IEC 60384-21:2024
(Main)Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
IEC 60384-21:2024 is applicable to fixed unencapsulated surface mount multilayer capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1), intended for use in electronic equipment. These capacitors have metallized connecting pads or soldering strips and are intended to be mounted on printed boards, or directly onto substrates for hybrid circuits. Capacitors for electromagnetic interference suppression are not included but are covered by IEC 60384-14. The object of this document is to specify preferred ratings and characteristics and to select from IEC 60384-1:2021 the appropriate quality assessment procedures, tests and measuring methods and to give general performance requirements for this type of capacitor. Test severities and requirements specified in detail specifications referring to this sectional specification provide specific test severities and requirements of an equal or higher performance level. Further information on the conception of generic, sectional and detail specifications can be found in the Introduction of IEC 60384-1:2021.
This edition includes the following significant technical changes with respect to the previous edition:
a) the document has been completely restructured to comply with the ISO/IEC Directives, Part 2 and to make it more useable; tables, figures and references have been revised accordingly; Annex X contains all cross-references of changes in clause/subclause numbers;
b) the terms have been replaced by the letter symbols in Table 3;
c) code of temperature coefficient and tolerance of C0G, U2J have been added in Table 4, Table 6, Table 8, Table 9, Table 11, Table 13, Table 16 and Annex B;
d) the requirement in 5.5.2(visual examination) has been repeated in 5.9.3, 5.10.5, 5.11.4, 5.11.4, 5.13.7, 5.14.5 and 5.15.5;
e) the deflection D in the very robust designs has been added in 5.9.1;
f) Annex B has been changed informative into normative;
g) Clause C.5 (Test schedule for quality conformance inspection) has been newly added to withdraw the blank detail specification: IEC 60384-21-1.
Condensateurs fixes utilisés dans les équipements électroniques - Partie 21: Spécification intermédiaire - Condensateurs multicouches fixes à diélectriques en céramique pour montage en surface, de Classe 1
L’IEC 60384-21:2024 s’applique aux condensateurs multicouches fixes à diélectriques en céramique pour montage en surface non encapsulés, avec un coefficient de température défini (diélectrique de Classe 1), destinés à être utilisés dans les équipements électroniques. Ces condensateurs possèdent des pastilles de connexion métallisées ou des bandes de brasure et sont destinés à être montés sur des cartes imprimées ou directement sur des substrats de circuits hybrides. Les condensateurs d’antiparasitage ne sont pas inclus, mais sont couverts par l’IEC 60384-14. Le présent document a pour objet de spécifier les valeurs assignées et caractéristiques préférentielles, de sélectionner, en se référant à l’IEC 60384-1:2021, les procédures d’assurance qualité appropriées, les essais et les méthodes de mesure et de donner les exigences de performances générales pour ce type de condensateur. Les sévérités et les exigences des essais spécifiées dans les spécifications particulières se référant au présent document fournissent des sévérités et des exigences d’essai d’un niveau de performance supérieur ou égal. Pour plus d’informations sur la conception des spécifications génériques, intermédiaires et particulières, voir l’Introduction de l’IEC 60384-1:2021.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
a) le document a été entièrement restructuré pour se conformer aux directives ISO/IEC, Partie 2, et pour en faciliter l’utilisation; les tableaux, les figures et les références ont été révisés en conséquence; l’Annexe X comporte toutes les références croisées des changements de numérotation des articles/paragraphes;
b) les termes ont été remplacés par des symboles littéraux dans le Tableau 3;
c) le codage de coefficient de température et tolérance de C0G et U2J a été ajouté dans le Tableau 4, le Tableau 6, le Tableau 8, le Tableau 9, le Tableau 11, le Tableau 13, le Tableau 16 et à l’Annexe B;
d) l’exigence de 5.5.2 (examen visuel) a été répétée en 5.9.3, en 5.10.5, en 5.11.4, en 5.11.4, en 5.13.7, en 5.14.5 et en 5.15.5;
e) la flèche D dans les modèles très robustes a été ajoutée en 5.9.1;
f) l’Annexe B est passée d’informative à normative;
g) l’Article C.5 (Programme d’essais pour le contrôle de conformité de la qualité) a été ajouté pour retirer la spécification particulière-cadre: IEC 60384-21-1.
