IEC 61180:2016

High-voltage test techniques for low-voltage equipment - Definitions, test and procedure requirements, test equipment

IEC 61180:2016 is applicable to dielectric tests with direct voltage; dielectric tests with alternating voltage; dielectric tests with impulse voltage and test equipment used for dielectric tests on low-voltage equipment. This standard is applicable only to tests on equipment having a rated voltage of not more than 1 kV a.c. or 1,5 kV d.c. This standard is applicable to type and routine tests for objects which are subjected to high voltage tests as specified by the technical committee. The test equipment comprises a voltage generator and a measuring system. This standard covers test equipment in which the measuring system is protected against external interference and coupling by appropriate screening, for example a continuous conducting shield. Therefore, simple comparison tests are sufficient to ensure valid results. This standard is not intended to be used for electromagnetic compatibility tests on electric or electronic equipment. Tests with the combination of impulse voltages and currents are covered by IEC 61000-4-5. This standard provides the relevant technical committees as far as possible with:
- defined terms of both general and specific applicability;
- general requirements regarding test objects and test procedures;
- methods for generation and measurement of test voltages;
- test procedures;
- methods for the evaluation of test results and to indicate criteria for acceptance;
- requirements concerning approved measuring devices and checking methods and measurement uncertainty. Alternative test procedures may be required and these should be specified by the relevant technical committees. Care should be taken if the test object has voltage limiting devices, as they may influence the results of the test. The relevant technical committees should provide guidance for testing objects equipped with voltage limiting devices. This 1st edition of IEC 61180 cancels and replaces the 1st edition of IEC 61180-1, issued in 1992, and the 1st edition of IEC 61180-2, issued in 1994. Key words: High Voltage Test Techniques, Dielectric Tests, Disruptive Discharge, Withstand Voltage.

Techniques des essais à haute tension pour matériel à basse tension - Définitions, exigences relatives aux essais, matériel d'essai

L'IEC 61180:2016 est applicable aux essais diélectriques en tension continue, aux essais diélectriques en tension alternative, aux essais diélectriques en tension de choc et au matériel d'essai utilisé pour effectuer des essais diélectriques sur des matériels à basse tension. La présente Norme n'est applicable qu'aux essais de matériels dont la tension assignée ne dépasse pas 1 kV en courant alternatif ou 1,5 kV en courant continu. La présente Norme est applicable aux essais de type et aux essais individuels de série pour les objets qui sont soumis à des essais à haute tension tels que spécifiés par le comité d'études. Le matériel d'essai est constitué d'un générateur de tension et d'un système de mesure. La présente Norme concerne le matériel d'essai dont le système de mesure est protégé contre les perturbations et les couplages externes par un système d'écrans approprié, par exemple, un écran conducteur continu. En conséquence, des essais de comparaison simples sont suffisants pour assurer la validité des résultats. La présente Norme n'est pas destinée à être utilisée pour les essais de compatibilité électromagnétique de matériel électrique ou électronique. Les essais qui combinent des tensions et des courants de choc sont couverts par l'IEC 61000-4-5. La présente norme spécifie autant que possible aux comités d'études concernés des termes définis d'application générale ou particulière, des exigences générales relatives aux objets en essai et aux modalités d'essai, des méthodes pour produire et mesurer les tensions d'essai, des modalités d'essai, des méthodes d'interprétation des résultats d'essai et d'indication des critères d'acceptation, des exigences concernant les dispositifs de mesure certifiés et les méthodes de vérification, une incertitude de mesure. Des variantes aux modalités d'essai peuvent être exigées et il convient qu'elles soient spécifiées par les comités d'études concernés. Il convient de déterminer si l'objet en essai comporte des dispositifs limiteurs de tension dans la mesure où ils peuvent influer sur les résultats de l'essai. Il convient que les comités d'études concernés fournissent des lignes directrices concernant les essais auxquels sont soumis les objets équipés de dispositifs limiteurs de tension. Cette première édition de l'IEC 61180 annule et remplace la première édition de l'IEC 61180-1, publiée en 1992, et la première édition de l'IEC 61180-2, publiée en 1994. Mots-clés: Techniques des essais à haute tension, essais diélectriques, décharge disruptive, tension de tenue.

