IEC 61786-1:2013/AMD1:2024
(Amendment)Amendment 1 - Measurement of DC magnetic, AC magnetic and AC electric fields from 1 Hz to 100 kHz with regard to exposure of human beings - Part 1: Requirements for measuring instruments
Amendment 1 - Measurement of DC magnetic, AC magnetic and AC electric fields from 1 Hz to 100 kHz with regard to exposure of human beings - Part 1: Requirements for measuring instruments
Amendement 1 - Mesure de champs magnétiques continus et de champs magnétiques et électriques alternatifs dans la plage de fréquences de 1 Hz à 100 kHz dans leur rapport à l'exposition humaine - Partie 1: Exigences applicables aux instruments de mesure
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IEC 61786-1 ®
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
HO RIZONTAL PUBLICATION
PU BLICATION HORIZONTALE
AMENDMENT 1
AMENDEMENT 1
Measurement of DC magnetic, AC magnetic and AC electric fields from 1 Hz to
100 kHz with regard to exposure of human beings –
Part 1: Requirements for measuring instruments
Mesure de champs magnétiques continus et de champs magnétiques et
électriques alternatifs dans la plage de fréquences de 1 Hz à 100 kHz dans leur
rapport à l'exposition humaine –
Partie 1: Exigences applicables aux instruments de mesure
IEC 61786-1:2013-12/AMD1:2024-07(en-fr)
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IEC 61786-1 ®
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
HO RIZONTAL PUBLICATION
PU BLICATION HORIZONTALE
AMENDMENT 1
AMENDEMENT 1
Measurement of DC magnetic, AC magnetic and AC electric fields from 1 Hz to
100 kHz with regard to exposure of human beings –
Part 1: Requirements for measuring instruments
Mesure de champs magnétiques continus et de champs magnétiques et
électriques alternatifs dans la plage de fréquences de 1 Hz à 100 kHz dans leur
rapport à l'exposition humaine –
Partie 1: Exigences applicables aux instruments de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-9449-9
– 2 – IEC 61786-1:2013/AMD1:2024
© IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF DC MAGNETIC, AC MAGNETIC AND
AC ELECTRIC FIELDS FROM 1 Hz TO 100 kHz WITH REGARD
TO EXPOSURE OF HUMAN BEINGS –
Part 1: Requirements for measuring instruments
AMENDMENT 1
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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Amendment 1 to IEC 61786-1:2013 has been prepared by IEC technical committee 106:
Methods for the assessment of electric, magnetic and electromagnetic fields associated with
human exposure.
© IEC 2024
The text of this Amendment is based on the following documents:
Draft Report on voting
106/647/FDIS 106/655/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
___________
2 Normative references
Add the following new reference:
IEC 61000-6-1:2016, Electromagnetic compatibility (EMC) – Part 6-1: Generic standards –
Immunity standard for residential, commercial and light-industrial environments
5.4 Pass-band
Replace the penultimate sentence with the following:
This range is not as broad as the pass band but shall be still broad enough to cover all
frequencies of interest.
5.7 Readability of scale
Delete the first paragraph.
Delete the first sentence of the last paragraph.
– 4 – IEC 61786-1:2013/AMD1:2024
© IEC 2024
5.8.1 General schema
Replace the 5.8.1 title with the following new title:
5.8.1 General schematic
Replace the first sentence with the following:
A general schematic of a meter is given in Figure 1.
Replace the title of Figure 1 with the following new title:
Figure 1 – Schematic of a field meter
Replace the paragraph below Figure 1 with the following:
The probes should be three-axis. For the weighted peak method (see IEC 61786-2:2014, 4.2.3),
three-axis probes shall be used.
5.8.4 Support for electric field meter
Replace the first paragraph with the following:
The support for the electric field meter shall be made of insulating materials, such as synthetic
or composite materials, or wood.
5.9.1 Immunity
c) Radiated electromagnetic fields
Replace the first paragraph with the following:
The operation of instrumentation shall not be affected by electromagnetic radiation for an
electric field defined in IEC 61000-6-1:2016, Table 1, rows 1.2 and 1.3. Equipment intended to
be used in industrial environment should reference the equivalent tables of IEC 61000-6-2 [37].
Delete NOTE 2.
5.9.2 Emissions
b) Conducted disturbances – 0,15 MHz to 30 MHz (instrumentation connected to AC power
supply)
Replace the first paragraph by the following:
The conducted disturbances shall be less than the limits defined in Table 4 of CISPR 11:2024,
as reproduced in Table 1 below.
© IEC 2024
c) Radiated disturbances – 30 MHz to 1 000 MHz
Replace the first paragraph with the following:
The electromagnetic radiated emissions from instrumentation containing devices operating at
frequencies 30 MHz to 1 GHz shall be limited to the values given in Table 9 of CISPR 11:2024
for class B group 1 equipment measured on a test site at 10 m. The limits are briefly summarized
below.
5.11 Durability
Replace the last sentence with the following:
The instrumentation shall be compliant with IEC 60721-3: storage class 1M2, transport class
2M6 and operation class 7M3.
6.1 General
Replace the third paragraph with the following:
The first method is detailed in 6.2.2. The other two methods, which are detailed in Annex A,
can be used when a calibrated coil and measurement system are not available.
NOTE The voltage injection technique is useful for the design or manufacturing stage of the field meter.
6.2
...
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