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Standards Content (Sample)
IEC 60384-21 ®
Edition 4.0 2024-06
COMMENTED VERSION
INTERNATIONAL
STANDARD
colour
inside
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
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IEC 60384-21 ®
Edition 4.0 2024-06
COMMENTED VERSION
INTERNATIONAL
STANDARD
colour
inside
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.060.10 ISBN 978-2-8322-9278-5
– 2 – IEC 60384-21:2024 CMV © IEC 2024
CONTENTS
FOREWORD .6
1 Scope .9
2 Normative references .9
3 Terms and definitions . 10
4 Preferred ratings and characteristics. 11
4.1 Preferred characteristics . 11
4.2 Preferred values of ratings . 11
4.2.1 Rated temperature (T ) . 11
R
4.2.2 Rated voltage (U ) . 11
R
4.2.3 Category voltage (U ) . 11
C
4.2.4 Preferred values of nominal capacitance and associated tolerance
values . 11
4.2.5 Temperature coefficient (α) . 12
4.2.6 Dimensions . 14
5 Test and measurement procedures . 14
5.1 General . 14
5.2 Preliminary drying . 15
5.3 Measuring conditions . 15
5.4 Mounting . 15
5.5 Visual examination and check of dimensions . 15
5.5.1 General . 15
5.5.2 Visual examination . 15
5.5.3 Requirements . 15
5.6 Electrical tests . 17
5.6.1 Capacitance . 17
5.6.2 Tangent of loss angle (tan δ) . 17
5.6.3 Insulation resistance . 18
5.6.4 Voltage proof . 19
5.7 Temperature coefficient (α) and temperature cyclic drift . 19
5.7.1 General . 19
5.7.2 Preliminary drying. 19
5.7.3 Measuring conditions . 19
5.7.4 Requirements . 20
5.8 Shear test . 20
5.9 Substrate bending test . 20
5.9.1 General . 20
5.9.2 Initial measurement . 20
5.9.3 Final inspection . 20
5.10 Resistance to soldering heat . 21
5.10.1 General . 21
5.10.2 Initial measurement . 21
5.10.3 Test conditions . 21
5.10.4 Recovery . 22
5.10.5 Final inspection, measurements and requirements . 22
5.11 Solderability . 23
5.11.1 General . 23
5.11.2 Test conditions . 23
5.11.3 Recovery . 24
5.11.4 Final inspection, measurements and requirements . 24
5.12 Rapid change of temperature . 24
5.12.1 General . 24
5.12.2 Initial measurement . 24
5.12.3 Number of cycles . 24
5.12.4 Recovery . 24
5.12.5 Final inspection, measurements and requirements . 24
5.13 Climatic sequence . 25
5.13.1 General . 25
5.13.2 Initial measurement . 25
5.13.3 Dry heat . 25
5.13.4 Damp heat, cyclic, Test Db, first cycle . 25
5.13.5 Cold . 25
5.13.6 Damp heat, cyclic, Test Db, remaining cycles . 25
5.13.7 Final inspection, measurements and requirements . 25
5.14 Damp heat, steady state . 26
5.14.1 General . 26
5.14.2 Initial measurement . 26
5.14.3 Test conditions . 26
5.14.4 Recovery . 27
5.14.5 Final inspection, measurements and requirements . 27
5.15 Endurance . 27
5.15.1 General . 27
5.15.2 Initial measurement . 27
5.15.3 Test conditions . 27
5.15.4 Recovery . 28
5.15.5 Final inspection, measurements and requirements . 28
5.16 Robustness of terminations (only for capacitors with strip termination) . 28
5.16.1 General . 28
5.16.2 Test conditions . 28
5.16.3 Final inspection and requirements . 29
5.17 Component solvent resistance (if required) . 29
5.18 Solvent resistance of the marking (if required) . 29
5.19 Accelerated damp heat, steady state (if required) . 29
5.19.1 General . 29
5.19.2 Initial measurement . 29
5.19.3 Conditioning . 29
5.19.4 Recovery . 30
5.19.5 Final measurements . 30
6 Marking . 30
6.1 General . 30
6.2 Information for marking . 30
6.3 Marking on the body . 30
6.4 Requirements for marking . 30
6.5 Marking of the packaging . 31
6.6 Additional marking . 31
7 Information to be given in a detail specification . 31
– 4 – IEC 60384-21:2024 CMV © IEC 2024
7.1 General . 31
7.2 Outline drawing and dimensions . 31
7.3 Mounting . 31
7.4 Rating and characteristics . 31
7.4.1 General . 31
7.4.2 Nominal capacitance range . 31
7.4.3 Particular characteristics . 32
7.4.4 Soldering . 32
7.5 Marking . 32
8 Quality assessment procedures . 32
8.1 Primary stage of manufacture . 32
8.2 Structurally similar components . 32
8.3 Certified records of released lots . 32
8.4 Qualification approval . 32
8.4.1 General . 32
8.4.2 Qualification approval on the basis of the fixed sample size procedures . 32
8.4.3 Tests. 33
Annex A (normative) Guidance for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1 . 42
Annex B (informativenormative) Combination of temperature coefficients and
tolerances for the reference temperature of 25 °C . 43
Annex C (normative) Quality conformance inspection . 44
C.1 Formation of inspection lots . 44
C.1.1 Groups A and B inspection . 44
C.1.2 Group C inspection . 44
C.2 Test schedule . 44
C.3 Delayed delivery . 44
C.4 Assessment levels . 44
C.5 Test schedule for quality conformance inspection . 45
Annex X (informative) Cross-reference for reference to IEC 60384-21:20112019 . 50
Bibliography . 52
List of comments . 53
Figure 1 – Fault: crack or fissure . 15
Figure 2 – Fault: crack or fissure . 16
Figure 3 – Separation or delamination . 16
Figure 4 – Exposed electrodes . 16
Figure 5 – Principal faces . 17
Figure 6 – Reflow temperature profile . 22
Figure A.1 – Dimensions . 42
Table 1 – Preferred tolerances on nominal capacitance . 12
Table 2 – Nominal temperature coefficient and tolerance
(for reference temperature 20 °C) . 12
Table 3 – Combination of temperature coefficient and tolerance . 13
Table 4 – Tangent of loss angle limits . 18
Table 5 – Test voltages . 19
Table 6 – Temperature cyclic drift limits . 20
Table 7 – Reflow temperature profiles for Sn-Ag-Cu alloy . 22
Table 8 – Maximum capacitance change . 23
Table 9 – Maximum capacitance change . 24
Table 10 – Number of damp heat cycles . 25
Table 11 – Final inspection, measurements and requirements . 26
Table 12 – Test conditions for damp heat, steady state . 26
Table 13 – Final inspection, measurements and requirements . 27
Table 14 – Endurance test conditions (U = U ). 27
C R
Table 15 – Endurance test conditions (U ≠ U ) . 28
C R
Table 16 – Final inspection, measurements and requirements . 28
Table 17 – Initial requirements . 29
Table 18 – Conditioning. 30
Table 19 – Fixed sample size test plan for qualification approval Assessment level EZ . 34
Table 20 – Tests schedule for qualification approval . 35
Table A.1 – Dimensions . 42
Table B.1 – Combination of temperature coefficients and tolerances for the reference
temperature of 25 °C . 43
Table C.1 – Lot by lot inspection . 45
Table C.2 – Periodic tests inspection . 45
Table C.3 – Test schedule for quality conformance inspection (lot by lot) . 46
Table C.4 – Test schedule for quality conformance inspection (Periodic test) . 47
Table X.1 – Reference to IEC 60384-21 for clause/subclauseannex . 50
Table X.2 – Reference to IEC 60384-21 for figure/table . 51
– 6 – IEC 60384-21:2024 CMV © IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
Part 21: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
FOREWORD
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This commented version (CMV) of the official standard IEC 60384-21:2024 edition 4.0
allows the user to identify the changes made to the previous IEC 60384-21:2019
edition 3.0. Furthermore, comments from IEC TC 40 experts are provided to explain the
reasons of the most relevant changes, or to clarify any part of the content.
