IEC 60747-5-13:2021
(Main)Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
IEC 60747-5-13:2021 provides the accelerated test method to assess effects of the tarnishing of silver and silver alloys used for LED packages due to hydrogen sulphide. Particularly, this test method is intended to give information on silver and silver alloy tarnishing effects to the luminous/radiant flux maintenance of LED packages. Additionally, this test method can give information on electric performances of LED packages due to corrosion of silver and silver alloys.
The object of this test is to determine the influence of atmospheres containing hydrogen sulphide on parts of LED packages made of: silver or silver alloy; silver or silver alloy protected with another layer; other metals covered with silver or silver alloy.
Testing other degradations that are susceptible to affect luminous/radiant flux maintenance and/or electric performance (e.g. degradation of copper or silicone parts) is not the object of this test. This test might not be suitable as a general corrosion test, i.e. it might not predict the behaviour of flux and/or electric characteristics and connections in industrial atmospheres. This document is applicable to LED packages for lighting applications only if referenced by an IEC SC 34A document.
General Information
Standards Content (Sample)
IEC 60747-5-13 ®
Edition 1.0 2021-06
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 5-13: Optoelectronic devices – Hydrogen sulphide corrosion test for
LED packages
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.
IEC Central Office Tel.: +41 22 919 02 11
3, rue de Varembé info@iec.ch
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.
About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.
IEC publications search - webstore.iec.ch/advsearchform IEC online collection - oc.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
variety of criteria (reference number, text, technical publications previews. With a subscription you will always
committee, …). It also gives information on projects, replaced have access to up to date content tailored to your needs.
and withdrawn publications.
Electropedia - www.electropedia.org
IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 000 terminological entries in English
details all new publications released. Available online and
and French, with equivalent terms in 18 additional languages.
once a month by email.
Also known as the International Electrotechnical Vocabulary
(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc
If you wish to give us your feedback on this publication or
need further assistance, please contact the Customer Service
Centre: sales@iec.ch.
IEC 60747-5-13 ®
Edition 1.0 2021-06
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 5-13: Optoelectronic devices – Hydrogen sulphide corrosion test for
LED packages
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-9852-7
– 2 – IEC 60747-5-13:2021 © IEC 2021
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Test apparatus . 8
4.1 General . 8
4.2 Test jig. 8
4.3 Test setup . 8
5 Test atmosphere . 9
6 Preconditioning. 9
6.1 General . 9
6.2 Hygroscopic treatment . 9
7 Method . 10
7.1 Initial measurements . 10
7.2 Procedure . 10
7.3 Final measurements. 11
8 Details to be specified . 12
Annex A (informative) Information to predict luminous/radiant flux degradation in
particular conditions from the test results . 13
A.1 Correspondence relation between hydrogen sulphide corrosion test and
indoor corrosivity categories . 13
A.2 Correspondence relation between the result of this corrosion test and the
corrosion in the field environment (Case example) . 14
Annex B (informative) Method for determining the mass increase of silver test pieces . 15
B.1 Purpose . 15
B.2 Method . 15
B.3 Silver test pieces . 15
B.4 How to place silver test pieces . 15
Annex C (informative) Silver test piece for corrosion monitoring . 17
C.1 Specimens . 17
C.2 Preparation . 17
Annex D (informative) Gas concentrations set up of test atmosphere . 18
D.1 General . 18
D.2 Reason about no allowable range of each gas concentration . 18
D.3 Application of the actual test . 18
Bibliography . 19
Figure 1 – Example of setup . 9
Figure 2 – Example of LED luminous flux maintenance factor before & after
hygroscopic treatment . 10
Figure A.1 – Mass increase example of silver test piece hydrogen sulphide corrosion test . 14
Figure B.1 – Example of layout of silver test pieces . 16
Table A.1 – Description of typical environments related to the estimation of indoor
corrosivity categories in ISO 11844-1:2006, Table D.3 . 13
Table A.2 – The upper limit of mass increase of silver test pieces in the indoor
environment of corrosivity category in ISO 11844-1:2006 for approximately ten years’
usage . 14
– 4 – IEC 60747-5-13:2021 © IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-13: Optoelectronic devices –
Hydrogen sulphide corrosion test for LED packages
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 60747-5-13 has been prepared by subcommittee 47E: Discrete semiconductor devices, of
IEC technical committee 47: Semiconductor devices. It is an International Standard.
The text of this International Standard is based on the following documents:
FDIS Report on voting
47E/746/FDIS 47E/751/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
– 6 – IEC 60747-5-13:2021 © IEC 2021
INTRODUCTION
This part of IEC 60747 provides the accelerated test method to assess effects of the tarnishing
of silver and silver alloys used for LED packages due to hydrogen sulphide, because sulphide
gas (H S) tarnishes silver used in LED packages and causes lumen degradation.
There are some existing environmental stress test standards, but they intend to test contacts
and connections, not LED lumen degradation. IEC 60068-2-43 provides useful information to
assess effects to the contact resistance for contacts and connections due to corrosion of silver
and silver alloy. Because the criterion performance in IEC 60068-2-43 is contact resistance, it
is not applicable to LED packages to determine effects to the luminous/radiant flux maintenance.
For LEDs, light output should be measured, but there is no such provision in existing standards.
Therefore, this document has been drawn up.
This document provides the accelerated test method with mixture gas (H S
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.