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IEC TS 62876-2-1:2018

(Main)

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

General Information

Status
Published
Publication Date
28-Aug-2018
ICS
01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
07.120 - Nanotechnologies
27.160 - Solar energy engineering
Technical Committee
TC 113 - Nanotechnology for electrotechnical products and systems
Drafting Committee
PT 62876-2-1 - TC 113/PT 62876-2-1
Current Stage
PPUB - Publication issued
Start Date
13-Sep-2018
Completion Date
29-Aug-2018
Ref Project

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IEC TS 62876-2-1:2018 - Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability testIEC TS 62876-2-1:2018 - Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
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IEC TS 62876-2-1
®

Edition 1.0 2018-08
TECHNICAL
SPECIFICATION



Nanotechnology – Reliability assessment –
Part 2-1: Nano-enabled photovoltaic devices – Stability test

IEC TS 62876-2-1:2018-08(en)

---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2018 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
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---------------------- Page: 2 ----------------------
IEC TS 62876-2-1

®


Edition 1.0 2018-08




TECHNICAL



SPECIFICATION



















Nanotechnology – Reliability assessment –

Part 2-1: Nano-enabled photovoltaic devices – Stability test



























INTERNATIONAL

ELECTROTECHNICAL


COMMISSION





ICS 07.120; 27.160 ISBN 978-2-8322-5981-8




  Warning! Make sure that you obtained this publication from an authorized distributor.


® Registered trademark of the International Electrotechnical Commission

---------------------- Page: 3 ----------------------
– 2 – IEC TS 62876-2-1:2018 © IEC 2018
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 9
2 Normative references . 9
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 11
4 General requirements . 11
4.1 Device . 11
4.2 Tests .
...

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