IEC 60747-16-1:2001/AMD1:2007

Amendment 1 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

Amendement 1 - Dispositifs à semiconducteurs - Partie 16-1: Circuits intégrés hyperfréquences - Amplificateurs

General Information

• Status: Published
• Publication Date: 25-Jan-2007
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: SC 47E - Discrete semiconductor devices
• Drafting Committee: WG 2 - TC 47/SC 47E/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 15-Jan-2007
• Completion Date: 26-Jan-2007

Relations

• Amends: IEC 60747-16-1:2001 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
• Effective Date: 05-Sep-2023

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD 60747-16-1
AMENDMENT 1
2007-01
Amendment 1
Semiconductor devices –
Part 16-1:
Microwave integrated circuits –
Amplifiers
© IEC 2007 Droits de reproduction réservés ⎯ Copyright - all rights reserved
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
PRICE CODE
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International Electrotechnical Commission
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For price, see current catalogue

– 2 – 60747-16-1 Amend. 1 © IEC:2006(E)
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
FDIS Report on voting
47E/305/FDIS 47E/317/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
reconfirmed,
withdrawn,
replaced by a revised edition, or
amended.
_____________
Page 2
CONTENTS
Replace the titles of Subclauses 5.11, 5.13, 5.14, 5.15, 5.19, and 5.21 by the following new
titles:
5.11 Intermodulation distortion (two-tone) (P /P )
1 n
5.13 Magnitude of the input reflection coefficient (input return loss) (|S |)
5.14 Magnitude of the output reflection coefficient (output return loss) (|S |)
5.15 Magnitude of the reverse transmission coefficient (isolation) (|S |)
5.19 nth order harmonic distortion ratio (P /P )
1 nth
5.21 Spurious intensity under specified load VSWR (P /P )
o sp
Add the titles of following new clause and subclauses:
5.22 Adjacent channel power ratio (P /P )
o(mod) adj
6 Verifying methods
6.1 Load mismatch tolerance (Ψ )
L
6.2 Source mismatch tolerance (Ψ )
S
6.3 Load mismatch ruggedness (Ψ )
R
Add the titles of following new figures:
Figure 12 – Circuit for the measurement of the adjacent channel power ratio
Figure 13 – Circuit for the verification of load mismatch tolerance in method 1
Figure 14 – Circuit for the verification of load mismatch tolerance in method 2
Figure 15 – Circuit for the verification of source mismatch tolerance in method 1
Figure 16 – Circuit for the verification of source mismatch tolerance in the method 2
Figure 17 – Circuit for the verification of load mismatch ruggedness

60747-16-1 Amend. 1 © IEC:2006(E) – 3 –
Page 5
2 Normative references
Replace existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617:2001, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
IEC 60747-4:-, Semiconductor devices – Discrete devices – Part 4: Microwave diodes and
transistors
IEC 60747-16-2:2001, Semiconductor devices – Part 16-2: Microwave integrated circuits –
Frequency prescalers
IEC 60747-16-4:2004, Semiconductor devices – Part 16-4: Microwave integrated circuits –
Switches
IEC/TS 61340-5-1:1998, Electrostatics - Part 5-1: Protection of electronic devices from
electrostatic phenomena - General requirements
IEC/TS 61340-5-2:1999, Electrostatics - Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide
3 Terminology
Replace, on pages 6 and 7, the terms 3.7, 3.9, 3.10, 3.11, 3.14, and 3.16 by the following new
terms:
3.7
intermodulation distortion P /P
1 n
ratio of the fundamental component of the output power to the nth order component of the
output power, at a specified input power
3.9
magnitude of the input reflection coefficient
(input return loss)
|S |
see 3.5.2.1 of IEC 60747-7
3.10
magnitude of the output reflection coefficient
(output return loss)
|S |
see 3.5.2.2 of IEC 60747-7
3.11
magnitude of the reverse transmission coefficient
(isolation)
|S |
see 3.5.2.4 of IEC 60747-7
3.14
nth order harmonic distortion ratio P /P
1 nth
ratio of the power of the fundamental frequency measured at the output port of the device to
the power of the nth order harmonic component measured at the output port for a specified
output power
—————————
The second edition of IEC 60747-4, which is cited in this standard, and to which terms introduced in this
amendment refer, is currently in preparation (ADIS).

