IEC 60384-17:2005

Fixed capacitors for use in electronic equipment - Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors

IEC 60384-17:2005 applies to fixed capacitors with metallized electrodes and polypropylene dielectric for use in electronic equipment. Capacitors which have mixed foil and metallized electrodes are also within the scope of this standard. These capacitors may have "self-healing" properties depending on conditions of use. Capacitors covered by this specification are mainly intended for use with alternating voltage and/or for pulse applications. The maximum reactive power applicable is 10 000 var and the maximum peak voltage is 3 000 V. This second edition cancels and replaces the first edition published in 1987 and constitutes minor revisions related to tables, figures and references.

Condensateurs fixes utilisés dans les équipements électroniques - Partie 17: Spécification intermédiaire - Condensateurs fixes pour tension alternative et pour impulsions à diélectrique en film de polypropylène métallisé

La CEI 60384-17:2005 s'applique aux condensateurs fixes à électrodes métallisées et à diélectrique en polypropylène destinés aux équipements électroniques. Les condensateurs équipés à la fois d'électrodes métallisées et d'électrodes en feuille sont également couverts par la présente norme. Ces condensateurs peuvent avoir des propriétés "d'auto-régénération" en fonction des conditions d'utilisation. Les condensateurs couverts par la présente spécification sont principalement destinés à être utilisés dans des applications à impulsions et/ou à tension alternative. La puissance réactive maximale est 10 000 var et la tension de crête maximale est 3 000 V. Cette deuxième édition annule et remplace la première édition parue en 1987. Elle constitue une révision mineure des tableaux, valeurs et références.

General Information

• Status: Published
• Publication Date: 08-Nov-2005
• ICS: 31.060.30 - Paper and plastics capacitors
• Technical Committee: TC 40 - Capacitors and resistors for electronic equipment
• Current Stage: DELPUB - Deleted Publication
• Start Date: 18-Mar-2019
• Completion Date: 26-Oct-2025

Relations

• Revised: IEC 60384-17:2019 - Fixed capacitors for use in electronic equipment - Part 17: Sectional specification - Fixed metallized polypropylene film dielectric AC and pulse capacitors
• Effective Date: 05-Sep-2023

IEC 60384-17:2005 - Overview

IEC 60384-17:2005 is the sectional specification for fixed metallized polypropylene film dielectric a.c. and pulse capacitors used in electronic equipment. This second edition (2005) replaces the 1987 edition with minor revisions to tables, figures and references. The standard covers capacitors with metallized electrodes (including mixed foil/metallized constructions) that may exhibit self‑healing behaviour and are intended primarily for alternating voltage and pulse applications. Key numeric limits in the scope include a maximum reactive power of 10 000 var, a maximum peak voltage of 3 000 V, and a capacitance upper boundary of 20 µF for the devices addressed.

Key topics and requirements

The standard selects and defines preferred ratings, characteristics and quality procedures from the IEC 60384 series to ensure consistent performance for AC/pulse film capacitors. Main topics include:

• Preferred ratings and values (capacitor ratings, tolerances and preferred combinations)
• Performance grades: Grade 1 (long‑life) and Grade 2 (general application)
• Quality assessment procedures: primary manufacture, lot release, qualification approval, and periodic/lot-by-lot inspection
• Test and measurement methods, for example:
  • Visual examination and dimensional checks
  • Electrical tests (capacitance, loss angle/tan δ, insulation resistance)
  • Robustness of terminations, solderability and resistance to soldering heat
  • Environmental and mechanical tests: rapid temperature change, vibration, shock, bump, climatic sequence, damp heat and endurance
  • Charge/discharge and solvent resistance tests
• Marking, detail specification content and required normative references

The document prescribes that any detail specification referring to this sectional specification must meet equal or higher test severities and performance levels.

Applications and who uses this standard

IEC 60384-17 is relevant for:

• Capacitor manufacturers and component engineers specifying metallized polypropylene film capacitors for AC and pulse use
• Design engineers in power electronics, pulse circuits, inverter/filter design and power factor applications
• Quality assurance teams and test laboratories performing component qualification and lot acceptance
• Purchasing and compliance officers ensuring components meet international capacitor standards

This standard helps ensure reliability, safe operating voltages, and predictable behaviour (including self‑healing) in applications requiring film capacitors under AC or pulse stresses.

Related standards

• IEC 60384‑1 - Generic specification for fixed capacitors
• IEC 60384 series (other part numbers for film, foil and electrolytic types)
• IEC 60068‑1 - Environmental testing: general guidance
• IEC 60063 - Preferred number series for resistors and capacitors
• IEC 60384‑14 - Capacitors for electromagnetic interference suppression (excluded from Part 17)

Keywords: IEC 60384-17:2005, metallized polypropylene film capacitors, AC capacitors, pulse capacitors, capacitor test methods, self‑healing capacitors, capacitor standard.

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD 60384-17
QC 301300
Second edition
2005-11
Fixed capacitors for use in electronic equipment –
Part 17:
Sectional specification:
Fixed metallized polypropylene film
dielectric a.c. and pulse capacitors

Reference number
Publication numbering
As from 1 January 1997 all IEC publications are issued with a designation in the

60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1.

Consolidated editions
The IEC is now publishing consolidated versions of its publications. For example,

edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the

base publication incorporating amendment 1 and the base publication incorporating

amendments 1 and 2.
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INTERNATIONAL IEC
STANDARD 60384-17
QC 301300
Second edition
2005-11
Fixed capacitors for use in electronic equipment –
Part 17:
Sectional specification:
Fixed metallized polypropylene film
dielectric a.c. and pulse capacitors

 IEC 2005  Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale V
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60384-17  IEC:2005(E)
CONTENTS
FOREWORD.4

1 General .7

1.1 Scope.7

1.2 Object .7

1.3 Normative references .7

1.4 Information to be given in a detail specification .8
1.5 Terms and definitions .9
1.6 Marking .10
2 Preferred ratings and characteristics .11
2.1 Preferred characteristics .11
2.2 Preferred values of ratings .11
3 Quality assessment procedures.12
3.1 Primary stage of manufacture.12
3.2 Structurally similar components.12
3.3 Certified records of released lots.13
3.4 Qualification approval.13
3.5 Quality conformance inspection.20
4 Test and measurement procedures.22
4.1 Visual examination and check of dimensions.22
4.2 Electrical tests.22
4.3 Robustness of terminations .25
4.4 Resistance to soldering heat .25
4.5 Solderability .25
4.6 Rapid change of temperature .25
4.7 Vibration.25
4.8 Bump .26
4.9 Shock.26
4.10 Climatic sequence .27
4.11 Damp heat, steady state.28
4.12 Endurance.28

