IEC 61643-21:2000/AMD1:2008
(Amendment)Amendment 1 - Low voltage surge protective devices - Part 21: Surge protective devices connected to telecommunications and signalling networks - Performance requirements and testing methods
Amendment 1 - Low voltage surge protective devices - Part 21: Surge protective devices connected to telecommunications and signalling networks - Performance requirements and testing methods
Amendement 1 - Parafoudres basse tension - Partie 21: Parafoudres connectés aux réseaux de signaux et de télécommunications - Prescriptions de fonctionnement et méthodes d'essais
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IEC 61643-21
Edition 1.0 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Low voltage surge protective devices –
Part 21: Surge protective devices connected to telecommunications and
signalling networks – Performance requirements and testing methods
Parafoudres basse tension –
Partie 21: Parafoudres connectés aux réseaux de signaux et de
télécommunications – Prescriptions de fonctionnement et méthodes d’essais
IEC 61643-21 A1:2008
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IEC 61643-21
Edition 1.0 2008-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Low voltage surge protective devices –
Part 21: Surge protective devices connected to telecommunications and
signalling networks – Performance requirements and testing methods
Parafoudres basse tension –
Partie 21: Parafoudres connectés aux réseaux de signaux et de
télécommunications – Prescriptions de fonctionnement et méthodes d’essais
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
S
CODE PRIX
ICS 29.240; 29.240.10 ISBN 2-8318-9731-9
– 2 – 61643-21 Amend. 1 © IEC:2008
FOREWORD
This amendment has been prepared by subcommittee 37A: Low-voltage surge protective
devices, of IEC technical committee 37: Surge arresters.
The text of this amendment is based on the following documents:
FDIS Report on voting
37A/200/FDIS 37A/201/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
61643-21 Amend. 1 © IEC:2008 – 3 –
Page 3
CONTENTS
Delete, on page 5, the title of Annexes B and C, and replace each by “Void”.
Add the following new Annexes D and E:
Annex D (informative) Measurement accuracy .17
Annex E (informative) Determination of let-through current (I ) .18
p
Page 9
FOREWORD
Delete the references to the annexes.
Page 15
Replace the existing Figures 1a, 1b, 1c, 1d, 1e and 1f with the following new figures:
X1
SPD
(V)
X2
IEC 549/08
Figure 1a – Two-terminal SPD
X1
SPD
SPD
X1
Y1
C
(V, I)
(V)
C X2
IEC 550/08
IEC 551/08
Figure 1b – Three-terminal SPD Figure 1c – Three-terminal SPD
X1 Y1
SPD
(V, I)
X2 Y2
X1 Y1
SPD
(V, I)
Y2
X2
C
IEC 552/08
IEC 553/08
Figure 1d – Four-terminal SPD Figure 1e – Five-terminal SPD
– 4 – 61643-21 Amend. 1 © IEC:2008
Y1
X1
X2
Y2
SPD
(V, I )
Yn
Xn
a
C
IEC 554/08
a
The common terminal C may not be provided.
Figure 1f – Multi-terminal SPD
61643-21 Amend. 1 © IEC:2008 – 5 –
Page 17
1.3 Use of this standard
Replace the existing fifth paragraph by the following:
Subclause 5.2.3 provides transmission tests that SPDs may need to conform to, depending on
their communication and signalling application. Selection of the applicable transmission tests
from 5.2.3 shall be made, based on the intended application of the SPDs. Table 1 provides
general guidance on how to select the applicable transmission tests.
Delete the last line of this subclause.
