IEC 61987-41:2025

Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 41: Lists of properties (LOPs) of process analysers for electronic data exchange - Generic structures

IEC 61987-41: 2025 provides:
• a characterization for the integration of process analysers in the Common Data Dictionary (CDD),
• generic structures for operating lists of properties (OLOP) and device lists of properties (DLOP) of measuring equipment in conformance with IEC 61987-10,
• generic structures for Dynamic Data, e.g. for condition monitoring of process analysers.
The generic structures for the OLOP and DLOP contain the most important blocks for process analysers. Blocks pertaining to a specific equipment type will be described in the corresponding part of the IEC 61987 standard series. Similarly, equipment properties are not part of this document. Thus, OLOP, DLOPs and LOPDs for selected process analysers families will be found in the IEC CDD.

Mesure et commande dans les processus industriels – Eléments et structures de données dans les catalogues d'équipements de processus – Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour l'échange électronique de données – Structures génériques

IEC 61987-41: 2025 fournit:
• une caractérisation pour l'intégration des analyseurs de processus dans le Dictionnaire de données communes (CDD),
• des structures génériques pour les listes de propriétés fonctionnelles (OLOP) et les listes de propriétés d'appareil (DLOP) des équipements de mesure conformes à l'IEC 61987-10,
• des structures génériques pour les données dynamiques, par exemple, pour la surveillance des conditions des analyseurs de processus.
Les structures génériques pour l'OLOP et la DLOP contiennent les blocs les plus importants pour les analyseurs de processus. Les blocs concernant un type d'équipement spécifique sont décrits dans la partie correspondante de la série de normes IEC 61987. De même, les propriétés des équipements ne sont pas traitées dans le présent document. Ainsi, les OLOP, DLOP et LOPD pour des familles choisies d'analyseurs de processus se trouveront dans l’IEC CDD.

General Information

• Status: Published
• Publication Date: 16-Apr-2025
• ICS: 01.140.30 - Documents in administration, commerce and industry
• Technical Committee: SC 65E - Devices and integration in enterprise systems
• Drafting Committee: WG 2 - TC 65/SC 65E/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 17-Apr-2025
• Completion Date: 19-May-2025

Standards Content (Sample)

IEC 61987-41 ®
Edition 1.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Industrial-process measurement and control – Data structures and elements in
process equipment catalogues –
Part 41: Lists of properties (LOPs) of process analysers for electronic data
exchange – Generic structures
Mesure et commande dans les processus industriels – Eléments et structures de
données dans les catalogues d'équipements de processus –
Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour
l'échange électronique de données – Structures génériques
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IEC 61987-41 ®
Edition 1.0 2025-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Industrial-process measurement and control – Data structures and elements in

process equipment catalogues –

Part 41: Lists of properties (LOPs) of process analysers for electronic data

exchange – Generic structures
Mesure et commande dans les processus industriels – Eléments et structures

de données dans les catalogues d'équipements de processus –

Partie 41: Listes des propriétés (LOP) des analyseurs de processus pour

l'échange électronique de données – Structures génériques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 01.140.30  ISBN 978-2-8327-0369-4

– 2 – IEC 61987-41:2025 © IEC 2025
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 9
4.1 Characterization scheme . 9
4.2 OLOP, DLOP and LOPD . 10
4.3 Cardinality and polymorphism . 10
5 Operating list of properties (OLOP). 11
5.1 Generic block structure . 11
5.2 Matrix of components/measurands . 11
5.2.1 General. 11
5.2.2 Chemical component/measurand . 11
5.2.3 Process analyser measurands . 12
5.3 Measuring or control point . 12
5.4 Base conditions . 12
5.5 Physical properties at sampling point . 12
5.6 Operating conditions for device design. 12
5.7 Process equipment . 12
5.8 Physical location . 12
5.8.1 General. 12
5.8.2 Available power supply . 12
5.8.3 Auxiliary media . 13
5.8.4 Process criticality classification . 13
5.8.5 Area classification . 13
6 Device list of properties (DLOP) . 13
6.1 Basic structure . 13
6.2 Generic block structure . 13
6.3 Relationship to IEC 61987-1 . 15
7 LOPD with dynamic properties for condition monitoring . 15
7.1 General . 15
7.2 Measurement variables . 16
7.3 General device variables/status . 16
7.4 Specific device variables/status/condition monitoring. 16
7.5 General device parameters and variables . 16
7.6 General functions . 16
8 Additional aspects . 16
Annex A (informative) Device type dictionary – Classification of process analysers . 17
Bibliography . 22

