Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement.

Amendement 1 - Règles de sécurité pour appareils électriques de mesurage, de régulation et de laboratoire - Partie 031: Exigences de sécurité pour sondes équipées portatives et manipulées à la main pour mesurage et essais électriques

General Information

Status
Published
Publication Date
28-May-2018
Current Stage
PPUB - Publication issued
Completion Date
29-May-2018
Ref Project

Buy Standard

Standard
IEC 61010-031:2015/AMD1:2018 - Amendment 1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement.
English and French language
33 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (sample)

IEC 61010-031
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ
AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement
Règles de sécurité pour appareils électriques de mesurage, de régulation et de
laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et
manipulées à la main pour mesurage et essais électriques
IEC 61010-031:2015-05/AMD1:2018-05(en-fr)
---------------------- Page: 1 ----------------------
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright © 2018 IEC, Geneva, Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form

or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from

either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC

copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or

your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite

ni utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie

et les microfilms, sans l'accord écrit de l'IEC ou du Comité national de l'IEC du pays du demandeur. Si vous avez des

questions sur le copyright de l'IEC ou si vous désirez obtenir des droits supplémentaires sur cette publication, utilisez

les coordonnées ci-après ou contactez le Comité national de l'IEC de votre pays de résidence.

IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC

The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes

International Standards for all electrical, electronic and related technologies.
About IEC publications

The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the

latest edition, a corrigenda or an amendment might have been published.
IEC Catalogue - webstore.iec.ch/catalogue Electropedia - www.electropedia.org

The stand-alone application for consulting the entire The world's leading online dictionary of electronic and

bibliographical information on IEC International Standards, electrical terms containing 21 000 terms and definitions in

Technical Specifications, Technical Reports and other English and French, with equivalent terms in 16 additional

documents. Available for PC, Mac OS, Android Tablets and languages. Also known as the International Electrotechnical

iPad. Vocabulary (IEV) online.

IEC publications search - webstore.iec.ch/advsearchform IEC Glossary - std.iec.ch/glossary

The advanced search enables to find IEC publications by a 67 000 electrotechnical terminology entries in English and

variety of criteria (reference number, text, technical French extracted from the Terms and Definitions clause of

committee,…). It also gives information on projects, replaced IEC publications issued since 2002. Some entries have been

and withdrawn publications. collected from earlier publications of IEC TC 37, 77, 86 and

CISPR.
IEC Just Published - webstore.iec.ch/justpublished

Stay up to date on all new IEC publications. Just Published IEC Customer Service Centre - webstore.iec.ch/csc

details all new publications released. Available online and If you wish to give us your feedback on this publication or

also once a month by email. need further assistance, please contact the Customer Service

Centre: sales@iec.ch.
A propos de l'IEC

La Commission Electrotechnique Internationale (IEC) est la première organisation mondiale qui élabore et publie des

Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications IEC

Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possédez l’édition la

plus récente, un corrigendum ou amendement peut avoir été publié.
Catalogue IEC - webstore.iec.ch/catalogue Electropedia - www.electropedia.org
Application autonome pour consulter tous les renseignements
Le premier dictionnaire en ligne de termes électroniques et
bibliographiques sur les Normes internationales,
électriques. Il contient 21 000 termes et définitions en anglais
Spécifications techniques, Rapports techniques et autres
et en français, ainsi que les termes équivalents dans 16
documents de l'IEC. Disponible pour PC, Mac OS, tablettes
langues additionnelles. Egalement appelé Vocabulaire
Android et iPad.
Electrotechnique International (IEV) en ligne.
Recherche de publications IEC -
Glossaire IEC - std.iec.ch/glossary
webstore.iec.ch/advsearchform
67 000 entrées terminologiques électrotechniques, en anglais

La recherche avancée permet de trouver des publications IEC et en français, extraites des articles Termes et Définitions des

en utilisant différents critères (numéro de référence, texte, publications IEC parues depuis 2002. Plus certaines entrées

comité d’études,…). Elle donne aussi des informations sur les antérieures extraites des publications des CE 37, 77, 86 et

projets et les publications remplacées ou retirées. CISPR de l'IEC.