Replace, on page 19, the existing Table 1 with the following new Table 1:
Table 1 – General SPD requirements
Test Sub-
4 Requirement – Test Type of SPD
series clause
1 General test 6.1
Identification and
documentation 6.1.1 A A A A A A
Marking 6.1.2 A A A A A A
Transmission tests 6.2.3
Capacitance 6.2.3.1 A O O O A O
Insertion loss 6.2.3.2 O A A A O A
Return loss 6.2.3.3 O O O A O O
Longitudinal balance 6.2.3.4 O O O A O O
Bit Error Ratio (BER) 6.2.3.5 O O O O O O
Near-end crosstalk (NEXT) 6.2.3.6 O O O A O O
Mechanical tests 6.3
Terminals and connectors 6.3.1 A A A A A A
General testing procedure 6.3.1.1 A A A A A A
Terminals with screws 6.3.1.2 A A A A A A
Screwless terminals 6.3.1.3 A A A A A A
Insulating pierced
connections 6.3.1.4 A A A A A A
Pull-out-test on SPD
terminals designed for
single-core conductors 6.3.1.4.1A A A A A A
Pull-out-test on SPD
terminals designed for multi-
core cables and cords 6.3.1.4.2 A A A A A A
Mechanical strength
(mounting) 6.3.2 A A A A A A
SPD with only voltage-
limiting function
SPD with both voltage-
limiting and current-
limiting functions
SPD with voltage-
limiting function and
linear component
between its terminals
SPD having both
voltage-limiting and
current-limiting
functions with enhanced
transmission
capabilities
SPD having only
voltage-limiting function
but intended for use in
extended range
environment
SPD having both
voltage-limiting and
current-limiting
functions but intends for
use in extended range
environment
– 6 – 61643-21 Amend. 1 © IEC:2008
Table 1 (continued)
Test Sub-
4 Requirement – Test Type of SPD
series clause
Resistance to ingress of
solid objects and to harmful
ingress of water 6.3.3 A A A A A A
Protection against direct
contact 6.3.4 A A A A A A
Fire resistance 6.3.5 A A A A A A
Environmental tests
6.4
High temperature and
humidity endurance 6.4.1 O O O O A A
Environmental cycling with
impulse surges 6.4.2 O O O O A A
Environmental cycling with
a.c. surges 6.4.3 O O O O A A
2 Voltage limiting tests 6.2.1
Maximum continuous
operating voltage (Uc) 6.2.1.1 A A A A A A
Insulation resistance 6.2.1.2 A A A A A A
Impulse durability for
voltage limiting function 6.2.1.6 A A A A A A
Impulse-limiting voltage 6.2.1.3 A A A A A A
Impulse reset switching
types 6.2.1.4A A A A A A
AC durability for voltage
limiting function
6.2.1.5 O O O O O O
Blind spot test multi stage
SPD 6.2.1.8 A A A A A A
Overstressed fault mode 6.2.1.7 A A A A A A
3 Current limiting tests 6.2.2
Rated current 6.2.2.1 N.A. A A A N.A. A
Series resistance 6.2.2.2 N.A. A A A N.A. A
A
Current response time 6.2.2.3 N.A. A N.A. A N.A.
A
Current reset time 6.2.2.4 N.A. A N.A. A N.A.
Maximum interrupting A
voltage 6.2.2.5N.A. A N.A. A N.A.
A
Operating duty test 6.2.2.6 N.A. A N.A. A N.A.
AC durability for current A
1 3
limiting function 6.2.2.7N.A. A N.A. A N.A.
Impulse durability for A
1 3
current limiting function 6.2.2.8 N.A. A N.A. A N.A.
Acceptance tests
4 6.5 O O O O O O
A Applicable.
N.A. Not applicable.
O Optional.
For each category of test impulse a new set of samples can be used.
It is admissible to measure the impulse-limiting voltage 6.2.1.3 while testing impulse durability 4.2.1.6.
Test not applicable if there is a linear component between its terminals.
Each test series is carried out on three samples.
SPD with only voltage-
limiting function
SPD with both voltage-
limiting and current-
limiting functions
SPD with voltage-
limiting function and
linear component
between its terminals
SPD having both
voltage-limiting and
current-limiting
functions with enhanced
transmission
capabilities
SPD having only
voltage-limiting function
but intended for use in
extended range
environment
SPD having both
voltage-limiting and
current-limiting
functions but intends for
use in extended range
environment
61643-21 Amend. 1 © IEC:2008 – 7 –
2 Normative references
Add the following new references:
IEC 61643-22:2004, Low-voltage surge protective devices – Part 22: Surge protection devices
connected to telecommunications and signalling networks – Selection and application
principles
ITU-T Recommendation K.55:2002, Overvoltage and overcurrent requirements for insulation
displacement connectors (IDC) terminations
ITU-T Recommendation K.65:2004, Overvoltage and overcurrent requirements for termination
modules with contacts for test ports or SPDs
ITU-T Recommendation O.9:1999, Measuring arrangements to assess the degree of
unbalance about earth
Delete, on page 21, the dates from the following references:
IEC 60529, IEC 61000-4-5, IEC 61083-1 and IEC 61643-1.
Delete the following reference:
ITU-T Recommendation K.17:1988, Tests on power-fed repeaters using solid-state devices in
order to check the arrangements for protection from external interference
3 Definitions
Replace, the existing definitions 3.8, 3.10, 3.14, 3.15 and 3.22 by the following new
definitions:
3.8
surge protective device
SPD
device that restricts the voltage of a designated port or ports, caused by a surge, when it
exceeds a predetermined level
NOTE 1 Secondary functions may be incorporated, such as a current-limiting to restrict a terminal current.
NOTE 2 Typically the protective circuit has at least one non-linear voltage-limiting surge protective component.
NOTE 3 An SPD is a complete assembly, having terminals to connect to the circuit conductors.