– 4 – 60747-16-1 Amend. 1 © IEC:2006(E)
3.16
spurious intensity under specified load VSWR P /P
o sp
ratio of the power of the fundamental frequency measured at the output port of the device to
the maximum spurious power measured at the output port under specified load VSWR
Add the following new terms:
3.17
output power
P
o
see 3.3 of IEC 60747-16-2
3.18
output power at 1 dB gain compression
P
o(1dB)
see 8.2.13 of IEC 60747-4
3.19
noise figure
F
see 702-08-57 of IEC 60050-702
3.20
power added efficiency
Ș
add
see 8.2.15 of IEC 60747-4
3.21
adjacent channel power ratio
P /P
o(mod) adj
see 3.10 of IEC 60747-16-4
3.22
load mismatch tolerance
Ȍ
L
see 7.2.20 of IEC 60747-4
3.23
source mismatch tolerance
Ȍ
S
see 7.2.21 of IEC 60747-4
3.24
load mismatch ruggedness
Ȍ
R
see 7.2.22 of IEC 60747-4
Page 9
4.3.1 Detailed block diagram – Functional blocks
Replace, in the last paragraph, “IEC 60617-12 or IEC 60617-13” by “IEC 60617” .
Page 12
4.6.2 Dynamic or a.c. characteristics
Replace the title and parameters 4.6.2.10, 4.6.2.20 and 4.6.22 by the following new title and
new parameters:
60747-16-1 Amend. 1 © IEC:2006(E) – 5 –
4.6.2 Dynamic or r.f. characteristics
Types
Parameters Min. Max.
A B C D
+  + +
Intermodulation distortion
4.6.2.10
4.6.2.20 nth order harmonic distortion ratio +  +
(where appropriate) (note 2)
+   +
Spurious intensity under specified load VSWR
4.6.2.22
(where appropriate) (note 2)
Add the following new parameters:
Types
Parameters Min. Max.
A B C D
+   +
Adjacent channel power ratio (where appropriate)
4.6.2.23
+  +
Load mismatch tolerance (where appropriate)
4.6.2.24
+  +
4.6.2.25 Source mismatch tolerance (where appropriate)
+  +
4.6.2.26 Load mismatch ruggedness (where appropriate)
Page 14
4.7 Mechanical and environmental ratings, characteristics and data
Replace ”IEC 60747-1, Chapter VI, clause 7” by “Subclause 5.10 and 5.11 of IEC 60747-
1:2006”.
4.8.8 Handling precautions
Replace “IEC 60747-1, Chapter IX” by “IEC 61340-5-1 and IEC 61340-5-2“.
Page 15
5.1.2 General precautions
Replace “clause 2 of IEC 60747-1, Chapter VII, Section One” by “clause 6.3, 6.4 and 6.6 of
IEC 60747-1:2006”.
5.1.3 Handling precautions
Replace “clause 1 of IEC 60747-1, Chapter IX” by “IEC 61340-5-1 and IEC 61340-5-2”.