General Information

• Status: Published
• Publication Date: 23-Jun-2016
• ICS: 19.080 - Electrical and electronic testing
• Technical Committee: TC 42 - High-voltage and high-current test techniques
• Drafting Committee: MT 18 - TC 42/MT 18
• Current Stage: PPUB - Publication issued
• Start Date: 24-Jun-2016
• Completion Date: 15-Jun-2016

Overview

IEC 61180:2016 is an international standard developed by the International Electrotechnical Commission (IEC) that focuses on high-voltage test techniques specifically designed for low-voltage equipment. Applicable to dielectric tests involving direct, alternating, and impulse voltages, this standard applies to equipment rated up to 1 kV a.c. or 1.5 kV d.c. It defines essential principles, methods, and requirements for conducting high-voltage tests to ensure dielectric strength and safe operation of low-voltage electrical devices.

This standard covers procedures and test equipment – such as voltage generators and measuring systems – used to perform type and routine tests. It emphasizes precise measurement, interference protection via effective screening, and defines acceptance criteria to validate test results. IEC 61180:2016 consolidates earlier editions and excludes electromagnetic compatibility testing and combined impulse voltage/current tests, which are covered in other standards.

Key Topics

• Dielectric Testing Methods: Procedures for testing with direct voltage (DC), alternating voltage (AC), and impulse voltage, ensuring the dielectric strength of low-voltage equipment.
• Test Equipment Requirements: Specifications for voltage generators and measurement devices, including calibration, dynamic behavior, and measurement uncertainty.
• Definitions and Terminology: Clear definitions of fundamental concepts such as disruptive discharge, withstand voltage, and relevant testing parameters to facilitate uniform understanding.
• Test Procedures: Guidelines for carrying out withstand voltage tests, establishing atmospheric conditions, and managing test object specifics, especially devices with voltage limiting components.
• Measurement Uncertainty and Calibration: Framework for evaluating measurement uncertainty, calibration schedules, stability, and maintaining accuracy in high-voltage test systems.
• Screening Techniques: Use of protective shielding and continuous conducting shields to prevent external interference for reliable test data.
• Test Result Evaluation: Criteria for acceptance based on test data, including procedures for qualifying measuring systems and ensuring compliance with performance requirements.

Applications

IEC 61180:2016 is vital for manufacturers, testing laboratories, and quality assurance teams involved with electrical equipment operating at low voltage levels. Its practical applications include:

• Type Testing: Verifying design integrity and dielectric strength during product development stages to meet safety standards.
• Routine Testing: Quality control testing in production lines to ensure each unit meets dielectric withstand voltage requirements.
• Safety Verification: Confirming that electrical equipment can safely handle high-voltage stresses without breakdown or failure under normal operating conditions.
• Calibration and Maintenance: Ensuring test equipment remains accurate through established calibration and uncertainty evaluation approaches.
• Design of Test Equipment: Guiding development of voltage generators and measuring systems that comply with strict testing conditions and environmental factors.
• Testing Equipment with Voltage Limiting Devices: Offering guidance to technical committees on appropriate test adaptations for equipment fitted with voltage-limiting features that may affect test outcomes.

By implementing IEC 61180:2016, stakeholders can ensure reliable dielectric testing that protects end-users, complies with regulatory requirements, and minimizes electrical hazards in low-voltage applications.

Related Standards

• IEC 61000-4-5: Standard covering tests with combinations of impulse voltages and currents, complementing IEC 61180 in electromagnetic compatibility testing.
• IEC 60664: Insulation coordination standards providing design criteria for electrical equipment insulation, used alongside dielectric test requirements.
• IEC 60060 Series: High-voltage test techniques for testing electrical apparatus, addressing broader voltage ranges beyond low-voltage equipment.
• IEC 60335: Safety standards for household and similar electrical appliances that often incorporate dielectric testing informed by IEC 61180 procedures.
• IEC Electropedia Vocabulary: Provides technical terminology support essential for consistent interpretation of test-related terms in IEC 61180.

---

Keywords: IEC 61180, high voltage test techniques, low-voltage equipment testing, dielectric tests, withstand voltage, impulse voltage testing, test equipment calibration, measuring system uncertainty, IEC standards, dielectric strength tests.

