Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method

IEC 61726:2022 describes the measurement of screening attenuation by the reverberation chamber measurement method, also called mode stirred chamber method.
This document is applicable to screening attenuation measurements of cable assemblies, cables, connectors, and passive microwave components, such as waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.
This fourth edition cancels and replaces the third edition published in 2015. This edition includes the following significant technical changes with respect to the previous edition:
a. reworded Clause 1 "Scope";
b. replaced IEC TS 62153-4-1 by IEC 62153 (all parts) in Clause 2;
c. added the definition of screening attenuation in 3.1;
d. added Clause 4 "Principle of screening attenuation measurement";
e. added the descriptions of some test set-ups, such as frequency synthesizer, spectrum analyser, stepper motor, linking devices and the sampling system, etc. in Clause 5;
f. added Clause 6 "DUT";
g. reworded Clause 7 "Measurement procedure";
h. added Clause 8 "Caution notes";
i. added Clause 9 "Acceptance criterion";
j. added Clause 10 "Information to be given in the relevant specification".

Cordons, câbles, connecteurs et composants hyperfréquence passifs - Mesurage de l'affaiblissement d'écran par la méthode de la chambre réverbérante

IEC 61726:2022 décrit le mesurage de l'affaiblissement d'écran par la méthode de mesure de la chambre réverbérante, également appelée "méthode de la chambre à brassage de modes".
Le présent document est applicable aux mesurages de l'affaiblissement d’écran des cordons, des câbles, des connecteurs et des composants hyperfréquence passifs, tels que les guides d'ondes, les déphaseurs, les diplexeurs/multiplexeurs, les répartiteurs/combineurs de puissance, etc.
Cette quatrième édition annule et remplace la troisième édition parue en 2015. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a. reformulation de l’Article 1 "Domaine d’application";
b. remplacement de l’IEC TS 62153-4-1 par l’IEC 62153 (toutes les parties) à l’Article 2;
c. ajout de la définition de l’affaiblissement d’écran en 3.1;
d. ajout de l’Article 4 "Principe de mesure de l’affaiblissement d’écran";
e. ajout des descriptions de certains montages d’essai, comme le synthétiseur de fréquences, l’analyseur de spectre, le moteur pas-à-pas, les dispositifs de liaison et le système d’échantillonnage etc. à l’Article 5;
f. ajout de l'Article 6 "DUT";
g. reformulation de l’Article 7 "Procédure de mesure";
h. ajout de l’Article 8 "Notes d’avertissement";
i. ajout de l’Article 9 "Critère d’acceptation";
j. ajout de l’Article 10 "Informations à fournir dans la spécification appropriée".

General Information

Status
Published
Publication Date
17-Jul-2022
Current Stage
PPUB - Publication issued
Completion Date
18-Jul-2022
Ref Project

Buy Standard

Standard
IEC 61726:2022 - Cable assemblies, cables, connectors and passive microwave components - Screening attenuation measurement by the reverberation chamber method
English and French language
38 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 61726
Edition 4.0 2022-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Cable assemblies, cables, connectors and passive microwave components –
Screening attenuation measurement by the reverberation chamber method
Cordons, câbles, connecteurs et composants hyperfréquence passifs –
Mesurage de l'affaiblissement d’écran par la méthode de la chambre
réverbérante
IEC 61726:2022-07(en-fr)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2022 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni

utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et

les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des

questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez

les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Secretariat Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch

The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the

variety of criteria (reference number, text, technical publications previews. With a subscription you will always have

committee, …). It also gives information on projects, replaced access to up to date content tailored to your needs.

and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 300 terminological entries in English
details all new publications released. Available online and once
and French, with equivalent terms in 19 additional languages.
a month by email.
Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc
If you wish to give us your feedback on this publication or need
further assistance, please contact the Customer Service
Centre: sales@iec.ch.
A propos de l'IEC

La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des

Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC

Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la

plus récente, un corrigendum ou amendement peut avoir été publié.

