Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

IEC 61000-4-5:2014 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by over-voltages from switching and lightning transients. Several test levels are defined which relate to different environment and installation conditions. These requirements are developed for and are applicable to electrical and electronic equipment. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to surges. The test method documented describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This standard defines a range of:
- test levels;
- test equipment;
- test setups; and
- test procedures. The task of the described laboratory test is to find the reaction of the equipment under test (EUT) under specified operational conditions to surge voltages caused by switching and lightning effects. It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress. Direct injections of lightning currents, i.e. direct lightning strikes, are not considered in this standard. This third edition cancels and replaces the second edition published in 2005, and constitutes a technical revision which includes the following significant technical changes with respect to the previous edition:
- a new Annex E on mathematical modelling of surge waveforms;
- a new Annex F on measurement uncertainty;
- a new Annex G on method of calibration of impulse measuring systems; and
- a new Annex H on coupling/decoupling surges to lines rated above 200 A. Moreover while surge test for ports connected to outside telecommunication lines was addressed in 6.2 of the second edition (IEC 61000-4-5:2005), in this third edition (IEC 61000-4-5:2014) the normative Annex A is fully dedicated to this topic. In particular it gives the specifications of the 10/700 µs combined wave generator. Keywords: electromagnetic compatibility, EMC, TC77, SC77B

Compatibilité électromagnétique (CEM) - Partie 4-5: Techniques d'essai et de mesure - Essai d'immunité aux ondes de choc

L'IEC 61000-4-5:2014 se rapporte aux exigences d'immunité pour les matériels, aux méthodes d'essai et à la gamme des niveaux d'essai recommandés, vis-à-vis des ondes de choc unidirectionnelles provoquées par des surtensions dues aux transitoires de foudre et de man uvre. Elle définit plusieurs niveaux d'essai se rapportant à différentes conditions d'environnement et d'installation. Ces exigences sont développées pour les matériels électriques et électroniques et leur sont applicables. Cette norme a pour objet d'établir une référence commune dans le but d'évaluer l'immunité des matériels électriques et électroniques, quand ils sont soumis à des ondes de choc. La méthode d'essai documentée décrit une méthode cohérente en vue d'évaluer l'immunité d'un matériel ou d'un système vis-à-vis d'un phénomène défini. La présente norme définit:
- une gamme de niveaux d'essai;
- le matériel d'essai;
- les montages d'essai; et
- les procédures d'essai. L'essai de laboratoire décrit ici a pour but de déterminer la réaction du matériel en essai (EUT), dans des conditions opérationnelles spécifiées, aux surtensions dues à la foudre ou à des manoeuvres. Il n'est pas destiné à évaluer la capacité de l'isolation de l'EUT à supporter des tensions élevées. Les injections directes de courants de foudre, par exemple les coups de foudre directs, ne sont pas prises en compte par la présente norme. Cette troisième édition annule et remplace la deuxième édition publiée 2005, et constitue une révision technique qui inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
- une nouvelle Annexe E sur la modélisation mathématique des formes d'ondes de choc;
- une nouvelle Annexe F sur les incertitudes de mesure;
- une nouvelle Annexe G sur la méthode d'étalonnage des systèmes de mesure d'impulsion; et
- une nouvelle Annexe H sur les ondes de choc de couplage/découplage appliquées à des lignes de valeurs assignées supérieures à 200 A. De plus, alors que l'essai à l'onde de choc sur les accès connectés à des lignes de télécommunication extérieures était traité dans le 6.2 de la deuxième édition (IEC 61000-4-5:2005), dans cette troisième édition (IEC 61000-4-5:2014), l'Annexe normative A est complètement dédiée à ce sujet. En particulier elle donne les spécifications du générateur d'onde combinée 10/700 µs. Mots clé: Compatibilité électromagnétique, EMC, CEM, TC77, SC77B

General Information

Status
Published
Publication Date
14-May-2014
Drafting Committee
MT 12 - TC 77/SC 77B/MT 12
Current Stage
PPUB - Publication issued
Start Date
15-May-2014
Completion Date
15-May-2014

Relations

Effective Date
05-Sep-2023
Effective Date
05-Sep-2023
Effective Date
05-Sep-2023

Overview

IEC 61000-4-5:2014 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on electromagnetic compatibility (EMC). This standard addresses testing and measurement techniques specifically for the surge immunity test of electrical and electronic equipment. It defines immunity requirements and test methods to evaluate equipment performance under unidirectional surge conditions caused by switching operations and lightning transients. The standard provides a common framework to assess equipment robustness against such transient over-voltages.

This 2014 edition replaces the 2005 version and includes major revisions such as added annexes on mathematical modeling of surge waveforms, measurement uncertainty, calibration of impulse measuring systems, and surge coupling/decoupling for high-current lines. It also adds a dedicated normative annex addressing surge testing for telecommunication lines connected to outdoor environments.

Key Topics

  • Surge Immunity Requirements: Specifies immunity thresholds equipment must meet to withstand surges typical of over-voltages from switching and lightning.
  • Test Levels: Defines various surge voltage/current waveforms and amplitude levels representing different environmental conditions and installation scenarios.
  • Test Equipment and Setup: Includes detailed specifications for combination wave generators (notably the 1.2/50 µs voltage wave and 8/20 µs current waveforms), coupling/decoupling networks for power and interconnection lines, and test arrangement protocols.
  • Measurement and Calibration: Provides guidance on calibrating surge generators and impulse measuring systems to ensure accurate and repeatable test results.
  • Surge Waveform Modeling: Introduces mathematical models for transient waveforms enhancing simulation accuracy.
  • Measurement Uncertainty: Addresses factors affecting precision in surge measurements and establishes methods to quantify and minimize uncertainties.
  • Specialized Testing: Normative annexes define procedures for testing unshielded outdoor symmetrical communication lines with a 10/700 µs impulse and considerations for lines rated above 200 A.

Applications

IEC 61000-4-5:2014 is crucial for manufacturers, test laboratories, and compliance bodies involved in:

  • Electrical and Electronic Equipment Design: Ensures products such as industrial machinery, consumer electronics, and communication devices meet required surge immunity levels for reliable operation.
  • Quality Assurance Testing: Provides a standard method for assessing equipment resilience against transient over-voltage events during design validation and routine production testing.
  • Installation and System Safety: Helps integrators and engineers implement surge protection strategies in power distribution and telecommunication systems to reduce equipment failures caused by switching surges or indirect lightning strikes.
  • Certification and Compliance: Supports global regulatory compliance by standardizing surge immunity evaluation in line with EMC directives and safety regulations.
  • Research and Development: Offers a foundation for further innovation in EMC testing techniques, including improved simulation, measurement accuracy, and surge mitigation technologies.

Related Standards

  • IEC 61000-4 Series: IEC 61000-4-x standards collectively cover various EMC testing methods, including radiated immunity, electric fast transients, and conducted disturbances.
  • IEC 61000-2-x Series: Defines the environment and installation conditions related to EMC phenomena.
  • IEC 62305 Series: Focuses on lightning protection standards which complement surge immunity testing by addressing direct strikes and protection system design.
  • ISO/IEC 17025: Specifies general requirements for test laboratories performing EMC testing to ensure competence and reliability.
  • Telecommunication EMC Standards: Specific documents addressing immunity of telecommunication equipment to surges often reference IEC 61000-4-5 for test methodologies.

Keywords: electromagnetic compatibility, EMC, surge immunity test, IEC 61000-4-5, combination wave generator, test procedure, over-voltage, switching transients, lightning surge, coupling/decoupling networks, test levels, measurement uncertainty, impulse measuring systems, telecommunication line testing.