Standards Content (Sample)

IEC 61180 ®
Edition 1.0 2016-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage test techniques for low-voltage equipment – Definitions, test and
procedure requirements, test equipment

Techniques des essais à haute tension pour matériel à basse tension –
Définitions, exigences et modalités relatives aux essais, matériel d'essai

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IEC 61180 ®
Edition 1.0 2016-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage test techniques for low-voltage equipment – Definitions, test and

procedure requirements, test equipment

Techniques des essais à haute tension pour matériel à basse tension –

Définitions, exigences et modalités relatives aux essais, matériel d'essai

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 19.080 ISBN 978-2-8322-3366-5

– 2 – IEC 61180:2016 © IEC 2016
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references. 7
3 Terms and definitions . 8
3.1 General terms . 8
3.2 Definitions related to disruptive discharge and test voltages . 8
3.3 Characteristics related to the test equipment . 9
3.4 Characteristics related to direct voltage tests . 9
3.5 Characteristics related to alternating voltage tests . 10
3.6 Characteristics related to impulse tests (see Figure 1) . 11
3.7 Definitions relating to tolerance and uncertainty . 12
4 General requirements . 13
4.1 General . 13
4.2 Atmospheric conditions for test procedures and verification of test equipment . 14
4.3 Procedures for qualification and use of measuring systems . 14
4.3.1 General principles . 14
4.3.2 Schedule of performance tests . 15
4.3.3 Requirements for the record of performance . 15
4.3.4 Uncertainty . 15
4.4 Tests and test requirements for an approved measuring system and its
components . 16
4.4.1 Calibration – Determination of the scale factor . 16
4.4.2 Influence of load . 18
4.4.3 Dynamic behaviour . 18
4.4.4 Short-term stability . 19
4.4.5 Long-term stability . 19
4.4.6 Ambient temperature effect . 20
4.4.7 Uncertainty calculation of the scale factor . 20
4.4.8 Uncertainty calculation of time parameter measurement (impulse
voltages only) . 22
5 Tests with direct voltage . 25
5.1 General . 25
5.2 Test voltage . 25
5.2.1 Requirements for the test voltage . 25
5.2.2 Generation of the test voltage . 25
5.2.3 Measurement of the test voltage . 25
5.3 Test procedures . 26
5.3.1 Withstand voltage tests . 26
6 Tests with alternating voltage . 27
6.1 Test voltage . 27
6.1.1 Requirements for the test voltage . 27
6.1.2 Generation of the test voltage . 27
6.1.3 Measurement of the test voltage . 28
6.2 Test procedures . 30
6.2.1 Withstand voltage tests . 30
7 Tests with impulse voltage . 30

7.1 Test voltage . 30
7.1.1 General . 30
7.1.2 Requirements for the test voltage . 31
7.1.3 Generation of the test voltage . 31
7.1.4 Measurement of the test voltage and determination of impulse shape . 32
7.2 Test procedures . 32
7.2.1 Verification of impulse voltage waveshape . 32
7.2.2 Impulse voltage tests . 32
7.3 Measurement of the test voltage . 32
7.3.1 Requirements for an approved measuring system . 32
7.3.2 Uncertainty contributions . 33
7.3.3 Dynamic behaviour . 33
7.3.4 Requirements for measuring instrument . 33
8 Reference measurement systems . 33
8.1 Requirements for reference measuring systems . 33
8.1.1 Direct voltage. 33
8.1.2 Alternating voltage . 33
8.1.3 Impulse voltages . 33
8.2 Calibration of a reference measuring system . 33
8.2.1 General . 33
8.2.2 Reference method: comparative measurement . 34
8.3 Interval between successive calibrations of reference measuring systems . 34
8.4 Use of reference measuring systems . 34
Annex A (informative) Uncertainty of measurement . 35
A.1 General . 35
A.2 Terms and definitions in addition to 3.7 . 35
A.3 Model function . 36
A.4 Type A evaluation of standard uncertainty . 36
A.5 Type B evaluation of standard uncertainty . 37
A.6 Combined standard uncertainty . 38
A.7 Expanded uncertainty . 39
A.8 Effective degrees of freedom . 40
A.9 Uncertainty budget . 40
A.10 Statement of the measurement result . 41
Annex B (informative) Example for the calculation of measuring uncertainties in high-
voltage measurements . 43
Annex C (informative) Atmospheric correction . 47
C.1 Standard reference atmosphere . 47
C.2 Atmospheric correction factor . 47
C.2.1 General . 47
C.2.2 Humidity correction factor k . 47
C.2.3 Air density correction factor k . 48
Bibliography . 49

Figure 1 – Full impulse voltage time parameters . 11
Figure 2 – Calibration by comparison over the full voltage range . 17
Figure 3 – Uncertainty contributions of the calibration (example with a minimum of 5
voltage levels) . 18

