IEC 61000-4-24:2015
(Main)Electromagnetic compatibility (EMC) - Part 4-24: Testing and measurement techniques - Test methods for protective devices for HEMP conducted disturbance
Electromagnetic compatibility (EMC) - Part 4-24: Testing and measurement techniques - Test methods for protective devices for HEMP conducted disturbance
IEC 61000-4-24:2015 deals with methods for testing protective devices for HEMP conducted disturbance. It includes two-terminal elements, such as gas discharge tubes, varistors, and two-port SPDs, such as HEMP combination filters. It covers testing of voltage breakdown and voltage-limiting characteristics but also methods to measure the residual voltage and/or the residual current, peak rate of rise and root action for the case of very fast changes of voltage and current as a function of time. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 1997. This edition constitutes a technical revision.
Compatibilité électromagnétique (CEM) - Partie 4-24: Techniques d'essai et de mesure - Méthodes d'essai pour les dispositifs de protection pour perturbations conduites IEMN-HA
L'IEC 61000-4-24:2015 définit les méthodes d'essai concernant les dispositifs de protection IEMN-HA contre les perturbations conduites. Elle inclut les éléments à deux bornes, tels que les tubes à décharge, varistances et les parafoudres à deux accès, tels que les filtres combinés IEMN-HA. Elle couvre les essais de caractéristiques de tension de claquage et de limitation de la tension résiduelle incluant les méthodes de mesure de tension résiduelle et/ou de courant résiduel, de la valeur de crête du temps de montée et de l'action racine dans le cas de variations très rapides de tension et de courant en fonction du temps. Elle a le statut de publication CEM de base conformément au Guide 107 de l'IEC. Cette deuxième édition annule et remplace la première édition parue en 1997. Cette édition constitue une révision technique.
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IEC 61000-4-24 ®
Edition 2.1 2023-08
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
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Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
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IEC 61000-4-24 ®
Edition 2.1 2023-08
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
colour
inside
Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.01 ISBN 978-2-8322-7451-4
IEC 61000-4-24 ®
Edition 2.1 2023-08
CONSOLIDATED VERSION
REDLINE VERSION
colour
inside
Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
– 2 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and abbreviated terms . 8
3.1 Terms and definitions . 8
3.2 Abbreviated terms . 10
4 Test methods for protective devices (excluding filter) for conducted disturbance . 10
4.1 General . 10
4.2 Test setup . 11
4.3 Pulse generator . 11
4.4 Launching line . 11
4.5 Test fixtures . 12
4.5.1 General . 12
4.5.2 Type A fixtures . 12
4.5.3 Type B fixtures . 12
4.6 Termination . 13
4.7 Oscilloscope . 14
4.8 Test procedure . 14
4.8.1 Adjustment of the pulse generator . 14
4.8.2 Verification procedures . 14
4.8.3 Test . 15
4.8.4 Final examination of the DUT . 15
4.9 Referring to this standard . 15
5 Measurement method for HEMP combination filters . 16
5.1 Verification setup . 16
5.2 Measurement setup . 16
5.3 Measurement instrument . 17
5.3.1 Pulse generators . 17
5.3.2 Oscilloscope . 19
5.3.3 Current sensors . 19
5.3.4 Test loads . 19
5.4 Test modes required . 19
5.5 Measurement procedure . 21
5.5.1 General . 21
5.5.2 Verification of pulses . 21
5.5.3 Measurement procedure . 21
5.6 Evaluation of test results . 22
5.7 Test report . 23
6 Measurement method of HEMP protectors for RF antenna ports . 23
6.1 General . 23
6.2 Test level and injection waveform specification . 24
6.3 Verification of test level . 24
6.4 Measurement procedure . 25
6.5 Evaluation of test results . 25
6.6 Test report . 26
© IEC 2023
Annex A (informative) Investigation for the establishment of a measurement setup . 27
A.1 General . 27
A.2 Variation of the cable connected for the measurement of short-circuit current . 27
A.3 Variation of the length of the cable L2 connected for the measurement of
residual current . 30
A.4 Variation of load impedance and cable length for connection between load
and ground . 34
A.5 Variation of the cable length between load and ground . 36
Annex B (informative) Test method for the quantitative determination of the direct
response behaviours of a coaxial surge protector . 39
Annex C (informative) Residual measurements for antenna port protectors . 43
C.1 Evaluating the required protection for RF antenna ports . 43
C.2 Evaluating the required protection for RF antenna ports . 45
Bibliography . 48
Figure 1 – Test setup for testing protective devices . 11
Figure 2 – Example of a type B test fixture (universal) . 14
Figure 3 – Typical setup for verification of the pulse test level . 16
Figure 4 – Example of test setup using one or two shielded enclosures . 17
Figure 5 – Example of test setup using a shielded enclosure . 17
Figure 6 – Double exponential waveform . 19
Figure 7 – Example of wiring setup of a single line DUT . 20
Figure 8 – Example of wiring setup for a mutually coupled multi-line DUT . 20
Figure 9 – Typical verification setup . 24
Figure 10 – Typical measurement setup . 25
Figure A.1 – Setup for calibration . 27
Figure A.2 – Peak current calibration results with 9 mm cables: 1 000 A ± 4 % . 28
Figure A.3 – Rise time calibration results with 9 mm cables . 29
Figure A.4 – FWHM calibration results with 9 mm cables . 29
Figure A.5 – Peak current calibration results with 4 mm cables: 1 000 A ± 8 % . 29
Figure A.6 – Rise time calibration results with 4 mm cables . 30
Figure A.7 – FWHM calibration results with 4 mm cables . 30
Figure A.8 – Measurement setup for residual current . 31
Figure A.9 – Measurement result of peak current with variation of measurement
cable L2 . 32
Figure A.10 – Measurement result of peak rate of rise with variation of measurement
cable L2 . 32
Figure A.11 – Measurement result of root action with variation of measurement
cable L2 . 32
Figure A.12 – Variation of the position of current sensor 2 on the measurement
cable L2 . 33
Figure A.13 – Peak current with variation of cable L2 and at different positions . 33
Figure A.14 – Peak rate of rise with variation of cable L2 and at different positions . 34
Figure A.15 – Root action with variation of cable L2 and at different positions . 34
Figure A.16 – Measurement result of peak current with variation of load impedance. . 35