4.13 Charge and discharge .30
4.14 Component solvent resistance.30
4.15 Solvent resistance of the marking.30

Bibliography.31

Table 1 – Preferred values.10
Table 2 – Preferred combinations .12
Table 3 – Sampling plan together with numbers of permissible defectives
for qualification approval tests for a.c. and pulse capacitors .14
Table 4 – Test schedule for qualification approval.15
Table 5 – Lot-by-lot inspection .21

60384-17  IEC:2005(E) – 3 –
Table 6 – Periodic inspection .21

Table 7 – Tangent of loss angle .23

Table 8 – Insulation resistance requirements .23

Table 9 – Correction factors.24

Table 10 – Characteristics at lower category temperature .24

Table 11 – Characteristics at upper category temperature .24

Table 12 – Preferred severities .26

– 4 – 60384-17  IEC:2005(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION

____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 17: Sectional specification: Fixed metallized

polypropylene film dielectric a.c. and pulse capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
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members of its technical committees and IEC National Committees for any personal injury, property damage or
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-17 has been prepared by IEC technical committee 40:

Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 1987 and constitutes
minor revisions related to tables, figures and references.
The text of this standard is based on the following documents:
FDIS Report on voting
40/1597/FDIS 40/1630/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

60384-17  IEC:2005(E) – 5 –
IEC 60384 consists of the following parts, under the (new) general title Fixed capacitors for

use in electronic equipment:
Part 1: Generic specification

Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric

d.c. capacitors
Part 3: Sectional specification: Fixed tantalum chip capacitors

Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid
electrolyte
Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated voltage

not exceeding 3000 V – Selection of methods of test and general requirements
Part 6: Sectional specification: Fixed metallized polycarbonate film dielectric d.c.
capacitors
Part 7: Sectional specification: Fixed polystyrene film dielectric metal foil d.c. capacitors
Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1
Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2
Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil
d.c. capacitors
Part 12: Sectional specification: Fixed polycarbonate film dielectric metal foil d.c.
capacitors
Part 13:  Sectional specification: Fixed polypropylene film dielectric metal foil d.c.
capacitors
Part 14: Sectional specification: Fixed capacitors for electromagnetic interference
suppression and connection to the supply mains
Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid
electrolyte
Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c.
capacitors
Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and
pulse capacitors
Part 18: Sectional specification: Fixed aluminium electrolytic chip capacitors with solid and
non-solid electrolyte
Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric
chip d.c. capacitors
Part 20: Sectional specification: Fixed metallized polyphenylene sulfide film dielectric chip
d.c. capacitors
Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 1
Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 2
Part 23: Sectional specification: Fixed surface mount metallized polyethylene naphthalate
film dielectric d.c. capacitors
Part 24: Sectional specification – Surface mount fixed tantalum electrolytic capacitors with
conductive polymer solid electrolyte (under consideration)
Part 25: Sectional specification – Surface mount fixed aluminium electrolytic capacitors
with conductive polymer solid electrolyte (under consideration)
All sectional specifications mentioned above do have one or more blank detail specifications
being a supplementary document, containing requirements for style, layout and minimum
content of detail specifications.

– 6 – 60384-17  IEC:2005(E)
The QC 301300 number that appears on the front cover of this publication is the specification

number in the IECQ Quality Assessment System for Electronic Components.

The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in

the data related to the specific publication. At this date, the publication will be

• reconfirmed;
• withdrawn;
• replaced by a revised edition, or

• amended.
A bilingual version of this publication may be issued at a later date.

60384-17  IEC:2005(E) – 7 –
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 17: Sectional specification: Fixed metallized

polypropylene film dielectric a.c. and pulse capacitors

1 General
1.1 Scope
This part of IEC 60384 applies to fixed capacitors with metallized electrodes and poly-
propylene dielectric for use in electronic equipment.
NOTE  Capacitors which have mixed foil and metallized electrodes are also within the scope of this standard.
These capacitors may have "self-healing" properties depending on conditions of use.
Capacitors covered by this specification are mainly intended for use with alternating voltage
and/or for pulse applications. The maximum reactive power applicable is 10 000 var and the
maximum peak voltage is 3 000 V.
Capacitors for reactive power exceeding 500 var and to which a maximum peak voltage of
2 500 V at 50 Hz can be applied are not covered by this standard, except when they are the
highest part of a range of reactive power mainly situated below 500 var at 50 Hz.
This standard is not intended to cover capacitance values higher than 20 µF.
Two performance grades of capacitors are covered, Grade 1 for long-life application and
Grade 2 for general application.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
Capacitors for electrical shock hazard protection (covered by IEC 60065) and fluorescent
lamp and motor capacitors (covered by IEC technical committee 33, and IEC technical
committee 34) are also excluded.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select

from IEC 60384-1, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of an equal or higher performance level, because lower performance
levels are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
– 8 – 60384-17  IEC:2005(E)
IEC 60068-1, Environmental testing – Part 1: General and guidance

IEC 60384-1, Fixed capacitors for use in electronic equipment – Part 1: Generic specification

IEC 60384-17-1, Fixed capacitors for use in electronic equipment – Part 17: Blank detail

specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors.
Assessment level E
IEC 60410, Sampling plans and procedures for inspection by attributes

ISO 3, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE  The information given in 1.4.1 may for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect
interchangeability and mounting, shall be given in the detail specification. All dimensions shall
preferably be stated in millimetres.
Normally, the numerical values shall be given for the length of the body, the width and height
of the body and the wire spacing, or for cylindrical types, the body diameter, and the length
and diameter of the terminations. When necessary, for example when a number of items
(capacitance values/voltage ranges) are covered by a detail specification, the dimensions and
their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not

designed for use on printed boards, this shall be clearly stated in the detail specification
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case, the detail specification shall describe
the mounting fixtures and they shall be used in the application of the vibration and bump or
shock tests.
1.4.3 Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following:

60384-17  IEC:2005(E) – 9 –
1.4.3.1 Rated capacitance range

See 2.2.1.
NOTE  When products approved to the detail specification have different ranges, the following statement should
be added:
"The range of values available in each voltage range is given in IEC QC 001005."

1.4.3.2 Sinusoidal current (if applicable)

The detail specification shall state the derating curve of the sinusoidal current versus

temperature with reference to 70 °C, and the derating curve of the sinusoidal current versus

frequency and of the sinusoidal current versus capacitance.
1.4.3.3 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.4 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat test.
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification, shall be specifically stated.
1.5 Terms and definitions
For the purposes of this document the terms and definitions given in IEC 60384-1 and the
following apply.
1.5.1
Performance grades
1.5.1.1
performance grade 1 capacitors (long-life)
capacitors intended for long-life applications with stringent requirements for the electrical
parameters
1.5.1.2
performance grade 2 capacitors (general purpose)
capacitors for general application where the stringent requirements of performance grade 1
are not necessary
1.5.2
stability grade
capacitance drift after climatic and mechanical tests and after endurance tests.
NOTE The performance grade and the stability grade must be noted in the detail specification
1.5.3
performance grade and stability grade combinations (if stability grade is required for
a.c. and pulse capacitors)
see the table below for preferred values:

– 10 – 60384-17  IEC:2005(E)
Table 1 – Preferred values
Performance Stability Combination

grades grades designations
1 1.1
2 1.2
2 – 2
The three combinations concern capacitance stability and tan δ values. Distinction in

performance of the three combinations is shown in Table 4.

