Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-53: Examinations and measurements - Encircled angular flux (EAF) measurement method based on two-dimensional far field data from multimode waveguide (including fibre)

IEC 61300-3-53:2020 is available as IEC 61300-3-53:2020 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61300-3-53:2020 defines the encircled angular flux measurement of multimode waveguide light sources, in which most of the transverse modes are excited. The term "waveguide" is understood to include both channel waveguides and optical fibres but not slab waveguides. The applicable fibre types are the followings:
- A1 specified in IEC 60793-2-10;
- A3 specified in IEC 60793-2-30;
- A4 specified in IEC 60793-2-40.
This second edition cancels and replaces the first edition in 2015. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- the scope of the applicable wave guides, and graded index multimode optical wave guide and fibre have been included;
- the structure of 5.3 has been rearranged;
- Annex C and Annex D have been added.

Dispositifs d’interconnexion et composants passifs fibroniques - Procédures fondamentales d'essais et de mesures - Partie 3-53 : Examens et mesures - Méthode de mesure du flux angulaire inscrit (EAF) fondée sur les données bidimensionnelles de champ lointain d’un guide d’ondes multimodal (fibre incluse)

IEC 61300-3-53:2020 est disponible sous forme de IEC 61300-3-53:2020 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente .
L'IEC 61300-3-53:2020 définit la mesure du flux angulaire inscrit de sources de rayonnement lumineux dotées d’un guide d’ondes multimodal, pour lequel la plupart des modes transversaux sont excités. On considère que le terme "guide d’ondes" inclut à la fois des guides d’ondes de canal et des fibres optiques, mais pas des guides d’ondes rectangulaires rigides. Les types de fibres applicables sont les suivants:
- A1 spécifié dans l’IEC 60793-2-10;
- A3 spécifié dans l’IEC 60793-2-30;
- A4 spécifié dans l’IEC 60793-2-40.
Cette deuxième édition annule et remplace la première édition parue en 2015. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
- la portée des guides d’ondes applicables, ainsi que la fibre et le guide d’ondes optiques multimodaux à gradient d’indice ont été inclus;
- restructuration de 5.3;
- ajout de l'Annexe C et de l'Annexe D.

General Information

Status
Published
Publication Date
14-Dec-2020
Current Stage
PPUB - Publication issued
Completion Date
15-Dec-2020
Ref Project

Buy Standard

Standard
IEC 61300-3-53:2020 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-53: Examinations and measurements - Encircled angular flux (EAF) measurement method based on two-dimensional far field data from multimode waveguide (including fibre)
English and French language
45 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 61300-3-53
Edition 2.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures
Part 3-53: Examinations and measurements – Encircled angular flux (EAF)
measurement method based on two-dimensional far field data from multimode
waveguide (including fibre)
Dispositifs d'interconnexion et composants passifs fibroniques – Procédures
fondamentales d'essais et de mesures –
Partie 3-53: Examens et mesures – Méthode de mesure du flux angulaire inscrit
(EAF) fondée sur les données bidimensionnelles de champ lointain d’un guide
d’ondes multimodal (fibre incluse)
IEC 61300-3-53:2020-12(en-fr)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2020 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite

ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie

et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des

questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez

les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform Electropedia - www.electropedia.org

The advanced search enables to find IEC publications by a The world's leading online dictionary on electrotechnology,

variety of criteria (reference number, text, technical containing more than 22 000 terminological entries in English

committee,…). It also gives information on projects, replaced and French, with equivalent terms in 16 additional languages.

and withdrawn publications. Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Glossary - std.iec.ch/glossary

details all new publications released. Available online and 67 000 electrotechnical terminology entries in English and

once a month by email. French extracted from the Terms and Definitions clause of

IEC publications issued since 2002. Some entries have been

IEC Customer Service Centre - webstore.iec.ch/csc collected from earlier publications of IEC TC 37, 77, 86 and

If you wish to give us your feedback on this publication or CISPR.
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
A propos de l'IEC

La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des

Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC

Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la

plus récente, un corrigendum ou amendement peut avoir été publié.
Recherche de publications IEC - Electropedia - www.electropedia.org

webstore.iec.ch/advsearchform Le premier dictionnaire d'électrotechnologie en ligne au

La recherche avancée permet de trouver des publications IEC monde, avec plus de 22 000 articles terminologiques en

en utilisant différents critères (numéro de référence, texte, anglais et en français, ainsi que les termes équivalents dans

comité d’études,…). Elle donne aussi des informations sur les 16 langues additionnelles. Egalement appelé Vocabulaire

projets et les publications remplacées ou retirées. Electrotechnique International (IEV) en ligne.