3.10
current limiting
action of an SPD, containing at least one non-linear current-limiting component, that causes
currents exceeding a predetermined value to be restricted
3.14
voltage clamping type SPD
SPD that has high shunt impedance and will have a continuous reduction in impedance with
increasing current in response to a voltage surge exceeding the threshold level of the SPD
NOTE Examples of components used in voltage clamping type SPDs: varistors (e.g. MOV) and avalanche
breakdown diodes (ABD).
3.15
voltage switching type SPD
SPD that has a high shunt impedance and will have a sudden and large reduction in
impedance in response to a voltage surge exceeding the threshold level of the SPD
NOTE Examples of components used in voltage switching type SPDs: air gaps, gas discharge tubes (GDT) and
thyristor surge suppressors (TSS).
– 8 – 61643-21 Amend. 1 © IEC:2008
3.22
rated current
maximum current a current-limiting SPD can conduct continuously with no change in the
impedance of the current-limiting components
NOTE This is also applicable to linear series components.
Add, on page 29, the following new definition 3.32:
3.32
surge (telecommunications)
temporary excessive voltage or current, or both, coupled on a telecommunication line, from an
external electrical source
NOTE 1 Typical electrical sources are lightning and AC/DC power systems.
NOTE 2 Electrical source coupling can be one or more of the following; electric, magnetic, electromagnetic,
conductive.
4.1.1 Normal service conditions
Replace the existing text of 4.1.1 as follows:
4.1.1.1 Air pressure and altitude
Air pressure is 80 kPa to 106 kPa. These values represent an altitude of +2 000 m to –500 m
respectively.
4.1.1.2 Ambient temperature
• normal range: –5 °C to +40 °C
NOTE 1 This range normally addresses SPDs for indoor use. This corresponds to code AB4 in IEC 60364-5-51.
• extended range: –40 °C to +70 °C
NOTE 2 This range normally addresses SPDs for outdoor use in non weather-protected locations, class 3K7 in
IEC 60721-3-3.
• storage range: –40 °C to +70 °C
NOTE 3 All values beyond will be specified by the manufacturer.
4.1.1.3 Relative humidity
• normal range: 5 % to 95 %
NOTE 1 This range normally addresses SPDs for indoor use. This corresponds to code AB4 in IEC 60364-5-51.
• extended range: 5 % to 100 %
NOTE 2 This range normally addresses SPDs for outdoor use in non weather-protected locations (e.g. SPD is
contained in a weather proofed enclosure).
Page 31
4.3 SPD testing
Replace the first two paragraphs of this subclause by the following:
The SPDs covered by this standard shall be tested using the connections or terminations that
are used when the SPDs are installed in the field. Also, the measurements shall be made at
the connections or terminations of the SPDs. For those that are intended to be used with a
base or connector, that base or connector shall be part of the tests.
For telecommunication applications ITU-T gives requirements in the K-series for protection
holders (K.65) and termination modules (K.55).
When a base is used for testing, the measurements shall be made as close as possible to the
terminals of the SPD. Oscilloscopes used for measurements shall be in accordance with
IEC 61083-1.
61643-21 Amend. 1 © IEC:2008 – 9 –
NOTE For oscilloscope settings, see Annex D.
SPDs of Figures 1c, 1e and 1f may have a common current path (including protective
The
components or just internal connections) that conducts the total impulse current.
manufacturer shall state the maximum value of impulse current for this current path. This
value of impulse current may be less than n times the maximum current capability of each line
terminal, where n equals the number of line terminals.
These SPDs shall have all of their line terminals tested simultaneously with respect to the
common terminal.
Page 35
5.2.1.1 Maximum continuous operating voltage (Uc)
Replace the existing text of this subclause by the following:
The manufacturer shall state the maximum continuous operating voltage for the SPD
appropriate for the application such as AC rms or DC.
Compliance shall be checked in accordance with 6.2.1.1.
Page 39
5.2.3 Transmission requirements
Replace the existing text of this subclause by the following:
The SPD, in addition to the requirements of 5.2.1 and 5.2.2, may need to conform to specific
requirements of 5.2.3 depending on its communication and signalling application (for
example, voice, data, and video). Table 1 provides guidance in the selection of applicable
transmission tests.
Page 47
6.2.1.3 Impulse-limiting voltage
Replace the first paragraph of this subclause by the following:
The SPDs shall be tested using one impulse selected from category C of Table 3 and applied
to the appropriate terminals. The current level shall be selected based on the energy
capability of the SPD as determined in the impulse durability test (see 6.2.1.6). Both impulse-
limiting voltage and impulse durability tests shall be performed with the same impulse. Values
listed in Table 3 are minimum requirements, other surge current ratings can be found in
standards e.g. ITU-T recommendations.