Figure 1 – Characterization of process analysers . 9
Figure 2 – Assignment of OLOP, LOPD and DLOPs for process analysers . 10

Table 1 – Generic block structure of an OLOP for process analysers . 11

Table 2 – Generic block structure of a DLOP . 14
Table 3 – Generic block structure of an LOPD for a process analyser . 15
Table A.1 – Classification scheme for process analysers . 17

– 4 – IEC 61987-41:2025 © IEC 2025
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL –
DATA STRUCTURES AND ELEMENTS IN PROCESS
EQUIPMENT CATALOGUES –
Part 41: Lists of properties (LOPs) of process analysers
for electronic data exchange – Generic structures

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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shall not be held responsible for identifying any or all such patent rights.
IEC 61987-41 has been prepared by subcommittee 65E: Devices and integration in enterprise
systems, of IEC technical committee 65: Industrial-process measurement, control and
automation. It is an International Standard.

The text of this International Standard is based on the following documents:
Draft Report on voting
65E/1067/CDV 65E/1091/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 61987 series, published under the general title Industrial-process
measurement and control – Data structures and elements in process equipment catalogues,
can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
– 6 – IEC 61987-41:2025 © IEC 2025
INTRODUCTION
The exchange of product data between companies, business systems, engineering tools, data
systems within companies and, in the future, control systems (electrical, measuring and control
technology) can run smoothly only when both the information to be exchanged and the use of
this information has been clearly defined.
Prior to this document, requirements on process control devices and systems were specified by
customers in various ways when suppliers or manufacturers were asked to quote for suitable
equipment. The suppliers in their turn described the devices according to their own
documentation schemes, often using different terms, structures and media (paper, databases,
CDs, e-catalogues, etc.). The situation was similar in the planning and development process,
with device information frequently being duplicated in a number of different information
technology (IT) systems.
Any method that is capable of recording all existing information only once during the planning
and ordering process and making it available for further processing, gives all parties involved
an opportunity to concentrate on the essentials. A precondition for this is the standardization of
both the descriptions of the objects and the exchange of information.
The IEC 61987 series proposes a method for standardization which will help both suppliers and
users of process control equipment to optimize workflows both within their own companies and
in their exchanges with other companies. Depending on their role in the process, engineering
firms can be considered here to be either users or suppliers.
The method specifies process control equipment by means of blocks of properties. These blocks
are compiled into lists of properties (LOPs), each of which describes a specific equipment
(device) type. The IEC 61987 series covers both properties that can be used in an inquiry or a
proposal and detailed properties required for integration of the equipment in computer systems
for other tasks.
IEC 61987-10 defines structure elements for constructing lists of properties for electrical and
process control equipment in order to facilitate automatic data exchange between any two
computer systems in any possible workflow, for example, engineering, maintenance or
purchasing workflow and to allow both the customers and the suppliers of the equipment to
optimize their processes and workflows. IEC 61987-10 also provides the data model for
assembling the LOPs.
IEC 61987-11 while specifying a generic structure for measuring equipment provides several
important detail descriptions, such as the handling of composite devices, that are also required
for LOPs describing process analysers.
This document specifies the generic structure for operating and device lists of properties
(OLOPs and DLOPs) for process analysers. Process analysers are installed directly in the
plants of the process industry and in control rooms specially set up for PAT (analyser houses
or analyser shelters). This document provides also generic structures for List of Properties for
Dynamic Data (LOPD) for process analysers. This LOPD can be used, for example, for the
description of dynamic data for condition monitoring.
NOTE Depending upon industry sector, process analysers are also known as Process Analyser Technology (PAT)
devices.
The entire IEC 61987 series provides the semantic of data needed for the area of the Industrial
Internet of Things (IIOT) and Smart Manufacturing. This document lays down the framework for
further parts of the IEC 61987series in which complete LOPs for process analysers of different
construction and functional principle that will be published in the IEC Common Data Dictionary
(IEC CDD).
Annex A contains a characterisation of process analysers. This is a tree of relationships
between different device types. Starting at the root "equipment for industrial-process
automation", it lists various types of process analyser. This characterisation is used in the
"Process automation" Domain of the IEC Common Data Dictionary (CDD).

