Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

General Information

Status
Published
Publication Date
13-Apr-2020
Current Stage
PPUB - Publication issued
Start Date
27-Apr-2020
Completion Date
14-Apr-2020
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IEC TS 62607-5-3:2020 - Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
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IEC TS 62607-5-3
®

Edition 1.0 2020-04
TECHNICAL
SPECIFICATION

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inside


Nanomanufacturing – Key control characteristics –
Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge
carrier concentration
IEC TS 62607-5-3:2020-04(en)

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IEC TS 62607-5-3

®


Edition 1.0 2020-04




TECHNICAL



SPECIFICATION









colour

inside










Nanomanufacturing – Key control characteristics –

Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge

carrier concentration


























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ICS 07.030; 07.120 ISBN 978-2-8322-8073-7




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– 2 – IEC TS 62607-5-3:2020  IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Sample structures . 6
4.1 Metal/insulator/semiconductor (MIS) structure . 6
4.2 Thin-film specimens with the van der Pauw configuration . 7
5 Criteria for choosing a method for measuring carrier concentration in organic
semiconductor layers . 8
6 Appropriate data formats . 8
Annex A (informative) Case study of carrier concentration measurements of organic
mater
...

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