Figure A.17 – Measurement result of peak rate of rise with variation of load impedance . 35
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© IEC 2023
Figure A.18 – Measurement result of root action with variation of load impedance. . 36
Figure A.19 – Variation of the length of cable L3 connected between load and ground
plane . 36
Figure A.20 – Measurement result of peak current with variation of measurement
cable L3 . 37
Figure A.21 – Measurement result of peak rate of rise with variation of measurement
cable L3 . 37
Figure A.22 – Measurement result of root action with variation of measurement
cable L3 . 38
Figure B.1 – Test setup with a power divider for testing protective devices . 39
Figure B.2 – Waves propagating along the branches . 40
Figure B.3 – Simplified test setup for testing protective devices . 41
Figure C.1 – Transceiver with antenna port shown . 43
Figure C.2 – Protectors on RX and TX signal path internal to the transceiver after the
RF port . 44
Figure C.3 – Protector internal to equipment for RX side protection and outside the
equipment at the antenna port for transmit and port protection . 44
Figure C.4 – N-type RF antenna port protector using GDTs . 45
Figure C.5 – Typical antenna system with RF-HEMP protector (DUT) . 46
Table 1 – Overview of conducted early-time HEMP (CEP) test requirements defined in
other specifications . 18
Table 2 – Overview of conducted intermediate-time HEMP (CIP) test requirements
defined in other specifications . 18
Table 3 – Test mode and DUT wiring setup . 21
Table 4 – Performance criteria of filter against early-time HEMP – AC power port with
nominal load 2 Ω . 22
Table 5 – Performance criteria of filter against early-time HEMP – DC power port with
nominal load 2 Ω . 22
Table 6 – Performance criteria of filter against early-time HEMP – Signal, data and
control port with nominal load 50 Ω . 23
Table 7 – Pulsed current injection test level for RF antenna ports . 24
Table 8 – Performance criteria of filters against early-time HEMP – RF antenna ports . 25
Table A.1 – Measurement results for the waveform calibration of short-circuit current . 28
Table A.2 – Measurement results for variation of the cable length at the measurement
points. 31
Table A.3 – Measurement results for variation of the load impedance . 35
Table A.4 – Measurement results for variation of the cable length between load and
ground . 37
© IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-24: Testing and measurement techniques –
Test methods for protective devices
for HEMP conducted disturbance
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This consolidated version of the official IEC Standard and its amendment has been
prepared for user convenience.
IEC 61000-4-24 edition 2.1 contains the second edition (2015-11) [documents
77C/245/FDIS and 77C/250/RVD] and its amendment 1 (2023-08) [documents
77C/330/FDIS and 77C/331/RVD].
In this Redline version, a vertical line in the margin shows where the technical content
is modified by amendment 1. Additions are in green text, deletions are in strikethrough
red text. A separate Final version with all changes accepted is available in this
publication.
– 6 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
International Standard IEC 61000-4-24 has been prepared by subcommittee 77C: High power
transient phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-24 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This second edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) A new Clause 5: Measurement method for HEMP combination filters, which contains 5.1
Verification setup, 5.2 Measurement setup, 5.3 Measurement instrument, 5.4 Test modes,
5.5 Measurement procedures, 5.6 Evaluation of test results, which introduced performance
criteria of filter, and 5.7 Test report.
b) A new informative Annex A: Investigation for the establishment of a measurement setup,
which was based on Clause 5.
c) A new informative Annex B: Test method for the quantitative determination of the direct
response behaviours of a coaxial surge protector.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this document and its amendment will remain
unchanged until the stability date indicated on the IEC website under webstore.iec.ch in the
data related to the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
© IEC 2023
INTRODUCTION
This standard is part of the IEC 61000 series of standards, according to the following
structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards,
as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
The IEC has initiated the preparation of standardized methods to protect civilian society from
the effects of high power electromagnetic (HPEM) environments. Such effects could disrupt
systems for communications, electric power, information technology, etc.
This part of IEC 61000 is an international standard that establishes the required test
procedures for protective devices for HEMP conducted disturbance, such as gas discharge
tubes, varistors, two-port SPDs and HEMP combination filters.
The application of this standard is, however, not dependent on access to other sections and
parts of the IEC 61000, except for those specifically referred to.
– 8 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-24: Testing and measurement techniques –
Test methods for protective devices
for HEMP conducted disturbance
1 Scope
This part of IEC 61000 deals with methods for testing protective devices for HEMP conducted
disturbance. It includes two-terminal elements, such as gas discharge tubes, varistors, and
two-port SPDs, such as HEMP combination filters. It covers testing of voltage breakdown and
voltage-limiting characteristics but also methods to measure the residual voltage and/or the
residual current, peak rate of rise and root action for the case of very fast changes of voltage
and current as a function of time.
This standard does not cover insertion loss measurement methods.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61000-2-10:2021, Electromagnetic compatibility (EMC) – Part 2-10: Environment –
Description of HEMP environment – Conducted disturbance
3 Terms, definitions and abbreviated terms
For the purposes of this document, the following terms, definitions and abbreviated terms
apply.
3.1 Terms and definitions
3.1.1
feed-through device
two-port device, which is designed to feed a signal through an electromagnetic barrier (shield)
Note 1 to entry: Typically it is in good electrical contact with the barrier and has one port on each side of the
barrier, thus maintaining the isolation of the barrier.
