Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

Applies to high quality approval systems for hybrid integrated circuits and film structures. The purpose of the tests is to perform visual inspections on the internal materials, construction and workmanship of hybrid, multichip and multichip module microcircuits and passive elements used for microelectronic applications including r.f./microwave. These tests will normally be used on microelectronic devices prior to capping or encapsulation to detect and eliminate devices with internal non-conformances that could lead to device failure in normal application. They may also be employed on a sampling basis to determine the effectiveness of the manufacturers' quality control and handling procedures.

General Information

Status
Published
Publication Date
22-May-2002
Technical Committee
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
15-Jun-2002
Completion Date
23-May-2002
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IEC 60748-23-2:2002 - Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
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Standards Content (Sample)

INTERNATIONAL IEC
STANDARD
60748-23-2
QC 165000-2
First edition
2002-05
Semiconductor devices –
Integrated circuits –
Part 23-2:
Hybrid integrated circuits and film structures –
Manufacturing line certification –
Internal visual inspection and special tests
Dispositifs à semiconducteurs –
Circuits intégrés –
Partie 23-2:
Circuits intégrés hybrides et structures par films –
Certification de la ligne de fabrication –
Contrôle visuel interne et essais spéciaux
Reference number
IEC 60748-23-2:2002(E)

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INTERNATIONAL IEC
STANDARD
60748-23-2
QC165000-2
First edition
2002-05
Semiconductor devices –
Integrated circuits –
Part 23-2:
Hybrid integrated circuits and film structures –
Manufacturing line certification –
Internal visual inspection and special tests
Dispositifs à semiconducteurs –
Circuits intégrés –
Partie 23-2:
Circuits intégrés hybrides et structures par films –
Certification de la ligne de fabrication –
Contrôle visuel interne et essais spéciaux
 IEC 2002  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch  Web: www.iec.ch
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International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue

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– 2 – 60748-23-2  IEC:2002(E)
CONTENTS
FOREWORD . 7
INTRODUCTION .9
1 Scope .10
2 Normative references.10
3 Definitions .11
4 Apparatus .18
5 Procedure.18
5.1 General .18
5.2 Sequence of inspection.19
5.3 Inspection control .19
5.4 Re-inspection .
...

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