IEC TS 62565-1:2023

Nanomanufacturing - Product specifications - Part 1: Basic concepts

IEC TS 62565-1:2023 which is a Technical Specification, defines the system of blank detail specifications for nanomaterials and nano-assemblies as well as final nano-enabled products addressed in the nanomanufacturing value chain.
It defines the concepts of blank detail specification (BDS), detail specification (DS) and key control characteristic (KCC). Furthermore, it provides guidelines how to develop and use product specifications, particularly the IEC 62565 series, in the field of nanotechnology.
This document also provides guidelines regarding the certification and reliability aspects for products specified by a DS and associated KCCs.
NOTE 1 The IEC 62565 series uses an open generic structure that can be flexibly adapted to technical developments. The double indexing of the individual parts allows grouping into technology areas without restriction due to an overly strict hierarchical structure.
NOTE 2 Key elements of the IEC 62565 series are a consensus-based set of key control characteristics (KCCs) with clear definitions and standardized measurement procedures to measure them.

General Information

• Status: Published
• Publication Date: 10-May-2023
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 3 - TC 113/WG 3
• Current Stage: PPUB - Publication issued
• Start Date: 20-Jun-2023
• Completion Date: 11-May-2023

Overview

IEC TS 62565-1:2023 - "Nanomanufacturing - Product specifications - Part 1: Basic concepts" defines a standardized system for writing and using product specifications across the nanomanufacturing value chain. It introduces the concepts of Blank Detail Specification (BDS), Detail Specification (DS) and Key Control Characteristic (KCC), and provides guidelines for developing, measuring, certifying and assessing the reliability of nanomaterials, nano-assemblies and nano‑enabled products.

Key topics and requirements

• Systematic specification framework: Specifies a generic, flexible structure for BDS and DS documents so suppliers and customers can agree on product attributes for nanomaterials and nano-enabled products.
• Key Control Characteristics (KCCs): Establishes the idea of consensus-based KCCs - clearly defined product parameters that must be measured and controlled under quality systems.
• Measurement procedures and SMLs: Describes measurement procedure maturity levels (SML 1–4) ranging from no documented method to fully standardized procedures, and recommends choosing or developing methods accordingly.
• BDS structure elements: Requires inclusion of general product description, procurement information and a formatted list of KCCs (attributes, units, measurement method references).
• Certification and reliability guidance: Provides guidelines for product and factory audits, quality management integration and reliability/durability assessment for products specified by DS and associated KCCs.
• Open, extensible indexing: Uses double indexing to group parts by technology area without rigid hierarchy, enabling adaptation to new nanotechnologies.

Practical applications and users

Who benefits:

• Nanomaterial and nano-enabled product manufacturers - to define reproducible product requirements and integrate KCCs into production control.
• Suppliers and procurers - to specify, request and compare products using harmonized BDS/DS templates.
• Quality, R&D and production engineers - to select appropriate measurement methods, implement KCC monitoring and integrate into quality management systems.
• Standards developers and certification bodies - to align measurement standards and audit processes with IEC TC 113 guidance.
• Regulatory and compliance teams - to reference standardized KCC definitions and measurement procedures for conformity evidence.

Practical uses:

• Creating supplier-ready product specifications for carbon nanotubes, graphene, luminescent nanomaterials, energy storage materials and other nano-enabled components.
• Integrating KCC-based testing into incoming inspection, process control and final product certification.
• Harmonizing international procurement language across the nanomanufacturing supply chain.

Related standards

• IEC TS 62607 series - measurement standards for KCCs (by material/application).
• IEC TS 62876 series - quality and reliability assessment standards for nano-enabled products.
• Specific BDS series (examples): IEC TS 62565-2-x (carbon nanotubes), 3-x (graphene), 4-x (luminescent nanomaterials).

Keywords: IEC TS 62565-1:2023, nanomanufacturing, product specifications, KCC, blank detail specification, detail specification, nanomaterials, nano-enabled products, measurement procedures, quality and reliability.