Standard

IEC 61000-4-5:2014 - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

English and French language
155 pages
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Standard

IEC 61000-4-5:2014+AMD1:2017 CSV - Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test Released:8/4/2017 Isbn:9782832247068

English and French language
334 pages
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Frequently Asked Questions

IEC 61000-4-5:2014 is a standard published by the International Electrotechnical Commission (IEC). Its full title is "Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test". This standard covers: IEC 61000-4-5:2014 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by over-voltages from switching and lightning transients. Several test levels are defined which relate to different environment and installation conditions. These requirements are developed for and are applicable to electrical and electronic equipment. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to surges. The test method documented describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This standard defines a range of: - test levels; - test equipment; - test setups; and - test procedures. The task of the described laboratory test is to find the reaction of the equipment under test (EUT) under specified operational conditions to surge voltages caused by switching and lightning effects. It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress. Direct injections of lightning currents, i.e. direct lightning strikes, are not considered in this standard. This third edition cancels and replaces the second edition published in 2005, and constitutes a technical revision which includes the following significant technical changes with respect to the previous edition: - a new Annex E on mathematical modelling of surge waveforms; - a new Annex F on measurement uncertainty; - a new Annex G on method of calibration of impulse measuring systems; and - a new Annex H on coupling/decoupling surges to lines rated above 200 A. Moreover while surge test for ports connected to outside telecommunication lines was addressed in 6.2 of the second edition (IEC 61000-4-5:2005), in this third edition (IEC 61000-4-5:2014) the normative Annex A is fully dedicated to this topic. In particular it gives the specifications of the 10/700 µs combined wave generator. Keywords: electromagnetic compatibility, EMC, TC77, SC77B

IEC 61000-4-5:2014 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by over-voltages from switching and lightning transients. Several test levels are defined which relate to different environment and installation conditions. These requirements are developed for and are applicable to electrical and electronic equipment. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to surges. The test method documented describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. This standard defines a range of: - test levels; - test equipment; - test setups; and - test procedures. The task of the described laboratory test is to find the reaction of the equipment under test (EUT) under specified operational conditions to surge voltages caused by switching and lightning effects. It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress. Direct injections of lightning currents, i.e. direct lightning strikes, are not considered in this standard. This third edition cancels and replaces the second edition published in 2005, and constitutes a technical revision which includes the following significant technical changes with respect to the previous edition: - a new Annex E on mathematical modelling of surge waveforms; - a new Annex F on measurement uncertainty; - a new Annex G on method of calibration of impulse measuring systems; and - a new Annex H on coupling/decoupling surges to lines rated above 200 A. Moreover while surge test for ports connected to outside telecommunication lines was addressed in 6.2 of the second edition (IEC 61000-4-5:2005), in this third edition (IEC 61000-4-5:2014) the normative Annex A is fully dedicated to this topic. In particular it gives the specifications of the 10/700 µs combined wave generator. Keywords: electromagnetic compatibility, EMC, TC77, SC77B

IEC 61000-4-5:2014 is classified under the following ICS (International Classification for Standards) categories: 33.100.20 - Immunity. The ICS classification helps identify the subject area and facilitates finding related standards.

IEC 61000-4-5:2014 has the following relationships with other standards: It is inter standard links to IEC 61000-4-5:2014/AMD1:2017, IEC 61000-4-5:2005/COR1:2009, IEC 61000-4-5:2005. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.

You can purchase IEC 61000-4-5:2014 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.

Standards Content (Sample)


IEC 61000-4-5 ®
Edition 3.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-5: Testing and measurement techniques – Surge immunity test

Compatibilité électromagnétique (CEM) –
Partie 4-5: Techniques d'essai et de mesure – Essai d'immunité aux ondes de
choc
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IEC 61000-4-5 ®
Edition 3.0 2014-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-5: Testing and measurement techniques – Surge immunity test

Compatibilité électromagnétique (CEM) –

Partie 4-5: Techniques d'essai et de mesure – Essai d'immunité aux ondes de

choc
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XC
ICS 33.100.20 ISBN 978-2-8322-1532-6

– 2 – IEC 61000-4-5:2014 © IEC 2014
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope and object . 9
2 Normative references . 9
3 Terms, definitions and abbreviations . 10
3.1 Terms and definitions . 10
3.2 Abbreviations . 13
4 General . 13
4.1 Power system switching transients . 13
4.2 Lightning transients . 14
4.3 Simulation of the transients . 14
5 Test levels . 14
6 Test instrumentation . 15
6.1 General . 15
6.2 1,2/50 µs combination wave generator . 15
6.2.1 General . 15
6.2.2 Performance characteristics of the generator . 16
6.2.3 Calibration of the generator . 18
6.3 Coupling/decoupling networks . 19
6.3.1 General . 19
6.3.2 Coupling/decoupling networks for a.c./d.c. power port rated up
to 200 A per line . 20
6.3.3 Coupling/decoupling networks for interconnection lines . 24
6.4 Calibration of coupling/decoupling networks . 27
6.4.1 General . 27
6.4.2 Calibration of CDNs for a.c./d.c. power port rated up to 200 A
per line . 27
6.4.3 Calibration of CDNs for interconnection lines . 28
7 Test setup . 30
7.1 Test equipment . 30
7.2 Verification of the test instrumentation . 31
7.3 Test setup for surges applied to EUT power ports . 31
7.4 Test setup for surges applied to unshielded unsymmetrical
interconnection lines . 32
7.5 Test setup for surges applied to unshielded symmetrical interconnection
lines . 32
7.6 Test setup for surges applied to shielded lines . 32
8 Test procedure . 33
8.1 General . 33
8.2 Laboratory reference conditions . 34
8.2.1 Climatic conditions . 34
8.2.2 Electromagnetic conditions . 34
8.3 Execution of the test . 34
9 Evaluation of test results . 35
10 Test report . 35

Annex A (normative) Surge testing for unshielded outdoor symmetrical communication
lines intended to interconnect to widely dispersed systems . 37
A.1 General . 37
A.2 10/700 µs combination wave generator . 37
A.2.1 Characteristics of the generator . 37
A.2.2 Performances of the generator . 38
A.2.3 Calibration of the generator . 40
A.3 Coupling/decoupling networks . 40
A.3.1 General . 40
A.3.2 Coupling/decoupling networks for outdoor communication

lines . 41
A.4 Calibration of coupling/decoupling networks . 41
A.5 Test setup for surges applied to outdoor unshielded symmetrical
communication lines . 42
Annex B (informative) Selection of generators and test levels . 44
B.1 General . 44
B.2 The classification of environments . 44
B.3 The definition of port types. 44
B.4 Generators and surge types . 45
B.5 Tables. 45
Annex C (informative) Explanatory notes . 47
C.1 Different source impedance . 47
C.2 Application of the tests . 47
C.2.1 Equipment level immunity . 47
C.2.2 System level immunity . 47
C.3 Installation classification . 48
C.4 Minimum immunity level of ports connected to the a.c./d.c. mains supply . 49
C.5 Equipment level immunity of ports connected to interconnection lines . 49
Annex D (informative) Considerations for achieving immunity for equipment
connected to low voltage power distribution systems . 51
Annex E (informative) Mathematical modelling of surge waveforms . 53
E.1 General . 53
E.2 Normalized time domain voltage surge (1,2/50 µs) . 54
E.3 Normalized time domain current surge (8/20 µs) . 55
E.4 Normalized time domain voltage surge (10/700 µs) . 57
E.5 Normalized time domain current surge (5/320 µs) . 59
Annex F (informative) Measurement uncertainty (MU) considerations . 62
F.1 Legend . 62
F.2 General . 62
F.3 Uncertainty contributors to the surge measurement uncertainty . 63
F.4 Uncertainty of surge calibration . 63
F.4.1 General . 63
F.4.2 Front time of the surge open-circuit voltage . 63
F.4.3 Peak of the surge open-circuit voltage . 65
F.4.4 Duration of the surge open-circuit voltage . 66
F.4.5 Further MU contributions to time and amplitude
measurements . 67
F.4.6 Rise time distortion due to the limited bandwidth of the

measuring system . 67

– 4 – IEC 61000-4-5:2014 © IEC 2014
F.4.7 Impulse peak and width distortion due to the limited
bandwidth of the measuring system . 68
F.5 Application of uncertainties in the surge generator compliance criterion . 69
Annex G (informative) Method of calibration of impulse measuring systems . 70
G.1 General . 70
G.2 Estimation of measuring system response using the convolution integral . 70
G.3 Impulse measuring system for open-circuit voltage (1,2/50 µs, 10/700 µs) . 71
G.4 Impulse measuring system for short-circuit current (8/20 µs, 5/320 µs) . 71
Annex H (informative) Coupling/decoupling surges to lines rated above 200 A . 73
H.1 General . 73
H.2 Considerations of coupling and decoupling . 73
H.3 Additional precautions . 74
Bibliography . 75

