Amendment 1 - Fixed inductors for electromagnetic interference suppression - Part 2: Sectional specification

Amendement 1 - Inductances fixes d'antiparasitage - Partie 2: Spécification intermédiaire

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18-Oct-2006
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IEC 60938-2:1999/AMD1:2006 - Amendment 1 - Fixed inductors for electromagnetic interference suppression - Part 2: Sectional specification
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IEC 60938-2
Edition 2.0 2006-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
QC 280100
Fixed inductors for electromagnetic interference suppression –
Part 2: Sectional specification
Inductances fixes d'antiparasitage –
Partie 2: Spécification intermédiaire
IEC 60938-2:1999/A1:2006
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 60938-2
Edition 2.0 2006-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
QC 280100
Fixed inductors for electromagnetic interference suppression –
Part 2: Sectional specification
Inductances fixes d'antiparasitage –
Partie 2: Spécification intermédiaire
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX
ICS 029.100.10; 31.020 ISBN 2-8318-9857-9
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – 60938-2 Amend. 1 © IEC:2006
FOREWORD

This amendment has been prepared by IEC technical committee 40: Capacitors and resistors

for electronic equipment.

This bilingual version, published in 2008-08, corresponds to the English version.

The text of this amendment is based on the following documents:
CDV Report on voting
40/1603/CDV 40/1700A/RVC

Full information on the voting for the approval of this amendment can be found in the report

on voting indicated in the above table.
The French version of this amendment has not been voted upon.

The committee has decided that the contents of this publication will remain unchanged until

the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in

the data related to the specific publication. At this date, the publication will be

• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
_____________
Page 5
1.3 Normative references
Add, to the list of references, the following new reference:

IEC 60384-14, Fixed capacitors for use in electronic equipment – Part 14: Sectional

specification: Fixed capacitors for electromagnetic interference suppression and connection to

the supply mains

CISPR 16-1-1:2003, Specification for radio disturbance and immunity measuring apparatus

and methods – Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring

apparatus

CISPR 16-1-2:2003, Specification for radio disturbance and immunity measuring apparatus

and methods – Part 1-2: Radio disturbance and immunity measuring apparatus – Ancillary

equipment – Conducted disturbances
Page 14
4.2 Voltage proof
Replace the existing Table 3 by the following new Table 3:
___________
A new edition of this publication exists.
---------------------- Page: 4 ----------------------
60938-2 Amend. 1 © IEC:2006 – 3 –
Table 3 – Measuring points
Inductors for Test A between terminations* Test B – Internal insulation)
Test C – External insulation
Test D** – Between windings
and core
Alternating 4,3 U (d.c.) 2 U + 1 500 V (a.c.) with a
R R
current minimum of 2 000 V (a.c.)
Direct current 3 U (d.c.) 2 U + 1 500 V (d.c.)
R R
* Applies only to inductors with more than one winding.

** Test not required for insulated or non-insulated and self-supporting mountable

inductors.
Page 22
Replace the existing Annex A by the following new Annex A:
Annex A
(normative)
Test schedule for safety tests only approval
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 0 ND See Tables 1
or 2
4.1.1 Dimensions See detail specification
(gauging)
4.1 Visual No visible damage
examination Legible marking
4.5 DC line See detail specification
resistance
4.4 Inductance Within specified tolerance
4.2 Voltage proof See Table 3 No breakdown or flashover
See detail specification for
the method
Foil method duration: 1 min
4.3 Insulation See detail specification for As in 4.3
resistance the method
---------------------- Page: 5 ----------------------
– 4 – 60938-2 Amend. 1 © IEC:2006
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 1A D See Tables 1
or 2
4.1.2 Dimensions See detail specification and
(detail) 4.1.2
Creepage For method and severity:
distances and see detail specification
clearances
4.6 Robustness of See detail specification for No visible damage
terminations the method (1A or 1B)
4.7 Resistance to For method 1A:
soldering heat Immersion time: 10 s,
(if applicable) unless otherwise specified
in the detail specification
4.20 Component
solvent
resistance
(if applicable)
As in group 0
4.7.2 Final DC line resistance
measurements
No breakdown or flashover
Voltage proof at 66 % of
value in Table 3
No visible damage
Visual examination
Group 2 D See Tables 1
or 2
4.15 Damp heat, Recovery: 1 h to 26 h
steady state
No visible damage
4.15.1 Final Visual examination
Legible marking
measurement
As in group 0
DC line resistance
Inductance See Tables Within ± 30 % of value
1 or 2 measured in group 0
Voltage proof No breakdown or flashover
Voltage: 66 % of voltage
applied in group 0
A polarizing voltage shall
be applied if specified in
the detail specification
Insulation resistance
≥ 50 % of value in 4.3
---------------------- Page: 6 ----------------------
60938-2 Amend. 1 © IEC:2006 – 5 –
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 3A D See Tables 1
or 2
4.16 Temperature Duration: until thermal
rise (inductors equilibrium has been
with mass reached
> 5 g only)
Current: rated current
4.16.1 Test
conditions
Ambient temperature: rated
temperature
4.16.2 Final
measurements
4.18.1 Endurance, Internal temperature As in 4.16.2
current
Duration: 1 000 h
(inductors with
Current: 1,1 × rated current
mass ≤ 5 g
only)
Recovery: 1 h to 26 h
Group 3B D See Tables
(inductors 1 or 2
with more
than one
winding only)
4.17 Impulse 3 impulses, full wave No breakdown or flashover
voltage Crest voltage: see 4.17.1
4.18.2 Endurance, Duration: 1 000 h
voltage Voltage and temperature,
between line see 4.18.2
terminations
Group 3 See Tables
1 or 2
4.18.3 Final Recovery: 1 h to 26 h
measurements
Visual examination No visible damage
Legible marking
DC line resistance As for group 0
Voltage proof No breakdown or flashover
Voltage: 66 % of voltage
applied in group 0
Insulation resistance
≥ 50 % of values in 4.3
Group 4 D See Tables
1 or 2
4.19 Passive As in 4.19
flammability (if
required in the
detail specifi-
cation)