Standards Content (Sample)

IEC TS 62565-1 ®
Edition 1.0 2023-05
TECHNICAL
SPECIFICATION
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Nanomanufacturing – Product specifications –
Part 1: Basic concepts
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IEC TS 62565-1 ®
Edition 1.0 2023-05
TECHNICAL
SPECIFICATION
colour
inside
Nanomanufacturing – Product specifications –

Part 1: Basic concepts
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120 ISBN 978-2-8322-7020-2

– 2 – IEC TS 62565-1:2023  IEC 2023
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 General . 12
4.1 Requirements for product specifications . 12
4.2 Generic systematics of specifications for nanomaterials and nano-enabled
products . 12
4.3 Blank detail specification . 13
4.4 Detail specification . 14
5 Structure of a blank detail specification . 15
5.1 General . 15
5.2 General product description and procurement information . 15
5.3 Specification of key control characteristics . 16
6 Measurement procedures for key control characteristics . 17
6.1 General . 17
6.2 SML 4: Standardized measurement procedure for the KCC available . 17
6.3 SML 3: Adoption and adaptation of an existing standardized measurement
procedure . 17
6.4 SML 2: Guidance for measurement procedures in the absence of a standard . 17
6.5 SML 1: No documented measurement procedure available . 18
6.6 Overview of measurement methods and SML of the related measurement
procedures . 18
7 Certification aspects . 19
7.1 General remarks . 19
7.2 Product audit . 20
7.3 Factory audit . 20
8 Process steps for the development of nanomaterial or nano-enabled product detail
specification . 20
8.1 General . 20
8.2 Defining the scope of the specification . 20
8.3 Defining the list of key control characteristics. 21
Annex A (informative) Structure of standards for blank detail specifications . 22
A.1 Title and scope of standards for blank detail specifications . 22
A.1.1 Generic format of the title . 22
A.1.2 Generic format of the scope . 22
A.2 Content of standards for blank detail specifications . 22
Annex B (informative) Structure of measurement standards for key control
characteristics . 24
B.1 Title and scope of measurement standards for key control characteristics. 24
B.1.1 Generic format of the title . 24
B.1.2 Generic format of the scope . 24
B.2 Content of measurement standards for key control characteristics . 24
Annex C (informative) Guidance of quality evaluation and reliability assessment . 26
C.1 General . 26
C.2 Content of quality and reliability assessment standard . 26

C.3 QM system audit . 27
C.4 Process audit . 27
C.5 Product audit . 27
C.6 Audit score . 27
C.7 Audit frequency . 28
C.8 Environmental, health and safety (EHS) aspects . 28
Bibliography . 29

Figure 1 – Systematics of IEC TC 113 standards . 6
Figure 2 – KCCs and their relation to the BDS: general scheme . 14
Figure 3 – KCCs and their relation to the BDS: example . 14

Table 1 – General product description and procurement information . 15
Table 2 – Format for specification of key control characteristics . 16
Table 3 – Overview of measurement methods (Example) . 19

– 4 – IEC TS 62565-1:2023  IEC 2023
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
NANOMANUFACTURING –
PRODUCT SPECIFICATIONS –
Part 1: Basic concepts
FOREWORD
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC TS 62565-1 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/697/DTS 113/723/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62565 series, published under the general title Nanomanufacturing –
Product specifications, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

– 6 – IEC TS 62565-1:2023  IEC 2023
INTRODUCTION
The mission of IEC technical committee 113 (IEC TC 113) is to develop IEC publications based
on quality management (QM) principles in order to facilitate the transition of nano-enabled
products from development to mass production.
The standardization strategy of IEC TC 113 covers the entire value chain from the production
of nanomaterials and their use as independent products (in other words, the product is the raw
material) to their use as raw materials for integration into subassemblies or end-user products.
Since IEC TC 113 is an electrotechnical committee, the focus of standardization is on
electrotechnical products without excluding the applicability to non-electrotechnical products.
The development of IEC Publications for reliability and durability assessment is also in the
scope of IEC TC 113.
This part of IEC 62565 provides the basic concept and guidelines on how to write the various
types of blank detail specification (BDS) and detail specification (DS) in a standardized and
harmonized manner and describes the systematics behind these documents.
The systematics is based on the "three pillar concept" and provides:
– standards for the specification of nanomaterials and nano-enabled products (left pillar:
IEC TS 62565-x-y);
– standards for the measurement of key control characteristics (KCCs) for nanomaterials and
nano-enabled products (right pillar: IEC TS 62607-x-y);
– standards for quality and reliability assessment. These include test methods for reliability
and durability, but also general standards based on existing International Standards for
quality management systems (QMS) adapted to the specific needs of nanotechnology
(centre pillar: IEC TS 62876-x-y).
Blank detail specifications (BDSs)
provide a list of all known product
performance parameters, called key
control characteristics (KCCs), of
the nanomaterial or nano-
subassembly which is part of the
nano value chain.
Detail specifications (DSs) provide
values and attributes (that had been
left blank in BDS) for a specific
application agreed between supplier
and customer.
KCC measurement standards
provide a detailed description how to
measure a specific KCC and report
the results. There can be several
measurement methods for the same
KCC, which can be selected based
on the needs of the application.
Quality and reliability assessment
standards describe the quality and
reliability of nano-enabled products.