Replace the fourth paragraph of this subclause by the following:
Measure the voltage limitation for each impulse without load. The maximum voltage measured
at the appropriate terminals shall not exceed the specified voltage protection level (U ).
p
Sufficient time shall be allowed between impulses to prevent accumulation of heat. It is
understood that different SPDs will have different thermal characteristics, and consequently
will require different times between impulses.
For detail impulse recorders settings refer to Annex D.
– 10 – 61643-21 Amend. 1 © IEC:2008
Page 49
Replace the existing Table 3 by the following new table:
Table 3 – Voltage and current waveforms for impulse-limiting voltage
Category Type of test Open-circuit Short-circuit Minimum Terminals to be
a
voltage current number of tested
applications
A1 Very slow rate 10 A, Not applicable X1 – C
≥ 1 kV
of rise Rate of rise from 0,1 A/µs to (NA) X2 – C
0,1 kV/µs to 2 A/μs, X1 – X2
b
100 kV/s ≥ 1 000 μs
(duration)
A2 AC Select a test from Table 5 Single cycle
B1 1 kV 100 A, 300
10/1000 10/1000
B2 Slow rate 1 kV to 4 kV 25 A to 100 A 300
of rise 10/700 5/300
B3 10 A to 100 A 300
≥ 1 kV
10/1 000
100 V/μs
C1 0,5 kV to < 2 kV 0,25 kA to < 1 kA 300
1,2/50 8/20
C2 2 kV to 10 kV 1 kA to 5 kA 10
1,2/50 8/20
Fast rate
of rise
C3 ≥ 1 kV 10 A to 100 A 300
10/1 000
1 kV/μs
D1 ≥ 1 kV 0,5 kA to 2,5 kA 2
10/350
High energy
0,6 kA to 2,0 kA
D2 5
≥ 1 kV
10/250
a
An open-circuit voltage different from 1 kV may be used. However, it must be sufficient to operate the SPD under
test.
b
X1 – X2 terminals shall be tested only if it is required.
NOTE 1 For the verification of U , one of the above impulse waveform of category C is mandatory and A, B and D
p
are optional. Unless otherwise specified, apply 5 positive and 5 negative pulses.
NOTE 2 For impulse reset, select test from category B, C and D. Unless otherwise specified, apply 3 positive and 3
negative pulses.
NOTE 3 For impulse durability measurement, one impulse waveform of category C is mandatory and A1, B and D
are optional.
NOTE 4 Values listed in Table 3 are minimum requirements; other surge current ratings are possible and can also
be found in other standards e.g. ITU-T K series – Recommendations.
Add the following text (including new Figure 16) immediately after Table 3:
Simultaneous surge on all protected conductors
Multi-line SPDs may use a common protective element for the ground return of the total
impulse current . Two examples are shown in Figure 16. All the protected lines shall have an
impulse current equal to total impulse current divided by number of lines. applied
simultaneously to verify that the common protective element had adequate current capability.
After this test the SPD shall not be degraded. This test also verifies that the internal
connections of the SPD have adequate current capability.
61643-21 Amend. 1 © IEC:2008 – 11 –
Xn
Yn Xn Yn
X2
Y2 X2 Y2
X1
Y1 X1 Y1
C C C C
IEC 555/08 IEC 556/08
Star protection circuit Diode steering bridge
Key
X1, X2, Xn, line terminals 1 individual protective element
Y1, Y2, Yn, protected line terminals 2 common protective element
C common
Figure 16 – Examples of multi-line SPDs with a common protective element
The requirements of the current distributor (coupling network) shown in Figure 4 are as
follows:
– The coupling network shall not influence the test impulse. All parameters of the surge
waveform according to 4.4 apply to the output terminals of the coupling network.
– The front time and the pulse duration shall be verified at the output terminals of the
coupling network for surge voltages (open circuit) and surge currents (short-circuit).
– The surge waveform of the short-circuit current can be measured with the aid of a torroidal
current transformer or a current monitoring resistor.
– Preferably resistors should be used for the coupling network.
– The current sharing in each conductor of the distributor has to be tested individually with
the other conductors shorted before connection to the respective test specimen is made.
The results of this test does not mean that the currents will be equally shared when the
SPD is in the circuit.
– During the simultaneous test it will be verified that the common protective element was
exposed to the total impulse current without failure of any surge protective components.
