Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

IEC/PAS 60512-27-200:2018 covers additional, supplemental specifications for signal integrity and transmission performance test methods of IEC 60512-27-100, for connectors using de-embedded crosstalk measurements, which are specified in respective parts of IEC 60603-7 standards for connecting hardware applications up to 2 000 MHz.
These additional specifications are also applicable for testing the related lower frequency connectors. However, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector.
Test procedures of IEC 60512-27-100 affected by these supplemental methods and procedures are:
• insertion loss, test 27a;
• return loss, test 27b;
• near-end crosstalk (NEXT) test 27c;
• far-end crosstalk (FEXT), test 27d;
• transverse conversion loss (TCL), test 27f;
• transverse conversion transfer loss (TCTL), test 27g.
Other test procedures referenced here are:
• transfer impedance (ZT), see test procedures in IEC 62153-4-6 or IEC 62153-4-7.
• for coupling attenuation (aC), see test procedures in IEC 62153-4-7 or IEC 62153-4-12.
Keywords: Connector, Signal Integrity

General Information

Status
Published
Publication Date
18-Oct-2018
Technical Committee
Current Stage
PPUB - Publication issued
Completion Date
19-Oct-2018
Ref Project

Buy Standard

Technical specification
IEC PAS 60512-27-200:2018 - Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g
English language
114 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC PAS 60512-27-200
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on

IEC 60603-7 series connectors – Tests 27a to 27g
IEC PAS 60512-27-200:2018-10(en)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2018 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org

The stand-alone application for consulting the entire The world's leading online dictionary of electronic and

bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in

Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional

documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical

iPad. Vocabulary (IEV) online.

IEC publications search - webstore.iec.ch/advsearchform IEC Glossary - std.iec.ch/glossary

The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and

variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of

committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been

and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc

details all new publications released. Available online and If you wish to give us your feedback on this publication or

also once a month by email. need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC PAS 60512-27-200
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on

IEC 60603-7 series connectors – Tests 27a to 27g
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.220.10 ISBN 978-2-8322-6093-7

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 3 ----------------------
– 2 – IEC PAS 60512-27-200:2018 © IEC 2018
CONTENTS

FOREWORD ........................................................................................................................... 8

1 Scope ............................................................................................................................ 10

2 Normative references .................................................................................................... 10

3 Terms and definitions .................................................................................................... 12

4 Overall test arrangement ............................................................................................... 12

4.1 General ................................................................................................................. 12

4.2 Indirect-reference test fixtures .............................................................................. 12

Annex A (normative) Indirect-reference test fixtures ............................................................. 13

A.1 General ................................................................................................................. 13

A.2 Requirements ....................................................................................................... 13

Annex B (normative) Measurement requirements (general) .................................................. 14

B.1 General test configuration ..................................................................................... 14

B.2 Termination of a cable DUT to test system ............................................................ 14

B.2.1 General ......................................................................................................... 14

B.2.2 Interconnections between the device under test (DUT) and the

calibration plane ............................................................................................ 15

B.2.3 Test lead return loss requirements ................................................................. 15

B.2.4 Ground plane requirements ........................................................................... 18

B.2.5 Network analyzer requirements ...................................................................... 18

B.3 Measurement points and spacing .......................................................................... 18

B.4 Impedance matching terminations ......................................................................... 19

B.4.1 General ......................................................................................................... 19

B.4.2 Resistor terminations ..................................................................................... 19

B.4.3 Termination return loss performance at the calibration plane ......................... 20

B.4.4 Termination TCL performance at the calibration plane ................................... 20

B.4.5 Calibration methods ....................................................................................... 20

B.4.6 Two-port calibration of the test system .......................................................... 21

B.4.7 One-port calibration of the test system .......................................................... 21

B.5 General calibration plane ...................................................................................... 21

B.5.1 General ......................................................................................................... 21

B.5.2 Calibration references ................................................................................... 22

B.5.3 50 Ω and 100 Ω calibration reference load requirements ............................... 22

B.5.4 Calibration reference load return loss requirement ......................................... 23

B.5.5 Typical test equipment performance parameters ............................................ 23

Annex C (normative) Cabling and component test procedures using baluns ......................... 24

C.1 Measurement test setup and apparatus................................................................. 24

C.1.1 General ......................................................................................................... 24

C.1.2 Balun terminations ......................................................................................... 24

C.1.3 Balun requirements........................................................................................ 24

C.2 Testing of cabling ................................................................................................. 26

C.2.1 Cabling DC resistance ................................................................................... 26

