Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers

IEC 62228-5:2021(E) specifies test and measurement methods for EMC evaluation of Ethernet transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for transceiver of the Ethernet systems
100BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD1;
100BASE-TX according to ISO/IEC/IEEE 8802-3;
1000BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD4  and covers
the emission of RF disturbances;
the immunity against RF disturbances;
the immunity against impulses;
the immunity against electrostatic discharges (ESD).

General Information

Status
Published
Publication Date
25-Apr-2021
Technical Committee
Current Stage
PPUB - Publication issued
Completion Date
26-Apr-2021
Ref Project

Buy Standard

Standard
IEC 62228-5:2021 - Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
English language
108 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 62228-5
Edition 1.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 5: Ethernet transceivers
IEC 62228-5:2021-04(en)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2021 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC online collection - oc.iec.ch

The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the

variety of criteria (reference number, text, technical publications previews. With a subscription you will always

committee, …). It also gives information on projects, replaced have access to up to date content tailored to your needs.

and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 000 terminological entries in English
details all new publications released. Available online and
and French, with equivalent terms in 18 additional languages.
once a month by email.
Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc
If you wish to give us your feedback on this publication or
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC 62228-5
Edition 1.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 5: Ethernet transceivers
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-9697-4

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC 62228-5:2021 © IEC 2021
CONTENTS

FOREWORD ........................................................................................................................... 8

1 Scope ............................................................................................................................ 10

2 Normative references .................................................................................................... 10

3 Terms, definitions and abbreviated terms ...................................................................... 11

3.1 Terms and definitions ............................................................................................ 11

3.2 Abbreviated terms ................................................................................................. 12

4 General ......................................................................................................................... 13

5 Test and operating conditions ........................................................................................ 14

5.1 Supply and ambient conditions.............................................................................. 14

5.2 Test operation modes ........................................................................................... 14

5.2.1 General ......................................................................................................... 14

5.2.2 Transceiver configuration for normal operation mode ..................................... 15

5.2.3 Transceiver configuration for low power mode ............................................... 15

5.3 Definition of BIN .................................................................................................... 15

5.4 Test configuration ................................................................................................. 16

5.4.1 General configuration for transceiver network ................................................ 16

5.4.2 General configuration for single transceiver ................................................... 18

5.4.3 Transceiver network tests – coupling ports and networks for conducted

tests .............................................................................................................. 18

5.4.4 Single transceiver tests – coupling ports and networks .................................. 21

5.5 Test communication and signals ........................................................................... 22

5.5.1 General ......................................................................................................... 22

5.5.2 Test signals for normal operation mode ......................................................... 22

5.5.3 Test signals for low power mode .................................................................... 23

5.6 Evaluation criteria ................................................................................................. 23

5.6.1 General ......................................................................................................... 23

5.6.2 Evaluation criteria for functional operation modes .......................................... 23

5.6.3 Evaluation criteria in unpowered condition after exposure to

disturbances .................................................................................................. 24

5.6.4 Status classes ............................................................................................... 25

5.7 DUT specific information ....................................................................................... 26

6 Test and measurement .................................................................................................. 26

6.1 Emission of conducted RF disturbances ................................................................ 26

6.1.1 Test method .................................................................................................. 26

6.1.2 Test setup ..................................................................................................... 26

6.1.3 Test procedure and parameters ..................................................................... 27

6.2 Immunity to conducted RF disturbances ................................................................ 28

6.2.1 Test method .................................................................................................. 28

6.2.2 Test setup ..................................................................................................... 28

6.2.3 Test procedure and parameters ..................................................................... 29

6.3 Immunity to impulses ............................................................................................ 33

6.3.1 Test method .................................................................................................. 33

6.3.2 Test setup ..................................................................................................... 33

6.3.3 Test procedure and parameters ..................................................................... 34

6.4 Electrostatic Discharge (ESD) ............................................................................... 36

6.4.1 Test method .................................................................................................. 36

6.4.2 Test setup ..................................................................................................... 36

---------------------- Page: 4 ----------------------
IEC 62228-5:2021 © IEC 2021 – 3 –

6.4.3 Test procedure and parameters ..................................................................... 41

7 Test report ..................................................................................................................... 43

Annex A (normative) Ethernet test circuits ........................................................................... 44

A.1 General ................................................................................................................. 44

A.2 Test circuit for Ethernet transceivers for functional tests ....................................... 44

