IEC 61010-031:2015/AMD1:2018

Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement.

Amendement 1 - Règles de sécurité pour appareils électriques de mesurage, de régulation et de laboratoire - Partie 031: Exigences de sécurité pour sondes équipées portatives et manipulées à la main pour mesurage et essais électriques

General Information

• Status: Published
• Publication Date: 28-May-2018
• ICS: 19.080 - Electrical and electronic testing
• Technical Committee: TC 66 - Safety of measuring, control and laboratory equipment
• Drafting Committee: WG 2 - TC 66/WG 2
• Current Stage: DELPUB - Deleted Publication
• Start Date: 22-Dec-2022
• Completion Date: 26-Oct-2025

Relations

• Amends: IEC 61010-031:2015 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
• Effective Date: 05-Sep-2023
• Revised: IEC 61010-031:2022 - Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
• Effective Date: 05-Sep-2023

Overview - IEC 61010-031:2015/AMD1:2018 (Amendment 1)

IEC 61010-031:2015/AMD1:2018 is an amendment to the IEC 61010 series that updates safety requirements for hand‑held and hand‑manipulated probe assemblies used in electrical test and measurement. It refines definitions, test methods and construction requirements to reduce electric shock, partial‑discharge and mechanical risks for probe assemblies, probe tips and connectors used with measuring equipment.

Key topics and technical requirements

• Updated definitions - clarifications to terms such as TERMINAL, CONNECTOR and MEASUREMENT CATEGORY to align safety language with probe assembly use.
• Protection against electric shock - revised rules for identifying accessible parts, required protective measures (double/reinforced insulation, protective impedance), and the use of protective fingerguards and tactile indicators.
• Probe tips and connectors - requirements for probe tips used as connectors, including testing in both fully‑mated and partially‑mated conditions.
• Solid insulation - replacement of previous clause with comprehensive guidance on solid insulation behaviour, ageing, voids and partial discharge; manufacturers must validate solid insulation by both short‑term (transient) and long‑term stress tests.
• Clearances and creepage - new/updated CLEARANCE values and conformity procedures for probe assemblies rated for Measurement Categories II, III and IV.
• Electrical testing - specified a.c. and impulse test voltages for electric strength testing of solid insulation and guidance for deriving long‑term test voltages for BASIC, SUPPLEMENTARY and REINFORCED insulation.
• Mechanical and thermal tests - changes to duty cycle terminology (short‑term or intermittent operation) and revised temperature rise measurement methods (add temperature rise to a 40 °C ambient or rated ambient).

Applications - who uses this standard

• Probe and accessory manufacturers designing hand‑held/hand‑manipulated probes, spring‑loaded clips and shielded test probes.
• Product safety engineers ensuring probe assemblies meet electrical clearance, insulation and touch‑current requirements.
• Test laboratories and compliance bodies performing dielectric, impulse and ageing tests specified by the amendment.
• Design teams in instrumentation, electronics manufacturing and calibration services who integrate probes with multimeters, oscilloscopes and portable testers.

Practical value

• Ensures safe design and testing of probe assemblies for use on mains circuits across Measurement Categories II–IV.
• Reduces risk of operator electric shock and long‑term insulation failure by enforcing more robust material selection and test regimes.
• Helps manufacturers demonstrate conformity to international safety expectations and facilitates market access.

Related standards

• IEC 61010 (general safety requirements for measurement, control and laboratory equipment), Part 031 (base document).
• Relevant IEC test and insulation standards referenced within the IEC 61010 series.

Standards Content (Sample)

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
GROUP SAFETY PUBLICATION
AMENDMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement

IEC 61010-031:2015-05/AMD1:2018-05(en)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

IEC publications search - webstore.iec.ch/advsearchform IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished
Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: [e-mail].
IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
GROUP SAFETY PUBLICATION
AMENDMENT 1
Safety requirements for electrical equipment for measurement, control and

laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe

assemblies for electrical test and measurement

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 19.080
ISBN 978-2-8322-5745-6
– 2 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
FOREWORD
This amendment has been prepared by IEC technical committee 66: Safety of measuring,

control and laboratory equipment.

The text of this standard is based on the following documents:

FDIS Report on voting
66/664/FDIS 66/670/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement

1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.

© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.

