IEC 61000-4-4:2012

Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

IEC 61000-4-4:2012 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It has the status of a basic EMC publication in accordance with IEC Guide 107. It gives immunity requirements and test procedures related to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes test procedures. The object of this standard is to establish a common and reproducible reference in order to evaluate the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this standard describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010). It constitutes a technical revision which improves and clarifies simulator specifications, test criteria and test setups.

Compatibilité électromagnétique (CEM) - Partie 4-4: Techniques d'essai et de mesure - Essais d'immunité aux transitoires électriques rapides en salves

IEC 61000-4-4:2012 concerne l'immunité des matériels électriques et électroniques aux transitoires rapides répétitifs. Elle a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI. Elle donne les exigences d'immunité et les procédures d'essai relatives aux transitoires électriques rapides en salves. Elle définit en outre des gammes de niveaux d'essais et établit des procédures d'essai. L'objet de la présente norme est d'établir une référence commune et reproductible dans le but d'évaluer l'immunité des matériels électriques et électroniques quand ils sont soumis aux transitoires électriques rapides en salves sur les accès d'alimentation, de signal, de commande et de terre. La méthode d'essai documentée dans la présente norme décrit une méthode cohérente dans le but d'évaluer l'immunité d'un matériel ou système vis-à-vis d'un phénomène défini. La présente troisième édition annule et remplace la deuxième édition, parue en 2004, et son amendement 1 (2010). Elle constitue une révision technique qui améliore et clarifie les spécifications du simulateur, les critères et les montages d'essai.

General Information

• Status: Published
• Publication Date: 29-Apr-2012
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77B - High frequency phenomena
• Drafting Committee: MT 12 - TC 77/SC 77B/MT 12
• Current Stage: PPUB - Publication issued
• Start Date: 30-Apr-2012
• Completion Date: 15-May-2012

Relations

• Revises: IEC 61000-4-4:2004/COR1:2006 - Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-4:2004/AMD1:2010 - Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-4:2004/COR2:2007 - Corrigendum 2 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-4:2004 - Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
• Effective Date: 05-Sep-2023

Overview

IEC 61000-4-4:2012 - "Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test" is a basic IEC EMC publication that defines a reproducible test method to evaluate the immunity of electrical and electronic equipment to repetitive electrical fast transients (EFT/B). Edition 3.0 (2012) cancels and replaces the 2004 edition and its 2010 amendment and provides clarified simulator specifications, test criteria and test setups.

Key Topics

• Scope and objectives: Establishes common reference conditions and procedures to assess immunity of equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports.
• Test levels and criteria: Defines ranges of test levels and acceptance criteria for immunity performance.
• Test equipment and calibration:
  • Burst generator specifications and calibration methods.
  • Coupling/decoupling networks (CDNs) for a.c./d.c. power ports.
  • Capacitive coupling clamps for signal and control ports, plus their calibration and verification.
• Test setups:
  • Laboratory type-test arrangements and in situ (on-site) test configurations.
  • Methods for coupling the test waveform to the Equipment Under Test (EUT).
• Test procedure and reporting:
  • Execution steps, environmental and electromagnetic reference conditions.
  • Evaluation of results and required test report content.
• Informative guidance: Annexes provide information on the fast transient phenomenon, selection of test levels and measurement uncertainty considerations.

Applications

• Verifying immunity of products and systems to EFT/B during product development and pre-compliance.
• Type testing for product certification and regulatory compliance where immunity to fast transients is required.
• On-site (in situ) assessment of installed equipment, particularly for industrial, consumer and professional electronic devices where repetitive transients may occur.
• Design validation for power, signal and control interfaces to ensure robust EMC performance.

Who uses this standard

• EMC engineers and test laboratory personnel
• Product designers and R&D teams developing electronic and electrical equipment
• Certification bodies, compliance managers and quality assurance teams
• Manufacturers of test equipment (burst generators, CDNs, coupling clamps)

Related standards

• Part of the IEC 61000 series on EMC; it is a basic EMC publication in accordance with IEC Guide 107. Users should consult other parts of IEC 61000 for complementary immunity and emission requirements relevant to their product category.

Keywords: IEC 61000-4-4, EFT/B, electrical fast transients, EMC immunity testing, burst generator, coupling/decoupling network, capacitive coupling clamp, test levels, in situ testing.

Standards Content (Sample)

IEC 61000-4-4 ®
Edition 3.0 2012-04
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-4: Testing and measurement techniques – Electrical fast transient/burst
immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires
électriques rapides en salves
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IEC 61000-4-4 ®
Edition 3.0 2012-04
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-4: Testing and measurement techniques – Electrical fast transient/burst

immunity test
Compatibilité électromagnétique (CEM) –

Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires

électriques rapides en salves
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-0016-2

IEC 61000-4-4 ®
Edition 3.0 2012-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-4: Testing and measurement techniques – Electrical fast transient/burst
immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires
électriques rapides en salves
– 2 – 61000-4-4 © IEC:2012
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviations . 7
3.1 Terms and definitions . 7
3.2 Abbreviations . 10
4 General . 10
5 Test levels . 10
6 Test equipment . 11
6.1 Overview . 11
6.2 Burst generator . 11
6.2.1 General . 11
6.2.2 Characteristics of the fast transient/burst generator . 12
6.2.3 Calibration of the characteristics of the fast transient/burst generator . 14
6.3 Coupling/decoupling network for a.c./d.c. power port . 15
6.3.1 Characteristics of the coupling/decoupling network . 15
6.3.2 Calibration of the coupling/decoupling network . 16
6.4 Capacitive coupling clamp . 17
6.4.1 General . 17
6.4.2 Calibration of the capacitive coupling clamp . 18
7 Test setup . 20
7.1 General . 20
7.2 Test equipment . 20
7.2.1 General . 20
7.2.2 Verification of the test instrumentation . 20
7.3 Test setup for type tests performed in laboratories . 21
7.3.1 Test conditions . 21
7.3.2 Methods of coupling the test voltage to the EUT . 24
7.4 Test setup for in situ tests . 26
7.4.1 Overview . 26
7.4.2 Test on power ports and earth ports . 26
7.4.3 Test on signal and control ports . 27
8 Test procedure . 28
8.1 General . 28
8.2 Laboratory reference conditions . 28
8.2.1 Climatic conditions . 28
8.2.2 Electromagnetic conditions . 28
8.3 Execution of the test . 28
9 Evaluation of test results . 29
10 Test report. 29
Annex A (informative) Information on the electrical fast transients . 30
Annex B (informative) Selection of the test levels . 32
Annex C (informative) Measurement uncertainty (MU) considerations . 34
Bibliography . 43