C.2.2 Return loss testing of cables and channels .................................................... 27

C.2.3 Insertion loss of cables and channels ............................................................ 29

C.2.4 NEXT loss of cables and channels ................................................................. 30

C.2.5 FEXT loss of cables and channels ................................................................. 32

C.2.6 Cable and channel propagation delay ............................................................ 34

---------------------- Page: 4 ----------------------
IEC PAS 60512-27-200:2018 © IEC 2018 – 3 –

C.2.7 TCL of cables and channels ........................................................................... 34

C.2.8 TCTL of cables and channels ........................................................................ 38

C.2.9 Cable and channel measurement precautions ................................................ 40

C.2.10 Screened or shielded cable and channel measurement configurations ........... 40

C.3 Permanent link test procedures ............................................................................. 40

C.3.1 General ......................................................................................................... 40

C.3.2 Permanent link measurement configurations .................................................. 40

C.3.3 Calibration of permanent link test configurations. ........................................... 41

C.3.4 Return loss of permanent links ...................................................................... 41

C.3.5 Insertion loss of permanent link ..................................................................... 42

C.3.6 NEXT loss of permanent link .......................................................................... 42

C.3.7 FEXT loss of permanent link .......................................................................... 43

C.3.8 TCL of permanent link ................................................................................... 44

C.3.9 TCTL of permanent link ................................................................................. 45

C.3.10 Propagation delay of permanent link .............................................................. 46

C.4 Direct attach measurement procedures ................................................................. 47

C.4.1 Direct attach test configurations..................................................................... 47

C.5 Modular cord test procedures ................................................................................ 50

C.5.1 Network analyzer test configuration ............................................................... 50

C.5.2 Test fixturing for modular cords ..................................................................... 52

C.5.3 Modular cord measurements. ......................................................................... 52

C.6 Connecting hardware testing ................................................................................. 52

C.6.1 General ......................................................................................................... 52

C.6.2 Connecting hardware measurement configurations ........................................ 52

C.6.3 Return loss measurements ............................................................................ 53

C.6.4 Insertion loss measurements ......................................................................... 53

C.6.5 NEXT loss measurements .............................................................................. 54

C.6.6 Test plug characterization .............................................................................. 56

C.6.7 Category 6A measurement reproducibility ...................................................... 72

C.7 Modular cord test head requirements .................................................................... 74

C.7.1 General ......................................................................................................... 74

C.7.2 Modular cord test head NEXT loss ................................................................. 74

C.7.3 Modular cord test head FEXT loss ................................................................. 74

C.7.4 Modular cord test head return loss ................................................................. 75

C.8 Alien crosstalk measurements ............................................................................... 75

C.8.1 Cabling ANEXT loss and AFEXT loss laboratory measurement

procedures .................................................................................................... 75

C.8.2 ANEXT loss and AFEXT loss of cable ............................................................ 77

C.8.3 Connecting Hardware ANEXT loss and AFEXT loss measurements ............... 79

Annex D (normative) Cabling and component balunless test procedures .............................. 83

D.1 Balunless measurement requirements ................................................................... 83

D.2 Resistor terminations used with balunless measurement systems ......................... 83

D.3 Calibration methods .............................................................................................. 84

D.4 Testing of cables and cabling ................................................................................ 84

D.4.1 Cabling and cable measurement procedures ................................................. 84

D.4.2 Cabling and cable DC resistance ................................................................... 85

D.4.3 Cabling and cable return loss ........................................................................ 85

D.4.4 Insertion loss of cables and channels ............................................................ 86

D.4.5 NEXT loss of cables and channels ................................................................. 87

---------------------- Page: 5 ----------------------
– 4 – IEC PAS 60512-27-200:2018 © IEC 2018

D.4.6 FEXT loss of cables and channels ................................................................. 87

D.4.7 TCL of cabling and cables ............................................................................. 88

D.4.8 TCTL of cabling and cables ........................................................................... 88

D.4.9 Propagation delay of cabling and cable.......................................................... 89

D.5 Permanent link test procedures ............................................................................. 89

D.5.1 General ......................................................................................................... 89

D.5.2 Permanent link measurement configurations .................................................. 89

D.5.3 Calibration of permanent link test configurations. ........................................... 89

D.5.4 Return loss of permanent links ...................................................................... 89

D.5.5 Insertion loss of permanent link ..................................................................... 90

D.5.6 NEXT loss of permanent link .......................................................................... 91

D.5.7 FEXT loss of permanent link .......................................................................... 92

D.5.8 TCL of permanent link ................................................................................... 93