– 4 – IEC 61180:2016 © IEC 2016
Figure 4 – Shaded area for acceptable normalised amplitude-frequency responses of
measuring systems intended for single fundamental frequencies f (to be tested in
nom
the range (1….7) f ) . 29
nom
Figure 5 – Shaded area for acceptable normalised amplitude-frequency responses of
measuring systems intended for a range of fundamental frequencies f to f (to
nom1 nom2
be tested in the range f to 7 f ) . 29
nom1 nom2
Figure 6 – 1,2/50 µs standard impulse voltage . 31
Figure A.1 – Normal probability distribution p(x) . 42
Figure A.2 – Rectangular probability distribution p(x) . 42

Table 1 – Tests required for an approved direct voltage measuring system . 26
Table 2 – Minimum currents of the test circuit . 27
Table 3 – Tests required for an approved alternating voltage measuring system . 30
Table 4 – Tests required for an approved impulse voltage measuring system . 33
Table A.1 – Coverage factor k for effective degrees of freedom ν (p = 95,45 %) . 40
eff
Table A.2 – Schematic of an uncertainty budget . 41
Table B.1 – Result of the comparison measurement up to 500 V at a single voltage level . 44
Table B.2 – Summary of results for h = 5 voltage levels (V = 500 V) . 45
Xmax
Table B.3 – Uncertainty budget of the assigned scale factor F . 46
X
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT –

Definitions, test and procedure requirements, test equipment

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61180 has been prepared by IEC technical committee 42: High-
voltage and high-current test techniques.
st st
This 1 edition of IEC 61180 cancels and replaces the 1 edition of IEC 61180-1, issued in
st
1992, and the 1 edition of IEC 61180-2, issued in 1994.
The text of this standard is based on the following documents:
FDIS Report on voting
42/341/FDIS 42/342/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 6 – IEC 61180:2016 © IEC 2016
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC website under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
HIGH-VOLTAGE TEST TECHNIQUES FOR LOW-VOLTAGE EQUIPMENT –

Definitions, test and procedure requirements, test equipment

1 Scope
This International Standard is applicable to:
– dielectric tests with direct voltage;
– dielectric tests with alternating voltage;
– dielectric tests with impulse voltage;
– test equipment used for dielectric tests on low-voltage equipment.
This standard is applicable only to tests on equipment having a rated voltage of not more than
1 kV a.c. or 1,5 kV d.c.
This standard is applicable to type and routine tests for objects which are subjected to high
voltage tests as specified by the technical committee.
The test equipment comprises a voltage generator and a measuring system. This standard
covers test equipment in which the measuring system is protected against external
interference and coupling by appropriate screening, for example a continuous conducting
shield. Therefore, simple comparison tests are sufficient to ensure valid results.
This standard is not intended to be used for electromagnetic compatibility tests on electric or
electronic equipment
NOTE Tests with the combination of impulse voltages and currents are covered by IEC 61000-4-5.
This standard provides the relevant technical committees as far as possible with:
– defined terms of both general and specific applicability;
– general requirements regarding test objects and test procedures;
– methods for generation and measurement of test voltages;
– test procedures;
– methods for the evaluation of test results and to indicate criteria for acceptance;
– requirements concerning approved measuring devices and checking methods;
– measurement uncertainty.
Alternative test procedures may be required and these should be specified by the relevant
technical committees.
Care should be taken if the test object has voltage limiting devices, as they may influence the
results of the test. The relevant technical committees should provide guidance for testing
objects equipped with voltage limiting devices.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For