– 6 – 60747-16-1 Amend. 1 © IEC:2006(E)
Page 25
Replace the existing title of Subclause 5.11 by the following new title:
5.11 Intermodulation distortion (two-tone) (P /P )
1 n
5.11.3 Principle of measurement
Replace, in the first line “P and P ” by “P and P ”.
n 1 1 n
Replace Equation (14) by the following:
P = P + L (14)
1 b 2
Replace the text after Equations (13), (14), (15) and (16) as follows:
where
P and P are the powers of the fundamental signal and the intermodulation distortion,
1 n
respectively;
P , P and P are the values indicated by the spectrum analyser corresponding to P , P and
a b c i 1
P , respectively:
n
L is the difference between the loss L and L where L is the loss from point E
1 A B A
is the loss from point E to point B shown in Figure 3,
to point A and L
B
respectively. L is the circuit loss from point C to point D shown in Figure 3. P ,
2 i
P , P , P , P and P are expressed in dBm. L and L are expressed in
1 n a b c 1 2
decibels.
/P , which is expressed in dBc, is derived from Equations
The intermodulation distortion, P
1 n
(14) and (15) as follows:
P /P = P – P = P – P (16)
1 n 1 n b c
Page 28
Replace the existing title of subclause 5.13 by the following new title:
5.13 Magnitude of the input reflection coefficient (input return loss) (|S |)
Replace, in Equation (17), the symbol “|s |” by “|S |”.
11 11
Page 29
Replace, the symbol “(|s |)” by “(|S |)” in the following places:
22 22
in both the title and text of subclause 5.14, on page 30 in Equation (18); on page 31, in
Subclause 5.14.2.1 and in Equation (19),
Page 32
5.14.2.4 Circuit description and requirements
Delete, in the second paragraph of this subclause, the symbol “|s |”.
60747-16-1 Amend. 1 © IEC:2006(E) – 7 –
5. 1 4 . 2 . 6 M easu r e m e n t p r o c e d u r e
Delete, in the last line of this subclause, the symbol “|s |”.
Replace the existing last line of this subclause by the following:
Page 33
Replace, in the title of Subclause 5.15 and in Equation (20), “(|s |)” by “|S |”
12 12
Page 39
Replace, in the title of Subclause 5.19, “(P /P )” by “(P /P )”.
nth 1 1 nth
Delete, in Subclause 5.19.1, the term “P /P ”.
nth 1
5.19.3 Principle of measurement
Replace, in Subclause 5.19.3, “P /P ” by “P /P ”.
nth 1 1 nth
Replace the existing Equation (29) by the following:
P /P = P – P  (29)
1 nth 1 nth
Page 40
5.19.6 Measurement procedure
Delete, in the last line of subclause 5.19.6, the term “P /P ”.
nth 1
Page 42
Replace, in the title of subclause 5.21, “(P /P )” by “(P /P )”.
sp o o sp
Page 43
5.21.3 Principle of measurement
Replace the existing Equation (35) and the line preceding as follows:
The spurious intensity P /P in dBc is defined as follows:
o sp
P /P = P − P (35)
o sp o sp
Page 44
5.21.6 Measurement procedure
Delete in the last line of this subclause, the term “P /P ”.
sp o
– 8 – 60747-16-1 Amend. 1 © IEC:2006(E)
Add the following new Subclause 5.22, new Clause 6 and (to appear on a separate end
page), new Bibliography:
5.22 Adjacent channel power ratio (P /P )
o(mod) adj
5.22.1 Purpose
To measure the adjacent channel power ratio under the specified conditions.
5.22.2 Circuit diagram
Signal Variable
Isolator
generator attenuator
A
Modulator
dB
G
f
f
W
Termi- Frequency Termi- Power
nation meter nation meter 1
Attenuator
C E
Device being Spectrum
B
dB
measured analyser
D
W
Power
Termi-
meter 2
nation
A
A
V
V
Power
Power
supply 1
supply 2
IEC  1962/06
Figure 12 – Circuit for the measurement of the adjacent channel power ratio
5.22.3 Principle of measurement
Under the condition that the modulated signal is supplied for the device being measured in
order to get the specified output power (P ), P is the total output power in the specified
o adj
bandwidth at the specified frequency away from the carrier signal, and P is the total
o(mod)
output power in the specified bandwidth at the carrier signal. Adjacent channel power ratio
P /P is the ratio of P to the P . The adjacent channels are in both the upper
o(mod) adj o(mod) adj
side band and lower side band of the carrier. The modulation signal is the carrier signal
modulated with the standard test signal having the same rate as the specified code
transmission rate.
P /P is given as the following equation in the circuit of Figure 12.
o(mod) adj
P = P + L (36)
o 1 1
P = P + L (37)
o(mod) 2 2
P = P + L (38)
adj 3 2
60747-16-1 Amend. 1 © IEC:2006(E) – 9 –
P /P = P − P = P − P (39)
o(mod) adj o(mod) adj 2 3
where
P is the value indicated by the power meter 2;
P is the value of total power in the specified bandwidth at the carrier signal indicated by
the spectrum analyser;
P is the value of total output power in the specified channel bandwidth at the specified
frequency that is equal to the channel spacing away from the carrier signal indicated by
the spectrum analyser;
L is the power at point C in dBm, less the power at point D in dBm;
L is the power at point C in dBm, less the power at point E in dBm.
P , P , P , P , P and P are expressed in dBm;
o o(mod) adj 1 2 3
L and L are expressed in dB;
1 2
P / P is expressed in dB.
o(mod) adj
5.22.4 Circuit description and requirement
The circuit losses L and L should be measured beforehand.
1 2
5.22.5 Precautions to be observed
The output signal and oscillation should be checked by the spectrum analyser. Oscillation
should be eliminated during these measurements. Harmonics or spurious responses of the
signal generator should be reduced so as to be negligible. An adequate attenuator should be
inserted at the input of the spectrum analyser when the output power is high.
5.22.6 Measurement procedure
The frequency of the signal generator shall be set to the specified value.
The bias conditions shall be applied to the device being measured.
An adequate input power shall be applied to the device being measured.
The following items of the modulator are set to the specified values according to the standard
code of the test signal: modulation method, signal transmission rate and modulation
bandwidth.
The following items of the spectrum analyser are set to the specified values: carrier
frequency, sweep range, resolution bandwidth, video bandwidth, number of sampling and
sweep time.
The value of P is measured at the power meter 1.
Output power of the device being measured P is calculated from Equation (36).
o
By adjusting the variable attenuator, P is set to the specified value.
o
The channel spacing and the channel bandwidth are set to the specified values.
The values of P and P are measured at the spectrum analyser.
2 3
P , P are calculated from Equations (37) and (38).
o(mod) adj
Adjacent channel power ratio P / P is calculated from Equation (39).
o(mod) adj
NOTE The display of the spectrum analyser is set to maximum hold mode. The detection mode of the spectrum
analyser is set to positive peak mode.