Figure 1 – Systematics of IEC TC 113 standards
In Figure 1, the logical connections in this comprehensive system of quality assurance for
nanomaterials and nano-enabled products are visualized. Due to the interdependence of the
three types of standards, it is important that standardization in IEC TC 113 covers all three
columns in order to arrive at a consistent system of standards which can be operated in a
"seamless" fashion.
This part of IEC 62565 provides the basic concept for the series of BDSs. Examples of other
parts addressing specific technology areas are:
– IEC TS 62565-2-x: Carbon nanotube materials
– IEC TS 62565-3-x: Graphene-based materials
– IEC TS 62565-4-x: Luminescent nanomaterials
– IEC TS 62565-5-x: Nano-enabled energy storage materials
NOTE It is expected that additional BDS series will emerge as industrial uptakes of new materials or new
applications occur.
An indispensable basis of the concept of BDS and DS are clear definitions of the product
characteristics and detailed descriptions for measuring these characteristics. These
characteristics are called key control characteristics (KCCs) because they represent key
features of the products to be monitored in the framework of a quality management system.
IEC 62607 consists of a series of KCC measurement Technical Specifications to be used for
the BDS and DS:
– IEC TS 62607-2-x: KCCs for carbon nanotube materials
– IEC TS 62607-3-x: KCCs for luminescent nanomaterials
– IEC TS 62607-4-x: KCCs for nano-enabled electrical energy storage
– IEC TS 62607-5-x: KCCs for thin-film organic/nano electronic devices
– IEC TS 62607-6-x: KCCs for graphene-based material
– IEC TS 62607-7-x: KCCs for nano-enabled photovoltaics
– IEC TS 62607-8-x: KCCs for nano-enabled metal-oxide interfacial devices
– IEC TS 62607-9-x: KCCs for nano-scale stray magnetic field measurements
Each part of the IEC 62607 series of measurement Technical Specifications describes exactly
one method for measuring a particular KCC. Measurement standards outside the IEC 62607
series can be used in IEC 62565 BDSs and DSs if their applications are clear in the context of
the specification.
In addition to the specification of the nanomaterial characteristics (IEC 62565 series) and the
standardized procedures for the measurement of the characteristics (IEC 62607 series), two
additional aspects of quality management are relevant for complete quality assurance:
The performance of materials and products at the time of manufacture is one thing, but the
reliability is an additional relevant quality assurance metric. Two examples in the IEC 62876
series are given below.
• IEC TS 62876-2-1:2018, Nanotechnology – Reliability assessment – Part 2-1: Nano-
enabled photovoltaic devices – Stability test
• IEC TS 62876-3-1:2022, Nanomanufacturing – Reliability assessment – Part 3-1:
Graphene-based material – Stability: Temperature and humidity test
To ensure that the sourcing of the nanomaterials and the manufacturing process are
consistently managed according to the prescriptions of ISO 9001:2015, the first steps have
been taken in the development of an IEC standard for a quality management system in
nanoelectronics.
The reliability standards and the quality management system standard are represented by the
centre pillar in Figure 1.
More background information can be found in Annex C.