IEC Just Published - webstore.iec.ch/justpublished Glossaire IEC - std.iec.ch/glossary

Restez informé sur les nouvelles publications IEC. Just 67 000 entrées terminologiques électrotechniques, en anglais

Published détaille les nouvelles publications parues. et en français, extraites des articles Termes et Définitions des

Disponible en ligne et une fois par mois par email. publications IEC parues depuis 2002. Plus certaines entrées

antérieures extraites des publications des CE 37, 77, 86 et
Service Clients - webstore.iec.ch/csc CISPR de l'IEC.
Si vous désirez nous donner des commentaires sur cette
publication ou si vous avez des questions contactez-nous:
sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC 61300-3-53
Edition 2.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Fibre optic interconnecting devices and passive components – Basic test and
measurement procedures
Part 3-53: Examinations and measurements – Encircled angular flux (EAF)
measurement method based on two-dimensional far field data from multimode
waveguide (including fibre)
Dispositifs d'interconnexion et composants passifs fibroniques – Procédures
fondamentales d'essais et de mesures –
Partie 3-53: Examens et mesures – Méthode de mesure du flux angulaire inscrit
(EAF) fondée sur les données bidimensionnelles de champ lointain d’un guide
d’ondes multimodal (fibre incluse)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.180.20 ISBN 978-2-8322-9136-8

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 61300-3-53:2020 © IEC 2020
CONTENTS

FOREWORD ........................................................................................................................... 4

1 Scope .............................................................................................................................. 6

2 Normative references ...................................................................................................... 6

3 Terms and definitions ...................................................................................................... 6

4 Measurement conditions .................................................................................................. 8

5 Apparatus ........................................................................................................................ 8

5.1 General ................................................................................................................... 8

5.2 Measurement method 1: fθ lens imaging ................................................................. 8

5.2.1 General ........................................................................................................... 8

5.2.2 Micro-positioner ............................................................................................... 8

5.2.3 FFP optical system .......................................................................................... 9

5.2.4 Imaging device ................................................................................................ 9

5.2.5 Computer (EAF analyser module) .................................................................... 9

5.3 Measurement method 2: direct imaging ................................................................... 9

5.3.1 General ........................................................................................................... 9

5.3.2 Micro-positioner ............................................................................................... 9

5.3.3 Imaging device .............................................................................................. 10

5.3.4 Computer, position controller and image acquisition ...................................... 10

6 Sampling and specimens ............................................................................................... 10

7 Geometric calibration ..................................................................................................... 10

7.1 General ................................................................................................................. 10

7.2 Light source .......................................................................................................... 11

7.3 Procedure ............................................................................................................. 11

8 Measurement procedure ................................................................................................ 11

8.1 Safety ................................................................................................................... 11

8.2 Far field image acquisition .................................................................................... 12

8.2.1 General ......................................................................................................... 12

8.2.2 Waveguide end-face alignment ...................................................................... 12

8.2.3 Light source image acquisition ....................................................................... 12

8.3 Removal of background noise ............................................................................... 13

8.4 Centre determination ............................................................................................ 13

8.4.1 General ......................................................................................................... 13

8.4.2 Method A: Optical centre determination ......................................................... 13

8.4.3 Method B: Mechanical centre determination ................................................... 14

8.5 Computation of encircled angular flux ................................................................... 15

9 Results .......................................................................................................................... 16

9.1 Information available with each measurement ....................................................... 16

9.2 Information available upon request ....................................................................... 17

10 Details to be specified ................................................................................................... 17

Annex A (informative) System recommendations – Measurement method 1: far field

optical system ....................................................................................................................... 18

A.1 General ................................................................................................................. 18

A.2 Recommendations ................................................................................................ 18

Annex B (informative) System recommendations – Measurement method 2: direct

imaging ................................................................................................................................. 19

---------------------- Page: 4 ----------------------
IEC 61300-3-53:2020 © IEC 2020 – 3 –

B.1 General ................................................................................................................. 19

B.2 Recommendations ................................................................................................ 19

Annex C (informative) Shading effect of CCD devices: incident ray angular sensitivity ......... 20

C.1 General ................................................................................................................. 20

C.2 Scheme of shading and example of the characteristics ......................................... 20

Annex D (normative) Launch optics for the EAF template compliance test ........................... 22

D.1 General ................................................................................................................. 22

D.2 Setup .................................................................................................................... 22

Bibliography .......................................................................................................................... 23

Figure 1 – Apparatus configuration of measurement method 1: fθ lens imaging ....................... 8

Figure 2 – Far field optical system diagram ............................................................................. 9

Figure 3 – Apparatus configuration of measurement method 2: direct imaging ...................... 10

Figure 4 – Calibration apparatus example ............................................................................. 11

Figure 5 – Acquired far field image ....................................................................................... 12

Figure 6 – Acquired far field image with false colour ............................................................. 13