3.1.2
gas discharge tube
GDT
device with two or three metal electrodes hermetically sealed so that gas mixture and
pressure are under control, and designed to protect apparatus or personnel from high
transient voltages
3.1.3
HEMP
high-altitude electromagnetic pulse
electromagnetic pulse produced by a nuclear explosion outside the earth’s atmosphere
Note 1 to entry: Typically above an altitude of 30 km.
© IEC 2023
[SOURCE: IEC 61000-1-3:2002, 3.10]
3.1.4
HEMP combination filter
filter combined with voltage limiting devices, so that this combination can attenuate the
residual current pulse passing through it
3.1.5
norms
scalar quantities that characterise the features of a waveform
Note 1 to entry: Norms are used to characterise features of a waveform that relate to susceptibility mechanisms.
3.1.6
peak rate of rise
maximum absolute value of the first derivative of a current waveform I(t) with respect to time,
di/dt, expressed in units of ampere per second
3.1.7
PCI
pulsed current injection.
test method for measuring the performance of a protective device
Note 1 to entry: A HEMP threat-relatable transient is injected on the input of the protective device and the
residual transient stress is measured on its output.
Note 2 to entry: This note applies to the French language only.
3.1.8
peak current
maximum absolute value of a current waveform, I(t), expressed in units of ampere
3.1.9
primary protection element
first protective element seen from the unprotected side of a protection measure, diverting the
main part of the surge current
3.1.10
protected side
side of a protection measure where the equipment is situated that has to be protected
3.1.11
protective device
electrical component such as a filter, gas discharge tube, metal oxide varistor (or other), for
protection against conducted disturbance, or a shield, gasket, waveguide trap (or other), for
protection against radiated disturbance, which is used to limit any conducted or radiated
stress. Such an element or a combination of several of them thus forms part of the conceptual
EM barrier for a system
[SOURCE: IEC 61000-5-5:1996, 3.20]
3.1.12
root action
norm of a current waveform I(t) defined by
∞
| I(t)| dt
∫
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© IEC 2023
Note 1 to entry: Where the load impedance is known, the energy in W/s or J can be calculated.
3.1.13
SPD
surge protective device
device that is intended to limit transient over-voltages and divert surge currents. It contains at
least one non-linear component that is intended to limit surge voltages and divert surge
currents
Note 1 to entry: This note applies to the French language only.
[SOURCE: IEC TR 61000-5-6:2002, 3.23, modified – a note has been added.]
3.1.14
two-port SPD
SPD which is not only a shunting device, but consists of a separated input port on the
unprotected side and an output port on the protected side
Note 1 to entry: Typically two-port SPDs are “black boxes” with non-linear shunting devices to ground and a
circuit between input and output ports.
3.1.15
two-terminal element
electrical element where a current enters in one terminal and leaves through a second
terminal
Note 1 to entry: A two-terminal element is a one-port device. Typically two-terminal SPD’s are devices shunting to
ground.
3.1.16
unprotected side
side of a protection measure from which the surge event is expected
3.1.17
waveform norm
parameter that is determined from a mathematically well-defined operation on a waveform or
signal (such as an integration of the waveform), which yields a scalar number that permits a
comparison of various waveforms or their effects
[SOURCE: IEC 61000-4-33:2005, 3.10]
3.2 Abbreviated terms
DUT Device under test
4 Test methods for protective devices (excluding filter) for conducted
disturbance
4.1 General
The actual behaviour of a protective device under HEMP conditions depends very much on
how it is integrated into its place of use and other attendant circumstances (e.g. quality of
shielding between the protected and unprotected side of a protection element). The following
test methods take this into account. They are defined so that the results obtained are as far
as possible related to the qualities of the device under test (DUT), and the test arrangement
does not differ too much from practical protection arrangements.
NOTE Clause 4 is intended to apply for a protective device such as gas discharge tubes, varistors and two-port
SPDs, excluding the HEMP combination filter. For a HEMP combination filter, Clause 5 applies.
© IEC 2023
4.2 Test setup
The test setup consists of a pulse generator (G), a launching line, a test fixture for the DUT,
and a termination with a connecting line and oscilloscope (see Figure 1). Various source
impedances may be used, but the example shown in Figure 1 uses 50 Ω. Other values could
be specified.
50 Ω
Pulse generator
Oscilloscope
G
Termination with line
50Ω
Launching line
50Ω
50 Ω
Test fixture (containing DUT)
Unprotected side Protected side
IEC
Figure 1 – Test setup for testing protective devices
To prevent parasitic coupling between the pulse generator and the oscilloscope, both the
unprotected and protected side of the setup shall be entirely shielded. It is recommended to
use cables with multiple braided wire shields or solid shields. The cable and connectors shall
be capable of withstanding the high voltage pulse without a breakdown. Grounding loops shall
be avoided.
4.3 Pulse generator
The pulse generator shall produce a normally rectangular voltage pulse into a matched
termination. The output voltage (into a matched termination) shall be adjustable to a value 2
times higher than the expected limiting voltage of the DUT. Both polarities shall be available.
The characteristics of a pulse generator are as follows:
– characteristic impedance: 50 Ω or an alternative value
– pulse wavefront , du/dt: at least 1 kV/ns
– pulse duration: at least 20 ns
4.4 Launching line
The launching line consists of a coaxial cable with a characteristic impedance of 50 Ω or the
value specified. The cable between the pulse generator and the DUT shall be long enough so
that reflections from the DUT do not arrive at the pulse generator during the pulse front. To
achieve this condition, the one-way propagation time along the cable shall be greater than
half the front time of the pulse. Due to the frequency-dependent attenuation of the cable, the
– 12 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
steepness of the pulse front may be lowered and thus adjusted to the desired value, by further
extending the launching line.
4.5 Test fixtures
4.5.1 General
Test fixtures are mechanical setups with coaxial connectors on both the unprotected and the
protected terminals. Their task is to hold the DUT. Two different types of test fixtures may be
used. They are referred to as type A and type B as described below.