3.1.5
CONNECTOR
Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:

“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:
classification of testing and measuring circuits according to the types of mains to which they
are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation

4.4.4.2 Temperature
Replace the existing second paragraph with the following:
This temperature is determined by measuring the temperature rise of the surface or part and
adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature
if higher.
4.5.2 Fuses
Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)
with “mains” (in regular font).

5 Marking and documentation
5.1.5 RATING
Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see
also 5.4.3 k))”.
– 4 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
6 Protection against electric shock

6.2.2 Examination
Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests

(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the
test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))

Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part

Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))

6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;
± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is
c) 150 mm
shorter;
d) other hand-held or hand-manipulated parts.

© IEC 2018
Figure 8 – Voltage and touch current measurement

Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.2 Probe assemblies with floating outer conductors

Figure 10 – Voltage and touch current measurement with shielded test probe

Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.3 High frequency test probes
Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:
a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see
6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).

6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.

6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:

The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be
applied shall be at least 2 mm.

6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:
SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY
for maximum 300 V which require finger pressure at about 90° to the axis of the clip are
acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to
indicate the limit of safe access for the OPERATOR.

– 6 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS

Replace the text with the following text:

PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified

accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those

accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-

mated position (see 6.4.2 a) and b)).

6.5.1.2.4 SOLID INSULATION
Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation
The term “solid insulation” is used to describe many different types of construction, including
monolithic blocks of insulating material and insulation subsystems composed of multiple
insulating materials, organized in layers or otherwise.
The electric strength of a thickness of solid insulation is considerably greater than that of the
same thickness of air. The insulating distances through solid insulation are therefore typically
smaller than the distances through air. As a result, electric fields in solid insulation are
typically higher, and often are less homogeneous.
Solid insulation material may contain gaps or voids. When a solid insulation system is
constructed from layers of solid materials, there are also likely to be gaps or voids between
layers. These voids will perturb the electric field so that a disproportionately large part of the
electric field is located in the void, potentially causing ionization within the void, resulting in
partial discharge. These partial discharges will influence the adjacent solid insulation and may
reduce its service life.
Solid insulation is not a renewable medium: damage is cumulative over the life of the
equipment. Solid insulation is also subject to ageing and to degradation from repeated high
voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.

6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:

© IEC 2018
Table 6 – CLEARANCES of probe assemblies RATED for MEASUREMENT CATEGORIES

Nominal a.c. r.m.s. CLEARANCE
line-to-neutral or
d.c. voltage of mm
mains to which the
BASIC INSULATION
probe assembly is
REINFORCED INSULATION
and SUPPLEMENTARY INSULATION
designed to be
connected
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT

CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
V
0,04 0,1 0,5 0,10 0,32 1,4
≤ 50
> 50 ≤ 100 0,1 0,5 1,5 0,32 1,4 3,0

> 100 ≤ 150 0,5 1,5 3,0 1,4 3,0 6,0
1,5 3,0 5,5 3,0 6,0 10,4
> 150 ≤ 300
3,0 5,5 8 6,0 10,4 15
> 300 ≤ 600
> 600 ≤ 1 000 5,5 8 14 10,4 15 23,9
8 11 18 16 22 36
> 1 000 ≤ 1 500
14 18 22 28 36 44
> 1 500 ≤ 2 000
> 2 000 ≤ 3 000 18 22 25 36 44 50

Replace, in the conformity statement, the word “clearance” with “CLEARANCE” (in SMALL CAPS).

6.5.2.3.1 General
Replace, in the second paragraph, the words “required clearance” with “required CLEARANCE”.
Add the following two new subclauses, Table 4, Table 5, Table 14, Figure 15, Figure 16 and
Figure 17:
6.5.2.5 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES
6.5.2.5.1 General
6.5.2.5.1.1 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES shall
withstand the electrical and mechanical stresses that may occur in NORMAL USE and in all
RATED environmental conditions (see 1.4) during the intended life of the probe assembly.

