IEC 62490-1:2010

ESL measuring method - Part 1: Capacitors with lead terminal for use in electronic equipment

IEC 62490-1:2010 provides the equivalent series inductance L (ESL) measuring method for capacitors with lead terminal type for use in electronic equipment. The inductance values of capacitors provided for this document are within the range of 1 nH to 10 nH.

Méthode de mesure de l'ESL - Partie 1: Condensateurs à bornes de sortie utilisés dans les équipements électroniques

La CEI 62490-1:2010 fournit la méthode de mesure de l'inductance série équivalente L (ESL) destinée aux condensateurs à bornes de sortie utilisés dans les équipements électroniques. Les valeurs d'inductance des condensateurs fournies pour le présent document se situent dans la plage comprise entre 1 nH et 10 nH.

General Information

• Status: Published
• Publication Date: 27-Jul-2010
• ICS: 31.060.01 - Capacitors in general
• Technical Committee: TC 40 - Capacitors and resistors for electronic equipment
• Current Stage: PPUB - Publication issued
• Start Date: 31-Aug-2010
• Completion Date: 28-Jul-2010

Standards Content (Sample)

IEC 62490-1 ®
Edition 1.0 2010-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
ESL measuring method –
Part 1: Capacitors with lead terminal for use in electronic equipment

Méthode de mesure de l’ESL –
Partie 1: Condensateurs à bornes de sortie utilisés dans les équipements
électroniques
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IEC 62490-1 ®
Edition 1.0 2010-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
ESL measuring method –
Part 1: Capacitors with lead terminal for use in electronic equipment

Méthode de mesure de l’ESL –
Partie 1: Condensateurs à bornes de sortie utilisés dans les équipements
électroniques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
L
CODE PRIX
ICS 31.060.01 ISBN 978-2-88912-068-0
– 2 – 62490-1 © IEC:2010
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 Terms and definitions .5
4 Measurement jig, short compensation jig, and spacer.5
4.1 Measurement jig (test fixture) .5
4.2 Short compensation jig .5
4.3 Spacer .6
5 Measuring method.7
5.1 Measuring instrument .7
5.2 Measurement conditions.7
5.3 Preparation of sample .8
5.4 Measurement points .8
5.5 Frequency and signal level.8
5.6 Measurement procedure.8
5.6.1 General .8
5.6.2 Open compensation.9
5.6.3 Short compensation.9
5.6.4 ESL measurement .9
6 Items to be indicated in test result report .10
Annex A (informative) The basic concept on ESL measuring method .11

Figure 1 – Short compensation jig.6
Figure 2 – Constructional example of the short compensation spacer and the
measurement spacer .7
Figure 3 – Measure points: seating plane or flange of capacitor on the printed circuit
board .8
Figure 4 – Method of short compensation .9
Figure 5 – Example in state where electrode of measurement jig shifted.10
Figure A.1 – Fundamental view of ESL measurement .11

62490-1 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ESL MEASURING METHOD –
Part 1: Capacitors with lead terminal
for use in electronic equipment

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62490-1 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
40/2044/FDIS 40/2056/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all the parts in the IEC 62490 series, under the general title ESL measuring method,
can be found on the IEC website.

– 4 – 62490-1 © IEC:2010
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
62490-1 © IEC:2010 – 5 –
ESL MEASURING METHOD –
Part 1: Cap with lead terminal
for use in electronic equipment

1 Scope
This part of IEC 62490 provides the equivalent series inductance L (ESL) measuring method
for capacitors with lead terminal type for use in electronic equipment.
The inductance values of capacitors provided for this document are within the range of 1 nH
to 10 nH.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
3 Terms and definitions
For the purpose of this document, the terms and definitions given in IEC 60384-1 and the
following apply.
3.1
equivalent series inductance L
ESL
inductive part of the impedance of capacitors
NOTE 1 The unit of ESL is Henry (H).
4 Measurement jig, short compensation jig, and spacer
4.1 Measurement jig (test fixture)
The measurement jig shall have the following features:
a) the lead terminal holding method shall be screw up;
b) the measurement jig has two pairs of screw-fixation electrodes for fixing the lead terminals
of the capacitor to be measured. In pairs, one of the electrodes is fixed to the
measurement jig and the other is adjustable for fixing the lead wire. The adjustable
electrode shall move only in a direction to hold the lead terminal and shall not rotate
around the electrode fixing screw.
4.2 Short compensation jig
The short compensation jig shall be the lead wire rod which has the following features of the
materials and dimensions, which includes the diameter or the cross-section area:
a) materials shall be the same materials as the lead wire of the capacitor to be measured;
b) shape shall be as shown in Figure 1;

– 6 – 62490-1 © IEC:2010
c) spacing section (pitch) shall be the same lead spacing as the capacitor to be measured.
The tolerance on the lead spacing of a short compensation jig shall be ±0,25 mm;
d) the straight section (shank) of the jig length shall be 5 mm to 10 mm, depending on what
the measurement jig is able to hold. The straight section of the jig shall be kept from
bending.
l
P
IEC  1725/10
Key
P spacing section (pitch) (shaded section)
l straight section (shank)
Figure 1 – Short compensation jig
4.3 Spacer
These spacers shall be firmly fixed onto the measurement jig. The spacer material shall be
nonmagnetic. An example is shown in Figure 2.