Figure 1 – Simplified circuit diagram of the combination wave generator . 16
Figure 2 – Waveform of open-circuit voltage (1,2/50 µs) at the output of the generator
with no CDN connected . 17
Figure 3 – Waveform of short-circuit current (8/20 µs) at the output of the generator
with no CDN connected . 18
Figure 4 – Selection of coupling/decoupling method. 20
Figure 5 – Example of coupling network and decoupling network for capacitive
coupling on a.c./d.c. lines line-to-line coupling . 22
Figure 6 – Example of coupling network and decoupling network for capacitive
coupling on a.c./d.c. lines: line-to-ground coupling . 23
Figure 7 – Example of coupling network and decoupling network for capacitive
coupling on a.c. lines (3 phases): line L2-to-line L3 coupling . 23
Figure 8 – Example of coupling network and decoupling network for capacitive
coupling on a.c. lines (3 phases): line L3-to-ground coupling . 24
Figure 9 – Example of coupling network and decoupling network for unshielded
unsymmetrical interconnection lines: line-to-line and line-to-ground coupling . 25
Figure 10 – Example of coupling and decoupling network for unshielded symmetrical
interconnection lines: lines-to-ground coupling . 26
Figure 11 – Example of coupling and decoupling network for unshielded symmetrical
interconnection lines: lines-to-ground coupling via capacitors . 27
Figure 12 – Example of test setup for surges applied to shielded lines . 33
Figure A.1 – Simplified circuit diagram of the combination wave generator (10/700 µs
– 5/320 µs) . 38
Figure A.2 – Waveform of open-circuit voltage (10/700 µs) . 39
Figure A.3 – Waveform of the 5/320 µs short-circuit current waveform . 39
Figure A.4 – Example of test setup for unshielded outdoor symmetrical communication
lines: lines-to-ground coupling, coupling via gas arrestors (primary protection fitted) . 41
Figure E.1 – Voltage surge (1,2/50 µs): width time response T . 54
w
Figure E.2 – Voltage surge (1,2/50 µs): rise time response T . 55
Figure E.3 – Voltage surge (1,2/50 µs): spectral response with ∆f = 3,333 kHz . 55
Figure E.4 – Current surge (8/20 µs): width time response T . 56
w
Figure E.5 – Current surge (8/20 µs): rise time response T . 57
r
Figure E.6 – Current surge (8/20 µs): spectral response with ∆f = 10 kHz . 57

Figure E.7 – Voltage surge (10/700 µs): width time response T . 58
w
Figure E.8 – Voltage surge (10/700 µs): rise time response T . 59
Figure E.9 – Voltage surge (10/700 µs): spectral response with ∆f = 0,2 kHz . 59
Figure E.10 – Current surge (5/320 µs): width time response T . 60
w
Figure E.11 – Current surge (5/320 µs): rise time response T . 61
r
Figure E.12 – Current surge (5/320 µs): spectral response with ∆f = 0,4 kHz . 61
Figure G.1 – Simplified circuit diagram of the current step generator . 72

Table 1 – Test levels. 15
Table 2 – Definitions of the waveform parameters 1,2/50 µs and 8/20 µs . 17
Table 3 – Relationship between peak open-circuit voltage and peak short-circuit
current . 17
Table 4 – Voltage waveform specification at the EUT port of the CDN . 21
Table 5 – Current waveform specification at the EUT port of the CDN. 21
Table 6 – Relationship between peak open-circuit voltage and peak short-circuit
current at the EUT port of the CDN . 22
Table 7 – Summary of calibration process for CDNs for unsymmetrical interconnection

lines . 28
Table 8 – Surge waveform specifications at the EUT port of the CDN for unsymmetrical
interconnection lines . 29
Table 9 – Summary of calibration process for CDNs for symmetrical interconnection
lines . 30
Table 10 – Surge waveform specifications at the EUT port of the CDN for symmetrical

interconnection lines . 30
Table A.1 – Definitions of the waveform parameters 10/700 µs and 5/320 µs . 39
Table A.2 – Relationship between peak open-circuit voltage and peak short-circuit
current . 40
Table A.3 – Summary of calibration process for CDNs for unshielded outdoor
symmetrical communication lines . 42
Table A.4 – Surge waveform specifications at the EUT port of the CDN for unshielded
outdoor symmetrical communication lines . 42
Table B.1 – Power ports: selection of the test levels (depending on the installation
class) . 45
Table B.2 – Circuits/lines: selection of the test levels (depending on the installation
class) . 46
Table F.1 – Example of uncertainty budget for surge open-circuit voltage front time
(T ) . 64
fV
Table F.2 – Example of uncertainty budget for surge open-circuit voltage peak value

(V ) . 65
P
Table F.3 – Example of uncertainty budget for surge open-circuit voltage duration (T ) . 66
d
Table F.4 – α factor, Equation (F.5), of different unidirectional impulse responses
corresponding to the same bandwidth of the system B . 68
Table F.5 – β factor, Equation (F.9), of the standard surge waveforms . 69
Table H.1 – Recommended inductance values for decoupling lines (> 200 A) . 73

– 6 – IEC 61000-4-5:2014 © IEC 2014
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
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ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-5: Testing and measurement techniques –
Surge immunity test
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
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3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-5 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical Committee 77: Electromagnetic compatibility.
It forms Part 4-5 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This third edition cancels and replaces the second edition published in 2005, and constitutes
a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) new Annex E on mathematical modelling of surge waveforms;
b) new Annex F on measurement uncertainty;
c) new Annex G on method of calibration of impulse measuring systems;

d) new Annex H on coupling/decoupling surges to lines rated above 200 A;
e) moreover while surge test for ports connected to outside telecommunication lines was
addressed in 6.2 of the second edition (IEC 61000-4-5:2005), in this third edition
(IEC 61000-4-5:2014) the normative Annex A is fully dedicated to this topic. In particular it
gives the specifications of the 10/700 µs combined wave generator.
The text of this standard is based on the following documents:
FDIS Report on voting
77B/711/FDIS 77B/715/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 8 – IEC 61000-4-5:2014 © IEC 2014
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (insofar as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an International Standard which gives immunity requirements and test procedures
related to surge voltages and surge currents.