The manufacturer should take the expected life of the probe assembly into account when
selecting insulating materials.
Conformity is checked by both of the following tests:
a) the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s using the applicable test
voltage of Table 4 or the impulse voltage test of 6.6.5.3 using the applicable test voltage
of Table 14;
b) the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of 6.6.5.2,
with a duration of at least 1 min using the test voltage determined by 6.5.2.5.1.2.
NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of
solid insulation.
– 8 – IEC 61010-031:2015/AMD1:2018

© IEC 2018
Table 4 – a.c. test voltages for testing electric strength

of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES

a.c. test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V r.m.s
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION

MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
V
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV

370 500 840 500 720 1300
≤ 50
> 50 ≤ 100 500 840 1 400 720 1 300 2 200
840 1 400 2 200 1 300 2 200 3 500
> 100 ≤ 150
1 400 2 200 3 300 2 200 3 500 5 100
> 150 ≤ 300
2 200 3 300 4 300 3 500 5 100 7 000
> 300 ≤ 600
> 600 ≤ 1 000 3 300 4 300 6 600 5 100 7 000 10 000
4 300 5 400 8 200 7 400 9 700 15 000
> 1 000 ≤ 1 500
6 600 8 200 9 700 12 000 15 000 18 000
> 1 500 ≤ 2 000
> 2 000 ≤ 3 000 8 200 9 700 11 000 15 000 18 000 20 000

Table 14 – Impulse test voltages for testing electric strength
of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES
Impulse test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V peak
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION

MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
V
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
≤ 50 500 800 1 500 800 1 280 2 400
> 50 ≤ 100 800 1 500 2 500 1 280 2 400 4 000
1 500 2 500 4 000 2 400 4 000 6 400
> 100 ≤ 150
> 150 ≤ 300 2 500 4 000 6 000 4 000 6 400 9 600
> 300 ≤ 600 4 000 6 000 8 000 6 400 9 600 12 800
6 000 8 000 12 000 9 600 12 800 19 200
> 600 ≤ 1 000
8 000 10 000 15 000 13 500 17 900 27 100
> 1 000 ≤ 1 500
> 1
...

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de
laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et
manipulées à la main pour mesurage et essais électriques

IEC 61010-031:2015-05/AMD1:2018-05(en-fr)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite
ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie
et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des
questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez
les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
The stand-alone application for consulting the entire The world's leading online dictionary of electronic and
bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in
Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional
documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical
iPad. Vocabulary (IEV) online.

IEC publications search - webstore.iec.ch/advsearchform IEC Glossary - std.iec.ch/glossary
The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and
variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of
committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been
and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc
details all new publications released. Available online and If you wish to give us your feedback on this publication or
also once a month by email. need further assistance, please contact the Customer Service
Centre: [e-mail].
A propos de l'IEC
La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC
Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la
plus récente, un corrigendum ou amendement peut avoir été publié.

Catalogue IEC - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
Application autonome pour consulter tous les renseignements
Le premier dictionnaire en ligne de termes électroniques et
bibliographiques sur les Normes internationales,
électriques. Il contient 21 000 termes et définitions en anglais
Spécifications techniques, Rapports techniques et autres
et en français, ainsi que les termes équivalents dans 16
documents de l'IEC. Disponible pour PC, Mac OS, tablettes
langues additionnelles. Egalement appelé Vocabulaire
Android et iPad.
Electrotechnique International (IEV) en ligne.

Recherche de publications IEC -
Glossaire IEC - std.iec.ch/glossary
webstore.iec.ch/advsearchform
67 000 entrées terminologiques électrotechniques, en anglais
La recherche avancée permet de trouver des publications IEC et en français, extraites des articles Termes et Définitions des
en utilisant différents critères (numéro de référence, texte, publications IEC parues depuis 2002. Plus certaines entrées
comité d’études,…). Elle donne aussi des informations sur les antérieures extraites des publications des CE 37, 77, 86 et
projets et les publications remplacées ou retirées. CISPR de l'IEC.

IEC Just Published - webstore.iec.ch/justpublished Service Clients - webstore.iec.ch/csc
Restez informé sur les nouvelles publications IEC. Just Si vous désirez nous donner des commentaires sur cette
Published détaille les nouvelles publications parues. publication ou si vous avez des questions contactez-nous:
Disponible en ligne et aussi une fois par mois par email. [e-mail].

IEC 61010-031 ®
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ

AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and

laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe

assemblies for electrical test and measurement

Règles de sécurité pour appareils électriques de mesurage, de régulation et de

laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et

manipulées à la main pour mesurage et essais électriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 19.080 ISBN 978-2-8322-6159-0

– 2 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
FOREWORD
This amendment has been prepared by IEC technical committee 66: Safety of measuring,
control and laboratory equipment.
This bilingual version (2018-10) corresponds to the monolingual English version, published in
2018-05.
The text of this standard is based on the following documents:
FDIS Report on voting
66/664/FDIS 66/670/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this amendment has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement

1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.

© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.
3.1.5
CONNECTOR
Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:
“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:
classification of testing and measuring circuits according to the types of mains to which they
are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation

4.4.4.2 Temperature
Replace the existing second paragraph with the following:
This temperature is determined by measuring the temperature rise of the surface or part and
adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature
if higher.
4.5.2 Fuses
Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)
with “mains” (in regular font).

5 Marking and documentation
5.1.5 RATING
Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see
also 5.4.3 k))”.
– 4 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6 Protection against electric shock
6.2.2 Examination
Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests
(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the
test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))

Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part
Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))

6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;
c) 150 mm ± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is
shorter;
d) other hand-held or hand-manipulated parts.

© IEC 2018
Figure 8 – Voltage and touch current measurement
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.2 Probe assemblies with floating outer conductors
Figure 10 – Voltage and touch current measurement with shielded test probe
Delete, in the text of key item 2c, the words “(see 12.3.2)”.

6.3.4.3 High frequency test probes
Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:
a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see
6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).

6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.

6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:
The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be
applied shall be at least 2 mm.

6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:
SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY
for maximum 300 V which require finger pressure at about 90° to the axis of the clip are
acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to
indicate the limit of safe access for the OPERATOR.

– 6 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS
Replace the text with the following text:
PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified
accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those
accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-
mated position (see 6.4.2 a) and b)).

OLID INSULATION
6.5.1.2.4 S
Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation
The term “solid insulation” is used to describe many different types of construction, including
monolithic blocks of insulating material and insulation subsystems composed of multiple
insulating materials, organized in layers or otherwise.
The electric strength of a thickness of solid insulation is considerably greater than that of the
same thickness of air. The insulating distances through solid insulation are therefore typically
smaller than the distances through air. As a result, electric fields in solid insulation are
typically higher, and often are less homogeneous.
Solid insulation material may contain gaps or voids. When a solid insulation system is
constructed from layers of solid materials, there are also likely to be gaps or voids between
layers. These voids will perturb the electric field so that a disproportionately large part of the
electric field is located in the void, potentially causing ionization within the void, resulting in
partial discharge. These partial discharges will influence the adjacent solid insulation and may
reduce its service life.
Solid insulation is not a renewable medium: damage is cumulative over the life of the
equipment. Solid insulation is also subject to ageing and to degradation from repeated high
voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.

6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:

© IEC 2018
Table 6 – CLEARANCES of probe assemblies RATED for MEASUREMENT CATEGORIES
Nominal a.c. r.m.s. CLEARANCE
line-to-neutral or
d.c. voltage of mm
mains to which the
BASIC INSULATION
probe assembly is
REINFORCED INSULATION
and SUPPLEMENTARY INSULATION
designed to be
connected
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT

CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
V
0,04 0,1 0,5 0,10 0,32 1,4
≤ 50
> 50 ≤ 100 0,1 0,5 1,5 0,32 1,4 3,0
0,5 1,5 3,0 1,4 3,0 6,0
> 100 ≤ 150
1,5 3,0 5,5 3,0 6,0 10,4
> 150 ≤ 300
> 300 ≤ 600 3,0 5,5 8 6,0 10,4 15
> 600 ≤ 1 000 5,5 8 14 10,4 15 23,9
8 11 18 16 22 36
> 1 000 ≤ 1 500
> 1 500 ≤ 2 000 14 18 22 28 36 44
> 2 000 ≤ 3 000 18 22 25 36 44 50

Replace, in the conformity statement, the word “clearance” with “CLEARANCE” (in SMALL CAPS).

6.5.2.3.1 General
Replace, in the second paragraph, the words “required clearance” with “required CLEARANCE”.
Add the following two new subclauses, Table 4, Table 5, Table 14, Figure 15, Figure 16 and
Figure 17:
6.5.2.5 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES
6.5.2.5.1 General
6.5.2.5.1.1 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES shall
withstand the electrical and mechanical stresses that may occur in NORMAL USE and in all
RATED environmental conditions (see 1.4) during the intended life of the probe assembly.
The manufacturer should take the expected life of the probe assembly into account when
selecting insulating materials.
Conformity is checked by both of the following tests:
a) the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s using the applicable test
voltage of Table 4 or the impulse voltage test of 6.6.5.3 using the applicable test voltage
of Table 14;
b) the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of 6.6.5.2,
with a duration of at least 1 min using the test voltage determined by 6.5.2.5.1.2.
NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of
solid insulation.
– 8 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
Table 4 – a.c. test voltages for testing electric strength
of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES
a.c. test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V r.m.s
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION

MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
V
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
≤ 50 370 500 840 500 720 1300
> 50 ≤ 100 500 840 1 400 720 1 300 2 200
840 1 400 2 200 1 300 2 200 3 500
> 100 ≤ 150
> 150 ≤ 300 1 400 2 200 3 300 2 200 3 500 5 100
> 300 ≤ 600 2 200 3 300 4 300 3 500 5 100 7 000
3 300 4 300 6 600 5 100 7 000 10 000
> 600 ≤ 1 000
4 300 5 400 8 200 7 400 9 700 15 000
> 1 000 ≤ 1 500
> 1 500 ≤ 2 000 6 600 8 200 9 700 12 000 15 000 18 000
> 2 000 ≤ 3 000 8 200 9 700 11 000 15 000 18 000 20 000

Table 14 – Impulse test voltages for testing electric strength
of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES
Impulse test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V peak
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION

MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
V
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
≤ 50 500 800 1 500 800 1 280 2 400
800 1 500 2 500 1 280 2 400 4 000
> 50 ≤ 100
1 500 2 500 4 000 2 400 4 000 6 400
> 100 ≤ 150
> 150 ≤ 300 2 500 4 000 6 000 4 000 6 400 9 600
4 000 6 000 8 000 6 400 9 600 12 800
> 300 ≤ 600
6 000 8 000 12 000 9 600 12 800 19 200
> 600 ≤ 1 000
> 1 000 ≤ 1 500 8 000 10 000 15 000 13 500 17 900 27 100
> 1 500 ≤ 2 000 12 000 15 000 18 000 21 400 27 100 32 000
15 000 18 000 20 000 27 100 32 000 36 000
> 2 000 ≤ 3 000
6.5.2.5.1.2 Test voltage values for testing long term stress of solid insulation are determined
as follows:
The test voltage for BASIC INSULATION and SUPPLEMENTARY INSULATION is calculated from:
U = A × U + B
T N
where
U is the test voltage;
T
is the nominal a.c. r.m.s. line-to-neutral or d.c. voltage of mains being measured;
U
N
© IEC 2018
A and B are parameters determined as follows:
≤ 1 000 V, A = 1 and B = 1 200 V
when U
N
when U > 1 000 V, A = 1,5 and B = 750 V
N
The a.c. test voltage is equal to U and the d.c. test voltage is equal to 1,414 × U .
T T
For REINFORCED INSULATION, the test voltage value is twice the value for BASIC INSULATION.
6.5.2.5.1.3 Solid insulation shall also meet the following requirements, as applicable:
1) for solid insulation used as an ENCLOSURE or PROTECTIVE FINGERGUARD, the requirements
of Clause 8;
2) for moulded and potted parts, the requirements of 6.5.2.5.2;
3) for insulating layers of printed wiring boards, the requirements of 6.5.2.5.3;
4) for thin-film insulation, the requirements of 6.5.2.5.4.
Conformity is checked as specified in 6.5.2.5.2 to 6.5.2.5.4, and in Clause 8, as applicable.
6.5.2.5.2 Moulded and potted parts
For BASIC INSULATION, SUPPLEMENTARY INSULATION, and REINFORCED INSULATION, conductors
located between the same two layers moulded together (see Figure 15, item L) shall be
separated by at least the applicable minimum distance of Table 5 after the moulding is
completed.
Conformity is checked by inspection and either by measurement of the separation or by
inspection of the manufacturer’s specifications.

Key
1 layer 1
2 layer 2
C conductor
L distance between conductors
Figure 15 – Distance between conductors on an interface between two layers

6.5.2.5.3 Insulating layers of printed wiring boards
For BASIC INSULATION, SUPPLEMENTARY INSULATION and REINFORCED INSULATION, conductors
located between the same two layers (see Figure 16, item L) shall be separated by at least
the applicable minimum distance of Table 5.
Conformity is checked by inspection and either by measurement of the separation or by
inspection of the manufacturer’s specifications.