4.5.2 Type A fixtures
Gas discharge tubes intended to be used for protection of coaxial high-frequency applications
may be tested in corresponding, commercially available holders. The protective device is
inserted between the inner and outer conductor of the coaxial setup, with a minimum of
influence on the characteristic impedance. Such holders allow the inherent properties of the
device to be measured explicitly and with good repeatability.
4.5.3 Type B fixtures
4.5.3.1 General
Type B fixtures are universal and apply in principle to all kinds of two-terminal or two-port
protective devices, whether they have a feed-through or non-feed-through configuration.
However, measurements on low-voltage devices like protective diodes and varistors may be
strongly influenced by inductive overshoot due to high di/dt.
NOTE By ensuring the test fixture lead lengths are as short as practically possible, the risk of inductive influence
can be mitigated.
The fixture is composed of three parts: the unprotected shell, the partition screen and the
protected shell (see Figure 2).
4.5.3.2 Unprotected shell
The dimensions and cross-section shape may be adapted to the size of the DUT. The shell
may be cut into two parts in the axial direction for better access to the solder points. If not
otherwise stated, the length of the wire from the unprotected connector (P ) to the input-
contact of the DUT (P ) shall not be longer than the length of the current path in the DUT
between points P and the grounding contact of the DUT (P ).
2 3
4.5.3.3 Partition screen
Feed-through protective devices shall be inserted in the partition screen in the same way as
in actual application.
Non-feed-through devices shall be passed through a hole in the partition screen as shown in
Figure 2a) and 2b). The wire passing through the partition screen shall be insulated. A feed-
through capacitor or other feed-through element shall not be used. A non-feed-through DUT
may be placed close to the screen but shall not touch it, except if it is to be installed on to a
metal wall in actual applications (as shown in Figure 2c)).
4.5.3.4 Protected shell
The protected shell serves as transition to the protected connector. The protected shell shall
be made as short as possible. The length of the connection between point P and the
protected connector shall be as short as possible.
© IEC 2023
4.6 Termination
The termination shall be matched to the characteristic impedance of the test setup within the
3 dB-bandwidth of the oscilloscope. It shall be of the feed-through type, followed by a high-
impedance, voltage-dividing probe of the oscilloscope or be part of the first stage of an
attenuator in front of the oscilloscope. The line between the test fixture and termination shall
have the same impedance as the termination. It shall be as short as possible. Its attenuation
shall be less than 0,5 dB at the upper 3 dB cut-off frequency of the oscilloscope. Make sure
that the termination withstands the test pulses without degradation.
Partition screen
Screw
P
P
P
Screw
Unprotected Protected
shell shell
IEC
a) Example of a type B test fixture with a two-terminal DUT in non-feed-through configuration
Partition screen
Screw
P
P
1 P
Screw
Unprotected Protected
shell shell
IEC
The DUT may alternatively be in the unprotected shell.
b) Example of a test fixture with a two-port DUT in non-feed-through configuration
– 14 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
Partition screen
Screw
P
P 3
P
Screw
Unprotected Protected
shell shell
IEC
c) Example of a test fixture with a DUT in a feed-through configuration
Figure 2 – Example of a type B test fixture (universal)
4.7 Oscilloscope
The bandwidth of the oscilloscope and the other components of the test setup shall be wide
enough that the overall tolerance of the peak values of u and du/dt due to bandwidth
limitations and other system errors is not higher than ±20 %.
4.8 Test procedure
4.8.1 Adjustment of the pulse generator
The launching line is first connected directly to the line leading to the termination (see
Figure 1).
The pulse generator is adjusted as follows:
a) if the DUT, or the primary protection element of a four-terminal DUT, is a gas discharge
tube, the steepness of the leading front of the prospective pulse shall be at least 1 kV/ns
at the impulse spark-over voltage of the gas discharge tube during the test;
b) if the DUT, or the primary protection element of a four-terminal DUT, is a voltage-limiting
device (e.g. protective diode or varistor), the highest tangential steepness of the leading
front of the prospective pulse is as described by
du/dt = (1/2) × Z × di/dt (1)
c
where Z is the characteristic impedance and di/dt is the specified value.
c
NOTE The specified di/dt corresponds to the actual di/dt in the DUT during the test. As the DUT has a very low
impedance compared with 50 Ω or the specified impedance, the current i and therefore also di/dt is doubled during
the test.
4.8.2 Verification procedures
The launching line is then connected to the test fixture (see Figure 1).
If a test fixture type B is used, the internal connection between the protected and the
unprotected connector shall be tested for transmission characteristics.
For this purpose the DUT is removed and the same pulse as under 4.8.1 (adjustment of the
pulse generator) is applied. The measured output shall not differ from the output measured
under 4.8.1 by more than 10 %. If it differs by more than 10 %, the diameter of the connecting
© IEC 2023
wire should be increased (a higher capacity will lower the characteristic impedance and
improve the match between the pulse generator and the load).
To make sure that no undesired coupling between the unprotected and the protected side of
the test setup is present, verification tests shall be made with the following modifications on
the test setup:
If the DUT is a two-terminal element, it shall be replaced by a short-circuit connection of the
same length and form as the current path through the DUT. The connection between P and
the centre-pin of the protected connector (see Figure 2) shall be removed. One test shall be
made with the centre-pin of the protected connector left open and another one with this pin
connected to the ground (within the protected shell).
If the DUT is a feed-through device, it shall be replaced by a device of the same dimensions
(dummy DUT) made entirely of well-conducting metal and thus representing an ideal short-
circuit. The centre-pin of the protected connector shall be connected to the output pin of the
dummy DUT.
The peak value of the residual voltage measured under these conditions shall be less than 5 %
of the peak value measured in the final test.
4.8.3 Test
The dummy DUT is replaced by the DUT, and the residual voltage is measured and compared
to the verification criteria.
4.8.4 Final examination of the DUT
After the test, the DUT shall be examined for visible damage. If visible damage is observed,
the DUT will be deemed to fail the test. If there is no visible damage a functional test shall be
performed to verify that the DUT is within its specification.