Recherche de publications IEC - Découvrez notre puissant moteur de recherche et consultez

webstore.iec.ch/advsearchform gratuitement tous les aperçus des publications. Avec un

La recherche avancée permet de trouver des publications IEC abonnement, vous aurez toujours accès à un contenu à jour

en utilisant différents critères (numéro de référence, texte, adapté à vos besoins.

comité d’études, …). Elle donne aussi des informations sur les

projets et les publications remplacées ou retirées. Electropedia - www.electropedia.org

Le premier dictionnaire d'électrotechnologie en ligne au monde,
IEC Just Published - webstore.iec.ch/justpublished
avec plus de 22 300 articles terminologiques en anglais et en
Restez informé sur les nouvelles publications IEC. Just
français, ainsi que les termes équivalents dans 19 langues
Published détaille les nouvelles publications parues.
additionnelles. Egalement appelé Vocabulaire
Disponible en ligne et une fois par mois par email.
Electrotechnique International (IEV) en ligne.
Service Clients - webstore.iec.ch/csc
Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
IEC Products & Services Portal - products.iec.ch
---------------------- Page: 2 ----------------------
IEC 61726
Edition 4.0 2022-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Cable assemblies, cables, connectors and passive microwave components –
Screening attenuation measurement by the reverberation chamber method
Cordons, câbles, connecteurs et composants hyperfréquence passifs –
Mesurage de l'affaiblissement d’écran par la méthode de la chambre
réverbérante
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.01 ISBN 978-2-8322-3966-7

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 61726:2022 © IEC 2022
CONTENTS

FOREWORD ........................................................................................................................... 4

1 Scope .............................................................................................................................. 6

2 Normative references ...................................................................................................... 6

3 Terms and definitions ...................................................................................................... 6

4 Principle of screening attenuation measurement .............................................................. 7

5 Measurement equipment ................................................................................................. 9

5.1 General test instruments ......................................................................................... 9

5.1.1 Frequency synthesizer ..................................................................................... 9

5.1.2 Spectrum analyser ........................................................................................... 9

5.1.3 Reverberation chamber ................................................................................... 9

5.1.4 Mode stirrer ................................................................................................... 10

5.1.5 Input antenna ................................................................................................ 10

5.1.6 Reference antenna ........................................................................................ 10

5.1.7 Stepper motor ................................................................................................ 10

5.1.8 Linking devices .............................................................................................. 10

5.1.9 Other instruments .......................................................................................... 11

5.2 Return loss requirements for linking devices ......................................................... 11

5.3 Sampling system ................................................................................................... 11

5.3.1 General ......................................................................................................... 11

5.3.2 Normal sampling system ................................................................................ 11

5.3.3 Fast sampling system .................................................................................... 12

6 DUT ............................................................................................................................... 12

6.1 DUT preparation ................................................................................................... 12

6.1.1 Cables ........................................................................................................... 12

6.1.2 Connector ...................................................................................................... 13

6.1.3 Cable assemblies .......................................................................................... 13

6.1.4 Passive microwave components .................................................................... 13

6.2 Installation of DUT ................................................................................................ 13

7 Measurement procedure ................................................................................................ 13

8 Caution notes ................................................................................................................ 14

8.1 Speed of mode stirrer ........................................................................................... 14

8.2 Measurement of lossy DUT ................................................................................... 14

8.3 Oscillation and resonance ..................................................................................... 14

8.4 Positioning of spectrum analyser .......................................................................... 15

8.5 High power signal test ........................................................................................... 15

8.6 High dynamic range test ....................................................................................... 15

9 Acceptance criterion ...................................................................................................... 15

10 Information to be given in the relevant specification ....................................................... 15

11 Test report ..................................................................................................................... 15

Annex A (informative) Example of a calibrator ....................................................................... 16

A.1 Relationship between transfer impedance and screening attenuation .................... 16

A.2 Example of a calibrator ......................................................................................... 17

Bibliography .......................................................................................................................... 19

---------------------- Page: 4 ----------------------
IEC 61726:2022 © IEC 2022 – 3 –