A vertical bar appears in the margin wherever a change has been made. Additions are in
green text, deletions are in strikethrough red text. Experts' comments are identified by a
blue-background number. Mouse over a number to display a pop-up note with the
comment.
This publication contains the CMV and the official standard. The full list of comments is
available at the end of the CMV.
IEC 60384-21 has been prepared by IEC technical committee 40: Capacitors and resistors for
electronic equipment. It is an International Standard.
This fourth edition cancels and replaces the third edition published in 2019. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) the document has been completely restructured to comply with the ISO/IEC Directives,
Part 2 and to make it more useable; tables, figures and references have been revised
accordingly; Annex X contains all cross-references of changes in clause/subclause
numbers;
b) the terms have been replaced by the letter symbols in Table 3;
c) code of temperature coefficient and tolerance of C0G, U2J have been added in Table 4,
Table 6, Table 8, Table 9, Table 11, Table 13, Table 16 and Annex B;
d) the requirement in 5.5.2(visual examination) has been repeated in 5.9.3, 5.10.5, 5.11.4,
5.11.4, 5.13.7, 5.14.5 and 5.15.5;
e) the deflection D in the very robust designs has been added in 5.9.1;
f) Annex B has been changed informative into normative;
g) Clause C.5 (Test schedule for quality conformance inspection) has been newly added to
withdraw the blank detail specification: IEC 60384-21-1.
The text of this International Standard is based on the following documents:
Draft Report on voting
40/3119/FDIS 40/3138/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60384 series, published under the general title Fixed capacitors for
use in electronic equipment, can be found on the IEC website.
– 8 – IEC 60384-21:2024 CMV © IEC 2024
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
Part 21: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
1 Scope
This part of IEC 60384 is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1),
intended for use in electronic equipment. These capacitors have metallized connecting pads or
soldering strips and are intended to be mounted on printed boards, or directly onto substrates
for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
The object of this document is to prescribe specify preferred ratings and characteristics and to
select from IEC 60384-1:2021 the appropriate quality assessment procedures, tests and
measuring methods and to give general performance requirements for this type of capacitor.
Test severities and requirements prescribed in detail specifications referring to this sectional
specification are of equal or higher performance levels; lower performance levels are not
permitted. Test severities and requirements specified in detail specifications referring to this
document provide specific test severities and requirements of an equal or higher performance
level. Further information on the conception of generic, sectional and detail specifications can
be found in the Introduction of IEC 60384-1:2021. 1
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60068-2-58:2015, Environmental testing – Part 2-58: Tests – Test Td – Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-58:2015/AMD1:2017
IEC 60384-1:20162021, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
ISO 3:1973, Preferred numbers – Series of preferred numbers
– 10 – IEC 60384-21:2024 CMV © IEC 2024
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1:2021 and
the following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
surface mount multilayer capacitor
multilayer capacitor whose small dimensions and nature or shape of terminations make it
suitable for surface mounting in hybrid circuits and on printed boards
3.2
capacitor of ceramic dielectric, Class 1
capacitor specially designed and suited for resonant circuit application where low losses and
high stability of capacitance are essential or where a precisely defined temperature coefficient
is required, for example for compensating temperature effects in the circuit
Note 1 to entry: The ceramic dielectric is defined by its nominal temperature coefficient (α).
3.3
subclass
tolerance on the temperature coefficient for a given nominal temperature coefficient,
the subclass is defined by the tolerance on the temperature coefficient
Note 1 to entry: See Table 2.
Note 2 to entry: The nominal temperature coefficient value and its tolerance refer to the temperature interval of
from the reference temperature +20 °C or +25°C to +85 °C, but because in practice TC curves are not strictly linear,
it is necessary to define limiting capacitance deviation (∆C/C) for other temperatures (see Table 3 and Annex B).
3.4
category temperature range
ambient temperature range for which the capacitor has been designed to operate continuously
Note 1 to entry: This is given by the lower and upper category temperature. (see Table 3 and Annex B).
3.5
rated temperature
T
R
maximum ambient temperature at which the rated voltage may can be continuously applied
3.6
rated voltage
U
R
maximum DC voltage that may can be applied continuously to a capacitor at any temperature
between the lower category temperature and the rated temperature
Note 1 to entry: The maximum DC voltage is the sum of the DC voltage and peak AC voltage or peak pulse voltage
applied to the capacitor.
3.7
category voltage
U
C
maximum voltage that can be applied continuously to a capacitor at its upper category
temperature
4 Preferred ratings and characteristics
4.1 Preferred characteristics
Preferred climatic categories only shall be given in the preferred characteristics.
The capacitors covered by this document are classified into climatic categories in accordance
with the general rules given in IEC 60068-1:2013, Annex A.
For reference temperature 20 °C or 25 °C 2, the lower and upper category temperatures and
the duration of the damp heat, steady state test shall be chosen from the following:
• lower category temperature: −55 °C, −40 °C, −25 °C, −10 °C and +10 °C;
• upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C and +150 °C;
• duration of the damp heat,
steady state test (40 °C, 93 % RH): 4, 10, 21 and 56 days.
The severities of the cold and dry heat tests are the lower and upper category temperatures
respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their unmounted
state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting substrate, the
mounting method (see 5.4) and the final coating.