IEC Just Published - webstore.iec.ch/justpublished Service Clients - webstore.iec.ch/csc

Restez informé sur les nouvelles publications IEC. Just Si vous désirez nous donner des commentaires sur cette

Published détaille les nouvelles publications parues. publication ou si vous avez des questions contactez-nous:

Disponible en ligne et aussi une fois par mois par email. sales@iec.ch.
---------------------- Page: 2 ----------------------
IEC 61010-031
Edition 2.0 2018-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
G ROUP SAFETY PUBLICATION
PU BLICATION GROUPÉE DE SÉCURITÉ
AMENDMENT 1
AMENDEMENT 1
Safety requirements for electrical equipment for measurement, control and
laboratory use –
Part 031: Safety requirements for hand-held and hand-manipulated probe
assemblies for electrical test and measurement
Règles de sécurité pour appareils électriques de mesurage, de régulation et de
laboratoire –
Partie 031: Exigences de sécurité pour sondes équipées portatives et
manipulées à la main pour mesurage et essais électriques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 19.080 ISBN 978-2-8322-6159-0

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
FOREWORD

This amendment has been prepared by IEC technical committee 66: Safety of measuring,

control and laboratory equipment.

This bilingual version (2018-10) corresponds to the monolingual English version, published in

2018-05.
The text of this standard is based on the following documents:
FDIS Report on voting
66/664/FDIS 66/670/RVD

Full information on the voting for the approval of this amendment can be found in the report

on voting indicated in the above table.
The French version of this amendment has not been voted upon.

The committee has decided that the contents of this amendment and the base publication will

remain unchanged until the stability date indicated on the IEC website under

"http://webstore.iec.ch" in the data related to the specific publication. At this date, the

publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Title
Replace the part title as follows:
Part 031: Safety requirements for hand-held and hand-manipulated
probe assemblies for electrical test and measurement
1 Scope and object
1.1.1 Probe assemblies included in scope
Figure 4 – Examples of Type D probe assemblies
Delete, in key 3, the words “or clamp”.
---------------------- Page: 4 ----------------------
IEC 61010-031:2015/AMD1:2018 – 3 –
© IEC 2018
3 Terms and definitions
3.1.1
TERMINAL
Note 1 to entry:
Delete the word “connectors,”.
3.1.5
CONNECTOR

Delete, in the definition, the words “a CONNECTOR of” so that the end of the sentence will read:

“…to connect to a TERMINAL of the equipment or to another probe assembly”.
3.4.11
MEASUREMENT CATEGORY
Replace the existing text of the definition with the following:

classification of testing and measuring circuits according to the types of mains to which they

are intended to be connected
4 Tests
4.3.9 Duty cycle
Replace the existing title of 4.3.9 with the following:
4.3.9 Short-term or intermittent operation
4.4.4.2 Temperature
Replace the existing second paragraph with the following:

This temperature is determined by measuring the temperature rise of the surface or part and

adding it to the ambient temperature of 40 °C, or to the maximum RATED ambient temperature

if higher.
4.5.2 Fuses

Replace, in the fourth sentence of the second paragraph, the word “MAINS” (in SMALL CAPS)

with “mains” (in regular font).
5 Marking and documentation
5.1.5 RATING

Replace, in list item a) of the first paragraph, the words “(see also 5.4.3 f) and g))” with “(see

also 5.4.3 k))”.
---------------------- Page: 5 ----------------------
– 4 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6 Protection against electric shock
6.2.2 Examination

Figure 6 – Methods for determination of ACCESSIBLE parts (see 6.2) and for voltage tests

(see 6.4.2)
Replace the existing subfigures 6c and 6d with the following new subfigures:

Connecting parts are partially mated so as just to make electrical contact while allowing maximum access to the

test finger.
Note the two possible positions of the test finger.
Figure 6c – Partially mated probe assemblies (see 6.2 and 6.4.2 b))
Key
F rigid test finger (see Figure B.1)
H potentially HAZARDOUS LIVE part
Note the two possible positions of the test finger.
Figure 6d – Unmated parts of a probe assembly (see 6.2 and 6.4.2 c))
6.3.4.1 General
Replace, in the first paragraph, the existing list with the following:
a) the probe body;
b) hand-held or hand-manipulated parts of each CONNECTOR;

c) 150 mm ± 20 mm of the PROBE WIRE or the maximum length of the cable whichever is

shorter;
d) other hand-held or hand-manipulated parts.
---------------------- Page: 6 ----------------------
IEC 61010-031:2015/AMD1:2018 – 5 –
© IEC 2018
Figure 8 – Voltage and touch current measurement
Delete, in the text of key item 2c, the words “(see 12.3.2)”.
6.3.4.2 Probe assemblies with floating outer conductors
Figure 10 – Voltage and touch current measurement with shielded test probe
Delete, in the text of key item 2c, the words “(see 12.3.2)”.
6.3.4.3 High frequency test probes

Replace, in the fourth paragraph, “the circuit from A.3” with “the circuit from Figure A.3”.

6.4.1 General
Replace, in the third paragraph, the existing list with the following list:

a) DOUBLE INSULATION, consisting of BASIC INSULATION plus SUPPLEMENTARY INSULATION (see

6.4.6)
b) BASIC INSULATION plus impedance (see 6.4.4);
c) REINFORCED INSULATION (see 6.4.6);
d) PROTECTIVE IMPEDANCE (see 6.4.5).
6.4.2 CONNECTORS
Add, at the end of the sentence of 6.4.2 c) 2), “(see Figure 5)”.
6.4.3.2 Protection by a PROTECTIVE FINGERGUARD
Replace the existing third paragraph with the following:

The height of the PROTECTIVE FINGERGUARD from the side where the fingers are intended to be

applied shall be at least 2 mm.
6.4.3.4 Protection by tactile indicator
Replace the existing first paragraph with the following:

SPRING-LOADED CLIPS RATED for MEASUREMENT CATEGORY II or without MEASUREMENT CATEGORY

for maximum 300 V which require finger pressure at about 90° to the axis of the clip are

acceptable without a PROTECTIVE FINGERGUARD, provided that there is a tactile indicator to

indicate the limit of safe access for the OPERATOR.
---------------------- Page: 7 ----------------------
– 6 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
6.4.3.5 PROBE TIPS used as CONNECTORS
Replace the text with the following text:

PROBE TIPS which can be used as CONNECTORS and are intended to be connected to specified

accessories (for example to a SPRING-LOADED CLIP) shall, in combination with those

accessories, also meet the requirements for CONNECTORS in fully-mated position and partially-

mated position (see 6.4.2 a) and b)).
OLID INSULATION
6.5.1.2.4 S

Delete the entire subclause including Table 4, Table 5, Figure 15, Figure 16 and Figure 17.

Add the following new subclause:
6.5.1.3 Solid insulation

The term “solid insulation” is used to describe many different types of construction, including

monolithic blocks of insulating material and insulation subsystems composed of multiple

insulating materials, organized in layers or otherwise.

The electric strength of a thickness of solid insulation is considerably greater than that of the

same thickness of air. The insulating distances through solid insulation are therefore typically

smaller than the distances through air. As a result, electric fields in solid insulation are

typically higher, and often are less homogeneous.

Solid insulation material may contain gaps or voids. When a solid insulation system is

constructed from layers of solid materials, there are also likely to be gaps or voids between

layers. These voids will perturb the electric field so that a disproportionately large part of the

electric field is located in the void, potentially causing ionization within the void, resulting in

partial discharge. These partial discharges will influence the adjacent solid insulation and may

reduce its service life.