– 10 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
Key
L distance between conductors on the same surface
A layers
C conductors
Figure 16 – Distance between adjacent conductors
along an interface of two layers

Table 5 – Minimum values for distance or thickness
WORKING VOLTAGE Minimum thickness Minimum distance L
a
(see Figure 16)
V mm mm
0,4 0,4
≤ 300
0,6 0,6
> 300 ≤ 600
b
> 600 ≤ 1 000 1,0 1,0
a
These values apply for BASIC INSULATION, SUPPLEMENTARY INSULATION and REINFORCED INSULATION.
b
For voltage above 1 000 V, a partial discharge test should be used (test procedure under consideration).

REINFORCED INSULATION of insulating layers of printed wiring boards (see Figure 16, item A)
shall also have adequate electric strength through the respective layers. One of the following
methods shall be used.
a) The thickness of the insulation is at least the value of Table 5.
Conformity is checked by inspection and either by measurement of the separation or by
inspection of the manufacturer’s specifications.
b) The insulation is assembled from at least two separate layers of printed wiring board
materials, each of which is RATED by the manufacturer of the material for an electric
strength of at least the value of the applicable test voltage of Table 4 or Table 14 for BASIC
INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.
c) The insulation is assembled from at least two separate layers of printed wiring board
materials, and the combination of layers is RATED by the manufacturer of the material for
an electric strength of at least the value of the applicable test voltage of Table 4 or
Table 14 for REINFORCED INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.

6.5.2.5.4 Thin-film insulation
For BASIC INSULATION, SUPPLEMENTARY INSULATION, and REINFORCED INSULATION, conductors
located between the same two layers (see Figure 17, item L) shall be separated by at least
the applicable SPACINGS of 6.5.2.2 and 6.5.2.4.

© IEC 2018
Conformity is checked by inspection and either by measurement of the separation or by
inspection of the manufacturer’s specifications.

Key
L distance between adjacent conductors
A layers of thin-film material such as tape and polyester film
C conductors
NOTE There might be air present between the layers.
Figure 17 – Distance between adjacent conductors located
between the same two layers
REINFORCED INSULATION through the layers of thin-film insulation shall also have adequate
electric strength. One of the following methods shall be used.
a) The thickness through the insulation is at least the value of Table 5.
Conformity is checked by inspection and either by measurement of the separation or by
inspection of the manufacturer’s specifications.
b) The insulation consists of at least two separate layers of thin-film materials, each of which
is RATED by the manufacturer of the material for an electric strength of at least the value of
the applicable test voltage of Table 4 or Table 14 for BASIC INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.
c) The insulation consists of at least three separate layers of thin-film materials, any two of
which have been tested to exhibit adequate electric strength.
Conformity is checked by the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s
applied to two of the three layers using the applicable test voltage of Table 4 for
REINFORCED INSULATION.
For the purposes of this test, a special sample can be assembled with only two layers of
the material.
6.5.2.6 Solid insulation for probe assemblies which are not RATED for MEASUREMENT
CATEGORIES
Solid insulation for probe assemblies which are not RATED for MEASUREMENT CATEGORIES shall
withstand the electrical and mechanical stresses that may occur in normal use and in all
RATED environmental conditions (see 1.4) during the intended life of the probe assembly.
The manufacturer should take the expected life of the probe assembly into account when
selecting insulating materials.
Conformity is checked by both of the following tests:
a) by the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s or the impulse voltage test
of 6.6.5.3 using the test voltage determined by the following procedure:

– 12 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
i) a theoretically required CLEARANCE for BASIC INSULATION or SUPPLEMENTARY INSULATION
is calculated according to 6.5.2.3.
Minimum CLEARANCES for POLLUTION DEGREES 2 and 3 do not apply:
ii) for REINFORCED INSULATION, CLEARANCE is twice the value for BASIC INSULATION;
iii) the applicable test voltage is from Table 10 for the calculated required CLEARANCE;
b) by the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of
6.6.5.2, with a duration of at least 1 min using the test voltage determined as follows:
BASIC INSULATION and SUPPLEMENTARY INSULATION, the test voltage is 1,5 times the
i) for
WORKING voltage;
ii) for REINFORCED INSULATION, the test voltage is twice the value for BASIC INSULATION.
NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of
solid insulation.
Solid insulation shall also meet the following requirements, as applicable:
1) for solid insulation used as an ENCLOSURE or PROTECTIVE FINGERGUARD, the requirements
of Clause 8;
2) for moulded and potted parts, the requirements of 6.5.2.5.2;
3) for insulating layers of printed wiring boards, the requirements of 6.5.2.5.3, except that the
applicable test voltage is determined using the procedure of 6.5.2.6 a);
4) for thin-film insulation, the requirements of 6.5.2.5.4, except that the applicable SPACINGS
are from 6.5.2.3 and 6.5.2.4, and the applicable test voltage is determined using the
procedure of 6.5.2.6 a).
Conformity is checked as specified in 6.5.2.5.2 to 6.5.2.5.4 with the test voltages of 6.5.2.6 a),
and in Clause 8, as applicable.