Figure 7 – Optical centre determination ................................................................................ 14

Figure 8 – Transformation of x-y to polar coordinates on the image sensor plane ................. 15

Figure 9 – Typical encircled angular flux chart ...................................................................... 16

Figure A.1 – An example of an optical system using an fθ lens ............................................. 18

Figure C.1 – Scheme of shading effect ................................................................................. 20

Figure C.2 – Example of shading characteristics ................................................................... 21

Figure D.1 – Schematic view of the setup for the EAF compliance test ................................. 22

---------------------- Page: 5 ----------------------
– 4 – IEC 61300-3-53:2020 © IEC 2020
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES
Part 3-53: Examinations and measurements – Encircled angular
flux (EAF) measurement method based on two-dimensional
far field data from multimode waveguide (including fibre)
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international

co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and

in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

Publicly Available Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their

preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with

may participate in this preparatory work. International, governmental and non-governmental organizations liaising

with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for

Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence between

any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent

rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61300-3-53 has been prepared by subcommittee 86B: Fibre optic

interconnecting devices and passive components, of IEC technical committee 86:Fibre optics.

This second edition cancels and replaces the first edition in 2015. This edition constitutes a

technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:

a) the scope of the applicable wave guides, and graded index multimode optical wave guide

and fibre have been included;
b) the structure of 5.3 has been rearranged;
c) Annex C and Annex D have been added.
---------------------- Page: 6 ----------------------
IEC 61300-3-53:2020 © IEC 2020 – 5 –
The text of this International Standard is based on the following documents:
FDIS Report on voting
86B/4343/FDIS 86B/4373/RVD

Full information on the voting for the approval of this International Standard can be found in the

report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 61300, published under the general title Fibre optic interconnecting

devices and passive components – Basic test and measurement procedures, can be found on

the IEC website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct understanding

of its contents. Users should therefore print this document using a colour printer.

---------------------- Page: 7 ----------------------
– 6 – IEC 61300-3-53:2020 © IEC 2020
FIBRE OPTIC INTERCONNECTING
DEVICES AND PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES
Part 3-53: Examinations and measurements – Encircled angular
flux (EAF) measurement method based on two-dimensional
far field data from multimode waveguide (including fibre)
1 Scope

This part of IEC 61300 defines the encircled angular flux measurement of multimode waveguide

light sources, in which most of the transverse modes are excited. The term "waveguide" is

understood to include both channel waveguides and optical fibres but not slab waveguides.

The applicable fibre types are the followings:
• A1 specified in IEC 60793-2-10;
• A3 specified in IEC 60793-2-30;
• A4 specified in IEC 60793-2-40.
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies.

For undated references, the latest edition of the referenced document (including any

amendments) applies.

IEC 60793-2-10, Optical fibres – Part 2-10: Product specifications – Sectional specification for

category A1 multimode fibres

IEC 60793-2-30, Optical fibres – Part 2-30: Product specifications – Sectional specification for

category A3 multimode fibres

IEC 60793-2-40, Optical fibres – Part 2-40: Product specifications – Sectional specification for

category A4 multimode fibres

IEC 60825-1, Safety of laser products – Part 1: Equipment classification and requirements

IEC 61300-1:2016, Fibre optic interconnecting devices and passive components – Basic test

and measurement procedures – Part 1: General and guidance
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
---------------------- Page: 8 ----------------------
IEC 61300-3-53:2020 © IEC 2020 – 7 –
3.1
encircled angular flux
EAF

fraction of the total optical power radiating from a multimode waveguide’s core within a certain

solid angle
3.2
Fraunhofer far field
far field which occurs when
L ≫ D /λ
where
L is the distance of the detection plane from the waveguide end facet;

D is the diameter of the multimode waveguide core or strictly mode field diameter;

λ is the wavelength.
3.3
fθ lens

lens converting the angle of incidence of the input beam, θ, into the output beam height, h

Note 1 to entry: The relationship between them is h = fθ, where f is the focal length of the lens.

3.4
mode power distribution
MPD
relative mode power in each of the mode groups of a multimode fibre

[SOURCE: IEC 62614-2:2015, 3.5, modified – The words "often shown graphically" have been

deleted.]
3.5
numerical aperture

sine of the vertex half-angle of the largest cone of meridional rays that can enter or leave the

core of an optical waveguide, multiplied by the refractive index of the medium in which the cone

is located
3.6
far field pattern
FFP

angular distribution of light radiating from a waveguide’s core, which corresponds to the optical

power distribution on a plane normal to the waveguide axis some distance from its end facet

Note 1 to entry: The distance depends on the largest waveguide cross section, a, the wavelength, λ, and the angle,φ,

to the optical axis. In the far field region, the shape of the distribution does not change as the distance from the

waveguide end facet increases; the distribution only scales in size with distance, L.