4.9 Referring to this standard
When reference is made to this standard, the following additional information shall be given.
Standard procedure:
– for gas discharge tubes: type of test fixture used (4.5)
– for measurement on two-terminal length of connection wires, see overall
elements in fixture B: length of DUT between solder points (4.5.3)
Modifications from standard procedure:
– characteristic impedance:
if other than 50 Ω (4.2)
– steepness of prospective pulse, if higher than 1 kV/ns (4.3)
du/dt:
– actual di/dt: if higher than 40 A/ns (4.8.1)
– modification of DUT: if connecting wires of gas discharge tubes are
cut away for measurement in type A fixture
– additional components to the DUT for example additional circuit components;
different wire lengths to those specified.
– 16 – IEC 61000-4-24:2015+AMD1:2023 CSV
© IEC 2023
5 Measurement method for HEMP combination filters
5.1 Verification setup
The output of the pulse generator shall be verified prior to applying a pulse to a DUT. The
typical setup for verification of the pulse test level is illustrated in Figure 3.
a a
Shielded enclosure Shielded enclosure
Coaxial feed-through
Coaxial cable
Oscilloscope
Cable L1
Pulse generator Current sensor
Ground plane
IEC
a
At least one of the two enclosures shall be shielded. Care should be taken to minimize radiated and conducted
interference.
Figure 3 – Typical setup for verification of the pulse test level
The pulse generator shall be connected to the ground plane. The output cable L1 shall also
be connected to t
...
IEC 61000-4-24 ®
Edition 2.0 2015-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
Compatibilité électromagnétique (CEM) –
Partie 4-24: Techniques d’essai et de mesure – Méthodes d’essai pour les
dispositifs de protection pour perturbations conduites IEMN-HA
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IEC 61000-4-24 ®
Edition 2.0 2015-11
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-24: Testing and measurement techniques – Test methods for protective
devices for HEMP conducted disturbance
Compatibilité électromagnétique (CEM) –
Partie 4-24: Techniques d’essai et de mesure – Méthodes d’essai pour les
dispositifs de protection pour perturbations conduites IEMN-HA
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100 ISBN 978-2-8322-2971-2
– 2 – IEC 61000-4-24:2015 © IEC 2015
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms, definitions and abbreviated terms . 8
3.1 Terms and definitions . 8
3.2 Abbreviated terms . 10
4 Test methods for protective devices (excluding filter) for conducted disturbance . 10
4.1 General . 10
4.2 Test setup . 11
4.3 Pulse generator . 11
4.4 Launching line . 11
4.5 Test fixtures . 12
4.5.1 General . 12
4.5.2 Type A fixtures . 12
4.5.3 Type B fixtures . 12
4.6 Termination . 13
4.7 Oscilloscope . 14
4.8 Test procedure . 14
4.8.1 Adjustment of the pulse generator . 14
4.8.2 Verification procedures . 14
4.8.3 Test . 15
4.8.4 Final examination of the DUT . 15
4.9 Referring to this standard . 15
5 Measurement method for HEMP combination filters . 16
5.1 Verification setup . 16
5.2 Measurement setup . 16
5.3 Measurement instrument . 17
5.3.1 Pulse generators . 17
5.3.2 Oscilloscope . 19
5.3.3 Current sensors . 19
5.3.4 Test loads . 19
5.4 Test modes required . 19
5.5 Measurement procedure . 21
5.5.1 General . 21
5.5.2 Verification of pulses . 21
5.5.3 Measurement procedure . 21
5.6 Evaluation of test results . 22
5.7 Test report . 23
Annex A (informative) Investigation for the establishment of a measurement setup . 24
A.1 General . 24
A.2 Variation of the cable connected for the measurement of short-circuit current . 24
A.3 Variation of the length of the cable L2 connected for the measurement of
residual current . 27
A.4 Variation of load impedance and cable length for connection between load
and ground . 31
A.5 Variation of the cable length between load and ground . 33
Annex B (informative) Test method for the quantitative determination of the direct
response behaviours of a coaxial surge protector . 36
Bibliography . 40
Figure 1 – Test setup for testing protective devices . 11
Figure 2 – Example of a type B test fixture (universal) . 14
Figure 3 – Typical setup for verification of the pulse test level . 16
Figure 4 – Example of test setup using one or two shielded enclosures . 17
Figure 5 – Example of test setup using a shielded enclosure . 17
Figure 6 – Double exponential waveform . 19
Figure 7 – Example of wiring setup of a single line DUT . 20
Figure 8 – Example of wiring setup for a mutually coupled multi-line DUT . 20
Figure A.1 – Setup for calibration . 24
Figure A.2 – Peak current calibration results with 9 mm cables: 1 000 A ± 4 % . 25
Figure A.3 – Rise time calibration results with 9 mm cables . 26
Figure A.4 – FWHM calibration results with 9 mm cables . 26
Figure A.5 – Peak current calibration results with 4 mm cables: 1 000 A ± 8 % . 26
Figure A.6 – Rise time calibration results with 4 mm cables . 27
Figure A.7 – FWHM calibration results with 4 mm cables . 27
Figure A.8 – Measurement setup for residual current . 28
Figure A.9 – Measurement result of peak current with variation of measurement cable L2 . 29
Figure A.10 – Measurement result of peak rate of rise with variation of measurement
cable L2 . 29
Figure A.11 – Measurement result of root action with variation of measurement cable L2 . 29
Figure A.12 – Variation of the position of current sensor 2 on the measurement cable L2 . 30
Figure A.13 – Peak current with variation of cable L2 and at different positions . 30
Figure A.14 – Peak rate of rise with variation of cable L2 and at different positions . 31
Figure A.15 – Root action with variation of cable L2 and at different positions . 31
Figure A.16 – Measurement result of peak current with variation of load impedance. . 32
Figure A.17 – Measurement result of peak rate of rise with variation of load impedance . 32
Figure A.18 – Measurement result of root action with variation of load impedance. . 33
Figure A.19 – Variation of the length of cable L3 connected between load and ground
plane . 33
Figure A.20 – Measurement result of peak current with variation of measurement
cable L3 . 34