– 8 – IEC 61180:2016 © IEC 2016
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60060-1:2010, High-voltage test techniques – Part 1: General definitions and test
requirements
IEC 60060-2:2010, High-voltage test techniques – Part 2: Measuring systems
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60335(all parts): Household and similar electrical appliances – Safety
IEC 60664-1:2007, Insulation co-ordination for equipment within low-voltage systems – Part 1:
Principles, requirements and tests
IEC 61083-1:2001, Instruments and software used for measurement in high-voltage impulse
test – Part 1: Requirements for instruments
IEC 61083-2:2013, Instruments and software used for measurement in high-voltage and high-
current tests – Part 2: Requirements for software for tests with impulse voltages and currents
ISO/IEC Guide 98-3:2008, Uncertainty of measurement – Part 3: Guide to the expression of
uncertainty in measurements (GUM)
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1 General terms
3.1.1
clearance
distance between two conductive parts along a string stretched across the shortest path
between these conductive parts
[SOURCE: IEC 60050-441:1984, 441-17-31]
3.1.2
creepage distance
shortest distance along the surface of a solid insulating material between two conductive
parts
[SOURCE: IEC 60050-151: 2001, 151-15-50]
3.2 Definitions related to disruptive discharge and test voltages
3.2.1
disruptive discharge
failure of insulation under electric stress, in which the discharge completely bridges the
insulation under test, reducing the voltage between electrodes to practically zero
3.2.2
withstand voltage
specified voltage value which characterizes the insulation of the object with regard to a
withstand test
Note 1 to entry: Unless otherwise specified, withstand voltages are referred to standard reference atmospheric
conditions (see 4.2).
3.3 Characteristics related to the test equipment
3.3.1
calibration
set of operations that establishes, by reference to standards, the relationship which exists,
under specified conditions, between an indication and a result of a measurement
Note 1 to entry: The determination of the scale factor is included in the calibration.
[SOURCE: IEC 60050-311:2001, 311-01-09, modified: note modified]
3.3.2
type test
conformity test made on one or more items representative of the production
Note 1 to entry: For a measuring system, this is a test performed on a component or on a complete measuring
system of the same design to characterize it under operating conditions.
[SOURCE: IEC 60050-151: 2001, 151-16-16, modified:note added]
3.3.3
routine test
conformity test made on each individual item during or after manufacture
Note 1 to entry: This is a test performed on each component or on each complete measuring system to
characterize it under operating conditions.
[SOURCE: IEC 60050-151: 2001, 151-16-17, modified:note added]
3.3.4
performance test
test performed on a complete measuring system to characterize it under operating conditions
3.3.5
test equipment
complete set of devices needed to generate and measure the test voltage or current applied
to a test object
3.3.6
reference measuring system
measuring system with its calibration traceable to relevant national and/or international
standards, and having sufficient accuracy and stability for use in the approval of other
systems by making simultaneous comparative measurements with specific types of waveform
and ranges of voltage
3.3.7
assigned scale factor
scale factor of a measuring system determined at the most recent performance test
Note 1 to entry: A measuring system may have more than one assigned scale factor; for example, it may have
several ranges, each with a different scale factor.
3.4 Characteristics related to direct voltage tests
3.4.1
value of the test voltage
arithmetic mean value
– 10 – IEC 61180:2016 © IEC 2016
3.4.2
ripple
periodic deviation from the arithmetic mean value of the test voltage
3.4.3
ripple amplitude
half the difference between the maximum and minimum values
Note 1 to entry: In cases where the ripple shape is nearly sinusoidal, true r.m.s. values multiplied by √ 2 are
acceptable for determination of the ripple amplitude.
3.4.4
ripple factor
ratio of the ripple amplitude to the value of test voltage
3.5 Characteristics related to alternating voltage tests
3.5.1
peak value
average of the magnitudes of the positive and negative maximum values
3.5.2
r.m.s. value
square root of the mean value of the square of the voltage values during a complete cycle
3.5.3
true r.m.s. value
value obtained from
T
I = i (t) dt
rms
∫
T
where
0 is the time instant (t = 0) of an a.c. periodic wave, convenient for the beginning of
integration;
T is the time taken over an integral number of cycles;
i(t) is the instantaneous value of the current.
Note 1 to entry: The true r.m.s. value can in general be calculated from a digitized record of any periodic
waveform, provided a sufficient number of samples have been taken.
Note 2 to entry: In cases with varying frequency, no strict formula for true r.m.s. value can be given.
3.5.4
total harmonic distortion
THD
the ratio of the rms value of the harmonic content of an alternating quantity to the rms value of
the fundamental component of the quantity
[SOURCE: IEC 60050-551: 1998, 551-17-06]

3.6 Characteristics related to impulse tests (see Figure 1)
U
1,0
B
0,9
0,5
0,3
A
t
T
T′
T = T/ 0,6
T
T
T′ = 0,3 T = 0,5 T
O IEC
O 1
Figure 1 – Full impulse voltage time parameters
Note 1 to entry: Oscillations are negligible.
3.6.1
impulse voltage
intentionally applied aperiodic transient voltage which usually rises rapidly to a peak value
and then falls more slowly to zero
3.6.2
peak value
maximum value
3.6.3
value of the test voltage
for an impulse without overshoot or oscillations, its peak value
Note 1 to entry: The determination of the peak value, in the case of oscillations or overshoot on standard
impulses, is considered in IEC 60060-1.
3.6.4
front time
T
virtual parameter defined as 1/0,6 times the interval T between the instants when the impulse
is 30 % and 90 % of the peak value on the test voltage curve (points A and B, Figure 1)
3.6.5
virtual origin
O
instant preceding point A, of the test voltage curve (see Figure 1) by a time 0,3 T
Note 1 to entry: For records having linear time scales, this is the intersection with the time axis of a straight line
drawn through the reference points A and B on the front.