4.2 Preferred values of ratings
4.2.1 Rated temperature (T )
R
For capacitors covered by this document, the rated temperature is equal to the upper category
temperature, unless the upper category temperature exceeds 125 °C.
4.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed, they shall be chosen from the R10 series.
The sum of the DC voltage and the peak AC voltage or the peak-to-peak AC voltage, whichever
is the greater, applied to the capacitor shall not exceed the rated voltage.
4.2.3 Category voltage (U )
C
When the rated temperature is defined as the upper category temperature, the category voltage
is equal to the rated voltage as defined in IEC 60384-1:20162021, 3.5. If the upper category
temperature exceeds 125 °C, or the rated voltages exceed 500 V, the category voltage shall be
given in the detail specification.
4.2.4 Preferred values of nominal capacitance and associated tolerance values
4.2.4.1 Preferred values of nominal capacitance
Nominal capacitance values shall should be taken from the number series of IEC 60063; the
E6, E12 and E24 series are preferred given in IEC 60063.
4.2.4.2 Preferred tolerances on nominal capacitance
See Table 1.
– 12 – IEC 60384-21:2024 CMV © IEC 2024
Table 1 – Preferred tolerances on nominal capacitance
Tolerance
Preferred
series
C ≥ 10 pF C < 10 pF
Letter code Letter code
N N
E6 ±20 % M ±2 pF G
E12 ±10 % K ±1 pF F
E24 ±5 % J ±0,5 pF D
±2 % G ±0,25 pF C
±1 % F ±0,1 pF B
4.2.5 Temperature coefficient (α)
4.2.5.1 Nominal temperature coefficient and tolerance (for reference temperature
20 °C)
Table 2 shows the preferred nominal temperature coefficients for the reference temperature
−6
20 °C, the associated tolerances, expressed in parts per million per Kelvin (10 /K), and the
corresponding subclasses and letter codes. The temperature coefficients, tolerances and letter
codes for the reference temperature 25 °C are given in Annex B. 3
The detail specification shall specify for each temperature coefficient the minimum value of
capacitance for which the given tolerance of temperature coefficient can be verified, considering
the accuracy of the methods of capacitance measurement specified.
For values of capacitance lower than this minimum value:
a) the detail specification shall specify a multiplying factor for the tolerance on α, as well as
the permissible changes of capacitance at the lower and upper category temperature;
b) special methods of measurement may can be necessary and, if required, shall be stated in
the detail specification.
Table 2 – Nominal temperature coefficient and tolerance
(for reference temperature 20 °C)
Letter code for
Nominal temperature coefficient Tolerance on temperature
Subclass
−6 −6
(10 /K) coefficient (10 /K)
α Tolerance
+100 ±30 1B A G
0 ±30 1B C G
−33 ±30 1B H G
−75 ±30 1B L G
−150 ±30 1B P G
−220 ±30 1B R G
−330 ±60 1B S H
−470 ±60 1B T H
−750 ±120 1B U J
−1 000 ±250 1F Q K
−1 500 ±250 1F V K
a
+140 ≥ α ≥ −1 000 1C SL -
NOTE 1 Preferred temperature coefficients values (α) are underlined.
NOTE 2 The nominal temperature coefficients and their tolerances are defined using the capacitance change
between the temperatures 20 °C and 85 °C.
−6
NOTE 3 A capacitor with a temperature coefficient 0 × 10 /K and a tolerance on temperature coefficient of
−6
±30 × 10 /K is designated as a CG capacitor (subclass 1B).
a
This temperature coefficient value is not subject to inspection since no limits for relative capacitance variation
are specified in Table 3.
NOTE See Annex B for the reference temperature of 25 °C as an informative guidance.
4.2.5.2 Permissible relative variation of capacitance
Table 3 shows for each combination of temperature coefficient and tolerance the permissible
relative variation of capacitance expressed in parts per thousand at both the upper and lower
category temperatures. Temperature coefficients and tolerances are expressed in parts per
−6
million per Kelvin (10 /K). In case of reference temperature 25 °C, see Table B.1 for an
explanation of the permissible relative variation of capacitance.
Table 3 – Combination of temperature coefficient and tolerance
Permissible relative variation in capacitance in parts per 1 000 between 20 °C
and a given temperature
Lower category temperature Upper category temperature
α Tolerance
−6 −6
−55 °C −40 °C −25 °C −10 °C +70 °C +85 °C +100 °C +125 °C
10 /K 10 /K
+100 ±30 (G) −9,75/ −7,80/ −5,85/ −3,90/ 3,50/ 4,55/ 5,60/ 7,35/
−3,71 −2,96 −2,22 −1,48 6,50 8,45 10,4 13,7
0 ±30 (G) −2,25/ −1,80/ −1,35/ −0,90/ −1,50/ −1,95/ −2,40/ −3,15/
5,45 4,36 3,27 2,18 1,50 1,95 2,40 3,15
−33 ±30 (G) 0,225/ 0,180/ 0,135/ 0,090/ −3,15/ −4,10/ −5,04/ −6,62/
8,47 6,77 5,08 3,39 −0,15 −0,195 −0,240 −0,32
−75 ±30 (G) 3,38/ 2,70/ 2,03/ 1,35/ −5,25/ −6,83/ −8,40/ −11,0/
12,3 9,85 7,39 4,92 −2,25 −2,93 −3,60 −4,73
−150 ±30 (G) 9,00/ 7,20/ 5,40/ 3,60/ −9,00/ −11,7/ −14,4/ −18,9/
19,2 15,3 11,5 7,67 −6,0 −7,80 −9,60 −12,6
−220 ±30 (G) 14,3/ 11,4/ 8,55/ 5,70/ −12,5/ −16,2/ −20,0/ −26,3/
25,6 20,46 15,3 10,2 −9,50 −12,4 −15,2 −20,0
−330 ±60 (H) 20,3/ 16,2/ 12,2/ 8,10/ −19,5/ −25,4/ −31,2/ −41,0/
38,4 30,7 23,0 15,4 −13,5 −17,6 −21,6 −28,4
−470 ±60 (H) 30,8/ 24,6/ 18,5/ 12,3/ −26,5/ −34,5/ −42,4/ −55,7/
51,2 41,0 30,7 20,5 −20,5 −26,7 −32,8 −43,1
−750 ±120 (J) 47,3/ 37,8/ 28,4/ 18,9/ −43,5/ −56,6/ −69,6/ −91,4/
82,3 65,8 49,4 32,9 −31,5 −41,0 −50,4 −66,2
−1 000 ±250 (K) 56,3/ 45,0/ 33,8/ 22,5/ −62,5/ −81,3/ −100/ −131/
117 93,7 70,2 46,8 −37,5 −48,8 −60,0 −78,8
−1 500 ±250 (K) 93,8/ 75,0/ 56,3/ 37,5/ −87,5/ −114/ −140/ −184/
163 130 97,7 65,1 −62,5 −81,3 −100 −131
– 14 – IEC 60384-21:2024 CMV © IEC 2024
When the upper category temperature is above 125 °C, the limits shall be given in the detail specification.
