IEC TS 62565-5-3:2025

Nanomanufacturing – Product specification – Part 5-3: Nanoenabled energy storage – Blank detail specification: silicon nanosized materials for the negative electrode of lithium-ion batteries

IEC TS 62565-5-3:2025 which is a Technical Specification, establishes a standardized method to determine a blank detail specification (BDS) for
‭• silicon nanosized materials
used for
‭• negative electrode of lithium-ion batteries.
This document is intended to be used for silicon nanosized materials for the negative electrode of lithium-ion batteries which have been widely employed in the fields of
- portable devices,
- power tools,
- electric vehicles, and
- energy storage system.
Numeric values for the key control characteristics are left blank as they will be specified between customer and supplier in the detail specification (DS). In the DS key control characteristics can be added or removed if agreed between customer and supplier.

General Information

• Status: Published
• Publication Date: 15-Apr-2025
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 11 - TC 113/WG 11
• Current Stage: PPUB - Publication issued
• Start Date: 16-Apr-2025
• Completion Date: 24-Jan-2025

Standards Content (Sample)

IEC TS 62565-5-3 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –
Part 5-3: Nanoenabled energy storage – Blank detail specification: silicon
nanosized materials for the negative electrode of lithium-ion batteries

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IEC TS 62565-5-3 ®
Edition 1.0 2025-04
TECHNICAL
SPECIFICATION
Nanomanufacturing – Product specification –

Part 5-3: Nanoenabled energy storage – Blank detail specification: silicon

nanosized materials for the negative electrode of lithium-ion batteries

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 07.120  ISBN 978-2-8327-0291-8

– 2 – IEC TS 62565-5-3:2025 © IEC 2025
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 11
3.1 General terms . 11
3.2 General product description and procurement information . 11
3.3 Physical key control characteristics . 11
3.4 Chemical key control characteristics . 12
3.5 Electrochemical key control characteristics . 14
3.6 Structural key control characteristics . 15
3.7 Measurement methods . 16
4 General introduction regarding measurement methods . 19
5 Specification format . 20
5.1 General product description and procurement information . 20
5.2 Physical key control characteristics . 21
5.3 Chemical key control characteristics . 21
5.4 Electrochemical key control characteristics . 22
5.5 Structural key control characteristics . 23
6 Overview of test methods . 23
Annex A (normative) Information for standardized KCC measurement procedures . 28
A.1 General . 28
A.2 Apparent density: Oscillating funnel method . 28
A.2.1 General. 28
A.2.2 Measurement standard . 28
A.2.3 Adaptations and modifications required . 28
A.3 Tap density: Tapping apparatus . 29
A.3.1 General. 29
A.3.2 Measurement standard . 29
A.3.3 Adaptations and modifications required . 29
A.4 Compacted density: Powder compaction method. 29
A.4.1 General. 29
A.4.2 Measurement standard . 29
A.4.3 Adaptations and modifications required . 29
A.5 True density: GD . 30
A.5.1 General. 30
A.5.2 Measurement standard . 30
A.5.3 Adaptations and modifications required . 30
A.6 Powder conductivity: Four-point probe . 30
A.6.1 General. 30
A.6.2 Measurement standard . 30
A.6.3 Adaptations and modifications required . 31
A.7 Particle size distribution: LD . 31
A.7.1 General. 31
A.7.2 Measurement standard . 31
A.7.3 Adaptations and modifications required . 31

A.8 Particle shape: SEM . 31
A.8.1 General. 31
A.8.2 Measurement standard . 32
A.8.3 Adaptations and modifications required . 32
A.9 Ignition temperature: DSC . 32
A.9.1 General. 32
A.9.2 Measurement standard . 32
A.9.3 Adaptations and modifications required . 32
A.10 Silicon content: XRF . 32
A.10.1 General. 32
A.10.2 Measurement standard . 33
A.10.3 Adaptations and modifications required . 33
A.11 Carbon content: HFCIAS . 33
A.11.1 General. 33
A.11.2 Measurement standard . 33
A.11.3 Adaptations and modifications required . 33
A.12 Oxygen content: Inert gas fusion infrared detection method . 33
A.12.1 General. 33
A.12.2 Measurement standard . 33
A.12.3 Adaptations and modifications required . 33
A.13 Water content: KFC . 34
A.13.1 General. 34
A.13.2 Measurement standard . 34
A.13.3 Adaptations and modifications required . 34
A.14 Sulfur content: ICP-OES . 34
A.14.1 General. 34
A.14.2 Measurement standard . 34
A.14.3 Adaptations and modifications required . 34
A.15 Metallic impurities: ICP-AES . 35
A.15.1 General. 35
A.15.2 Measurement standard . 35
A.15.3 Adaptations and modifications required . 35
A.16 Magnetic impurities: ICP-OES . 35
A.16.1 General. 35
A.16.2 Measurement standard . 35
A.16.3 Adaptations and modifications required . 35
A.17 pH value: Potentiometry . 35
A.17.1 General. 35
A.17.2 Measurement standard . 35
A.17.3 Adaptations and modifications required . 35
A.18 Pore size distribution: GA . 36
A.18.1 General. 36
A.18.2 Measurement standard . 36
A.18.3 Adaptations and modifications required . 36
A.19 Porosity: MP . 36
A.19.1 General. 36
A.19.2 Measurement standard . 36
A.19.3 Adaptations and modifications required . 36
A.20 Specific surface area: BET . 36

– 4 – IEC TS 62565-5-3:2025 © IEC 2025
A.20.1 General. 36
A.20.2 Measurement standard . 36
A.20.3 Adaptations and modifications required . 37
A.21 Lattice spacing: TEM. 37
A.21.1 General. 37
A.21.2 Measurement standard . 37
A
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