6.6.4 Test voltages
Replace the existing first paragraph with the following:
Voltage tests for solid insulation are applied using the values specified in 6.5.2.5 and 6.5.2.6.

6.7.4 PROBE WIRE attachment
6.7.4.1 General
Replace the existing conformity statement with the following:
Conformity is checked by inspection and by applying the tests of 6.7.4.2 to 6.7.4.4. After the
tests,
a) the insulation of the PROBE WIRE shall not have been cut or torn, and shall not have moved
more than 2 mm in the bushing;
b) SPACINGS shall not have been reduced below the applicable values of 6.5.2.2 or 6.5.2.3
and 6.5.2.4;
c) the PROBE WIRE shall pass the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b);
d) no more than 75 % of the copper strands of the PROBE WIRE shall be broken.

© IEC 2018
8 Resistance to mechanical stresses
8.1 General
Replace, in the existing first sentence of the third paragraph, “the a.c. voltage test or the d.c.
voltage test of 6.6 using the test voltage and duration of Table 4” with “the applicable test of
6.5.2.5.1.1 b) or 6.5.2.6 b)”.

8.4 Impact swing test
Replace, in the first sentence of the first paragraph, “5 mm” with “50 mm” and “70 kg/m ” with
“700 kg/m ”.
9 Temperature limits and protection against the spread of fire
9.1 General
Replace the existing second paragraph with the following two paragraphs:
The temperature of easily touched surfaces shall not exceed the values below in NORMAL
CONDITION, and 105 °C in SINGLE FAULT CONDITION, at an ambient temperature of 40 °C.
Easily touched surfaces of probe assemblies RATED for a maximum ambient temperature
above 40 °C are permitted to exceed the values of below in NORMAL CONDITION, and to exceed
105 °C in SINGLE FAULT CONDITION, by not more than the amount by which the maximum RATED
temperature exceeds 40 °C.
Replace, in the conformity statement, the reference “6.6.5” with “6.6”.

11 Protection against HAZARDS from fluids
11.2 Cleaning
Replace, in the existing second sentence of the conformity statement, the words “the a.c.
voltage test or the d.c. voltage test of 6.6 using the applicable test voltage and duration of
Table 4” with “the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b)”.

11.3 Specially protected probe assemblies
Replace, in the existing conformity statement, the words “the a.c. voltage test or the d.c.
voltage test of 6.6 using the applicable test voltage and duration of Table 4” with “the
applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b)”.

– 14 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
12 Components
12.3.2 RATING of PROBE WIRE
Replace the first sentence of the existing conformity statement with the following:
Conformity is checked by inspection, and by the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b)
for REINFORCED INSULATION.
Add at the end of the conformity statement “(see also 5.2 and 5.4.3 I))”.

12.3.3 Pressure test at high temperature for insulations
Delete the existing second paragraph.
Replace the existing conformity statement with the following:
Conformity is checked by the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b) for REINFORCED
INSULATION (without humidity preconditioning).

12.3.4 Tests for resistance of insulation to cracking
Delete, in the first existing paragraph, the second sentence.
Replace the existing conformity statement with:
Conformity is checked by inspection and by the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b)
for REINFORCED INSULATION (without humidity preconditioning).

12.3.5 Voltage tests
Replace the existing fifth paragraph with the following:
REINFORCED INSULATION (without humidity
The applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b) for
preconditioning) is then performed. The test voltage is applied between the conductor of the
test specimen and the metal mandrel. After 1 min at the specified test voltage, the test
voltage is increased at a rate not exceeding 500 V/s until dielectric breakdown occurs. If
dielectric breakdown does not occur, breakdown voltage can be considered as twice the value
in 6.5.2.5.1.2 or 6.5.2.6 b) (or 10 kV). The dielectric breakdown voltage values are recorded
separately for unaged specimens and oven-aged specimens. The average of the dielectric
breakdown voltage values is calculated and recorded separately for unaged specimens and
oven-aged specimens.
12.3.6.3 Preparation and conditioning of samples
Replace, in the first
...