NOTE 1 Preferred temperature coefficient values (α) are underlined.
NOTE 2 The temperature coefficient limits at the temperature range from 20 °C to the upper category temperature
are calculated by the nominal temperature coefficients and their tolerances (see formula a) of NOTE 3).
The temperature coefficient limits at the temperature range from 20 °C to –55 °C are calculated by using the
formulas b) and c) of NOTE 3.
NOTE 3 The capacitance deviations at the lower category temperature are obtained by using following formulas:
a) upper and lower permissible relative variation in capacitance under upper category temperature:
−3
ΔC/C (10 ) = (nominal temperature coefficient ± tolerance on temperature coefficient*) × (upper category
temperature − 20)/1 000
b) lower permissible relative variation in capacitance under lower category temperature:
−3
ΔC/C (10 ) = (nominal temperature coefficient + tolerance on temperature coefficient*) × (lower category
temperature − 20)/1 000
c) upper permissible relative variation in capacitance under lower category temperature:
−3
ΔC/C (10 ) = [(−36) − (1,22 × tolerance on temperature coefficient*) + (0,22 × nominal temperature coefficient)
+ nominal temperature coefficient ] × (lower category temperature − 20)/1 000
where tolerance on temperature coefficient* is an absolute value.
Formulas for calculation of the permissible relative variation in capacitance:
Permissible relative variation in the temperature range from 20 °C to the upper category temperature:
−3
∆−C/C 10 =αδ±× UCT 20 /1000 (1)
( ) ( )
( )
Permissible relative variation in the temperature range from 20 °C to the lower category temperature:
a) lower permissible relative variation in capacitance from 20 °C to lower category temperature:
−3
(2)
∆−C/C 10 =αδ±× (LCT 20)/1000
( )
( )
b) upper permissible relative variat
...
IEC 60384-21 ®
Edition 4.0 2024-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 21: Spécification intermédiaire – Condensateurs multicouches fixes à
diélectriques en céramique pour montage en surface, de Classe 1
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IEC 60384-21 ®
Edition 4.0 2024-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 21: Sectional specification – Fixed surface mount multilayer capacitors of
ceramic dielectric, Class 1
Condensateurs fixes utilisés dans les équipements électroniques –
Partie 21: Spécification intermédiaire – Condensateurs multicouches fixes à
diélectriques en céramique pour montage en surface, de Classe 1
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.10 ISBN 978-2-8322-8903-7
– 2 – IEC 60384-21:2024 © IEC 2024
CONTENTS
FOREWORD . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Preferred ratings and characteristics . 9
4.1 Preferred characteristics . 9
4.2 Preferred values of ratings . 10
4.2.1 Rated temperature (T ) . 10
R
4.2.2 Rated voltage (U ) . 10
R
4.2.3 Category voltage (U ) . 10
C
4.2.4 Preferred values of nominal capacitance and associated tolerance
values . 10
4.2.5 Temperature coefficient (α) . 11
4.2.6 Dimensions . 13
5 Test and measurement procedures . 13
5.1 General . 13
5.2 Preliminary drying . 13
5.3 Measuring conditions . 13
5.4 Mounting . 13
5.5 Visual examination and check of dimensions . 13
5.5.1 General . 13
5.5.2 Visual examination . 13
5.5.3 Requirements . 13
5.6 Electrical tests . 15
5.6.1 Capacitance . 15
5.6.2 Tangent of loss angle (tan δ) . 15
5.6.3 Insulation resistance . 16
5.6.4 Voltage proof . 17
5.7 Temperature coefficient (α) and temperature cyclic drift . 17
5.7.1 General . 17
5.7.2 Preliminary drying . 18
5.7.3 Measuring conditions . 18
5.7.4 Requirements . 18
5.8 Shear test . 18
5.9 Substrate bending test . 18
5.9.1 General . 18
5.9.2 Initial measurement . 18
5.9.3 Final inspection . 19
5.10 Resistance to soldering heat . 19
5.10.1 General . 19
5.10.2 Initial measurement . 19
5.10.3 Test conditions . 19
5.10.4 Recovery . 20
5.10.5 Final inspection, measurements and requirements. 20
5.11 Solderability . 21
5.11.1 General . 21
5.11.2 Test conditions . 21
5.11.3 Recovery . 21
5.11.4 Final inspection, measurements and requirements. 21
5.12 Rapid change of temperature . 22
5.12.1 General . 22
5.12.2 Initial measurement . 22
5.12.3 Number of cycles . 22
5.12.4 Recovery . 22
5.12.5 Final inspection, measurements and requirements. 22
5.13 Climatic sequence. 22
5.13.1 General . 22
5.13.2 Initial measurement . 22
5.13.3 Dry heat . 23
5.13.4 Damp heat, cyclic, Test Db, first cycle . 23
5.13.5 Cold. 23
5.13.6 Damp heat, cyclic, Test Db, remaining cycles . 23
5.13.7 Final inspection, measurements and requirements. 23
5.14 Damp heat, steady state . 24
5.14.1 General . 24
5.14.2 Initial measurement . 24
5.14.3 Test conditions . 24
5.14.4 Recovery . 24
5.14.5 Final inspection, measurements and requirements. 24
5.15 Endurance . 25
5.15.1 General . 25
5.15.2 Initial measurement . 25
5.15.3 Test conditions . 25
5.15.4 Recovery . 26
5.15.5 Final inspection, measurements and requirements. 26
5.16 Robustness of terminations (only for capacitors with strip termination) . 26
5.16.1 General . 26
5.16.2 Test conditions . 26
5.16.3 Final inspection and requirements . 27