Solid insulation is not a renewable medium: damage is cumulative over the life of the

equipment. Solid insulation is also subject to ageing and to degradation from repeated high

voltage testing.
Conformity is checked as specified in 6.5.2.5 and 6.5.2.6.
6.5.2.2 CLEARANCES for probe assemblies of MEASUREMENT CATEGORIES II, III and IV
Replace the existing Table 6 with the following:
---------------------- Page: 8 ----------------------
IEC 61010-031:2015/AMD1:2018 – 7 –
© IEC 2018
Table 6 – CLEARANCES of probe assemblies RATED for MEASUREMENT CATEGORIES
Nominal a.c. r.m.s. CLEARANCE
line-to-neutral or
d.c. voltage of mm
mains to which the
BASIC INSULATION
probe assembly is
REINFORCED INSULATION
and SUPPLEMENTARY INSULATION
designed to be
connected
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
0,04 0,1 0,5 0,10 0,32 1,4
≤ 50
> 50 ≤ 100 0,1 0,5 1,5 0,32 1,4 3,0
0,5 1,5 3,0 1,4 3,0 6,0
> 100 ≤ 150
1,5 3,0 5,5 3,0 6,0 10,4
> 150 ≤ 300
> 300 ≤ 600 3,0 5,5 8 6,0 10,4 15
> 600 ≤ 1 000 5,5 8 14 10,4 15 23,9
8 11 18 16 22 36
> 1 000 ≤ 1 500
> 1 500 ≤ 2 000 14 18 22 28 36 44
> 2 000 ≤ 3 000 18 22 25 36 44 50

Replace, in the conformity statement, the word “clearance” with “CLEARANCE” (in SMALL CAPS).

6.5.2.3.1 General

Replace, in the second paragraph, the words “required clearance” with “required CLEARANCE”.

Add the following two new subclauses, Table 4, Table 5, Table 14, Figure 15, Figure 16 and

Figure 17:
6.5.2.5 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES
6.5.2.5.1 General

6.5.2.5.1.1 Solid insulation of probe assemblies RATED for MEASUREMENT CATEGORIES shall

withstand the electrical and mechanical stresses that may occur in NORMAL USE and in all

RATED environmental conditions (see 1.4) during the intended life of the probe assembly.

The manufacturer should take the expected life of the probe assembly into account when

selecting insulating materials.
Conformity is checked by both of the following tests:

a) the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s using the applicable test

voltage of Table 4 or the impulse voltage test of 6.6.5.3 using the applicable test voltage

of Table 14;

b) the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of 6.6.5.2,

with a duration of at least 1 min using the test voltage determined by 6.5.2.5.1.2.

NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of

solid insulation.
---------------------- Page: 9 ----------------------
– 8 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
Table 4 – a.c. test voltages for testing electric strength
of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES
a.c. test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V r.m.s
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
≤ 50 370 500 840 500 720 1300
> 50 ≤ 100 500 840 1 400 720 1 300 2 200
840 1 400 2 200 1 300 2 200 3 500
> 100 ≤ 150
> 150 ≤ 300 1 400 2 200 3 300 2 200 3 500 5 100
> 300 ≤ 600 2 200 3 300 4 300 3 500 5 100 7 000
3 300 4 300 6 600 5 100 7 000 10 000
> 600 ≤ 1 000
4 300 5 400 8 200 7 400 9 700 15 000
> 1 000 ≤ 1 500
> 1 500 ≤ 2 000 6 600 8 200 9 700 12 000 15 000 18 000
> 2 000 ≤ 3 000 8 200 9 700 11 000 15 000 18 000 20 000
Table 14 – Impulse test voltages for testing electric strength
of solid insulation in probe assemblies RATED for MEASUREMENT CATEGORIES
Impulse test voltage
Nominal a.c. r.m.s.
line-to-neutral or
V peak
d.c. voltage of
mains being BASIC INSULATION
REINFORCED INSULATION
measured and SUPPLEMENTARY INSULATION
MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT MEASUREMENT
CATEGORY II CATEGORY III CATEGORY IV CATEGORY II CATEGORY III CATEGORY IV
≤ 50 500 800 1 500 800 1 280 2 400
800 1 500 2 500 1 280 2 400 4 000
> 50 ≤ 100
1 500 2 500 4 000 2 400 4 000 6 400
> 100 ≤ 150
> 150 ≤ 300 2 500 4 000 6 000 4 000 6 400 9 600
4 000 6 000 8 000 6 400 9 600 12 800
> 300 ≤ 600
6 000 8 000 12 000 9 600 12 800 19 200
> 600 ≤ 1 000
> 1 000 ≤ 1 500 8 000 10 000 15 000 13 500 17 900 27 100
> 1 500 ≤ 2 000 12 000 15 000 18 000 21 400 27 100 32 000
15 000 18 000 20 000 27 100 32 000 36 000
> 2 000 ≤ 3 000

6.5.2.5.1.2 Test voltage values for testing long term stress of solid insulation are determined

as follows:

The test voltage for BASIC INSULATION and SUPPLEMENTARY INSULATION is calculated from:

U = A × U + B
T N
where
U is the test voltage;

is the nominal a.c. r.m.s. line-to-neutral or d.c. voltage of mains being measured;

---------------------- Page: 10 ----------------------
IEC 61010-031:2015/AMD1:2018 – 9 –
© IEC 2018
A and B are parameters determined as follows:
≤ 1 000 V, A = 1 and B = 1 200 V
when U
when U > 1 000 V, A = 1,5 and B = 750 V

The a.c. test voltage is equal to U and the d.c. test voltage is equal to 1,414 × U .

T T

For REINFORCED INSULATION, the test voltage value is twice the value for BASIC INSULATION.

6.5.2.5.1.3 Solid insulation shall also meet the following requirements, as applicable:

1) for solid insulation used as an ENCLOSURE or PROTECTIVE FINGERGUARD, the requirements

of Clause 8;
2) for moulded and potted parts, the requirements of 6.5.2.5.2;

3) for insulating layers of printed wiring boards, the requirements of 6.5.2.5.3;

4) for thin-film insulation, the requirements of 6.5.2.5.4.

Conformity is checked as specified in 6.5.2.5.2 to 6.5.2.5.4, and in Clause 8, as applicable.

6.5.2.5.2 Moulded and potted parts

For BASIC INSULATION, SUPPLEMENTARY INSULATION, and REINFORCED INSULATION, conductors

located between the same two layers moulded together (see Figure 15, item L) shall be

separated by at least the applicable minimum distance of Table 5 after the moulding is

completed.

Conformity is checked by inspection and either by measurement of the separation or by

inspection of the manufacturer’s specifications.
Key
1 layer 1
2 layer 2
C conductor
L distance between conductors
Figure 15 – Distance between conductors on an interface between two layers
6.5.2.5.3 Insulating layers of printed wiring boards

For BASIC INSULATION, SUPPLEMENTARY INSULATION and REINFORCED INSULATION, conductors

located between the same two layers (see Figure 16, item L) shall be separated by at least

the applicable minimum distance of Table 5.

Conformity is checked by inspection and either by measurement of the separation or by

inspection of the manufacturer’s specifications.
---------------------- Page: 11 ----------------------
– 10 – IEC 61010-031:2015/AMD1:2018
© IEC 2018
Key
L distance between conductors on the same surface
A layers
C conductors
Figure 16 – Distance between adjacent conductors
along an interface of two layers
Table 5 – Minimum values for distance or thickness
WORKING VOLTAGE Minimum thickness Minimum distance L
(see Figure 16)
V mm mm
0,4 0,4
≤ 300
0,6 0,6
> 300 ≤ 600
> 600 ≤ 1 000 1,0 1,0

These values apply for BASIC INSULATION, SUPPLEMENTARY INSULATION and REINFORCED INSULATION.