– 12 – 61643-21 Amend. 1 © IEC:2008
Page 49
6.2.1.4 Impulse reset
Replace, on page 51, the existing Table 4 with the following new table:
Table 4 – Source voltages and currents for impulse reset test
b
Open-circuit source voltage Short-circuit source current
V mA
12 500
24 500
48 260
97 80
a
135 200
a
The SPD may be connected in parallel by a series combination of a 135-150 Ω resistor and a
0,08 µF to 0,1 µF capacitor.
b
Tolerance (including ripple) + 10% -0%
6.2.1.5 AC durability
Replace the existing title by the following:
6.2.1.5 AC durability for voltage limiting function
Replace, on page 53, the existing Table 5 with the following new table:
Table 5 – Preferred values of currents for a.c. durability test
48 Hz-62 Hz Duration Number Test terminals
Short-circuit currents on of applications b
each tested terminal a
A s
rms
0,1 1 5 X1 – C
X2 – C
0,25 1 5
X1 – X2
c
0,5 1 5
0,5 30 1
1 1 5
1 1 60
2 1 5
2,5 1 5
5 1 5
10 1 5
20 1 5
a
Values listed in Table 5 are minimum requirements. .
b Different numbers of applications can be found in other standards e.g.
ITU-T K series - Recommendations
c
X1 – X2 terminals shall be tested only if required
61643-21 Amend. 1 © IEC:2008 – 13 –
6.2.1.6 Impulse durability
Replace the existing title by the following:
6.2.1.6 Impulse durability for voltage limiting function
Replace the fifth paragraph of this subclause by the following:
For SPDs that have a common current path refer to 4.3.
Page 55
6.2.1.7 Overstressed fault mode
Replace the first two paragraphs of this subclause by the following:
The SPD shall be overstressed by impulse overstress and a.c. overstress currents. For tests
on the SPDs shown in Figures 1c, 1e and 1f, each pair of terminals (X1 – C and X2 – C) may
be tested separately. For SPD 1f select two terminals as a representative sample. Different
SPDs shall be tested for impulse and a.c. tests.
Then insulation resistance, voltage-limiting and series resistance (if applicable) tests shall be
performed to determine if the SPD has reached an acceptable overstressed fault mode as
described in 3.3. The SPD shall reach its overstressed fault mode in a safe manner without
causing a fire hazard, an explosion hazard, an electrical hazard or emission of toxic fumes.
Page 57
6.2.2.3 Current response time
Replace the first two paragraphs by the following:
The SPD shall be connected as shown in Figure 5. The source voltage shall be less than the
maximum interrupting voltage as specified by the manufacturer. The frequency shall be either
0 Hz (d.c.) or 50 Hz or 60 Hz, the choice being selected, according to the intended
application.
Devices shall be tested at appropriate temperatures with reference to 4.2. Sufficient time shall
be allowed between tests to ensure that devices cool back to testing temperature prior to
subsequent testing. Alternatively, separate devices can be used for each test to avoid waiting
for the cooling period. Rs or Rs1 and Rs2 shall be set to provide the desired prospective test
currents of Table 6. The response time of the current-limiting function at each test current
shall be recorded. The response time is the time from application of power until the current
falls to 10 % of the rated current. If the prospective test current exceeds the maximum current
capability of the current-limiting component(s), then the highest test current shall be the
maximum current capability of the current-limiting component(s).
Page 61
6.2.2.7 AC durability
Replace the existing title by the following:
6.2.2.7 AC durability for current limiting function
6.2.2.8 Impulse durability
Replace the existing title by the following:
6.2.2.8 Impulse durability for current limiting function
– 14 – 61643-21 Amend. 1 © IEC:2008
Page 63
6.2.3.2 Insertion loss
Replace the existing Table 10 by the following new table:
Table 10 – Standard parameters for Figure 8
Frequency range Characteristic impedance Z
Cable types
Ω
300 Hz to 4 kHz 600 Twisted-pair
4 kHz to 250 MHz 100, 120 or 150 Twisted-pair
50 or 75 Coaxial
≤ 1 GHz
> 1 GHz 50 Coaxial
Page 65
6.2.3.4 Longitudinal balance
Replace the existing title and text of this subclause (including the existing Table 11) by the
following:
6.2.3.4 Longitudinal balance / Longitudinal conversion loss (LCL)
Longitudinal balance as calculated in the equation below is equivalent to longitudinal
conversion loss (LCL) as described in ITU-T O.9 (03.1999).
Figure 10 shows the connections for longitudinal balance testing of three- four- and five-
terminal SPDs. For four- and five-terminal SPDs, the test shall be carried out with switch S1
both open and closed. The longitudinal balance is the ratio of the applied longitudinal voltage
V and the resulting voltage V of the SPD under test expressed in dB, as follows:
s m
Longitudinal balance (dB) = 20 log (V / V )
s m
where the V and V signals have the same frequency.
s m
Due to more precision at higher frequencies, a balun transformer to implement the SPD may
be used instead of the shown ohmic resistances in the test set-up of Figure 10. The test
bridge configuration, with transversal impedance Z1 and longitudinal impedance Z2 does not
represent all conditions found in practice. Values and limits for the intended transmission
characteristics, such as frequency range and voltage, special considerations for terminating
impedances and measurement frequencies to be used are given in the relevant ITU-T
recommendations. An example of values and impedances for different frequency ranges up to
190 kHz is shown in Table 11. Unless otherwise specified, The test may be performed with
increasing frequencies, for example at 200 Hz, 500 Hz, 1 000 Hz and 4 000 Hz for analogue
applications, or at 5 kHz, 60 kHz, 160 kHz and 190 kHz for digital ISDN applications. The
inherent longitudinal balance of the measuring arrangements should be 20 dB greater than
the limit set for the SPD. If the longitudinal balance of the SPD is affected by the d.c. bias
voltage, then the test should be carried out whilst applying the appropriate d.c. bias voltage at
each SPD terminal. Requirements for the measuring arrangements are given in ITU-T
Recommendation O.9.
