment under test, relative to a performance level defined by its
manufacturer or the requestor of the test, or agreed between the manufacturer and the
purchaser of the product. The recommended classification is as follows:
a) normal performance within limits specified by the manufacturer, requestor or purchaser;
b) temporary loss of function or degradation of performance which ceases after the
disturbance ceases, and from which the equipment under test recovers its normal
performance,
...
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