61000-4-4 © IEC:2012 – 3 –
Figure 1 – Simplified circuit diagram showing major elements of a fast transient/burst
generator . 12
Figure 2 – Representation of an electrical fast transient/burst . 13
Figure 3 – Ideal waveform of a single pulse into a 50 Ω load with nominal parameters
t = 5 ns and t = 50 ns . 13
r w
Figure 4 – Coupling/decoupling network for a.c./d.c. power mains supply
ports/terminals . 16
Figure 5 – Calibration of the waveform at the output of the coupling/decoupling network . 17
Figure 6 – Example of a capacitive coupling clamp . 18
Figure 7 – Transducer plate for coupling clamp calibration . 19
Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate . 19
Figure 9 – Block diagram for electrical fast transient/burst immunity test . 20
Figure 10 – Example of a verification setup of the capacitive coupling clamp . 21
Figure 11 – Example of a test setup for laboratory type tests . 22
Figure 12 – Example of test setup using a floor standing system of two EUTs. 23
Figure 13 – Example of a test setup for equipment with elevated cable entries . 24
Figure 14 – Example of a test setup for direct coupling of the test voltage to a.c./d.c.
power ports for laboratory type tests . 25
Figure 15 – Example for in situ test on a.c./d.c. power ports and protective earth
terminals for stationary, floor standing EUT . 26
Figure 16 – Example of in situ test on signal and control ports without the capacitive
coupling clamp . 27

Table 1 – Test levels. 11
Table 2 – Output voltage peak values and repetition frequencies . 15
Table C.1 – Example of uncertainty budget for voltage rise time (t ) . 36
r
Table C.2 – Example of uncertainty budget for EFT/B peak voltage value (V ) . 37
P
Table C.3 – Example of uncertainty budget for EFT/B voltage pulse width (t ) . 38
w
Table C.4 – α factor (Equation (C.4)) of different unidirectional impulse responses
corresponding to the same bandwidth of the system B . 40

– 4 – 61000-4-4 © IEC:2012
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-4 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-4 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107, Electromagnetic compatibility – Guide to the drafting of electromagnetic
compatibility publications.
This third edition cancels and replaces the second edition published in 2004 and its
amendment 1 (2010) and constitutes a technical revision.
This third edition improves and clarifies simulator specifications, test criteria and test setups.

61000-4-4 © IEC:2012 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
77B/670/FDIS 77B/673/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all currently available parts of the IEC 61000 series, under the general title
Electromagnetic compatibility (EMC), can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 6 – 61000-4-4 © IEC:2012
INTRODUCTION
IEC 61000 is published in separate parts, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others are published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to electrical fast transients/bursts.

61000-4-4 © IEC:2012 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test

1 Scope
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to
repetitive electrical fast transients. It gives immunity requirements and test procedures related
to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes
test procedures.
The object of this standard is to establish a common and reproducible reference in order to
evaluate the immunity of electrical and electronic equipment when subjected to electrical fast
transient/bursts on supply, signal, control and earth ports. The test method documented in
this part of IEC 61000 describes a consistent method to assess the immunity of an equipment
or system against a defined phenomenon.
NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity
test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and
performance criteria.
The standard defines:
– test voltage waveform;
– range of test levels;
– test equipment;
– calibration and verification procedures of test equipment;
– test setups;
– test procedure.
The standard gives specifications for laboratory and in situ tests.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050-161:1990, International Electrotechnical Vocabulary – Chapter 161:
Electromagnetic compatibility
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60050-161, as well as the
following apply.
—————————
TC 77 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.

– 8 – 61000-4-4 © IEC:2012
NOTE Several of the most relevant terms and definitions from IEC 60050-161 are presented among the
definitions below.
3.1.1
auxiliary equipment
AE
equipment necessary to provide the equipment under test (EUT) with the signals required for
normal operation and equipment to verify the performance of the EUT
3.1.2
burst
sequence of a limited number of distinct pulses or an oscillation of limited duration
[SOURCE: IEC 60050-161:1990, 161-02-07]
3.1.3
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
Note 1 to entry: This term is based on the "uncertainty" approach.
Note 2 to entry: The relationship between the indications and the results of measurement can be expressed, in
principle, by a calibration diagram.
[SOURCE: IEC 60050-311:2001, 311-01-09]
3.1.4
coupling
interaction between circuits, transferring energy from one circuit to another
3.1.5
common mode (coupling)
simultaneous coupling to all lines versus the ground reference plane
3.1.6
coupling clamp
device of defined dimensions and characteristics for common mode coupling of the
disturbance signal to the circuit under test without any galvanic connection to it
3.1.7
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.1.8
decoupling network
electrical circuit for the purpose of preventing EFT voltage applied to the EUT from affecting
other devices, equipment or systems which are not under test
3.1.9
degradation (of performance)
undesired departure in the operational performance of any device, equipment or system from
its intended performance
Note 1 to entry: The term "degradation" can apply to temporary or permanent failure.
[SOURCE: IEC 60050-161:1990, 161-01-19]
3.1.10
EFT/B
electrical fast transient/burst

61000-4-4 © IEC:2012 – 9 –
3.1.11
electromagnetic compatibility
EMC
ability of an equipment or system to function satisfactorily in its electromagnetic environment
without introducing intolerable electromagnetic disturbances to anything in that environment
[SOURCE: IEC 60050-161:1990, 161-01-07]
3.1.12
EUT
equipment under test
3.1.13
ground reference plane
GRP
flat conductive surface whose potential is used as a common reference
[SOURCE: IEC 60050-161:1990, 161-04-36]
3.1.14
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.1.15
port
particular interface of the EUT with the external electromagnetic environment
3.1.16
pulse width
interval of time between the first and last instants at which the instantaneous value reaches
50 % value of the rising and falling edge of the pulse
[SOURCE: IEC 60050-702:1992, 702-03-04, modified]
3.1.17
rise time
interval of time between the instants at which the instantaneous value of a pulse first reaches
10 % value and then the 90 % value
[SOURCE: IEC 60050-161:1990, 161-02-05, modified]
3.1.18
transient
pertaining to or designating a phenomenon or a quantity which varies between two
consecutive steady states during a time interval which is short compared with the time-scale
of interest
[IEC 60050-161:1990, 161-02-01]
3.1.19
unsymmetric mode (coupling)
single line coupling versus the ground reference plane

– 10 – 61000-4-4 © IEC:2012
3.1.20
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to gain confidence that the test system is functioning
within the specifications given in Clause 6
Note 1 to entry: The methods used for verification may be different from those used for calibration.
Note 2 to entry: For the purposes of this basic EMC standard this definition is different from the definition given in
IEC 60050-311:2001, 311-01-13.
3.2 Abbreviations
AE Auxiliary Equipment
CDN Coupling/Decoupling Network
EFT/B Electrical Fast Transient/Burst
EMC ElectroMagnetic Compatibility
ESD ElectroStatic Discharge
EUT Equipment Under Test
GRP Ground Reference Plane
MU Measurement Uncertainty
PE Protective Earth
TnL Terminator non Linearity
4 General
The repetitive fast transient test is a test with bursts consisting of a number of fast transients,
coupled into power, control, signal and earth ports of electrical and electronic equipment.
Significant for the test are the high amplitude, the short rise time, the high repetition
frequency, and the low energy of the transients.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to types of transient disturbances such as those originating from switching
transients (interruption of inductive loads, relay contact bounce, etc.).
5 Test levels
The preferred test levels for the electrical fast transient test, applicable to power, control,
signal and earth ports of the equipment are given in Table 1.