D.5.9 TCTL of permanent link ................................................................................. 93

D.5.10 Propagation delay of permanent link .............................................................. 94

D.6 Balunless direct attach measurement procedures ................................................. 94

D.7 Balunless modular cord test procedures – Balunless network analyzer test

configuration ......................................................................................................... 98

D.8 Connecting hardware test procedures ................................................................. 100

D.8.1 General ....................................................................................................... 100

D.8.2 Connecting hardware measurement configurations ...................................... 100

D.9 Balunless alien crosstalk for cabling, cable and connecting hardware. ................ 101

D.9.1 Balunless ANEXT loss and AFEXT loss laboratory measurement

procedures .................................................................................................. 101

D.9.2 Balunless connecting hardware ANEXT loss and AFEXT loss

procedures .................................................................................................. 101

Annex E (informative) Connecting hardware test fixtures ................................................... 104

E.1 General ............................................................................................................... 104

E.2 Additional components for connection to a network analyzer ............................... 105

E.3 Direct fixture ....................................................................................................... 106

E.4 PCB based test plug assembly ............................................................................ 106

E.5 Connecting hardware measurement configuration ............................................... 107

E.6 Test fixture calibration ........................................................................................ 108

E.6.1 General ....................................................................................................... 108

E.6.2 Calibration and reference plane location ...................................................... 112

E.7 DUT connections using header PCB assemblies ................................................. 113

Bibliography ........................................................................................................................ 114

Figure B.1 – Example 360° shielded cable termination .......................................................... 16

Figure B 2 – Example individually shielded pair cable termination ......................................... 17

Figure B.3 – Test fixture interface pattern ............................................................................. 17

Figure B.4 – Example pin and socket dimension ................................................................... 18

Figure B.5 – Resistor termination networks for balun testing ................................................. 19

Figure B.6 – Balunless resistor termination network .............................................................. 20

Figure B.7 – Calibration plane ............................................................................................... 21

Figure C.1 – Measurement configurations for test balun qualification .................................... 26

Figure C.2 – Balun schematic diagram .................................................................................. 27

Figure C.3 – Laboratory test configuration for return loss ...................................................... 28

---------------------- Page: 6 ----------------------
IEC PAS 60512-27-200:2018 © IEC 2018 – 5 –

Figure C.4 – Laboratory test configuration for insertion loss and propagation delay

measurements ...................................................................................................................... 29

Figure C.5 – Laboratory test configuration for cable and channel NEXT loss ......................... 31

Figure C.6 – Laboratory test configuration for FEXT loss ...................................................... 33

Figure C.7 – Laboratory test configuration for TCL ................................................................ 35

Figure C.8 – Coaxial lead through calibration ........................................................................ 36

Figure C.9 – Back-to-back balun insertion loss measurement ............................................... 36

Figure C.10 – Output terminal connection ............................................................................. 37

Figure C.11 – Outer shield grounding position ...................................................................... 37

Figure C.12 – Laboratory test configuration for TCTL ............................................................ 39

Figure C.13 – Laboratory test configuration for permanent link return loss and TCL

measurements ...................................................................................................................... 41

Figure C.14 – Laboratory test configuration for permanent link insertion loss and

propagation delay measurements ......................................................................................... 42

Figure C.15 – Laboratory test configuration for permanent link NEXT loss

measurements ...................................................................................................................... 43

Figure C.16 – Laboratory test configuration for permanent link FEXT loss (ACRF) ................ 44

Figure C.17 – Laboratory test configuration for permanent link TCL measurements .............. 45

Figure C.18 – Laboratory test configuration for permanent link TCTL .................................... 46

Figure C.19 – Direct attach return loss test configuration ...................................................... 47

Figure C.20 – Direct attach cord insertion loss test configuration .......................................... 48

Figure C.21 – Direct attach cord NEXT loss test configuration .............................................. 48

Figure C.22 – Direct attach cord FEXT loss, (ACRF) test configuration ................................. 49

Figure C.23 – Direct attach cord TCL test configuration ........................................................ 49

Figure C.24 – Direct attach cord TCTL test configuration ...................................................... 50

Figure C.25 – Modular cord return loss test configuration ..................................................... 51

Figure C.26 – Modular cord NEXT loss test configuration ..................................................... 51

Figure C.27 – Modular cord FEXT loss, (ACRF) test configuration ........................................ 52

Figure C.28 – Female test connector interface mating dimensions (1) ................................... 58

Figure C.29 – Female test connector interface mating dimensions (2) ................................... 59