2a cos φ
( )
L>>
3.7
far field image
far field pattern formed on an imaging device
---------------------- Page: 9 ----------------------
– 8 – IEC 61300-3-53:2020 © IEC 2020
3.8
neutral density filter
ND filter
filter that attenuates light of all colours equally
4 Measurement conditions

Optical fibres which are applied to this measurement are specified in IEC 60793-2-10,

IEC 60793-2-30 and IEC 60793-2-40. The measurement ambient condition shall be the

standard atmospheric conditions specified in IEC 61300-1.
5 Apparatus
5.1 General

The optical source multimode waveguide shall be long enough to ensure that all cladding modes

are stripped by passage through the waveguide. Often, the fibre coating or tight buffer is

sufficient to perform this function. Alternatively, a cladding mode stripper shall be used in the

source launch multimode optical fibre. An example of a typical cladding mode stripper which

would be suitable for optical fibre is sufficient windings of the fibre around a mandrel of an

appropriate diameter. The windings also have a more important essential effect to fully fill the

transverse modes across the maximum mode field diameter. It should be checked that all of the

transverse modes of the fibre are sufficiently well excited. See Annex D. This can be done by

comparing the FFPs for different lengths of the launch fibre or different light sources. Once the

FFP no longer changes in form as the launch fibre length is increased, there is no need to

increase the length further.
5.2 Measurement method 1: fθ lens imaging
5.2.1 General

In theory, this measurement method, which is effectively a coherent optical method to Fourier

transform the near field to the far field using a lens, does not operate well using very wideband

optical sources. Experimentally, it has been shown to operate sufficiently well for sources up to

30 nm bandwidth, which are most commonly used.

Figure 1 below shows the apparatus configuration. The measurement system consists of a

micro-positioner, a far field broadband optical system, an imaging device (e.g. camera) and

computer (EAF analyser module). An appropriate type of camera (imaging device) shall be

chosen to suit the wavelength under test.
Figure 1 – Apparatus configuration of measurement method 1: fθ lens imaging
5.2.2 Micro-positioner

The micro-positioner shall hold the optical source (including the waveguide) and be able to

move in three directions (X, Y, Z). Angular movement for the optical system is recommended.

---------------------- Page: 10 ----------------------
IEC 61300-3-53:2020 © IEC 2020 – 9 –
5.2.3 FFP optical system

As shown in Figure 2, an fθ lens can directly convert the light from the multimode waveguide to

a far field image; however, scaling the far field image in order to fit the image sensor in the

imaging device and adjustment of the light intensity in order to prevent saturation is required.

The FFP optical system is chosen to operate at the measurement wavelength across the

required measurement bandwidth to match that of the detection system. See Annex A for more

information.
Figure 2 – Far field optical system diagram
5.2.4 Imaging device

Imaging device includes a camera, CCD, CMOS, etc. that can detect images. The detector is

typically a charge coupled device (CCD) or a complementary metal oxide semiconductor (CMOS)

camera. The type of imaging device shall be chosen by the measurement wavelength. Absolute

intensity measurement is not required.
5.2.5 Computer (EAF analyser module)

Since the acquired image contains many thousands of pixels, and the image conversion into

encircled angular flux requires substantial computation, a computer is required. The computer

shall be connected to the imaging device through an image acquisition board (or with an

embedded image acquisition circuit), and beam analysis software which enables the computer

as a EAF analyser shall be installed.
5.3 Measurement method 2: direct imaging
5.3.1 General

In this method, far field images are acquired directly by an imaging device without any optical

system. The distance between the optical waveguide source under test and the imaging device

shall be long enough to achieve Fraunhofer far field.

NOTE A CCD device generally consist of CCD semiconductor tip and micro lens array to get higher sensitivity

practically, then the structure generates shading effect which is incident angle dependent sensitivity consequently.

For more information, see Annex C and Figure 3.
See detail information of imaging device setup in Annex B.

When the far field image is larger than the area of the imaging device, multiple images shall be

taken and stitched together to configure a complete far field image.
5.3.2 Micro-positioner

Both the input multimode waveguide source and the photo detector (PD) shall be mounted on

motorized translation Astages. The motorized translation stages shall operate for both coarse

alignment with tenths millimetres step movement for wide position and accurate alignment with

sub-micron step adjustment to maximize the light through the waveguide.
---------------------- Page: 11 ----------------------
– 10 – IEC 61300-3-53:2020 © IEC 2020
5.3.3 Imaging device

An imaging device includes a camera, CCD, CMOS, etc. that can detect images. An imaging

device plane without any lens system shall be placed sufficiently far from the optical source

launch mu
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.