61000-4-4 © IEC:2012 – 11 –
Table 1 – Test levels
Open circuit output test voltage and repetition frequency of the impulses
Signal
Power ports, earth port (PE)
and control ports
Level
Voltage peak Repetition frequency Voltage peak Repetition frequency
kV kHz kV kHz
1 0,5 5 or 100 0,25 5 or 100
2 1 5 or 100 0,5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
a
Special Special Special Special
X
The use of 5 kHz repetition frequency is traditional, however, 100 kHz is closer to reality. Product committees
should determine which frequencies are relevant for specific products or product types.
With some products, there may be no clear distinction between power ports and signal ports, in which case it is up
to product committees to make this determination for test purposes.
a
"X" can be any level, above, below or in between the others. The level shall be specified in the dedicated

equipment specification.
For selection of test levels, see Annex B.
6 Test equipment
6.1 Overview
The calibration procedures of 6.2.3, 6.3.2 and 6.4.2 ensure the correct operation of the test
generator, coupling/decoupling networks, and other items making up the test setup so that the
intended waveform is delivered to the EUT.
6.2 Burst generator
6.2.1 General
The simplified circuit diagram of the generator is given in Figure 1. The circuit elements C ,
c
R , R , and C are selected so that the generator delivers a fast transient under open circuit
s m d
conditions and with a 50 Ω resistive load. The effective output impedance of the generator
shall be 50 Ω.
– 12 – 61000-4-4 © IEC:2012
Switch
R R
50 Ω
c m
C
d
coaxial
output
U R
C
s
c
IEC  635/12
Components
U high-voltage source
R charging resistor
c
C energy storage capacitor
c
R impulse duration shaping resistor
s
R impedance matching resistor
m
C d.c. blocking capacitor
d
Switch high-voltage switch
NOTE The characteristics of the switch together with stray elements (inductance and capacitance) of the layout
shape the required rise time.
Figure 1 – Simplified circuit diagram showing major elements
of a fast transient/burst generator
6.2.2 Characteristics of the fast transient/burst generator
The characteristics of the fast transient/burst generator are the following.
– Output voltage range with 1 000 Ω load shall be at least 0,24 kV to 3,8 kV.
– Output voltage range with 50 Ω load shall be at least 0,125 kV to 2 kV.
The generator shall be capable of operating under short-circuit conditions without being
damaged.
Characteristics:
– polarity: positive/negative
– output type: coaxial, 50 Ω
– d.c. blocking capacitor (10 ± 2) nF
– repetition frequency: (see Table 2) ±20 %
– relation to a.c. mains: asynchronous
– burst duration: (15 ± 3) ms at 5 kHz
(see Figure 2) (0,75 ± 0,15) ms at 100 kHz
– burst period: (300 ± 60) ms
(see Figure 2)
– wave shape of the pulse
• into 50 Ω load rise time t = (5 ± 1,5) ns
r
pulse width t = (50 ± 15) ns
w
peak voltage = according to Table 2, ±10 %

61000-4-4 © IEC:2012 – 13 –
(see Figure 3for the 50 Ω wave shape)
• into 1 000 Ω load rise time t = (5 ± 1,5) ns
r
pulse width t = 50 ns, with a tolerance of
w
–15 ns to +100 ns
peak voltage = according to Table 2, ±20 %
(see Note 1 of Table 2)
U
Pulse
t
200 µs at 5 kHz
1/repetition frequency
10 µs at 100 kHz
U
Burst
t
15 ms
at 5 kHz
Burst duration
0,75 ms
at 100 kHz
Burst period 300 ms
IEC  636/12
Figure 2 – Representation of an electrical fast transient/burst

1,00
0,75
0,50
t
w
t
w
0,25
0 50 100 150 200 250 300
ns
1,0
0,9
0,8
0,7
0,6
0,5
t
r
0,4
t
r
0,3
0,2
0,1
0 1 2 3 4 5 6 7 8 9 10
ns
IEC  637/12
Figure 3 – Ideal waveform of a single pulse into a 50 Ω load
with nominal parameters t = 5 ns and t = 50 ns
r w
Normalized voltage
Normalized voltage
– 14 – 61000-4-4 © IEC:2012
ν (t), is as follows:
The formula of the ideal waveform of Figure 3,
EFT
n
EFT
 
 
t
   
−t
 
τ
 v 
τ
 1 
1 2
v (t) = k ⋅ ⋅ e
EFT v
n
 
EFT
k
EFT  
t
 
1+  
 
 
τ
 1 
 
where
τ  n ⋅τ  n
EFT
1 EFT 2
− ⋅ 
 
τ τ
2  1 
k = e
EFT
and
k is maximum or peak value of the open-circuit voltage (k = 1 means normalized voltage)
v v
ν = 0,92 τ = 3,5 ns τ = 51 ns n = 1,8
1 1 2 EFT
NOTE The origin of this formula is given in IEC 62305-1:2010, Annex B.
6.2.3 Calibration of the characteristics of the fast transient/burst generator
The test generator characteristics shall be calibrated in order to establish that they meet the
requirements of this standard. For this purpose, the following procedure shall be undertaken.
The test generator output shall be connected to a 50 Ω and 1 000 Ω coaxial termination
respectively and the voltage monitored with an oscilloscope. The –3 dB bandwidth of the
oscilloscope shall be at least 400 MHz. The test load impedance at 1 000 Ω is likely to
become a complex network. The characteristics of the test load impedance are:
– (50 ± 1) Ω;
– (1 000 ± 20) Ω; the resistance measurement is made at d.c.
The tolerance of the insertion loss of both test loads shall not exceed as follows:
• ±1 dB up to 100 MHz
• ±3 dB from 100 MHz up to 400 MHz.
The following parameters shall be measured:
• peak voltage;
For each of the set voltages of Table 2, measure the output voltage with a 50 Ω load
[V (50 Ω)]. This measured voltage shall be V (50 Ω), with a tolerance of ±10 %.
p p
With the same generator setting (set voltage), measure the voltage with a 1 000 Ω load
[V (1 000 Ω)]. This measured voltage shall be V (1 000 Ω), with a tolerance of ±20 %.
p p
• rise time for all set voltages;
• pulse width for all set voltages;
• repetition frequency of the pulses within one burst for any one set voltage;
• burst duration for any one set voltage;
• burst period for any one set voltage.