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-5: Testing and measurement techniques –
Surge immunity test
1 Scope and object
This part of IEC 61000 relates to the immunity requirements, test methods, and range of
recommended test levels for equipment with regard to unidirectional surges caused by over-
voltages from switching and lightning transients. Several test levels are defined which relate
to different environment and installation conditions. These requirements are developed for
and are applicable to electrical and electronic equipment.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to surges. The test method documented in
this part of IEC 61000 describes a consistent method to assess the immunity of an equipment
or system against a defined phenomenon.
NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity
test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and
performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity test levels for their products.
This standard defines:
– a range of test levels;
– test equipment;
– test setups;
– test procedures.
The task of the described laboratory test is to find the reaction of the equipment under test
(EUT) under specified operational conditions to surge voltages caused by switching and
lightning effects.
It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress.
Direct injections of lightning currents, i.e. direct lightning strikes, are not considered in this
standard.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV) (available at
www.electropedia.org)
– 10 – IEC 61000-4-5:2014 © IEC 2014
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050 as well as
the following apply.
3.1.1
avalanche device
diode, gas tube arrestor, or other component that is designed to break down and conduct at a
specified voltage
3.1.2
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
Note 1 to entry: This term is based on the "uncertainty" approach.
Note 2 to entry: The relationship between the indications and the results of measurement can be expressed, in
principle, by a calibration diagram.
[SOURCE: IEC 60050-311:2001, 311-01-09]
3.1.3
clamping device
diode, varistor or other component that is designed to prevent an applied voltage from
exceeding a specified value
3.1.4
combination wave generator
CWG
generator with 1,2/50 µs or 10/700 µs open-circuit voltage waveform and respectively 8/20 µs
or 5/320 µs short-circuit current waveform
3.1.5
coupling network
CN
electrical circuit for the purpose of transferring energy from one circuit to another
3.1.6
coupling/decoupling network
CDN
combination of a coupling network and a decoupling network
3.1.7
decoupling network
DN
electrical circuit for the purpose of preventing surges applied to the EUT from affecting other
devices, equipment or systems which are not under test
3.1.8
duration
3.1.8.1
duration
T
d
time interval between the instant at which the surge voltage rises to 0,5 of its
peak value, and then falls to 0,5 of its peak value (T )
w
T = T
d w
SEE: Figures 2 and A.2
3.1.8.2
duration
T
d
virtual parameter defined as the time interval between the instant
at which the surge current rises to 0,5 of its peak value, and then falls to 0,5 of its peak value
(T ), multiplied by 1,18
w
T = 1,18 × T
d w
SEE: Figure 3.
3.1.8.3
duration
T
d
time interval between the instant at which the surge current rises
to 0,5 of its peak value, and then falls to 0,5 of its peak value (T )
w
T = T
d w
SEE: Figure A.3.
3.1.9
effective output impedance
ratio of the peak open-circuit voltage to the peak short-circuit current at the
same output port
3.1.10
electrical installation
assembly of associated electrical equipment having co-ordinated characteristics to fulfil
purposes
[SOURCE: IEC 60050-826:2004, 826-10-01]
3.1.11
front time
3.1.11.1
front time
T
f
virtual parameter defined as 1,67 times the interval T between the instants
when the impulse is 30 % and 90 % of the peak value
SEE: Figures 2 and A.2.
3.1.11.2
front time
T
f
virtual parameter defined as 1,25 times the interval T between the instants
r
when the impulse is 10 % and 90 % of the peak value
SEE: Figures 3 and A.3.
3.1.12
high-speed communication lines
input/output lines which operate at transmission frequencies above 100 kHz

– 12 – IEC 61000-4-5:2014 © IEC 2014
3.1.13
immunity
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.1.14
interconnection lines
I/O lines (input/output lines) and/or communication lines and/or low voltage d.c. input/output
lines (≤ 60 V), where secondary circuits (isolated from the a.c. mains supply) are not subject
to transient over-voltages (i.e. reliably-grounded, capacitively-filtered d.c. secondary circuits
where the peak-to-peak ripple is less than 10 % of the d.c. component)
3.1.15
power port
port, at which the conductor or cable carrying the primary electrical power needed for the
operation (functioning) of an apparatus or associated apparatus is connected to the apparatus
3.1.16
primary protection
means by which the majority of stressful energy is prevented from propagating beyond a
designated interface
3.1.17
reference ground
part of the Earth considered as conductive, the electrical potential of which is conventionally
taken as zero, being outside the zone of influence of any earthing (grounding) arrangement
[SOURCE: IEC 60050-195:1998, 195-01-01]
3.1.18
rise time
T
r
interval of time between the instants at which the instantaneous value of an impulse first
reaches 10 % value and then 90 % value
SEE: Figures 3 and A.3.
[SOURCE: IEC 60050-161:1990, 161-02-05, modified – the content of the note has been
included in the definition and “pulse” has been changed to “impulse”.]
3.1.19
secondary protection
means by which the let-through energy from primary protection is suppressed
Note 1 to entry: It may be a special device or an inherent characteristic of the EUT.
3.1.20
surge
transient wave of electrical current, voltage or power propagating along a line or a circuit and
characterized by a rapid increase followed by a slower decrease
[SOURCE: IEC 60050-161:1990, 161-08-11, modified – “surge” here applies to voltage,
current and power]
3.1.21
symmetrical lines
pair of symmetrically driven conductors with a conversion loss from differential to common
mode of greater than 20 dB
3.1.22
system
set of interdependent elements constituted to achieve a given objective by performing a
specified function
Note 1 to entry: The system is considered to be separated from the environment and other external systems by an
imaginary surface which cuts the links between them and the considered system. Through these links, the system
is affected by the environment, is acted upon by the external systems, or acts itself on the environment or the
external systems.
3.1.23
transient, adjective and noun
pertaining to or designating a phenomenon or a quantity which varies between two
consecutive steady states during a time interval short compared to the time scale of interest
[SOURCE: IEC 60050-161:1990, 161-02-01]
3.1.24
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and its interconnecting cables) to demonstrate that the test system is functioning
Note 1 to entry: The methods used for verification may be different from those used for calibration.
Note 2 to entry: For the purposes of this basic EMC standard this definition is different from the definition given in
IEC 60050-311:2001, 311-01-13.
3.2 Abbreviations
AE Auxiliary equipment
CD Coupling device
CDN Coupling/decoupling network
CLD Clamping device
CN Coupling network
CWG Combination wave generator
DN Decoupling network
EFT/B Electrical fast transient/burst
EMC Electromagnetic compatibility
ESD Electrostatic discharge
EUT Equipment under test
GDT Gas discharge tube
MU Measurement uncertainty
PE Protective earth
SPD Surge protective device
4 General
4.1 Power system switching transients
Power system switching transients can be separated into transients associated with:

– 14 – IEC 61000-4-5:2014 © IEC 2014
a) major power system switching disturbances, such as capacitor bank switching;
b) minor local switching activity or load changes in the power distribution system;
c) resonating circuits associated with switching devices, e.g. thyristors, transistors;
d) various system faults, such as short-circuits and arcing faults to the grounding system of
the installation.
4.2 Lightning transients
The major mechanisms by which lightning produces surge voltages are the following:
a) direct lightning stroke to an external (outdoor) circuit injecting high currents that produce
voltages by either flowing through ground resistance or flowing through the impedance of
the external circuit;
b) indirect lightning stroke (i.e. a stroke between or within clouds or to nearby objects which
produces electromagnetic fields) that induces voltages/currents on the conductors outside
and/or inside a building;
c) lightning ground current flow resulting from nearby direct-to-earth discharges coupling into
the common ground pa
...


IEC 61000-4-5 ®
Edition 3.1 2017-08
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –
Part 4-5: Testing and measurement techniques – Surge immunity test

Compatibilité électromagnétique (CEM) –
Partie 4-5: Techniques d'essai et de mesure – Essai d'immunité aux ondes
de choc
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IEC 61000-4-5 ®
Edition 3.1 2017-08
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE
Electromagnetic compatibility (EMC) –

Part 4-5: Testing and measurement techniques – Surge immunity test

Compatibilité électromagnétique (CEM) –

Partie 4-5: Techniques d'essai et de mesure – Essai d'immunité aux ondes

de choc
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-4706-8

IEC 61000-4-5 ®
Edition 3.1 2017-08
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE
Electromagnetic compatibility (EMC) –

Part 4-5: Testing and measurement techniques – Surge immunity test

Compatibilité électromagnétique (CEM) –
Partie 4-5: Techniques d'essai et de mesure – Essai d'immunité aux ondes
de choc
– 2 – IEC 61000-4-5:2014+AMD1:2017 CSV
© IEC 2017
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
INTRODUCTION to the amendment . 10
1 Scope and object . 11
2 Normative references . 11
3 Terms, definitions and abbreviations . 12
3.1 Terms and definitions . 12
3.2 Abbreviations . 15
4 General . 16
4.1 Power system switching transients . 16
4.2 Lightning transients . 16
4.3 Simulation of the transients . 16
5 Test levels . 16
6 Test instrumentation . 17
6.1 General . 17
6.2 1,2/50 µs combination wave generator . 17
6.2.1 General . 17
6.2.2 Performance characteristics of the generator . 18
6.2.3 Calibration of the generator . 20
6.3 Coupling/decoupling networks . 21
6.3.1 General . 21
6.3.2 Coupling/decoupling networks for a.c./d.c. power port rated up
to 200 A per line . 22
6.3.3 Coupling/decoupling networks for interconnection lines . 26
6.4 Calibration of coupling/decoupling networks . 29
6.4.1 General . 29
6.4.2 Calibration of CDNs for a.c./d.c. power port rated up to 200 A
per line . 30
6.4.3 Calibration of CDNs for interconnection lines . 30
7 Test setup . 33
7.1 Test equipment . 33
7.2 Verification of the test instrumentation . 33
7.3 Test setup for surges applied to EUT power ports . 34
7.4 Test setup for surges applied to unshielded unsymmetrical
interconnection lines . 34
7.5 Test setup for surges applied to unshielded symmetrical interconnection
lines . 34
7.6 Test setup for surges applied to shielded lines . 35
8 Test procedure . 36
8.1 General . 36
8.2 Laboratory reference conditions . 36
8.2.1 Climatic conditions . 36
8.2.2 Electromagnetic conditions . 36
8.3 Execution of the test . 37
9 Evaluation of test results . 38
10 Test report . 38