NOTE 1 Subclause numbers of test and performance requirements refer to Clause 4 .

NOTE 2 In this table, D = destructive, ND = non-destructive.
---------------------- Page: 7 ----------------------
– 6 – 60938-2 Amend. 1 © IEC:2006
Page 25
Replace the existing Annex B by the following new Annex B:
Annex B
(normative)
Test schedule for safety tests and performance
tests for qualification approval, assessment level D
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 0 ND See Tables 1
or 2
4.1.1 Dimensions See detail specification
(gauging)
4.1 Visual No visible damage
examination Legible marking
4.5 DC line See detail specification
resistance
4.4 Inductance Within specified tolerance
4.2 Voltage proof See Table 3 No breakdown or flashover
See detail specification for
the method
Foil method duration: 1 min
4.3 Insulation See detail specification for As in 4.3
resistance the method
Group 1A D See Tables 1
or 2
4.1.2 Dimensions See detail specification and
(detail) 4.1.2
No visible damage
4.6 Robustness of For method and severity:
terminations see detail specification
4.7 Resistance to See detail specification for
soldering heat the method (1A or 1B)
(if applicable) For method 1A:
Immersion time: 10 s,
unless otherwise specified
in the detail specification
4.20 Component
solvent
resistance
(if applicable)
No visible damage
4.7.2 Final Visual examination
measurements
DC line resistance As in group 0
---------------------- Page: 8 ----------------------
60938-2 Amend. 1 © IEC:2006 – 7 –
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 1B See Tables 1
or 2
4.8 Solderability See detail specification for Good tinning as evidenced
(if applicable) the method by free flowing of the solder
with wetting of the
terminations, or solder shall
flow within 3 s, as
applicable
4.21 Solvent resis-
tance of the
marking (if
applicable)
4.9 Rapid change θ = Lower category
of temperature temperature
θ = Upper category
temperature
Five cycles
Duration t =... h, see 4.9.1
Visual examination No visible damage
4.10 Vibration For mounting method see
detail specification
Frequency range:
from... Hz to... Hz
Total number of sweep
cycles:...
Visual examination No visible damage
4.10.2 Final
inspection
4.11 Bump, (or For mounting method see
shock, see detail specification
4.12) Number of bumps:...
Acceleration:... m/s
Duration of pulse:... ms
Visual examination No visible damage
4.12 Shock, (or For mounting method see
bump, see detail specification
4.11) Acceleration:... m/s
Duration of pulse:... ms
4.11.2 Final Visual examination No visible damage
measurements
4.12.3 DC line resistance As in group 0
---------------------- Page: 9 ----------------------
– 8 – 60938-2 Amend. 1 © IEC:2006
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 1 D See Tables 1
or 2
4.13 Container Test Qc or Qd as No leakage
sealing (if prescribed in the detail
required in the specification
detail specifi-
cation)
4.14 Climatic
sequence
4.14.2 Dry heat Temperature: upper
category temperature
Duration: 16 h
4.14.3 Damp heat,
cyclic,
test Db, first
cycle
4.14.4 Cold Temperature: lower cate-
gory temperature
Duration: 2 h
4.14.5 Low air pres- Air pressure 8,0 kPa unless
sure (if otherwise stated in the
required in the detail specification
detail Duration: 1 h
specification)
Visual examination No permanent breakdown,
flashover, harmful deforma-
tion of the case
4.14.6 Damp heat, Recovery: 1 h to 26 h
cyclic,
test Db,
remaining
cycles
No visible damage
4.14.7 Final Visual examination
Legible marking
measurement
As in group 0
DC line resistance
Within ± 30 % of value
Inductance
measured in group 0
No breakdown or flashover
Voltage proof
Voltage: 66 % of voltage
applied in group 0
≥ 50 % of values in 4.3
Insulation resistance
---------------------- Page: 10 ----------------------
60938-2 Amend. 1 © IEC:2006 – 9 –
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 2 D See Tables 1
or 2
4.15 Damp heat, Recovery: 1 h to 26 h
steady state
4.15.1 Final Visual examination No visible damage
measurements Legible marking
DC line resistance As in group 0
Inductance Within +/- 30 % of value
measured in group 0
Voltage proof No breakdown or flashover
Voltage: 66 % of voltage
applied in group 0
A polarizing voltage shall
be applied if specified in
the detail specification
Insulation resistance ≥ 50 % of value in 4.3
Group 3A D See Tables 1
or 2
4.16 Temperature Duration: until thermal
rise equilibrium has been
(inductors with reached
mass > 5 g
only)
See Tables 1
or 2
4.16.1 Test Current: rated current
conditions
Ambient temperature: rated
temperature
4.16.2 Final Internal temperature As in 4.16.2
measurements
4.18.1 Endurance, Duration: 1 000 h
current Current: 1,1 × rated current
(inductors with
mass ≤ 5 g
only) Recovery: 1 h to 26 h
Group 3B D See Tables 1
(inductors or 2
with more
than one
winding only)
4.17 Impulse 3 impulses, full wave No breakdown or flashover
voltage Crest voltage: see 4.17.1
4.18.2 Endurance, Duration: 1 000 h
voltage be- Voltage and temperature,
tween line see 4.18.2
terminations
---------------------- Page: 11 ----------------------
– 10 – 60938-2 Amend. 1 © IEC:2006
Subclause number D Conditions of test Number of Performance
and test or specimens (n) requirements
ND and number of
(see Note 1) (see Note 1)
(see Note 1) (see non-conforming
Note 2) items (c)
Group 3 See Tables 1
or 2
4.18.3 Final Recovery: 1 h to 26 h
measurements
Visual examination No visible damage
Legible marking
DC line resistance As for group 0
Voltage proof No breakdown or flashover
Voltage: 66 % of voltage
applied in group 0
Insulation resistance See 4.18.3
Inductance Within +/- 30 % of value
measured in group 0
Group 4 D See Tables 1
or 2
4.19 Passive flam- As in 4.19
mability (if
required in the
detail speci-
fication)
NOTE 1 Subclause numbers of test and performance requirements refer to Clause 4.
NOTE 2 In this table, D = destructive, ND = non-destructive.
Page 30
Add, after Annex D, the following new Annex E:
---------------------- Page: 12 ----------------------
60938-2 Amend. 1 © IEC:2006 – 11 –
Annex E
(normative)
Test methods for thyristor electromagnetic
interference suppression inductors
E.1 Inductance