– 8 – IEC TS 62565-1:2023  IEC 2023
NANOMANUFACTURING –
PRODUCT SPECIFICATIONS –
Part 1: Basic concepts
1 Scope
This part of IEC 62565, which is a Technical Specification, defines the system of blank detail
specifications for nanomaterials and nano-assemblies as well as final nano-enabled products
addressed in the nanomanufacturing value chain.
It defines the concepts of blank detail specification (BDS), detail specification (DS) and key
control characteristic (KCC). Furthermore, it provides guidelines how to develop and use
product specifications, particularly the IEC 62565 series, in the field of nanotechnology.
This document also provides guidelines regarding the certification and reliability aspects for
products specified by a DS and associated KCCs.
NOTE 1 The IEC 62565 series uses an open generic structure that can be flexibly adapted to technical
developments. The double indexing of the individual parts allows grouping into technology areas without restriction
due to an overly strict hierarchical structure.
NOTE 2 Key elements of the IEC 62565 series are a consensus-based set of key control characteristics (KCCs)
with clear definitions and standardized measurement procedures to measure them.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
key control characteristic
KCC
product characteristic which can affect safety or compliance with regulations, fit, function,
performance, quality, reliability or subsequent processing of the final product
Note 1 to entry: The measurement of a key control characteristic is described in a standardized measurement
procedure with known accuracy and precision.
Note 2 to entry: It is possible to define more than one measurement method for a key control characteristic if the
correlation of the results is well-defined and known (3.2).

3.2
blank detail specification
BDS
structured generic specification providing a comprehensive set of key control characteristics
which are needed to describe a specific product without assigning specific values or attributes
Note 1 to entry: Examples of nano-enabled products are: nanocomposites and nano-subassemblies.
Note 2 to entry: Blank detail specifications are intended to be used by industrial users to prepare their detail
specifications used in bilateral procurement contracts. A blank detail specification facilitates the comparison and
benchmarking of different materials. Furthermore, a standardized format makes procurement more efficient and more
error robust.
3.3
detail specification
DS
specification based on a blank detail specification with assigned values and attributes
Note 1 to entry: The characteristics listed in the detail specification are usually a subset of the key control
characteristics listed in the relevant blank detail specification. The industrial partners define only those
characteristics which are required for the intended application.
Note 2 to entry: Detail specifications are defined by the industrial partners. Standards development organizations
will be involved only if there is a general need for a detail specification in an industrial sector.
Note 3 to entry: The industrial partners may define additional key control characteristics if they are not listed in the
blank detail specification.
3.4
good practice guide
GPG
informal document which is not necessarily peer reviewed but can be used as a working
document to establish a measurement procedure
Note 1 to entry: A GPG serves as the first document based on initial scientific research which is intended to be the
first step toward future standardization.
3.5
standard maturity level
SML
measure for estimating the maturity of a measurement procedure based on the consensus
achieved in the stakeholder community
Note 1 to entry: SML 1 – No documented measurement procedure available.
Note 2 to entry: SML 2 – Good practice guide publicly available based on a reasonable consensus achieved in the
stakeholder community, e.g. an industrial or academic consortium.
Note 3 to entry: SML 3 – IEC or ISO standard or Technical Specification available which can be applied with
modification and adaption to the intended application and use case of the blank detail specification scope.
Note 4 to entry: SML 4 – IEC or ISO standard or Technical Specification available for the exact intended application
and use case of the blank detail specification.
3.6
procurement information
information other than key control characteristics needed for the procurement process
3.7
measurand
quantity intended to be measured
Note 1 to entry: If the quantity is a key control characteristic, the measurement is an essential part of the quality
management system.
– 10 – IEC TS 62565-1:2023  IEC 2023
[SOURCE: ISO/IEC Guide 99:2007, 2.1, modified – Notes to entry and examples have been
deleted and a new Note 1 to entry has been added.]
3.8
measurement
process of experimentally obtaining one or more values that can reasonably be attributed to a
quantity
Note 1 to entry: If the quantity is a key control characteristic, the measurement is an essential part of the quality
management system.
[SOURCE: ISO/IEC Guide 99:2007, 2.1, modified – In the definition, "quantity values" has
been replaced by "values". Notes to entry have been deleted and a new Note 1 to entry has
been added.]
3.9
measurement accuracy
closeness of agreement between a measured quantity value and a true quantity value of a
measurand
Note 1 to entry: The concept ‘measurement accuracy’ is not a quantity and is not given a numerical quantity value.
A measurement is said to be more accurate when it offers a smaller measurement error.
[SOURCE: ISO/IEC Guide 99:2007, 2.13, modified – Notes 2 and 3 to entry have been
deleted.]
3.10
measurement method
process of experimentally obtaining one or more values that can reasonably be attributed to a
quantity
Note 1 to entry: If the quantity is a key control characteristic, the measurement is an essential part of the quality
management system.
3.11
measurement principle
phenomenon serving as a basis of a measurement
EXAMPLE 1 Thermoelectric effect applied to the measurement of temperature.
EXAMPLE 2 Energy absorption applied to the measurement of amount-of-substance concentration.
EXAMPLE 3 Hall effect applied to the measurement of magnetic flux density.
Note 1 to entry: The phenomenon can be of a physical, chemical, or biological nature.
[SOURCE: ISO/IEC Guide 99:2007, 2.4, modified – EXAMPLE 3 has been replaced.]
3.12
measurement procedure
detailed description of a measurement according to one or more measurement principles and
to a given measurement method, based on a measurement model and including any calculation
to obtain a measurement result
Note 1 to entry: A measurement procedure is usually documented in sufficient detail to enable an operator to
perform a measurement.
Note 2 to entry: A measurement procedure can include a statement concerning a target measurement uncertainty.
Note 3 to entry: A measurement procedure is sometimes called a standard operating procedure, abbreviated SOP.
[SOURCE: ISO/IEC Guide 99:2007, 2.6]