61000-4-4 © IEC:2012 – 15 –
Table 2 – Output voltage peak values and repetition frequencies
Set voltage Repetition
V (open circuit) V (1 000 Ω) V (50 Ω)
p p p
frequency
kV kHz
kV kV kV
0,25 0,25 0,24 0,125 5 or 100
0,5 0,5 0,48 0,25 5 or 100
1 1 0,95 0,5 5 or 100
2 2 1,9 1 5 or 100
4 4 3,8 2 5 or 100
Measures should be taken to ensure that stray capacitance is kept to a minimum.
NOTE 1 Use of a 1 000 Ω load resistor will automatically result in a voltage reading that is 5 % lower than
the set voltage, as shown in column V (1 000 Ω). The reading V at 1 000 Ω = V (open circuit) multiplied
p p p
times 1 000/1 050 (the ratio of the test load to the total circuit impedance of 1 000 Ω plus 50 Ω).
NOTE 2 With the 50 Ω load, the measured output voltage is 0,5 times the value of the unloaded voltage as
reflected in the table above.
6.3 Coupling/decoupling network for a.c./d.c. power port
6.3.1 Characteristics of the coupling/decoupling network
The coupling/decoupling network is used for tests of a.c./d.c. power ports.
The circuit diagram (example for a three-phase power port) is given in Figure 4.
The typical characteristics of the coupling/decoupling network are the following:
– decoupling inductor with ferrite: >100 µH;
– coupling capacitors: 33 nF.
– 16 – 61000-4-4 © IEC:2012
Signal from test generator
C
c
L
L
C
c
L
L
AC/DC
C
c
L
supply
EUT
L
C
c
N
N
C
c
PE
PE
Ferrites
>100 µH
C = 33 nF
Filtering c
Connected to earth
Decoupling section Coupling section
IEC  638/12
Components
L1, L2, L3, phases
N neutral
PE protective earth
C coupling capacitors
c
Figure 4 – Coupling/decoupling network for a.c./d.c.
power mains supply ports/terminals
6.3.2 Calibration of the coupling/decoupling network
Measurement equipment that is specified as suitable to perform the calibrations defined in
6.2.3 shall also be used for the calibration of the characteristics of the coupling/decoupling
network.
The coupling/decoupling network shall be calibrated with a generator, which has been shown
to be compliant with the requirements of 6.2.3.
The waveform shall be calibrated in common mode coupling, this means to couple the
transients to all lines simultaneously. The waveform shall be individually calibrated for each
coupling line at each output terminal (L1, L2, L3, N and PE) of the coupling/decoupling
network with a single 50 Ω termination to reference ground. Figure 5 shows one of the five
calibration measurements, the calibration of L1 to reference ground.
NOTE 1 Verifying each coupling line separately is done to ensure that each line is properly functioning and
calibrated.
Care should be taken to use coaxial adapters to interface with the output of the CDN.
The connection between the output of the CDN and the coaxial adapter should be as short as
possible; but not to exceed 0,1 m.

61000-4-4 © IEC:2012 – 17 –
The calibration is performed with the generator output at a set voltage of 4 kV. The generator
is connected to the input of the coupling/decoupling network. Each individual output of the
CDN (normally connected to the EUT) is terminated in sequence with a 50 Ω load while the
other outputs are open. The peak voltage and waveform are recorded for each polarity.
Rise time of the pulses shall be (5,5 ± 1,5) ns.
Pulse width shall be (45 ± 15) ns.
Peak voltage shall be (2 ± 0,2) kV, according to Table 2.
NOTE 2 The values shown above are the result of the calibration method of the CDN.
The residual test pulse voltage on the power inputs of the coupling/decoupling network when
the EUT and the power network are disconnected shall not exceed 400 V when measured
individually at each input terminal (L1, L2, L3, N to PE) with a single 50 Ω termination and
when the generator is set to 4 kV and the coupling/decoupling network is set in common mode
coupling, this means to couple the transients to all lines simultaneously.

Signal from test generator
Power
supply
EUT port
port
C C C C C
c c c c c
L
L
L
L
Open
Decoupling Termination
L
L
network resistor
50 Ω
N
N
PE
PE
Reference ground
IEC  639/12
Figure 5 – Calibration of the waveform at the output of the
coupling/decoupling network
6.4 Capacitive coupling clamp
6.4.1 General
The clamp provides the ability of coupling the fast transients/bursts to the circuit under test
without any galvanic connection to the terminals of the EUT's ports, shielding of the cables or
any other part of the EUT.
The coupling capacitance of the clamp depends on the cable diameter, material of the cables
and cable shielding (if any).
The device is composed of a clamp unit (made, for example, of galvanized steel, brass,
copper or aluminium) for housing the cables (flat or round) of the circuits under test and shall

– 18 – 61000-4-4 © IEC:2012
be placed on a ground reference plane. The ground reference plane shall extend beyond the
clamp by a least 0,1 m on all sides.
The clamp shall be provided at both ends with a high-voltage coaxial connector for the
connection of the test generator at either end. The generator shall be connected to that end of
the clamp which is nearest to the EUT.
When the coupling clamp has only one HV coaxial connector, it should be arranged so that
the HV coaxial connector is closest to the EUT.
The clamp itself shall be closed as much as possible to provide maximum coupling
capacitance between the cable and the clamp.
An example of the mechanical arrangement of the coupling clamp is given in Figure 6. The
following dimensions shall be used:
Lower coupling plate height: (100 ± 5) mm
Lower coupling plate width: (140 ± 7) mm
Lower coupling plate length: (1 000 ± 50) mm
The coupling method using the clamp is used for tests on lines connected to signal and
control ports. It may also be used on power ports only if the coupling/decoupling network
defined in 6.3 cannot be used (see 7.3.2.1).
Dimensions in millimetres
All dimensions are ±5 %
1 000
High-voltage
coaxial connector
Coupling plates
High-voltage
coaxial connector
IEC  640/12
Insulating supports
Figure 6 – Example of a capacitive coupling clamp
6.4.2 Calibration of the capacitive coupling clamp
Measurement equipment that is specified as suitable to perform the calibrations defined in
6.2.3 shall also be used for the calibration of the characteristics of the capacitive coupling
clamp.
A transducer plate (see Figure 7) shall be inserted into the coupling clamp and a connecting
adapter with a low inductance bond to ground shall be used for connection to the
measurement terminator/attenuator. A setup is given in Figure 8.