1.5.4
rated voltages
NOTE  The sum of the d.c. voltage and the peak a.c. voltage or the peak pulse voltage applied to the capacitor
must not exceed the rated voltage. The value of the peak a.c. voltage allowed at different frequencies is under
consideration.
1.5.4.1
rated d.c. voltage
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
1.5.4.2
rated a.c. voltage
maximum r.m.s. alternating voltage which may be applied continuously to a capacitor at the
rated temperature and at a given frequency
1.5.4.3
rated pulse voltage
peak value of the pulse voltage which may be applied continuously to a capacitor at the rated
temperature and at a given frequency
1.5.5
(dU )
rated voltage pulse slope (if applicable)
(dt)
R
dU
maximum admissible value of the voltage slope of a pulse, at the rated temperature at
dt
such a repetition frequency that no significant increase of temperature occurs
1.6 Marking
See 2.4 of IEC 60384-1, with the following details:
1.6.1  The information given in the marking is normally selected from the following list; the
relative importance of each item is indicated by its position in the list:
a) rated capacitance;
b) rated a.c. and/or pulse voltage (a.c. voltage may be indicated by the symbol ~) and the
corresponding frequency if different from 50 Hz;
c) tolerance on rated capacitance;
d) rated voltage pulse slope (if applicable);
e) rated current and corresponding frequency (if applicable);
f) year and month (or week) of manufacture;

60384-17  IEC:2005(E) – 11 –
g) manufacturer's name or trade mark;

h) climatic category;
i) manufacturer's type designation;

j) reference to the detail specification.

1.6.2  The capacitor shall be clearly marked with a), b) and c) above and with as many as

possible of the remaining items as is considered necessary. Any duplication of information in

the marking on the capacitor should be avoided.

1.6.3  The package containing the capacitor(s) shall be clearly marked with all the

information listed in 1.6.1.
1.6.4  Any addition marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following:
2.1.1 Preferred climatic categories
The capacitors covered by this specification are classified into climatic categories according
to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature:  –55 °C, –40 °C, –25 °C and –10 °C
Upper category temperature:  +70 °C, +85 °C; +100 °C and +105 °C
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Rated capacitance (C )
R
Preferred values of rated capacitance are values chosen from the E series of preferred values

given in IEC 60063.
2.2.2 Tolerances on rated capacitance
The preferred tolerances on the rated capacitance are ±20 %; ±10 %; ±5 %; ±2 %; ±1 %.
2.2.3 Rated capacitance with associated tolerance values
For preferred combinations of capacitance series and tolerances see the table below:

– 12 – 60384-17  IEC:2005(E)
Table 2 – Preferred combinations

Preferred combinations
Series Tolerances
E  6 ±20 %
E 12 ±10 %
E 24  ±5 %
E 48  ±2 %
E 96  ±1 %
2.2.4 Rated a.c. voltage (U or U )
Ra.c. R~
The frequency for the rated a.c. voltage shall be 50/60 Hz unless the detail specification
prescribes a higher frequency.
The preferred values of rated a.c. voltage (r.m.s. value) shall be chosen from the R10 or R20
series given in ISO 3.
The detail specification shall give the derating curve of the admissible r.m.s. voltage versus
temperature (higher than rated temperature) and, if applicable, versus frequency.
2.2.5 Category a.c. voltage (U or U )
Ca.c. C~
The category a.c. voltage is equal to the rated a.c. voltage U for upper category
Ra.c.
temperatures up to 85 °C. For an upper category temperature >85 °C the category a.c.
voltage is 0,7 U .
R~
2.2.6 Rated temperature
The standard value for rated temperature is 85 °C. Except for upper category temperature of
70 °C, the rated temperature is 70 °C.
NOTE  AC rated temperature is 15 °C less than d.c. rated temperature.
2.2.7 Rated a.c. current (when required in the detail specification)
The detail specification shall state:
– the frequency
– the r.m.s. value of the rated a.c. current applicable at the specified frequency (value

chosen from R10 or R20 series)
– the derating curve of the admissible a.c. current versus ambient temperature.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.

60384-17  IEC:2005(E) – 13 –
3.3 Certified records of released lots

The information required in IEC 60384-1, 3.9, shall be made available when prescribed in the

detail specification and when requested by a purchaser. After the endurance test the

parameters for which variables information is required are the capacitance change, tan δ. The

insulation resistance is only required by attribute.

3.4 Qualification approval
The procedures for qualification approval testing are given in the generic specification

IEC 60384-1, 3.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5 of this specification. The procedure using a fixed sample size
schedule is given in 3.4.1 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
3.4.1.1 Sampling
The fixed sample size procedure is described in IEC 60384-1, 3.5.3 b). The sample shall be
representative of the range of capacitors for which approval is sought. This may or may not be
the complete range covered by the detail specification.
The sample shall consist of specimens having the lowest and highest voltages, and for these
voltages the lowest and highest capacitances. When there are more than four rated voltages
an intermediate voltage shall also be tested. Thus for the approval of a range, testing is
required of either four or six values (capacitance/voltage combinations). When the range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
Spare specimens are permitted as follows:
Two (for six values) or three (for four values) per value which may be used as replacements
for specimens which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that

required for the additional groups.
Table 3 gives the number of samples to be tested in each group or subgroup together with the
permissible number of defectives for qualification approval tests.
3.4.1.2 Tests
The complete series of tests specified in Tables 3 and 4 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found defective during the tests of Group 0 shall not be used for the other groups.