3.13
measurement result
set of quantity values being attributed to a measurand together with any other available relevant
information
Note 1 to entry: A measurement result is generally expressed as a single measured quantity value and a
measurement uncertainty. If the measurement uncertainty is considered to be negligible for some purpose, the
measurement result may be expressed as a single measured quantity value. In many fields, this is the common way
of expressing a measurement result.
[SOURCE: ISO/IEC Guide 99:2007, 2.9, modified – Notes 1 and 3 to entry have been deleted.]
3.14
measurement standard
standardized measurement procedure
normative document established by consensus and approved by a recognized body, that
provides a measurement procedure, for common and repeated use, aimed at the achievement
of the optimum degree of order in a given context
Note 1 to entry: Standards are in general based on the consolidated results of science, technology and experience,
and aimed at the promotion of optimum community benefits.
3.15
nano-enabled
exhibiting function or performance only possible with nanotechnology
[SOURCE: ISO/TS 80004-1:2015 , 2.15]
3.16
nanomanufacturing
intentional synthesis, generation or control of nanomaterials, or fabrication steps in the
nanoscale, for commercial purposes
[SOURCE: ISO/TS 80004-1:2015, 2.11]
3.17
product specification
structured document which describes all characteristics of a product known to be relevant for
applications of that product
Note 1 to entry: A material specification is an example of a product specification
3.18
use case
specification of a generalized field of application, possibly entailing the following information
about the system: one or several scenarios; the functional range; the desired behaviour; and
the system boundaries
Note 1 to entry: The use case description typically does not include a detailed list of all relevant scenarios for this
use case. Instead, a more abstract description of these scenarios is used.

– 12 – IEC TS 62565-1:2023  IEC 2023
4 General
4.1 Requirements for product specifications
The IEC 62565 series is intended to specify nanomanufactured products (materials, assemblies,
end-user products) of stable quality under parametric control. Products produced to meet the
specification, agreed between a customer and supplier, shall be qualified through routine
process checks (routine process checks in mass production means that statistical process
control (SPC) is applied), demonstrating that the process is in a state of control. More detailed
information on the essential role of SPC can be found in [1] and [3].
The specification usually contains the following elements.
– Relevant information for product identification, such as a safety data sheet, which should
be shared between customer and supplier during the purchasing process.
– Information about the fabrication process to address potentially relevant "hidden
parameters".
– A list of key control characteristics of the product that are relevant for the intended
application.
– For detailed specifications, include numerical values, value ranges, or non-numerical
attributes (such as solid or liquid) of the key control characteristics. Leave these fields blank
if no details are provided.
– Units of measurement for the key control characteristics.
– Reference to standardized measurement procedures for determining the key control
characteristics or a standard measurement procedure if no standards exist.
NOTE With increasing maturity of the technology, formerly "hidden parameters" will appear as additional KCCs
in the BDS: Standardization of the known will help to gain control of the unknown.
An example for the content structure of a blank detail specification is given in Annex A.
4.2 Generic systematics of specifications for nanomaterials and nano-enabled
products
Given an ever-increasing number of materials used in the fabrication of nano-enabled
electrotechnical products, the design of a classification system is essential to establish an easy-
to-use suite of standards. The systematics defined support the users to find the most
appropriate Technical Specification for their application, to incorporate new materials standards
with ease, to define a way to develop a modified or new specification; and to facilitate the
development of user-customer agreements if, for example, special final product characteristics
make this necessary.
This system shall allow for the incorporation of new materials while maintaining the overall
classification system.
—————————
Numbers in square brackets refer to the Bibliography.