The inductance of thyristor electromagnetic interference suppression inductors shall be

measured at a frequency of 100 kHz ± 20 kHz, unless otherwise specified in the detail

specification.
E.2 Temperature rise

The temperature rise of thyristor electromagnetic interference suppression inductors shall be

Figure E.1.
measured under the following conditions, using the phase control circuit of

a) At a gating angle of 0° (thyristor short circuit), adjust R to achieve the rated current.

b) Adjust the gating angle until the highest temperature rise is reached.
R L
10 kΩ
Mains C
0,1 μF0,1 μF
Key
R rated load (ohm resistive load)
L thyristor electromagnetic interference suppression inductor (DUT)
C interference suppression capacitor
D bidirectional trigger diode (ignition-voltage: approximately 32 V)
Tr bi-polar thyristor (triac)
P 500 kΩ potentiometer for setting the gating angle
100 kΩ variable resistor for adjusting the smallest angle
Figure E.1 – Test circuit for temperature rise
E.3 Voltage attenuation
E.3.1 Definition of the interference voltage attenuation a

The effective interference voltage attenuation a is the attenuation of the thyristor

electromagnetic interference suppression inductor together with one capacitor for interference

suppression inserted in a defined phase controlled modulator circuit.
150 kΩ
---------------------- Page: 13 ----------------------
– 12 – 60938-2 Amend. 1 © IEC:2006
E.3.2 Measurement of a

The effective interference voltage attenuation a shall be measured as the ratio (in dB)

between the interference voltage U with and without EMI suppression components L and C,

using the test circuit of Figure E.2 and a quasi-peak measuring receiver according to

CISPR 16-1-1:2003.

a) At a gating angle of 0° (thyristor short circuit) and with L replaced by a short circuit and C

by an open circuit, adjust R to achiev
...

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