– 14 – 60384-17  IEC:2005(E)
"One defective" is counted when a capacitor has not satisfied the whole or a part of the tests

of a group.
The approval is granted when the number of defectives does not exceed the specified number

of permissible defectives for each group or subgroup and the total number of permissible

defectives.
NOTE  Tables 3 and 4 together form the fixed sample size test schedule, for which Table 3 includes the details for
the sampling and permissible defectives for the different tests or groups of tests, whereas Table 4 together with

the details of tests contained in Clause 4 gives a complete summary of test conditions and performance

requirements and indicates where, for example for the test method or conditions of test a choice has to be made in

the detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule must be identical to
those prescribed in the detail specification for quality conformance inspection.
Table 3 – Sampling plan together with numbers of permissible defectives for
qualification approval tests for a.c. and pulse capacitors
Group Test Subclause Number of specimens (n)
No. of this and number of non-conformances (c)
publication
Per For four or less For six values
c c
values
value to be tested
c
to be tested
4 n c c 6 n c c
n
total total
Visual examination 4.1
Marking 1.6
Dimensions 4.1
b b
Capacitance 4.2.2 29 116 2 174 3
Tangent of loss angle 4.2.3
e e e
Voltage proof 4.2.1 (+5) (+20) (+30)
e e e
Insulation resistance 4.2.4 (+5) (+20) (+30)
e
Inductance 4.2.5
e
Sealing
Spare specimens 2 8 12
1A Robustness of terminations 4.3 3 12 1 18 1
Resistance to soldering heat 4.4
Component solvent resistance 4.14

b
Solderability     4.5 6 24 1 36 2
Solvent resistance of the marking     4.15
1B Rapid change of temperature     4.6
Vibration     4.7
a
Bump or shock  4.8 or 4.9
1 Climatic sequence 4.10 9 36 2 4 54 3 6
b
2 Damp heat, steady state 4.11 5 20 1 30 2
b b
3 Endurance test at 50 Hz/60 HZ 4.12.1 10 40 3 60 4

alternating voltage
b b
Endurance test with sinusoidal 4.12.2 5 20 1 30 2
e
current or voltage
e b b
Pulse endurance test 4.12.3 5 20 1 30 2
e
4,2,6 5 20 1 30 2
Temperature characteristics
d
4 4.13
Charge and discharge
a
As required in the detail specification.
b
Not more than one defective is permitted from any one value.
c
Capacitance-voltage combinations, see 3.4.1.
d
Not required when pulse endurance test is required.
e
If required in the detail specification.

60384-17  IEC:2005(E) – 15 –
Table 4 – Test schedule for qualification approval

a a a
Subclause number and test D Conditions of test Number of Performance requirements

or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
Group 0 ND See Table 3
4.1 Visual examination   As in 4.1

Legible marking and as
specified in the detail
specification
4.1 Dimensions (detail)   See detail specification
4.2.2 Capacitance   Within specified tolerance
4.2.3 Tangent of loss angle Frequency: 1 kHz  As in 4.2.3.2
(tan δ)
4.2.1 Voltage proof See detail specification for  No breakdown or flashover
the method
4.2.4 Insulation resistance See detail specification for  As in 4.2.4.2
for the method
4.2.5 Inductance
Inductance: ≤. mH
(if applicable)
(see detail specification)
Sealing (if applicable) See detail specification for
No seepage of impregnant
the method or harmful deformation of
the case
Group 1A D See Table 3
4.3.1 Initial measurements Capacitance
Tangent of loss angle:
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.3 Robustness of Visual examination  No visible damage
terminations
4.4 Resistance to No pre-drying
soldering heat See detail specification for
the method (1A or 1B)
4.14 Component solvent Solvent: .  See detail specification
resistance (if Solvent temperature: .
applicable) Method 2
Recovery: .
4.4.2 Final measurements Visual examination  No visible damage
Legible marking
Capacitance
ΔC/C for Grade 1.1: ≤1 %
Grade 1.2: ≤2 %
Grade 2:  ≤3 %
of value measured in 4.3.1
Tangent of loss angle
Increase of tan δ
for C ≤ 1 µF:
for Grade 1.1: ≤0,001
Grade 1.2: ≤0,002
Grade 2:  ≤0,004
for C > 1 µF: see detail speci-
fication, compared to
values measured in
4.3.1
– 16 – 60384-17  IEC:2005(E)
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements
a
test or specimens (n)
ND and number of
b
permissible non-
conformances (c)
Group 1B D See Table 3
4.5 Solderability Without ageing Good tinning as evidenced by free

See detail specification for the flowing of the solder with wetting of

method the terminations or solder shall flow
within . . . s, as applicable
4.15 Solvent resistance of Solvent: . Legible marking
the marking Solvent temperature: .
(if applicable) Method 1
Rubbing material:
cotton wool
Recovery: .
4.6.1 Initial measurements Capacitance
Tangent of loss angle:
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.6 Rapid change of T = Lower category
A
temperature temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
No visible damage
Visual examination
4.7 Vibration For mounting method
see detail specification
Procedure B4
Frequency range:
from . . . Hz to . . . Hz
Amplitude: 0,75 mm or
acceleration 98 m/s
(whichever is the less severe)
Total duration: 6 h
4.7.2 Final inspection Visual examination  No visible damage
4.8 Bump (or shock, see For mounting method
4.9)  see detail specification
Number of bumps: .
Acceleration: . m/s
Duration of pulse: . ms
4.9 Shock (or bump, see For mounting method
4.8)  see detail specification
Number of bumps: .
Acceleration: . m/s
Duration of pulse: . ms
4.8.3 or 4.9.3
Final measurements Visual examination No visible damage
ΔC/C for Grade 1.1: ≤1 %
Grade 1.2: ≤2 %
Grade 2:  ≤3 %
of value measured in 4.6.1
Capacitance
Tangent of loss angle  Increase of tan δ:
for C ≤ 1 µF:
for Grade 1.1: ≤0,001
Grade 1.2: ≤0,002
Grade 2:  ≤0,004
for C > 1 µF: see detail
specification, compared
to values measured in 4.6.1
Insulation resistance  ≥50 % of values in 4.2.4.2

60384-17  IEC:2005(E) – 17 –
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements

a
test or specimens (n)
ND and number of
b
permissible non-
conformances (c)
Group 1 D See Table 3
4.10 Climatic sequence
4.10.2 Dry heat Temperature: upper

category temperature
Duration: 16 h
4.10.3 Damp heat, cyclic,
Test Db, first cycle
4.10.4 Cold Temperature: lower
category temperature
Duration: 2 h
4.10.5 Low air pressure  Air pressure: 8 kPa
(if required by the
detail specification)
No permanent breakdown,
4.10.5.3 Final measurement Visual examination
flashover or harmful
deformation of the case
4.10.6 Damp heat, cyclic,
Test Db, remaining
cycles
4.10.6.2 Final measurement Visual examination  No visible damage
Legible marking
Capacitance
ΔC/C for Grade 1.1: ≤1 %
Grade 1.2: ≤3 %
Grade 2:  ≤5 %
of value measured in 4.4.2,
4.8.3 or 4.9.3 as applicable
Tangent of loss angle
Increase of tan δ:
for C ≤ 1 µF:
for Grade 1.1: ≤0,0015
Grade 1.2: ≤0,003
Grade 2:  ≤0,005
for C > 1 µF: see detail
specification, compared
to values measured in 4.3.1
or 4.6.1 as applicable
Insulation resistance
≥50 % of values in 4.2.4.2
Group 2
D See Table 3
4.11 Damp heat, steady
state
4.11.1 Initial Capacitance
measurements
Tangent of loss angle at
1 kHz
4.11.3 Final measurements Visual examination  No visible damage
Legible marking
Capacitance
ΔC/C for Grade 1.1: ≤1 %
Grade 1.2: ≤3 %
Grade 2:  ≤5 %
of value measured in 4.11.1
– 18 – 60384-17  IEC:2005(E)
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements

a
test or specimens (n)
b
ND and number of
permissible non-
conformances (c)
Group 2 (continued)  See Table 3