62490-1 © IEC:2010 – 7 –
0,5
t
0,5
∅1,2
*
P /2
*
P /2
IEC  1726/10
Dimensions in millimetres
Key for Figure 2a Key for Figure 2b
P lead spacing
t thickness of the spacer
*
Lead spacing shall be the same as the capacitor
to be measured.
Figure 2a – Front view of the spacer
Figure 2b – Side view of the spacer

Remarks
P t
Short compensation spacer
1,5 ± 0,1
3,5 ± 0,3
3,25 ± 0,1 Measurement spacer
1,5 ± 0,1 Short compensation spacer
5,0 ± 0,3
Measurement spacer
4,0 ± 0,1
NOTE The basic method for measuring ESL when using these types of spacer is shown in Annex A.
Figure 2 – Constructional example of the short compensation spacer
and the measurement spacer
5 Measuring method
5.1 Measuring instrument
The impedance analyser (balance bridge method) with the following specification or
equivalent shall be used:
a) inductance value (ESL) can be measured at a frequency of 40 MHz or higher;
b) basic impedance accuracy shall be ±0,08 % or better;
c) impedance value of 3 mΩ or less can be measured.
5.2 Measurement conditions
The measurements shall be made under the standard atmospheric conditions for testing, as
specified in IEC 60384-1:2008, 4.2.1. In addition, if there is any doubt as to the validity of
measurement, the recovery conditions, as specified in IEC 60384-1:2008, 4.2.2, shall be
implemented.
5,5
+0,1
17 –0,1
– 8 – 62490-1 © IEC:2010
5.3 Preparation of sample
The lead terminals of a capacitor to be measured shall be cut at a length of 5 mm to 10 mm.
When cutting the lead terminals, the lead terminal shall be kept from bending.
NOTE By cutting the leads shorter, they make stable contact with the measurement electrodes and provide highly
repeatability and reproducibility.
5.4 Measurement points
The measurement points of ESL shall be the places of the seating plane or flange of the
capacitor to be measured. An example is shown in Figure 3.
NOTE Although during measurement the spacer is used, the measured value is equivalent to the value that would
be measured at the seating plane of the lead terminals of capacitors as shown in Annex A.

IEC  1727/10
Key
1 flange
2 seating plane
Figure 3 – Measure points: seating plane or flange
of capacitor on the printed circuit board
5.5 Frequency and signal level
Unless otherwise specified in the product specification, the frequency and signal shall be as
follows;
a) the measurement frequency shall be 40 MHz;
b) the signal level of an oscillation of a measuring instrument shall be 0,5 V to 1,0 V in r.m.s.
5.6 Measurement procedure
5.6.1 General
The measurement shall be performed in the order of open compensation, short compensation,
and ESL measurement of the capacitor. Before beginning the procedure, the number of times
to average and integration time shall be set so that measurement accuracy in less than 2 %.
NOTE Increasing the number of times to average and integration time increases repeatability and reproducibility.

62490-1 © IEC:2010 – 9 –
5.6.2 Open compensation
Connect the measurement jig specified in 4.1 to the measuring instrument and tighten the
screw for adjustable electrode with nothing in between the electrodes. Perform open
compensation according to the instructions for the measuring instrument.
5.6.3 Short compensation
The test fixture specified in 4.1 shall be connected to the measuring instrument and the short
compensation jig specified in 4.2 with the short compensation spacer shall be fixed in
between the electrodes by tightening the screws. Then the short compensation shall be
performed according to the instruction of the measurement instrument. Example of short
compensation shall be as shown in Figure 4.

P*
IEC  1728/10
Key
1 short compensation jig (dashed lines)
2 electrode of measurement jig (solid lines)
3 short compensation spacer (shaded section)
P lead spacing
* lead spacing shall be the same as the capacitor to be measured.
Figure 4 – Method of short compensation
5.6.4 ESL measurement
After performing the compensation specified in 5.6.2 and 5.6.3, replace short compensation
spacer with the measurement spacer specified in 4.3 and tighten the screw for adjustable
electrode with the lead terminal of the capacitor to be measured which is prepared according
to 5.3 through the spacer in between the electrodes. Then measure the ESL of the capacitor.
Care shall be taken so that the electrode of the measurement jig does not rotate and prevent
shifting as shown in Figure 5, when insert lead terminal of the capacitor to be measured.

– 10 – 62490-1 © IEC:2010
Electrode fixing screw of a measurement jig
IEC  1729/10
Key
1 lead wire (shaded section)
2 fixation screw (shaded section)
3 adjustable electrode (dashed lines)
4 fixed electrode (solid lines)
5 shifting (measuring point deviation)
Figure 5 – Example in state where electrode of measurement jig shifted
6 Items to be indicated in test result report
The test report shall include at least the following information:
a) test date *;
b) test site (name and place) *;
c) detail description of capacitor under test *;
d) measuring instrument (manufacturer and type);
e) test fixture (manufacturer and type);
f) measurement frequency and a measurement signal level;
g) measurement point, if other than seating plane; and
h) measured ESL value.
* optional
62490-1 © IEC:2010 – 11 –
Annex A
(informative)
The basic concept on ESL measuring method

The basic concept on ESL measuring method is shown in Figure A.1. The measuring point by
this method shall be the place of the seating plane, as described in 5.4.
a) The inductance corresponding to the short compensation jig length of P is deducted at
short compensation. See Figure A.1a.
b) Use the short compensation spacer, and the measurement spacer as specified in 4.3.
c) Perform short compensation with the short compensation spacer as shown in Figure A.1a.
d) When ESL measurement of the capacitor, deducted ESL at short compensation shall be
added. For this purpose thickness of the measurement spacer shall be thicker than short
compensation spacer by P/2. The measured ESL in Figure A.1b is
...