– 8 – IEC 61987-41:2025 © IEC 2025
INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL –
DATA STRUCTURES AND ELEMENTS IN PROCESS
EQUIPMENT CATALOGUES –
Part 41: Lists of properties (LOPs) of process analysers
for electronic data exchange – Generic structures

1 Scope
This part of IEC 61987 provides
• a characterization for the integration of process analysers in the Common Data Dictionary
(CDD),
• generic structures for operating lists of properties (OLOP) and device lists of properties
(DLOP) of measuring equipment in conformance with IEC 61987-10,
• generic structures for Dynamic Data, e.g. for condition monitoring of process analysers.
The generic structures for the OLOP and DLOP contain the most important blocks for process
analysers. Blocks pertaining to a specific equipment type will be described in the corresponding
part of the IEC 61987 standard series. Similarly, equipment properties are not part of this
document. Thus, OLOP, DLOPs and LOPDs for selected process analysers families will be
found in the IEC CDD.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61987-1:2024, Industrial-process measurement and control – Data structures and elements
in process equipment catalogues – Part 1: Generic structures for measuring equipment
IEC 61987-10, Industrial-process measurement and control – Data structures and elements in
process equipment catalogues – Part 10: List of Properties (LOPs) for Industrial-Process
Measurement and Control for Electronic Data Exchange – Fundamentals
IEC 61987-11:2016, Industrial-process measurement and control – Data structures and
elements in process equipment catalogues – Part 11: List of properties (LOPs) of measuring
equipment for electronic data exchange – Generic structures
3 Terms and definitions
For the purposes of this document, the terms and definitions in IEC 61987-10 and IEC 61987-11
apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp

3.1
dynamic property
property, the value of which can change over time.
3.2
list of properties for dynamic data
LOPD
LOP that contains the dynamic properties (dynamic data) of one or more device types
Note 1 to entry: The LOPD is an aspect of a device.
4 General
4.1 Characterization scheme
IEC 61987-1 describes a general classification scheme for industrial process measuring
equipment based on measured variables based on ISO 3511-1. Under this scheme, process
analysers fall under the category Q (quality) but they are also used for the measurement of
moisture and humidity (M) as well as viscosity (V). The introduction of the LOPs of any area of
technology into the IEC Common Data Dictionary (CDD) requires the creation of a
characterization scheme for the device types of this technology area.
The area of technology considered in this document concerns process analysers. The
characterisation of the area for the CDD is provided in Table A.1 of Annex A.
The enhanced characterization scheme is used for the IEC Common Data Dictionary (CDD).
The area of process analysers belongs to the domain of "Process automation" in the CDD.
The area of process analysers is divided into a range of sub-areas. The names of the sub-areas
are shown in Figure 1.
Figure 1 – Characterization of process analysers

– 10 – IEC 61987-41:2025 © IEC 2025
4.2 OLOP, DLOP and LOPD
An operating list of properties (OLOP) describes an aspect relating to a device type, for
example, the operational environment of the device, the device design requirements as well as
all the boundary conditions applicable to the point of operation. The structure element "aspect"
is described in IEC 61987-11.
The device list of properties (DLOP) is used to describe a given device type, for example an
optical absorption photometer, a chromatograph or a viscometer. The DLOP describes, for
example, the mechanical construction and the electrical construction of a device. Each DLOP
concerns a particular device type.
The list of properties for dynamic data (LOPD) is used to describe dynamic parameters from
various process analysers that are used, for example, in condition monitoring.
Figure 2 shows the relationship between the OLOP and LOPD and the DLOPs for process
analysers. The OLOP and LOPD are valid for the generic DLOP as well as for the DLOPs for
the various device types, for example optical spectrometer, electrochemical sensors, etc.

Figure 2 – Assignment of OLOP, LOPD and DLOPs for process analysers
At higher levels of their construction, OLOPs, LOPDs and DLOPs contain blocks of properties
that are common to all process variables or device types respectively. This document specifies
these generic block structures.
Further parts of the IEC 61987 series specify the block structures and properties of OLOP,
LOPD and DLOPs for process analysers.
4.3 Cardinality and polymorphism
The principles and the description of the cardinality and polymorphic areas applied in this
document are described in IEC 61987-10 and IEC 61987-11. These structural elements
introduce a high degree of flexibility in the description of a device and its surroundings, provided
the block structure in the LOP is used. They can be briefly described as follows:
• cardinality allows an LOP element, for example a property block describing a particular
feature of a device, to be repeated as many times as necessary;
• polymorphism allows the introduction of a complete property block from a selection of
property blocks at a particular structure level of an LOP.
In the case of process analysers, the cardinality can be used for replication of the "Input" block.
For example, an input-module can have two or more different types of input signals.