© IEC 2017
Annex A (normative) Surge testing for unshielded outdoor symmetrical communication
lines intended to interconnect to widely dispersed systems . 40
A.1 General . 40
A.2 10/700 µs combination wave generator . 40
A.2.1 Characteristics of the generator . 40
A.2.2 Performances of the generator . 41
A.2.3 Calibration of the generator . 43
A.3 Coupling/decoupling networks . 43
A.3.1 General . 43
A.3.2 Coupling/decoupling networks for outdoor communication

lines . 44
A.4 Calibration of coupling/decoupling networks . 44
A.5 Test setup for surges applied to outdoor unshielded symmetrical
communication lines . 45
Annex B (informative) Selection of generators and test levels . 47
B.1 General . 47
B.2 The classification of environments . 47
B.3 The definition of port types. 47
B.4 Generators and surge types . 48
B.5 Tables. 48
Annex C (informative) Explanatory notes . 50
C.1 Different source impedance . 50
C.2 Application of the tests . 50
C.2.1 Equipment level immunity . 50
C.2.2 System level immunity . 50
C.3 Installation classification . 51
C.4 Minimum immunity level of ports connected to the a.c./d.c. mains supply . 52
C.5 Equipment level immunity of ports connected to interconnection lines . 52
Annex D (informative) Considerations for achieving immunity for equipment
connected to low voltage power distribution systems . 54
Annex E (informative) Mathematical modelling of surge waveforms . 56
E.1 General . 56
E.2 Normalized time domain voltage surge (1,2/50 µs) . 57
E.3 Normalized time domain current surge (8/20 µs) . 58
E.4 Normalized time domain voltage surge (10/700 µs) . 60
E.5 Normalized time domain current surge (5/320 µs) . 62
Annex F (informative) Measurement uncertainty (MU) considerations . 65
F.1 Legend . 65
F.2 General . 65
F.3 Uncertainty contributors to the surge measurement uncertainty . 66
F.4 Uncertainty of surge calibration . 66
F.4.1 General . 66
F.4.2 Front time of the surge open-circuit voltage . 66
F.4.3 Peak of the surge open-circuit voltage . 68
F.4.4 Duration of the surge open-circuit voltage . 69
F.4.5 Further MU contributions to time and amplitude
measurements . 70
F.4.6 Rise time distortion due to the limited bandwidth of the

measuring system . 70

– 4 – IEC 61000-4-5:2014+AMD1:2017 CSV
© IEC 2017
F.4.7 Impulse peak and width distortion due to the limited
bandwidth of the measuring system . 71
F.5 Application of uncertainties in the surge generator compliance criterion . 72
Annex G (informative) Method of calibration of impulse measuring systems . 73
G.1 General . 73
G.2 Estimation of measuring system response using the convolution integral . 73
G.3 Impulse measuring system for open-circuit voltage (1,2/50 µs, 10/700 µs) . 74
G.4 Impulse measuring system for short-circuit current (8/20 µs, 5/320 µs) . 74
Annex H (informative) Coupling/decoupling surges to lines rated above 200 A . 76
H.1 General . 76
H.2 Considerations of coupling and decoupling . 76
H.3 Additional precautions . 77
Annex I (informative) Issues relating to powering EUTs having DC/DC converters
at the input . 78
I.1 General . 78
I.2 Considerations for remediation . 79
Bibliography . 80

Figure 1 – Simplified circuit diagram of the combination wave generator . 18
Figure 2 – Waveform of open-circuit voltage (1,2/50 µs) at the output of the generator
with no CDN connected . 19
Figure 3 – Waveform of short-circuit current (8/20 µs) at the output of the generator
with no CDN connected . 20
Figure 4 – Selection of coupling/decoupling method. 22
Figure 5 – Example of coupling network and decoupling network for capacitive
coupling on a.c./d.c. lines line-to-line coupling . 24
Figure 6 – Example of coupling network and decoupling network for capacitive
coupling on a.c./d.c. lines: line-to-ground coupling . 25
Figure 7 – Example of coupling network and decoupling network for capacitive
coupling on a.c. lines (3 phases): line L2-to-line L3 coupling . 25
Figure 8 – Example of coupling network and decoupling network for capacitive
coupling on a.c. lines (3 phases): line L3-to-ground coupling . 26
Figure 9 – Example of coupling network and decoupling network for unshielded
unsymmetrical interconnection lines: line-to-line and line-to-ground coupling . 27
Figure 10 – Example of coupling and decoupling network for unshielded symmetrical
interconnection lines: lines-to-ground coupling . 28
Figure 11 – Example of coupling and decoupling network for unshielded symmetrical
interconnection lines: lines-to-ground coupling via capacitors . 29
Figure 12 – Example of test setup for surges applied to shielded lines . 36
Figure A.1 – Simplified circuit diagram of the combination wave generator (10/700 µs
– 5/320 µs) . 41
Figure A.2 – Waveform of open-circuit voltage (10/700 µs) . 42
Figure A.3 – Waveform of the 5/320 µs short-circuit current waveform . 42
Figure A.4 – Example of test setup for unshielded outdoor symmetrical communication
lines: lines-to-ground coupling, coupling via gas arrestors (primary protection fitted) . 44
Figure E.1 – Voltage surge (1,2/50 µs): width time response T . 57
w
Figure E.2 – Voltage surge (1,2/50 µs): rise time response T . 58
Figure E.3 – Voltage surge (1,2/50 µs): spectral response with ∆f = 3,333 kHz . 58

© IEC 2017
Figure E.4 – Current surge (8/20 µs): width time response T . 59
w
Figure E.5 – Current surge (8/20 µs): rise time response T . 60
r
Figure E.6 – Current surge (8/20 µs): spectral response with ∆f = 10 kHz . 60
Figure E.7 – Voltage surge (10/700 µs): width time response T . 61
w
Figure E.8 – Voltage surge (10/700 µs): rise time response T . 62
Figure E.9 – Voltage surge (10/700 µs): spectral response with ∆f = 0,2 kHz . 62
Figure E.10 – Current surge (5/320 µs): width time response T . 63
w
Figure E.11 – Current surge (5/320 µs): rise time response T . 64
r
Figure E.12 – Current surge (5/320 µs): spectral response with ∆f = 0,4 kHz . 64
Figure G.1 – Simplified circuit diagram of the current step generator . 75
Figure I.1 – Example of adding a damping circuit to the CDN for DC/DC converter
EUTs . 79

Table 1 – Test levels. 17
Table 2 – Definitions of the waveform parameters 1,2/50 µs and 8/20 µs . 19
Table 3 – Relationship between peak open-circuit voltage and peak short-circuit
current . 19
Table 4 – Voltage waveform specification at the EUT port of the CDN . 23
Table 5 – Current waveform specification at the EUT port of the CDN. 23
Table 6 – Relationship between peak open-circuit voltage and peak short-circuit
current at the EUT port of the CDN . 24
Table 7 – Summary of calibration process for CDNs for unsymmetrical interconnection
lines . 31
Table 8 – Surge waveform specifications at the EUT port of the CDN for unsymmetrical
interconnection lines . 31
Table 9 – Summary of calibration process for CDNs for symmetrical interconnection
lines . 32
Table 10 – Surge waveform specifications at the EUT port of the CDN for symmetrical
interconnection lines . 33
Table A.1 – Definitions of the waveform parameters 10/700 µs and 5/320 µs . 42
Table A.2 – Relationship between peak open-circuit voltage and peak short-circuit
current . 43
Table A.3 – Summary of calibration process for CDNs for unshielded outdoor

symmetrical communication lines . 45
Table A.4 – Surge waveform specifications at the EUT port of the CDN for unshielded
outdoor symmetrical communication lines . 45
Table B.1 – Power ports: selection of the test levels (depending on the installation
class) . 48
Table B.2 – Circuits/lines: selection of the test levels (depending on the installation

class) . 49
Table F.1 – Example of uncertainty budget for surge open-circuit voltage front time
(T ) . 67
fV
Table F.2 – Example of uncertainty budget for surge open-circuit voltage peak value
(V ) . 68
P
Table F.3 – Example of uncertainty budget for surge open-circuit voltage duration (T ) . 69
d
Table F.4 – α factor, Equation (F.5), of different unidirectional impulse responses
corresponding to the same bandwidth of the system B . 71

