IEC 62969-4:2018

Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Dispositifs à semiconducteurs – Interface à semiconducteurs pour les véhicules automobiles - Partie 4: Méthode d'évaluation de l'interface de données destinée aux capteurs de véhicules automobiles

L’IEC 62969-4:2018 spécifie une méthode d’essai par injection directe de défaut pour l’interface à semiconducteurs des capteurs de véhicules automobiles, pouvant être utilisée pour assurer la conformité de l’interface de communication du véhicule.

General Information

• Status: Published
• Publication Date: 17-Jun-2018
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: TC 47 - Semiconductor devices
• Drafting Committee: WG 6 - TC 47/WG 6
• Current Stage: PPUB - Publication issued
• Start Date: 18-Jun-2018
• Completion Date: 29-Jun-2018

Standards Content (Sample)

IEC 62969-4 ®
Edition 1.0 2018-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Semiconductor interface for automotive vehicles –
Part 4: Evaluation method of data interface for automotive vehicle sensors

Dispositifs à semiconducteurs – Interface à semiconducteurs pour les véhicules
automobiles –
Partie 4: Méthode d’évaluation de l’interface de données destinée aux capteurs
de véhicules automobiles
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IEC 62969-4 ®
Edition 1.0 2018-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Semiconductor interface for automotive vehicles –

Part 4: Evaluation method of data interface for automotive vehicle sensors

Dispositifs à semiconducteurs – Interface à semiconducteurs pour les véhicules

automobiles –
Partie 4: Méthode d’évaluation de l’interface de données destinée aux capteurs

de véhicules automobiles
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.99 ISBN 978-2-8322-5791-3

– 2 – IEC 62969-4:2018 © IEC 2018

CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms, definitions and abbreviated terms . 6
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 7
4 Evaluation and tests . 7
4.1 Evaluation test setup . 7
4.2 Block diagram . 7
4.3 Input and output connector setup . 8
4.4 Test conditions and configurations . 8
4.5 Disturbances test conditions . 9
5 Disturbance test item . 10
5.1 Data interface load . 10
5.1.1 Variable impedance . 10
5.1.2 Direct crosstalk . 11
5.1.3 Diagonal crosstalk . 11
5.2 Data interface line status . 11
5.2.1 Short circuit . 11
5.2.2 Data interface break . 12
5.3 Fault injection . 12
5.3.1 Disturbing signals . 12
5.3.2 Overwrite signals . 14
5.3.3 Signal generator . 15
5.3.4 Trigger . 15
Annex A (informative) Description of disturbance detail items . 17
Bibliography . 19

Figure 1 – The semiconductor-based sensor data interface test with fault injection . 7
Figure 2 – Block diagram of the data interface example of duplex channel . 8
Figure 3 – Fault injection test configuration example of the sensor data interface . 10
Figure 4 – Disturbing signal put onto the data interface . 13
Figure 5 – The node receives invalid signals . 14

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES –

Part 4: Evaluation method of data interface
for automotive vehicle sensors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
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9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62969-4 has been prepared by IEC technical committee 47:
Semiconductor devices.
The text of this International Standard is based on the following documents:
FDIS Report on voting
47/2470/FDIS 47/2487/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – IEC 62969-4:2018 © IEC 2018
A list of all parts in the IEC 62969 series, published under the general title Semiconductor
devices – Semiconductor interface for automotive vehicles, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
INTRODUCTION
The IEC 62969 series is composed of four parts as follow:
• IEC 62969-1 Semiconductor devices – Semiconductor interface for automotive vehicles –
Part 1: General requirements of power interface for automotive vehicle sensors
• IEC 62969-2 Semiconductor devices – Semiconductor interface for automotive vehicles –
Part 2: Efficiency evaluation methods of wireless power transmission using resonance for
automotive vehicle sensors
• IEC 62969-3 Semiconductor devices – Semiconductor interface for automotive vehicles –
Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors
• IEC 62969-4 Semiconductor devices – Semiconductor interface for automotive vehicles –
Part 4: Evaluation method of data interface for automotive vehicle sensors
The IEC 62969 series covers power and data interfaces for sensors in automotive vehicles.
The first part covers general requirements of test conditions such as temperature, humidity,
vibration, etc., for automotive sensor power interface. It also includes various electrical
performances of power interface such as voltage drop from power source to automotive
sensors, noises, voltage level, etc. The second part covers “Efficiency evaluation methods of
wireless power transmission using resonance for automotive vehicle sensors “. The third part
covers “Shock driven piezoelectric energy harvesting for automotive vehicle sensors”. The
fourth part covers “Evaluation methods of data interface for automotive vehicle sensors”.