61000-4-4 © IEC:2012 – 19 –
Dimensions in millimetres
1 050 ± 5
120 ± 1
Connected to adapter
IEC  641/12
Figure 7 – Transducer plate for coupling clamp calibration
The transducer plate shall consist of a metallic sheet 120 mm × 1 050 mm of maximum
0,5 mm thickness, insulated on top and bottom by a dielectric sheet of 0,5 mm. Insulation of
at least 2,5 kV on all sides shall be guaranteed in order to avoid the clamp contacting the
transducer plate. At one end it is connected by a maximum of 30 mm long low impedance
connection to the connecting adapter. The transducer plate shall be placed in the capacitive
coupling clamp such that the end with the connection is aligned with the end of the lower
coupling plate. The connecting adapter shall support a low impedance connection to ground
reference plane for grounding of the 50 Ω coaxial measurement terminator/attenuator. The
distance between the transducer plate and the 50 Ω measurement terminator/attenuator shall
not exceed 0,1 m.
NOTE The clearance between the upper coupling plate and transducer plate is not significant.
The waveform shall be calibrated with a single 50 Ω termination.
The clamp shall be calibrated with a generator, which has been shown to be compliant with
the requirements of 6.2.2 and 6.2.3.
The calibration is performed with the generator output voltage set to 2 kV.

< 0,1 m
Transducer plate
Capacitive coupling clamp
EFT/B
generator To oscilloscope
50 Ω terminator/attenuator
Connecting adapter
Ground reference plane
IEC  642/12
Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate
The generator is connected to the input of the coupling clamp.
The peak voltage and waveform parameters are recorded at the transducer plate output
located at the opposite end of the clamp.
The waveform characteristics shall meet the following requirements:
• rise time (5 ± 1,5) ns;
• pulse width (50 ± 15) ns;
• peak voltage (1 000 ± 200) V.

– 20 – 61000-4-4 © IEC:2012
7 Test setup
7.1 General
Different types of tests are defined based on test environments. These are:
– type (conformance) tests performed in laboratories;
– in situ tests performed on equipment in its final installed condition.
The preferred test method is that of type tests performed in laboratories.
The EUT shal
...

IEC 61000-4-4 ®
Edition 3.0 2012-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-4: Testing and measurement techniques – Electrical fast transient/burst
immunity test
Compatibilité électromagnétique (CEM) –
Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires
électriques rapides en salves
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IEC 61000-4-4 ®
Edition 3.0 2012-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-4: Testing and measurement techniques – Electrical fast transient/burst

immunity test
Compatibilité électromagnétique (CEM) –

Partie 4-4: Techniques d'essai et de mesure – Essai d'immunité aux transitoires

électriques rapides en salves
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
X
CODE PRIX
ICS 33.100.20 ISBN 978-2-83220-016-2

– 2 – 61000-4-4 © IEC:2012
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviations . 7
3.1 Terms and definitions . 7
3.2 Abbreviations . 10
4 General . 10
5 Test levels . 10
6 Test equipment . 11
6.1 Overview . 11
6.2 Burst generator . 11
6.2.1 General . 11
6.2.2 Characteristics of the fast transient/burst generator . 12
6.2.3 Calibration of the characteristics of the fast transient/burst generator . 14
6.3 Coupling/decoupling network for a.c./d.c. power port . 15
6.3.1 Characteristics of the coupling/decoupling network . 15
6.3.2 Calibration of the coupling/decoupling network . 16
6.4 Capacitive coupling clamp . 17
6.4.1 General . 17
6.4.2 Calibration of the capacitive coupling clamp . 18
7 Test setup . 20
7.1 General . 20
7.2 Test equipment . 20
7.2.1 General . 20
7.2.2 Verification of the test instrumentation . 20
7.3 Test setup for type tests performed in laboratories . 21
7.3.1 Test conditions . 21
7.3.2 Methods of coupling the test voltage to the EUT . 24
7.4 Test setup for in situ tests . 26
7.4.1 Overview . 26
7.4.2 Test on power ports and earth ports . 26
7.4.3 Test on signal and control ports . 27
8 Test procedure . 28
8.1 General . 28
8.2 Laboratory reference conditions . 28
8.2.1 Climatic conditions . 28
8.2.2 Electromagnetic conditions . 28
8.3 Execution of the test . 28
9 Evaluation of test results . 29
10 Test report. 29
Annex A (informative) Information on the electrical fast transients . 30
Annex B (informative) Selection of the test levels . 32
Annex C (informative) Measurement uncertainty (MU) considerations . 34
Bibliography . 43

61000-4-4 © IEC:2012 – 3 –
Figure 1 – Simplified circuit diagram showing major elements of a fast transient/burst
generator . 12
Figure 2 – Representation of an electrical fast transient/burst . 13
Figure 3 – Ideal waveform of a single pulse into a 50 Ω load with nominal parameters
t = 5 ns and t = 50 ns . 13
r w
Figure 4 – Coupling/decoupling network for a.c./d.c. power mains supply
ports/terminals . 16
Figure 5 – Calibration of the waveform at the output of the coupling/decoupling network . 17
Figure 6 – Example of a capacitive coupling clamp . 18
Figure 7 – Transducer plate for coupling clamp calibration . 19
Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate . 19
Figure 9 – Block diagram for electrical fast transient/burst immunity test . 20
Figure 10 – Example of a verification setup of the capacitive coupling clamp . 21
Figure 11 – Example of a test setup for laboratory type tests . 22
Figure 12 – Example of test setup using a floor standing system of two EUTs. 23
Figure 13 – Example of a test setup for equipment with elevated cable entries . 24
Figure 14 – Example of a test setup for direct coupling of the test voltage to a.c./d.c.
power ports for laboratory type tests . 25
Figure 15 – Example for in situ test on a.c./d.c. power ports and protective earth
terminals for stationary, floor standing EUT . 26
Figure 16 – Example of in situ test on signal and control ports without the capacitive
coupling clamp . 27

Table 1 – Test levels. 11
Table 2 – Output voltage peak values and repetition frequencies . 15
Table C.1 – Example of uncertainty budget for voltage rise time (t ) . 36
r
Table C.2 – Example of uncertainty budget for EFT/B peak voltage value (V ) . 37
P
Table C.3 – Example of uncertainty budget for EFT/B voltage pulse width (t ) . 38
w
Table C.4 – α factor (Equation (C.4)) of different unidirectional impulse responses
corresponding to the same bandwidth of the system B . 40

– 4 – 61000-4-4 © IEC:2012
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
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6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-4 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
It forms Part 4-4 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107, Electromagnetic compatibility – Guide to the drafting of electromagnetic
compatibility publications.
This third edition cancels and replaces the second edition published in 2004 and its
amendment 1 (2010) and constitutes a technical revision.
This third edition improves and clarifies simulator specifications, test criteria and test setups.

61000-4-4 © IEC:2012 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
77B/670/FDIS 77B/673/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all currently available parts of the IEC 61000 series, under the general title
Electromagnetic compatibility (EMC), can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 6 – 61000-4-4 © IEC:2012
INTRODUCTION
IEC 61000 is published in separate parts, according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others are published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an international standard which gives immunity requirements and test procedures
related to electrical fast transients/bursts.