– 10 – 60747-16-1 Amend. 1 © IEC:2006(E)
5.22.7 Specified conditions
– Ambient or reference-point temperature
– Bias conditions
– Frequency (carrier frequency)
– Output power
– Standard code of the test signal:
• channel spacing
• channel bandwidth
• modulation method
• signal transmission rate
• modulation bandwidth
– Spectrum analyser:
• sweep range
• resolution bandwidth
* video bandwidth of a spectrum analyser
* sampling numbers of a spectrum analyser
* sweep time of a spectrum analyser
6 Verifying methods
6.1 Loa
...

IEC 60747-16-1 ®
Edition 1.0 2007-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-1: Microwave integrated circuits – Amplifiers

Dispositifs à semiconducteurs –
Partie 16-1: Circuits intégrés hyperfréquences - Amplificateurs

IEC 60747-16-1:2001/A1:2007
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IEC 60747-16-1 ®
Edition 1.0 2007-01
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
AMENDMENT 1
AMENDEMENT 1
Semiconductor devices –
Part 16-1: Microwave integrated circuits – Amplifiers

Dispositifs à semiconducteurs –

Partie 16-1: Circuits intégrés hyperfréquences - Amplificateurs

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX Q
ICS 31.080.99 ISBN 978-2-83220-234-0

– 2 – 60747-16-1 Amend. 1  IEC:2007
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
This bilingual version (2012-09) corresponds to the monolingual English version, published in
2007-01. The text of this amendment is based on the following documents:
FDIS Report on voting
47E/305/FDIS 47E/317/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The French version of this standard has not been voted upon.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the maintenance result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Page 2
CONTENTS
Replace the titles of Subclauses 5.11, 5.13, 5.14, 5.15, 5.19, and 5.21 by the following new
titles:
5.11 Intermodulation distortion (two-tone) (P /P )
1 n
5.13 Magnitude of the input reflection coefficient (input return loss) (|S |)
5.14 Magnitude of the output reflection coefficient (output return loss) (|S |)
|)
5.15 Magnitude of the reverse transmission coefficient (isolation) (|S
5.19 nth order harmonic distortion ratio (P /P )
1 nth
5.21 Spurious intensity under specified load VSWR (P /P )
o sp
Add the titles of following new clause and subclauses:
5.22 Adjacent channel power ratio (P /P )
o(mod) adj
6 Verifying methods
6.1 Load mismatch tolerance (Ψ )
L
6.2 Source mismatch tolerance (Ψ )
S
6.3 Load mismatch ruggedness (Ψ )
R
Add the titles of following new figures:
Figure 12 – Circuit for the measurement of the adjacent channel power ratio
Figure 13 – Circuit for the verification of load mismatch tolerance in method 1
Figure 14 – Circuit for the verification of load mismatch tolerance in method 2
Figure 15 – Circuit for the verification of source mismatch tolerance in method 1