– 6 – IEC 62969-4:2018 © IEC 2018
SEMICONDUCTOR DEVICES –
SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES –

Part 4: Evaluation method of data interface
for automotive vehicle sensors

1 Scope
This part of IEC 62969 specifies a method of directly fault injection test for automotive
semiconductor sensor interface that can be used to support the conformance assurance in the
vehicle communications interface.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
There are no normative references in this document.
3 Terms, definitions and abbreviated terms
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1 Terms and definitions
3.1.1
data interface
transfer of data with electrical signal from a sensor source to another ECU in vehicle such as
ECU and sensors via cable or electric and/or magnetic fields through air or medium
3.1.2
fault injection
technique for improving the coverage of a test by introducing faults to device under test
3.1.3
disturbance
temporary change of environmental conditions that can cause a fault to the device under test
3.1.4
crosstalk
appearance of undesired energy in a channel, owing to the presence of a signal in another
channel, caused by, for example induction, conduction or non-linearity
[SOURCE: IEC 60050-722:1992, 722-15-03]

3.2 Abbreviated terms
ECU: Electronic Control Unit (see IEC 60050-442:1998, 442-04-22)
DUT: Device Under Test
4 Evaluation and tests
4.1 Evaluation test setup
Figure 1 shows the conceptual diagram of the semiconductor-based sensor data interface test
with fault injection.
Sensor ECU (Electronic Control Unit)
Sensor(s) Microprocessor
Fault Injection
Example: Example:
MEMS sensor, Micro-controller,
CMOS image sensor, Communication controller,
Etc. Etc.
Example:
SPI (Serial Peripheral Interface),
SCI (Serial Communication Interface),
IIC (Inter-Integrated Circuit),
Etc.
In-Vehicle Network ECU
Example:
Fault Injection
CAN, LIN, FlexRay,
Etc.
IEC
Figure 1 – The semiconductor-based sensor data interface test with fault injection
The fault injection tool can do the fault injection to a semiconductor type sensor and works as
a communication monitoring for the fault injection node and system during fault injection. The
fault injection tool provides fault injection of physical level and monitoring of node level.
It offers many new possibilities for the analysis of data interface errors. A representation of
the physical layer is often indispensable, particularly during the execution of conformity tests.
With data interface-specific trigger conditions and time synchronization, it can find the causes
of protocol errors much quicker than with a traditional test method.
4.2 Block diagram
The block diagrams of the data communication interfaces and digital or analog disturbance
units clarify the terminal assignments and uses of the externally accessible interface lines.
Figure 2 shows conceptual block diagram of the data interface example of duplex channel.
The signals for generating trigger events are evaluated via the trig-high and trig-low
connections. The digital disturbance types 'recessive' and 'dominant' are also output over
these two connections.
V represents the reference voltage of the data interface signals. If the high-speed interface
Ref
is being used, V shall be connected to the GND. When using the low-speed interface,
Ref
connection to the GND is optional.