5.17 Component solvent resistance (if required) . 27
5.18 Solvent resistance of the marking (if required) . 27
5.19 Accelerated damp heat, steady state (if required) . 27
5.19.1 General . 27
5.19.2 Initial measurement . 27
5.19.3 Conditioning . 27
5.19.4 Recovery . 28
5.19.5 Final measurements . 28
6 Marking . 28
6.1 General . 28
6.2 Information for marking . 28
6.3 Marking on the body . 28
6.4 Requirements for marking . 28
6.5 Marking of the packaging . 29
6.6 Additional marking . 29
7 Information to be given in a detail specification . 29
– 4 – IEC 60384-21:2024 © IEC 2024
7.1 General . 29
7.2 Outline drawing and dimensions . 29
7.3 Mounting . 29
7.4 Rating and characteristics . 29
7.4.1 General . 29
7.4.2 Nominal capacitance range . 29
7.4.3 Particular characteristics . 30
7.4.4 Soldering . 30
7.5 Marking . 30
8 Quality assessment procedures . 30
8.1 Primary stage of manufacture . 30
8.2 Structurally similar components . 30
8.3 Certified records of released lots . 30
8.4 Qualification approval . 30
8.4.1 General . 30
8.4.2 Qualification approval on the basis of the fixed sample size procedures . 30
8.4.3 Tests . 31
Annex A (normative) Guidance for the specification and coding of dimensions of fixed
surface mount multilayer capacitors of ceramic dielectric, Class 1 . 36
Annex B (normative) Combination of temperature coefficients and tolerances for the
reference temperature of 25 °C . 37
Annex C (normative) Quality conformance inspection . 38
C.1 Formation of inspection lots . 38
C.1.1 Groups A and B inspection . 38
C.1.2 Group C inspection . 38
C.2 Test schedule . 38
C.3 Delayed delivery . 38
C.4 Assessment levels . 38
C.5 Test schedule for quality conformance inspection . 39
Annex X (informative) Cross-reference for reference to IEC 60384-21:2019 . 44
Bibliography . 45
Figure 1 – Fault: crack or fissure. 14
Figure 2 – Fault: crack or fissure. 14
Figure 3 – Separation or delamination . 14
Figure 4 – Exposed electrodes . 14
Figure 5 – Principal faces . 15
Figure 6 – Reflow temperature profile . 20
Figure A.1 – Dimensions . 36
Table 1 – Preferred tolerances on nominal capacitance . 10
Table 2 – Nominal temperature coefficient and tolerance
(for reference temperature 20 °C) . 11
Table 3 – Combination of temperature coefficient and tolerance . 12
Table 4 – Tangent of loss angle limits . 16
Table 5 – Test voltages . 17
Table 6 – Temperature cyclic drift limits . 18
Table 7 – Reflow temperature profiles for Sn-Ag-Cu alloy . 20
Table 8 – Maximum capacitance change . 20
Table 9 – Maximum capacitance change . 22
Table 10 – Number of damp heat cycles . 23
Table 11 – Final inspection, measurements and requirements . 23
Table 12 – Test conditions for damp heat, steady state . 24
Table 13 – Final inspection, measurements and requirements . 25
Table 14 – Endurance test conditions (U = U ) . 25
C R
Table 15 – Endurance test conditions (U ≠ U ) . 26
C R
Table 16 – Final inspection, measurements and requirements . 26
Table 17 – Initial requirements . 27
Table 18 – Conditioning . 28
Table 19 – Fixed sample size test plan for qualification approval Assessment level EZ . 32
Table 20 – Tests schedule for qualification approval . 33
Table A.1 – Dimensions . 36
Table B.1 – Combination of temperature coefficients and tolerances for the reference
temperature of 25 °C . 37
Table C.1 – Lot by lot inspection . 39
Table C.2 – Periodic inspection. 39
Table C.3 – Test schedule for quality conformance inspection (lot by lot) . 40
Table C.4 – Test schedule for quality conformance inspection (Periodic test) . 41
Table X.1 – Reference to IEC 60384-21 for clause/annex . 44
Table X.2 – Reference to IEC 60384-21 for figure/table . 44
– 6 – IEC 60384-21:2024 © IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
Part 21: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
may be required to implement this document. However, implementers are cautioned that this may not represent
the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC 60384-21 has been prepared by IEC technical committee 40: Capacitors and resistors for
electronic equipment. It is an International Standard.
This fourth edition cancels and replaces the third edition published in 2019. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) the document has been completely restructured to comply with the ISO/IEC Directives,
Part 2 and to make it more useable; tables, figures and references have been revised
accordingly; Annex X contains all cross-references of changes in clause/subclause
numbers;
b) the terms have been replaced by the letter symbols in Table 3;
c) code of temperature coefficient and tolerance of C0G, U2J have been added in Table 4,
Table 6, Table 8, Table 9, Table 11, Table 13, Table 16 and Annex B;
d) the requirement in 5.5.2(visual examination) has been repeated in 5.9.3, 5.10.5, 5.11.4,
5.11.4, 5.13.7, 5.14.5 and 5.15.5;
e) the deflection D in the very robust designs has been added in 5.9.1;
f) Annex B has been changed informative into normative;
g) Clause C.5 (Test schedule for quality conformance inspection) has been newly added to
withdraw the blank detail specification: IEC 60384-21-1.