Figure 1 – System configuration example of screening attenuation by reverberation

chamber ................................................................................................................................. 7

Figure 2 – System configuration example of screening attenuation by reverberation

chamber with only one spectrum analyser ............................................................................... 9

Figure A.1 – Basic construction details ................................................................................. 17

Table 1 – Recommended antennas ....................................................................................... 10

Table 2 – Number of sampling positions recommended for calibration and test ..................... 12

---------------------- Page: 5 ----------------------
– 4 – IEC 61726:2022 © IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS – SCREENING ATTENUATION
MEASUREMENT BY THE REVERBERATION CHAMBER METHOD
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international

co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and

in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their

preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with

may participate in this preparatory work. International, governmental and non-governmental organizations liaising

with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for

Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence between

any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent

rights. IEC shall not be held responsible for identifying any or all such patent rights.

IEC 61726 has been prepared by IEC technical committee 46: Cables, wires, waveguides, RF

connectors, RF and microwave passive components and accessories. It is an International

Standard.

This fourth edition cancels and replaces the third edition published in 2015. This edition

constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) reworded Clause 1 "Scope";
b) replaced IEC TS 62153-4-1 by IEC 62153 (all parts) in Clause 2;
c) added the definition of screening attenuation in 3.1;
d) added Clause 4 "Principle of screening attenuation measurement";

e) added the descriptions of some test set-ups, such as frequency synthesizer, spectrum

analyser, stepper motor, linking devices and the sampling system, etc. in Clause 5;

f) added Clause 6 "DUT";
---------------------- Page: 6 ----------------------
IEC 61726:2022 © IEC 2022 – 5 –
g) reworded Clause 7 "Measurement procedure";
h) added Clause 8 "Caution notes";
i) added Clause 9 "Acceptance criterion";
j) added Clause 10 "Information to be given in the relevant specification".
The text of this International Standard is based on the following documents:
Draft Report on voting
46/847/CDV 46/877/RVC

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.
The language used for the development of this International Standard is English.

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available

at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are

described in greater detail at www.iec.ch/publications.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under webstore.iec.ch in the data related to the

specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it

contains colours which are considered to be useful for the correct understanding of its

contents. Users should therefore print this document using a colour printer.
---------------------- Page: 7 ----------------------
– 6 – IEC 61726:2022 © IEC 2022
CABLE ASSEMBLIES, CABLES, CONNECTORS AND PASSIVE
MICROWAVE COMPONENTS – SCREENING ATTENUATION
MEASUREMENT BY THE REVERBERATION CHAMBER METHOD
1 Scope

This document describes the measurement of screening attenuation by the reverberation

chamber measurement method, also called mode stirred chamber method.

This document is applicable to screening attenuation measurements of cable assemblies,

cables, connectors, and passive microwave components, such as waveguides, phase shifters,

diplexers/multiplexers, power dividers/combiners, etc.
Modern electronic equipment has shown a demand for methods for testing screening

attenuation performance of microwave components over their whole frequency range.

Convenient measurement methods have existed for lower frequencies and components of

regular shape. These measurement methods are described in the IEC 62153 series. For much

higher frequencies and for components of irregular shape, the reverberation chamber method

can be used. Theoretically, the reverberation chamber method has no upper limit of the

measurement frequency, but it is limited by the quality and sensitivity of the measurement

system, and the lower limit of the measurement frequency is restricted by the size of the

reverberation chamber.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies.

For undated references, the latest edition of the referenced document (including any

amendments) applies.

IEC 61000-4-21:2011, Electromagnetic compatibility (EMC) – Part 4-21: Testing and

measurement techniques – Reverberation chamber test methods

IEC 61196-1, Coaxial communication cables – Part 1: Generic specification – General,

definitions and requirements
IEC 62153 (all parts), Metallic communication cable test methods
3 Terms and definitions

For the purposes of this document, the terms and definitions given in IEC 61196-1,

IEC 61000-4-21 and the following apply.