61643-21 Amend. 1 © IEC:2008 – 15 –
Table 11 – Impedance values for longitudinal balance test
a b
f Z1 Z2
Service
kHz
Ω Ω
≤4 Analogue 300 150
ISDN 55 or 67.5 20-40
≤190
Up to 30 MHz ADSL2+; VDSL 67,5 20-40
a
The real difference between the test set-up and the actual longitudinal balance is somewhat independent
of the terminal input impedance and therefore this analysis applies to virtually all reasonable input
impedances. For details to specify Z1 and Z2, see the relevant product standard.
b
Z2 should be equal to half of Z1.
Where the longitudinal conversion loss is dependent on the SPD series resistance matching,
the balance may be specified as the maximum ohmic or percentage difference between the
series resistances.
6.2.3.5 Bit error ratio (BER)
Replace the first paragraph of this subclause by the following:
Bit error ratio (BER, see Figure 11), the result of dividing the number of bit errors by the total
number of bits is a stream, can be used to identify the performance of a communications or
data storage product. For example, 2,5 erroneous bits out of 100 000 bits transmitted would
5 –5
be 2,5 out of 10 or 2,5 ×10 . An example of test times for different transmission rates is
shown in Table 12
BER tests are conducted to measure the change, if any, caused by insertion of an SPD. BER
tests are described in ITU-T G series (e.g. for ISDN ITU-T G.821, ADSL2 ITU-T G.992.3,
VDSL ITU-T G.993.1, etc.)
Page 75
6.4.2 Environmental cycling with impulse surges
Replace the second paragraph of this subclause by the following:
When cycle A is selected, two impulse currents shall be applied each cycling day for five
consecutive days, followed by two days without application. Alternatively, when cycle B is
selected, two impulse currents shall be applied at the first day and the last day of the
temperature cycling. On each surge day, one impulse current is applied at high extreme
temperature T , given in Table 16, and the other at low extreme temperature T , given in
1 2
Table 16. The surges shall be applied within 1 h of the centre of the dwell time at low and
high extreme temperatures. The impulse currents on a given day shall be of the same
polarity, but shall alternate polarity on the next test day. This procedure shall be repeated
until the completion of the environmental cycling.
Page 77
6.4.3 Environmental cycling with a.c. surges
Replace the second paragraph of this subclause by the following:
When cycle A is selected, two impulse currents shall be applied each cycling day for five
consecutive days followed by two days without application. Alternatively, when cycle B is
selected, two impulse currents shall be applied at the first day and the last day of the
temperature cycling. On each surge day, one impulse current is applied at high extreme
– 16 – 61643-21 Amend. 1 © IEC:2008
temperature T , given in Table 16, and the other at low extreme temperature T given in
Table 16. The surges shall be applied within 1 h of the centre of the dwell time at low and
high extreme temperatures. The a.c. surges shall be applied within 1 h of the centre of the
dwell time at low and high extreme temperatures. This procedure shall be repeated until the
completion of the environmental cycling.
Page 83
Insert the following additional Figure at the bottom of Figure 4:
CD
X1 Y1
X2 Y2
3 Y3
X3 V, I
G
.
.
.
Yn
Xn
n
C
IEC 557/08
Additional key
CD current distributor
Page 107
Annex B
Delete the title and text of this annex and add under Annex B “Void”.
Page 109
Annex C
Delete the title and text of this annex and add under Annex C “Void”.
61643-21 Amend. 1 © IEC:2008 – 17 –
Insert the following new Annexes D and E
Annex D
(informative)
Measurement accuracy
IEC 61083-1 defines the measurement accuracy for analogue type and digital type impulse
recorders, such as a digital oscilloscope with probes. Analogue recorders shall have rise
times five times faster than the signal rise time. This ensures less than 2 % error in the
displayed rise time. Digital recorders shall have sample times at least 30/TX where TX is the
–8
time interval to be measured. A rated resolution of 0,4 % of full-scale deviation (2 full-scale
deviation) or better is recommended for tests where only the impulse parameters are to be
evaluated. For reference tests, which require comparison of records, a rated resolution of
–9
0,2 % of full-scale deviation (2 full-scale deviation) or better shall be used. IEC 61083-1 also
covers additional accuracy parameters for specific waveshapes.