Figure A.21 – Measurement result of peak rate of rise with variation of measurement
cable L3 . 34
Figure A.22 – Measurement result of root action with variation of measurement cable L3 . 35
Figure B.1 – Test setup with a power divider for testing protective devices . 36
Figure B.2 – Waves propagating along the branches . 37
Figure B.3 – Simplified test setup for testing protective devices . 38
Table 1 – Overview of conducted early-time HEMP (CEP) test requirements defined in
other specifications . 18
– 4 – IEC 61000-4-24:2015 © IEC 2015
Table 2 – Overview of conducted intermediate-time HEMP (CIP) test requirements
defined in other specifications . 18
Table 3 – Test mode and DUT wiring setup . 21
Table 4 – Performance criteria of filter against early-time HEMP – AC power port with
nominal load 2 Ω . 22
Table 5 – Performance criteria of filter against early-time HEMP – DC power port with
nominal load 2 Ω . 22
Table 6 – Performance criteria of filter against early-time HEMP – Signal, data and
control port with nominal load 50 Ω . 23
Table A.1 – Measurement results for the waveform calibration of short-circuit current . 25
Table A.2 – Measurement results for variation of the cable length at the measurement
points. 28
Table A.3 – Measurement results for variation of the load impedance . 32
Table A.4 – Measurement results for variation of the cable length between load and
ground . 34
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-24: Testing and measurement techniques –
Test methods for protective devices
for HEMP conducted disturbance
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-24 has been prepared by subcommittee 77C: High power
transient phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-24 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This second edition cancels and replaces the first edition published in 1997. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) A new Clause 5: Measurement method for HEMP combination filters, which contains 5.1
Verification setup, 5.2 Measurement setup, 5.3 Measurement instrument, 5.4 Test modes,
– 6 – IEC 61000-4-24:2015 © IEC 2015
5.5 Measurement procedures, 5.6 Evaluation of test results, which introduced performance
criteria of filter, and 5.7 Test report.
b) A new informative Annex A: Investigation for the establishment of a measurement setup,
which was based on Clause 5.
c) A new informative Annex B: Test method for the quantitative determination of the direct
response behaviours of a coaxial surge protector.
The text of this standard is based on the following documents:
FDIS Report on voting
77C/245/FDIS 77C/250/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
INTRODUCTION
This standard is part of the IEC 61000 series of standards, according to the following
structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards,
as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
The IEC has initiated the preparation of standardized methods to protect civilian society from
the effects of high power electromagnetic (HPEM) environments. Such effects could disrupt
systems for communications, electric power, information technology, etc.
This part of IEC 61000 is an international standard that establishes the required test
procedures for protective devices for HEMP conducted disturbance, such as gas discharge
tubes, varistors, two-port SPDs and HEMP combination filters.
The application of this standard is, however, not dependent on access to other sections and
parts of the IEC 61000, except for those specifically referred to.
– 8 – IEC 61000-4-24:2015 © IEC 2015
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-24: Testing and measurement techniques –
Test methods for protective devices
for HEMP conducted disturbance
1 Scope
This part of IEC 61000 deals with methods for testing protective devices for HEMP conducted
disturbance. It includes two-terminal elements, such as gas discharge tubes, varistors, and
two-port SPDs, such as HEMP combination filters. It covers testing of voltage breakdown and
voltage-limiting characteristics but also methods to measure the residual voltage and/or the
residual current, peak rate of rise and root action for the case of very fast changes of voltage
and current as a function of time.
This standard does not cover insertion loss measurement methods.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 61000-2-10, Electromagnetic compatibility (EMC) – Part 2-10: Environment – Description
of HEMP environment – Conducted disturbance
3 Terms, definitions and abbreviated terms
For the purposes of this document, the following terms, definitions and abbreviated terms
apply.
3.1 Terms and definitions
3.1.1
feed-through device
two-port device, which is designed to feed a signal through an electromagnetic barrier (shield)
Note 1 to entry: Typically it is in good electrical contact with the barrier and has one port on each side of the
barrier, thus maintaining the isolation of the barrier.
3.1.2
gas discharge tube
device with two or three metal electrodes hermetically sealed so that gas mixture and
pressure are under control, and designed to protect apparatus or personnel from high
transient voltages
3.1.3
HEMP
high-altitude electromagnetic pulse
electromagnetic pulse produced by a nuclear explosion outside the earth’s atmosphere
Note 1 to entry: Typically above an altitude of 30 km.
[SOURCE: IEC 61000-1-3:2002, 3.10]
3.1.4
HEMP combination filter
filter combined with voltage limiting devices, so that this combination can attenuate the
residual current pulse passing through it
3.1.5
norms
scalar quantities that characterise the features of a waveform
Note 1 to entry: Norms are used to characterise features of a waveform that relate to susceptibility mechanisms.
3.1.6
peak rate of rise
maximum absolute value of the first derivative of a current waveform I(t) with respect to time,
di/dt, expressed in units of ampere per second
3.1.7
PCI
pulsed current injection.
test method for measuring the performance of a protective device
Note 1 to entry: A HEMP threat-relatable transient is injected on the input of the protective device and the
residual transient stress is measured on its output.
Note 2 to entry: This note applies to the French language only.
