IEC 61000-4-13:2002/AMD1:2009

Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-13: Testing and measurement techniques - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests

Amendement 1 - Compatibilité électromagnétique (CEM) - Partie 4-13: Techniques d'essai et de mesure - Essais d'immunité basse fréquence aux harmoniques et inter-harmoniques incluant les signaux transmis sur le réseau électrique alternatif

General Information

• Status: Published
• Publication Date: 12-May-2009
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77A - EMC - Low frequency phenomena
• Drafting Committee: WG 6 - TC 77/SC 77A/WG 6
• Current Stage: PPUB - Publication issued
• Start Date: 31-Aug-2009
• Completion Date: 13-May-2009

Relations

• Amends: IEC 61000-4-13:2002 - Electromagnetic compatibility (EMC) - Part 4-13: Testing and measurement techniques - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61000-4-13 ®
Edition 1.0 2009-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Electromagnetic compatibility (EMC) –
Part 4-13: Testing and measurement techniques – Harmonics and
interharmonics including mains signalling at a.c. power port, low frequency
immunity tests
Compatibilité électromagnétique (CEM) –
Partie 4-13: Techniques d’essai et de mesure – Essais d’immunité basse
fréquence aux harmoniques et inter-harmoniques incluant les signaux transmis
sur le réseau électrique alternatif

IEC 61000-4-13:2002/A1:2009
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IEC 61000-4-13 ®
Edition 1.0 2009-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
AMENDMENT 1
AMENDEMENT 1
Electromagnetic compatibility (EMC) –
Part 4-13: Testing and measurement techniques – Harmonics and
interharmonics including mains signalling at a.c. power port, low frequency
immunity tests
Compatibilité électromagnétique (CEM) –
Partie 4-13: Techniques d’essai et de mesure – Essais d’immunité basse
fréquence aux harmoniques et inter-harmoniques incluant les signaux transmis
sur le réseau électrique alternatif

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
G
CODE PRIX
ICS 33.100.20 ISBN 978-2-88910-379-9
– 2 – 61000-4-13 Amend. 1 © IEC:2009
FOREWORD
This amendment has been prepared by subcommittee 77A: Low frequency phenomena, of IEC
technical committee 77: Electromagnetic compatibility.
The text of this amendment is based on the following documents:
Enquiry draft Report on voting
77A/668/CDV 77A/684/RVC
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
5.2 Test levels for interharmonics and mains signalling
Replace the last paragraph of this subclause, the paragraph below Table 4b, by the following:
Immunity test levels for interharmonics above 100 Hz are based on the mains signalling levels
or by the Meister curve levels defined in 8.2.4 depending on the class of equipment being
tested. Mains signalling levels are in the range of 2 % to 6 % of U . Discrete interharmonic

frequencies have a level of about 0,5 % of the fundamental frequency voltage U (in absence
of resonance). In class 3 for industrial networks, these levels can be considerably higher.
Figure 1 Test flowcharts
Replace Figures 1a and 1b by the following:

61000-4-13 Amend. 1 © IEC:2009 – 3 –

Start - Class 1/2:
Determine appropriate test
configuration
Perform 8.2.1 Test
"harmonic combination"
Any functional
No Class 2 required? Yes
anomalies?
No
Perform 8.2.2 Test Perform 8.2.4 Test
"sweep in frequencies" "Meister curve"
Any functional Any functional
anomalies? anomalies?
Yes
Yes No
No
Perform 8.2.3 Test
"individual harmonics/
interharmonics"
Yes
Test completed Any functional Test completed
Yes No
FAIL - Record results anomalies? PASS - Record results
IEC  668/09
Figure 1a – Test flowchart class 1 and class 2

– 4 – 61000-4-13 Amend. 1 © IEC:2009

Start - Class 3:
Determine appropriate test
configuration
Perform test 8.2.1
"harmonic combination"
Any functional Perform test 8.2.2
No
anomalies? "sweep in frequencies"
Any functional
Yes
anomalies?
No
Perform test 8.2.3
Yes
"individual harmonics/
interharmonics"
Test completed Any functional Test completed
Yes No
FAIL - record results anomalies? PASS - record results
IEC  669/09
Figure 1b – Test flowchart class 3
Figure 1 – Test flowcharts
8.2.1 Harmonic combination test flat curve and over swing
Replace the entire subclause by the following:
The two harmonic combination tests to be carried out are flat curve and over swing. The EUT
shall be tested for each harmonic combination, according to Tables 7 and 8 for 2 min. The
time-domain waveforms are shown in Figures 6 and 7 for the flat curve and over swing tests
respectively.
Flat curve: the voltage follows a time related function in which each half-wave consists of three
parts. See Figure 6.
– Part 1 starts from zero, it follows a pure sine function up to 95% of the peak value for Class
1, 90 % of the peak value for Class 2 and up to 80 % for Class 3.
– Part 2 is a constant voltage.
– Part 3 is equivalent to Part 1 (following a pure sine function).