60747-16-1 Amend. 1  IEC:2007 – 3 –
Figure 16 – Circuit for the verification of source mismatch tolerance in the method 2
Figure 17 – Circuit for the verification of load mismatch ruggedness

Page 5
2 Normative references
Replace existing references IEC 60617-12, IEC 60617-13 and IEC 60747-1 as follows:
IEC 60617:2001, Graphical symbols for diagrams
IEC 60747-1:2006, Semiconductor devices – Part 1: General
IEC 60747-4:-, Semiconductor devices – Discrete devices – Part 4: Microwave diodes and
transistors
IEC 60747-16-2:2001, Semiconductor devices – Part 16-2: Microwave integrated circuits –
Frequency prescalers
IEC 60747-16-4:2004, Semiconductor devices – Part 16-4: Microwave integrated circuits –
Switches
IEC/TS 61340-5-1:1998, Electrostatics - Part 5-1: Protection of electronic devices from
electrostatic phenomena - General requirements
IEC/TS 61340-5-2:1999, Electrostatics - Part 5-2: Protection of electronic devices from
electrostatic phenomena - User guide
3 Terminology
Replace, on pages 6 and 7, the terms 3.7, 3.9, 3.10, 3.11, 3.14, and 3.16 by the following new
terms:
3.7
intermodulation distortion P /P
1 n
ratio of the fundamental component of the output power to the nth order component of the
output power, at a specified input power
3.9
magnitude of the input reflection coefficient
(input return loss)
|S |
see 3.5.2.1 of IEC 60747-7
3.10
magnitude of the output reflection coefficient
(output return loss)
|S |
see 3.5.2.2 of IEC 60747-7
3.11
magnitude of the reverse transmission coefficient
(isolation)
|S |
see 3.5.2.4 of IEC 60747-7
—————————
The second edition of IEC 60747-4, which is cited in this standard, and to which terms introduced in this
amendment refer, is currently in preparation (ADIS).

– 4 – 60747-16-1 Amend. 1  IEC:2007
3.14
nth order harmonic distortion ratio P /P
1 nth
ratio of the power of the fundamental frequency measured at the output port of the device to
the power of the nth order harmonic component measured at the output port for a specified
output power
3.16
spurious intensity under specified load VSWR P /P
o sp
ratio of the power of the fundamental frequency measured at the output port of the device to
the maximum spurious power measured at the output port under specified load VSWR
Add the following new terms:
3.17
output power
P
o
see 3.3 of IEC 60747-16-2
3.18
output power at 1 dB gain compression
P
o(1dB)
see 8.2.13 of IEC 60747-4
3.19
noise figure
F
see 702-08-57 of IEC 60050-702
3.20
power added efficiency
η
add
see 8.2.15 of IEC 60747-4
3.21
adjacent channel power ratio
P /P
o(mod) adj
see 3.10 of IEC 60747-16-4
3.22
load mismatch tolerance
Ψ
L
see 7.2.20 of IEC 60747-4
3.23
source mismatch tolerance
Ψ
S
see 7.2.21 of IEC 60747-4
3.24
load mismatch ruggedness
Ψ
R
see 7.2.22 of IEC 60747-4
Page 9
4.3.1 Detailed block diagram – Functional blocks
Replace, in the last paragraph, “IEC 60617-12 or IEC 60617-13” by “IEC 60617” .