5 Operating list of properties (OLOP)
5.1 Generic block structure
An operating list of properties is a list of properties describing the aspect concerning the
operational conditions of the device and additional information regarding the design conditions
under which it will be applied. An OLOP contains no information about the device itself: this is
to be found in the DLOP.
The role of an OLOP is similar to that of an engineering datasheet, in which data describing the
installation environment where the device is to operate are collected. This includes information
on the ambient conditions, the design safety conditions, etc. All of these data are described
with an OLOP.
Due to the nature of process analysers, a single OLOP can be used for more than one process
analyser family. The generic block structure of this OLOP shall correspond to that shown in
Table 1.
Table 1 – Generic block structure of an OLOP for process analysers
Operating list of properties
Matrix of components/measurands

Chemical component/measurand [c]
P r oc  es  s  anal   y s er   m eas   ur  ands
Measuring or control point
Base conditions
Physical properties at sampling point
Operating conditions for device design
Process equipment
Physical location
Available power supply
Auxiliary media
Process criticality classification
Area classification
[c] According to IEC 61987-10, the block can be repeated as many times as needed using cardinality, which
means that a cardinality property with the name "number of " directly precedes the block

Details of the individual blocks are to be found in 5.2 to 5.8 which follow.
5.2 Matrix of components/measurands
5.2.1 General
The block matrix of components/measurands shall contain information on all substances and
measurands.
5.2.2 Chemical component/measurand
The block chemical component/measurand shall contain information on the composition of the
sample to be measured.
– 12 – IEC 61987-41:2025 © IEC 2025
5.2.3 Process analyser measurands
The block process analyser measurands shall contain information on the quantities to be
measured as well as information on the measurand ranges.
5.3 Measuring or control point
The block measuring or control point shall contain information on the process control
engineering request, for example tag name.
5.4 Base conditions
The block base conditions shall contain the properties of the reference variables that are to be
used throughout the document. Such variables give the reference state or reference conditions
to which calculated variables such as normalized flow rate are calculated.
For example the conditions of pressure and temperature to be used to calculate density would
be entered in the properties "absolute base pressure" and "base temperature".
NOTE Base conditions are often standardized for particular industries or applications.
5.5 Physical properties at sampling point
The block physical properties at sampling point shall contain information on the physical
properties of process media at the point of sampling.
5.6 Operating conditions for device design
The block operating conditions for device design shall contain properties describing the nominal
environmental and process conditions to be found at the process analyser installation point.
5.7 Process equipment
The block process equipment shall contain properties that describe the process equipment at
the point where measurand is taken from and return to the process.
5.8 Physical location
5.8.1 General
The block physical location shall contain properties that describe conditions other than those of
the environment and process that are in force at the instrument location. The block contains the
following sub-blocks:
• available power supply;
• purge gas supply;
• process criticality classification;
• area classification.
The cardinality property "number of physical locations" allows all the locations to be described,
where parts of the process analyser are to be deployed.
5.8.2 Available power supply
The block available power supply shall contain properties that describe the available power
supply. It can contain electrical line power supply.