61000-4-4 © IEC:2012 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-4: Testing and measurement techniques –
Electrical fast transient/burst immunity test

1 Scope
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to
repetitive electrical fast transients. It gives immunity requirements and test procedures related
to electrical fast transients/bursts. It additionally defines ranges of test levels and establishes
test procedures.
The object of this standard is to establish a common and reproducible reference in order to
evaluate the immunity of electrical and electronic equipment when subjected to electrical fast
transient/bursts on supply, signal, control and earth ports. The test method documented in
this part of IEC 61000 describes a consistent method to assess the immunity of an equipment
or system against a defined phenomenon.
NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity
test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and
performance criteria.
The standard defines:
– test voltage waveform;
– range of test levels;
– test equipment;
– calibration and verification procedures of test equipment;
– test setups;
– test procedure.
The standard gives specifications for laboratory and in situ tests.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050-161:1990, International Electrotechnical Vocabulary – Chapter 161:
Electromagnetic compatibility
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions of IEC 60050-161, as well as the
following apply.
—————————
TC 77 and its subcommittees are prepared to co-operate with product committees in the evaluation of the value
of particular immunity tests for their products.

– 8 – 61000-4-4 © IEC:2012
NOTE Several of the most relevant terms and definitions from IEC 60050-161 are presented among the
definitions below.
3.1.1
auxiliary equipment
AE
equipment necessary to provide the equipment under test (EUT) with the signals required for
normal operation and equipment to verify the performance of the EUT
3.1.2
burst
sequence of a limited number of distinct pulses or an oscillation of limited duration
[SOURCE: IEC 60050-161:1990, 161-02-07]
3.1.3
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
Note 1 to entry: This term is based on the "uncertainty" approach.
Note 2 to entry: The relationship between the indications and the results of measurement can be expressed, in
principle, by a calibration diagram.
[SOURCE: IEC 60050-311:2001, 311-01-09]
3.1.4
coupling
interaction between circuits, transferring energy from one circuit to another
3.1.5
common mode (coupling)
simultaneous coupling to all lines versus the ground reference plane
3.1.6
coupling clamp
device of defined dimensions and characteristics for common mode coupling of the
disturbance signal to the circuit under test without any galvanic connection to it
3.1.7
coupling network
electrical circuit for the purpose of transferring energy from one circuit to another
3.1.8
decoupling network
electrical circuit for the purpose of preventing EFT voltage applied to the EUT from affecting
other devices, equipment or systems which are not under test
3.1.9
degradation (of performance)
undesired departure in the operational performance of any device, equipment or system from
its intended performance
Note 1 to entry: The term "degradation" can apply to temporary or permanent failure.
[SOURCE: IEC 60050-161:1990, 161-01-19]
3.1.10
EFT/B
electrical fast transient/burst

61000-4-4 © IEC:2012 – 9 –
3.1.11
electromagnetic compatibility
EMC
ability of an equipment or system to function satisfactorily in its electromagnetic environment
without introducing intolerable electromagnetic disturbances to anything in that environment
[SOURCE: IEC 60050-161:1990, 161-01-07]
3.1.12
EUT
equipment under test
3.1.13
ground reference plane
GRP
flat conductive surface whose potential is used as a common reference
[SOURCE: IEC 60050-161:1990, 161-04-36]
3.1.14
immunity (to a disturbance)
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.1.15
port
particular interface of the EUT with the external electromagnetic environment
3.1.16
pulse width
interval of time between the first and last instants at which the instantaneous value reaches
50 % value of the rising and falling edge of the pulse
[SOURCE: IEC 60050-702:1992, 702-03-04, modified]
3.1.17
rise time
interval of time between the instants at which the instantaneous value of a pulse first reaches
10 % value and then the 90 % value
[SOURCE: IEC 60050-161:1990, 161-02-05, modified]
3.1.18
transient
pertaining to or designating a phenomenon or a quantity which varies between two
consecutive steady states during a time interval which is short compared with the time-scale
of interest
[IEC 60050-161:1990, 161-02-01]
3.1.19
unsymmetric mode (coupling)
single line coupling versus the ground reference plane

– 10 – 61000-4-4 © IEC:2012
3.1.20
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) and to gain confidence that the test system is functioning
within the specifications given in Clause 6
Note 1 to entry: The methods used for verification may be different from those used for calibration.
Note 2 to entry: For the purposes of this basic EMC standard this definition is different from the definition given in
IEC 60050-311:2001, 311-01-13.
3.2 Abbreviations
AE Auxiliary Equipment
CDN Coupling/Decoupling Network
EFT/B Electrical Fast Transient/Burst
EMC ElectroMagnetic Compatibility
ESD ElectroStatic Discharge
EUT Equipment Under Test
GRP Ground Reference Plane
MU Measurement Uncertainty
PE Protective Earth
TnL Terminator non Linearity
4 General
The repetitive fast transient test is a test with bursts consisting of a number of fast transients,
coupled into power, control, signal and earth ports of electrical and electronic equipment.
Significant for the test are the high amplitude, the short rise time, the high repetition
frequency, and the low energy of the transients.
The test is intended to demonstrate the immunity of electrical and electronic equipment when
subjected to types of transient disturbances such as those originating from switching
transients (interruption of inductive loads, relay contact bounce, etc.).
5 Test levels
The preferred test levels for the electrical fast transient test, applicable to power, control,
signal and earth ports of the equipment are given in Table 1.

61000-4-4 © IEC:2012 – 11 –
Table 1 – Test levels
Open circuit output test voltage and repetition frequency of the impulses
Signal
Power ports, earth port (PE)
and control ports
Level
Voltage peak Repetition frequency Voltage peak Repetition frequency
kV kHz kV kHz
1 0,5 5 or 100 0,25 5 or 100
2 1 5 or 100 0,5 5 or 100
3 2 5 or 100 1 5 or 100
4 4 5 or 100 2 5 or 100
a
Special Special Special Special
X
The use of 5 kHz repetition frequency is traditional, however, 100 kHz is closer to reality. Product committees
should determine which frequencies are relevant for specific products or product types.
With some products, there may be no clear distinction between power ports and signal ports, in which case it is up
to product committees to make this determination for test purposes.
a
"X" can be any level, above, below or in between the others. The level shall be specified in the dedicated

