IEC TS 62565-4-4:2025

Nanomanufacturing – Product specification – Part 4-4: Nanophotonic products – Blank detail specification: Quantum dot enabled light conversion films

IEC TS 62565-4-4:2025 which is a Technical Specification, establishes a standardized method to determine a blank detail specification (BDS) for
- quantum dot enabled light conversion film (Q-LCF).
This document is intended to be used for nano-enabled photoelectric display, based on liquid crystal display (LCD).
The relevant key control characteristics (KCC) of Q-LCF are listed, including physical, mechanical and optical properties, and stability. For each KCC, measurement methods and existing standards are reported.
Numeric values for the KCCs are left blank as they will be specified between customer and supplier in the detail specification (DS). In the DS KCCs can be added or removed if agreed between customer and supplier.

General Information

• Status: Published
• Publication Date: 15-Apr-2025
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 10 - TC 113/WG 10
• Current Stage: PPUB - Publication issued
• Start Date: 16-Apr-2025
• Completion Date: 28-Feb-2025

Standards Content (Sample)

IEC TS 62565-4-4 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –
Part 4-4: Nanophotonic products – Blank detail specification: Quantum dot
enabled light conversion films

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IEC TS 62565-4-4 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –

Part 4-4: Nanophotonic products – Blank detail specification: Quantum dot

enabled light conversion films

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120  ISBN 978-2-8327-0226-0

– 2 – IEC TS 62565-4-4:2025 © IEC 2025
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 9
3.1 General terms . 9
3.2 General product description and procurement information . 10
3.3 Physical key control characteristics . 11
3.4 Mechanical key control characteristics . 11
3.5 Optical key control characteristics . 12
3.6 Reliability control characteristics . 13
3.7 Measurement methods . 13
4 General introduction regarding measurement methods . 13
5 Specification format . 14
5.1 General product description and procurement information . 14
5.2 General material information of QDs and Q-LCF . 15
5.3 Physical key control characteristics . 16
5.4 Mechanical key control characteristics . 16
5.5 Optical key control characteristics . 16
5.6 Reliability key control characteristics . 17
6 Overview of test methods . 17
Annex A (normative) Supporting information for standardized KCC measurement
procedures . 21
A.1 General . 21
A.2 Thickness: Mechanical scanning . 21
A.2.1 General. 21
A.2.2 Measurement standard . 21
A.3 Surface resistivity: DC method . 21
A.3.1 General. 21
A.3.2 Measurement standard . 21
A.4 Coefficient of linear thermal expansion: Thermomechanical analysis . 22
A.4.1 General. 22
A.4.2 Measurement standard . 22
A.5 Haze: Hazemeter or spectrophotometer . 22
A.5.1 General. 22
A.5.2 Measurement standard . 22
A.6 Total luminous transmittance: Hazemeter or spectrophotometer . 22
A.6.1 General. 22
A.6.2 Measurement standard . 22
A.7 Tensile strength: Tensile testing machine . 22
A.7.1 General. 22
A.7.2 Measurement standard . 22
A.8 Elongation at break: Tensile testing machine . 23
A.8.1 General. 23
A.8.2 Measurement standard . 23
A.9 180° peel strength: Peel test . 23

A.9.1 General. 23
A.9.2 Measurement standard . 23
A.10 Pencil hardness: Pencil test . 23
A.10.1 General. 23
A.10.2 Measurement standard . 23
A.11 Thermoshrinking percentage: Oven heating method . 23
A.11.1 General. 23
A.11.2 Measurement standard . 23
A.12 Peak wavelength: BLU with spectroradiometer. 23
A.12.1 General. 23
A.12.2 Measurement standard . 24
A.12.3 Adaptations and modifications required . 24
A.13 FWHM: BLU with spectroradiometer . 24
A.13.1 General. 24
A.13.2 Measurement standard . 24
A.13.3 Adaptations and modifications required . 24
A.14 Chromaticity coordinate: BLU with spectroradiometer . 24
A.14.1 General. 24
A.14.2 Measurement standard . 24
A.14.3 Adaptations and modifications required . 24
A.15 Chromaticity coordinate non-uniformity: BLU with spectroradiometer . 25
A.15.1 General. 25
A.15.2 Measurement standard . 25
A.15.3 Adaptations and modifications required . 25
A.16 Luminance: BLU with spectroradiometer . 26
A.16.1 General. 26
A.16.2 Measurement standard . 26
A.16.3 Adaptations and modifications required . 26
A.17 Luminance uniformity: BLU with spectroradiometer . 26
A.17.1 General. 26
A.17.2 Measurement standard . 26
A.17.3 Adaptations and modifications required . 26
Annex B (informative) Guidance for KCC measurement procedures if no standard is
available . 27
B.1 General . 27
B.2 Light conversion efficiency: BLU with spectroradiometer . 27
B.2.1 General. 27
B.2.2 Measurement standard . 27
B.3 Photon absorptance: BLU with spectroradiometer . 29
B.3.1 General. 29
B.3.2 Measurement standard . 29
Bibliography . 30

Figure A.1 –Schematic structure of Q-LCF . 21
Figure A.2 –Measuring arrangement for Q-LCF . 25
Figure B.1 – Standard measurement system . 28

Table 1 – General product description and procurement information . 14

– 4 – IEC TS 62565-4-4:2025 © IEC 2025
Table 2 – General material information for QDs . 15
Table 3 – General material information for Q-LCF . 15
Table 4 – Format for physical key control characteristics for Q-LCF . 16
Table 5 – Format for mechanical key control characteristics for Q-LCF . 16
Table 6 – Format for optical key control characteristics for Q-LCF . 17
Table 7 – Format for reliability key control characteristics for Q-LCF . 17
Table 8 – Overview of measurement methods . 19

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING – PRODUCT SPECIFICATION –

Part 4-4: Nanophotonic products – Blank detail specification:
Quantum dot enabled light conversion films

FOREWORD
1) The Internatio
...