IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Dispositifs à seminconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13: Atmosphère saline

L’IEC 60749-13:2018 décrit un essai d’atmosphère saline réalisé pour déterminer la résistance à la corrosion des dispositifs à semiconducteurs. Il s’agit d’un essai accéléré qui simule les effets d’une atmosphère côtière corrosive sur toutes les surfaces exposées. Il n’est applicable qu’aux dispositifs spécifiés pour un environnement maritime. L’essai d’atmosphère saline est considéré comme destructif.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) alignement avec la norme MIL-STD-883J, Method 1009.8, Salt Atmosphere (Corrosion), y compris les informations sur le conditionnement et la maintenance de la chambre d’essai et sur le montage des spécimens d’essais (y compris les figures explicatives).

General Information

• Status: Published
• Publication Date: 14-Feb-2018
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 2 - TC 47/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 23-Feb-2018
• Completion Date: 15-Feb-2018

Relations

• Revises: IEC 60749-13:2002/COR1:2003 - Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
• Effective Date: 05-Sep-2023
• Revises: IEC 60749-13:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60749-13 ®
Edition 2.0 2018-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 13: Salt atmosphere
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –
Partie 13: Atmosphère saline
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IEC 60749-13 ®
Edition 2.0 2018-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –

Part 13: Salt atmosphere
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –

Partie 13: Atmosphère saline
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-5369-4

– 2 – IEC 60749-13:2018 © IEC 2018
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Test apparatus . 5
5 Procedure . 6
5.1 Conditioning and maintenance of test chamber . 6
5.2 Initial preconditioning of leads . 6
5.3 Mounting of test specimens . 6
5.4 Chamber operation . 10
5.5 Length of test . 10
5.6 Examination . 11
5.7 Failure criteria . 11
5.7.1 Finished product . 11
5.7.2 Package elements . 12
6 Summary . 12
Bibliography . 14

Figure 1 – Dual-in-line packages with leads attached to, or exiting from package sides
(such as side-brazed packages and ceramic dual-in-line packages) . 7
Figure 2 – Packages with leads attached to, or exiting from the opposite side of the lid . 9
Figure 3 – Packages with leads attached to, or exiting from package sides, parallel to
lids (such as flatpacks) . 9
Figure 4 – Leadless and leaded chip carriers . 10
Figure 5 – Corrosion area charts . 13

Table 1 – Minimum duration of exposure . 11

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –

Part 13: Salt atmosphere
FOREWORD
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International Standard IEC 60749-13 has been prepared by IEC technical committee 47:
Semiconductor devices.
This second edition cancels and replaces the first edition published in 2002. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including
information on conditioning and maintenance of the test chamber and mounting of test
specimens (including explanatory figures).

– 4 – IEC 60749-13:2018 © IEC 2018
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2446/FDIS 47/2455/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60749 series, published under the general title Semiconductor
devices – Mechanical and climatic test methods, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS
...