Tangent of loss angle
Increase of tan δ:
for C ≤ 1 µF:
for Grade 1: ≤0,001
Grade 2: ≤0,002
for C > 1 µF: see detail
specification, compared to
values measured in 4.11.1
Insulation resistance  ≥50 % of values in 4.2.4.2
Group 3A D See Table 3
4.12.1 Endurance test at Duration:
50/60 Hz alternating Grade 1: 2 000 h
voltage (if Grade 2: 1 000 h
applicable)
4.12.1.1 Initial measurements Capacitance
Tangent of loss angle
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.12.1.3 Final measurements Visual examination  No visible damage
Legible marking
ΔC/C for Grade 1: ≤5 %
Capacitance
Grade 2: ≤10 %
of value measured in 4.12.1.1
Tangent of loss angle
Increase of tan δ:
for C ≤ 1 µF:
for Grade 1: ≤0,0015
Grade 2: ≤0,003
for C > 1 µF: see detail
specification, compared to
values measured in
4.12.1.1
Insulation resistance
≥50 % of values in 4.2.4.2
c
Group 3B D See Table 3
4.12.2 Endurance test with Duration:
sinusoidal current or Grade 1: 2 000 h
voltage (if
Grade 2: 1 000 h
applicable) Frequency:. Hz
Capacitance
4.12.2.1 Initial measurements
Tangent of loss angle
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.12.2.3 Final measurements Visual examination  No visible damage
Legible marking
Capacitance
ΔC/C for Grade 1: ≤5 %
Grade 2: ≤10 %
of value measured in 4.12.2.1
60384-17  IEC:2005(E) – 19 –
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements
a
test or specimens (n)
b
ND and number of
permissible non-
conformances (c)
c
Group 3B (continued)  See Table 3

Tangent of loss angle
Increase of tan δ:
for C ≤ 1 µF:
for Grade 1: ≤0,0015
Grade 2: ≤0,003
for C > 1 µF: see detail
specification, compared to
values measured in
4.12.2.1
Insulation resistance  ≥50 % of values in 4.2.4.2
c
Group 3C D See Table 3
4.12.3 Pulse endurance Duration:
test (if applicable)
Grade 1: 2 000 h
Grade 2: 1 000 h
Pulse repetition rate: . Hz
Discharge time constant: as
in 4.12.3.2
Applied peak voltage: equal
to the rated peak voltage
(see detail specification)
4.12.3.1 Initial measurements Capacitance
Tangent of loss angle:
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.12.3.3 Final measurements Visual examination No visible damage
Legible marking
Capacitance
ΔC/C for Grade 1: ≤5 %
Grade 2: ≤10 %
of value measured in 4.12.3.1
Tangent of loss angle Increase of tan δ:
for C ≤ 1 µF:
for Grade 1: ≤0,0015
Grade 2: ≤0,003
for C > 1 µF: see detail
specification, compared to
values measured in
4.12.3.1
Insu
...

IEC 60384-17 ®
Edition 2.0 2005-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 17: Sectional specification: Fixed metallized polypropylene film dielectric
a.c. and pulse capacitors
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 17: Spécification intermédiaire – Condensateurs fixes pour tension
alternative et pour impulsions à diélectrique en film de polypropylène métallisé

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IEC 60384-17 ®
Edition 2.0 2005-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 17: Sectional specification: Fixed metallized polypropylene film dielectric

a.c. and pulse capacitors
Condensateurs fixes utilisés dans les équipements électroniques –

Partie 17: Spécification intermédiaire – Condensateurs fixes pour tension

alternative et pour impulsions à diélectrique en film de polypropylène métallisé

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 31.060.30 ISBN 978-2-83220-603-4

– 2 – 60384-17  IEC:2005
CONTENTS
FOREWORD . 4

1 General . 7

1.1 Scope . 7

1.2 Object . 7

1.3 Normative references . 7

1.4 Information to be given in a detail specification . 8
1.5 Terms and definitions . 9
1.6 Marking . 10
2 Preferred ratings and characteristics . 11
2.1 Preferred characteristics . 11
2.2 Preferred values of ratings . 11
3 Quality assessment procedures . 12
3.1 Primary stage of manufacture . 12
3.2 Structurally similar components . 12
3.3 Certified records of released lots . 13
3.4 Qualification approval . 13
3.5 Quality conformance inspection . 20
4 Test and measurement procedures . 22
4.1 Visual examination and check of dimensions . 22
4.2 Electrical tests . 22
4.3 Robustness of terminations . 25
4.4 Resistance to soldering heat . 25
4.5 Solderability . 25
4.6 Rapid change of temperature . 25
4.7 Vibration. 25
4.8 Bump . 26
4.9 Shock . 26
4.10 Climatic sequence . 27
4.11 Damp heat, steady state . 28
4.12 Endurance . 28
4.13 Charge and discharge . 30

4.14 Component solvent resistance . 30
4.15 Solvent resistance of the marking . 30

Bibliography . 31

Table 1 – Preferred values . 10
Table 2 – Preferred combinations . 12
Table 3 – Sampling plan together with numbers of permissible defectives
for qualification approval tests for a.c. and pulse capacitors . 14
Table 4 – Test schedule for qualification approval. 15
Table 5 – Lot-by-lot inspection . 21

60384-17  IEC:2005 – 3 –
Table 6 – Periodic inspection . 21

Table 7 – Tangent of loss angle . 23

Table 8 – Insulation resistance requirements . 23

Table 9 – Correction factors . 24

Table 10 – Characteristics at lower category temperature . 24

Table 11 – Characteristics at upper category temperature . 24

Table 12 – Preferred severities . 26

– 4 – 60384-17  IEC:2005
INTERNATIONAL ELECTROTECHNICAL COMMISSION

______________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 17: Sectional specification: Fixed metallized

polypropylene film dielectric a.c. and pulse capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-17 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This second edition cancels and replaces the first edition published in 1987 and constitutes
minor revisions related to tables, figures and references.
This bilingual version (2013-01) corresponds to the monolingual English version, published in
2005-11.
The text of this standard is based on the following documents:
FDIS Report on voting
40/1597/FDIS 40/1630/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

60384-17  IEC:2005 – 5 –
The French version of this standard has not been voted upon.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