equipment specification.
For selection of test levels, see Annex B.
6 Test equipment
6.1 Overview
The calibration procedures of 6.2.3, 6.3.2 and 6.4.2 ensure the correct operation of the test
generator, coupling/decoupling networks, and other items making up the test setup so that the
intended waveform is delivered to the EUT.
6.2 Burst generator
6.2.1 General
The simplified circuit diagram of the generator is given in Figure 1. The circuit elements C ,
c
R , R , and C are selected so that the generator delivers a fast transient under open circuit
s m d
conditions and with a 50 Ω resistive load. The effective output impedance of the generator
shall be 50 Ω.
– 12 – 61000-4-4 © IEC:2012
Switch
R R
50 Ω
c m
C
d
coaxial
output
U R
C
s
c
IEC  635/12
Components
U high-voltage source
R charging resistor
c
C energy storage capacitor
c
R impulse duration shaping resistor
s
R impedance matching resistor
m
C d.c. blocking capacitor
d
Switch high-voltage switch
NOTE The characteristics of the switch together with stray elements (inductance and capacitance) of the layout
shape the required rise time.
Figure 1 – Simplified circuit diagram showing major elements
of a fast transient/burst generator
6.2.2 Characteristics of the fast transient/burst generator
The characteristics of the fast transient/burst generator are the following.
– Output voltage range with 1 000 Ω load shall be at least 0,24 kV to 3,8 kV.
– Output voltage range with 50 Ω load shall be at least 0,125 kV to 2 kV.
The generator shall be capable of operating under short-circuit conditions without being
damaged.
Characteristics:
– polarity: positive/negative
– output type: coaxial, 50 Ω
– d.c. blocking capacitor (10 ± 2) nF
– repetition frequency: (see Table 2) ±20 %
– relation to a.c. mains: asynchronous
– burst duration: (15 ± 3) ms at 5 kHz
(see Figure 2) (0,75 ± 0,15) ms at 100 kHz
– burst period: (300 ± 60) ms
(see Figure 2)
– wave shape of the pulse
• into 50 Ω load rise time t = (5 ± 1,5) ns
r
pulse width t = (50 ± 15) ns
w
peak voltage = according to Table 2, ±10 %

61000-4-4 © IEC:2012 – 13 –
(see Figure 3for the 50 Ω wave shape)
• into 1 000 Ω load rise time t = (5 ± 1,5) ns
r
pulse width t = 50 ns, with a tolerance of
w
–15 ns to +100 ns
peak voltage = according to Table 2, ±20 %
(see Note 1 of Table 2)
U
Pulse
t
200 µs at 5 kHz
1/repetition frequency
10 µs at 100 kHz
U
Burst
t
15 ms
at 5 kHz
Burst duration
0,75 ms
at 100 kHz
Burst period 300 ms
IEC  636/12
Figure 2 – Representation of an electrical fast transient/burst

1,00
0,75
0,50
t
w
t
w
0,25
0 50 100 150 200 250 300
ns
1,0
0,9
0,8
0,7
0,6
0,5
t
r
0,4
t
r
0,3
0,2
0,1
0 1 2 3 4 5 6 7 8 9 10
ns
IEC  637/12
Figure 3 – Ideal waveform of a single pulse into a 50 Ω load
with nominal parameters t = 5 ns and t = 50 ns
r w
Normalized voltage
Normalized voltage
– 14 – 61000-4-4 © IEC:2012
ν (t), is as follows:
The formula of the ideal waveform of Figure 3,
EFT
n
EFT
 
 
t
   
−t
 
τ
 v 
τ
 1 
1 2
v (t) = k ⋅ ⋅ e
EFT v
n
 
EFT
k
EFT  
t
 
1+  
 
 
τ
 1 
 
where
τ  n ⋅τ  n
EFT
1 EFT 2
− ⋅ 
 
τ τ
2  1 
k = e
EFT
and
k is maximum or peak value of the open-circuit voltage (k = 1 means normalized voltage)
v v
ν = 0,92 τ = 3,5 ns τ = 51 ns n = 1,8
1 1 2 EFT
NOTE The origin of this formula is given in IEC 62305-1:2010, Annex B.
6.2.3 Calibration of the characteristics of the fast transient/burst generator
The test generator characteristics shall be calibrated in order to establish that they meet the
requirements of this standard. For this purpose, the following procedure shall be undertaken.
The test generator output shall be connected to a 50 Ω and 1 000 Ω coaxial termination
respectively and the voltage monitored with an oscilloscope. The –3 dB bandwidth of the
oscilloscope shall be at least 400 MHz. The test load impedance at 1 000 Ω is likely to
become a complex network. The characteristics of the test load impedance are:
– (50 ± 1) Ω;
– (1 000 ± 20) Ω; the resistance measurement is made at d.c.
The tolerance of the insertion loss of both test loads shall not exceed as follows:
• ±1 dB up to 100 MHz
• ±3 dB from 100 MHz up to 400 MHz.
The following parameters shall be measured:
• peak voltage;
For each of the set voltages of Table 2, measure the output voltage with a 50 Ω load
[V (50 Ω)]. This measured voltage shall be V (50 Ω), with a tolerance of ±10 %.
p p
With the same generator setting (set voltage), measure the voltage with a 1 000 Ω load
[V (1 000 Ω)]. This measured voltage shall be V (1 000 Ω), with a tolerance of ±20 %.
p p
• rise time for all set voltages;
• pulse width for all set voltages;
• repetition frequency of the pulses within one burst for any one set voltage;
• burst duration for any one set voltage;
• burst period for any one set voltage.

61000-4-4 © IEC:2012 – 15 –
Table 2 – Output voltage peak values and repetition frequencies
Set voltage Repetition
V (open circuit) V (1 000 Ω) V (50 Ω)
p p p
frequency
kV kHz
kV kV kV
0,25 0,25 0,24 0,125 5 or 100
0,5 0,5 0,48 0,25 5 or 100
1 1 0,95 0,5 5 or 100
2 2 1,9 1 5 or 100
4 4 3,8 2 5 or 100
Measures should be taken to ensure that stray capacitance is kept to a minimum.
NOTE 1 Use of a 1 000 Ω load resistor will automatically result in a voltage reading that is 5 % lower than
the set voltage, as shown in column V (1 000 Ω). The reading V at 1 000 Ω = V (open circuit) multiplied
p p p
times 1 000/1 050 (the ratio of the test load to the total circuit impedance of 1 000 Ω plus 50 Ω).
NOTE 2 With the 50 Ω load, the measured output voltage is 0,5 times the value of the unloaded voltage as
reflected in the table above.
6.3 Coupling/decoupling network for a.c./d.c. power port
6.3.1 Characteristics of the coupling/decoupling network
The coupling/decoupling network is used for tests of a.c./d.c. power ports.
The circuit diagram (example for a three-phase power port) is given in Figure 4.
The typical characteristics of the coupling/decoupling network are the following:
– decoupling inductor with ferrite: >100 µH;
– coupling capacitors: 33 nF.
– 16 – 61000-4-4 © IEC:2012
Signal from test generator
C
c
L
L
C
c
L
L
AC/DC
C
c
L
supply
EUT
L
C
c
N
N
C
c
PE
PE
Ferrites
>100 µH
C = 33 nF
Filtering c
Connected to earth
Decoupling section Coupling section
IEC  638/12
Components
L1, L2, L3, phases
N neutral
PE protective earth
C coupling capacitors
c
Figure 4 – Coupling/decoupling network for a.c./d.c.
power mains supply ports/terminals
6.3.2 Calibration of the coupling/decoupling network
Measurement equipment that is specified as suitable to perform the calibrations defined in
6.2.3 shall also be used for the calibration of the characteristics of the coupling/decoupling
network.
The coupling/decoupling network shall be calibrated with a generator, which has been shown
to be compliant with the requirements of 6.2.3.
The waveform shall be calibrated in common mode coupling, this means to couple the
transients to all lines simultaneously. The waveform shall be individually calibrated for each
coupling line at each output terminal (L1, L2, L3, N and PE) of the coupling/decoupling
network with a single 50 Ω termination to reference ground. Figure 5 shows one of the five
calibration measurements, the calibration of L1 to reference ground.
NOTE 1 Verifying each coupling line separately is done to ensure that each line is properly functioning and
calibrated.
Care should be taken to use coaxial adapters to interface with the output of the CDN.
The connection between the output of the CDN and the coaxial adapter should be as short as
possible; but not to exceed 0,1 m.