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3.6.6
time to half-value
T
virtual parameter defined as the time interval between the virtual origin O and the instant
when the voltage has decreased to half the peak value
3.6.7
recorded curve
graphical or digital representation of the test data of an impulse voltage
3.7 Definitions relating to tolerance and uncertainty
3.7.1
tolerance
permitted difference between the measured value and the specified value
3.7.2
uncertainty of measurement
parameter, associated with the result of a measurement, that characterizes the dispersion of
the values that could be reasonably attributed to the measurand
Note 1 to entry: Uncertainty is positive and given without sign.
[SOURCE: IEC 60050-311:2001, 311-01-02]
3.7.3
error
measured quantity value minus a reference quantity value
[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.2]
3.7.4
standard uncertainty
u
uncertainty of the result of a measurement expressed as a standard deviation
Note 1 to entry: The standard uncertainty associated with an estimate of a measurand has the same dimension as
the measurand.
Note 2 to entry: In some cases, the relative standard uncertainty of a measurement may be appropriate. The
relative standard uncertainty of measurement is the standard uncertainty divided by the measurand, and is
therefore dimensionless.
[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.1]
3.7.5
combined standard uncertainty
u
c
standard uncertainty of the result of a measurement when that result is obtained from the
values of a number of other quantities, equal to the positive square root of a sum of terms, the
terms being the variances or covariances of these other quantities weighted according to how
the measurement result varies with changes in these quantities
[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.4]

3.7.6
expanded uncertainty
U
quantity defining an interval about the result of a measurement that may be expected to
encompass a large fraction of the distribution of values that could reasonably be attributed to
the measurand
Note 1 to entry: Expanded uncertainty is the closest match to the term “overall uncertainty”.
Note 2 to entry: The true, but unknown test-voltage value may lie outside the limits given by the uncertainty
because the coverage probability is < 100 % (see 3.7.7).
[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.5, modified:notes added]
3.7.7
coverage factor
k
numerical factor used as multiplier of the combined standard uncertainty in order to obtain an
expanded uncertainty
Note 1 to entry: For 95 % coverage probability and normal (Gaussian) probability distribution the coverage factor
is approximately k = 2.
[SOURCE: ISO/IEC Guide 98-3:2008, GUM 2.3.6, modified:note added]
3.7.8
type A evaluation
method of evaluation of an uncertainty by statistical analysis of a series of observations
3.7.9
type B evaluation
method of evaluation of an uncertainty by means other than statistical analysis of a series of
observations
3.7.10
national metrology institute
institute designated by national decision to develop and maintain national measurement
standards for one or more quantities
4 General requirements
4.1 General
Unless otherwise specified by the relevant technical committee, the test object should be
clean and dry, stabilized to ambient environmental conditions and the voltage application shall
be as specified in the relevant clauses of this standard. The test procedures applicable to
particular types of test objects, should be specified by the relevant technical committee,
having regard to such factors as:
• the required accuracy of test results;
• the random nature of the observed phenomenon and any polarity dependence of the
measured characteristics;
• the possibility of progressive deterioration with repeated voltage applications.
This includes for example, the polarity to be used, the preferred order if both polarities are to
be used, the number of applications and the interval between applications, and any
conditioning and preconditioning.