The systematics is reflected in the numbering system for specification documents: In order to
fulfil the requirements described in the preceding paragraph, the parts of the IEC 62565 series
have two indices, e.g. IEC 62565-x-y (x and y are natural numbers):
– The first index x is a number chosen by the technical committee to represent a product,
system or more generally a technology or technical field, e.g. materials used for energy
storage or for lighting applications; the second index y is a sequential number which is
increased by one as each new specification is added.
– Furthermore, the parts of the IEC 62565 series differentiate between blank detail
specifications (BDS) and detail specifications (DS), which have different roles as described
in 4.3 and 4.4.
In this document, the general term "specification" is used if it is not necessary to differentiate
between a BDS or DS, as all types of specification follow the same systematics.
4.3 Blank detail specification
A blank detail specification (BDS) for nanomanufactured products (materials, assemblies, end-
user products) is a template which contains requirements for style, layout and content of a
material specification. It lists the key control characteristics (KCCs) which are required to
ensure the quality for material procurement and the use of the material in the manufacture of
nano-enabled products. The BDS does not contain specific numerical values or attributes for
those KCCs. Therefore, the BDS establishes the foundation for customers and suppliers of
nanomaterials to develop their own specification. The relation of a BDS, KCCs and
measurement methods is visualized in Figure 2 and Figure 3.
In more detail, a BDS has the following characteristics.
– It provides a predefined structure of the contents of a product description to identify the
product, and defines general requirements in connection with the product.
– It contains a consensus-based list of KCCs which describe the nanomaterial or more
generally the nano-enabled product. This list in the form of a table provides
• name of the KCC, accompanied by a formal definition in the "Terms and definitions"
clause,
• name of the measurement method of the KCC, accompanied by a formal definition in the
"Terms and definitions" clause,
• format of the specified value and measurement unit, and
• identification of the standard defining the measurement procedure for the key control
characteristics. If there is no dedicated measurement standard for the KCC,
i) other documented standards may be applied, if guidelines for their use are provided
in Annex A of the BDS, or if no applicable standard exists,
ii) good practice guides or bilateral supply agreements may fill the gap. This shall be
addressed in Annex B, because no KCC shall be listed without providing a guideline
to verify conformity with the specification.
The document maturity is indicated by the SRL value.
– Each KCC listed in the specification is voluntary. Supplier and customer may add or remove
items in the KCC list or agree on other methods than those in the BDS to verify the specified
KCCs.
– 14 – IEC TS 62565-1:2023  IEC 2023

Figure 2 – KCCs and their relation to the BDS: general scheme

Figure 3 – KCCs and their relation to the BDS: example
NOTE In special cases for a particular application it can be useful to establish a document containing only a
subgroup of the KCCs listed in the BDS. This document is called a sectional blank detail specification.
4.4 Detail specification
A detail specification (DS) for nanomanufactured products, including materials, assemblies, and
end-user products, serves as a template which is based on a BDS. In contrast to the BDS the
DS contains specific numerical values or attributes for the key control characteristics (KCCs) of
the product. The KCC list of the DS is typically a subset of the list in the BDS. If required by the
application additional KCCs may be added. The BDS shall be referenced in the DS as a
normative reference. The DS shall include all the elements of the product specification
necessary to ensure the reliability of the numerical values. While alternative measurement
methods may be accepted in the BDS, this is typically not the case in the DS. The measurement
method and procedure shall be included in the detail specification.