– 8 – IEC 62969-4:2018 © IEC 2018
The supply voltage for the low-speed transceiver is fed in via V – which acts as the
Bat
operating voltage for the rest of the transceivers used in the system. Alternatively, V may
Bat
be left unconnected, and in this case an internal power supply generates a regulated voltage
of vehicle for the transceiver supply. V is not necessary for operation of the high-speed
Bat
interface.
RTH and RTL supply the voltages needed for a low-speed data interface termination by 1 kΩ
internal resistors. If required, these connections can be made to the data interface lines
directly or via supplemental external resistors in the cable connector.
1 2
Disturbance
dominant
Disturbance
recessive
Trigger
Trig-high
Trig-low
GND (V )
Ref
V
Bat
Trigger
Disturbance
recessive
RTH
RTL
Disturbance
dominant
IEC
Key
1 Operational Amplifier
2 Connector
3 Switch
Figure 2 – Block diagram of the data interface example of duplex channel
4.3 Input and output connector setup
The non-shield of the interface connectors is connected to GND. The output and input pins of
the fault injection tool connectors are connected to input port and output port of the DUT,
respectively. All port pins have a series resistance value and clamp diodes to GND and input
voltages to protect them against overloading.
4.4 Test conditions and configurations
The test specification defines three test cases of the data interface: data interface, data
interface line status, and fault injection. The disturbance test specification concerning the
physical layer test is close to the data interface.
Channel A
Channel B
4.5 Disturbances test conditions
A test procedure consists of the definition of test condition and corresponding action. With the
start of measurement, a set of test procedure can be transferred to the hardware for execution.
The test condition applies only to the DUT; it does not affect the device for the disturbance
source.
The resistor settings are validated before the configuration that is set at the disturbance test
user interface is downloaded to the hardware. This involves checking whether the current
settings may be transferred to the hardware, or whether they could result in potential
hardware damage. If there is a risk of hardware damage, transfer of the configuration to the
hardware is aborted.
To ensure that the validation process will detect potential hardware damage and prevent
transfer of the configuration that could result in damage, the voltage applied as the
disturbance voltage shall be entered in the entry voltage signals.
If no changes are made to the hardware, the V supply voltage is also used as the
cc
disturbance voltage. Therefore, the entry signal voltage has already been set in the
disturbance test.
A fault injection is placed on the data interface when a start of signal is detected. This occurs
five times within one disturbance cycle. Afterwards the data interface is left undisturbed for
some period of time such as 10 ms for signal stabilization. In this time period the data
interface can recover, and the error counters of the nodes are decremented by correct receipt
and transmission of messages.
The error rate of the protocol is according to the conformance test reference for each
interface protocol.
Figure 3 shows conceptual diagram of the fault injection test configuration example of the
sensor data interface.
– 10 – IEC 62969-4:2018 © IEC 2018

Fault Injection Test Tool
Fault Injection
Signal Monitoring Tool
Disturbance Test Tool
Data Communication Signal
Satellite ECU1
2 Satellite ECU2
SCI
SCI
Physical Interface
Physical Interface
Sensor ECU
Satellite ECU3 Satellite ECU N
2 2
Network V Diagnosis
cc
Interface
SCI SCI
Physical Interface Physical Interface
SCI
Physical Interface
IEC
Key
1  Fault injection
2  Node
3  Data communication signal
Figure 3 – Fault injection test configuration example of the sensor data interface
5 Disturbance test item
5.1 Data interface load
5.1.1 Variable impedance
5.1.1.1 Load on line
This test sets up a resistance and/or capacitance between one data interface line of a defined
channel and ground (GND). The impedance parameter consists of a capacitor and the resistor
value of the data interface-loading circuit.
5.1.1.2 Load on channel
This test sets up a resistance and/or capacitance between the high data interface and low
data interface lines of a defined channel.
No. Adjustable Parameter Description
1 Impedance of data interface-loading capacitor value pF – sets capacitor value of line-loading
circuit circuit (pF)
resistor value ohm – sets resistor value of line-loading
circuit (Ω)
Channel name – selects a channel
2 Duration of mismatch value – sets a duration value for the mismatch
unit – selects a time unit to set the mismatch duration

5.1.2 Direct crosstalk
This test sets up a resistance and/or a capacitance between the high data interface lines of
channel A and the high data interface lines of channel B.
NOTE Direct crosstalk examples are described in Annex A.
5.1.3 Diagonal crosstalk
This test sets up a resistance and/or a capacitance between the high data interface lines of
channel A and the low data interface lines of channel B.
NOTE Diagonal crosstalk examples are described in Annex A.
5.2 Data interface line status
5.2.1 Short circuit
5.2.1.1 Ground
This GND-short test configures, for a predefined duration, a short circuit of one data interface
line (high data interface line or low data interface line) to ground (GND).
No. Adjustable Parameter Description
1 Channel with short circuit to GND Channel name – selects a channel
2 Data interface line with short circuit to line – selects a data interface line
GND
3 Duration of short circuit to GND value – sets a duration value for short circuit to GND
unit – selects a time unit to set duration of short circuit to
GND
NOTE Ground examples are described in Annex A.
5.2.1.2 External voltage source
V -short test configures a short circuit of one data interface line (high data interface line or
BAT
low data interface line) to an external voltage source (V ). Connect the external voltage
Bat
source to the short-circuit voltage input interface, located on the rear panel of the disturbance
node.
5.2.1.3 V
CC
V -short test configures, for a predefined time, a short circuit of one data interface line (high
CC
data interface line or low data interface line) to V using a predefined repetition rate.
CC
No. Adjustable Parameter Description
1 Repetition rate of short circuit to V loop – sets a number of iterations
CC
2 Channel with short circuit to V Channel name – selects a channel
CC
3 Data interface line with short circuit to V line – selects a data interface line
CC
4 Duration of short circuit to V value – sets a duration value for short circuit to V
CC CC
unit – selects a time unit to set duration of short circuit
to V
CC
5 Delay between two iterations of short circuit value – sets a value for the delay
to V
CC
unit – selects a time unit for the delay