Page 12
60747-16-1 Amend. 1  IEC:2007 – 5 –
4.6.2 Dynamic or a.c. characteristics
Replace the title and parameters 4.6.2.10, 4.6.2.20 and 4.6.22 by the following new title and
new parameters:
4.6.2 Dynamic or r.f. characteristics
Types
Parameters Min. Max.
A B C D
+  + +
Intermodulation distortion
4.6.2.10
4.6.2.20 nth order harmonic distortion ratio +   +

(where appropriate) (note 2)
+   +
Spurious intensity under specified load VSWR
4.6.2.22
(where appropriate) (note 2)
Add the following new parameters:
Types
Parameters Min. Max.
A B C D
+   +
Adjacent channel power ratio (where appropriate)
4.6.2.23
+  +
Load mismatch tolerance (where appropriate)
4.6.2.24
+  +
4.6.2.25 Source mismatch tolerance (where appropriate)
+  +
4.6.2.26 Load mismatch ruggedness (where appropriate)

Page 14
4.7 Mechanical and environmental ratings, characteristics and data
Replace ”IEC 60747-1, Chapter VI, clause 7” by “Subclause 5.10 and 5.11 of IEC 60747-
1:2006”.
4.8.8 Handling precautions
Replace “IEC 60747-1, Chapter IX” by “IEC 61340-5-1 and IEC 61340-5-2“.
Page 15
5.1.2 General precautions
Replace “clause 2 of IEC 60747-1, Chapter VII, Section One” by “clause 6.3, 6.4 and 6.6 of
IEC 60747-1:2006”.
5.1.3 Handling precautions
Replace “clause 1 of IEC 60747-1, Chapter IX” by “IEC 61340-5-1 and IEC 61340-5-2”.

– 6 – 60747-16-1 Amend. 1  IEC:2007
Page 25
Replace the existing title of Subclause 5.11 by the following new title:
5.11 Intermodulation distortion (two-tone) (P /P )
1 n
5.11.3 Principle of measurement
Replace, in the first line “P and P ” by “P and P ”.
n 1 1 n
Replace Equation (14) by the following:
P = P + L (14)
1 b 2
Replace the text after Equations (13), (14), (15) and (16) as follows:
where
P and P are the powers of the fundamental signal and the intermodulation distortion,
1 n
respectively;
P , P and P are the values indicated by the spectrum analyser corresponding to P , P and
a b c i 1
P , respectively:
n
L is the difference between the loss L and L where L is the loss from point E
1 A B A
to point A and L is the loss from point E to point B shown in Figure 3,
B
respectively. L is the circuit loss from point C to point D shown in Figure 3. P ,
2 i
P , P , P , P and P are expressed in dBm. L and L are expressed in
1 n a b c 1 2
decibels.
The intermodulation distortion, P /P , which is expressed in dBc, is derived from Equations
1 n
(14) and (15) as follows:
P /P = P – P = P – P (16)
1 n 1 n b c
Page 28
Replace the existing title of subclause 5.13 by the following new title:
5.13 Magnitude of the input reflection coefficient (input return loss) (|S |)
Replace, in Equation (17), the symbol “|s |” by “|S |”.
11 11
Page 29
Replace, the symbol “(|s |)” by “(|S |)” in the following places:
22 22
in both the title and text of subclause 5.14, on page 30 in Equation (18); on page 31, in
Subclause 5.14.2.1 and in Equation (19),

Page 32
5.14.2.4 Circuit description and requirements
Delete, in the second paragraph of this subclause, the symbol “|s |”.
60747-16-1 Amend. 1  IEC:2007 – 7 –
5.14.2.6 Measurement procedure
Delete, in the last line of this subclause, the symbol “|s |”.
Replace the existing last line of this subclause by the following:

Page 33
Replace, in the title of Subclause 5.15 and in Equation (20), “(|s |)” by “|S |”
12 12
Page 39
Replace, in the title of Subclause 5.19, “(P /P )” by “(P /P )”.
nth 1 1 nth
Delete, in Subclause 5.19.1, the term “P /P ”.
nth 1
5.19.3 Principle of measurement
Replace, in Subclause 5.19.3, “P /P ” by “P /P ”.
nth 1 1 nth
Replace the existing Equation (29) by the following:
P /P = P – P  (29)
1 nth 1 nth
Page 40
5.19.6 Measur
...