A.3 Test circuit for Ethernet transceivers for ESD test ................................................. 46

Annex B (normative) Test circuit boards............................................................................... 49

B.1 Test circuit board for transceiver network configuration ......................................... 49

B.2 Test circuit board for single transceiver configuration ............................................ 51

Annex C (informative) Test of Ethernet transceiver for radiated RF emission and RF

immunity ............................................................................................................................... 53

C.1 General ................................................................................................................. 53

C.2 General configuration for transceiver network ....................................................... 53

C.3 Tests .................................................................................................................... 54

C.3.1 General ......................................................................................................... 54

C.3.2 Emission of radiated RF disturbances ............................................................ 58

C.3.3 Immunity to radiated RF disturbances ............................................................ 59

Annex D (informative) Examples for test limits for Ethernet transceiver in automotive

application ............................................................................................................................ 63

D.1 General ................................................................................................................. 63

D.2 Emission of conducted RF disturbances ................................................................ 63

D.3 Immunity to conducted RF disturbances ................................................................ 64

D.4 Immunity to impulses ............................................................................................ 68

D.5 Electrostatic discharge (ESD) ............................................................................... 68

D.6 Emission of radiated RF disturbances ................................................................... 69

D.7 Immunity to radiated RF disturbances ................................................................... 70

Annex E (informative) Characterization of common mode chokes for EMC evaluation

of Ethernet transceivers ........................................................................................................ 72

E.1 General ................................................................................................................. 72

E.2 Test ...................................................................................................................... 72

E.2.1 General ......................................................................................................... 72

E.2.2 S-parameter measurement mixed mode ......................................................... 73

E.2.3 ESD damage ................................................................................................. 80

E.2.4 Saturation test at RF disturbances ................................................................. 82

E.2.5 Saturation test at ESD ................................................................................... 85

E.2.6 TDR measurement of differential mode impedance ........................................ 87

Annex F (informative) Characterization of ESD suppression devices for EMC

evaluation of Ethernet transceivers ....................................................................................... 89

F.1 General ................................................................................................................. 89

F.2 Test ...................................................................................................................... 90

F.2.1 General ......................................................................................................... 90

F.2.2 S-parameter measurement mixed mode ......................................................... 91

F.2.3 ESD damage ................................................................................................. 97

F.2.4 ESD discharge current measurement ........................................................... 100

F.2.5 Test of unwanted clamping effect at RF immunity tests ................................ 104

Bibliography ........................................................................................................................ 108

Figure 1 – Minimum MDI interface test network (Min-BIN) ..................................................... 16

Figure 2 – Standard MDI interface test network (Std-BIN) ..................................................... 16

---------------------- Page: 5 ----------------------
– 4 – IEC 62228-5:2021 © IEC 2021

Figure 3 – Optimized MDI interface test network (Opt-BIN) ................................................... 16

Figure 4 – General test configuration for tests in transceiver network for conducted

tests ..................................................................................................................................... 17

Figure 5 – General test configuration for unpowered ESD test .............................................. 18

Figure 6 – Transceiver network tests – coupling ports and networks ..................................... 19

Figure 7 – Coupling ports and networks for unpowered ESD tests ........................................ 22

Figure 8 – Principle drawing of the maximum deviation on an I-V characteristic .................... 25

Figure 9 – Test setup for measurement of conducted RF disturbances ................................. 27

Figure 10 – Test setup for DPI tests ...................................................................................... 29

Figure 11 – Test setup for impulse immunity tests................................................................. 33

Figure 12 – Test setup for powered ESD tests – principle arrangement................................. 36

Figure 13 – Test setup for powered ESD tests – stimulation and monitoring ......................... 37

Figure 14 – Test setup for unpowered ESD tests – principle arrangement ............................. 38

Figure 15 – Test setup for unpowered ESD tests – stimulation and monitoring for

function validation pre and post ESD test .............................................................................. 40

Figure A.1 – General drawing of the circuit diagram of test network for 100BASE-T1

and 1000BASE-T1 Ethernet transceivers for functional test using conducted test

methods ................................................................................................................................ 45

Figure A.2 – General drawing of the circuit diagram of test network for 100BASE-TX

Ethernet transceivers for functional test using conducted test methods ................................. 46

Figure A.3 – General drawing of the circuit diagram for ESD tests of Ethernet

transceivers in powered mode .............................................................................................. 47

Figure A.4 – General drawing of the circuit diagram for ESD tests of Ethernet

transceivers in unpowered mode ........................................................................................... 48