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© IEC 2017
Table F.5 – β factor, Equation (F.9), of the standard surge waveforms . 72
Table H.1 – Recommended inductance values for decoupling lines (> 200 A) . 76

© IEC 2017
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-5: Testing and measurement techniques –
Surge immunity test
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
This consolidated version of the official IEC Standard and its amendment has been prepared
for user convenience.
IEC 61000-4-5 edition 3.1 contains the third edition (2014-05) [documents 77B/711/FDIS and
77B/715/RVD] and its amendment 1 (2017-08) [documents 77B/762/CDV and 77B/773/RVC].
In this Redline version, a vertical line in the margin shows where the technical content is
modified by amendment 1. Additions are in green text, deletions are in strikethrough red text.
A separate Final version with all changes accepted is available in this publication.

– 8 – IEC 61000-4-5:2014+AMD1:2017 CSV
© IEC 2017
International Standard IEC 61000-4-5 has been prepared by subcommittee 77B: High
frequency phenomena, of IEC technical Committee 77: Electromagnetic compatibility.
It forms Part 4-5 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
This third edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) new Annex E on mathematical modelling of surge waveforms;
b) new Annex F on measurement uncertainty;
c) new Annex G on method of calibration of impulse measuring systems;
d) new Annex H on coupling/decoupling surges to lines rated above 200 A;
e) moreover while surge test for ports connected to outside telecommunication lines was
addressed in 6.2 of the second edition (IEC 61000-4-5:2005), in this third edition
(IEC 61000-4-5:2014) the normative Annex A is fully dedicated to this topic. In particular it
gives the specifications of the 10/700 µs combined wave generator.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of the base publication and its amendment will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
© IEC 2017
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (insofar as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as international standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: IEC 61000-6-1).
This part is an International Standard which gives immunity requirements and test procedures
related to surge voltages and surge currents.

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© IEC 2017
INTRODUCTION to the amendment
Rationale:
The method for testing DC products in the current revision of IEC61000-4-5 is causing many
field related problems for test labs and manufacturers. Many products will not power up
through the power CDN in the standard and in some cases may be damaged by the
inductance that is necessary to apply the surge (see 77B/734/DC for further information).
The DC./DC converter problem is related to the switching of the converter which produces a
voltage drop at the decoupling inductors on one hand and oscillations produced by the EUT
impedance in combination with the source on the other hand. Measurements were performed
using different brands of CDNs with a device known to show that problem as an EUT. The
result shows different oscillations and signal forms of the voltage at the EUT for different
CDNs. According to the outcome, the use of a CDN with a higher current rating (i.e. smaller
decoupling inductivity) can solve the problem. At the meeting of SC77B/MT12 in Akishima,
Japan on August 26, 2016, it was decided to add a statement into 7.3 allowing surge tests
with higher current rated CDNs and to add a new Annex I to explain the problem in detail.

© IEC 2017
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-5: Testing and measurement techniques –
Surge immunity test
1 Scope and object
This part of IEC 61000 relates to the immunity requirements, test methods, and range of
recommended test levels for equipment with regard to unidirectional surges caused by over-
voltages from switching and lightning transients. Several test levels are defined which relate
to different environment and installation conditions. These requirements are developed for
and are applicable to electrical and electronic equipment.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to surges. The test method documented in
this part of IEC 61000 describes a consistent method to assess the immunity of an equipment
or system against a defined phenomenon.
NOTE As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC.
As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity
test standard is applied or not, and if applied, they are responsible for determining the appropriate test levels and
performance criteria. TC 77 and its sub-committees are prepared to co-operate with product committees in the
evaluation of the value of particular immunity test levels for their products.
This standard defines:
– a range of test levels;
– test equipment;
– test setups;
– test procedures.
The task of the described laboratory test is to find the reaction of the equipment under test
(EUT) under specified operational conditions to surge voltages caused by switching and
lightning effects.
It is not intended to test the capability of the EUT's insulation to withstand high-voltage stress.
Direct injections of lightning currents, i.e. direct lightning strikes, are not considered in this
standard.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60050 (all parts), International Electrotechnical Vocabulary (IEV) (available at
www.electropedia.org)
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© IEC 2017
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050 as well as
the following apply.
3.1.1
avalanche device
diode, gas tube arrestor, or other component that is designed to break down and conduct at a
specified voltage
3.1.2
calibration
set of operations which establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
Note 1 to entry: This term is based on the "uncertainty" approach.
Note 2 to entry: The relationship between the indications and the results of measurement can be expressed, in
principle, by a calibration diagram.
[SOURCE: IEC 60050-311:2001, 311-01-09]
3.1.3
clamping device
diode, varistor or other component that is designed to prevent an applied voltage from
exceeding a specified value
3.1.4
combination wave generator
CWG
generator with 1,2/50 µs or 10/700 µs open-circuit voltage waveform and respectively 8/20 µs
or 5/320 µs short-circuit current waveform
3.1.5
coupling network
CN
electrical circuit for the purpose of transferring energy from one circuit to another
3.1.6
coupling/decoupling network
CDN
combination of a coupling network and a decoupling network
3.1.7
decoupling network
DN
electrical circuit for the purpose of preventing surges applied to the EUT from affecting other
devices, equipment or systems which are not under test
3.1.8
duration
3.1.8.1
duration
T
d
time interval between the instant at which the surge voltage rises to 0,5 of its
peak value, and then falls to 0,5 of its peak value (T )
w
© IEC 2017
T = T
d w
SEE: Figures 2 and A.2
3.1.8.2
duration
T
d
virtual parameter defined as the time interval between the instant
at which the surge current rises to 0,5 of its peak value, and then falls to 0,5 of its peak value
(T ), multiplied by 1,18
w
T = 1,18 × T
d w
SEE: Figure 3.
3.1.8.3
duration
T
d
time interval between the instant at which the surge current rises
to 0,5 of its peak value, and then falls to 0,5 of its peak value (T )
w
T = T
d w
SEE: Figure A.3.
3.1.9
effective output impedance
ratio of the peak open-circuit voltage to the peak short-circuit current at the
same output port
3.1.10
electrical installation
assembly of associated electrical equipment having co-ordinated characteristics to fulfil
purposes
[SOURCE: IEC 60050-826:2004, 826-10-01]
3.1.11
front time
3.1.11.1
front time
T
f
virtual parameter defined as 1,67 times the interval T between the instants
when the impulse is 30 % and 90 % of the peak value
SEE: Figures 2 and A.2.
3.1.11.2
front time
T
f
virtual parameter defined as 1,25 times the interval T between the instants
r
when the impulse is 10 % and 90 % of the peak value
SEE: Figures 3 and A.3.
3.1.12
high-speed communication lines
input/output lines which operate at transmission frequencies above 100 kHz

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© IEC 2017
3.1.13
immunity
ability of a device, equipment or system to perform without degradation in the presence of an
electromagnetic disturbance
[SOURCE: IEC 60050-161:1990, 161-01-20]
3.1.14
interconnection lines
I/O lines (input/output lines) and/or communication lines and/or low voltage d.c. input/output
lines (≤ 60 V), where secondary circuits (isolated from the a.c. mains supply) are not subject
to transient over-voltages (i.e. reliably-grounded, capacitively-filtered d.c. secondary circuits
where the peak-to-peak ripple is less than 10 % of the d.c. component)
3.1.15
power port
port, at which the conductor or cable carrying the primary electrical power needed for the
operation (functioning) of an apparatus or associated apparatus is connected to the apparatus
3.1.16
primary protection
means by which the majority of stressful energy is prevented from propagating beyond a
designated interface
3.1.17
reference ground
part of the Earth considered as conductive, the electrical potential of which is conventionally
taken as zero, being outside the zone of influence of any earthing (grounding) arrangement
[SOURCE: IEC 60050-195:1998, 195-01-01]
3.1.18
rise time
T
r
interval of time between the instants at which the instantaneous value of an impulse first
reaches 10 % value and then 90 % value
SEE: Figures 3 and A.3.
[SOURCE: IEC 60050-161:1990, 161-02-05, modified – the content of the note has been
included in the definition and “pulse” has been changed to “impulse”.]
3.1.19
secondary protection
means by which the let-through energy from primary protection is suppressed
Note 1 to entry: It may be a special device or an inherent characteristic of the EUT.
3.1.20
surge
transient wave of electrical current, voltage or power propagating along a line or a circuit and
characterized by a rapid increase followed by a slower decrease
[SOURCE: IEC 60050-161:1990, 161-
...