Figure C.30 – Balun fixture PCB paddle card interface mating dimensions ............................ 60

Figure C.31 – Balunless fixture PCB paddle card interface mating dimensions ..................... 60

Figure C.32 – Example of a measurement setup for test plug NEXT loss .............................. 64

Figure C.33 – Example of a measurement setup for test plug FEXT loss ............................... 65

Figure C.34 – Direct fixture mating dimensions, top view ...................................................... 67

Figure C.35 – Direct fixture mating dimensions, front view .................................................... 68

Figure C.36 – Direct fixture mating dimensions, side view ..................................................... 68

Figure C.37 – Modular plug placed into the plug clamp ......................................................... 69

Figure C.38 – Guiding the plug into position.......................................................................... 69

Figure C.39 – Calibration planes, test plug phase reference plane, and port extensions ....... 70

Figure C.40 – Examples of direct fixture short, open, load, and through artefacts ................. 72

Figure C.41 – Inter-laboratory return loss variability for testing category 6A connecting

hardware .............................................................................................................................. 74

Figure C.42 – 6-around-1 cable test configuration ................................................................. 78

Figure C.43 – Connecting hardware ANEXT loss measurement setup ................................... 80

---------------------- Page: 7 ----------------------
– 6 – IEC PAS 60512-27-200:2018 © IEC 2018

Figure C.44 – Connecting hardware AFEXT loss measurement setup ................................... 81

Figure C.45 – Example connector configurations for alien crosstalk ...................................... 82

Figure D.1 – Balunless resistor termination network .............................................................. 84

Figure D.2 – Laboratory test configuration for cabling and cable return loss and TCL

measurements ...................................................................................................................... 85

Figure D.3 – Laboratory test configuration for cabling and cable insertion loss, TCTL,

and propagation delay measurements – Alternate test configuration for return loss

and TCL. ............................................................................................................................... 86

Figure D.4 – Laboratory test configuration for cabling and cable NEXT loss .......................... 87

Figure D.5 – Laboratory test configuration for cabling and cable FEXT loss (ACRF) ............. 88

Figure D.6 – Laboratory test configuration for permanent link return loss and TCL

measurements ...................................................................................................................... 90

Figure D.7 – Laboratory test configuration for permanent link insertion loss, TCTL, and

propagation delay measurements – Alternate test configuration for return loss and TCL ....... 91

Figure D.8 – Laboratory test configuration for permanent link NEXT loss

measurements ...................................................................................................................... 92

Figure D.9 – Laboratory test configuration for permanent link FEXT loss (ACRF) .................. 93

Figure D.10 – Balunless direct attach cord return loss test configuration ............................... 95

Figure D.11 – Balunless direct attach insertion loss, TCTL, and propagation delay test

configuration – Alternate test configuration for return loss and TCL ...................................... 96

Figure D.12 – Balunless direct attach cord NEXT loss test configuration ............................... 97

Figure D.13 – Balunless direct attach cord FEXT loss, (ACRF) test configuration ................. 98

Figure D.14 – Balunless modular cord NEXT loss test configuration ..................................... 99

Figure D.15 – Balunless modular cord return loss test configuration ................................... 100

Figure D.16 – Connecting hardware ANEXT loss measurement setup ................................. 102

Figure D.17 – Connecting hardware AFEXT loss measurement setup ................................. 103

Figure E.1 – Test head assembly with baluns attached ....................................................... 104

Figure E.2 – Test head assembly showing shielding between interconnecting sockets ........ 105

Figure E.3 – Plug direct fixture ............................................................................................ 106

Figure E.4 – PCB based plug .............................................................................................. 107

Figure E.5 – PCB based plug assembly with adapter .......................................................... 107

Figure E.6 – An example of a connecting hardware measurement configuration ................. 108

Figure E.7 – Test fixture interface ....................................................................................... 109

Figure E.8 – Open calibration standard applied to balunless test interface .......................... 109

Figure E.9 – Short calibration standard applied to balunless test interface .......................... 110

Figure E.10 – Load calibration standard applied to test interface ........................................ 110

Figure E.11 – A loop back through standard applied to a balunless test interface ............... 111

Figure E.12 – Test plug attached to the test interface ......................................................... 111

Figure E.13 – Direct fixture mounted to the test head interface ........................................... 112

Figure E.14 – Calibration reference plane ........................................................................... 112

Figure E.15 – Back-to-back through calibration ................................................................... 113

Table A.1 – IEC 60603-7 series, 8-way connector types detail specifications and

respective detail connector test procedures standards ........................................................

...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.