ISO and IEC maintain terminology databases for use in standardization at the following

addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
---------------------- Page: 8 ----------------------
IEC 61726:2022 © IEC 2022 – 7 –
3.1
screening attenuation

ratio of the electromagnetic field power coupled to the reference antenna to the electromagnetic

field power coupled to the device under test (DUT), expressed by a in Formula (1):

REF
a = 10 log
(1)
s 10
DUT
where
a is the screening attenuation of DUT, in dB;
P is the power coupled to the reference antenna, in W;
REF
P is the power coupled to the DUT, in W.
DUT
4 Principle of screening attenuation measurement

The reverberation chamber is an electrically large screening cavity with high quality factor,

which is equipped with mode stirrer(s), input antenna and reference antenna. A system

configuration example of screening attenuation measurement by reverberation chamber method

is shown in Figure 1.
Figure 1 – System configuration example of screening
attenuation by reverberation chamber

The electromagnetic wave power P emitted by the frequency synthesizer is transmitted to the

INJ

reverberation chamber through the input antenna in the cavity. The electromagnetic wave will

excite the multi-mode electromagnetic field in the reverberation chamber. The boundary

conditions of these electromagnetic fields change with the rotation and stirring of the mode

stirrer, and the electromagnetic field distribution in the cavity is nearly uniform, isotropic and

randomly polarized in the sense of statistical average. When the DUT is placed in the

reverberation chamber, the approximately uniformly distributed electromagnetic power P in

REF

the reverberation chamber received by the reference antenna is equivalent to the external input

power of the DUT, and the electromagnetic power P coupled into the DUT can be obtained

DUT
by the spectrum analyser outside the reverberation chamber.
---------------------- Page: 9 ----------------------
– 8 – IEC 61726:2022 © IEC 2022

According to the definition Formula (1), the screening attenuation of DUT can be calculated

from Formula (2):
REF
a = 10 log
s 10
DUT
 P  P 
INJ REF
10 log ×
  
 DUT INJ
(2)
P  P 
INJ INJ
10 log −10log
  
10 10
DUT  REF
P
INJ
10 log − Δ
10 ins
DUT
where
a is the screening attenuation of DUT, in dB;
P is the power coupled to the reference antenna, in W;
REF
P is the power coupled to the DUT, in W;
DUT
P is the power injected into the chamber, in W;
INJ
Δ is the insertion loss of the chamber, in decibels (dB).
ins

In Formula (2), the first term represents the total screening attenuation of the system which

can be obtained by measuring the power of DUT connected with a load by spectrum analyser

1. The second term represents the insertion loss of the reverberation chamber which can be

obtained by measuring the power of the reference antenna by spectrum analyser 2.

Measurements of the total screening attenuation and the insertion loss can be carried out

simultaneously.

When only one spectrum analyser is configured, the DUT and reference antenna can be

connected to the spectrum analyser separately by using a switch, and the total screening

attenuation of the system and the insertion loss of the reverberation chamber can be measured

separately (also known as time-division measurement), as shown in Figure 2.
---------------------- Page: 10 ----------------------
IEC 61726:2022 © IEC 2022 – 9 –
Figure 2 – System configuration example of screening attenuation
by reverberation chamber with only one spectrum analyser
5 Measurement equipment
5.1 General test instruments
5.1.1 Frequency synthesizer

Frequency synthesizer or other frequency source shall be used, and its output power, frequency

range and transmission bandwidth shall meet the measurement requirements. In order to

ensure the repeatability of measurement, the frequency stability of frequency synthesizer or

other frequency source should be better than 10 .
5.1.2 Spectrum analyser

The frequency range, resolution bandwidth and sensitivity of the spectrum analyser should meet

the measurement requirements. Other equipment that offers the same function, such as EMI

test receiver, can also be used.
5.1.3 Reverberation chamber
The reverberation chamber shall comply with IEC 61000-4-21.