3.1.8
peak current
maximum absolute value of a current waveform, I(t), expressed in units of ampere
3.1.9
primary protection element
first protective element seen from the unprotected side of a protection measure, diverting the
main part of the surge current
3.1.10
protected side
side of a protection measure where the equipment is situated that has to be protected
3.1.11
protective device
electrical component such as a filter, gas discharge tube, metal oxide varistor (or other), for
protection against conducted disturbance, or a shield, gasket, waveguide trap (or other), for
protection against radiated disturbance, which is used to limit any conducted or radiated
stress. Such an element or a combination of several of them thus forms part of the conceptual
EM barrier for a system
[SOURCE: IEC 61000-5-5:1996, 3.20]
3.1.12
root action
norm of a current waveform I(t) defined by
∞
| I(t)| dt
∫
– 10 – IEC 61000-4-24:2015 © IEC 2015
Note 1 to entry: Where the load impedance is known, the energy in W/s or J can be calculated.
3.1.13
SPD
surge protective device
device that is intended to limit transient over-voltages and divert surge currents. It contains at
least one non-linear component that is intended to limit surge voltages and divert surge
currents
Note 1 to entry: This note applies to the French language only.
[SOURCE: IEC TR 61000-5-6:2002, 3.23, modified – a note has been added.]
3.1.14
two-port SPD
SPD which is not only a shunting device, but consists of a separated input port on the
unprotected side and an output port on the protected side
Note 1 to entry: Typically two-port SPDs are “black boxes” with non-linear shunting devices to ground and a
circuit between input and output ports.
3.1.15
two-terminal element
electrical element where a current enters in one terminal and leaves through a second
terminal
Note 1 to entry: A two-terminal element is a one-port device. Typically two-terminal SPD’s are devices shunting to
ground.
3.1.16
unprotected side
side of a protection measure from which the surge event is expected
3.1.17
waveform norm
parameter that is determined from a mathematically well-defined operation on a waveform or
signal (such as an integration of the waveform), which yields a scalar number that permits a
comparison of various waveforms or their effects
[SOURCE: IEC 61000-4-33:2005, 3.10]
3.2 Abbreviated terms
DUT Device under test
4 Test methods for protective devices (excluding filter) for conducted
disturbance
4.1 General
The actual behaviour of a protective device under HEMP conditions depends very much on
how it is integrated into its place of use and other attendant circumstances (e.g. quality of
shielding between the protected and unprotected side of a protection element). The following
test methods take this into account. They are defined so that the results obtained are as far
as possible related to the qualities of the device under test (DUT), and the test arrangement
does not differ too much from practical protection arrangements.
NOTE Clause 4 is intended to apply for a protective device such as gas discharge tubes, varistors and two-port
SPDs, excluding the HEMP combination filter. For a HEMP combination filter, Clause 5 applies.
4.2 Test setup
The test setup consists of a pulse generator (G), a launching line, a test fixture for the DUT,
and a termination with a connecting line and oscilloscope (see Figure 1). Various source
impedances may be used, but the example shown in Figure 1 uses 50 Ω. Other values could
be specified.
50 Ω
Pulse generator
Oscilloscope
G
Termination with line
50Ω
Launching line
50Ω
50 Ω
Test fixture (containing DUT)
Unprotected side Protected side
IEC
Figure 1 – Test setup for testing protective devices
To prevent parasitic coupling between the pulse generator and the oscilloscope, both the
unprotected and protected side of the setup shall be entirely shielded. It is recommended to
use cables with multiple braided wire shields or solid shields. The cable and connectors shall
be capable of withstanding the high voltage pulse without a breakdown. Grounding loops shall
be avoided.
4.3 Pulse generator
The pulse generator shall produce a normally rectangular voltage pulse into a matched
termination. The output voltage (into a matched termination) shall be adjustable to a value 2
times higher than the expected limiting voltage of the DUT. Both polarities shall be available.
The characteristics of a pulse generator are as follows:
– characteristic impedance:
50 Ω or an alternative value
– pulse wavefront , du/dt: at least 1 kV/ns
– pulse duration: at least 20 ns
4.4 Launching line
The launching line consists of a coaxial cable with a characteristic impedance of 50 Ω or the
value specified. The cable between the pulse generator and the DUT shall be long enough so
that reflections from the DUT do not arrive at the pulse generator during the pulse front. To
achieve this condition, the one-way propagation time along the cable shall be greater than
half the front time of the pulse. Due to the frequency-dependent attenuation of the cable, the
– 12 – IEC 61000-4-24:2015 © IEC 2015
steepness of the pulse front may be lowered and thus adjusted to the desired value, by further
extending the launching line.
4.5 Test fixtures
4.5.1 General
Test fixtures are mechanical setups with coaxial connectors on both the unprotected and the
protected terminals. Their task is to hold the DUT. Two different types of test fixtures may be
used. They are referred to as type A and type B as described below.
4.5.2 Type A fixtures
Gas discharge tubes intended to be used for protection of coaxial high-frequency applications
may be tested in corresponding, commercially available holders. The protective device is
inserted between the inner and outer conductor of the coaxial setup, with a minimum of
influence on the characteristic impedance. Such holders allow the inherent properties of the
device to be measured explicitly and with good repeatability.
4.5.3 Type B fixtures
4.5.3.1 General
Type B fixtures are universal and apply in principle to all kinds of two-terminal or two-port
protective devices, whether they have a feed-through or non-feed-through configuration.
However, measurements on low-voltage devices like protective diodes and varistors may be
strongly influenced by inductive overshoot due to high di/dt.
NOTE By ensuring the test fixture lead lengths are as short as practically possible, the risk of inductive influence
can be mitigated.
The fixture is composed of three parts: the unprotected shell, the partition screen and the
protected shell (see Figure 2).
4.5.3.2 Unprotected shell
The dimensions and cross-section shape may be adapted to the size of the DUT. The shell
may be cut into two parts in the axial direction for better access to the solder points. If not
otherwise stated, the length of the wire from the unprotected connector (P ) to the input-
contact of the DUT (P ) shall not be longer than the length of the current path in the DUT
between points P and the grounding contact of the DUT (P ).
2 3
4.5.3.3 Partition screen
Feed-through protective devices shall be inserted in the partition screen in the same way as
in actual application.