– 12 – IEC 62969-4:2018 © IEC 2018
5.2.1.4 V and GND
CC
V and GND-short test configures, for a predefined time, a short circuit between the high
CC
data interface line and V and a short circuit between the low data interface line and ground
CC
by using a predefined repetition rate. This disturbance is configured by short circuit test. It
uses relays with operate and release times such as no more 1,5 ms to protect from severe
physical damage.
5.2.2 Data interface break
This test splits the data interface into two sub-data interfaces, which requires special cabling.
This means that the primary and secondary side of the data interface shall be connected to
the corresponding connectors.
5.2.2.1 Mismatched termination
This element defines a disturbance that causes a mismatched termination on one channel or
on both channels. The first test sets up a parasitic capacitance between the high data
interface and low data interface lines by using a chosen capacitance value. And, the other
test sets up a mismatched resistor termination between the high data interface and low data
interface lines of one channel.
The disturbances configured by this element are slow, which means that operate and release
times of the relays will have time for signal stabilization such as 1 ms.
5.2.2.2 Switch on/off
This test uses the switch-on and switch-off commands to control the flow of the disturbance.
5.3 Fault injection
5.3.1 Disturbing signals
5.3.1.1 High or low signal
This test defines a disturbance that sends a differential high and low signals. These signals
are used to generate a disturbance pulse. To generate spikes, use the signal high and signal
low elements in combination with a small duration element.
The duration element shall use the value of ns unit as an attribute. A small duration unit can
be set to 5 ns for 200 Mbps case. If, for example, a duration unit of 5 ns is set, the duration
can be set as 25 ns for a pulse.
Figure 4 shows conceptual diagram of the disturbing signal put onto the data interface.

Trigger Out
Disturbing Signal
Signal
Generator
Trigger In
R C
R C
Channel A
Channel B
IEC
Figure 4 – Disturbing signal put onto the data interface
5.3.1.2 Random pulse signal
This test sends randomly distributed pulses at random times.
No. Adjustable parameter Description
1 Channel to be disturbed Channel name – selects a channel
2 Form of disturbing signal signal high – high-level signal
signal low – low-level signal
noise burst – signal with alternating level
3 Random duration of disturbing signal high bound – sets high bound of the random
computation
high bound – sets high bound of the random
computation
unit – selects a time unit to set the duration
4 Random delay between disturbances high bound – sets high bound of the random
computation
high bound – sets high bound of the random
computation
unit – selects a time unit to set the duration

5.3.1.3 Bit pattern
This test sends a predefined bit pattern on the data interface. This element defines a
command that waits for a specified, predefined bit pattern. The maximum bit pattern length is
3 000 bits. The element can only be used in combination with a valid network setup.
NOTE 4 Bit pattern examples are described in Annex A.

– 14 – IEC 62969-4:2018 © IEC 2018
No. Adjustable parameter Description
1 Cycle selection Cycle – disturbs every second, fourth, eighth, sixteenth,
thirty-second, sixty-fourth cycle. Do not set this attribute
if you want to execute a disturbance in every
communication cycle
Number of how often a bit pattern is to be
2 loop – sets the number of repetitions to be done
sent
3 Channel to be disturbed Channel name – selects a channel
4 Bit pattern data – defines a bit pattern
numeral system – selects a numeral system of the data
defined (in hexadecimal or binary format)
5 Delay between two bit patterns sent value – sets a value for the delay
unit – selects a time unit for the delay

5.3.2 Overwrite signals
This test sends overwrite signals by the disturbance node, it can happen that some nodes do
not receive the data transmitted.
Figure 5 shows conceptual diagram of the node receives invalid signals.
Disturbance node transmits another frame. As Node 2 has a strong driver, it can happen that
the signal of Node 2 cannot be completely overwritten by the disturbance node.
In that case, Node 3 can receive an invalid frame, whereas Node 1 receives the valid frame
from disturbance node. Using Node 2 with a normal driver can cause Node 3 to receive the
valid frame from the disturbance node. When setting up test cases, it is highly recommended
to consider such effects, as described above.
Transmission Receives
Conflict Invalid signal
Node 1 Disturbance Node 2 Node 3
Node
Terminator Transmits valid Transmits Terminator
Received valid modified signal Valid signal (invalid signal)
modified signal
IEC
Figure 5 – The node receives invalid signals