IEC 60384 consists of the following parts, under the (new) general title Fixed capacitors for

use in electronic equipment:
Part 1: Generic specification

Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric

d.c. capacitors
Part 3: Sectional specification: Fixed tantalum chip capacitors

Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid
electrolyte
Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated voltage
not exceeding 3000 V – Selection of methods of test and general requirements
Part 6: Sectional specification: Fixed metallized polycarbonate film dielectric d.c.
capacitors
Part 7: Sectional specification: Fixed polystyrene film dielectric metal foil d.c. capacitors
Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, Class 1
Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, Class 2
Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil
d.c. capacitors
Part 12: Sectional specification: Fixed polycarbonate film dielectric metal foil d.c.
capacitors
Part 13:  Sectional specification: Fixed polypropylene film dielectric metal foil d.c.
capacitors
Part 14: Sectional specification: Fixed capacitors for electromagnetic interference
suppression and connection to the supply mains
Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid
electrolyte
Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c.
capacitors
Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and
pulse capacitors
Part 18: Sectional specification: Fixed aluminium electrolytic chip capacitors with solid and
non-solid electrolyte
Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric
chip d.c. capacitors
Part 20: Sectional specification: Fixed metallized polyphenylene sulfide film dielectric chip
d.c. capacitors
Part 21: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 1
Part 22: Sectional specification: Fixed surface mount multilayer capacitors of ceramic
dielectric, Class 2
Part 23: Sectional specification: Fixed surface mount metallized polyethylene naphthalate
film dielectric d.c. capacitors
Part 24: Sectional specification – Surface mount fixed tantalum electrolytic capacitors with
conductive polymer solid electrolyte (under consideration)
Part 25: Sectional specification – Surface mount fixed aluminium electrolytic capacitors
with conductive polymer solid electrolyte (under consideration)

– 6 – 60384-17  IEC:2005
All sectional specifications mentioned above do have one or more blank detail specifications

being a supplementary document, containing requirements for style, layout and minimum

content of detail specifications.

The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in

the data related to the specific publication. At this date, the publication will be

• reconfirmed;
• withdrawn;
• replaced by a revised edition, or

• amended.
60384-17  IEC:2005 – 7 –
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 17: Sectional specification: Fixed metallized

polypropylene film dielectric a.c. and pulse capacitors

1 General
1.1 Scope
This part of IEC 60384 applies to fixed capacitors with metallized electrodes and poly-
propylene dielectric for use in electronic equipment.
NOTE Capacitors which have mixed foil and metallized electrodes are also within the scope of this standard.
These capacitors may have "self-healing" properties depending on conditions of use.
Capacitors covered by this specification are mainly intended for use with alternating voltage
and/or for pulse applications. The maximum reactive power applicable is 10 000 var and the
maximum peak voltage is 3 000 V.
Capacitors for reactive power exceeding 500 var and to which a maximum peak voltage of
2 500 V at 50 Hz can be applied are not covered by this standard, except when they are the
highest part of a range of reactive power mainly situated below 500 var at 50 Hz.
This standard is not intended to cover capacitance values higher than 20 µF.
Two performance grades of capacitors are covered, Grade 1 for long-life application and
Grade 2 for general application.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
Capacitors for electrical shock hazard protection (covered by IEC 60065) and fluorescent
lamp and motor capacitors (covered by IEC technical committee 33, and IEC technical
committee 34) are also excluded.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of an equal or higher performance level, because lower performance
levels are not permitted.
1.3 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60063:1963, Preferred number series for resistors and capacitors
Amendment 1 (1967)
Amendment 2 (1977)
– 8 – 60384-17  IEC:2005
IEC 60068-1, Environmental testing – Part 1: General and guidance

IEC 60384-1, Fixed capacitors for use in electronic equipment – Part 1: Generic specification

IEC 60384-17-1, Fixed capacitors for use in electronic equipment – Part 17: Blank detail

specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors.
Assessment level E
IEC 60410, Sampling plans and procedures for inspection by attributes

ISO 3, Preferred numbers – Series of preferred numbers
1.4 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
NOTE The information given in 1.4.1 may for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.1 Outline drawing and dimensions
There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect
interchangeability and mounting, shall be given in the detail specification. All dimensions shall
preferably be stated in millimetres.
Normally, the numerical values shall be given for the length of the body, the width and height
of the body and the wire spacing, or for cylindrical types, the body diameter, and the length
and diameter of the terminations. When necessary, for example when a number of items
(capacitance values/voltage ranges) are covered by a detail specification, the dimensions and
their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor. When the capacitor is not

designed for use on printed boards, this shall be clearly stated in the detail specification
1.4.2 Mounting
The detail specification shall specify the method of mounting to be applied for normal use and
for the application of the vibration and the bump or shock tests. The capacitors shall be
mounted by their normal means. The design of the capacitor may be such that special
mounting fixtures are required in its use. In this case, the detail specification shall describe
the mounting fixtures and they shall be used in the application of the vibration and bump or
shock tests.
1.4.3 Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this
specification, together with the following:

60384-17  IEC:2005 – 9 –
1.4.3.1 Rated capacitance range

See 2.2.1.
NOTE When products approved to the detail specification have different ranges, the following statement should
be added:
"The range of values available in each voltage range is given in IEC QC 001005."

1.4.3.2 Sinusoidal current (if applicable)

The detail specification shall state the derating curve of the sinusoidal current versus

temperature with reference to 70 °C, and the derating curve of the sinusoidal current versus

frequency and of the sinusoidal current versus capacitance.
1.4.3.3 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.3.4 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat test.
1.4.4 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
package. Deviations from 1.6 of this sectional specification, shall be specifically stated.
1.5 Terms and definitions
For the purposes of this document the terms and definitions given in IEC 60384-1 and the
following apply.
1.5.1
Performance grades
1.5.1.1
performance grade 1 capacitors (long-life)
capacitors intended for long-life applications with stringent requirements for the electrical
parameters
1.5.1.2
performance grade 2 capacitors (general purpose)
capacitors for general application where the stringent requirements of performance grade 1
are not necessary
1.5.2
stability grade
capacitance drift after climatic and mechanical tests and after endurance tests.
NOTE The performance grade and the stability grade must be noted in the detail specification.
1.5.3
performance grade and stability grade combinations (if stability grade is required for
a.c. and pulse capacitors)
see the table below for preferred values:

– 10 – 60384-17  IEC:2005
Table 1 – Preferred values
Performance Stability Combination

grades grades designations
1 1.1
2 1.2
2 – 2
The three combinations concern capacitance stability and tan δ values. Distinction in

performance of the three combinations is shown in Table 4.