Figure B.1 – Example of functional conducted test board for Ethernet transceiver ICs

(100BASE-T1) ...................................................................................................................... 49

Figure B.2 – Example of powered ESD test board for Ethernet transceivers ICs

(100BASE-T1) ...................................................................................................................... 50

Figure B.3 – Example of unpowered ESD test board for Ethernet transceivers ICs

(100BASE-T1), top layer ....................................................................................................... 51

Figure B.4 – Example of unpowered ESD test board for Ethernet transceivers ICs

(100BASE-T1), bottom layer ................................................................................................. 51

Figure C.1 – General test configuration for tests in transceiver network used for

radiated tests ........................................................................................................................ 53

Figure C.2 – General drawing of the circuit diagram of test network for 100BASE-T1

and 1000BASE-T1 Ethernet transceivers for functional test using radiated RF test

methods ................................................................................................................................ 55

Figure C.3 – Example of functional radiated test board for Ethernet transceiver ICs

(100BASE-T1), top layer (DUT side) ..................................................................................... 56

Figure C.4 – Example of functional radiated test board for Ethernet transceiver ICs

(100BASE-T1), bottom layer (external circuitry side) ............................................................. 57

Figure C.5 – Test setup for measurement of radiated RF emission ....................................... 58

Figure C.6 – Test setup for radiated RF immunity tests ......................................................... 60

Figure D.1 – Example of limits for conducted RF emission – MDI Opt-BIN, V and
BAT

WAKE ................................................................................................................................... 63

Figure D.2 – Example of limits for conducted RF emission – local supplies ........................... 64

Figure D.3 – Example of limits for conducted RF immunity for functional status

class A – MDI Opt-BIN ...................................................................................................... 65

---------------------- Page: 6 ----------------------
IEC 62228-5:2021 © IEC 2021 – 5 –
Figure D.4 – Example of limits for conducted RF immunity for functional status

class A – V and WAKE ................................................................................................ 65

IC BAT
Figure D.5 – Example of limits for conducted RF immunity for functional status

class C or D – MDI Opt-BIN ........................................................................................... 67

IC IC
Figure D.6 – Example of limits for conducted RF immunity for functional status

class C or D – V and WAKE .................................................................................... 67

IC IC BAT

Figure D.7 – Example of limits for radiated RF emission for IC stripline with 6,7 mm

active conductor height ......................................................................................................... 69

Figure D.8 – Example of limits for radiated RF immunity ....................................................... 70

Figure E.1 – General electrical drawing of a CMC ................................................................. 72

Figure E.2 – Test setup for S-parameter measurements at CMC ........................................... 73

Figure E.3 – Example of test board 4-port S-parameter measurement at CMC – mixed

mode, top layer ..................................................................................................................... 74

Figure E.4 – Example of test board 3-port S-parameter measurement at CMC – single

ended, top layer .................................................................................................................... 74

Figure E.5 – Recommended characteristics for S , S (RL) for CMC .......................... 77

dd11 dd22

Figure E.6 – Recommended characteristics for S (IL) for CMC....................................... 78

dd21

Figure E.7 – Recommended characteristics for S (CMR) for CMC .................................. 78

cc21

Figure E.8 – Recommended characteristics for S , S (LCL) for CMC ........................ 79

dc11 dc22
Figure E.9 – Recommended characteristics for S , S (DCMR) and S ,
sd21 sd12 ds21

S (CDMR) for CMC ........................................................................................................ 79

ds12

Figure E.10 – Test setup for ESD damage tests at CMC ....................................................... 80

Figure E.11 – Example of ESD test board for CMC, top layer ................................................ 81

Figure E.12 – Test setup for RF saturation measurements at CMC ....................................... 83

Figure E.13 – Example of RF saturation / S-parameter test board for CMC, top layer............ 83

Figure E.14 – Test setup for ESD saturation measurements at CMC ..................................... 85

Figure E.15 – Example of ESD saturation test board for CMC, top layer ............................... 85

Figure E.16 – Example of ESD saturation tests results for CMC ............................................ 87

Figure E.17 – Test setup for TDR measurement at CMC ....................................................... 87

Figure E.18 – Example of TDR test board for CMC, top layer ................................................ 88

Figure F.1 – Arrangement of ESD suppression device within the 100BASE-T1 and

1000BASE-T1 MDI interface ................................................................................................. 90