5.3.3 Signal generator
5.3.3.1 Coupling onto data interface
The signal generated by the signal generator is directly connected to the data interface by
using a coupling network. The output trigger of the disturbance node switches on and off the
signal generator. This disturbance test can be used to add to the data interface noise that has
any signal level.
5.3.3.2 Disturbances with signal level
This test switches to the network data interface a signal generated by an external signal
generator. The signal generator is connected to the injection input pin. The disturbance node
sends the input signal to the data interface by using the signal level of the data interface
driver. The signal sent at data interface driver level is rectangular, regardless of the waveform
of the signal generator.
5.3.3.3 Pulse every 10 ms
This test disturbs communication by using pulses, with the pulses being sent periodically. The
first pulse is triggered by an external input trigger.
No. Adjustable Parameter Description
1 Channel to be disturbed Channel name – selects a channel
2 Form of disturbing signal signal low – low-level signal
signal high – high-level signal
noise burst – signal with alternating level
3 Duration of trigger signal value – sets a duration value
unit – selects a time unit to set duration of disturbance
4 Delay between disturbances value – sets a delay value
unit – selects a time unit to set the delay

5.3.4 Trigger
5.3.4.1 Output trigger
This test configures an output trigger (for example, to trigger an oscilloscope) by using a
positive offset to the start of the communication defined.
No. Adjustable Parameter Description
1 Cycle selection Cycle – disturbs every second, fourth, eighth, sixteenth,
thirty-second, sixty-fourth cycle. Do not set this attribute
if you want to execute a disturbance in every
communication cycle.
2 Offset value – sets an offset value
unit – selects a time unit for the offset
3 Trigger output port name – selects a trigger output port
4 Duration of trigger signal value – sets a value for the delay
unit – selects a time unit to set the delay

– 16 – IEC 62969-4:2018 © IEC 2018
5.3.4.2 Trigger on data interface idle
This test triggers a disturbance when the data interface is in idle state.
5.3.4.3 Trigger on data interface traffic
This test triggers a disturbance when the disturbance node detects data interface traffic.
5.3.4.4 External trigger
This test starts a disturbance by using the external trigger-in signal.
No. Adjustable Parameter Description
1 Definition of trigger edge – trigger on the rising/falling edge, or trigger level
name – selects a trigger input
2 Channel to be disturbed Channel name – selects a channel
3 Form of disturbing signal signal high – high-level signal
signal low – low-level signal
noise burst – signal with alternating level

Annex A
(informative)
Description of disturbance detail items
Element Attribute(s) Value(s) Description
Bit pattern Attribute group bit pattern String: Put a bit pattern to a data
A,B,C,D,E,F,0…9 interface channel. The
Required attribute
maximum bit pattern length
possible is 30 000 bits.
Diagonal crosstalk Attribute group impedance value Activates a resistance
and/or capacitance
Resistor value ohm: Required attribute
between: Channel A high
and Channel B low, or
Resistor values, Ω: String.
Channel B high and
10 15 22 33 47 68 100 150 220 330 470 680
Channel A low
(E-6 series with 20 % tolerance)

Capacitor value pF: Required attribute
Capacitor values, pF: Integer.
10 12 15 18 22 27 33 39 47 56 68 82 100 120 150
180 220 270 330 390 470 560 680 820 1,0 K 1,2 K
1,5 K
(E-12 series with 10 % tolerance)
Direct crosstalk attribute group impedance value Defines impedance between
Channel A high and
Resistor value ohm: Required attribute.
Channel B high, or Channel
A low and Channel B low.
Resistor values, Ω: String.
Operate and release times
10 15 22 33 47 68 100 150 220 330 470 680
of relays take at least 1ms.
(E-6 series with 20 % tolerance)