61000-4-13 Amend. 1 © IEC:2009 – 5 –
The r.m.s. value of the resultant waveform shall be maintained at nominal voltage during the
application of this test. This means that the sinusoidal part of the waveform has to be
increased in amplitude by the factor K shown in Table 7.
y
Table 7 – Time related function, "flat curve"
Voltage
Function
Ratio
Voltage (Parts 1 and 3) Function (Part 2) Voltage (Part 2) Class
(Parts 1 and 3)
K
y
1,013 3 1
0 ≤ |sin(ωt)| ≤ 0,95 u = U × K × √2 × sin(ωt) 0,95 ≤ |sin(ωt)| ≤ 1 u = ±0,95 × U × K × √2
1 1 1 1
0 ≤ |sin(ωt)| ≤ 0,9 1,037 9 u = U × K × √2 × sin(ωt) 0,9 ≤ |sin(ωt)| ≤ 1 u = ±0,9 × U × K × √2 2
1 2 1 2
1,111 7 3
0 ≤ |sin(ωt)| ≤ 0,8 u = U × K × √2 × sin(ωt) 0,8 ≤ |sin(ωt)| ≤ 1 u = ±0,8 × U × K × √2
1 3 1 3
0 ≤ |sin(ωt)| ≤ X X u = U × K × √2 × sin(ωt) X ≤ |sin(ωt)| ≤ 1 u = ±X × U × K × √2 X
1 x 1 x
NOTE 1 Classes 1, 2, and 3 are defined in Annex C.
NOTE 2 The levels given for class X are open. The level must be defined by the product committees. However, for
equipment for use in public supply systems the values must not be lower than those of class 2.
NOTE 3 Maximum deviation: Δu = ±(0,01 × U × √2 + 0,005 × u).
rd
Over swing: Over swing is generated by adding a discrete value of the 3 harmonic and also of
th
the 5 harmonic both with a corresponding phase relationship.
Table 8 – Harmonic combination, "over swing"
h 3 5 Class
% of U 4 % / 180° 3 % / 0° 1
% of U 6 % / 180° 4 % / 0° 2
% of U 8 % / 180° 5 % / 0° 3
% of U X / 180° X / 0° X
NOTE 1 Classes 1, 2, and 3 are defined in Annex C.
NOTE 2 The levels given for class X are open. Thee level has to be defined by the product committees. However,
for equipment for use in public supply systems, the values must not be lower than those of class 2.

8.2.2 Test method “Sweep in frequencies”
Replace the entire text of this subclause by the following new text. Table 9 at the end of this
subclause remains unchanged.
The equipment set-up for sweep frequency tests are shown in Figures 2 and 3. The amplitude
of the sweep frequencies depends on the frequency range (see Table 9 and Figure 5). The
sweep (analogue) or step rate (digital) should be such that the time taken per decade is no less
than 5 min, as shown in Figure 5. The frequency sweep will dwell at frequencies where
performance anomalies are detected. At each dwell point, the test time should be at least
120 s.
NOTE Anomalies can also be caused by resonances. Further details are described in Annex B.
8.2.4 Application of the Meister curve
Delete the first paragraph.
Replace the second paragraph by the following new text:

– 6 – 61000-4-13 Amend. 1 © IEC:2009
The Meister curve test is applied to Class 2 products. During this test, the sweep (analog) or
step rate (digital) should be such that the time taken per decade is no less than 5 min, as
shown in Figure 5.
Delete the fourth and the fifth paragraphs (the two paragraphs below Table 11).
Figure 5 An example of the sweep in frequency test
Replace existing Figure 5 by the following new Figure:
f  Hz
f = fundamental frequency
40 × f
20 × f
2 × f
0,33 × f
>5 min/decade
t
>5 min/decade
steps 0,1 × f
steps 0,2 × f
1 >5 min/decade
steps 0,5 × f
U  %
h
(5)
(4)
(2)
(2)
Class 1 limits
f  Hz
0,33 × f 2 × f 10 × f 20 × f 40 × f
1 1 1 1 1
IEC  670/09
NOTE U = value of superimposed harmonics in %.
h
Figure 5 – An example of the sweep in frequency test
(for example class 1 equipment from Table 9)

61000-4-13 Amend. 1 © IEC:2009 – 7 –
Figure 6 Flat curve waveshape
Replace the existing Figure 6 by the following new Figure:

√2 × K × U
y
Flat part
π 2π
ωt
Part 1 Part 2 Part 3 Part 1 Part 2 Part 3
IEC  822/02
Examples with U = 230 V:
For class 1: K = 1,013 3
Peak voltage: U × K × √2 = 329,6 V Voltage of flat part: 0,95 × U × K × √2 = 313,1 V
1 1 1 1
For class 2: K = 1,037 9
Peak voltage: U × K × √2 = 337,6 V Voltage of flat part: 0,9 × U × K × √2 = 303,8 V
1 2 1 2
For class 3: K = 1,111 7
Peak voltage: U × K × √2 = 361,6 V Voltage of flat part: 0,8 × U × K × √2 = 289,3 V
1 3 1 3
Figure 6 – Flat curve waveshape
Annex B Resonance point
Replace the first and second paragraphs by the following new text. The example remains
unchanged.
A resonance point for example may be assumed, if the harmonic or interharmonic current at a
constant harmonic voltage amplitude reaches a maximum value at a frequency f , and the
res
current decreases by 3 dB in the frequency range f to 1,5 f . A resonance frequency can
res res
cause significant thermal disturbances. Thermal effects are not considered in this standard.
In practice, resonances appear especially at higher frequencies.

___________
– 8 – 61000-4-13 Amend. 1 © CEI:2009
AVANT-PROPOS
Le présent amendement a été établi par le sous-comité 77A: Phénomènes basse fréquence,
du comité d'études 77 de la CEI: Compatibilité électromagnétique.
Le texte de cet amendement est issu des documents suivants:
Projet d’enquête Rapport de vote
77A/668/CDV 77A/684/RVC
Le rapport d
...