Non-feed-through devices shall be passed through a hole in the partition screen as shown in
Figure 2a) and 2b). The wire passing through the partition screen shall be insulated. A feed-
through capacitor or other feed-through element shall not be used. A non-feed-through DUT
may be placed close to the screen but shall not touch it, except if it is to be installed on to a
metal wall in actual applications (as shown in Figure 2c)).
4.5.3.4 Protected shell
The protected shell serves as transition to the protected connector. The protected shell shall
be made as short as possible. The length of the connection between point P and the
protected connector shall be as short as possible.
4.6 Termination
The termination shall be matched to the characteristic impedance of the test setup within the
3 dB-bandwidth of the oscilloscope. It shall be of the feed-through type, followed by a high-
impedance, voltage-dividing probe of the oscilloscope or be part of the first stage of an
attenuator in front of the oscilloscope. The line between the test fixture and termination shall
have the same impedance as the termination. It shall be as short as possible. Its attenuation
shall be less than 0,5 dB at the upper 3 dB cut-off frequency of the oscilloscope. Make sure
that the termination withstands the test pulses without degradation.
Partition screen
Screw
P
P
P
Screw
Unprotected Protected
shell shell
IEC
a) Example of a type B test fixture with a two-terminal DUT in non-feed-through configuration
Partition screen
Screw
P
P
P
Screw
Unprotected Protected
shell shell
IEC
The DUT may alternatively be in the unprotected shell.
b) Example of a test fixture with a two-port DUT in non-feed-through configuration
– 14 – IEC 61000-4-24:2015 © IEC 2015
Partition screen
Screw
P
P 3
P
Screw
Unprotected Protected
shell shell
IEC
c) Example of a test fixture with a DUT in a feed-through configuration
Figure 2 – Example of a type B test fixture (universal)
4.7 Oscilloscope
The bandwidth of the oscilloscope and the other components of the test setup shall be wide
enough that the overall tolerance of the peak values of u and du/dt due to bandwidth
limitations and other system errors is not higher than ±20 %.
4.8 Test procedure
4.8.1 Adjustment of the pulse generator
The launching line is first connected directly to the line leading to the termination (see
Figure 1).
The pulse generator is adjusted as follows:
a) if the DUT, or the primary protection element of a four-terminal DUT, is a gas discharge
tube, the steepness of the leading front of the prospective pulse shall be at least 1 kV/ns
at the impulse spark-over voltage of the gas discharge tube during the test;
b) if the DUT, or the primary protection element of a four-terminal DUT, is a voltage-limiting
device (e.g. protective diode or varistor), the highest tangential steepness of the leading
front of the prospective pulse is as described by
du/dt = (1/2) × Z × di/dt (1)
c
where Z is the characteristic impedance and di/dt is the specified value.
c
NOTE The specified di/dt corresponds to the actual di/dt in the DUT during the test. As the DUT has a very low
impedance compared with 50 Ω or the specified impedance, the current i and therefore also di/dt is doubled during
the test.
4.8.2 Verification procedures
The launching line is then connected to the test fixture (see Figure 1).
If a test fixture type B is used, the internal connection between the protected and the
unprotected connector shall be tested for transmission characteristics.
For this purpose the DUT is removed and the same pulse as under 4.8.1 (adjustment of the
pulse generator) is applied. The measured output shall not differ from the output measured
under 4.8.1 by more than 10 %. If it differs by more than 10 %, the diameter of the connecting
wire should be increased (a higher capacity will lower the characteristic impedance and
improve the match between the pulse generator and the load).
To make sure that no undesired coupling between the unprotected and the protected side of
the test setup is present, verification tests shall be made with the following modifications on
the test setup:
If the DUT is a two-terminal element, it shall be replaced by a short-circuit connection of the
same length and form as the current path through the DUT. The connection between P and
the centre-pin of the protected connector (see Figure 2) shall be removed. One test shall be
made with the centre-pin of the protected connector left open and another one with this pin
connected to the ground (within the protected shell).
If the DUT is a feed-through device, it shall be replaced by a device of the same dimensions
(dummy DUT) made entirely of well-conducting metal and thus representing an ideal short-
circuit. The centre-pin of the protected connector shall be connected to the output pin of the
dummy DUT.
The peak value of the residual voltage measured under these conditions shall be less than 5 %
of the peak value measured in the final test.
4.8.3 Test
The dummy DUT is replaced by the DUT, and the residual voltage is measured and compared
to the verification criteria.
4.8.4 Final examination of the DUT
After the test, the DUT shall be examined for visible damage. If visible damage is observed,
the DUT will be deemed to fail the test. If there is no visible damage a functional test shall be
performed to verify that the DUT is within its specification.
4.9 Referring to this standard
When reference is made to this standard, the following additional information shall be given.
Standard procedure:
– for gas discharge tubes: type of test fixture used (4.5)
– for measurement on two-terminal length of connection wires, see overall
elements in fixture B: length of DUT between solder points (4.5.3)
Modifications from standard procedure:
– characteristic impedance:
if other than 50 Ω (4.2)
– steepness of prospective pulse, if higher than 1 kV/ns (4.3)
du/dt:
– actual di/dt: if higher than 40 A/ns (4.8.1)
– modification of DUT: if connecting wires of gas discharge tubes are
cut away for measurement in type A fixture
– additional components to the DUT for example additional circuit components;
different wire lengths to those specified.
– 16 – IEC 61000-4-24:2015 © IEC 2015
5 Measurement method for HEMP combination filters
5.1 Verification setup
The output of the pulse generator shall be verified prior to applying a pulse to a DUT. The
typical setup for verification of the pulse test level is illustrated in Figure 3.
a a
Shielded enclosure Shielded enclosure
Coaxial feed-through
Coaxial cable
Oscilloscope
Cable L1
Pulse generator Current sensor
Ground plane
IEC
a
At least one of the two enclosures shall be shielded. Care should be taken to minimize radiated and conducted
interference.
Figure 3 – Typical setup for verification of the pulse test level
The pulse gen
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