IEC TS 62876-2-1:2018

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

General Information

• Status: Published
• Publication Date: 28-Aug-2018
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 07.120 - Nanotechnologies
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: PT 62876-2-1 - TC 113/PT 62876-2-1
• Current Stage: PPUB - Publication issued
• Start Date: 13-Sep-2018
• Completion Date: 29-Aug-2018

Standards Content (Sample)

IEC TS 62876-2-1 ®
Edition 1.0 2018-08
TECHNICAL
SPECIFICATION
Nanotechnology – Reliability assessment –
Part 2-1: Nano-enabled photovoltaic devices – Stability test

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IEC TS 62876-2-1 ®
Edition 1.0 2018-08
TECHNICAL
SPECIFICATION
Nanotechnology – Reliability assessment –

Part 2-1: Nano-enabled photovoltaic devices – Stability test

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120; 27.160 ISBN 978-2-8322-5981-8

– 2 – IEC TS 62876-2-1:2018 © IEC 2018
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 11
4 General requirements . 11
4.1 Device . 11
4.2 Tests . 12
4.2.1 General . 12
4.2.2 Quantity of specimens . 14
4.2.3 Sequence . 14
4.2.4 Equipment specifications . 14
4.2.5 Test methods . 14
4.3 Measurements . 15
4.3.1 General . 15
4.3.2 Conditioning . 15
4.3.3 Visual inspection . 16
4.3.4 Data collection . 16
4.3.5 Pass/fail criteria . 16
5 Test methods . 17
5.1 ST1 – Dry heat . 17
5.1.1 Purpose . 17
5.1.2 Temperature/humidity . 17
5.1.3 Data logging . 17
5.1.4 Output . 17
5.1.5 Required equipment . 17
5.2 ST2 – UV exposure . 17
5.2.1 Purpose . 17
5.2.2 Radiation source. 17
5.2.3 Temperature/humidity . 18
5.2.4 Data logging . 18
5.2.5 Output . 18
5.2.6 Required equipment . 18
5.3 ST3 – Damp heat . 18
5.3.1 Purpose . 18
5.3.2 Procedure . 18
5.3.3 Temperature/humidity . 18
5.3.4 Data logging . 18
5.3.5 Output . 19
5.3.6 Required equipment . 19
5.4 ST4 – Light exposure . 19
5.4.1 Purpose . 19
5.4.2 Light source . 19
5.4.3 Devices and load condition . 19

5.4.4 Temperature . 19
5.4.5 Humidity at ambient conditions . 19
5.4.6 Data logging . 19
5.4.7 Output . 20
5.4.8 Required equipment . 20
5.5 ST5 – Outdoor exposure . 20
5.5.1 Purpose . 20
5.5.2 Locations . 20
5.5.3 Solar irradiance . 20
5.5.4 Devices . 20
5.5.5 Temperature . 20
5.5.6 Load condition . 20
5.5.7 Humidity/wind . 21
5.5.8 Data logging . 21
5.5.9 Output . 21
5.5.10 Required equipment . 21
5.6 ST6 – Laboratory weathering . 21
5.6.1 Purpose . 21
5.6.2 Temperature/humidity/light . 21
5.6.3 Devices . 21
5.6.4 Load condition . 22
5.6.5 Data logging . 22
5.6.6 Output . 22
5.6.7 Required equipment . 22
5.7 ST7 – Thermal cycling . 22
5.7.1 Purpose . 22
5.7.2 Temperature/humidity . 22
5.7.3 Data logging . 22
5.7.4 Output . 23
5.7.5 Required equipment . 23
6 Report . 23
Annex A (informative) Overview of common failure modes – Failure mode and known
failure mechanisms for nano-enabled photovoltaic devices . 25
Annex B (informative) Stability test temperature choice – How to choose the best
temperature for stability testing of new technologies . 26
Annex C (informative) Correspondence between ISOS protocols and the stability test
for nano-enabled photovoltaic devices outlined in this document . 27
Bibliography . 30

Figure 1 – Generic representation of a device under test during IV-characterization . 8
Figure 2 – Overview of stresses that photovoltaic devices are exposed to in service
environments . 12
Figure 3 – General stability test procedure . 13
Figure 4 – Overview of the stability assessment tests that are recommended for
standard testing in order to assess the stability of NePV . 14
Figure 5 – Plot of the temperature cycle to be used for thermal cycling. . 23

Table 1 – Summary of the stresses utilized in this document . 13

– 4 – IEC TS 62876-2-1:2018 © IEC 2018
Table 2 – Summary overview of the relevant test meth
...