Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry

IEC TS 62607-6-20:2022 (EN) IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic
- metallic impurity content
for powders of graphene-based materials by
- inductively coupled plasma mass spectrometry (ICP-MS).
The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS.
- The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO).
– The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.

General Information

Status
Published
Publication Date
10-Oct-2022
Current Stage
PPUB - Publication issued
Start Date
08-Nov-2022
Completion Date
11-Oct-2022
Ref Project

Buy Standard

Technical specification
IEC TS 62607-6-20:2022 - Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based material - Metallic impurity content: Inductively coupled plasma mass spectrometry Released:10/11/2022
English language
28 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


IEC TS 62607-6-20 ®
Edition 1.0 2022-10
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –
Part 6-20: Graphene-based material – Metallic impurity content: Inductively
coupled plasma mass spectrometry
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Secretariat Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews. With a subscription you will always
committee, …). It also gives information on projects, replaced have access to up to date content tailored to your needs.
and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 300 terminological entries in English
details all new publications released. Available online and
and French, with equivalent terms in 19 additional languages.
once a month by email.
Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc

If you wish to give us your feedback on this publication or
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC TS 62607-6-20 ®
Edition 1.0 2022-10
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Key control characteristics –

Part 6-20: Graphene-based material – Metallic impurity content: Inductively

coupled plasma mass spectrometry

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120 ISBN 978-2-8322-5732-6

– 2 – IEC TS 62607-6-20:2022 © IEC 2022
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 7
3.2 Key control characteristics measured in accordance with this document . 9
4 General . 9
4.1 Chemical reagents . 9
4.2 Description of measurement instrument and apparatus . 9
4.2.1 Measurement instrument . 9
4.2.2 Sample pre-treatment apparatus . 9
4.2.3 Other . 9
4.3 Calibration standards . 10
4.3.1 Standard stock solutions . 10
4.3.2 Internal standard (IS) solutions . 10
5 Sample preparation method . 10
5.1 General . 10
5.2 Sample pre-treatment procedure . 10
6 Measurement procedure . 12
6.1 Calibration of ICP-MS instrument . 12
6.2 Quantitative measurement procedure . 12
6.2.1 Whole element scanning . 12
6.2.2 Quantitative measurement of metal impurities. 12
6.2.3 Method recovery measurement . 12
6.2.4 Standard recovery measurement . 12
7 Data analysis . 13
7.1 Content of metal impurities in test samples . 13
7.2 Standard recovery. 13
8 Measurement uncertainty estimation. 13
9 Measurement report . 14
9.1 General . 14
9.2 Product or sample identification . 14
9.3 Measurement conditions . 14
9.4 Measurement specific information . 14
9.5 Measurement results . 14
Annex A (informative) Case study for FLG powder . 16
A.1 Test sample . 16
A.2 Sample pre-treatment . 16
A.3 Instrument information . 16
A.4 Standard calibration curve . 16
A.4.1 Standard stock solutions . 16
A.4.2 Standard calibration curve . 17
A.5 Measurement procedure . 17
A.6 Measurement results . 17
Annex B (informative) Case study for rGO powder . 19

B.1 Test sample . 19
B.2 Sample pre-treatment . 19
B.3 Measurement instrument . 19
B.4 Standard calibration curve . 19
B.5 Measurement results . 21
B.6 Standard recovery. 22
Annex C (informative) Comparison of different pre-treatment methods . 24
C.1 Test sample . 24
C.2 Comparison of different pre-treatment methods. 24
C.2.1 GO test sample preparation . 24
C.2.2 rGO test sample preparation . 25
C.3 Comparison of different digestion conditions . 25
Annex D (informative) Results comparison of ICP-MS and ICP-OES . 27
D.1 Test sample . 27
D.2 Measurement results comparison between ICP-MS and ICP-OES . 27
Bibliography . 28

Figure A.1 – Content distribution of metal impurities detected in FLG test sample . 18
Figure B.1 – Standard calibration curves of several metal elements contained in rGO

test sample . 20
Figure B.2 – Content distribution of metal impurities detected in rGO test sample . 22
Figure B.3 – Standard recovery of most species of metal impurities in rGO test sample . 23
Figure C.1 – Result comparison of three pre-treatment methods for industrial GO
powder . 25
Figure C.2 – Result comparison of different digestion methods for industrial rGO
powder . 25
Figure C.3 – Content of metal impurities detected in rGO test sample using microwave-

assisted digestion under different digestion conditions . 26

Table 1 – Potential interferences for several typical elements in industrial graphene
powder . 12
Table A.1 – Content of all metal impurities detected in FLG test sample . 17
Table B.1 – Content of all metal impurities detected in rGO test sample . 21
Table D.1 – Measurement results comparison between ICP-MS and ICP-OES . 27

– 4 – IEC TS 62607-6-20:2022 © IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING – KEY CONTROL CHARACTERISTICS –

Part 6-20: Graphene-based material – Metallic impurity content:
Inductively coupled plasma mass spectrometry

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the correspondin
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.