For voltage above 1 000 V, a partial discharge test should be used (test procedure under consideration).

REINFORCED INSULATION of insulating layers of printed wiring boards (see Figure 16, item A)

shall also have adequate electric strength through the respective layers. One of the following

methods shall be used.
a) The thickness of the insulation is at least the value of Table 5.

Conformity is checked by inspection and either by measurement of the separation or by

inspection of the manufacturer’s specifications.

b) The insulation is assembled from at least two separate layers of printed wiring board

materials, each of which is RATED by the manufacturer of the material for an electric

strength of at least the value of the applicable test voltage of Table 4 or Table 14 for BASIC

INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.

c) The insulation is assembled from at least two separate layers of printed wiring board

materials, and the combination of layers is RATED by the manufacturer of the material for

an electric strength of at least the value of the applicable test voltage of Table 4 or

Table 14 for REINFORCED INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.
6.5.2.5.4 Thin-film insulation

For BASIC INSULATION, SUPPLEMENTARY INSULATION, and REINFORCED INSULATION, conductors

located between the same two layers (see Figure 17, item L) shall be separated by at least

the applicable SPACINGS of 6.5.2.2 and 6.5.2.4.
---------------------- Page: 12 ----------------------
IEC 61010-031:2015/AMD1:2018 – 11 –
© IEC 2018

Conformity is checked by inspection and either by measurement of the separation or by

inspection of the manufacturer’s specifications.
Key
L distance between adjacent conductors
A layers of thin-film material such as tape and polyester film
C conductors
NOTE There might be air present between the layers.
Figure 17 – Distance between adjacent conductors located
between the same two layers

REINFORCED INSULATION through the layers of thin-film insulation shall also have adequate

electric strength. One of the following methods shall be used.
a) The thickness through the insulation is at least the value of Table 5.

Conformity is checked by inspection and either by measurement of the separation or by

inspection of the manufacturer’s specifications.

b) The insulation consists of at least two separate layers of thin-film materials, each of which

is RATED by the manufacturer of the material for an electric strength of at least the value of

the applicable test voltage of Table 4 or Table 14 for BASIC INSULATION.
Conformity is checked by inspection of the manufacturer’s specifications.

c) The insulation consists of at least three separate layers of thin-film materials, any two of

which have been tested to exhibit adequate electric strength.

Conformity is checked by the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s

applied to two of the three layers using the applicable test voltage of Table 4 for

REINFORCED INSULATION.

For the purposes of this test, a special sample can be assembled with only two layers of

the material.

6.5.2.6 Solid insulation for probe assemblies which are not RATED for MEASUREMENT

CATEGORIES

Solid insulation for probe assemblies which are not RATED for MEASUREMENT CATEGORIES shall

withstand the electrical and mechanical stresses that may occur in normal use and in all

RATED environmental conditions (see 1.4) during the intended life of the probe assembly.

The manufacturer should take the expected life of the probe assembly into account when

selecting insulating materials.
Conformity is checked by both of the following tests:

a) by the a.c. voltage test of 6.6.5.1 with a duration of at least 5 s or the impulse voltage test

of 6.6.5.3 using the test voltage determined by the following procedure:
---------------------- Page: 13 ----------------------
– 12 – IEC 61010-031:2015/AMD1:2018
© IEC 2018

i) a theoretically required CLEARANCE for BASIC INSULATION or SUPPLEMENTARY INSULATION

is calculated according to 6.5.2.3.
Minimum CLEARANCES for POLLUTION DEGREES 2 and 3 do not apply:

ii) for REINFORCED INSULATION, CLEARANCE is twice the value for BASIC INSULATION;

iii) the applicable test voltage is from Table 10 for the calculated required CLEARANCE;

b) by the a.c. voltage test of 6.6.5.1 or if stressed only by d.c., the d.c. voltage test of

6.6.5.2, with a duration of at least 1 min using the test voltage determined as follows:

BASIC INSULATION and SUPPLEMENTARY INSULATION, the test voltage is 1,5 times the
i) for
WORKING voltage;

ii) for REINFORCED INSULATION, the test voltage is twice the value for BASIC INSULATION.