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Die Norm IEC 61000-4-5:2014 beschäftigt sich mit der elektromagnetischen Verträglichkeit (EMC) und legt spezifische Prüf- und Messmethoden für die Surge-Immunität von elektrischen und elektronischen Geräten fest. Gegenstand dieser Norm sind die Anforderungen an die Immunität, die Prüfmethoden sowie die empfohlenen Prüfpegel in Bezug auf unidirektionale Überspannungen, die durch Schaltvorgänge und Blitzeinschläge verursacht werden. Stärken der Norm liegen in der klaren Definition verschiedener Prüfpegel, die auf unterschiedliche Umwelt- und Installationsbedingungen abgestimmt sind. Dies ermöglicht eine umfassende Bewertung der Geräte unter realistischen Einsatzbedingungen. Die standardisierte Prüfmethodik bietet einheitliche Verfahren zur Beurteilung der Reaktion des getesteten Gerätes (EUT) auf spezifische Spannungsstößesignifikanten, was die Integrität der Geräte im Hinblick auf elektromagnetische Störungen Sicherstellt. Ein weiterer relevanter Aspekt der Norm ist die Einführung mehrerer neuer Anhänge, die wesentliche technische Änderungen beinhalten. Dazu gehört zum Beispiel der neue Anhang E, der sich mit der mathematischen Modellierung von Surge-Wellenformen beschäftigt. Dies stellt eine bedeutende technische Erweiterung dar, die die Genauigkeit der Prüfungen verbessert. Der neue Anhang F behandelt die Messunsicherheit, während der Anhang G Methoden zur Kalibrierung von Impulsmeßsystemen beschreibt. Der Anhang H hingegen behandelt das Thema der Kopplung/Dekopplung von Überspannungen an Leitungen mit Nennwerten über 200 A. Eine bemerkenswerte Neuerung in dieser dritten Auflage ist die vollständige Widmung des normativen Anhangs A dem Surge-Test für Anschlüsse, die mit externen Telekommunikationsleitungen verbunden sind. Dies zeigt die Aktualität und Relevanz der Norm in einer zunehmend vernetzten Welt. Die IEC 61000-4-5:2014 stellt damit einen unverzichtbaren Bezugspunkt zur Bewertung der elektromagnetischen Verträglichkeit dar, insbesondere für Unternehmen, die sicherstellen möchten, dass ihre elektrischen und elektronischen Geräte den Anforderungen der Technologiekommissionen TC77 und SC77B gerecht werden. Die Norm trägt zur Verbesserung der Zuverlässigkeit und Sicherheit in der Anwendung von elektrischen Geräten in verschiedenen Umgebungen bei, was in der heutigen Zeit von größter Bedeutung ist.

La norme IEC 61000-4-5:2014 se concentre sur la compatibilité électromagnétique (EMC) et constitue un guide essentiel pour évaluer l'immunité des équipements électriques et électroniques face aux surcharges unidirectionnelles dues aux surtensions causées par des transitoires de commutation et des éclairs. Ce document définit des niveaux de test, des équipements de test, des configurations de test et des procédures de test ciblés, permettant une évaluation cohérente de la façon dont les équipements réagissent aux surtensions. L'une des forces majeures de la norme réside dans l'établissement de niveaux de test recommandés qui sont adaptés à diverses conditions environnementales et d'installation. Cela garantit que les fabricants peuvent tester un large éventail d'équipements dans des conditions qui reflètent leur utilisation réelle. Le fait qu'elle offre des méthodes de test standardisées renforce la robustesse des évaluations et facilite la comparaison des performances entre différents équipements. La norme intègre également des mises à jour importantes par rapport à l'édition précédente, notamment des annexes nouvelles et révisées qui traitent de la modélisation mathématique des formes d'onde de surtension, de l'incertitude de mesure et de la méthode de calibration des systèmes de mesure d'impulsons. Ces ajouts renforcent la précision et la fiabilité des tests, ce qui est crucial pour assurer la conformité des équipements aux exigences d'immunité. En outre, l'Annexe A, qui se concentre spécifiquement sur les tests de surtension pour les ports connectés aux lignes de télécommunication extérieures, témoigne de la pertinence croissante de la norme dans un contexte connecté. Dans l'ensemble, la norme IEC 61000-4-5:2014, avec ses exigences détaillées sur les méthodes de test et ses valeurs limites recommandées, s'affirme comme un document incontournable pour garantir la sécurité et la fiabilité des équipements face aux défis modernes de la compatibilité électromagnétique (EMC). Les ajouts et modifications apportés dans cette édition en font une ressource d'une grande pertinence pour les concepteurs et les ingénieurs confrontés à la nécessité d'évaluer et de certifier l'immunité de leurs produits.

IEC 61000-4-5:2014は、電磁両立性(EMC)に関する標準であり、特にサージ耐性試験の技術的要求事項を明示しています。この標準は、スイッチングや雷の過渡から生じる一方向サージに対する電気および電子機器の耐性要件、試験方法、および推奨される試験レベルの範囲をカバーしています。標準は、異なる環境や設置条件に応じた複数の試験レベルを定義しており、実際の試験での一貫性を確保するための具体的な手順を示しています。 特に、IEC 61000-4-5:2014の強みは、電気および電子機器の免疫を評価するための共通の基準を確立している点です。試験方法は、特定の動作条件下での試験対象機器(EUT)の反応を測定するための一貫した方法を文書化しており、この標準によって、設計者やエンジニアは、サージ効果に対する機器の耐性を正確に評価することができます。 さらに、この標準は、サージ電圧の影響を評価するための新しい附属書E(サージ波形の数学的モデリング)、附属書F(測定不確かさ)、附属書G(インパルス測定システムのキャリブレーション方法)、および附属書H(200 Aを超えるラインへのサージの結合/分離)など、技術的な改善が行われた点でも重要です。 また、第2版(IEC 61000-4-5:2005)からの改善点として、外部通信ラインに接続されたポートに対するサージ試験が全面的に択一された附属書Aで扱われており、10/700 µsの複合波発生器の仕様も具体的に定義されています。これにより、EMCの評価においてより高度な検証が可能となり、TC77やSC77Bの枠組みの中でも、この標準の関連性が高まっています。 以上の理由から、IEC 61000-4-5:2014は電磁両立性(EMC)に関する重要な基準であり、現代の電気および電子機器の設計において不可欠なリソースとなっています。