1.5.4
rated voltages
NOTE The sum of the d.c. voltage and the peak a.c. voltage or the peak pulse voltage applied to the capacitor
must not exceed the rated voltage. The value of the peak a.c. voltage allowed at different frequencies is under
consideration.
1.5.4.1
rated d.c. voltage
maximum d.c. voltage which may be applied continuously to a capacitor at the rated
temperature
1.5.4.2
rated a.c. voltage
maximum r.m.s. alternating voltage which may be applied continuously to a capacitor at the
rated temperature and at a given frequency
1.5.4.3
rated pulse voltage
peak value of the pulse voltage which may be applied continuously to a capacitor at the rated
temperature and at a given frequency
1.5.5
(dU )
rated voltage pulse slope (if applicable)
(dt)
R
dU
maximum admissible value of the voltage slope of a pulse, at the rated temperature at
dt
such a repetition frequency that no significant increase of temperature occurs
1.6 Marking
See 2.4 of IEC 60384-1, with the following details:
1.6.1 The information given in the marking is normally selected from the following list; the
relative importance of each item is indicated by its position in the list:
a) rated capacitance;
b) rated a.c. and/or pulse voltage (a.c. voltage may be indicated by the symbol ~) and the
corresponding frequency if different from 50 Hz;
c) tolerance on rated capacitance;
d) rated voltage pulse slope (if applicable);
e) rated current and corresponding frequency (if applicable);
f) year and month (or week) of manufacture;

60384-17  IEC:2005 – 11 –
g) manufacturer's name or trade mark;

h) climatic category;
i) manufacturer's type designation;

j) reference to the detail specification.

1.6.2 The capacitor shall be clearly marked with a), b) and c) above and with as many as

possible of the remaining items as is considered necessary. Any duplication of information in

the marking on the capacitor should be avoided.

1.6.3 The package containing the capacitor(s) shall be clearly marked with all the

information listed in 1.6.1.
1.6.4 Any addition marking shall be so applied that no confusion can arise.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following:
2.1.1 Preferred climatic categories
The capacitors covered by this specification are classified into climatic categories according
to the general rules given in IEC 60068-1.
The lower and upper category temperatures and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature:  –55 °C, –40 °C, –25 °C and –10 °C
Upper category temperature:  +70 °C, +85 °C; +100 °C and +105 °C
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Rated capacitance (C )
R
Preferred values of rated capacitance are values chosen from the E series of preferred values

given in IEC 60063.
2.2.2 Tolerances on rated capacitance
The preferred tolerances on the rated capacitance are ±20 %; ±10 %; ±5 %; ±2 %; ±1 %.
2.2.3 Rated capacitance with associated tolerance values
For preferred combinations of capacitance series and tolerances see the table below:

– 12 – 60384-17  IEC:2005
Table 2 – Preferred combinations

Preferred combinations
Series Tolerances
E  6 ±20 %
E 12 ±10 %
E 24  ±5 %
E 48  ±2 %
E 96  ±1 %
2.2.4 Rated a.c. voltage (U or U )
Ra.c. R~
The frequency for the rated a.c. voltage shall be 50/60 Hz unless the detail specification
prescribes a higher frequency.
The preferred values of rated a.c. voltage (r.m.s. value) shall be chosen from the R10 or R20
series given in ISO 3.
The detail specification shall give the derating curve of the admissible r.m.s. voltage versus
temperature (higher than rated temperature) and, if applicable, versus frequency.
or U )
2.2.5 Category a.c. voltage (U
Ca.c. C~
The category a.c. voltage is equal to the rated a.c. voltage U for upper category
Ra.c.
temperatures up to 85 °C. For an upper category temperature >85 °C the category a.c.
voltage is 0,7 U .
R~
2.2.6 Rated temperature
The standard value for rated temperature is 85 °C. Except for upper category temperature of
70 °C, the rated temperature is 70 °C.
NOTE AC rated temperature is 15 °C less than d.c. rated temperature.
2.2.7 Rated a.c. current (when required in the detail specification)
The detail specification shall state:
– the frequency
– the r.m.s. value of the rated a.c. current applicable at the specified frequency (value

chosen from R10 or R20 series)
– the derating curve of the admissible a.c. current versus ambient temperature.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and values.

60384-17  IEC:2005 – 13 –
3.3 Certified records of released lots

The information required in IEC 60384-1, 3.9, shall be made available when prescribed in the

detail specification and when requested by a purchaser. After the endurance test the

parameters for which variables information is required are the capacitance change, tan δ. The

insulation resistance is only required by attribute.

3.4 Qualification approval
The procedures for qualification approval testing are given in the generic specification

IEC 60384-1, 3.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5 of this specification. The procedure using a fixed sample size
schedule is given in 3.4.1 below.
3.4.1 Qualification approval on the basis of the fixed sample size procedures
3.4.1.1 Sampling
The fixed sample size procedure is described in IEC 60384-1, 3.5.3 b). The sample shall be
representative of the range of capacitors for which approval is sought. This may or may not be
the complete range covered by the detail specification.
The sample shall consist of specimens having the lowest and highest voltages, and for these
voltages the lowest and highest capacitances. When there are more than four rated voltages
an intermediate voltage shall also be tested. Thus for the approval of a range, testing is
required of either four or six values (capacitance/voltage combinations). When the range
consists of less than four values, the number of specimens to be tested shall be that required
for four values.
Spare specimens are permitted as follows:
Two (for six values) or three (for four values) per value which may be used as replacements
for specimens which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that

required for the additional groups.
Table 3 gives the number of samples to be tested in each group or subgroup together with the
permissible number of defectives for qualification approval tests.
3.4.1.2 Tests
The complete series of tests specified in Tables 3 and 4 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Specimens found defective during the tests of Group 0 shall not be used for the other groups.

– 14 – 60384-17  IEC:2005
"One defective" is counted when a capacitor has not satisfied the whole or a part of the tests

of a group.
The approval is granted when the number of defectives does not exceed the specified number

of permissible defectives for each group or subgroup and the total number of permissible

defectives.
NOTE Tables 3 and 4 together form the fixed sample size test schedule, for which Table 3 includes the details for
the sampling and permissible defectives for the different tests or groups of tests, whereas Table 4 together with

the details of tests contained in Clause 4 gives a complete summary of test conditions and performance

requirements and indicates where, for example for the test method or conditions of test a choice has to be made in

the detail specification.
The conditions of test and performance requirements for the fixed sample size test schedule must be identical to
those prescribed in the detail specification for quality conformance inspection.
Table 3 – Sampling plan together with numbers of permissible defectives
for qualification approval tests for a.c. and pulse capacitors
Group Test Subclause Number of specimens (n)
No. of this and number of non-conformances (c)
publication
Per For four or less For six values
c c
values
value to be tested
c
to be tested
4 n c c 6 n c c
n
total total
Visual examination 4.1
Marking 1.6
Dimensions 4.1
b b
Capacitance 4.2.2 29 116 2 174 3
Tangent of loss angle 4.2.3
e e e
Voltage proof 4.2.1 (+5) (+20) (+30)
e e e
Insulation resistance 4.2.4 (+5) (+20) (+30)
e
Inductance 4.2.5
e
Sealing
Spare specimens 2 8 12
1A Robustness of terminations 4.3 3 12 1  18 1
Resistance to soldering heat 4.4
Component solvent resistance 4.14

b
Solderability     4.5 6 24 1 36 2
Solvent resistance of the marking     4.15
1B Rapid change of temperature     4.6
Vibration     4.7
a
Bump or shock   4.8 or 4.9
1 Climatic sequence 4.10 9 36 2 4 54 3 6
b
2 Damp heat, steady state 4.11 5 20 1 30 2
b b
3 Endurance test at 50 Hz/60 HZ 4.12.1 10 40 3 60 4

alternating voltage
b b
Endurance test with sinusoidal 4.12.2 5 20 1 30 2
e
current or voltage
e b b
Pulse endurance test 4.12.3 5 20 1 30 2
e
4,2,6 5 20 1 30 2
Temperature characteristics
d
4 4.13
Charge and discharge
a
As required in the detail specification.
b
Not more than one defective is permitted from any one value.
c
Capacitance-voltage combinations, see 3.4.1.
d
Not required when pulse endurance test is required.
e
If required in the detail specification.