5.8.3 Auxiliary media
The block auxiliary media shall contain properties that describe the media that the process
analyser requires for operation.
5.8.4 Process criticality classification
The block process criticality classification shall contain properties that describe the criticality
classification for the means of assuring plant safety, for example, the safety integrity level.
5.8.5 Area classification
The block area classification shall contain properties that describe the equipment internal, local
and remote area, including the wiring concept.
The cardinality property "number of area classifications" allows more locations to be described.
The property "type of area classification" describes the location. The block Physical location
shall contain properties that describe conditions that are in force at the instrument location.
6 Device list of properties (DLOP)
6.1 Basic structure
As there are large similarities between measuring instruments and process analysers, the first
level structure of the generic Device list of properties (DLOP) for process analysers closely
adheres to the structure defined in IEC 61987-1. The differences are explained in 6.3.
NOTE Currently, there are no business processes requiring the use of device-type specific DLOPs for process
analysers. Thus, only a generic DLOP for process analysers will be provided in the CDD. If the situation
changes, device-type specific DLOPs will be provided where necessary and the generic DLOP for process analysers
will be withdrawn as appropriate. The classes and properties of the generic DLOP will be kept, as far as this is
possible.
6.2 Generic block structure
As process analysers are similar to measuring instruments, the generic structure of the DLOP
from IEC 61987-11, which concerns measuring equipment, can be taken over completely for
process analysers. Table 2 shows the generic block structure of the device list of properties
(DLOP) for process analysers as derived from Table 4 of IEC 61987-11:2016. The description
of the blocks of Table 2 is to be found in IEC 61987-11:2016. For process analysers, the
property ABB014 "application description" can be used to describe a specific application for
which the device has been designed, e.g. oil in water.
Should a device not offer a particular function, e. g. digital communication, the corresponding
block is not filled out or used in the DLOP structure.
Each block comprises a generic set of properties and where appropriate additional sub-blocks.
Sub-blocks can be generic for a family of similar devices or particular to a device type. The
sub-blocks can also contain other blocks.

– 14 – IEC 61987-41:2025 © IEC 2025
Table 2 – Generic block structure of a DLOP
Device list of properties
Identification
Application
Function and system design
Dependability [c]
Input
Measured variable [c] [p]
Auxiliary input [c] [p]
Output [c] [p]
output
Digital communication
Digital communication interface [c]
Performance
Rated operating conditions
Installation conditions
Environmental design ratings
Process design ratings
Pressure-temperature design ratings
Mechanical and electrical construction
Overall dimensions and weight
Structural design
Explosion protection design approval [c]
Codes and standards approval
Operability
Basic configuration
Parametrization
Adjustment
Operation
Diagnosis
Power supply
Certificates and approvals
Component part identifications
[c] The block can be repeated as many times as needed using cardinality, which means that a cardinality
property with the name "number of " directly precedes the block (see IEC 61987-10).
[p] The block contains a polymorphic area, which consists of a control property for polymorphism with a value
list and of as many polymorphic (alternative) sub-blocks as there are values in the value list (see IEC 61987-
10). The alternative sub-blocks are the ones directly below the marked block and belonging only to the next
structure level. For clarity, the table contains only block levels of technical relevance. Additional structural
elements for creating polymorphic areas are not shown in the structure (see for example IEC 61987-12).

Source: Table 4 of IEC 61987-11:2016.

6.3 Relationship to IEC 61987-1
For the generation of the DLOPs, the structure of a DLOP for measuring equipment in
IEC 61987-1 shall be taken into account with the following amendments:
a) IEC 61987-1:2024, 5.8 "Operating conditions" has been renamed "Rated operating
conditions" to distinguish it from its counterpart in the OLOP of "Operating Conditions for
Device Design".
b) IEC 61987-1:2024, 5.14 "Documentation" has been placed as a separate aspect.
The DLOP or aspects of it contains other elements not included in IEC 61987-1 which are used
to describe any tests carried out by the manufacturer, the device components, accessories and
documentation delivered with the device.
7 LOPD with dynamic properties for condition monitoring
7.1 General
Process analysers play a very important role in the process industry. They are very often used
to supervise the quality of the product or the safety of the plant. For this reason, their correct
functioning should also be guaranteed and therefore monitored.
Condition monitoring (CM) tracks the values of a range of physical variables associated with
the health of the process analysers operating in a plant. Dynamic properties can be assigned
to each of these physical variables. Such dynamic properties can be for example "Signal fit
quality", "Laser temperature" or "Fuel gas pressure". These properties are called dynamic data
or dynamic properties: their values are not fixed or changed by a user but vary over time.
The dynamic properties are defined in the same way as properties according to IEC 61360-1
by "name", "code", "definition", "unit of measure", etc. The dynamic properties are regarded and
stored in the same way as properties in the IEC CDD.
The dynamic properties for a device type are collected in an Aspect LOP, in the LOP for
Dynamic Data (LOPD). An LOPD can be created for each device type.
The characteristic feature of the condition monitoring properties is that each device type can
have a different list of the CM properties. Even device types from the same device family can
have different lists of these properties. Therefore, similar to the DLOP and OLOP, a separate
LOPD will be created for each device type.
The generic block structure of an LOPD shall correspond to that shown in Table 3. Details of
the individual blocks are to be found in 7.2 to 7.6 which follow.
Table 3 – Generic block structure of an LOPD for a process analyser
List of properties for dynamic data (LOPD)
Measurement variables
General device variables/status
Specific device variables/status/condition monitoring
General device parameters and variables
General functions
___________
IEC 61987-1:2006 has been replaced by a new edition that aligns it to the structure in IEC 61987-11:2016.