IEC 61000-4-5:2014 표준은 전자기 호환성(EMC) 분야에서 중요한 역할을 하는 규정으로, 장비의 서지 내성 시험에 대한 요구사항과 시험 방법을 정의하고 있습니다. 이 표준은 스위칭과 번개 변동으로 인한 단방향 서지 전압에 대한 내성 요구 사항을 다루고 있으며, 전기 및 전자 장비를 위한 공통 기준을 설정하여 서지에 대한 장비의 내성을 평가하는 데 기여합니다. 이 표준의 강점 중 하나는 다양한 환경 및 설치 조건에 따른 여러 시험 수준이 정의되어 있다는 점입니다. 이는 전자기 호환성(EMC)을 만족시키기 위해 필요로 하는 장비의 성능을 보다 정확하게 평가할 수 있게 해줍니다. 특히, 시험 장비와 시험 설정, 테스트 절차를 명확히 규정하여 실험의 일관성을 보장하고 있습니다. 또한, IEC 61000-4-5:2014 표준은 이전 판의 기술적 개정을 포함하고 있으며, 새로운 부록 E, F, G 및 H가 추가되었습니다. 이 부록들은 서지 파형의 수학적 모델링, 측정 불확실성, 임펄스 측정 시스템의 교정 방법 및 200 A 이상의 라인으로의 서지 결합/분리 방법에 대한 내용을 다루고 있어, 전자기 호환성 관련 기술을 보다 심층적으로 다루고 있습니다. 특히, 외부 통신선에 연결된 포트에 대한 서지 시험이 제 2판(IEC 61000-4-5:2005)에서는 6.2절에서 언급되었던 것과 달리, 제 3판(IEC 61000-4-5:2014)에서는 전적으로 부록 A가 이 주제에 전념하고 있어, 10/700 µs 결합파형 발생기의 상세 사양을 제공하고 있습니다. 따라서 이 표준은 EMC와 관련하여 전기 및 전자 장비의 서지 내성 평가를 위한 공통의 기준을 제시하며, 전자기 호환성 분야에서의 신뢰성을 높이는 데 중요한 기여를 하고 있습니다.

IEC 61000-4-5:2014 is a comprehensive standard that outlines critical testing and measurement techniques regarding surge immunity for electrical and electronic equipment, focusing on electromagnetic compatibility (EMC). The scope of this standard is particularly relevant as it addresses the immunity requirements and test methods necessary to evaluate how equipment reacts to unidirectional surges caused by switching and lightning transients. One of the strengths of IEC 61000-4-5:2014 is its establishment of a common reference that helps manufacturers ensure their products meet international resilience benchmarks when subjected to surge voltages under specified operational conditions. This standard specifies a range of test levels, equipment, setups, and procedures, making it a vital tool for ensuring good EMC practices across various industry sectors. The inclusion of several significant technical revisions in this third edition, compared to the second edition from 2005, highlights the standard's adaptability and commitment to evolving industry needs. Notably, the addition of Annex E for mathematical modelling of surge waveforms, Annex F addressing measurement uncertainty, Annex G for the calibration of impulse measuring systems, and Annex H covering coupling/decoupling surges to lines rated above 200 A significantly enhances the robustness of the testing criteria. Furthermore, the dedicated normative Annex A focusing on surge tests for ports connected to telecommunications lines demonstrates the standard's relevance in modern applications where interconnected systems are commonplace. This attention to detail ensures that manufacturers can closely adhere to compliance requirements, thus increasing the reliability and safety of products in real-world applications. Overall, the IEC 61000-4-5:2014 standard plays a crucial role in the field of electromagnetic compatibility, providing necessary frameworks that support effective surge immunity testing, and it continues to be a key document referred to by TC77 and SC77B working groups in the advancement of EMC standards.

글 제목: IEC 61000-4-5:2014 - 전자기적 호환성 (EMC) - 파트 4-5: 시험 및 측정 기술 - 서지강도 시험 글 내용: IEC 61000-4-5:2014는 스위칭 및 번개 돌발로 인해 발생하는 일방향 서지에 관한 기기의 내성 요구 사항, 시험 방법 및 권장 시험 레벨 범위와 관련이 있다. 여러 가지 환경 및 설치 조건과 관련된 다양한 시험 레벨이 정의되어 있다. 이러한 요구 사항은 전기 및 전자 장치에 대해 개발되었으며 적용 가능하다. 이 표준의 목적은 기기가 서지에 노출될 때 전기 및 전자 장치의 내성을 평가하기 위한 공통 기준을 수립하는 것이다. 기술된 시험 방법은 특정 현상에 대해 장비 또는 시스템의 내성을 평가하기 위한 일관된 방법을 서술하고 있다. 이 표준은 다음을 정의한다. - 시험 레벨 - 시험 장비 - 시험 설정 - 시험 절차 기술된 실험실 시험의 목적은 테스트 대상 기기의 반응을 특정 운전 조건에서 스위칭 및 번개 효과에 의해 발생하는 서지 전압에 대해 찾는 것이다. 높은 전압 스트레스에 대한 기기의 절연 기능을 시험하는 것은 의도되지 않은 것이다. 직접 번개 전류 주입, 즉 직접 번개 타격은 이 표준에서 고려되지 않는다. 이 제3판은 2005년에 발행된 제2판을 취소하고 대체하며, 다음과 같은 이전판과 비교하여 중요한 기술적 변화를 포함하는 기술적 개정이다. - 새로운 부록 E는 서지 파형의 수학적 모델링에 관한 것이다. - 새로운 부록 F는 측정 불확실성에 관한 것이다. - 새로운 부록 G는 서지 계측 시스템의 보정 방법에 관한 것이다. - 새로운 부록 H는 200A 이상의 라인에 서지 결합/분리 여파에 관한 것이다. 또한 2차 역전류 통신 라인에 대한 서지 시험은 제2판(IEC 61000-4-5:2005)의 6.2에서 다루어졌으나, 이 제3판(IEC 61000-4-5:2014)에서 이에 대한 규범화 부록 A가 완전히 이에 헌신되었다. 특히 10/700 µs 결합 파 발생기의 사양을 제공한다. 키워드: 전자기적 호환성, EMC, TC77, SC77B

The article discusses the IEC 61000-4-5:2014 standard, which focuses on testing and measurement techniques for surge immunity in electrical and electronic equipment. The standard provides guidelines for evaluating the equipment's resistance to surges caused by over-voltages from switching and lightning transients. It defines various test levels, equipment, setups, and procedures for conducting the tests. The purpose of the standard is to establish a common reference for assessing the immunity of equipment to surges. The third edition of the standard includes new annexes on mathematical modeling of surge waveforms, measurement uncertainty, calibration of impulse measuring systems, and coupling/decoupling surges to lines rated above 200 A. The article also mentions that the third edition addresses surge tests for ports connected to outside telecommunication lines in a dedicated annex. Keywords associated with the article include electromagnetic compatibility, EMC, and TC77, SC77B.

記事のタイトル:IEC 61000-4-5:2014年-電磁的適合性(EMC)-第4-5部:試験および計測技術-サージ耐性試験 記事の内容:IEC 61000-4-5:2014年は、スイッチングや雷放電による過電圧によって引き起こされる一方向のサージに関する機器の耐性要件、試験方法、および推奨試験レベルの範囲に関連しています。さまざまな環境と設置条件に関連するいくつかの試験レベルが定義されています。これらの要件は、電気および電子機器に関して開発され、適用されます。この標準の目的は、サージにさらされた場合の電気および電子機器の耐性を評価するための共通の基準を確立することです。文書化された試験方法は、定義された現象に対する装置またはシステムの耐性を評価するための一貫した方法を説明しています。この標準では、次の項目を定義しています。 - 試験レベル - 試験装置 - 試験設定 - 試験手順 記述された実験室試験の目的は、指定された運転条件下での装置の反応をスイッチングや雷エフェクトによるサージ電圧に対して調べることです。装置の絶縁耐力を高電圧ストレスに耐える能力を試験することは意図されていません。直接的な雷電流の注入、つまり直接的な雷撃は、この標準では考慮されていません。この第3版は、2005年に発行された第2版を取り消し、置き換えるものであり、以前の版に比べて以下の重要な技術的変更を含んでいます。 - 新しい付録Eは、サージ波形の数学的モデリングに関するものです。 - 新しい付録Fは、測定の不確かさに関するものです。 - 新しい付録Gは、インパルス計測システムの校正方法に関するものです。 - 新しい付録Hは、200A以上のラインに対する結合/解結のサージに関するものです。また、第2版(IEC 61000-4-5:2005)では、外部通信ラインに接続されたポートのサージ試験について言及されていましたが、この第3版(IEC 61000-4-5:2014)では、このトピックに関する規範的な付録Aを完全に割り当てています。具体的には、10/700 µsの組み合わせ波形発生器の仕様を提供しています。キーワード:電磁的適合性、EMC、TC77、SC77B