A DS is often used in supplier–customer relations to define the quality of products and serves
as a basis to accept or reject a delivery. If required, a technical committee can issue a DS to
provide guidance to stakeholders.
5 Structure of a blank detail specification
5.1 General
The recommended structure of a BDS is shown in Annex A. Although the introduction is not
normative in nature, it does provide the user with important information regarding the
commercial relevance of the BDS as well as its relationship to other product specifications in
the same technology area. Annex A also provides a generic format of title and scope as well as
a suggested table of contents.
The core elements of the BDS are the tables listing the information to specify the product. This
includes a general product description and procurement information as well as the list of the
KCCs.
5.2 General product description and procurement information
Table 1 contains information needed for the procurement of the specified material, component
or sub-assembly generally referred to as product. The information shall be suitable to track it
back to the particular fabrication process at the supplier and it is assumed that this information
allows the supplier to verify the complete set of fabrication conditions for the production batch
in question. In addition, the information shall be suitable to order the identical product again.
Table 1 – General product description and procurement information
Item
Item Information
No
1.1 Supplier
1.2 Trade name
1.3 ID number
 Number of pieces
1.4 Typical batch quantity  Mass [kg]
 Volume [l]
 Batch number
 Serial number
1.5 Traceability requirements
 Others, specify ………………………….
Manufacturing date
Number
1.6 Specification
Revision level
Date of issue
1.7 Packaging requirements
Factory name and
1.8
location
– 16 – IEC TS 62565-1:2023  IEC 2023
5.3 Specification of key control characteristics
This part of the BDS lists the identified KCCs for the product. In general, it is recommended to
provide it in table form similar to that of Table 2, but as every product is different this can be
only a guideline. For a BDS that contains many KCCs, it is recommended to structure the list
by dividing it into categories. This makes the specification clearer and easier to use in practice.
NOTE Example for the category structure of nanomaterials: chemical KCCs, electrical KCCs, thermal KCCs, optical
KCCs, mechanical KCCs, dimensional and structural KCCs.
Table 2 – Format for specification of key control characteristics
KCC MEASUREMENT MEASUREMENT
KCC SPECIFICATION UNIT SML
No. METHOD PROCEDURE
Nominal [ ] ± Tolerance [ ]
key control
3.1 or
characteristic
larger than [ ], smaller than [ ]
Nominal [ ] ± Tolerance [ ]
Terahertz time-
sheet
3.2 or Ω/□ domain 4 IEC TS 62607-6-10
resistance
spectroscopy
larger than [ ], smaller than [ ]
Nominal [ ] ± Tolerance [ ]
ISO 9277
specific
3.3 or BET method 3
m /g
surface area
(Annex A.n)
larger than [ ], smaller than [ ]
3.4   2 (Annex B.n)
3.5   1 NA
Description of the entries in Table 2:
– KCC contains the term used for the KCC. This term should be defined in the "terms and
definitions" clause of the BDS with a reference to the source if the definition was taken from
another standard. Whenever possible the definitions shall be consistent with definitions in
the terminological databases maintained by IEC and ISO (IEC Electropedia and ISO Online
Browsing Platform) preferably the definitions in the IEC 62565, IEC 62607, IEC 62876 and
ISO 80004 series.
– SPECIFICATION is described as the nominal value of the KCC with its tolerance or the
limiting values such as larger than or smaller than a specified value.
– UNIT is the physical unit of the measurand.
– MEASUREMENT METHOD is the generally used name of measurement according to a given
principle, e.g. Raman spectroscopy, atomic force microscopy, van der Pauw method.
– SML describes the maturity of measurement procedure based on the consensus achieved
in the stakeholder community.
– MEASUREMENT PROCEDURE ideally refers to the measurement standard for the KCC.
Depending on the degree of maturity of the measurement standard, additional information
is given in Annex A.
6 Measurement procedures for key control characteristics
6.1 General
According to the philosophy in IEC TC 113, all KCCs and the measurement procedures listed
in the BDS are defined in Clause 3 "Terms and definitions". In some cases, there are several
measurement methods that are suitable for measuring a specific KCC. Although it is
recommended to specify exactly one combination of KCC and measurement method, there can
be good reasons to specify multiple combinations.
For each combination of KCC and measurement method there shall be a reference in Table 2
to a document describing the measurement procedure. The referenced measurement
procedures should be International Standards from the IEC 62607 series because they are
focused on providing exactly the information in the KCC table. Nevertheless, for emerging
technologies like nanotechnology this is not always possible.
In general, there are four scenarios regarding the availability of standardized measurement
methods. These are outlined in 6.2 to 6.5.
6.2 SML 4: Standardized measurement procedure for the KCC available
SML 4 describes the situation where a standardized measurement procedure is available and
can be used exactly for the use case under consideration. In this case it is suitable just to list
the standard in Table 2.
The advantage of SML 4 is that the standard can directly be applied to the intended use case
including sample preparation, description of the measurement procedure, data analysis and
reporting of the results.
6.3 SML 3: Adoption and adaptation of an existing standardized measurement
procedure
A standardized measurement procedure is available which is intended to be used for a
...