– 18 – 61643-21 Amend. 1 © IEC:2008
Annex E
(informative)
Determination of let-through current (I )
p
To determine the maximum let-through current I at the output terminals of an SPD, the input
P
terminals should be exposed to a specified test impulse selected from Table 3. The output
current waveform into a short-circuit (Figures E.1 to E.6) should be measured. If the
measured waveform is equal to the waveform given by Table 3, than the value I is given by
P
the peak value of the measured current. Where the measured waveform deviates from the
specified waveform according to Table 3, it can be assumed that at Figures 1b to 1f, the
measured maximum current corresponds to I . At Figure 1a, I is equal to the short-circuit
P P
current of the generator. To get an exact calculation of coordination, it is necessary to use the
let-through energy (LTE) method (see Clause F.5 of IEC 61643-12 or Clause C.4 of
IEC 62305-4).
This determination of the let-through current (I ) is used to calculate a coordination of SPDs
P
(see Figure E.1 in IEC 61643-22).
If several test impulses are specified, the maximum values of U and I should be indicated
p P
for each test impulse. Depending on the type of SPD (see 1.2), the test a), b) or c) should be
chosen.
a) Asymmetrical application of test impulses to determine the differential mode I (see Figure
P
E.1). The test impulse is applied to the input side of the SPD.
b) Non-symmetrical application of test impulses to determine the common mode I (see
P
Figure E.2). The test impulse is applied to the input side of the SPD.
c) Symmetrical application of test impulses to determine the differential mode I (see Figure
P
E.3). The test impulse is applied by a current distributor (1:2) to the input side of the SPD.
d) Asymmetrical application of test impulses to determine the differential mode I (see Figure
P
E.4). The test impulse is applied to the input side of the SPD.
e) Symmetrical application of test impulses to determine the common mode I (see Figure
P
E.5). The test impulse is applied by a current distributor (1:2) to the input side of the SPD.
f) Symmetrical application of test impulses to determine the common mode I (see Figure
P
E.6). The test impulse is applied by a current distributor (1:n) to the input side of the SPD.
X1
SPD A
I
P
G
(Figure 1a)
X2
IEC 558/08
NOTE The value of I is equal to the surge current of the generator.
P
Figure E.1 – Determination of differential mode let-through current
61643-21 Amend. 1 © IEC:2008 – 19 –
SPD
X1 Y1
(Figure 1b)
C
A
G
I
P
IEC 559/08
Figure E.2 – Determination of common mode let-through current
X1
SPD
C
A
I
P
CD (Figure 1c)
G
X2
IEC 560/08
Figure E.3 – Determination of differential mode let-through current
X1 Y1
SPD
G
A
I
P
(Figure 1d)
X2 Y2
IEC 561/08
Figure E.4 – Determination of differential mode let-through current
X1 Y1
SPD
CD (Figure 1e)
X2
Y2
C
A
I
P
G
IEC 562/08
Figure E.5 – Determination of common mode max. let-through current
– 20 – 61643-21 Amend. 1 © IEC:2008
X1
Y1
.
.
SPD
.
.
CD
.
(Figure 1f)
.
Yn
Xn
C
I
A
P
G
IEC 563/08
Figure E.6 – Determination of common mode max.
let-through current at multi-terminal SPDs
Page 111
Bibliography
Insert the following new standards:
IEC 60364-5-51:2005, Electrical installations of buildings – Part 5-51: Selection and erection
of electrical equipment – Common rules
IEC 61180-1, High-voltage test techniques for low-voltage equipment – Part 1- Definitions,
test and procedure requirements
IEC 61643-12, Low-voltage surge protective devices – Part 12: Surge protective devices
connected to low-voltage power distribution systems – Selection and application principles
IEC 62305-4, Protection against lightning – Part 4: Electrical and electronic systems within
structures
ITU-T K.44:2003, Resistibility tests for telecommunication equipment exposed to overvoltages
and overcurrents – Basic recommendation
___________
– 22 – 61643-21 Amend. 1 © CEI:2008
AVANT-PROPOS
Le présent amendement a été préparé par le sous-comité 37A: Dispositifs de protection basse
tension contre les surtensions, du comité d'études 37 de la CEI: Parafoudres.
Le texte de cet amendement est issu des documents suivants:
FDIS Rapport de vote
37A/200/FDIS 37A/201/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cette norme.
Le comité a décidé que le contenu de cette publication ne sera pas modifié avant la date de
maintenance indiquée sur le site web de la CEI sous "http://webstore.iec.ch" dans les
données relatives à la publication recherchée. A cette date, la publication sera
• reconduite,
• supprimée,
• remplacée par une édition révisée, ou
• amendée.