60384-17  IEC:2005 – 15 –
Table 4 – Test schedule for qualification approval

a a a
Subclause number and test D Conditions of test Number of Performance requirements

or specimens (n)
ND and number of
b
permissible
non-
conformances
(c)
Group 0 ND See Table 3
4.1 Visual examination   As in 4.1

Legible marking and as
specified in the detail
specification
4.1 Dimensions (detail)   See detail specification
4.2.2 Capacitance   Within specified tolerance
4.2.3 Tangent of loss angle Frequency: 1 kHz  As in 4.2.3.2
(tan δ)
4.2.1 Voltage proof See detail specification for  No breakdown or flashover
the method
4.2.4 Insulation resistance See detail specification for  As in 4.2.4.2
for the method
4.2.5 Inductance
Inductance: ≤. mH
(if applicable)
(see detail specification)
Sealing (if applicable) See detail specification for
No seepage of impregnant
the method or harmful deformation of
the case
Group 1A D See Table 3
4.3.1 Initial measurements Capacitance
Tangent of loss angle:
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.3 Robustness of Visual examination  No visible damage
terminations
4.4 Resistance to No pre-drying
soldering heat See detail specification for
the method (1A or 1B)
4.14 Component solvent Solvent: .  See detail specification
resistance (if Solvent temperature: .
applicable) Method 2
Recovery: .
4.4.2 Final measurements Visual examination  No visible damage
Legible marking
Capacitance
∆C/C for Grade 1.1: ≤1 %
Grade 1.2: ≤2 %
Grade 2:  ≤3 %
of value measured in 4.3.1
Tangent of loss angle
Increase of tan δ
for C ≤ 1 µF:
for Grade 1.1: ≤0,001
Grade 1.2: ≤0,002
Grade 2:  ≤0,004
for C > 1 µF: see detail speci-
fication, compared to
values measured in
4.3.1
– 16 – 60384-17  IEC:2005
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements

a
test or specimens (n)
ND and number of
b
permissible non-
conformances (c)
Group 1B D See Table 3
Good tinning as evidenced by free
4.5 Solderability Without ageing
flowing of the solder with wetting of
See detail specification for the

the terminations or solder shall flow
method
within . . . s, as applicable
4.15 Solvent resistance of Solvent: . Legible marking
the marking Solvent temperature: .
(if applicable) Method 1
Rubbing material:
cotton wool
Recovery: .
4.6.1 Initial measurements Capacitance
Tangent of loss angle:
For C > 1 µF: at 1 kHz
R
C ≤ 1 µF: at 10 kHz
R
4.6 Rapid change of T = Lower category
A
temperature temperature
T = Upper category
B
temperature
Five cycles
Duration t = 30 min
No visible damage
Visual examination
4.7 Vibration For mounting method
see detail specification
Procedure B4
Frequency range:
from . . . Hz to . . . Hz
Amplitude: 0,75 mm or
acceleration 98 m/s
(whichever is the less severe)
Total duration: 6 h
4.7.2 Final inspection Visual examination  No visible damage
4.8 Bump (or shock, see For mounting method
4.9)  see detail specification
Number of bumps: .
Acceleration: . m/s
Duration of pulse: . ms
4.9 Shock (or bump, see For mounting method
4.8)  see detail specification
Number of bumps: .
Acceleration: . m/s
Duration of pulse: . ms
4.8.3 or 4.9.3
Final measurements Visual examination No visible damage
∆C/C for Grade 1.1: ≤1 %
Grade 1.2: ≤2 %
Grade 2:  ≤3 %
of value measured in 4.6.1
Capacitance
Tangent of loss angle  Increase of tan δ:
for C ≤ 1 µF:
for Grade 1.1: ≤0,001
Grade 1.2: ≤0,002
Grade 2:  ≤0,004
for C > 1 µF: see detail
specification, compared
to values measured in 4.6.1
Insulation resistance  ≥50 % of values in 4.2.4.2

60384-17  IEC:2005 – 17 –
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements

a
test or specimens (n)
ND and number of
b
permissible non-
conformances (c)
G roup 1
D See Table 3
4.10 Climatic sequence
4.10.2 Dry heat Temperature: upper

category temperature
Duration: 16 h
4.10.3 Damp heat, cyclic,
Test Db, first cycle
4.10.4 Cold Temperature: lower
category temperature
Duration: 2 h
4.10.5 Low air pressure  Air pressure: 8 kPa
(if required by the
detail specification)
4.10.5.3 Final measurement Visual examination  No permanent breakdown,
flashover or harmful
deformation of the case
4.10.6 Damp heat, cyclic,
Test Db, remaining
cycles
4.10.6.2 Final measurement Visual examination  No visible damage
Legible marking
Capacitance  ∆C/C for Grade 1.1: ≤1 %
Grade 1.2: ≤3 %
Grade 2:  ≤5 %
of value measured in 4.4.2,
4.8.3 or 4.9.3 as applicable
Tangent of loss angle
Increase of tan δ:
for C ≤ 1 µF:
for Grade 1.1: ≤0,0015
Grade 1.2: ≤0,003
Grade 2:  ≤0,005
for C > 1 µF: see detail
specification, compared
to values measured in 4.3.1
or 4.6.1 as applicable
Insulation resistance  ≥50 % of values in 4.2.4.2

Group 2 D See Table 3
4.11 Damp heat, steady
state
4.11.1 Initial Capacitance
measurements
Tangent of loss angle at
1 kHz
4.11.3 Final measurements Visual examination  No visible damage
Legible marking
Capacitance  ∆C/C for Grade 1.1: ≤1 %
Grade 1.2: ≤3 %
Grade 2:  ≤5 %
of value measured in 4.11.1
– 18 – 60384-17  IEC:2005
Table 4 (continued)
a a
Subclause number and D Conditions of test Number of Performance requirements

a
test or specimens (n)
b
ND and number of
permissible non-
conformances (c)
Group 2 (continued)
See Table 3
Tangent of l
...