The text of this International Standard is based on the following documents:
Draft Report on voting
40/3119/FDIS 40/3138/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 60384 series, published under the general title Fixed capacitors for
use in electronic equipment, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
– 8 – IEC 60384-21:2024 © IEC 2024
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
Part 21: Sectional specification –
Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
1 Scope
This part of IEC 60384 is applicable to fixed unencapsulated surface mount multilayer
capacitors of ceramic dielectric with a defined temperature coefficient (dielectric Class 1),
intended for use in electronic equipment. These capacitors have metallized connecting pads or
soldering strips and are intended to be mounted on printed boards, or directly onto substrates
for hybrid circuits.
Capacitors for electromagnetic interference suppression are not included but are covered by
IEC 60384-14.
The object of this document is to specify preferred ratings and characteristics and to select from
IEC 60384-1:2021 the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test severities
and requirements specified in detail specifications referring to this document provide specific
test severities and requirements of an equal or higher performance level. Further information
on the conception of generic, sectional and detail specifications can be found in the Introduction
of IEC 60384-1:2021.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60068-2-58, Environmental testing – Part 2-58: Tests – Test Td – Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface mounting
devices (SMD)
IEC 60384-1:2021, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60384-1:2021 and
the following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
surface mount multilayer capacitor
multilayer capacitor whose small dimensions and nature or shape of terminations make it
suitable for surface mounting in hybrid circuits and on printed boards
3.2
capacitor of ceramic dielectric, Class 1
capacitor specially designed and suited for resonant circuit application where low losses and
high stability of capacitance are essential or where a precisely defined temperature coefficient
is required, for example for compensating temperature effects in the circuit
Note 1 to entry: The ceramic dielectric is defined by its nominal temperature coefficient (α).
3.3
subclass
tolerance on the temperature coefficient for a given nominal temperature coefficient
Note 1 to entry: See Table 2.
Note 2 to entry: The nominal temperature coefficient value and its tolerance refer to the temperature interval from
the reference temperature +20 °C or +25°C to +85 °C, but because in practice TC curves are not strictly linear, it is
necessary to define limiting capacitance deviation (∆C/C) for other temperatures (see Table 3 and Annex B).
3.4
temperature range
ambient temperature range for which the capacitor has been designed to operate continuously
Note 1 to entry: This is given by the lower and upper category temperature. (see Table 3 and Annex B).
3.5
rated temperature
T
R
maximum ambient temperature at which the rated voltage can be continuously applied
3.6
rated voltage
U
R
maximum DC voltage that can be applied continuously to a capacitor at any temperature
between the lower category temperature and the rated temperature
Note 1 to entry: The maximum DC voltage is the sum of the DC voltage and peak AC voltage or peak pulse voltage
applied to the capacitor.
3.7
category voltage
U
C
maximum voltage that can be applied continuously to a capacitor at its upper category
temperature
4 Preferred ratings and characteristics
4.1 Preferred characteristics
Preferred climatic categories only shall be given in the preferred characteristics.
The capacitors covered by this document are classified into climatic categories in accordance
with the general rules given in IEC 60068-1:2013, Annex A.
For reference temperature 20 °C or 25 °C, the lower and upper category temperatures and the
duration of the damp heat, steady state test shall be chosen from the following:
– 10 – IEC 60384-21:2024 © IEC 2024
• lower category temperature: −55 °C, −40 °C, −25 °C, −10 °C and +10 °C;
• upper category temperature: +70 °C, +85 °C, +100 °C, +125 °C;
• duration of the damp heat,
steady state test (40 °C, 93 % RH): 4, 10, 21 and 56 days.
The severities of the cold and dry heat tests are the lower and upper category temperatures
respectively.
NOTE The resistance to humidity resulting from the above climatic category is for the capacitors in their unmounted
state. The climatic performance of the capacitors after mounting is greatly influenced by the mounting substrate, the
mounting method (see 5.4) and the final coating.
4.2 Preferred values of ratings
4.2.1 Rated temperature (T )
R
For capacitors covered by this document, the rated temperature is equal to the upper category
temperature, unless the upper category temperature exceeds 125 °C.
4.2.2 Rated voltage (U )
R
The preferred values of the rated voltage are the values of the R5 series of ISO 3. If other
values are needed, they shall be chosen from the R10 series.
The sum of the DC voltage and the peak AC voltage or the peak-to-peak AC voltage, whichever
is the greater, applied to the capacitor shall not exceed the rated voltage.
4.2.3 Category voltage (U )
C
When the rated temperature is defined as the upper category temperature, the category voltage
is equal to the rated voltage as defined in IEC 60384-1:2021, 3.5. If the upper category
temperature exceeds 125 °C, or the rated voltages exceed 500 V, the category voltage shall be
given in the detail specification.
4.2.4 Preferred values of nominal capacitance and associated tolerance values
4.2.4.1 Preferred values of nominal capacitance
Nominal capacitance values should be taken from the E6, E12 and E24 series given in
IEC 60063.
4.2.4.2 Preferred tolerances on nominal capacitance
See Table 1.
Table 1 – Preferred tolerances on nominal capacitance
Tolerance
Preferred
series
C ≥ 10 pF C < 10 pF
Letter code Letter code
N N
E6 ±20 % M ±2 pF G
E12 ±10 % K ±1 pF F
E24 ±5 % J ±0,5 pF D
±2 % G ±0,25 pF C
±1 % F ±0,1 pF B
4.2.5 Temperature coefficient (α)
4.2.5.1 Nominal temperature coefficient and tolerance (for reference temperature
20 °C)
Table 2 shows the nominal temperature coefficients for the reference temperature 20 °C, the
−6
associated tolerances, expressed in parts per million per Kelvin (10 /K), and the corresponding
subclasses and letter codes. The temperature coefficients, tolerances and letter codes for the
reference temperature 25 °C are given in Annex B.
