Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects

IEC 62396-4:2013(E) provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). This part of IEC 62396 defines the effects of that environment on high voltage electronics and provides design considerations for the accommodation of those effects within avionics systems. This part of IEC 62396 provides technical data and methodology for aerospace equipment manufacturers and designers to standardise their approach to single event effects on high voltage avionics by providing guidance, leading to a standard methodology.
This publication is to be read in conjunction with IEC 62396-1:2012.

General Information

Status
Published
Publication Date
24-Sep-2013
Current Stage
PPUB - Publication issued
Start Date
30-Sep-2013
Completion Date
25-Sep-2013
Ref Project

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IEC 62396-4:2013 - Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects
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IEC 62396-4
®

Edition 1.0 2013-09
INTERNATIONAL
STANDARD



Process management for avionics – Atmospheric radiation effects –
Part 4: Design of high voltage aircraft electronics managing potential single
event effects

IEC 62396-4:2013(E)

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IEC 62396-4

®


Edition 1.0 2013-09




INTERNATIONAL



STANDARD



















Process management for avionics – Atmospheric radiation effects –

Part 4: Design of high voltage aircraft electronics managing potential single

event effects


























INTERNATIONAL

ELECTROTECHNICAL

COMMISSION

PRICE CODE
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ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-1094-9



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® Registered trademark of the International Electrotechnical Commission

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– 2 – 62396-4 © IEC:2013(E)
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Potential high voltage single event effects . 6
5 Quantifying single event burnout in avionics for high voltage devices . 8
6 Relevant SEB data and applying it to avionics . 9
6.1 SEB data from heavy ion testing is not relevant . 9
6.2 SEB data from high energy neutron and proton testing . 9
6.3 Calculating the SEB rate at aircraft altitudes . 12
6.4 Measurement of high voltage component radiation characteristics, EPICS . 12
6.5 Single event burnout due to thermal neutrons . 14
6.6 Alternative semiconductor materials to silicon . 15
7 Conclusion .
...

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