Capacitor value pf: Required attribute.
Capacitor values, pF:
Integer.
10 12 15 18 22 27 33 39 47 56 68 82 100 120 150
180 220 270 330 390 470 560 680 820 1,0 K 1,2 K
1,5 K
(E-12 series with 10 % tolerance)
GND attribute group select data High, low, Both Short-circuits data interface
interface line line to ground.
line: Required attribute
Data interface loading attribute group impedance value Defines a mismatch with an
channels impedance between
resistor value ohm: Required attribute
Channel A high and
Resistor values, Ω: String.
Channel A low to GND, or
between Channel B high
10 15 22 33 47 68 100 150 220 330 470 680
and Channel B low to GND,
(E-6 series with 20 % tolerance) for both lines. Operate and
release times of the relays
take at least 1 ms
Capacitor value pf: Required attribute
Capacitor values, pF: Integer.
10 12 15 18 22 27 33 39 47 56 68 82 100 120 150
180 220 270 330 390 470 560 680 820 1,0 K 1,2 K
1,5 K
(E-12 series with 10 % tolerance)

– 18 – IEC 62969-4:2018 © IEC 2018
Element Attribute(s) Value(s) Description
Data interface loading lines attribute group impedance value Activates the line-loading
feature. Defines a mismatch
resistor value ohm: Required attribute
that uses for both channels
an impedance between high
Resistor values, Ω: String.
and GND, or between low
10 15 22 33 47 68 100 150 220 330 470 680 and GND. Operate and
release times of the relays
(E-6 series with 20 % tolerance)
take at least 1 ms.
capacitor value pf: Required attribute
Capacitor values, pF: Integer.
10 12 15 18 22 27 33 39 47 56 68 82 100 120 150
180 220 270 330 390 470 560 680 820 1,0 K 1,2 K
1,5 K
(E-12 series with 10 % tolerance)
Mismatched termination attribute group impedance value Causes a mismatched
termination on one channel
resistor value ohm: Required attribute
or on both channels.
Resistor values, Ω: String.
10 15 22 33 47 68 100 150 220 330 470 680
(E-6 series with 20 % tolerance)

Capacitor value pf: Required attribute
Capacitor values, pF: Integer.
10 12 15 18 22 27 33 39 47 56 68 82 100 120 150
180 220 270 330 390 470 560 680 820 1,0 K 1,2 K
1,5 K
(E-12 series with 10 % tolerance)
V attribute group select High, low, Both Defines a disturbance that
Bat
data interface line short-circuits the data
interface line(s) to an
line: Required attribute
external supply voltage
(-5 V to maximum +5 V)
V attribute group select High, low, Both Defines a disturbance that
CC
data interface line short-circuits the data
interface line(s) to a 5 V
line: Required attribute
supply.
Impedance value resistor value ohm: Resistor values, Ω: Defines resistor and
capacitor values. Used with:
Required attribute 10 15 22 33 47 68
100 150 220 330 470 Diagonal crosstalk
capacitor value pf:
Direct crosstalk
Required attribute
(E-6 series with 20 %
Data interface loading
tolerance)
channels
Data interface loading lines
Capacitor values, pF:
Mismatched termination
10 12 15 18 22 27 33
Signal generator on channel
39 47 56 68 82 100
120 150 180 220 270
Signal generator on line
330 390 470 560 680
820 1,0 K 1,2 K 1,5 K
(E-12 series with
10 % tolerance)
Bibliography
IEC 60050-161, International Electrotechnical Vocabulary – Chapter 161: Electromagnetic
compatibility
IEC 60050-442, International Electrotechnical Vocabulary – Part 442: Electrical accessories
IEC 60050-722, International Electrotechnical Vocabulary (IEV) – Chapter 722: Telephony

______________
– 20 – IEC 62969-4:2018 © IEC 2018

SOMMAIRE
AVANT-PROPOS . 21
INTRODUCTION . 23
1 Domaine d’application . 24
2 Références normatives . 24
3 Termes, définitions et termes abrégés . 24
3.1 Termes et définitions . 24
3.2 Termes abrégés . 25
4 Evaluation et essais . 25
4.1 Montage d’essai pour l’évaluation . 25
4.2 Schéma synoptique . 26
4.3 Montage des connecteurs d’entrée et de sortie . 27
4.4 Conditions et configurations d’essai . 27
4.5 Conditions de l’essai de perturbation . 27
5 Paramètres de l’essai de perturbation . 29
5.1 Charge de l’interface de données . 29
5.1.1 Impédance variable . 29
5.1.2 Diaphonie longitudinale . 29
5.1.3 Diaphonie transversale . 29
5.2 Etat de la ligne d’interface de données . 29
5.2.1 Court-circuit . 29
5.2.2 Scission de l’interface de données . 30
5.3 Injection de défaut . 31
5.3.
...