The detail specification shall specify for each temperature coefficient the minimum value of
capacitance for which the given tolerance of temperature coefficient can be verified, considering
the accuracy of the methods of capacitance measurement specified.
For values of capacitance lower than this minimum value:
a) the detail specification shall specify a multiplying factor for the tolerance on α, as well as
the permissible changes of capacitance at the lower and upper category temperature;
b) special methods of measurement can be necessary and, if required, shall be stated in the
detail specification.
Table 2 – Nominal temperature coefficient and tolerance
(for reference temperature 20 °C)
Letter code for
Nominal temperature coefficient Tolerance on temperature
Subclass
−6 −6
(10 /K) coefficient (10 /K)
α Tolerance
+100 ±30 1B A G
0 ±30 1B C G
−33 ±30 1B
H G
−75 ±30 1B L G
−150 ±30 1B P G
−220 ±30 1B R G
−330 ±60 1B S H
−470 ±60 1B
T H
−750 ±120 1B U J
−1 000 ±250 1F Q K
−1 500 ±250 1F V K
a
+140 ≥ α ≥ −1 000 1C SL -
The nominal temperature coefficients and their tolerances are defined using the capacitance change between the
temperatures 20 °C and 85 °C.
−6 −6
A capacitor with a temperature coefficient 0 × 10 /K and a tolerance on temperature coefficient of ±30 × 10 /K
is designated as a CG capacitor (subclass 1B).
a
This temperature coefficient value is not subject to inspection since no limits for relative capacitance variation
are specified in Table 3.
4.2.5.2 Permissible relative variation of capacitance
Table 3 shows for each combination of temperature coefficient and tolerance the permissible
relative variation of capacitance expressed in parts per thousand at both the upper and lower
category temperatures. Temperature coefficients and tolerances are expressed in parts per
−6
million per Kelvin (10 /K). In case of reference temperature 25 °C, see Table B.1 for an
explanation of the permissible relative variation of capacitance.
– 12 – IEC 60384-21:2024 © IEC 2024
Table 3 – Combination of temperature coefficient and tolerance
Permissible relative variation in capacitance in parts per 1 000 between 20 °C
and a given temperature
Lower category temperature Upper category temperature
α Tolerance
−6 −6
−55 °C −40 °C −25 °C −10 °C +70 °C +85 °C +100 °C +125 °C
10 /K 10 /K
+100 ±30 (G) −9,75/ −7,80/ −5,85/ −3,90/ 3,50/ 4,55/ 5,60/ 7,35/
−3,71 −2,96 −2,22 −1,48 6,50 8,45 10,4 13,7
0 ±30 (G) −2,25/ −1,80/ −1,35/ −0,90/ −1,50/ −1,95/ −2,40/ −3,15/
5,45 4,36 3,27 2,18 1,50 1,95 2,40 3,15
−33 ±30 (G) 0,225/ 0,180/ 0,135/ 0,090/ −3,15/ −4,10/ −5,04/ −6,62/
8,47 6,77 5,08 3,39 −0,15 −0,195 −0,240 −0,32
3,38/ 2,70/ 2,03/ 1,35/ −5,25/ −6,83/ −8,40/ −11,0/
−75 ±30 (G)
12,3 9,85 7,39 4,92 −2,25 −2,93 −3,60 −4,73
−150 ±30 (G) 9,00/ 7,20/ 5,40/ 3,60/ −9,00/ −11,7/ −14,4/ −18,9/
19,2 15,3 11,5 7,67 −6,0 −7,80 −9,60 −12,6
−220 ±30 (G) 14,3/ 11,4/ 8,55/ 5,70/ −12,5/ −16,2/ −20,0/ −26,3/
25,6 20,46 15,3 10,2 −9,50 −12,4 −15,2 −20,0
−330 ±60 (H) 20,3/ 16,2/ 12,2/ 8,10/ −19,5/ −25,4/ −31,2/ −41,0/
38,4 30,7 23,0 15,4 −13,5 −17,6 −21,6 −28,4
−470 ±60 (H) 30,8/ 24,6/ 18,5/ 12,3/ −26,5/ −34,5/ −42,4/ −55,7/
51,2 41,0 30,7 20,5 −20,5 −26,7 −32,8 −43,1
−750 ±120 (J) 47,3/ 37,8/ 28,4/ 18,9/ −43,5/ −56,6/ −69,6/ −91,4/
82,3 65,8 49,4 32,9 −31,5 −41,0 −50,4 −66,2
−1 000 ±250 (K) 56,3/ 45,0/ 33,8/ 22,5/ −62,5/ −81,3/ −100/ −131/
117 93,7 70,2 46,8 −37,5 −48,8 −60,0 −78,8
−1 500 ±250 (K) 93,8/ 75,0/ 56,3/ 37,5/ −87,5/ −114/ −140/ −184/
163 130 97,7 65,1 −62,5 −81,3 −100 −131
When the upper category temperature is above 125 °C, the limits shall be given in the detail specification.
Formulas for calculation of the permissible relative variation in capacitance:
Permissible relative variation in the temperature range from 20 °C to the upper category temperature:
−3
∆−C/C 10 =αδ±× UCT 20 /1000 (1)
( ) ( )
( )
Permissible relative variation in the temperature range from 20 °C to the lower category temperature:
a) lower permissible relative variation in capacitance from 20 °C to lower category temperature:
−3
∆−C/C 10 =αδ±× LCT 20 /1000 (2)
( ) ( )
( )
b) upper permissible relative variation in capacitance from 20 °C to lower category temperature:
−3
∆C/C 10 = (−36) − 1
...
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