NOTE Test a) checks the effects of transient overvoltages, while test b) checks the effects of long-term stress of

solid insulation.
Solid insulation shall also meet the following requirements, as applicable:

1) for solid insulation used as an ENCLOSURE or PROTECTIVE FINGERGUARD, the requirements

of Clause 8;
2) for moulded and potted parts, the requirements of 6.5.2.5.2;

3) for insulating layers of printed wiring boards, the requirements of 6.5.2.5.3, except that the

applicable test voltage is determined using the procedure of 6.5.2.6 a);

4) for thin-film insulation, the requirements of 6.5.2.5.4, except that the applicable SPACINGS

are from 6.5.2.3 and 6.5.2.4, and the applicable test voltage is determined using the

procedure of 6.5.2.6 a).

Conformity is checked as specified in 6.5.2.5.2 to 6.5.2.5.4 with the test voltages of 6.5.2.6 a),

and in Clause 8, as applicable.
6.6.4 Test voltages
Replace the existing first paragraph with the following:

Voltage tests for solid insulation are applied using the values specified in 6.5.2.5 and 6.5.2.6.

6.7.4 PROBE WIRE attachment
6.7.4.1 General
Replace the existing conformity statement with the following:

Conformity is checked by inspection and by applying the tests of 6.7.4.2 to 6.7.4.4. After the

tests,

a) the insulation of the PROBE WIRE shall not have been cut or torn, and shall not have moved

more than 2 mm in the bushing;

b) SPACINGS shall not have been reduced below the applicable values of 6.5.2.2 or 6.5.2.3

and 6.5.2.4;

c) the PROBE WIRE shall pass the applicable test of 6.5.2.5.1.1 b) or 6.5.2.6 b);

d) no more than 75 % of the copper strands of the PROBE WIRE shall be broken.
---------------------- Page: 14 ----------------------
IEC 61010-031:2015/AMD1:2018 – 13 –
© IEC 2018
8 Resistance to mechanical stresses
8.1 General

Replace, in the existing first sentence of the third paragraph, “the a.c. voltage test or the d.c.

voltage test of 6.6 using the test voltage and duration of Table 4” with “the applicable test of

6.5.2.5.1.1 b) or 6.5.2.6 b)”.
8.4 Impact swing test

Replace, in the first sentence of the first paragraph, “5 mm” with “50 mm” and “70 kg/m ” with

“700 kg/m ”.
9 Temperature limits and protection against the spread of fire
9.1 General
Replace the existing second paragraph with the following two paragraphs:

The temperature of easily touched surfaces shall not exceed the values below in NORMAL

CONDITION, and 105 °C in SINGLE FAULT CONDITION, at an ambient temperature of 40 °C.

Easily touched surfaces of probe assemblies RATED for a maximum ambient temperature

above 40 °C are permitted to exceed the values of below in NORMAL CONDITION, and to exceed

105 °C in SINGLE FAULT CONDITION, by not more than the amount by which the maximum RATED

temperature exceeds 40 °C.
Replace, in the conformity statement, the reference “6.6.5” with “6.6”.
11 Protection against HAZARDS from fluids
11.2 Cleaning

Replace, in the existing second sentence of the conformity statement, the words “the a.c.

voltage test or the d.c. voltage test of 6.6 using the applicable test voltage and duration of

Table 4” with “the applicable
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.