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7.2 Measurement variables
The block measurement variables shall contain dynamic data characterizing data which are the
result of a measurement.
7.3 General device variables/status
The block general device variables/status shall contain characterizing information issued by a
device.
NOTE These properties can be related to several device types.
7.4 Specific device variables/status/condition monitoring
The block specific device variables/status/condition monitoring shall contain dynamic properties
specific to the measuring method.
7.5 General device parameters and variables
The block general device parameters shall contain dynamic data characterizing non-specific
parameters of a device.
NOTE These properties can be related to several device types.
7.6 General functions
The block general functions shall contain dynamic data characterizing general functions of the
device.
8 Additional aspects
The same approach as described in IEC 61987-11 is valid also for LOPs for process analysers.
The Aspect LOPs are listed and described in IEC 61987-92. They can be accessed
electronically in the CDD.
Annex A
(informative)
Device type dictionary –
Classification of process analysers
NOTE The working version of the classification can be found in the IEC Common Data Dictionary at
https://cdd.iec.ch/cdd/iec61987/cdddev.nsf/. As each part of IEC 61987 becomes an international standard the
normative version will be found in the IEC Common Data Dictionary at https://cdd.iec.ch/cdd/iec61360/iec61360.nsf
Table A.1 shows the classification scheme equipment for industrial-process automation which
forms the basis of this document. Each device type has been assigned an identifier, which is
the code of an object in the IEC Common Data Dictionary (CDD). Additionally, the column "LOP"
in Table A.1 indicates the device types and LOPs which will be available in further parts of the
IEC 61987 series.
Table A.1 – Classification scheme for process analysers
Classification Definition Identifier LOP
Equipment for industrial-process automation equipment that supports partial or fully IEC-ABA000
automated operation of industrial
processes
Process Analyser automation equipment that enables IEC-ABP397
measurement of key quality and
performance indicators in process
materials and outputs a standard signal
Calorimeter process analyser that uses the heat IEC-ABP398
developed during a mechanical,
electrical or chemical reaction to
measure heat capacity
Chemiluminescence detector process analyser that uses the emission IEC-ABP756
of light from excited molecules, ions, or
atoms formed in a chemical reaction to
measure the concentration of a
component in a liquid or gas
Chromatograph process analyser that takes a known IEC-ABP399
amount of a sample mixture, separates
all chemical components and detects the
individual components based on their
a
retention time and concentration
Gas chromatograph chromatograph that takes a gaseous IEC-ABP400
sample or liquid samples that can be
vaporized and separates the components
in a gaseous phase
Liquid chromatograph chromatograph that uses the separation IEC-ABP401
with different columns to measure the
concentration of specific components in
liquid phase
Combustion analyser process analyser that burns a sample
IEC-ABP402
gas or liquid under reference conditions
to determine the concentration of the
known analyte
Flame temperature analyser combustion analyser that uses the IEC-ABP403
change in temperature of a reference
flame due to the combustion of an
analyte to determine its concentration
Calorific value analyser combustion analyser that uses heat IEC-ABP404
generated by the combustion of an
analyte to determine its concentration
Conductivity meter process analyser that measures the IEC-ABP405 x
conductivity to determine the
concentration of electrolytes in liquids

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Classification Definition Identifier LOP
Electrochemical analyser process analyser that uses the IEC-ABP406
electrochemical characteristics of the
analyte to measure the concentration of
a specific component in a gas or liquid
sample
Amperometric sensor electrochemical analyser that uses an IEC-ABP407
amperometric sensing element to
measure a specific component in a
b
sample
Polarographic sensor electrochemical analyser that uses a IEC-ABP408
polarographic principle to measure the
concentration of specific component in a
sample
Zirconium dioxide analyser e
...