Figure F.2 – Test setup for S-parameter measurements at ESD suppression device ............. 91

Figure F.3 – Example of test board 4-port S-parameter measurement for ESD

suppression device – mixed mode, top layer ......................................................................... 92

Figure F.4 – Example of test board 3-port S-parameter measurement for ESD

suppression device – single ended, top layer ........................................................................ 92

Figure F.5 – Recommended characteristics for S (RL) for ESD suppression device ....... 95

dd11

Figure F.6 – Recommended characteristics for S (IL) for ESD suppression device ......... 95

dd21
Figure F.7 – Recommended characteristics for S (DCMR) for ESD suppression
sd21

device ................................................................................................................................... 96

Figure F.8 – Test setup for ESD damage tests at ESD suppression device ........................... 97

Figure F.9 – Example of ESD test board for ESD suppression device, top layer .................... 98

Figure F.10 – Test setup for ESD discharge current measurement at ESD suppression

device ................................................................................................................................. 100

---------------------- Page: 7 ----------------------
– 6 – IEC 62228-5:2021 © IEC 2021
Figure F.11 – Example of ESD discharge current test board for ESD suppression

device, top and bottom layer ............................................................................................... 101

Figure F.12 – Example of test results and recommended limits for remaining ESD

discharge current after the MDI test network for ESD suppression device ........................... 103

Figure F.13 – Test setup for RF clamping test at ESD suppression device .......................... 104

Figure F.14 – Example of test board RF clamping test at suppression device, top layer ...... 105

Figure F.15 – Recommended test power levels for RF clamping tests at ESD

suppression device ............................................................................................................. 107

Table 1 – Overview of measurements and tests .................................................................... 13

Table 2 – Supply and ambient conditions for functional operation ......................................... 14

Table 3 – Definition for transceiver configuration for normal operation mode ........................ 15

Table 4 – Definition for transceiver mode configuration for low power mode ......................... 15

Table 5 – Selection recommendation of MII interfaces for transceiver network

configuration ......................................................................................................................... 18

Table 6 – Transceiver network tests – component value definitions of coupling ports

and networks ........................................................................................................................ 20

Table 7 – Definitions of coupling ports for unpowered ESD tests ........................................... 22

Table 8 – Definition for transceiver mode configuration for normal operation mode ............... 23

Table 9 – Evaluation criteria for Ethernet transceiver ............................................................ 24

Table 10 – Definition of functional status classes .................................................................. 25

Table 11 – Settings of the conducted RF measurement equipment ....................................... 27

Table 12 – Conducted emission measurements .................................................................... 28

Table 13 – Specifications for DPI tests ................................................................................. 30

Table 14 – DPI tests for functional status class A evaluation of Ethernet transceivers ....... 31

Table 15 – DPI tests for functional status class C or D evaluation of Ethernet
IC IC

transceivers .......................................................................................................................... 32

Table 16 – Specifications for impulse immunity tests ............................................................ 34

Table 17 – Parameters for impulse immunity test .................................................................. 34

Table 18 – Impulse immunity tests for functional status class A evaluation of

Ethernet transceivers ............................................................................................................ 35

Table 19 – Impulse immunity tests for functional status class C or D evaluation of

IC IC

Ethernet transceivers ............................................................................................................ 35

Table 20 – Specifications for ESD tests ................................................................................ 41

Table 21 – ESD tests in powered mode for functional status class A , C and D
IC IC IC

evaluation of Ethernet transceivers ....................................................................................... 42

Table 22 – ESD tests in unpowered mode for functional status class D evaluation of

Ethernet transceiver ICs ....................................................................................................... 43

Table B.1 – Parameter ESD test circuit board ....................................................................... 52

Table C.1 – Settings of the radiated RF measurement equipment ......................................... 59

Table C.2 – Radiated RF emission measurements ................................................................ 59

Table C.3 – Specifications for radiated RF immunity tests ..................................................... 61

Table C.4 – Radiated RF immunity tests for functional status class AIC evaluation of

Ethernet transceivers ............................................................................................................ 62

Table D.1 – Example of limits for conducted RF emission – test cases with

recommended limit classes ................................................................................................... 64

---------------------- Page: 8 ----------------------
IEC 62228-5:2021 © IEC 2021 – 7 –
Table D.2 – Example of limits for conducted RF immunity – test cases with

recommended limit classes for functional status class A .................................................... 66

Table D.3 – Example of limits for conducted RF immunity – test cases with
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.