In general, the reverberation chamber is a shielded enclosure having any shape; however, a

perfect cubic shape should be avoided for optimum performance at lower frequencies. It shall

be made of conductive materials (copper, aluminium or steel) and shall not contain lossy

materials.

The upper frequency limit depends on the quality of the shielded enclosure and cables.

Furthermore, the sensitivity of the used measurement instruments also limits the maximum

frequency. There is no upper limit theoretically for the measurement frequency of the

reverberation chamber when its quality is disregarded.

In general, the reverberation chamber is required to work with sufficient modes, and the working

frequency should be greater than the cavity mode frequency as calculated from Formula (3):

---------------------- Page: 11 ----------------------
– 10 – IEC 61726:2022 © IEC 2022
2 22
 mn  p
(3)
ff>= ++
mnp    
2 l wh
   

where l, w and h are the length, width and height of reverberation chamber respectively, m, n

and p are integers, and the value range is up to the number of modes of reverberation chamber.

It can be drawn from Formula (3) that the lowest usable frequency (LUF) of the reverberation

chamber is limited by the size of the reverberation chamber. The larger the volume is, the lower

LUF is; and the number of modes of the reverberation chamber is directly proportional to the

measurement frequency and the size of the reverberation chamber. Increasing the size of the

reverberation chamber and raising the test frequency can both expand the number of modes of

the reverberation chamber. Therefore, the size of reverberation chamber should be large

enough to meet the requirements for mode frequency and mode number when measuring at

lower frequencies.

For more detailed requirements and instructions for reverberation chambers, reference to

IEC 61000-4-21.
5.1.4 Mode stirrer

The mode stirrer shall be large with respect to wavelength and be at an angle to the walls of

the chamber. The mode stirrer shall be at least two wavelengths at the lowest measurement

frequency from tip to tip. When needed, more than one mode stirrer can be provided.

5.1.5 Input antenna

The input antenna shall be a broadband antenna capable of covering the operating frequency

range, and its transmitting direction shall be towards the corner of the reverberation chamber

or the mode stirrer to avoid direct exposure to the reference antenna. The antenna should

exhibit limited resonances in the frequency range and not introduce losses.
The recommended antennas for different frequency bands are given in Table 1.
Table 1 – Recommended antennas
Frequency range Antenna type
≤1 GHz Dipole antenna
≥1 GHz Horn antenna
5.1.6 Reference antenna

The reference antenna shall be of the same type as the input antenna, and its polarization

direction shall be orthogonal to that of the input antenna.
5.1.7 Stepper motor

The stepper motor should be driven with enough torque to control the angle and speed.

5.1.8 Linking devices

Low loss semi-rigid coaxial cables with good screening attenuation shall be used as the test

cables to connect the spectrum analyser to the DUT. To avoid resonances, the DUT is inserted

into a test cable loop having a length of more than four wavelengths at minimum frequency.

The cable connecting the spectrum analyser to the reference antenna should be consistent with

---------------------- Page: 12 ----------------------
IEC 61726:2022 © IEC 2022 – 11 –

the length and quality of the test cable connecting the spectrum analyser to the DUT. It is

required that the test cables, related connectors, adapters, loads, etc. having a screening

attenuation at least 10 dB better than the DUT, so as to ensure that the measured leakage is

caused by DUT.
5.1.9 Other instruments

In order to improve the performance of the measurement system, the power meter, directional

coupler, power amplifier and other control equipment can be used. These instruments should

meet the measurement requirements.
5.2 Return loss requirements for linking devices

The individual components of the measurement system should be of good quality, with an input

and output return loss of 15 dB or better. This applies especially to all components, cables and

instrumentation in the signal paths between the reference antenna and the spectrum analyser,

as well as between the DUT and the spectrum analyser, they shall meet this requirement.

This requirement can be difficult to achieve for some DUTs. In this case, a graph of return loss

against frequency shall be included in the documentation.
5.3 Sampling system
5.3.1 General

The sampling system shall acquire the power values of the signals from the reference antenna

and the DUT on one revolution of the mode stirrer. The receiver can be connected with

...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.