61000-4-4 © IEC:2012 – 17 –
The calibration is performed with the generator output at a set voltage of 4 kV. The generator
is connected to the input of the coupling/decoupling network. Each individual output of the
CDN (normally connected to the EUT) is terminated in sequence with a 50 Ω load while the
other outputs are open. The peak voltage and waveform are recorded for each polarity.
Rise time of the pulses shall be (5,5 ± 1,5) ns.
Pulse width shall be (45 ± 15) ns.
Peak voltage shall be (2 ± 0,2) kV, according to Table 2.
NOTE 2 The values shown above are the result of the calibration method of the CDN.
The residual test pulse voltage on the power inputs of the coupling/decoupling network when
the EUT and the power network are disconnected shall not exceed 400 V when measured
individually at each input terminal (L1, L2, L3, N to PE) with a single 50 Ω termination and
when the generator is set to 4 kV and the coupling/decoupling network is set in common mode
coupling, this means to couple the transients to all lines simultaneously.

Signal from test generator
Power
supply
EUT port
port
C C C C C
c c c c c
L
L
L
L
Open
Decoupling Termination
L
L
network resistor
50 Ω
N
N
PE
PE
Reference ground
IEC  639/12
Figure 5 – Calibration of the waveform at the output of the
coupling/decoupling network
6.4 Capacitive coupling clamp
6.4.1 General
The clamp provides the ability of coupling the fast transients/bursts to the circuit under test
without any galvanic connection to the terminals of the EUT's ports, shielding of the cables or
any other part of the EUT.
The coupling capacitance of the clamp depends on the cable diameter, material of the cables
and cable shielding (if any).
The device is composed of a clamp unit (made, for example, of galvanized steel, brass,
copper or aluminium) for housing the cables (flat or round) of the circuits under test and shall

– 18 – 61000-4-4 © IEC:2012
be placed on a ground reference plane. The ground reference plane shall extend beyond the
clamp by a least 0,1 m on all sides.
The clamp shall be provided at both ends with a high-voltage coaxial connector for the
connection of the test generator at either end. The generator shall be connected to that end of
the clamp which is nearest to the EUT.
When the coupling clamp has only one HV coaxial connector, it should be arranged so that
the HV coaxial connector is closest to the EUT.
The clamp itself shall be closed as much as possible to provide maximum coupling
capacitance between the cable and the clamp.
An example of the mechanical arrangement of the coupling clamp is given in Figure 6. The
following dimensions shall be used:
Lower coupling plate height: (100 ± 5) mm
Lower coupling plate width: (140 ± 7) mm
Lower coupling plate length: (1 000 ± 50) mm
The coupling method using the clamp is used for tests on lines connected to signal and
control ports. It may also be used on power ports only if the coupling/decoupling network
defined in 6.3 cannot be used (see 7.3.2.1).
Dimensions in millimetres
All dimensions are ±5 %
1 000
High-voltage
coaxial connector
Coupling plates
High-voltage
coaxial connector
IEC  640/12
Insulating supports
Figure 6 – Example of a capacitive coupling clamp
6.4.2 Calibration of the capacitive coupling clamp
Measurement equipment that is specified as suitable to perform the calibrations defined in
6.2.3 shall also be used for the calibration of the characteristics of the capacitive coupling
clamp.
A transducer plate (see Figure 7) shall be inserted into the coupling clamp and a connecting
adapter with a low inductance bond to ground shall be used for connection to the
measurement terminator/attenuator. A setup is given in Figure 8.

61000-4-4 © IEC:2012 – 19 –
Dimensions in millimetres
1 050 ± 5
120 ± 1
Connected to adapter
IEC  641/12
Figure 7 – Transducer plate for coupling clamp calibration
The transducer plate shall consist of a metallic sheet 120 mm × 1 050 mm of maximum
0,5 mm thickness, insulated on top and bottom by a dielectric sheet of 0,5 mm. Insulation of
at least 2,5 kV on all sides shall be guaranteed in order to avoid the clamp contacting the
transducer plate. At one end it is connected by a maximum of 30 mm long low impedance
connection to the connecting adapter. The transducer plate shall be placed in the capacitive
coupling clamp such that the end with the connection is aligned with the end of the lower
coupling plate. The connecting adapter shall support a low impedance connection to ground
reference plane for grounding of the 50 Ω coaxial measurement terminator/attenuator. The
distance between the transducer plate and the 50 Ω measurement terminator/attenuator shall
not exceed 0,1 m.
NOTE The clearance between the upper coupling plate and transducer plate is not significant.
The waveform shall be calibrated with a single 50 Ω termination.
The clamp shall be calibrated with a generator, which has been shown to be compliant with
the requirements of 6.2.2 and 6.2.3.
The calibration is performed with the generator output voltage set to 2 kV.

< 0,1 m
Transducer plate
Capacitive coupling clamp
EFT/B
generator To oscilloscope
50 Ω terminator/attenuator
Connecting adapter
Ground reference plane
IEC  642/12
Figure 8 – Calibration of a capacitive coupling clamp using the transducer plate
The generator is connected to the input of the coupling clamp.
The peak voltage and waveform parameters are recorded at the transducer plate output
located at the opposite end of the clamp.
The waveform characteristics shall meet the following requirements:
• rise time (5 ± 1,5) ns;
• pulse width (50 ± 15) ns;
• peak voltage (1 000 ± 200) V.

– 20 – 61000-4-4 © IEC:2012
7 Test setup
7.1 General
Different types of tests are defined based on test environments. These are:
– type (conformance) tests performed in laboratories;
– in situ tests performed on equipment in its final installed condition.
The preferred test method is that of type tests performed in laboratories.
The EUT shall be arranged in accordance with the manufacturer's instructions for installation
(if any).
7.2 Test equipment
7.2.1 General
The test setup includes the following equipment (see Figure 9):
– ground reference plane;
– coupling device (network or clamp);
– decoupling network, if appropriate;
– test generator.
Coupling/decoupling sections
shall be mounted directly on
Lines/terminals
the reference ground plane
to be tested
Bonding connectors shall be
as short as possible
EUT
Insulating
Lines
...