_____________
61643-21 Amend. 1 © CEI:2008 – 23 –
Page 2
SOMMAIRE
Supprimer, en page 4, le titre des Annexes B et C, et le remplacer par « Vacant ».
Ajouter les nouvelles Annexex D et E suivantes :
Annexe D (informative) Exactitude de mesure.38
Annexe E (informative) Détermination du courant conventionnel de non-
fonctionnement (I ) .39
p
Page 8
AVANT-PROPOS
Supprimer les références aux annexes.
Page 14
Remplacer les Figures 1a, 1b, 1c, 1d, 1e et 1f existantes par les nouvelles figures suivantes:
X1
SPD
(V)
X2
IEC 549/08
Figure 1a – Parafoudre à 2 bornes
X1
SPD
SPD
X1
Y1
C
(V, I)
(V)
C X2
IEC 550/08
IEC 551/08
Figure 1b – Parafoudre à 3 bornes Figure 1c – Parafoudre à 3 bornes
X1 Y1
SPD
(V, I)
X2 Y2
X1 Y1
SPD
(V, I)
Y2
X2
C
IEC 552/08
IEC 553/08
Figure 1d – Parafoudre à 4 bornes Figure 1e – Parafoudre à 5 bornes
– 24 – 61643-21 Amend. 1 © CEI:2008
X1 Y1
X2
Y2
SPD
(V, I )
Yn
Xn
a
C
IEC 554/08
a
La borne commune C peut ne pas exister.
Figure 1f – Parafoudre multibornes
61643-21 Amend. 1 © CEI:2008 – 25 –
Page 16
1.3 Utilisation de cette norme
Remplacer le cinquième alinéa existant par ce qui suit :
Le Paragraphe 5.2.3 traite de quelques essais de transmission auxquels les parafoudres
peuvent avoir à se conformer, selon leurs applications en télécommunications ou en
transmission de signaux. Ainsi, une sélection des essais de transmission applicables doit être
faite selon 5.2.3, en fonction des objectifs d’application des parafoudres. Le Tableau 1 donne
des lignes directrices pour choisir les essais de transmission applicables.
Supprimer la dernière ligne de ce paragraphe.
Remplacer, à la page 18, le Tableau 1 existant par le nouveau Tableau 1 suivant:
Tableau 1 – Exigences générales des parafoudres
Série
d’essai Exigence – Essai Paragraphe Type de parafoudre
1 Essais généraux 6.1
Identification et
documentation 6.1.1 A A A A A A
Marquage 6.1.2 A A A A A A
Essais de transmission 6.2.3
Capacité 6.2.3.1 A O O O A O
Perte d’insertion (ou
affaiblissement) 6.2.3.2 O A A A O A
Facteur d’adaptation 6.2.3.3 O O O A O O
Affaiblissement de
conversion longitudinal
(ACL) 6.2.3.4 O O O A O O
Taux d’erreur binaire
(TEB) 6.2.3.5 O O O O O O
Paradiaphonie 6.2.3.6 O O O A O O
Essais mécaniques 6.3
Bornes et connecteurs 6.3.1 A A A A A A
Procédure générale
d’essai 6.3.1.1 A A A A A A
Bornes à vis 6.3.1.2 A A A A A A
Bornes sans vis 6.3.1.3 A A A A A A
Connexions à perçage
d’isolant 6.3.1.4 A A A A A A
Essai de traction pour des
bornes de parafoudres à
monoconducteurs 6.3.1.4.1 A A A A A A
Essai de traction pour des
parafoudres conçus pour
des câbles
multiconducteurs et des
cordons
6.3.1.4.2 A A A A A A
Contrainte mécanique
(montage) 6.3.2 A A A A A A
Parafoudre limiteur de
tension
Parafoudre limiteur de
tension et de courant
Parafoudre limiteur de
tension et ayant un
composant linéaire
entre ses bornes
Parafoudre limiteur de
tension et limiteur de
courant et ayant des
bornes à capacités de
transmission
Parafoudre limiteur de
tension, mais destiné à
un environnement à
conditions étendues
Parafoudre limiteur de
tension et de courant,
mais destiné à un
environnement à
conditions étendues
– 26 – 61643-21 Amend. 1 © CEI:2008
Tableau 1 (suite)
Série
d’essai Exigence – Essai Paragraphe Type de parafoudre
Résistance à
l’introduction de corps
solides et d’eau 6.3.3 A A A A A A
Protection contre les
contacts directs 6.3.4 A A A A A A
Résistance au feu 6.3.5 A A A A A A
Essais
d’environnement 6.4
Hautes températures
et résistance à
l’humidité 6.4.1 O O O O A A
Condi
...
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