– 14 – IEC 61180:2016 © IEC 2016
The connections between the test equipment and the object subjected to the high voltage test
shall be direct and as short as possible. Loops of the connections should be avoided to
minimize oscillations on the front of the impulse. The leads should be as close to each other
as possible in order to minimize the area between the leads.
These requirements shall also apply for the qualification of the measuring system, e.g. the
test equipment to be calibrated and the reference measuring system.
The manufacturer of the test equipment shall give information on the characteristics of the
test equipment, so that the generated voltage is still within the allowed tolerances when
testing the object subjected to the high voltage test.
4.2 Atmospheric conditions for test procedures and verification of test equipment
The atmospheric conditions for test procedures and the verification of test equipment shall be
those stated for testing in IEC 60068-1:
Temperature 15 °C to 35 °C
Air pressure 86 kPa to 106 kPa
Relative humidity 25 % to 75 %
Absolute humidity ≤ 22 g/m
The actual atmospheric conditions during the test shall be recorded.
For the purpose of testing, where the atmospheric conditions are within the ranges specified
in this standard, corrections to the test voltage due to variations of the temperature, humidity
and air pressure do not need to be applied.
When the atmospheric conditions during the test are not within the ranges specified in this
standard, the method in Annex C shall be used, by agreement, for test voltage correction.
4.3 Procedures for qualification and use of measuring systems
4.3.1 General principles
Every approved measuring system shall undergo initial tests, followed by periodic
performance tests throughout its service life, as specified in 4.3.2. The initial tests consist of
type tests and routine tests.
The performance tests shall prove that the measuring systems can measure the intended test
voltages within the uncertainties given in this standard, and that the measurements are
traceable to national and/or international standards of measurement. The system is approved
only for the arrangements and operating conditions included in its record of performance, as
specified in 4.3.3.
A major requirement for measuring systems is stability within the specified range of operating
conditions so that the scale factor remains constant over long periods.
The assigned scale factor is determined in the performance test by calibration. Any calibration
shall be traceable to national and/or international standards. The user shall ensure that any
calibration is performed by competent personnel using reference measuring systems and
suitable procedures.
Alternatively, any user may choose to have the performance tests made by a national
metrology institute or by a calibration laboratory accredited for the quantity to be calibrated.

Calibrations performed by a national metrology institute, or by a laboratory accredited for the
quantities calibrated and reported under the accreditation, are considered traceable to
national and/or international standards.
In all cases, the user shall include the test data in the record of performance.
4.3.2 Schedule of performance tests
To maintain the quality of a measuring system, the assigned scale factor(s) shall be
determined by periodic performance tests. The interval between performance tests shall be
not longer than 1 year unless otherwise stated by the manufacturer and based on experience
demonstrating long-term stability.
Performance tests shall be made following major repairs to the measuring system and
whenever a circuit arrangement that is beyond the limits given in the record of performance is
to be used.
4.3.3 Requirements for the record of performance
The results of all tests, including the conditions under which the results were obtained, shall
be kept in the record of performance (stored in paper format or electronically if permitted by
quality systems and local laws) established and maintained by the user. The record of
performance shall uniquely identify the components of the measuring system and shall be
structured so that performance of the measuring system can be traced over time.
The record of performance shall comprise at least the following information:
• General description of the measuring system.
• Results of type and routine tests on the measuring system.
• Results of subsequent performance tests on the measuring system.
The general description of the measuring system usually comprises main data and
capabilities of the measuring system, such as the rated operating voltage, waveform(s),
range(s) of clearances, operating time, or maximum rate of voltage applications. For many
measuring systems, information on the transmission system as well as high-voltage and
ground-return arrangements are important. If required, a description is also given of
components of the measuring system, including for example the type and identification of the
measuring instrument.
4.3.4 Uncertainty
The uncertainty of all measurements made under this International Standard shall be
evaluated according to ISO/IEC Guide 98-3. Uncertainty of measurement shall be
distinguished from the tolerance. A pass/fail decision is based solely on the measured value
in relation to the pass/fail criteria. The measurement uncertainty shall not be applied to the
measured value to make the pass/fail decision. Procedures for evaluating uncertainties given
in 4.4.7 are specified in accordance with the principles of ISO/IEC Guide 98-3, and are
considered sufficient for the instrumentation and measurement arrangements commonly used
in high-voltage testing. However, users may select other appropriate procedures from
ISO/IEC Guide 98-3, some of which are outlined in Annex A and Annex B.
In general, the measurand to be considered is the scale factor of the measuring system, but in
some cases other quantities, such as the time parameters of an impulse voltage and their
associated errors, should also be considered.
NOTE 1 Other measurands for specific converting devices are in common use. For example, a voltage divider is
characterized by the voltage ratio and its uncertainty in the assigned measurement ranges used. A voltage
transformer is characterized by the ratio error, the phase displacement and the corresponding uncertainties.

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According to the ISO/IEC Guide 98-3, the uncertainty of a measurement is determine
...